Abstract
The invention relates to a measuring device (10) for determining at least one mechanical property of a workpiece sample (100), which comprises at least one image capturing unit (12) for optically determining a workpiece geometry of the workpiece sample (100), and at least one mechanical inspection head (13) for making an indentation (101) in the workpiece sample (100). According to the invention, at least the image capturing unit (12) and the mechanical inspection head (13) form a structural unit (B) together.
Claims
1-25. (canceled)
26. A measuring device for determining at least one mechanical property of a workpiece probe, comprising at least one image acquisition unit for optically determining a workpiece geometry of the workpiece probe, and at least one mechanical probe for generating an impression in the workpiece probe, wherein, at least the image acquisition unit and the mechanical probe together form a structural unit.
27. The measuring device according to claim 26, wherein, a workpiece receptacle is provided for fixing and testing the workpiece probe.
28. The measuring device according to claim 26, wherein, at least one drive unit is provided for at least partially positioning at least the workpiece receptacle, the image acquisition unit or the probe relative to one another.
29. The measuring device according to claim 26, wherein, the assembly unit comprises at least one adjusting element, as a result of which at least the image acquisition unit and the probe are arranged so as to be movable relative to one another, wherein in particular the adjusting element only moves the image acquisition unit or the probe.
30. The measuring device according to claim 26, wherein, at least one adjusting element of the assembly unit can be moved by a drive unit, wherein in particular at least two adjusting elements can be driven by a drive unit.
31. The measuring device according to claim 26, wherein, the assembly unit comprises at least one deflection unit, whereby a beam path of the image acquisition unit can be deflected, wherein in particular an adjusting element is provided for adjusting at least one mirror.
32. The measuring device according to claim 26, wherein, at least the image acquisition unit, the probe, the drive unit and the workpiece receptacle are arranged on a test frame.
33. The measuring device according to claim 26, wherein, the probe has a probe tip.
34. The measuring device according to claim 26, wherein, at least one depth gauge is provided for the probe, whereby preferably at least one impression depth of the probe in the workpiece probe can be measured.
35. The measuring device according to claim 26, wherein, a light source is provided, wherein in particular the unit comprises the light source.
36. The measuring device according to claim 26, wherein, at least the measuring device can be arranged or moved on a supporting arm, or at least that the measuring device forms a feedback in a control loop of a manufacturing or processing method of the workpiece probes, preferably in that the measuring device transmits the respective specific mechanical properties of a workpiece probe to a spaced-apart electronic unit.
37. The measuring device according to claim 26, wherein, the workpiece probe comprises a metal or its alloys, preferably contains at least aluminum, magnesium, lead, iron, steel, stainless steel, gold, molybdenum, nickel, copper, silver, vanadium, tungsten, zinc, tin, titanium or an alloy such as brass.
38. The measuring device according to claim 26, wherein, at least one control unit is provided for at least controlling or regulating or evaluating data of the image acquisition unit and the drive unit or the drive unit to a spaced-apart electronics unit, in particular at least external server or cloud, wherein the interface implements a wireless data transmission, in particular via at least WLAN or Bluetooth data technology, or a cable-bound data transmission, in particular via USB data technology.
39. A method for determining at least one mechanical property of a workpiece probe comprising at least one of the following steps or all of the following steps: a) At least optical or tactile detection of a workpiece geometry of the workpiece probe, b) Generating an impression by penetration of a probe, c) At least optical or tactile detection of an impression topography of the generated impression in the workpiece probe, d) In particular computer-based simulation of a theoretical impression topography using a material model, in particular an elastoplastic material model, preferably for anisotropic materials, e) Comparison of the simulated and the generated impression topography, f) Determination of the mechanical properties of the workpiece probe as a function of steps a) to e).
40. The method according to claim 39, wherein, in a step b2) at least one renewed penetration of the probe, into the workpiece probe is performed, wherein step c) in particular follows in order to perform the detection of the respective impression topography of the generated impression in the workpiece probe.
