INTEGRATED BEAD MEASUREMENT SYSTEM AND RELATED METHOD
20200271439 ยท 2020-08-27
Assignee
Inventors
- Paul David Gatley (Halland Patent, NY, US)
- Kevin Richard Razy (Lee Center, NY, US)
- John Robert Russo, II (Marcy, NY, US)
Cpc classification
International classification
Abstract
In one aspect, the present disclosure relates to a bead measurement system with a set of radially-movable support arms for engaging a bead, where the support arms are rotatable such that they are capable of rotating the bead about a central. The bead measurement system may further include a first measurement device, where in an operational state, the first measurement device faces one of an inner profile surface and an outer profile surface of the bead. The bead measurement system may be configured to collect a set of profile measurements based on readings of the first measurement device as the support arms rotate the bead.
Claims
1. A bead measurement system, comprising: a set of radially-movable support arms for engaging a bead, wherein the support arms are rotatable such that they are capable of rotating the bead about a central; and a first measurement device, wherein in an operational state, the first measurement device faces one of an inner profile surface and an outer profile surface of the bead, wherein the bead measurement system is configured to collect a set of profile measurements based on readings of the first measurement device as the support arms rotate the bead.
2. The bead measurement system of claim 1, wherein the support arms are movable axially to index the bead measurement system for measurement of a second bead.
3. The bead measurement system of claim 1, wherein the first measurement device includes at least one of a laser and a camera.
4. The bead measurement system of claim 1, wherein the support arms are coupled to a base, and wherein the base is movable in at least two directions via a robotic arm.
5. The bead measurement system of claim 1, further comprising a micrometer configured to obtain a width measurement of the bead as the bead is rotated by the support arms.
6. The bead measurement system of claim 5, wherein the micrometer includes an emitter and a receiver, and wherein the emitter and the receiver are fixed relative to the first measurement device.
7. The bead measurement system of claim 1, wherein the first measurement device faces the inner profile surface of the bead, and wherein the bead measurement system further comprises a second measurement device facing the outer profile surface of the bead.
8. A bead measurement system, comprising: a set of radially-movable support arms for engaging a plurality of beads, wherein the support arms are coupled to a base, and wherein the base is rotatable to cause rotation of the support arms about a central axis of the plurality of beads; and a first measurement device, wherein in an operational state, the first measurement device faces a surface of at least one bead of the plurality of beads, and wherein the base is movable axially to index the first measurement device from a first position to a second position.
9. The bead measurement system of claim 8, wherein in the first position, the first measurement device is in position for measuring a first bead of the plurality of beads, and wherein in the second position, the first measurement device is in position for measuring a second bead of the plurality of beads.
10. The bead measurement system of claim 8, wherein the first measurement device includes at least one of a laser and a camera.
11. The bead measurement system of claim 8, wherein the base is movable in a direction perpendicular to the central axis to adjust a position of the central axis relative to the first measurement device.
12. The bead measurement system of claim 8, further comprising a micrometer configured to obtain a width measurement of the bead as the bead is rotated by the support arms.
13. The bead measurement system of claim 12, wherein the micrometer includes an emitter and a receiver, and wherein the emitter and the receiver are fixed relative to the first measurement device.
14. The bead measurement system of claim 8, further comprising a second measurement device, wherein in the operational state, the second measurement device faces a second surface of the at least one bead.
15. A bead measurement system, comprising: a set support arms for engaging a bead, wherein the support arms are rotatable such that they are capable of rotating the bead about a central axis; and a first measurement device, wherein in an operational state, the first measurement device faces an inner profile surface of the bead to collect measurement data of the inner profile surface as the bead rotates, and a second measurement device, wherein in the operational state, the second measurement device faces an outer profile surface of the bead to collect measurement data of the inner profile surface as the bead rotates.
16. The bead measurement system of claim 15, wherein the support arms are movable axially to index the bead measurement system for measurement of a second bead.
17. The bead measurement system of claim 15, wherein the first measurement device includes at least one of a laser and a camera.
18. The bead measurement system of claim 15, wherein the support arms are coupled to a base, and wherein the base is movable in at least two directions via a robotic arm.
19. The bead measurement system of claim 15, further comprising a micrometer configured to obtain a width measurement of the bead as the bead is rotated by the support arms.
20. The bead measurement system of claim 19, wherein the micrometer includes an emitter and a receiver, and wherein the emitter and the receiver are fixed relative to the first measurement device.
Description
BRIEF DESCRIPTION OF THE DRAWINGS
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[0009]
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[0014]
DETAILED DESCRIPTION
[0015] The present embodiments are described with reference to the drawings in which like elements are referred to by like numerals. The relationship and functioning of the various elements of this invention are better understood from the following detailed description. However, the embodiments of the invention are not limited to the embodiments illustrated in the drawings. It should be understood that in certain instances, details have been omitted which are not necessary for an understanding of the present invention, such as conventional fabrication and assembly.
[0016]
[0017] As shown in
[0018] The support arms 112 may be movable to rotate the beads 102 about a central axis 116, which is defined through the center point of the circular beads 102. For example, the support arms 112 may be coupled to a rotatable base 118. Optionally, each of the support arms 112 be coupled to one of three base protrusions 120 (e.g., one for each support arm 112). When the base 118 rotates about the axis 116, the support arms 112 rotate with it, which also causes the beads 102 to rotate (e.g., in the direction 122). In this embodiment, the beads 102 may be firmly held by the support arms 112 such when the support arms 112 rotate, the beads 102 rotate the same amount.
