MEMS OPTICAL DEVICE COMPRISING A MEMS MAGNETIC SENSING MECHANSIM AND MEMS LIGHT ABSORBING STRUCTURE

Abstract

A MEMS optical device and an array composed thereof are disclosed herein, wherein the MEMS optical device comprises a light absorbing element, a deforming element, and a magnetic detector, wherein the magnetic detector comprises a magnetic source and a magnetic sensor.

Claims

1. An optical MEMS device, comprising: a substrate; a deformable arm connected to a post at an end, wherein the post is connected to said substrate such that the deformable arm is capable of deforming above the substrate; a heat plate connected to said deformable arm, wherein the heat plate is capable of absorbing light; and a magnetic sensing mechanism disposed between the substrate and the heat plate for detecting a displacement of said heat plate, wherein the magnetic sensing mechanism comprises: a magnetic source providing magnetic field, wherein the magnetic source moves along with the heat plate; and a magnetic sensing that is attached to the substrate and capable of sensing the magnetic field from the magnetic source.

2. The device of claim 1, wherein the heat plate comprises a light absorbing mechanism that is capable of absorbing infrared light.

3. The device of claim 1, wherein the heat plate comprises a light absorbing mechanism that is capable of absorbing terahertz light.

4. The device of claim 1, wherein the heat plate comprises: a metallic structure having a plasmonic resonant frequency corresponding to light having a wavelength of infrared light.

5. The device of claim 1, wherein the heat plate comprises: a light absorbing layer having a thickness that corresponds to a destructive interference of infrared light reflected from the top and bottom surfaces of the light absorbing layer.

6. The device of claim 1, wherein the deformable arm comprises a first and second layer, wherein the first and second layers have different CTEs.

7. The device of claim 6, wherein the first layer comprises a metallic material and the second layer comprises a non-metallic material.

8. The device of claim 1, wherein the magnetic source comprises a permanent magnet.

9. The device of claim 1, wherein the magnetic source comprises a segment of a conductive wire through which current can flow through so as to generate magnetic field.

10. The device of claim 1, wherein the magnetic sensor comprises: a tunneling magnetic resister.

11. The device of claim 1, wherein the magnetic sensor comprises: a giant-magneto-resister (GMR).

12. An optical MEMS device, comprising: a plurality of optical MEMS devices that are formed into a device array, wherein the device array comprises a row and a column; and wherein the optical MEMS device comprises: a substrate; a heat plate connected to a deformable arm, wherein the deformable arm is held above the substrate by a post such that the deformable arm is capable of deforming above the substrate; and a magnetic sending mechanism disposed between the substrate and the heat plate for detecting a displacement of the heat plate in relation to the substrate.

13. The device of claim 12, wherein the device array comprises 16×16 or more optical devices.

14. The device of claim 12, wherein the device array comprises 640×480 or more optical devices.

15. The device of claim 12, wherein the device array comprises 800×600 or more optical devices.

Description

BRIEF DESCRIPTION OF DRAWINGS

[0013] FIG. 1 diagrammatically illustrates a typical MEMS optical device comprising a light absorbing mechanism and detecting mechanism in prior art;

[0014] FIG. 2 illustrates a FPA of the optical device illustrated in FIG. 1;

[0015] FIG. 3 illustrates another exemplary MEMS optical device comprising a light absorbing mechanism, a mechanically deformable mechanism, and a detecting mechanism for detecting the deformation in prior art;

[0016] FIG. 4 illustrates a top view of an example of the light absorbing mechanism in the MEMS optical device in FIG. 3;

[0017] FIG. 5 illustrates a side view of an exemplary MEMS optical device of this invention, wherein the MEMS optical device comprises a mechanically deformable membrane and a detection mechanism that is capable of detecting the deformation of the membrane, wherein the detection mechanism comprises a magnetic field source and magnetic sensor that measures the magnetic field of the magnetic source;

[0018] FIG. 6a illustrates an example of the deformable membrane in the device illustrated in FIG. 5, wherein the deformable membrane comprises multiple layers for enhanced absorption of the incident light of interest;

[0019] FIG. 6b illustrates a state of the MEMS optical device in FIG. 6 in an operation, wherein the mechanically deformable membrane of the optical device is deformed due to the absorption of the incident light;

[0020] FIG. 7 illustrates a FPA composed of the MEMS optical device of FIG. 5 and FIG. 6;

[0021] FIG. 8 illustrates a size view of a row of the FPA of FIG. 7;

[0022] FIG. 9 illustrates a variation of the MEMS optical device in FIG. 5 by adding an antenna on the top surface of the membrane of the device in FIG. 5, wherein the antenna is capable of enhancing the absorption of incident light of specific wavelength;

[0023] FIG. 10 illustrates an example of the antenna of the optical device in FIG. 9;

[0024] FIG. 11 illustrates a state of the optical device in FIG. 9 in an operation wherein the membrane is mechanically deformed due to the absorption of the incident light;

[0025] FIG. 12 illustrates a FPA composed of the optical device of FIG. 9;

[0026] FIG. 13 illustrates another example of MEMS optical device of this invention, wherein the MEMS optical device comprises a heat plate for absorbing incident light, a deformable arm structure attached to the heat plate; and a detection structure for detecting the deformation of the deformable arm structure;

[0027] FIG. 14 illustrates an exemplary bi-morph of the deformable arms in FIG. 13;

[0028] FIG. 15 is a cross-sectional view of the MEMS optical device of FIG. 13 in a non-deformable state; and

[0029] FIG. 16 illustrates a state of the MEMS optical device in FIG. 14 in an operation wherein the optical device is exposed to incident light causing the deformable arm structure deforming.