41. The method according to claim 39, wherein, a step c2) the detected workpiece geometry of the workpiece probe from step a) is taken into account in the actual detection of the impression topography of the generated impression in the workpiece probe.
42. The method according to claim 39, wherein, in step c) an acquisition of an impression topography of the generated impression in the workpiece probe takes place, in which in particular subsequently a geometrical division of the impression topography of the impression generated in the workpiece probe is performed, preferably by determining at least one axis of symmetry.
43. The method according to claim 39, wherein, before or in step d), a determination of sections, of the impression topography of the generated impression in the workpiece probe, preferably on the basis of the determined axis of symmetry is performed.
44. The method according to claim 39, wherein, step d) at least one FEM simulation of a theoretical impression topography is performed using the material model.
45. The method according to claim 39, wherein, for each step d) performed, a step c) is performed, followed by at least a step e) or step d).
46. The method according to claim 39, wherein, step e) data from pre-simulated impression topographies are used, whereby preferably these data are stored in at least a memory or a database.
47. The method according to claim 39, wherein, at least for step d) or e) artificial intelligence methods are used, which in a further step g) a correction takes place between the captured impression topographies and the simulated impression topographies.
48. The method according to claim 39, wherein, an application of the method is also used for anisotropic workpiece probes, wherein, such as, for example, at least yield strength/strain limit, tensile strength, ductility or elongation at fracture, can be determined.
49. The method according to claim 39, wherein, at least the case of rolled, extruded, cast or drawn workpiece probes, direction-dependent properties of the material can be measured, or that one measurement of the measuring method per workpiece probe takes less than 14 seconds, preferably less than 12 seconds.
50. A computer program product for a measuring device for determining mechanical properties of a workpiece probe, wherein, the program has at least an algorithm or a heuristic which is processed by an electronic unit, wherein in particular at least the algorithm or the heuristic implements the method for determining at least one mechanical property of a workpiece probe comprising at least one of the following steps or all of the following steps: a) At least optical and/or tactile detection of a workpiece geometry of the workpiece probe, b) Generating an impression by penetration of a probe into the workpiece probe with defined test conditions, c) At least optical and/or tactile detection of an impression topography of the generated impression in the workpiece probe, d) In particular computer-based simulation of a theoretical impression topography using a material model, in particular an elastoplastic material model, preferably for anisotropic materials, e) Comparison of the simulated and the generated impression topography, f) Determination of the mechanical properties of the workpiece probe as a function of steps a) to e).
Description
[0069] The above explanation of the embodiment describes the present invention exclusively by way of examples. Of course, individual features of the embodiments can be freely combined with each other, if technically reasonable, without leaving the scope of the present invention. Show it:
[0070] FIG. 1 shows a first embodiment of a measuring device according to the invention,
[0071] FIG. 2 shows another embodiment of a measuring device according to the invention,
[0072] FIG. 3 shows another embodiment of a measuring device according to the invention,
[0073] FIG. 4 shows a probe according to the invention and a mechanical impression that can be generated in a workpiece probe,
[0074] FIG. 5 shows a mechanically generated impression in a workpiece probe,
[0075] FIG. 6 schematic view of a measuring device according to the invention with a deflector for the beam path of the image acquisition unit,
[0076] FIG. 7 schematic view of a measuring device according to the invention with a diagonally arranged image acquisition unit to the mechanical probe,
[0077] FIG. 8 schematic view of a comparable measuring device from FIG. 7 with an additional light source to the image acquisition unit,
[0078] FIG. 9 schematic presentation of a measuring device according to the invention with an adjustable image acquisition unit and an adjustable mechanical probe,
[0079] FIG. 10 schematic presentation of a measuring device according to the invention with a mechanical probe and a swiveling test arm for the probe tip,
[0080] FIG. 11 schematic presentation of a measuring device in accordance with the invention with an image acquisition unit transverse to the mechanical probe,
[0081] FIG. 12 schematic top view of an actual impression topography in a workpiece probe with anisotropic material properties,
[0082] FIG. 13a an exemplary, three-dimensional elevation image of the detected impression topography, e.g. from FIG. 12 and
[0083] FIG. 13b conversion of the three-dimensional elevation image from FIG. 13a into a two-dimensional elevation image with additional elevation information.
