Power supply device, a test equipment comprising a power supply device and a method for operating a power supply device

Abstract

A power supply device for a test equipment, test equipment having a power supply device and a method for operating a power supply device are described. The power supply device is configured for an at least partly capacitive load and has an output voltage provider configured to generate a target voltage, which is energized by an input supply voltage provided at an input of the power supply, wherein the target voltage generates an output supply voltage at the capacitive load, when the capacitive load is connected to an output of the power supply and a supply current monitor configured to monitor supply current flowing into the input of the power supply and to temporarily reduce the target voltage generating the output supply voltage, if a current value of the supply current exceeds a first predetermined threshold.

Claims

1. A power supply device comprising: an input operable to receive a supply current; an output; an output voltage provider configured to generate a target voltage, wherein the target voltage is provided to the output to supply an output supply voltage for an at least partly capacitive load associated with an electronic device under test; and a supply current monitor configured to monitor the supply current that flows into the input of the power supply device and to temporarily reduce the target voltage that supplies the output supply voltage, wherein the target voltage is temporarily reduced from a first value to a second value if a monitored current value of the supply current exceeds a first predetermined threshold, wherein the target voltage is energized by an input supply voltage provided at the input of the power supply device, and wherein the supply current monitor is configured to increase the target voltage from the second value to the first value if the current value of the supply current falls below the first predetermined threshold or a second predetermined threshold, and to set the second predetermined value below an initial value if a rise of the target voltage from the initial value to the first value occurs and the supply current exceeds the first predetermined threshold due to the rise.

2. The power supply device according to claim 1, wherein the second value is one of a value in a range of 0% to 60% of the first value, a value in a range of 5% to 50% of the first value, or a value in a range of 10% to 40% of the first value.

3. The power supply device according to claim 1, wherein the supply current monitor is configured to repeatedly reduce the target voltage in response to the current value of the supply current exceeding the first predetermined threshold and to repeatedly increase the target voltage in response to the current value of the supply current falling below the first predetermined threshold or the second predetermined threshold.

4. The power supply device according to claim 3, wherein the supply current monitor is configured to perform the repeated reducing and increasing of the target voltage until the output supply voltage has reached the first value of the target voltage.

5. The power supply device according to claim 2, further comprising a control input configured to receive a target voltage adjust signal that indicates the first value of the target voltage and that causes adjustment of the target voltage to the first value.

6. The power supply device according to claim 2, further comprising a voltage indication output configured to output an indication flag if the output supply voltage reaches the first value of the target voltage.

7. A test equipment for testing an electronic device, comprising: a power supply device configured to provide an output supply voltage for the electronic device to be tested, wherein the power supply device includes: an input operable to receive a supply current; an output; an output voltage provider configured to generate a target voltage, wherein the target voltage is provided to the output to supply the output supply voltage; a supply current monitor configured to monitor the supply current that flows into the input of the power supply device and to temporarily reduce the target voltage that supplies the output supply voltage if a monitored current value of the supply current exceeds a first predetermined threshold; a releasable element configured to connect the electronic device electrically to the power supply device; and at least one blocking capacitor, which is connected in parallel with the electronic device to be tested.

8. The test equipment according to claim 7, further comprising a raw power supply, which is connected to the input of the power supply device and is configured to provide an input supply voltage to the input of the power supply device to energize the target voltage and to provide the supply current to the input of the power supply device.

9. The test equipment according to claim 8, wherein the blocking capacitor is connected to a power output of the releasable element.

10. The test equipment according to claim 8, further comprising a switch for connecting the output of the power supply device to the blocking capacitor and/or the electronic device, wherein the electronic device comprises a processor, and wherein the test equipment is an automated test equipment.

11. A method for supplying an electrical power, the method comprising: generating a target voltage by using a power supply device in automated test equipment configured to supply power at a multiple of regular operating power of a device under test, wherein the generating the target voltage includes providing the target voltage to an output of the power supply device to supply an output supply voltage for an at least partly capacitive load; receiving a supply current at an input of the power supply device; monitoring the supply current that flows into the input of the power supply device; releasably connecting an electronic device electrically to the power supply device; blocking direct current with a blocking capacitor, wherein the blocking capacitor is coupled in parallel with the device under test; and temporarily reducing the target voltage if a monitored current value of the supply current exceeds a first predetermined threshold.

