SHEAROGRAPHY AND INTERFEROMETRY SENSOR WITH MULTIDIRECTIONAL DYNAMIC PHASE SHIFTING AND METHOD OF INSPECTION AND MEASUREMENT OF VIBRATION MODES
20230012001 · 2023-01-12
Inventors
- Sergio DAMASCENO SOARES (Petrópolis, BR)
- Fabiana DIAS FONSECA MARTINS (Rio de Janeiro, BR)
- Ana Lucia FAMPA SEABRA D'ALMEIDA (Rio de Janeiro, BR)
- Mauro Eduardo BENEDET (São José, BR)
- Armando ALBERTAZZI GONÇALVES JUNIOR (Florianópolis, BR)
- Analucia VIEIRA FANTIN (Florianópolis, BR)
- Daniel Pedro WILLEMANN (Laguna, BR)
- Estiven SANCHEZ BARRERA (Florianópolis, BR)
Cpc classification
H04N23/45
ELECTRICITY
G01N21/8851
PHYSICS
G01B11/16
PHYSICS
International classification
Abstract
The present invention addresses to a multidirectional dynamic phase shifting interferometry (DPSI) shearography and interferometry sensor. The present invention uses a configuration with three fixed prisms, or a single fixed three-facet optical prism constructed so as to achieve the same effect as three prisms and thus simultaneously obtain three images with phase shifting. The present invention also encompasses a method of inspection and measurement of vibration modes using said sensor.
Claims
1- A SHEAROGRAPHY AND INTERFEROMETRY SENSOR WITH MULTIDIRECTIONAL DYNAMIC PHASE SHIFTING, comprising a multidirectional measurement head interconnected, on one side, to a charging or excitation module, and, on the other side, to a lighting laser, which are supported by a fixing structure.
2- THE SHEAROGRAPHY AND INTERFEROMETRY SENSOR WITH MULTIDIRECTIONAL DYNAMIC PHASE SHIFTING according to claim 1, wherein the multidirectional measurement head comprises a digital video camera, a digital camera image sensor, an internal lens, an aperture mask, an optical prism and an objective lens.
3- THE SHEAROGRAPHY AND INTERFEROMETRY SENSOR WITH MULTIDIRECTIONAL DYNAMIC PHASE SHIFTING, according to claim 2, wherein the digital camera image sensor is of the CCD or CMOS type.
4- THE SHEAROGRAPHY AND INTERFEROMETRY SENSOR WITH MULTIDIRECTIONAL DYNAMIC PHASE SHIFTING according to claim 2, wherein the sensor is a three-facet optical prism.
5- THE SHEAROGRAPHY AND INTERFEROMETRY SENSOR WITH MULTIDIRECTIONAL DYNAMIC PHASE SHIFTING according to claim 2, further comprising three wedge-shaped optical prisms (W.sub.1-3).
6- THE SHEAROGRAPHY AND INTERFEROMETRY SENSOR WITH MULTIDIRECTIONAL DYNAMIC PHASE SHIFTING according to claim 1, comprising optical components for simultaneous measurement of shearography and DPSI, wherein said optical components are a semi-mirror or beam splitter and a first surface mirror disposed at 45°.
7- A METHOD OF INSPECTION AND MEASUREMENT OF VIBRATION MODES, using the shearography and interferometry sensor with multidirectional dynamic phase shifting as defined in claims 1 to 6, comprising: a) Positioning of said shearography and interferometry sensor with multidirectional dynamic phase shifting in front of the inspection area; b) Acquisition of the image of the reference state; c) Application of the load for excitation of the repair; d) Acquisition of the image of the structure in the deformed state (Δϕ); e) Processing of the acquired images with the presentation of the final images with the fringe maps in the three sensitivity directions for the identification of defects.