[0084] In the following figures, the identical reference signs are used for the same technical characteristics even from different embodiments.
[0085] FIG. 1 shows a measuring device 10 for determining the mechanical properties of a workpiece probe 100 in a first embodiment. The workpiece probe 100 is arranged in a workpiece fixture 11 of the measuring device 10 for testing. In addition, measuring fixture 10 has an image acquisition unit 12 for the optical determination of a workpiece geometry of workpiece probe 100. Optionally or in addition, a depth gauge T can also be provided for tactile determination of a workpiece geometry of the workpiece probe 100. In this case, the image acquisition unit 12 is located in the area of the mechanical probe 13 in or on a test frame 15. The image acquisition unit 12 can be arranged at such a distance from or adjacent to the search unit 13 that optical acquisition of the workpiece probe 100 is possible. It is also conceivable that the image acquisition unit 12 and/or the mechanical probe 13 are arranged so as to be movable in translation and/or rotation on the test frame 15. Accordingly, the mechanical probe 13 and/or the image acquisition unit 12 can be positioned relative to one another or positioned on the test frame 15 in such a way that an impression 101 is generated in the workpiece probe 100 and, following this and/or before an impression 101 is generated in the workpiece probe 100, the image acquisition unit 12 is positioned in such a way that the workpiece geometry and/or the topography of the generated impression 101 can be optically detected. In addition, a drive unit 14 is arranged on the test frame 15 of the measuring device 10, as a result of which it is at least partially possible to position the workpiece receptacle 11, the image acquisition unit 12 and/or the probe 13 relative to one another. The probe 13 as well as the image acquisition unit 12 are arranged on a tool revolver 17, so that by means of the drive unit 14 the probe 13 and/or the image acquisition unit 12 are arranged preferably rotatably on the tool revolver 17. Accordingly, the probe 13 and/or the image acquisition unit 12 can be positioned above the workpiece probe 100 by means of a rotational movement in such a way that either a mechanical impression 101 can be made by the probe 13, in particular by the probe tip 13.1, or the geometry and/or topography of the workpiece probe 100 or the impression 101 can be detected. The probe tip 13.1 is arranged on the probe 13 and has a test probe tip geometry 13.2, the test probe tip geometry 13.2 preferably having a sphero-conical shape which in particular produces a rotationally symmetrical impression 101 in the workpiece probe 100. In FIG. 1, the test frame 15 also has a test table 16 which can be moved horizontally and/or vertically, in particular by the drive unit 14. Accordingly, the drive unit 14 can move the tool revolver 17, in particular the probe 13 with the probe tip 13.1 in the direction of the test table 16 with the workpiece probe 100 arranged in a workpiece receptacle 11 and/or the test table 16 is moved by the drive unit 14 in the direction of the tool revolver 17, so that a mechanical impression 101 in the workpiece probe 100 can be made by the probe 13, in particular the probe tip 13.1. Furthermore, the measuring device 10 has a control unit 18, which is arranged on the test frame 15, whereby a control and/or regulation and/or evaluation of data from the image acquisition unit 12 and the drive unit 14 can be performed via the control unit 18.