12. The method of claim 11, further comprising: energizing the target voltage by using an input supply voltage provided at the input of the power supply device.

13. A non-transitory digital storage medium having stored thereon a computer program for performing a method for supplying an electrical power, the method comprising: generating a target voltage by using a power supply device in automated test equipment configured to supply power at a multiple of regular operating power of a device under test, wherein the generating the target voltage includes providing the target voltage to an output of the power supply device to supply an output supply voltage for an at least partly capacitive load; receiving a supply current at an input of the power supply device; monitoring the supply current that flows into the input of the power supply device; releasably connecting an electronic device electrically to the power supply device; blocking direct current with a blocking capacitor, wherein the blocking capacitor is coupled in parallel with the device under test; temporarily reducing the target voltage if a monitored current value of the supply current exceeds a first predetermined threshold; and increasing the target voltage if a monitored current value of the supply current drops below the first predetermined threshold.

14. The non-transitory digital storage medium of claim 13, wherein the method further comprises: energizing the target voltage by using an input supply voltage provided at the input of the power supply device.

Description

BRIEF DESCRIPTION OF THE DRAWINGS

(1) Embodiments of the present invention will be described in detail, using the accompanying figures in which:

(2) FIG. 1A shows a diagram of a power supply device according to an embodiment of the present invention;

(3) FIG. 1B shows a diagram illustrating the relation between the target voltage and the output supply voltage;

(4) FIG. 2A shows a test equipment, comprising the power supply device shown in FIG. 1A and FIG. 1B;

(5) FIG. 2B shows a diagram of an example of the functionality of the power supply device; and

(6) FIG. 3 shows an exemplary flow-chart of a method for providing an output supply voltage according to an embodiment of the present invention.

DETAILED DESCRIPTION OF THE INVENTION

(7) Before the present invention will be described in more details, it is pointed out that, in the figures, functionally equal elements are provided with the same reference numbers and that a repeated description for elements provided with the same reference numbers is omitted. Hence, descriptions provided for elements having the same reference numbers are mutually exchangeable.

(8) FIG. 1A shows a block schematic diagram of a power supply device 100 for a test equipment 200 (FIG. 2A), which is configured for an at least partly capacitive load 108, according to an embodiment of the present invention.

(9) Continuing, the power supply device 100 comprises an output voltage provider 101 and a supply current monitor 103.

(10) The output voltage provider 101 is configured to generate a target voltage U.sub.N, which is energized by an input supply voltage U.sub.raw provided at an input 107 of the power supply 100, wherein the target voltage U.sub.N generates an output supply voltage U.sub.DUT at the capacitive load (C.sub.1 to C.sub.N, and 201 in FIG. 1B), when the capacitive load (C.sub.1 to C.sub.N and 201 in FIG. 1B) is connected to an output 105 of the power supply 100.

(11) The supply current monitor 103 is configured to monitor a supply current I.sub.in flowing into the input 107 of the power supply device 100. Furthermore, to temporarily reduce the target voltage U.sub.N generating the output supply voltage U.sub.DUT, if a current value of the supply current I.sub.in exceeds a first predetermined threshold T.sub.1.

(12) The target voltage U.sub.N may be produced by a controllable voltage source 109. Further, the output supply voltage U.sub.DUT for the capacitive load 108 is generated by the target voltage U.sub.N. As the target voltage U.sub.N is energized by an input supply voltage U.sub.raw of the power supply device 100, the supply current I.sub.in flowing into the input 107 of the power supply device 100 correlates with the supply current I.sub.out flowing out of the output 105 of the power supply device 100.

(13) The capacitive load 108 for the power supply device 100 may consist of an electronic device to be tested and a blocking capacitor, which are connected in parallel with respect to each other.

