TEST APPARATUS FOR TEST CARDS

Abstract

A test apparatus (1) for test cards (37), comprising a receiving device (3) for holding at least one test card (37) to be tested, comprising at least one contact device (4) for making electrical touch contact with electrically conductive contact points of the at least one test card (37) in the receiving device (3), wherein the contact device (4) can be arranged vertically above the receiving device for the purpose of making touch contact, and comprising an actuating device (19), which is formed to displace the contact device (4) and the receiving device (3) relative to one another for the purpose of establishing the touch contact. It is provided that the receiving device (3) can be displaced by means of the actuating device (19) from a test position, which is located vertically below the contact device (4), into a loading and unloading position, which is laterally spaced apart from the contact device (4), and the other way round.

Claims

1. A test apparatus (1) for test cards (37), comprising a receiving device (3) for holding at least one test card (37) to be tested, comprising at least one contact device (4) for making electrical touch contact with electrically conductive contact points of the at least one test card (37) in the receiving device (3), wherein the contact device (4) can be arranged vertically above the receiving device for the purpose of making touch contact, and comprising an actuating device (19), which is formed to displace the contact device (4) and the receiving device (3) relative to one another for the purpose of establishing the touch contact, characterized in that the receiving device (3) can be displaced by means of the actuating device (19) from a test position, which is located vertically below the contact device (4), into a loading and unloading position, which is laterally spaced apart from the contact device (4), and the other way round.

2. The test apparatus according to claim 1, characterized by a frame (2), to which the receiving device (3) and the contact device (4) are mounted.

3. The test apparatus according to claim 1, characterized in that the receiving device (3) is mounted to the frame (2) as horizontally shiftable drawer (6).

4. The test apparatus according to claim 1, characterized in that the contact device (4) is mounted in a vertically shiftable manner between a touch contact position and a release position by means of the actuating device (19).

5. The test apparatus according to claim 1, characterized in that the actuating device (19) has at least one first controllable actuator (25) for displacing the receiving device (3).

6. The test apparatus according to claim 1, characterized in that the actuating device (19) has at least one second controllable actuator (26) for displacing the contact device (4).

7. The test apparatus according to claim 1, characterized in that the first actuator (25) and/or the second actuator (26) in each case have at least one electric motor.

8. The test apparatus according to claim 1, characterized in that the second actuator (26) is coupled to at least one slider (27), which has a slide guide (28), which cooperates with an entraining protrusion (30) of the contact device (4) for the purpose of vertically displacing the contact device (4).

9. The test apparatus according to claim 1, characterized in that the slide guide (28) has an obliquely aligned run-on surface (29).

10. The test apparatus according to claim 1, characterized in that at least one spring element, which forces the contact device (4) with the entraining protrusion (30) against the slide guide (28), is assigned to the contact device (4).

11. The test apparatus according to claim 1, characterized in that the slide guide (28) has a catch hook (31, 32) for the entraining protrusion (30) on at least one end.

12. The test apparatus according to claim 1, characterized in that the contact device (4) is mounted in a vertically shiftable manner to the frame (2) by means of at least three guide bolts (20).

13. The test apparatus according to claim 1, characterized in that the receiving device (3) has an exchangeable support structure (17), which is formed to hold one or several test cards (37).

14. The test apparatus according to claim 1, characterized in that the second actuator (26) has a lifting device (33), which can be coupled to the support structure (17).

15. The test apparatus according to claim 1, characterized in that the receiving device (3) has a support frame (7), onto which the support structure (17) can be placed.

16. The test apparatus according to claim 1, characterized in that the support structure (17) is formed in a trough-shaped manner.

17. The test apparatus according to claim 1, characterized in that the frame (2) has closed side walls (14).

18. The test apparatus according to claim 1, characterized by a test device (5), which is or can be electrically connected to the contact device (4).

19. The test device according to claim 1, characterized in that the contact device (4) is formed for receiving one or several different contact modules for the purpose of making touch contact with the at least one test card (37).

Description

[0026] The invention will be described in more detail below on the basis of the drawings, for the purpose of which

[0027] FIG. 1 shows an advantageous test device according to a first operating state,

[0028] FIG. 2 shows the test device in a second operating state,

[0029] FIG. 3 shows the test apparatus in a third operating state,

[0030] FIG. 4 shows the test apparatus in a fourth operating state,

[0031] FIG. 5 shows the test apparatus in a fifth operating state,

[0032] FIG. 6 shows the test apparatus in a sixth operating state, in each case in a perspective illustration, and

[0033] FIG. 7 shows an optional further development of the test apparatus in a simplified sectional illustration.

[0034] FIG. 1 shows an advantageous test apparatus 1 for test cards in a simplified perspective illustration. Test cards, which are used for the purpose of testing electrical/electronic test objects, can be tested with regard to their own functionality by means of the test apparatus 1.