[0086] FIG. 2 shows a further embodiment of a measuring device 10 according to the invention, with the measuring device 10 having an essentially horizontal U-shaped test frame 15. A control unit 18 for controlling and/or regulating and/or evaluating data from the image acquisition unit 12 and the drive unit 14 is arranged on the test frame 15. In addition, the measuring fixture 10 in FIG. 2 has a tool revolver 17 with an image acquisition unit 12 and light source 12.1 mounted on it. In addition, the tool revolver 17, which is preferably movable in a rotary manner, in particular drivable via the drive unit 14, has a probe 13 with a probe tip 13.1 arranged thereon. The probe tip 13.1 has a conical probe tip geometry 13.2, with which a particularly rotationally symmetrical impression 101 can be generated in the workpiece probe 100. For this purpose, the workpiece probe 100 is fixedly arranged in a workpiece receptacle 11 on a test table 16, the test table 16 being arranged on the test frame 15 so as to be horizontally and/or vertically movable, in particular so as to be drivable via the drive unit 14. In FIG. 2, an interface 19.1 is also arranged on the measuring device 10, whereby data from the image acquisition unit 12 and the drive unit 14 can be transmitted to a spaced electronic unit 19. In FIG. 2, the spaced electronic unit 19 is a computer which is connected to the measuring device 10 via a Bluetooth, WLAN or comparable electromagnetic transmission interface (e.g. RS 232 or USB).
[0087] FIG. 3 shows a further embodiment of the measuring device 10 according to the invention, whereby the measuring device 10 has a test frame 15. A control unit 18, a tool revolver 17 and a drive unit 14 are arranged on the test frame 15. Via the drive unit 14, the test table 16 and/or the tool revolver 17 and/or the image acquisition unit 12 can be moved translationally and/or rotationally, in particular horizontally and/or vertically. The image acquisition unit 12 is movably arranged in FIG. 3 on an outer side of the test frame 15, wherein the image acquisition unit 12 is movable on the test frame 15 in such a way that the image acquisition unit 12 can be moved in particular and/or vertically to the test table 16 and/or the tool revolver 17. For this purpose, for example, the image acquisition unit 12 can be arranged on the test frame 15 via a rail and/or a movable arm, so that a movement, in particular a guided movement, can be performed along the rail and/or along a movable arm. The image acquisition unit 12 can be illuminated by means of the light source 12.1 for optical acquisition of the workpiece geometry and/or the impression topography 103, whereby the light source 12.1 can be, for example, an optical sensor, an infrared sensor, an LED and/or an OLED. The tool revolver 17 has a probe 13 with a probe tip 13.1, whereby the probe tip 13.1 is spherical and can generate a mechanical impression 101 in the workpiece probe 100. The workpiece probe 100 is arranged on a workpiece receptacle 11 on a movable test table 16. The test table 16 can be configured to be translatory, in particular horizontally and/or vertically as well as rotatory, and can be driven via the drive unit 14. Accordingly, the drive unit 14 can enable the test table 16 with a workpiece receptacle 11 arranged thereon and the workpiece probe 100 held therein to move in the direction of the tool revolver 17 and thus to the probe 13 and a probe tip 13.1 arranged thereon with a probe tip geometry 13.2.
[0088] FIG. 4 shows a probe 13 according to the invention with a sphero-conical probe tip geometry 13.2 of probe tip 13.1. In addition, FIG. 4 shows a workpiece probe 100 with an impression 101, which was generated by the probe tip 13.1 with the probe tip geometry 13.2. The impression 101 shows an impression topography 103, which was generated by the probe tip 13.1 with the probe tip geometry 13.2. The impression topography 103 has an impression depth of 102 and a projection on the circumference of the impression 101. According to the invention, the characteristic impression topography 103, in particular a material throw-up of the impression topography 103, serves to determine the mechanical properties of the workpiece probe 100.
[0089] FIG. 5 shows an impression 101 enlarged in a workpiece probe 100. Here, the impression 101 has an impression depth of 102 and a corresponding impression topography of 103. The topography of the impression 103 results from the impression depth 102 and the impression 101 formed by the probe tip as well as a material throw-up formed on the circumference of the impression 101. The impression topography 103 of the impression 101 serves to determine the material parameters of the workpiece probe 100. According to the invention, the impression depth 102 and the throw-up height of the material of the workpiece probe 100 are used to determine the material parameters.