(14) As already described in the beginning, power supplies 100 for test equipments often have the problem that an output supply voltage U.sub.DUT provided by the power supply device 100 has to be changed (e.g., increased) by changing (e.g., increasing) the target voltage U.sub.N, which can, due to a capacitive load 108, which may comprise one or more blocking capacitors, and one or more electronic devices under test, coupled to the output 105 of such power supply device 100, result in high current peaks in an input current I.sub.in, as well as in an output current I.sub.out of such a power supply device 100. Such high current peaks can even lead to a total breakdown of the so called raw power supply which supplies the input voltage U.sub.raw and the input current I.sub.in, to the power supply device 100 for supplying one or more devices under test.

(15) The power supply device 100 shown in FIG. 1A solves this issue of having such high current peaks, which could lead to total brake down of a raw power supply supplying the power supply device 100 with the supply current I.sub.in, by monitoring the supply current I.sub.in, flowing into the input 107 of the power supply device 100. If now, due to a change of the target voltage U.sub.N of the power supply device 100, a high current peak in the supply current I.sub.in, occurs (which exceeds the predetermined threshold), the target voltage U.sub.N is reduced, which then results in an automatic reduction of the supply current I.sub.in, flowing into the input 107 of the power supply device 100. Hence, by temporarily reducing the target voltage U.sub.N, an adaption of the output supply voltage U.sub.DuT can be achieved in a very fast manner without excessive current spikes in the supply current I.sub.in, flowing into the input 107 of the power supply device 100. By preventing such current spikes, it can be ensured that a raw power supply providing the supply current I.sub.in, to the power supply device 100 does not break down, and therefore, a more stable power supply for the test equipment can be achieved compared to conventional systems.

(16) FIG. 1B shows a diagram illustrating the connection between the target voltage and the output supply voltage

(17) The target voltage U.sub.N may be an impressed voltage U.sub.N generated internal of the power supply device 100, in particular internal of the output voltage provider 101, which may be controlled by the power supply device 100, in particular by the supply current monitor 103 automatically. The target voltage U.sub.N may be produced by a controllable ideal voltage source 109, wherein the voltage U.sub.N of the voltage source 109 is independent from a current I.sub.out of the voltage source 109. If such a target voltage U.sub.N is fed to a capacitive load 108, the resulting output supply voltage U.sub.DUT at the capacitive load 108 over time depends on the capacitive load 108, on the resistance R between the voltage source 109 and the capacitive load 108, as well as on inductances L and capacities C between the voltage source 109 and the capacitive load 108. The resistance R represents the internal resistance of the output voltage provider 101 as well as the resistances of the electrical connecting lines of the supply circuit. Further, the inductance L represents all inductances of the supply circuit and the capacities C represents all capacities of the supply circuit.

(18) Further advantages and modifications of the power supply device 100 will be explained next.

(19) FIG. 2A shows a test equipment 200 according to further embodiments of the present invention as an exemplary application of the power supply device 100.

(20) The test equipment 200 for testing an electronic device 201, such as a processor 201, comprises a power supply device 100 as described herein, which is configured to provide an output supply voltage U.sub.DuT, which is used as a supply voltage U.sub.DuT for the electronic device 201, while the electronic device 201 is being tested. As can be seen from FIG. 2A, an electronic device 201 is connected to the output 105 of the power supply device 100 while a test is performed. The power supply device 100 provides the output supply voltage U.sub.DUT and an output supply current I.sub.load for supplying the device under test 200 with energy.

(21) In some embodiments, the test equipment 200 comprises at least one capacitor C.sub.1 to C.sub.N connected in parallel with the electronic device (201), while the electronic device (201) is being tested. The at least one capacitor C.sub.1 to C.sub.N acts as blocking capacitor.

(22) According to some embodiments, the test equipment 200 comprises a raw power supply 203, which is connected to the input 107 of the power supply device 100 for providing the input supply voltage U.sub.raw and the supply current I.sub.in to the input 107 of the power supply device 100.

