METHOD FOR DIAGNOSING STATE OF CAPACITOR IN MODULAR CONVERTER

Abstract

The present invention relates to a method for diagnosing the state of the capacitor in a modular converter. The method for diagnosing the state of the capacitor in a modular converter includes determining a FIT table depending on the input voltage and temperature of an internal capacitor for multiple sample modular converters; detecting, by an input voltage detection unit, the input voltage of the capacitor in a target modular converter, the state of the capacitor of which is to be diagnosed, during a preset period; detecting, by a temperature detection unit, the temperature of the capacitor of the target modular converter during the preset period; calculating the cumulative mean for the input voltage and the temperature, which are respectively detected by the input voltage detection unit and the temperature detection unit during the preset period; and selecting, by a control unit, a FIT value corresponding to the cumulative mean of the input voltage and the temperature, from the FIT table; and extracting the MTBF of the capacitor from the FIT table.

Claims

1. A method for diagnosing a state of a capacitor in a modular converter, comprising: setting a Failures in Time (FIT) table depending on an input voltage and a temperature of an internal capacitor for multiple sample modular converters; detecting, by an input voltage detection unit, an input voltage of a capacitor in a target modular converter, a state of the capacitor of which is to be diagnosed, during a preset period; detecting, by a temperature detection unit, a temperature of the capacitor of the target modular converter during the preset period; calculating a cumulative mean for the input voltage and the temperature, which are respectively detected by the input voltage detection unit and the temperature detection unit during the preset period; selecting, by a control unit, a FIT value, corresponding to the calculated cumulative mean for the input voltage and temperature, from the FIT table; and extracting a Mean Time Between Failures (MTBF) of the capacitor from the FIT value.

2. The method of claim 1, wherein the setting the FIT table comprises: determining a FIT value based on an input voltage and a temperature of the capacitor for each of the multiple sample modular converters; generating a FIT graph from the determined FIT value for each of the multiple sample modular converters; and setting the FIT table by extracting a FIT value, corresponding to preset ranges of the input voltage and temperature, from the FIT graph.

3. The method of claim 1, wherein the extracting the MTBF comprises: calculating a failure rate (λ) for the multiple sample modular converters using (N=N.sub.0×e.sup.−λt); and extracting the MTBF from the failure rate (λ) and the FIT value, using (MTBF=λ×FIT value).

4. The method of claim 1, further comprising after the extracting the MTBF, generating a warning sound when a failure occurrence time, predicted based on the extracted MTBF of the capacitor, arrives.

Description

DESCRIPTION OF DRAWINGS

[0016] FIG. 1 is a block diagram of the apparatus for diagnosing the state of a capacitor in a modular converter according to the present invention;

[0017] FIG. 2 is a graph for describing the process of generating Failures In Time (FIT) according to the present invention; and

[0018] FIG. 3 is a flowchart illustrating the method for diagnosing the state of a capacitor in a modular converter according to the present invention.

BEST MODE

[0019] Hereinafter, some embodiments of the present invention will be described in detail with reference to exemplary drawings. Reference should now be made to the drawings, in which the same reference numerals are used throughout the different drawings to designate the same or similar components. In the following description, it is to be noted that, when the functions of conventional elements and the detailed description of elements related with the present invention may make the gist of the present invention unclear, a detailed description of those elements will be omitted.

[0020] It will be understood that, although the terms “first,” “second,” “A,” “B,” “(a),” “(b),” etc. may be used herein to describe various elements, these terms are only used to distinguish one element from another element, and the essentials or the order of these elements should not be limited by these terms. When a first element is described as being “connected,” “combined,” or “coupled” to a second element, it should be understood that the first element may be directly connected or coupled to the second element, or that another element may alternatively be “connected,” “combined” or “coupled” therebetween.

[0021] FIG. 1 is a block diagram of an apparatus for diagnosing the state of a capacitor in a modular converter according to an embodiment of the present invention.

[0022] Referring to FIG. 1, a modular converter according to an embodiment of the present invention may be applied to, for example, an HVDC system or a STATCOM device. In this case, the modular converter is supplied with a high voltage and stores the same in the internal capacitor thereof. Because the state of such a capacitor is changed depending on the input voltage and the temperature, an object of the apparatus for diagnosing the state of a capacitor according to the present invention is to diagnose the state of the capacitor.