[0090] In the further FIGS. 6-11 schematic configurations of the measuring device 10 according to the invention are shown, especially when using continuously formed workpiece probes, especially in the form of rolled material, bar material and the like. These figures deal in particular with the different possible arrangements of the image acquisition unit 12 and the mechanical probe 13 in assembly unit B. Assembly unit B is located above the workpiece probe 100 and accommodates the image acquisition unit 12 and the mechanical probe 13. In addition, a deflection unit U can also be provided for setting and adjusting mirrors 21, 22, which can deflect a beam path L of image acquisition unit 12. In addition to the integrated light source 12.1 in the image acquisition unit 12, an external light source 12.1 can also be used with the measuring device 10 according to the invention.
[0091] In FIGS. 6-11 the measuring device 10 can be fed to the workpiece probe 100 via a support arm 40 or a robot arm 40. Ideally, this support arm 40 is attached directly to the test frame 15 in order to achieve high stability. In addition, a fixing unit 50 is optionally available for the measuring fixture 10, which allows it to be fixed to the workpiece probe 100. By means of the fixing unit 50, the workpiece probe can be clamped or clamped between the workpiece fixture 11 in order to safely avoid a relative movement between the measuring device 10 during the measuring method and the workpiece probe 100.
[0092] In the following, the differences between the various embodiments of invention-related measuring device 10 are described in FIGS. 6-11.
[0093] In FIG. 6, a deflection unit U is provided for deflecting the beam path L, so that the image acquisition unit 12 and the mechanical probe 13 can be arranged rigidly to each other and form the assembly unit B. The first mirror 21 may be fixed to the assembly unit B or the measuring device 10. The second mirror 22, which is movable by the deflector unit U, can be swiveled by a drive unit 14 with an adjustment element V below the probe tip 13.1 to perform the optical measurement. The mirror 22 can be moved longitudinally or by rotation (see arrows). When generating the impression 101, the mirror 22 must be positioned outside the sphere of action of the probe tip 13.1, whereas for the optical detection of the impression topography 103, the second mirror 22 must be positioned below the probe tip 13.1 in order to deflect the beam path L accordingly so that the image acquisition unit 12 can perform an optical detection of the impression topography 103. In FIG. 6, the mechanical probe 13 can be moved vertically together with the probe tip 13.1, or only the probe tip 13.1 can be configured so that it can be withdrawn from the probe 13 by means of an adjusting element V (e.g. cylinder).
[0094] In FIG. 7, the image acquisition unit 12 is arranged diagonally to the mechanical probe 13 within assembly unit B. This means that image acquisition unit 12 does not have a direct top view of the generated impression topography, but rather a slight oblique view, which must be compensated for in the further method in order to obtain exact measurement results. Furthermore, FIG. 7 shows a display unit 23 and an input unit 24. The display unit 23 can consist of a display, especially with touch screen function. This display unit 23 can be used, for example, to display error states or measurement results of measuring device 10 and can be influenced by input device 24. FIG. 7 also shows a purely schematic representation of the spaced electronic unit 20 as an external server or computer.
[0095] In contrast to FIG. 7, FIG. 8 uses an additional light source 12.1, which is not integrated in the image acquisition unit 12. Both the image acquisition unit 12 and the light source 12.1 are arranged diagonally to the mechanical probe unit 13 on assembly unit B.
[0096] In FIG. 9, both the mechanical probe 13 and the image acquisition unit 12 can be moved by the drive unit 14 with a corresponding adjustment element V. A relative movement between the image acquisition unit 12 and the mechanical probe 13 is also conceivable. The movement of the corresponding components can be linear on the one hand or by a rotary and/or pivoting movement on the other. It is also conceivable that the entire assembly unit B is configured to be movable by a linear displacement and/or rotary and/or swiveling movement in order to generate the impression topography 103 on the one hand and to be able to detect it optically and/or tactilely in a plan view on the other hand.
[0097] In FIG. 10, the mechanical probe 13 has a test arm 13.3 on which the probe tip 13.1 is located on the underside. This test arm 13.3 can be rotated or swiveled and/or linearly adjustable in order to be able to generate the mechanical impression topography 103 for the workpiece probe 100. As soon as this actual impression topography 103 is generated by the impression 101, the mechanical probe 13 can swivel the test arm 13.3 away above the impression 101 so that the image acquisition unit 12 obtains a top view of the impression topography 103.