(23) In embodiments, the test equipment 200 comprises a load resister R.sub.s which is connected between the raw power supply 203 and the input 107 of the power supply device 100. The supply current monitor 103 is configured to measure a voltage stroke at the load resistor R.sub.s to determine a value of the supply current I.sub.in.

(24) Hence, the supply current monitor 103 can be configured to monitor the supply current I.sub.in flowing into the input 107 of the power supply device 100 by continuously measuring a voltage stroke at the load resistor R.sub.s.

(25) In some embodiments, the test equipment 200 comprises a switch 205 for connecting the output 105 of the power supply device 100 to the blocking capacity C.sub.1, C.sub.2, C.sub.3 . . . C.sub.N and/or the electronic device 201.

(26) In the example shown in FIG. 2A, only one single device under test 201 is connected to the power supply device 100. However, in a typical application of the power supply device 100, the power supply device 100 may supply a plurality of devices under test 201 with the output supply voltage U.sub.DUT.

(27) As already described in the foregoing, the power supply device 100 is configured to prevent excessive current peaks in the supply current I.sub.in by temporarily reducing a target voltage U.sub.N generating the output supply voltage U.sub.DUT, if a predetermined threshold for the supply current is exceeded. The threshold may be determined, for example, in dependence on a nominal power of the raw power supply 203, in order to prevent the raw power supply 203 from breaking down due to a too high output load.

(28) According to embodiments, the test equipment 200 further comprises releasable means 208 for connecting the electronic device 201 electrically to the test equipment 200.

(29) In some embodiments, the blocking capacitor C.sub.1, C.sub.2, C.sub.3 . . . C.sub.N is connected to a power output 209 of the releasable means 208 for connecting the electronic device 201 electrically to the test equipment 200.

(30) In some embodiments the power supply device 100 is configured to set an indication flag 210 in case the output supply voltage U.sub.DUT reaches the first value V.sub.1 of the target voltage U.sub.N. In other words, the power supply device 100 is configured to set the indication flag 210 in response to the output supply voltage U.sub.DUT reaching the unreduced value of the target voltage U.sub.N.

(31) FIG. 2B shows in a diagram an example of the functionality of the power supply device 100, shown in FIGS. 1A, 1B and 2A. Herein, a target voltage U.sub.N, a resulting output supply voltage U.sub.DUT and a resulting supply current I.sub.in are shown on a common time axis.

(32) Embodiments of the present invention relate to a power supply device 100 for a capacitive load 108 in a test equipment 200 (FIG. 2A) that comprises an output voltage provider 101 and a supply current monitor 103.

(33) The output voltage provider 101 is configured to generate a target voltage U.sub.N, which is energized by an input supply voltage U.sub.raw provided at an input 107 of the power supply 100, wherein the target voltage U.sub.N generates an output supply voltage U.sub.DUT at the capacitive load 108 (C.sub.1, C.sub.2, C.sub.3 . . . C.sub.N, and 201 in FIG. 2A), when the capacitive load 108 (C.sub.1, C.sub.2, C.sub.3 . . . C.sub.N, and 201 in FIG. 2A) is connected to an output 105 of the power supply 100.

(34) Continuing, the supply current monitor 103 is configured to monitor a supply current I.sub.in, flowing into the input 107 of the power supply device 100. Furthermore, the supply current monitor 103 is configured to temporarily reduce a target voltage U.sub.N generating the output supply voltage U.sub.DuT, if a current value of the supply current I.sub.in, exceeds a predetermined threshold T.sub.1.

(35) Starting at time t.sub.1 the target voltage U.sub.N jumps from an initial value V.sub.init to a first value V.sub.1 in order to raise the output supply voltage U.sub.DUT from the initial value V.sub.init to a first value V.sub.1. As an example, the initial value is 0.9 volts and the first value is 1.3 volts. This causes the output supply voltage U.sub.N to increase rapidly. Furthermore, this generates a rapid increase of the supply current I.sub.in, flowing into the input 107 of the power supply device 100. At time t.sub.2 the supply current I.sub.in, exceeds the first predetermined threshold T.sub.1. Therefore the nominal voltage U.sub.N or the target voltage U.sub.N is reduced from the first value V.sub.1 to a second value V.sub.2. This slows down the increase of the output supply voltage U.sub.DuT and limits the supply current I.sub.in. Hence, an excessive current peak is prevented.