[0023] To this end, the apparatus for diagnosing the state of a capacitor in a modular converter according to the present embodiment is configured to include an input voltage detection unit 110 for detecting the voltage input to the capacitor, a temperature detection unit 120, installed so as to be in contact or not in contact with the capacitor, for detecting the temperature of the capacitor, a calculation unit 130 for receiving the input voltage and the temperature, respectively detected by the input voltage detection unit 110 and the temperature detection unit 120, cumulatively adding the received input voltage and temperature during a preset time period, and calculating the cumulative mean of the cumulatively added values, and a control unit 140 for extracting an MTBF from the cumulative mean.

[0024] The input voltage detection unit 110 detects the input voltage, which is input to the capacitor from the front thereof. Here, the input voltage means the magnitude of the voltage supplied to the capacitor, which is different from the charging voltage of the capacitor. Also, the temperature detection unit 120 detects the temperature of the capacitor while in contact with the capacitor, or alternatively detects the temperature of the capacitor or the ambient temperature without being in contact therewith.

[0025] Here, in order to extract the MTBF of the capacitor from the cumulative mean of the input voltage and temperature, the present invention uses a Failure In Time (FIT) table for a modular converter. The FIT table is a table in which FIT values are defined based on the temperature and input voltage of a capacitor in a modular converter, which is the same product as the modular converter, the state of the capacitor of which is to be diagnosed. Here, a FIT value is a value that defines the time at which a failure occurs in the capacitor of the corresponding modular converter. That is, it is the fault occurrence time based on the temperature and input voltage of the capacitor of a modular converter. This FIT table may be determined based on reliable data on capacitor products produced by a manufacturer. Alternatively, in another example, the temperature and input voltage are measured through multiple experiments targeted at a plurality of the same modular converter products, and the time at which a fault occurs is measured based on the measured values, whereby the FIT table based on the temperature and input voltage of a capacitor of the corresponding modular converter may be determined.

[0026] Therefore, in the method for diagnosing the state of a capacitor in a modular converter according to the present invention, a FIT table for the modular converter, the state of the capacitor of which is to be diagnosed, is prepared in advance, and a FIT value is extracted by applying the cumulative mean of the temperature and input voltage of the capacitor of the corresponding modular converter to the FIT table, whereby the MTBF corresponding to the FIT value is extracted. Here, the Mean Time Between Failures (MTBF) is the arithmetic mean time between failures when a component, a device, or a system operates, and means the mean interval between failures. This MBTF is one of the indicators for representing how reliable a component, a device, or a system is, and the higher the MBTF, the higher the reliability.

[0027] Meanwhile, the present embodiment may further include a warning generation unit 150, and the warning generation unit 150 determines whether a fault occurrence time, predicted based on the MTBF of the capacitor, extracted by the control unit 140, has arrived, and generates a warning sound when the fault occurrence time arrives. This is intended to prompt the performance of preventive repairs, replacement, or inspection via the warning sound when the fault occurrence time, predicted based on the MTBF of the capacitor, arrives.

[0028] FIG. 2 is a graph for describing the process of generating a FIT table according to the present invention.

[0029] Referring to FIG. 2, in order to generate a FIT table according to the present invention, multiple sample modular converters are arranged, and a FIT value is determined based on the temperature and input voltage of the capacitor for each of the sample modular converters. Here, the larger the number of sample modular converters, the more reliable the FIT table. The FIT graph is generated from the FIT values for the sample modular converters using a program. In the present embodiment, the control unit 140 generates a 2-dimensional graph, the X axis and the Y axis of which are the input voltage and temperature, from the multiple FIT values using a predetermined program. Using this graph, a FIT table is generated based on the range of the temperature and input voltage. FIG. 2 shows an example of the FIT table in which the temperature ranges from 55 to 85° and the input voltage ranges from 15 to 27 kV. These ranges may be changed depending on the capacity of the capacitor to be measured.

[0030] FIG. 3 is a flowchart illustrating the method of diagnosing the state of a capacitor in a modular converter according to the present invention.