[0019] In certain alternative embodiments, the base 118 may be fixed (when measuring) and the support arms 112 may rotate about their own central axis, depicted as second axes 124. In these embodiments, the rotation of at least one of the support arms 112 may be driven (e.g., via a motor or other rotation-causing actuator), thereby causing the beads 102 to rotate about the axis 116 without translational movement of the support arms 112. The other support arms 112 may be idlers (and thus driven by the beads 102 themselves).
[0020] Referring to the embodiment of
[0021]
[0022] In the embodiment of
[0023]
[0024] Optionally, multiple measurements may be taken at different locations on the inner diameter surface 132 such that the measurement device 104 measures not only the minimum inner diameter, but rather maps the cross-sectional shape of the inner-diameter profile of the beads 102. These multiple measurement values may be collected by a data acquisition system or other suitable device, recorded, and analyzed to ensure the dimensions of the beads 102 meet appropriate quality standards. Portions of data collection, processing, and recordation may be executed in a processor or other electronic device within (or external to) the bead measurement system 100.
[0025] In exemplary embodiments, the measurement device 104 may operate continuously as the beads 102 rotate such that the bead measurement system 100 maps substantially the entirety of the inner diameter surface 132 around the entire circumference of the beads 102. When a full revolution is complete, the bead measurement system 100 may have obtained tens, hundreds, or even thousands of discrete measurements, thus providing an extremely high probability of detecting any quality issues.
[0026] While the embodiment of
[0027] Referring back to
[0028] The measurement devices described above may be capable of measuring multiple beads 102 at once. For example, referring only to the first measurement device 104 (for simplicity, though this paragraph may also apply to all other measurement devices), multiple sensors and/or multiple detection means may be included such that the dimensions of multiple adjacent beads 102 are taken and recorded at the same time. For example, all six beads 102 (or even more in other embodiments) may be measured with one measurement device upon one full revolution. In other embodiments, the first measurement device 104 may be capable of measuring less than all of the beads 102 at once (e.g., via a simpler and more cost-effective measurement device). In these situations, the base 118 (and therefore also the support arms 112 and beads 102) may be capable of indexing axially (i.e., in the direction parallel to the central axis 116 of the beads 102). After a full revolution to measure a certain bead 102 (or more than one bead 102 but less than the full set), the system may index to move other beads 102 into position for measurement, and then another rotation may occur. To simplify wiring and/or mechanical components, the rotation may reverse after each revolution. Alternatively (or additionally), the measurement devices may be movable axially, and/or the measurement devices may be otherwise capable of changing which bead they are measuring (e.g., via pointing a camera/sensor in a different direction).
[0029] In the depicted embodiments of
[0030] In some embodiments, the base 118 may also be movable in a direction perpendicular to the central axis 116 (i.e., the y direction in
[0031] While any suitable device is contemplated to move the base 118 (e.g., linear actuators, hydraulics, manual movement, etc.), the robotic arm assembly 142 provides the base 118 movement in the depicted embodiment of
[0032]
[0033] The robotic arm assembly 142 may be tasked with causing the above-described rotation of the bead 102 (e.g., such that they rotate past a measurement device). In the depicted embodiment, the first arm segment 144 and the second arm segment 146 may have fixed positions while the third arm segment 148 rotates about its longitudinal axis (without linear translation) to cause such rotation. The robotic arm assembly 142 may additionally or alternatively be tasked with indexing the bead measurement system 100 (e.g., by moving at least one of a bead and measurement device linearly along the axes of the beads, as described above). To accomplish the indexing, the second arm segment 146 and/or the first arm segment 144 change their orientations to move the third arm segment 148 in the z-direction while the third arm segment 148 remains a fixed distance from the central axis of the beads 102. In other embodiments, at least one arm segment, such as the third arm segment 148, may have telescoping (or other length-changing) capabilities such that indexing can occur without substantial movement of the second arm segment 146 and/or the first arm segment 144. Any other alternative arrangement of arm segments is contemplated.
[0034] The robotic arm assembly 142 may additionally or alternatively be capable of other movements. For example, the robotic arm assembly 142 may be configured to move the bead measurement system 100 into and out of engagement with the beads 102. More particularly, referring to
[0035] In one exemplary measurement method, the robotic arm assembly 142 may collect one or more beads 102 from the unloader 158 after bead formation. Such collection may include engaging the beads 102 on their outer surface (like in
[0036] The present embodiments provide enhanced speed, precision, and accuracy relative to prior measurement systems, thereby increasing the overall efficiency and success of the quality process. In certain tests performed by the inventors, the outer diameter profile, the inner diameter profile, the weight, and the width of up to eight (8) beads have been measured in less than 15 seconds, which is a substantial improvement over prior systems. In view of the system's speed, it may be capable of measuring parameters of all manufactured beads (or other components) rather than sampling certain bead(s) in a batch (as is presently customary), and therefore the principles of the present embodiments may prevent samples that are out of tolerance from ending up in the hands of consumers.
[0037] While various embodiments of the invention have been described, the invention is not to be restricted except in light of the attached claims and their equivalents. Moreover, the advantages described herein are not necessarily the only advantages of the invention and it is not necessarily expected that every embodiment of the invention will achieve all of the advantages described.