(36) In some embodiments, the supply current monitor 103 is configured to increase the target voltage U.sub.N from the second value V.sub.2 to the first value V.sub.1 if the value of the supply current I.sub.in falls below the first predetermined threshold T.sub.1 or falls below a second predetermined threshold.

(37) In the example, at time t.sub.3 the supply current I.sub.in, falls below the first predetermined threshold T.sub.1. Therefore, the target voltage U.sub.N is set back to the first value V.sub.1 (in this example 1.3 volts), which leads to an increasing of the supply current I.sub.in, but this increasing is limited the same way as before by the supply current monitor 103 by temporarily reducing the target voltage U.sub.N from the first value V.sub.1 to the second value V.sub.2 during the time interval from t.sub.4 to t.sub.5.

(38) As already mentioned, the reduction of the target voltage U.sub.N only happens temporarily, for example, at least as long as the supply current I.sub.in, is bigger than the predetermined threshold T.sub.1 such that after the supply current I.sub.in, has fallen below the predetermined threshold T.sub.1, the target voltage U.sub.N is again increased from the second value V.sub.2 to the first value V.sub.1 to ensure that after the complete optimization process the output supply voltage U.sub.DUT reaches the first value V.sub.1 of the target voltage U.sub.N, which is desired to be achieved.

(39) If the supply current monitor 103 is configured to increase the target voltage U.sub.N from the second value V.sub.2 to the first value V.sub.1 again, if the value of the supply current falls below a second predetermined threshold T.sub.2, which is lower than the first predetermined threshold T.sub.1, a hysteresis function is implemented, wherein the first threshold T.sub.1 for reducing the target voltage U.sub.N is higher than the second threshold T.sub.2 for increasing the target voltage U.sub.N.

(40) Such a hysteresis can be used, for example for preventing a too often switching of the target voltage between the first value V.sub.1 and the second value V.sub.2 and vice versa.

(41) In some embodiments, the supply current monitor 103 is configured to repeatedly reduce the target voltage U.sub.N in response to the current value of the supply current I.sub.in exceeding the predetermined first threshold T.sub.1 and to repeatedly increase the target voltage U.sub.N in response to the current value of the supply current I.sub.in falling below the predetermined first threshold T.sub.1 or the second predetermined threshold T.sub.2.

(42) This means, that the supply current monitor 103 is configured to repeat this process of decreasing and increasing the target voltage U.sub.N from the first value V.sub.1 to the second value V.sub.2 and from the second value V.sub.2 to the first value V.sub.1 until the output supply voltage U.sub.DUT reaches the first value V.sub.1. In other words, the supply current monitor 103 is configured to reduce the target voltage U.sub.N repeatedly, when the value of the supply current I.sub.in exceeds the first predetermined threshold T.sub.1 and increase the target voltage U.sub.N again, when the value of the supply current I.sub.in falls below the first predetermined threshold T1 or the second predetermined threshold T.sub.2.

(43) Furthermore, as exemplarily shown in the example of FIG. 2B, the supply current monitor 103 is configured to reduce the target voltage U.sub.N from a first value V.sub.1 to a second value V.sub.2, wherein the second value V.sub.2 is in a range of 0% to 60% of the first value V.sub.1, advantageously in a range of 5% to 50% of the first value V.sub.1, most advantageously in a range of 10% to 40% of the first value V.sub.1.

(44) In some embodiments, the supply current monitor 103 is configured in such way that, in case a rise of the target voltage U.sub.N from an initial value V.sub.init the first value V.sub.1 occurs and the supply current I.sub.in exceeds the predetermined first threshold T.sub.1 due to the rise, the second predetermined value V.sub.2 is set below the initial value V.sub.init.