[0098] In FIG. 11, in contrast to the measuring device 10 from FIG. 6, a deflection unit U is used, which has only one mirror 22 to deflect the beam path L. For this purpose, the image acquisition unit 12 is arranged on assembly unit B at least diagonally or, as in the present case, rotated by 90 to the mechanical probe 13. The mirror 22 can be swiveled or linearly displaced by the deflection unit U, as rotated in FIG. 6, by the adjustment element V.
[0099] In the FIGS. 6-11 the different possibilities of movement are arranged in a translatory manner, in the direction of rotation and pivoting by means of corresponding arrows. By means of these movement possibilities, the impression 101 with its actual impression topography 103 can be generated in the workpiece probe 100 and then optical and/or tactile detection can take place. FIGS. 6, 10 and 11 schematically show a support arm 40 or a robot arm 40 for the movable feeding of the measuring device 10 to the workpiece probe 100.
[0100] FIG. 12 shows a purely schematic top view of an impression topography 103 for an anisotropic workpiece probe 100. This does not have a rotationally symmetrical configuration, as is indicated in FIG. 5 for isotropic materials. In the present case, the impression topography 103 of impression 101 resembles a cloverleaf in the top view. This impression topography 103 has a total of two axes of symmetry S1 and S2, which allow the sections I-IV to be formed. It should be mentioned at this point that there can also be only one symmetry axis S1 or several symmetry axes. In addition, points P1.1-P1.4 are indicated, which have the same height information of the impression topography 103 and come to lie on top of each other by folding or mirroring in sections. This is indicated by the folding arrows in FIG. 12 in sections II and III, which can be used to generate a folding up of sections II and III on the basis of the axis of symmetry S1 to sections I and IV.
[0101] In FIGS. 13a and 13b, the measurement data obtained in step c) are arranged in a three-dimensional coordinate system. The impression 101 was introduced into a workpiece probe 100 made of an aluminum alloy. This shows that height information is stored for each two-dimensional point P, resulting in the three-dimensional model of the impression topography in FIG. 13a with points P1 and P2. The corresponding two-dimensional model with points P1 and P2 is shown in FIG. 13b, whereby the individual points have height information in addition to their x and y coordinates, in order to be able to mathematically represent the three-dimensional impression topography. This height information is expressed in FIGS. 13a and 13b by the different shades of grey.
[0102] The above explanation of the embodiments describes the present invention exclusively within the scope of examples. Of course, individual features of the present invention can be freely combined with each other, if technically reasonable, without leaving the scope of the present invention/claims.
LIST OF REFERENCE SIGNS
[0103] 10 Measuring device [0104] 11 Workpiece receptacle [0105] 12 Image acquisition unit [0106] 12.1 Light source [0107] 13 Probe [0108] 13.1 Probe tip [0109] 13.2 Probe tip geometry [0110] 13.3 Test arm [0111] 14 Drive unit [0112] 15 Test frame [0113] 16 Test table [0114] 17 Tool revolver [0115] 18 Control unit [0116] 19 Electronic unit [0117] 19.1 Interface to 19 [0118] 20 Spaced electronics unit, such as external server and/or cloud [0119] 21 Mirror, especially fixed [0120] 22 Mirror, especially adjustable by U [0121] 22 Display unit, display [0122] 23 Input unit, keys/touch screen [0123] 24 Data link, wireless or wired [0124] 40 Robot or support arm [0125] 50 Fixing unit [0126] 100 Workpiece probe [0127] 101 Impression [0128] 102 Impression depth [0129] 103 Impression topography [0130] B Assembly unit [0131] V Adjusting element [0132] U Deflection unit [0133] L Beam path [0134] S1, S2 Symmetry axes from 103 [0135] T Depth gauge [0136] I-IV Parts from 103 [0137] R1, R2 Directions [0138] Px.y Points, in particular measuring points of 103 in the sections