Description
BRIEF DESCRIPTION OF DRAWINGS
[0014] The present invention will be described in more detail below, with reference to the attached figures, which, in a schematic way and not limiting the inventive scope, represent examples of its embodiment. In the drawings, there are:
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DETAILED DESCRIPTION OF THE INVENTION
[0035] The present invention will be described in detail below with reference to the above-mentioned Figures, which in no way signify or represent limitations that may be imposed on the inventive scope as claimed herein. In this sense, and to facilitate the understanding of the constituent elements of the invention, the following reference list is presented: [0036] 1—Reference point [0037] 2—Bulkhead [0038] 3—Camera sensor [0039] 4—Triple lateral displacement [0040] L1—Lens [0041] W1-3—Wedge-shaped prisms [0042] 5—Reference image [0043] 6—Triple displacement image [0044] Z—Distance from aperture to camera sensor 3 [0045] 8—Combination of apertures [0046] 9—Simulation of carrier fringes [0047] 10—Fast Fourier Transform [0048] 11—Equivalent lateral displacement [0049] 12-14—Combinations of two apertures [0050] 15—Combination of three apertures [0051] *—Opposition in relation to origin [0052] A.sub.1-3—Apertures [0053] C.sub.x—Displacement on the x axis [0054] A.sub.x—Arrangement on the x axis [0055] C.sub.y—Displacement on the y axis [0056] A.sub.y—Arrangement on the y axis [0057] C.sub.xy—Displacement at −45° from the x-axis direction [0058] A.sub.xy—Arrangement on the straight line at −45° from the [0059] x-axis direction [0060] A—Arrangement at origin [0061] 16—Filtered Fast Fourier Transforms [0062] 17—Phase maps [0063] 18—Orientation of the lateral displacement [0064] 19—Reference beam [0065] 20—Mirror [0066] 22—Displaced images [0067] S.sub.y—Carrier fringes for the shearography components on the y-axis [0068] H.sub.x—Carrier fringes for the DSPI components on the y-axis [0069] H.sub.xy—Carrier fringes for DSPI components at −45° from the x-axis direction [0070] Δϕ—Phase map resulting from the difference between the deformed map (acquired after loading) and the reference map [0071] 23—Multidirectional measurement head [0072] 24—Charging or excitation module [0073] 25—Lighting laser [0074] 26—Fixing structure [0075] 27—Repair in composite material with internal defect [0076] 28—Metal Pipe with through-hole [0077] f1—Focal length 1 [0078] f2—Focal length 2 [0079] 29—Video camera [0080] 30—CCD or CMOS Image Sensor [0081] 31—Internal lens [0082] 32—Mask of apertures [0083] 33—Three-facet optical prism [0084] 34—Objective lens [0085] 35—Semi-mirror or Beam splitter [0086] 36—First surface mirror [0087] 37—Specimen [0088] 38—DSPI-Shearography multidirectional head [0089] 39—Original phase difference maps [0090] 40—Phase difference maps after applying a sine/cosine low pass filter [0091] 41—Phase difference maps after processing for phase jump removal [0092] 42—Loudspeaker [0093] 43—Circular membrane [0094] 44—Beam splitter [0095] 45—Acquired image and its two-dimensional frequency spectrum by Fast Fourier Transform [0096] 46—Extraction of the main components in the Fourier plane by applying an elliptical band pass filter [0097] 47—Resulting phase maps of each component [0098] 48—Enlarged view of a region of the phase map, showing the orientation of the carrier fringes [0099] 49—Fast Fourier Transform, DSPI-Shearography [0100] w—Out-of-plane displacement component [0101] s—Deformation field
[0102] The use of the present invention is to perform instantaneous measurements of shearography or speckle interferometry (DSPI) in multiple directions of sensitivity.
[0103] Multiple directions of shearography sensitivity (4) can be captured simultaneously using a single image (1) with the addition of a new optical component. A third wedge-shaped prism (W3) was included in the configuration to generate a third laterally displaced image, as shown in
[0104] In order to enable the separation of the three displacement components in the Fourier spectrum, three apertures are included in the optical configuration (7), as shown in
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[0106] According to the provisions (8) presented in
[0107] Each component C in the Fourier spectrum (10) corresponds to a single lateral displacement shift orientation. C.sub.x indicates a lateral displacement in the x-axis direction (10;13). C.sub.xy denotes a transverse displacement at −45° (10;14) and C.sub.xy a displacement at −135° (10;12). In this way, with only a single reference image (5), it is possible to obtain information from the three phase maps (17) simultaneously, in different displacement directions. This fact leads to an increase in speed and consequently a gain in productivity of the inspection process by shearography.