[0031] Referring to FIG. 3, the method for diagnosing the state of a capacitor in a modular converter according to the present invention intends to diagnose the state of a capacitor of a modular converter that is applied to, for example, an HVDC system or a STATCOM device. First, a FIT table is set depending on the input voltage and temperature of capacitors of multiple sample modular converters at step S101. That is, as described above, a FIT value depending on the input voltage and temperature of a capacitor is determined for each of the multiple sample modular converters, and the FIT graph is generated from the FIT value for each of the sample modular converters. When the FIT table is set, the input voltage detection unit 110 measures the input voltage of a capacitor of a target modular converter, the state of the capacitor of which is to be diagnosed, at preset regular intervals at step S103, and the temperature detection unit 120 measures the temperature of the capacitor to be diagnosed at the preset regular intervals at step S105. Here, steps S103 and S105 may be performed in an arbitrary order, or they may be performed in the same time.

[0032] Subsequently, the calculation unit 130 calculates the cumulative mean of the multiple values, acquired by measuring the input voltage and temperature at the preset regular intervals at step S107. The cumulative mean is the arithmetic mean of the input voltage and the temperature, which are measured and cumulatively added at a preset regular interval. Then, at step S109, the control unit 140 selects the FIT value corresponding to the cumulative mean from the FIT table, which is set at step S101. Subsequently, the control unit 140 extracts the MTBF of the capacitor from the selected FIT value at step S111. Then, whether a fault occurrence time, predicted from the extracted MTBF of the capacitor, has arrived is determined at step S113. Here, when it is determined that the fault occurrence time has arrived, a step of generating a warning sound (S115) may be further included. This serves to prompt for the performance of operations such as preventive repairs, replacement, inspection, or the like via the warning sound when a fault occurrence time, predicted based on the extracted MTBF, arrives while the capacitor is in use.

[0033] Hereinafter, the process of extracting an MTBF is described. In an embodiment of the present invention, a failure rate (λ) for the multiple sample modular converters is calculated. The failure rate (λ) is calculated using the following Equation 1:

N=N.sub.0×e.sup.−λt  [Equation 1]

[0034] where N.sub.0 denotes the number of multiple sample modular converters, N denotes the number of modular converters that remain in a normal state after an experiment, λ denotes the failure rate, and t denotes the experiment time.

[0035] The failure rate λ may be calculated using the number of modular converters that remain in a normal state without a fault after a preset time t has passed, among the multiple sample modular converters. An MTBF is extracted from the calculated failure rate λ and the selected FIT value, using the following Equation 2:

MTBF=λ×FIT value  [Equation 2]

[0036] The calculated MTBF becomes the criterion for determining how often a fault occurs, on average, in the capacitor of the corresponding modular converter. Therefore, in the present invention, the current state of the capacitor may be diagnosed using the MTBF, and when a fault occurrence time, predicted based on the MTBF, arrives, a process such as maintenance, inspection, or replacement is performed, whereby an accident that may arise from the fault of the capacitor in the modular converter may be prevented in advance.

[0037] As described above, although all components constituting an embodiment of the present invention have been described as being combined into one element or being operated as a single unit, the present invention is not limited thereto. That is, all components may be selectively combined into one or more components and operated. Also, the terms such as “include,” “comprise,” or “have” specify the presence of the stated element but do not preclude the addition of one or more other elements unless otherwise specified. Unless differently defined, all terms used here including technical or scientific terms have the same meanings as the terms generally understood by those skilled in the art to which the present invention pertains. The terms identical to those defined in generally used dictionaries should be interpreted as having meanings identical to contextual meanings of the related art, and are not interpreted as having ideal or excessively formal meanings unless they are definitely defined in the present specification.

[0038] The above description is merely an illustration of the technical spirit of the present invention, and those having ordinary knowledge in the technical field to which the present invention pertains can make modifications and variations within the range that does not depart from the essential characteristics of the present invention. Accordingly, the disclosed embodiments of the present invention are not intended to limit the technical spirit of the present invention but to illustrate the technical spirit of the present invention, and the scope of the technical spirit of the present invention is not limited to these embodiments. The range of protection of the present invention should be interpreted based on the following claims, and all technical spirit within the range equivalent to the claims should be construed as falling within the range of the rights of the present invention.