(45) In the example shown in FIG. 2B, such an initial value V.sub.init of the target voltage is 0.9 volts, which may be also the initial value of the output supply voltage U.sub.DUT. Furthermore, the second value V.sub.2 in the example is 0.65 volts, which is lower than the initial value V.sub.init. By having the second value V.sub.2 lower than the initial value V.sub.init, it can be achieved that after reducing the target voltage U.sub.N from the first value V.sub.1 to the second value V.sub.2, the supply current I.sub.in decreases very fast.

(46) According to an embodiment, the power supply device 100 is configured to receive a target voltage adjust signal 207 (see FIG. 2A) indicating the first value V.sub.1 for the target voltage U.sub.N and to adjust the target voltage U.sub.N to the first value V.sub.1 indicated in the output voltage adjust signal 207, when receiving the output voltage adjust signal 207.

(47) In other words, the power supply device 100 is configured to change, in response to a reception of the output voltage adjust signal 207 the target voltage U.sub.N of the power supply device 100. Furthermore, the power supply device 100 may, but does not need, to receive the second value V.sub.2 of the target voltage U.sub.N to which the target voltage U.sub.N is reduced, when the supply current I.sub.in, exceeds the predetermined threshold T.sub.1, as the supply current monitor 103 may be capable of determining the second value V.sub.2 based on the first value V.sub.1 indicated in the output voltage adjust signal 207 and/or in dependence on the initial value V.sub.init of the target voltage U.sub.N, which was set before the power supply device 100 received the output voltage adjust signal 207 (FIG. 2A).

(48) In an embodiment of the invention, a self-adapting power supply device 100 solves the issues described in the introductory part of the application. The power supply device 100 keeps the output voltage stable throughout all stages of the power ramping and automatically generates a steepness-limited limited ramp which avoids overload.

(49) In the power supply device 100, a measuring unit (see supply current monitor 103) continuously measures the input current or supply current I.sub.in. In case of over currents, the nominal output voltage (the target voltage U.sub.N) will be decreased by a certain amount to lower the output voltage Up.sub.DUT. This decrease can be established very quickly by the output voltage provider 101. The output voltage provider 101 may be, for example, a switch voltage regulator or may be also a linear voltage regulator.

(50) Due to speed limitations of the output stage of the power supply device 100, the output voltage (the output supply voltage U.sub.DUT) can hardly follow the decrease. Therefore, in the very first moment, the output voltage U.sub.DUT just stays stable (or even increases) and provide a further increase of the charge current I.sub.1, I.sub.2, I.sub.3 . . . I.sub.N into the blocking capacitors C.sub.1, C.sub.2, C.sub.3 . . . C.sub.N. However, after a certain amount of time, the input current (the supply current I.sub.in) starts to decrease and when it falls below a certain threshold (the first predetermined threshold T.sub.1), the nominal voltage (the target voltage U.sub.N) is set to the higher level again by the supply current monitor 103. This leads to a restarting of the charging process of the blocking capacitors C.sub.1, C.sub.2, C.sub.3 . . . C.sub.N possibly producing a further input current spike in the supply current I.sub.n. If now further current spike occurs in the supply current I.sub.in, the above procedure will simply be repeated, with the effect of limiting the current again, but at a higher level of the output supply voltage U.sub.DUT. This procedure will be automatically repeated as often as necessitated until the output supply voltage U.sub.DUT finally reaches its nominal value (the target voltage U.sub.N). By this effect, a desired output supply voltage U.sub.DUT can be generated as fast as possible and overload conditions for the raw power supply 203 may be avoided. This procedure can be executed by the power supply device 100 completely automatic and does neither require any programming nor any operator control. As already mentioned, just an indication flag can be generated to notify the test engineer that this optimization process has happened.

(51) FIG. 3 shows a flow-chart of a method 400 according to an embodiment of the present invention for supplying an electrical power to an at least partly capacitive load 108 (C.sub.1, C.sub.2, C.sub.3 . . . C.sub.N and 201 in FIG. 2A) in a test arrangement 200 (FIG. 2A) with a power supply device 100.

