PATTERNED METALLIZATION FOR HYBRID METAL-SEMICONDUCTOR MIRROR OF HIGH REFLECTIVITY
20200313394 ยท 2020-10-01
Inventors
- Alexandre Laurain (Tucson, AZ, US)
- Jerome V. Moloney (Tucson, AZ, US)
- Patrick Kokou Gbele (Tucson, AZ, US)
Cpc classification
H01S5/18383
ELECTRICITY
H01S5/18377
ELECTRICITY
H01S5/0216
ELECTRICITY
International classification
H01S5/183
ELECTRICITY
H01S5/04
ELECTRICITY
Abstract
A reflector for optical devices is disclosed. The reflector includes a distributed Bragg reflector and a metal reflector. The metal reflector is contained within one or more apertures defined by a material having good adhesion to a semiconductor material. method for bonding the resulting structure to a heat spreader is also disclosed.
Claims
1. A laser device comprising: a first reflector; a semiconductor gain medium; a distributed Bragg reflector; a first metal layer in direct contact with the distributed Bragg reflector, the first metal layer including a reflective metal having a reflectance of greater than 97% at a predetermined wavelength; a second metal layer in direct contact with the first metal layer; a third metal layer in direct contact with the second metal layer; a layer of indium in direct contact with the third metal layer; and a heat spreader in thermal contact with the layer of indium.
2. The device of claim 1, wherein the distributed Bragg reflector includes a phase matching layer and the first metal layer is in direct contact with the phase matching layer.
3. The device of claim 1, wherein the first metal layer is gold.
4. The device of claim 1, wherein the first metal is selected from the group of silver and aluminum and the second metal is selected from the group of platinum and cobalt.
5. The device of claim 1, wherein the first and third metal layers are gold.
6. The device of claim 1, wherein the heat spreader includes a material selected from the group of CVD diamond, sapphire, and a semiconductor material.
7. The device of claim 1, further comprising a layer of titanium or chromium having a front side in direct contact with the distributed Bragg reflector and a back side, said layer of titanium or chromium defining one or more apertures, wherein said first metal layer is disposed within said apertures such that said first metal layer makes direct contact with the phase matching layer in a region within the one or more apertures.
8. The device of claim 7, wherein said first metal layer is also in direct contact with the back side of the layer of titanium or chromium in a region outside of the one or more apertures.
9. A reflector for an optical device, comprising: a distributed Bragg reflector; a metal matrix having a front side in direct contact with the distributed Bragg reflector, the metal matrix defining one or more apertures; and a layer of reflective metal having a reflectance of greater than 97% at a predetermined wavelength at normal incidence in direct contact with the distributed Bragg reflector through the apertures.
10. The reflector of claim 9, wherein the layer of reflective metal is gold.
11. The reflector of claim 9, wherein the reflective metal is selected from the group of silver and aluminum.
12. The reflector of claim 9, wherein the metal matrix is titanium or chromium.
13. The reflector of claim 9, wherein the distributed Bragg reflector includes a phase matching layer with which the metal matrix and the layer of reflective metal make contact.
14. The reflector of claim 9, further comprising a layer of platinum in direct contact with a back side of the reflective metal.
15. The reflector of claim 14, wherein the layer of platinum has a back side, and wherein the reflector includes a layer of gold in direct contact with the layer of indium.
16. The reflector of claim 15, further comprising a heat spreader in direct contact with the layer of indium.
17. The reflector of claim 9, wherein the metal matrix has a back side, and wherein the layer of reflective metal also directly contacts the back side of the metal matrix outside of the area of the apertures.
18. The device of claim 9, wherein the material of the metal matrix has a reflectance of less than 62% at the predetermined wavelength at normal incidence.
19. A method of fabricating a reflector for an optical device, the method comprising: on a semiconductor substrate, forming a distributed Bragg reflector; on the distributed Bragg reflector, forming a metal matrix defining a plurality of apertures; and on the distributed Bragg reflector in the area of the apertures, forming a layer of reflective metal having a reflectance of 97% at a predetermined wavelength.
20. The method of claim 19, wherein the reflective metal is gold and the metal matrix is titanium.
21. The method of claim 19, further comprising forming, on a back side of the layer of reflective metal, a layer of platinum, a layer of gold, and a layer of indium.
Description
BRIEF DESCRIPTION OF THE DRAWINGS
[0016] The following disclosure will be better understood in reference to the following accompanying generally not-to-scale Drawings, of which:
[0017]
[0018]
[0019]
[0020]
[0021]
[0022]
[0023]
[0024] Generally, the sizes and relative scales of elements in Drawings may be set to be different from actual ones to appropriately facilitate simplicity, clarity, and understanding of the Drawings. For the same reason, not all elements present in one Drawing may necessarily be shown in another.
DETAILED DESCRIPTION
[0025] In accordance with examples of embodiments of the present invention, methods and apparatus are disclosed for providing a hybrid metal-DBR reflector for high powered lasers, which greatly reduces the thickness of the reflector over conventional DBRs, while solving the adhesion problem present in conventional solutions. Additionally, systems and methods are disclosed which enable durable bonding of the resultant structure to a heat spreader without risk of indium diffusion lowering the reflectivity of the metal reflector.