[0035] For this purpose, the test apparatus 1 has a frame 2, on which a receiving device 3 and a contact device 4 are arranged. A test device 5, which is or can be electrically connected to the contact apparatus 4 and which is formed to test one or several test cards, which are arranged in the receiving device 3 with regard to its functionality, as will be described in more detail below, is furthermore arranged on the frame 2. The contact device 4 is thereby formed to electrically contact the one or the several test cards by making touch contact and to thus establish the connection to the test device 5.

[0036] The receiving device 3 is formed as drawer 6. The receiving device 3 thereby has a support frame 7, which has at least two longitudinal beams 8, which are aligned in parallel to one another and which are arranged spaced apart from one another, which are connected to one another by means of at least two cross beams 9, wherein one of the cross beams 9 has a closing element 10. The longitudinal beams 8 are advantageously mounted in a horizontally shiftable manner in a respective guide rail 11, which is arranged in the frame 2, as suggested by a double arrow 12 in FIG. 1. The frame 2 thereby has an opening 13, through which the longitudinal beams 8 are guided into the guide rails 11, which are arranged in the frame 2. The guide rails 11 thereby rest, for example, on closed side walls 14 of the frame 2 within the frame 2. The closing element 10 is formed to be so large that it completely covers the opening 13 when the drawer 6 is completely inserted into the frame 2. L-shaped holders 15, which in each case have a centering bolt 16, are furthermore arranged on the support structure 7. With a first leg, the holders 15 protrude vertically downwards from the longitudinal beams 8 and with the second, further leg, which is in particular aligned perpendicularly to the first leg and which supports the centering bolt 16, protrude laterally in the direction of the holder 15, which is arranged on the opposite longitudinal beam 8, so that the second legs are aligned essentially horizontally and lie between the longitudinal beams, in a top view onto the receiving apparatus 3.

[0037] The support frame 7 is formed to receive and to align an exchangeable support structure 17. For this purpose, FIG. 2 now additionally shows a through-shaped support structure 17, which is supplied to the receiving device 3 vertically from the top, as by means of arrows in FIG. 2, in a further operating state of the test apparatus 1. The support structure 17 is thereby formed as receiving trough, which is formed for the purpose of holding and aligning one or several test cards.

[0038] The test device 1 thereby preferably has a plurality of support structures 17 of this type, which are formed in an exchangeable manner and which can thus in each case be arranged on the receiving device 3, in order to be able to receive differently formed and/or a different number of test cards. A simple adaptation of the test device 1 to different test cards, which are to be tested, is thus possible with the help of the exchangeable support structure 17.

[0039] In particular for each of the centering bolts 16, the support structure 17 has a corresponding centering receptacle 18, into which the centering bolts 16 are inserted when the support structure 17 is attached to the receiving device 3 or the support frame 7, respectively, as shown in FIG. 2. The support structure 17 is thus advantageously aligned on the support frame 7 and is locked to the receiving device 3.

[0040] FIG. 3 shows the support structure 17, which is inserted completely into the support frame 7. As soon as the support structure 17 is arranged and held on the support frame 7, the receiving device 3 is slid horizontally into the frame 2 through the opening 13 according to the arrow illustrated in FIG. 3 with the help of the longitudinal beams 8 lying in the guide rails 11, as shown in a further step in FIG. 4. The receiving device 3 is thus shifted from a loading and unloading position, as it is shown in FIGS. 1 to 3, into a test position, in which the support structure 17 is arranged directly vertically below the contact device 4, as shown in FIG. 5. FIG. 5 shows the completely retracted receiving device 3 or drawer 6, respectively, which now completely closes the opening 13 by means of the closing element 10. The closing element 10 optionally has one or several grab handles 18, by means of which a user can manually shift the receiving device 3 from the loading and unloading position into the test position or the other way round. In the alternative or in addition, the test apparatus 1 has an actuating device 19, which has at least one first actuator 25, which comprises an electric motor, which is operatively connected to the receiving device 3 in such a way that the drawer 6 or the receiving device 3 is moved in an automated manner from the loading and unloading position into the test position and the other way round by controlling the electric motor of the first actuator 25.

[0041] As soon as the receiving device 3 or the drawer 6, respectively, has reached the test position, in which it lies directly below, thus vertically below the contact device 4, as shown in FIG. 6, the contact device is displaced vertically downwards in the direction of the test card for the purpose of making touch contact with the test card or test cards located in the receiving device 3, as shown by means of arrows in FIG. 6. For this purpose, the contact device is mounted to the frame 2 in a vertically shiftable manner According to the present exemplary embodiment, four guide bolts 20, which are aligned vertically in their longitudinal extension and which are arranged in parallel to one another, are arranged on the frame for this purpose. The guide bolts 20 are thereby in each case arranged in the frame 2 on the outer corners of the contact device 4. In the present case, the contact device 4 has a support plate 21, in which a respective guide opening 22 is formed for each of the guide bolts. The support plate 21 is thus mounted in a vertically shiftable manner in the frame along the guide bolts. On their free end facing away from the contact device 3, the guide bolts 20 in each case advantageously have a head 23 with an outer diameter, which is greater than the diameter of the guide openings 22, so that the support plate 3 is permanently held on the guide bolts 20. A spring element, in particular a helical spring, which is arranged coaxially to the respective guide bolt 20 and which pushes the support plate 21 downwards in the direction of the receiving device 3, as suggested in FIG. 5 by means of arrows, are in each case optionally arranged between the respective head and the support plate 21.

