Error detection device and error detection method

Abstract

It is possible to know a guideline for adjusting the levels of three voltage thresholds of a PAM4 signal. An error detection device receives a measurement pattern including a pseudo random pattern having equal appearance frequencies of four levels, decodes the measurement pattern into a most significant bit sequence signal MSB and a least significant bit sequence signal LSB, based on three voltage thresholds Vth1, Vth2, and Vth3, identifies and counts, by a level counting unit, the four levels of the measurement pattern, based on the most significant bit sequence signal MSB and the least significant bit sequence signal LSB, and displays numerical values or bar graphs indicating ratios of the appearance frequencies of the four levels of the measurement pattern so as to be in the same order as waveform levels of the measurement pattern, based on a result of the counting.

Claims

1. An error detection device comprising: a receiver configured to receive a measurement pattern including a pseudo random pattern having equal appearance frequencies of four levels from a device under test, and configured to decode the measurement pattern into a most significant bit sequence signal and a least significant bit sequence signal, based on three voltage thresholds for identifying voltages of the four levels of the measurement pattern; a processor configured to identify the four levels of the measurement pattern, based on the decoded most significant bit sequence signal and least significant bit sequence signal, and configured to count the number of each level; and a display configured to display at least one of numerical values or bar graphs indicating ratios of the appearance frequencies of the four levels of the measurement pattern, based on a result of counting by the processor.

2. The error detection device according to claim 1, wherein the numerical values or the bar graphs indicating the ratios of the appearance frequencies of the four levels of the measurement pattern are in the same order as waveform levels of the measurement pattern.

3. An error detection method comprising: receiving a measurement pattern including a pseudo random pattern having equal appearance frequencies of four levels from a device under test, and decoding the measurement pattern into a most significant bit sequence signal and a least significant bit sequence signal, based on three voltage thresholds for identifying voltages of the four levels of the measurement pattern; by a processor of an error detection device, identifying the four levels of the measurement pattern, based on the decoded most significant bit sequence signal and least significant bit sequence signal, and counting the number of each level; and displaying at least one of numerical values or bar graphs indicating ratios of the appearance frequencies of the four levels of the measurement pattern, based on a result of the counting.

4. The error detection method according to claim 3, wherein the numerical values or the bar graphs indicating the ratios of the appearance frequencies of the four levels of the measurement pattern are in the same order as waveform levels of the measurement pattern.

Description

BRIEF DESCRIPTION OF THE DRAWINGS

(1) FIG. 1 is a block configuration diagram of an error detection device according to the present invention.

(2) FIG. 2 is a flowchart of an error detection method according to the present invention.

(3) FIGS. 3A and 3B are diagrams showing a display example of a level count result of a PAM4 signal by the error detection device according to the present invention.

(4) FIG. 4 is an explanatory diagram of a PAM4 signal.

(5) FIGS. 5A to 5E are diagrams showing relationships between symbols of the PAM4 signal and three voltage thresholds Vth1, Vth2, and Vth3.

(6) FIG. 6A shows an example of an input PAM4 signal, and FIG. 6B is a diagram showing a result of a case where the PAM4 signal of FIG. 6A is decoded by setting the three voltage thresholds Vth1, Vth2, and Vth3 in a medium voltage range H2.

BEST MODE FOR CARRYING OUT THE INVENTION

(7) Hereinafter, an embodiment for carrying out the present invention will be described in detail with reference to the attached drawings.

(8) As shown in FIG. 1, an error detection device 1 receives a measurement pattern including a pseudo random pattern (PAM4 signal) in which appearance frequencies of four levels are equal, that is, PAM4 symbols 0, 1, 2, and are generated equally, three voltage thresholds Vth1, Vth2, and Vth3 for identifying voltages of four levels of the measurement pattern is set, identifies four levels (0 (Level 0), 1 (Level 1), 2 (Level 2), and 3 (Level 3) of the PAM4 symbol) of the measurement pattern, based on the three voltage thresholds Vth1, Vth2, and Vth3 to decode the measurement pattern into a binary signal (a most significant bit sequence signal MSB and a least significant bit sequence signal LSB), and detects an error in the PAM4 symbols, based on the result of the decoded binary signal, and is roughly configured with an operation unit 2, a pattern generation unit 3, a decoding unit 4, a level counting unit 5, a control unit 6, and a display unit 7.

(9) The operation unit 2 includes, for example, a pointing device such as a mouse or a touch screen for operating a pointer or an icon on the display screen of the display unit 7, and keys, switches, buttons, or the like provided in the main body of the error detection device 1. The operation unit 2 performs various settings and operations related to the measurement, including instructions for starting and stopping the measurement of the device under test W, and setting of three voltage thresholds Vth1, Vth2, and Vth3 when receiving the PAM4 signal.