[0026] Referring to
[0027]
[0028] Next, a positive photoresist layer 210 is deposited onto the semiconductor substrate 205. Next, the positive photoresist is exposed (illustrated as 215) through a photolithography mask having the geometry illustrated above to
[0029] In the resulting structure, on the circular spots 235, the semiconductor 205 is in contact with pure gold, forming the highly reflective hybrid-mirror. In the area outside of the circular apertures 235, the remaining semiconductor surface area is in direct contact with titanium which has a much stronger bond with GaAs, which ensures a good adhesion of the deposited metal film. This occurs because the circular gold spots within the titanium apertures 250 are supported from the sides by the titanium matrix, as well as the portion of gold layer 240 that is deposited onto the thin 20 nm gold layer 230, which is deposited onto the titanium layer 225. The portion of layer 240 that overlays the thin gold layer 230 and the titanium layer 225 benefits from strong gold to titanium adhesion outside of the circular regions 235, which helps tack the circular gold portions into place on the semiconductor substrate 205. Additionally, in the final structure, the circular gold reflector portions of layer 240 are completely encapsulated and embedded in the additional layers, which helps the gold adhere to the semiconductor. The Platinum layer 245, which is deposited both over the titanium layer and the circular spots, acts as a barrier to prevent the indium solder 255 from interdiffusing with the 200 nm gold layer 240, which would decrease the reflectivity over time. The last 100 nm of gold 250 ensures an excellent adhesion with the indium solder.
[0030]
[0031] In certain embodiments, after the patterned metallization set forth above with respect to
[0032] The processing technique set forth above provides a reflectivity of >99.95% on the gold spots at a wavelength of 1000 nm. This reflectivity is accomplished with only 12 pairs of quarter wavelength AlAs/AlGaAs layers, whereas a stand-alone semiconductor DBR would require 24 pairs to reach a similar reflectivity. When a thermal stress is applied to the structure, for example by the absorption of an intense laser beam or by the excitation with a strong electrical current, the surrounding area metallized with Titanium keeps the semiconductor structure in contact with the gold layer, preserving the integrity of the gold reflector. This concept of tacking a small reflective area to a semiconductor structure using a surrounding metal matrix has particular application in high power, solid state lasers. For example, metal-DBR hybrid reflectors can be integrated in a VECSEL as a bottom reflector, where the inherent low gain requires highly reflective mirrors. In the case of an optically pumped VECSEL, a gold reflector is even more advantageous as it may be used to reflect the pump wavelength in addition to the lasing wavelength. By recycling the pump light in this manner, the efficiency of the laser is increased, which allows a design of the gain medium with a shorter absorbing region, which is critical for ultra-short pulse generation.
[0033] Portions of such a device are depicted schematically in
[0034]
[0035] One of the improvements provided by the hybrid-DBR is the increased reflectivity bandwidth around the signal wavelength, as it takes advantage of the very broadband reflectivity of gold. For example, when compared to a standard full size 24 pairs DBR, the bandwidth at which the reflectivity is above 99.9% is increased by more than 23%. This provides a major improvement as the tunability range of a laser may be limited by the stopband and a broader range may allow for a shorter pulse generation in a modelocked VECSEL.
[0036] The reflectivity outside the DBR stop-band is also enhanced and exhibits broader interference fringes. A broader and higher reflectivity at shorter wavelengths may be fully exploited to reflect a pump wavelength with a large acceptance wavelength and angle. The Figure below shows a reflectivity spectrum simulation of a VECSEL structure comparing a standard 24 pairs DBR, and with a hybrid minor.
[0037] Additionally, a shorter DBR also leads to a lower thermal impedance of the device since semiconductor materials have a poor thermal conductivity compared to metals and diamond. For example, a thermal impedance decrease >30% is expected in a hybrid-DBR VECSEL structure of the current invention, when compared to a full size DBR structure.
[0038] While the examples set forth above are based on GaAs-based systems, the invention is not so limited. Hybrid mirrors and the metal-to-indium bonding methods of embodiments of the invention may be used with other semiconductors such as InP or GaSb for improved performances at other wavelengths (telecom bands, mid-infrared, etc.). Moreover, while the examples above use gold as the metal reflector, any metal having greater than 97% reflectivity at a predetermined design wavelength would be acceptable, including, for example, silver or aluminum. Additionally, while the mask or matrix described in reference to the examples above is titanium, other materials with good adhesion to semi-conductor materials, such as chromium, would be acceptable. Also, while the heat spreader described above is CVD diamond, other heat spreader materials, e.g., sapphire, glass, or semiconductor materials, are also acceptable for certain applications. Finally, while the metal-DBR hybrid reflector embodiments have been described as having particular advantages when used as VECSEL bottom reflectors, such structures have other applications in optics as well, for example, as reflectors for other solid-state laser architectures or for optical telecommunications applications. For example, a hybrid DBR according to the invention could be used as a saturable absorber mirror (SESAM) for the modelocking of numerous high power laser architectures (fiber, solid state, semiconductor). In such an application, one or multiple QWs would be arranged in front of the DBR (in place of the gain region in the laser architectures described above). The improved bandwidth and reduced thermal impedance of the inventive reflection would be a clear advantage for short pulse generation.
[0039] Additionally, while the exemplary reflector described above, and depicted specifically in
[0040] Moreover, while the metal reflectors have been described herein as circular, this is not a requirement. The matrix pattern (and the resultant reflectors) can be designed to select a chosen transverse mode distribution. In these embodiments, the shape of the matrix is adjusted to the field distribution of the mode selected, to ensure a high reflectivity at the field maxima and a low reflectivity at the field minima. The transverse mode discrimination is provided by the lower spatial overlap of the other modes with the highly reflective area, and by the lower pump reflection on the matrix. Exemplary matrix patterns for the selection of a Laguerre-Gauss mode LG01 and for a Hermite-Gauss mode TEM11 are given in
[0041] While the invention is described through the above-described exemplary embodiments, of which greater detail is provided in Appendix A, it will be understood by those of ordinary skill in the art that modifications to, and variations of, the illustrated embodiments may be made without departing from the inventive concepts disclosed herein. Accordingly, the invention should not be viewed as being limited to the disclosed embodiment(s).