(52) The method 400 comprises a step 401 of generating a target voltage U.sub.N, which is energized by an input supply voltage U.sub.raw provided at an input 107 of the power supply device 100, wherein the target voltage U.sub.N generates an output supply voltage U.sub.DUT at the capacitive load 108 (C.sub.1, C.sub.2, C.sub.3 . . . C.sub.N and 201 in FIG. 2A), when the capacitive load 108 (C.sub.1, C.sub.2, C.sub.3 . . . C.sub.N and 201 in FIG. 2A) is connected to an output 105 of the power supply device 100.

(53) Furthermore, the method 400 comprises a step 403 of monitoring a supply current I.sub.in, flowing into the input 107 (FIGS. 1A and 2A) of the power supply device 100.

(54) Furthermore, the method 400, comprises a step 405 of temporarily reducing the target voltage U.sub.N generating the output supply voltage U.sub.DUT if a current value of the supply current I.sub.in exceeds a first predetermined threshold T.sub.1 (FIG. 2B).

(55) The method 400 can be performed, for example, using the power supply device 100 described in conjunction with the FIGS. 1A, 1B, 2A and 2B.

(56) The method 400 may be supplemented by any features of the power supply 100 and/or the test equipment as described herein.

(57) Depending on certain implementation requirements, embodiments of the invention can be implemented in hardware or in software. The implementation can be performed using a non-transitory storage medium such as a digital storage medium, for example a floppy disc, a DVD, a Blu-Ray, a CD, a ROM, a PROM, and EPROM, an EEPROM or a FLASH memory, having electronically readable control signals stored thereon, which cooperate (or are capable of cooperating) with a programmable computer system such that the respective method is performed. Therefore, the digital storage medium may be computer readable.

(58) Some embodiments according to the invention comprise a data carrier having electronically readable control signals, which are capable of cooperating with a programmable computer system, such that one of the methods described herein is performed.

(59) Generally, embodiments of the present invention can be implemented as a computer program product with a program code, the program code being operative for performing one of the methods when the computer program product runs on a computer. The program code may, for example, be stored on a machine readable carrier.

(60) Other embodiments comprise the computer program for performing one of the methods described herein, stored on a machine readable carrier.

(61) In other words, an embodiment of the inventive method is, therefore, a computer program having a program code for performing one of the methods described herein, wherein the computer program runs on a computer.

(62) A further embodiment of the inventive method is, therefore, a data carrier (or a digital storage medium, or a computer-readable medium) comprising, recorded thereon, the computer program for performing one of the methods described herein. The data carrier, the digital storage medium or the recorded medium are typically tangible and/or non-transitionary.

(63) A further embodiment of the invention method is, therefore, a data stream or a sequence of signals representing the computer program for performing one of the methods described herein. The data stream or the sequence of signals may, for example, be configured to be transferred via a data communication connection, for example, via the internet.

(64) A further embodiment comprises a processing means, for example, a computer or a programmable logic device, configured to, or adapted to, perform one of the methods described herein.

(65) A further embodiment comprises a computer having installed thereon the computer program for performing one of the methods described herein.

(66) A further embodiment according to the invention comprises an apparatus or a system configured to transfer (for example, electronically or optically) a computer program for performing one of the methods described herein to a receiver. The receiver may, for example, be a computer, a mobile device, a memory device or the like. The apparatus or system may, for example, comprise a file server for transferring the computer program to the receiver.

(67) In some embodiments, a programmable logic device (for example, a field programmable gate array) may be used to perform some or all of the functionalities of the methods described herein. In some embodiments, a field programmable gate array may cooperate with a microprocessor in order to perform one of the methods described herein. Generally, the methods may be performed by any hardware apparatus.

(68) While this invention has been described in terms of several embodiments, there are alterations, permutations, and equivalents which will be apparent to others skilled in the art and which fall within the scope of this invention. It should also be noted that there are many alternative ways of implementing the methods and compositions of the present invention. It is therefore intended that the following appended claims be interpreted as including all such alterations, permutations, and equivalents as fall within the true spirit and scope of the present invention.