[0108] The same process is repeated for the images of the structure in the deformed state, produced by the application of a load. Therefore, from the difference between the reference image and the one after a deformation, it is possible to obtain, from a single shearography measurement, the phase difference maps referring to three different displacement directions (18). The resulting maps are shown in
[0109] With some adaptations to the configuration of multiple apertures presented above, it is possible to have an alternative configuration that allows to obtain, in a simultaneous way, results of two interferometric techniques: shearography and DSPI (Digital Speckle Pattern Interferometry).
[0110] Configuration Adaptation with Multiple Apertures for Simultaneous Measurement DSPI-Shearography:
[0111] As shown in
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[0113] With this new optical arrangement, it is possible to obtain, simultaneously, the “out-of-plane” displacement field (DSPI) and the deformation gradient (shearography) for the analyzed surface. Obtaining both results facilitates the extraction of mechanical parameters from the structure and complements the mechanical analysis.
[0114] The optical configurations detailed above are applied within the measurement heads (23) of non-destructive inspection systems.
[0115] The multidirectional head for multidirectional shearography/DPSI measurements is simply coupled to the computer by means of the specific video camera interface (29) used in the equipment, such as a USB or GigE interface. The acquisition of images is performed by means of this interface.
[0116] The inspection system is basically composed of the following components: a multidirectional measurement head (23) interconnected, on one side, to a charging or excitation module (24), and, on the other side, to a lighting laser (25), which are supported by a fixing structure (26). In addition to showing the basic components of a shearography system,
[0117] The inspection procedure using multidirectional shearography for the non-destructive analysis of composite repair can be divided into the following steps: [0118] a) Positioning the shearography system in front of the inspection area; [0119] b) Acquisition of the image of the reference state; [0120] c) Application of the load for excitation of the repair; [0121] d) Acquisition of the image of the structure in the deformed state; [0122] e) Processing (subtraction) of the acquired images with presentation of the final images with the Fringe Maps (also called Phase Difference Maps) in the three directions of sensitivity for the identification of defects by the inspector.
[0123] Since the present invention is aimed at multidirectional shearography, only the operation of the multidirectional head will be detailed below.
[0124] The multidirectional head, as illustrated in
[0125] The surface of the inspected structure reflects laser light (25) towards the multidirectional inspection head. Laser light reflected from the composite surface enters the multidirectional head through the objective lens (34), and is projected onto the image sensor (30) after passing through the internal components of the head. The internal components (31-33) are responsible for the formation of the double image and the carrier fringes in the three preferred measurement directions. The processing to obtain the shearography results is done as previously described.
[0126] For simultaneous measurement of DPSI and shearography, the optical arrangement of the system is modified with the insertion of a semi-mirror (beam splitter) (35) and a first surface mirror (36) arranged at 45° to direct the reference beam to the image sensor (30), as shown in
[0127] Several measurements using the configuration according to the present invention were performed for different specimens, and their results are shown in the figures described below. The following figures also show the experimental configuration, as well as the three simultaneous shearography/DPSI results obtained before and after the application of a low-pass filter.
[0128] The results shown in
[0129] DSPI-Shearography Simultaneous Measurement:
[0130] The measurement of the displacement component outside the plane w by Speckle Interferometry (DSPI) and, simultaneously, the measurement of the deformation field s by shearography, was validated by means of the configuration presented in
[0131] Measurement of Vibration Modes:
[0132] Additionally, measurements were made of the vibration modes of a latex membrane, painted with white matte paint, glued to the end of an acrylic tube. Vibration loading was carried out by means of a loudspeaker glued to the other end of the tube. The specimen is shown in
[0133] The images obtained were processed in the Fourier plane and the results for each vibration mode, after applying a low pass filter to reduce speckle noise, are shown in