(10) The pattern generation unit 3 generates a PAM4 signal of a pseudo random pattern (PRBS: Pseudo Random Bit Sequence) in which the appearance frequencies of the four levels of “0”, “1”, “2”, and “3” are equal, as the measurement pattern input to the device under test W. Examples of the pseudo random pattern include bit sequence signals such as PRBS7 (pattern length: 2.sup.7−1), PRBS9 (pattern length: 2.sup.9−1), PRBS10 (pattern length: 2.sup.10−1), PRBS11 (pattern length: 2.sup.11−1), PRBS15 (pattern length: 2.sup.15−1), and PRBS20 (pattern length: 2.sup.20−1).

(11) Although the error detection device 1 is configured to include the pattern generation unit 3 in FIG. 1, the pattern generation unit 3 can be configured independently of the error detection device 1.

(12) The decoding unit 4 receives a measurement pattern (PAM4 signal), identifies voltages of four levels of the measurement pattern based on three preset voltage thresholds Vth1, Vth2, and Vth3, and decodes the measurement pattern into a most significant bit sequence signal (MSB) and a least significant bit sequence signal (LSB) which are binary signals (NRZ signals).

(13) The level counting unit 5 identifies and counts the four levels of the measurement pattern, based on the most significant bit sequence signal (MSB) and the least significant bit sequence signal (LSB) decoded by the decoding unit 4, under the control of the control unit 6.

(14) To explain further, the level counting unit 5 identifies four levels (MSB, LSB)=(0,0), (0,1), (1,0), and (1,1) of the measurement pattern from the most significant bit sequence signal MSB and the least significant bit sequence signal LSB decoded by the decoding unit 4, and counts each level. That is, (MSB, LSB)=(1,1) is counted as Level 3, (MSB, LSB)=(1,0) is counted as Level 2, (MSB, LSB)=(0,1) is counted as Level 1, and (MSB, LSB)=(0,0) is counted as Level 0.

(15) The control unit 6 collectively controls each unit (the operation unit 2, the pattern generation unit 3, the decoding unit 4, the level counting unit 5, and the display unit 7) of the error detection device 1, and performs setting control of the voltage thresholds Vth1, Vth2, and Vth3 to the decoding unit 4 based on the operation of the operation unit 2, generation control of the measurement pattern from the pattern generation unit 3 to the device under test W, display control of the display unit 7 based on the count result of level counting unit 5, and the like.

(16) Under the control of the control unit 6, the display unit 7 displays the ratios of the appearance frequencies of the four levels of the measurement pattern such that the order is the same as the level of the waveform of the measurement pattern, based on the count result of the level counting unit 5, on the display screen 7a in the display format shown in FIGS. 3A and 3B, for example. The order of display is not limited to the same order as the level of the waveform of the measurement pattern, and may be, for example, any order specified by the user or an order opposite to the level of the waveform of the measurement pattern.

(17) On the display screen 7a of FIG. 3A, the numerical values and the bar graphs (horizontal bar graphs) of the count results of Level 0, Level 1, Level 2, and Level 3 are displayed in parallel in order from the bottom of the baseline (L0: 0 level in FIG. 4) so as to be in the same order as the level of the waveform of the measurement pattern. Further, below these displays, a numerical value indicating the total value of the symbols of the measurement pattern counted by the level counting unit 5 is displayed. However, the order of display is not limited to the same order as the level of the waveform of the measurement pattern, and may be, for example, any order specified by the user or an order opposite to the level of the waveform of the measurement pattern.

(18) The total value of the symbols of the measurement pattern (PAM4 Symbol Count) is calculated by PAM4 Level 3 Count+PAM4 Level 2 Count+PAM4 Level 1 Count+PAM4 Level 0 Count.

(19) Similar to FIG. 3A, on the display screen 7a of FIG. 3B, the numerical values and the bar graphs (horizontal bar graphs) of the count results of Level 0, Level 1, Level 2, and Level 3 are displayed in parallel in order from the bottom of the baseline (L0: 0 level in FIG. 4) so as to be in the same order as the level of the waveform of the measurement pattern. Further, below these displays, the value obtained by converting the symbols of the measurement pattern counted by the level counting unit 5 into the bit count is displayed. However, the order of display is not limited to the same order as the level of the waveform of the measurement pattern, and may be, for example, any order specified by the user or an order opposite to the level of the waveform of the measurement pattern.

(20) The bit count (MSB Bit Count) of the most significant bit sequence signal MSB is calculated by PAM4 Level 3 Count+PAM4 Level 2 Count+PAM4 Level 1 Count+PAM4 Level 0 Count, as a value obtained by converting the symbols of the measurement pattern into the bit count.

(21) The bit count (LSB Bit Count) of the least significant bit sequence signal LSB is calculated by PAM4 Level 3 Count+PAM4 Level 2 Count+PAM4 Level 1 Count+PAM4 Level 0 Count.

(22) Then, the total bit count (MSB+LSB Bit Count) of the most significant bit sequence signal MSB and the least significant bit sequence signal LSB is calculated by MSB Bit Count+LSB Bit Count.

(23) incidentally, the error detection device 1 of FIG. 1 is configured such that the measurement pattern generated by the pattern generation unit 3 is input to the decoding unit 4 via the device under test W, but the present invention is not limited to this. For example, when the device under test W generates the above-described measurement pattern, the measurement pattern generated by the device under test W may be input to the decoding unit 4.