[0042] For the purpose of displacing the contact device 4, the actuating means 19 has a second actuator 26, which in particular has an electric motor for driving purposes. Arranged on each side wall 14 of the edge 2, the actuator 26 in each case furthermore has a slider 27, which is aligned in parallel to the side wall 14 and which is mounted in a shiftable manner. The respective slider 27 is operatively connected to the electric motor or to one electric motor each of the actuator 26, so that the respective slider 27 is shifted horizontally and in particular in parallel to the side walls 14 and thus also in parallel to the respective guide rail 11 by controlling the respective electric motor.

[0043] On its end facing the opening 13, the respective slider 27 has a slide guide 28. For this purpose, FIGS. 5 and 6 show a side wall 14 in a transparent manner, so that the inner workings of the test apparatus 1 in this region can be seen.

[0044] The slide guide 28 has a run-on slope 29, which has a slope in such a way that the height of the slider or of the slide guide 28, respectively, increases away from the opening 13, viewed from the free end. An entraining protrusion 30 of the contact device 4, in particular of the support plate 21, is guided on the slide guide 28. The entraining protrusion 30 thereby rests on the run-on slope 29. On each end of the run-on slope 29, the slide guide 28 moreover has a catch hook 31, 32, which is formed for the purpose of receiving the entraining protrusion 30 in a positive manner and for the purpose of preventing it from an onward movement. The entraining protrusion 30 can thus not leave the slide guide 28, and the actuator 25 is advantageously connected to the contact device 4.

[0045] In the initial state shown in FIG. 5, the entraining protrusion 30 lies in the upper catch hook 32. In the shown release position, the support plate 21 thus rests in the catch hook 32 on the slider 27 or on the run-on slope 29, respectively, on the upper end and cannot fall downwards. By controlling the actuator 25, the slider 27, as shown by means of a horizontal arrow in FIGS. 5 and 6, is now shifted backwards in the direction of the control device 5 away from the opening 13, so that the entraining protrusion 30 slides downwards on the run-on slope 29, whereby the support plate 21 is moved downwards, and the contact device 4 as a whole is moved towards the receiving device 3 or the test cards located therein, respectively, in order to electrically contact them in the lowered touch contact position through touch. The slider 27 can be displaced backwards maximally so far, until the entraining protrusion 30 is caught in the lower catch hook 31. A reliable and simple vertical displacement of the contact device 4 is thus made possible by means of the actuator 26. By means of the advantageous guidance of the support plate 21 on the guide bolts 20, it is furthermore ensured that the contact device 4 is always optimally aligned to the receiving device 3 in the test position, so that a reliable touch contact with the desired contact points of the test cards located in the receiving device 3 is ensured. The alignment of the test cards is ensured by means of the support structure 17, which is in each case optimally adapted to the test cards, as well as the centered arrangement of the support structure 17 on the support frame 7 with the help of the centering bolts 16. If the test cards are now electrically contacted, a test of the test card can be performed with the help of the test apparatus 5.

[0046] By means of the advantageous formation of the receiving device 3 and of the contact device 4, an exchange of the contact device 4 is also possible independently of the receiving device 3, in order to be able to adapt, for example, the contact device, to different tasks. The contact device 4 is in particular formed for the purpose of receiving one or several different or identical contact modules for the purpose of making touch contact with the at least one test card or the several test cards, in order to provide for a simple adaptation of the contact device 4.

[0047] In a further sectional illustration, FIG. 7 shows an advantageous further development of the test apparatus 1, wherein elements known from the preceding exemplary embodiments are provided with the same reference numerals and reference is made in this respect to the above description. A test card 37, which is arranged on the receiving device 3, is moreover shown in this exemplary embodiment.

[0048] According to the advantageous further development, the test apparatus 1 advantageously has a lifting device 32 of the actuating device 19 in the region of the contact device. The lifting device is formed for the purpose of coupling the contact device to the support structure 17 of the receiving device 3 in the test position. For this purpose, the lifting device 33 has one or several pivotable gripping levers 34, which have a slide guide for an entraining protrusion 35, which is arranged on the respective support structure 17. By rotating the respective entraining lever 34, the entraining protrusion 35 is inserted into the slide guide 36 of the lever 34, wherein the slide guide 36 is formed in such a way that the entraining protrusion 35 is moved upwards in the direction of the contact device 4 in response to the pivoting of the respective lever 34. In addition or alternatively to the vertical displacement of the contact device 4, the support structure as a whole comprising the test cards located therein can thereby be moved in the direction of the contact device 4, for the purpose of establishing the touch contact. If the lifting device 33 is additionally provided, it serves in particular for the fixed connection of contact device 4 and support structure 17 while performing a test.