(24) Next, as an operation of the error detection device configured as described above, a display method for knowing a guideline for adjusting the levels of the three voltage thresholds Vth1, Vth2, and Vth3 of the measurement pattern will be described with reference to the flowchart of FIG. 2.

(25) First, when a measurement pattern having equal appearance frequencies of four levels, generated by the pattern generation unit 3, under the control of the control unit 6 is input to the device under test W, the measurement pattern looped back from the device under test W is input to the decoding unit 4 (ST1).

(26) In addition to the input of the measurement pattern that is generated by the pattern generation unit 3 and is looped back from the device under test (DUT), the measurement pattern can be transmitted and input by the device under test (DUT) itself having a transmission function.

(27) Next, the decoding unit 4 compares the measurement pattern with the three voltage thresholds Vth1, Vth2, and Vth3 that are preset and controlled, and decodes the measurement pattern into the most significant bit sequence signal MSB and the least significant bit sequence signal LSB (ST2).

(28) Subsequently, the level counting unit 5 recognizes and counts the four levels of the measurement pattern based on the most significant bit sequence signal MSB and the least significant bit sequence signal LSB decoded by the decoding unit 4 (ST3).

(29) Then, under the display control by the control unit 6, the display unit 7 displays, based on a result of the count by the level counting unit 5, ratios of the appearance frequencies of the four levels according to the level order of the four levels of the measurement pattern, by numerical values or bar graphs (ST4). The order of display is not limited to the same order as the level of the waveform of the measurement pattern, and may be, for example, any order specified by the user or an order opposite to the level of the waveform of the measurement pattern.

(30) As described above, according to the present embodiment, as shown in FIGS. 3A and 3B, the ratios of the appearance frequencies of four levels of the PAM4 signal based on the three voltage thresholds Vth1, Vth2, and Vth3 set by the user can be confirmed by numerical values or bar graphs on the display screen 7a of the display unit 7.

(31) Then, in particular, when the ratios of the appearance frequencies of the four levels of the measurement pattern are displayed on the display screen 7a of the display unit 7 as a bar graph, it is possible to visually check whether or not the four symbols of the PAM4 signal of the measurement pattern are generated evenly. Further, when the display order is specified as the same as the waveform level of the measurement pattern, the display order matches the level order of the 4 levels of the measurement pattern, so that the ratios of the appearance frequencies of the four levels can be intuitively grasped from the numerical values or the bar graphs. In addition, when the display order is specified as any order specified by the user, the level of the measurement pattern that the user wants to focus on is in any position, so that the ratios of the appearance frequencies of the four levels can be easily grasped from the numerical values or the bar graphs. In addition, when the display order is specified as the reverse order of the waveform level of the measurement pattern, the levels are in positions in the reverse order of the measurement pattern according to the user's taste, so that the ratios of the appearance frequencies of the four levels can be easily grasped from the numerical values or the bar graphs.

(32) When the measurement pattern including a pseudo random pattern such as PRBS is created such that four symbol types of a PAM4 signal are evenly generated, and error-free adjustment is performed using this pseudo random pattern, if the three voltage thresholds Vth1, Vth2, and Vth3 are adjusted in the display of FIGS. 3A and 3B such that the horizontal bar graphs showing the ratios of the appearance frequencies of the four levels of the PAM4 signal do not become uneven, the three voltage thresholds can be adjusted to voltage thresholds by which the four values of the symbols of the PAM4 signal are correctly distinguished. This makes it possible to correctly adjust the three voltage thresholds Vth1, Vth2, and Vth3 which cannot be correctly adjusted only by the bit error.

(33) Further, since the high-speed PAM4 signal of 50 G or more has a small eye opening, the difference between the three voltage thresholds Vth1, Vth2, and Vth3 is only several tens of mV, and it is very difficult to adjust the voltage thresholds Vth1, Vth2, and Vth3.

(34) However, according to the present embodiment, it is possible to obtain a guideline for adjusting the levels of the three voltage thresholds Vth1, Vth2, and Vth3 by the display of FIGS. 3A and 3B. This makes it possible to easily adjust the reception of the symbols of the measurement pattern (PAM4 signal). Then, when the appearance frequency of each level of the PAM4 signal is equal, it indicates that the three voltage thresholds Vth1, Vth2, and Vth3 are correct values, so that error-free of the symbols of the PAM4 signal can be achieved by adjusting the phase direction.

(35) Although the best form of the error detection device and the error detection method according to the present invention has been described above, the present invention is not limited by the description and drawings in this form. That is, it goes without saying that all other forms, examples, operational techniques, and the like made by those skilled in the art based on this form are included in the scope of the present invention.

DESCRIPTION OF REFERENCE NUMERALS AND SIGNS

(36) 1 Error detection device 60 Operation unit 3 Pattern generation unit 4 Decoding unit 5 Level counting unit 6 Control unit 7 Display unit 7a Display screen W Device under test (DUT)