DETAILED DESCRIPTION OF SELECTED EXAMPLES

[0030] Disclosed herein comprises a MEMS optical device capable of responding to incident light of specific wavelength or wavelength range. From the response, detection of the incident light can be achieved. The detection can be applied to imaging and non-imaging applications such as spectrometry, lidar, and wavefront sensing and many other applications. The MEMS optical device can be particularly useful in forming a large FPA array, such as FPA of VGA and above.

[0031] In one example of this MEMS optical device of this invention, the detection mechanism comprises a magnetic source and magnetic sensor, wherein the magnetic sensor is spaced apart from the light absorbing mechanism. An advantage of this configuration is that the heat generated by the sensing current flowing through the magnetic sensor can be isolated from the heat generated by the light absorbing mechanism, and thus significantly increases the measurement accuracy.

[0032] In another example of this invention, the MEMS optical device is used to form a FPA, wherein each FPA pixel comprises a light absorbing mechanism and a detection mechanism that is associated with said light absorbing mechanism in the FPA.

[0033] In the following, the invention will be disclosed with referring to selected examples. It will be appreciated by those skilled in the art that the following discussion including the selected examples are for demonstration purpose only, and should not be interpreted into any limitation.

[0034] Referring to FIG. 5, an example of a MEMS optical device of this invention is illustrated therein. In this example, MEMS optical device 120 comprises mechanically deformable membrane 121 that is supported by posts 126 and 128 on substrate 130. Detection mechanism 123 is disposed between deformable membrane 121 and substrate 130 for detecting the deformation of deformable membrane 121. Detection mechanism 123 comprises magnetic source 122 for generating magnetic field and magnetic sensor 124 capable of sensing the magnetic field and magnetic field gradient of the magnetic field generated by magnetic source 122. Magnetic source 122 in this example is disposed on the bottom surface of deformable membrane 121. Magnetic sensor 124 is disposed on substrate 130 such that magnetic sensor 124 is spaced apart from deformable membrane 121 and magnetic source 122.

[0035] Deformable membrane 121 is provided for absorbing incident light of specific wavelength or wavelength range, such as Infrared light or Terahertz (THz) light. For this purpose, deformable membrane 121 may comprises a material such as SiOx and SiNx and many other suitable materials. Alternatively, deformable membrane 121 may be a laminate comprising multiple layers of different materials, an example of which is illustrated in FIG. 6a.

[0036] Referring to FIG. 6a, deformable membrane 121 comprises layer 125 and layer 127, wherein layers 125 and 127 comprise different materials. For example, layer 125 may comprise a material that has high absorption coefficient, such as higher than 60%, 80%, 90%, to the incident of interest. The material for layer 127 may or may not be required to have a high absorption coefficient.

[0037] Layers 125 and 127 are preferred to have a large difference in their CTE (Coefficient of Thermo-Expansion). For example, the relative difference in CTE of layers 125 and 127 can be 1% or higher, 5% or higher, 10% or higher, 20% or higher, 30% or higher, 50% or higher, wherein the relative difference of CTE in percentage is defined as: ABS ((CTE of layer 125−CTE of layer 127))/MAX (CTE of layers 125 and 127). In the above expression, ABS( ) is the absolute value; MAX( ) is the maximum value. Larger difference in CTE of layers 125 and 127 enhances mechanical deformation of layer 121 (the combination of layers 125 and 127) due to thermos-mechanical effect. Larger mechanical deformation obviously makes detection of the mechanical deformation much easier, which will be discussed in the following.

[0038] In one example, layer 125 may comprise a metal material, especially when the incident light of interest is in the visible, Infrared, or Terahertz (THz). The metal can be Gold (Au) or Aluminum (Al). Layer 127 can be composed of a ceramic material, wherein a ceramic material can be silicon-oxides (e.g. SiOx), silicon-nitrides (SiNx).

[0039] Laminate layer 121, in addition to layers 125 and 127 as discussed above, may comprise other materials for different purposes, such as Ta between layers 125 and 127 for enhancing the bonding of layers 125 and 127.

[0040] The geometry of deformable membrane (layer 121) is configured to be compatible with the incident light of interest. For example wherein deformable membrane 121 is a single layer, the thickness of deformable membrane 121 is selected such that the interference between the reflected light from the upper surface (exposed to the incident light) of deformable membrane 121 and the reflected light from the bottom surface (opposite to the incident light) of deformable membrane 121 is destructive. Such destructive interference causes absorption of the incident light of interest at deformable membrane 121. In an example wherein deformable membrane 121 is a laminate comprising multiple layers such as that illustrated in FIG. 6a, it is preferred that the top layer of the laminate, which is layer 125 has a thickness such that the interference of the reflected light from the top surface of layer 125 and the reflected light from the bottom surface of layer 125 is substantially constructive. The same constructive interference may also be expected in layer 127, though not required.

[0041] When exposed to the incident light of interest, deformable membrane 121 absorbs the incident light. The energy of the absorbed light raises the temperature of layer 121, causing the temperature change of deformable membrane 121. The temperature change consequently causes the mechanical deformation of deformable membrane 121 due to thermos-mechanical effect, which is illustrated in FIG. 6b. The mechanical deformation can be significantly increased when deformable membrane 121 is a laminate comprising multiple layers of different CTEs as discussed above with reference to FIG. 6a. In this example, layer 125 absorbs incident light. The energy of the absorbed incident light is converted into thermos-energy that causes the temperature changes in both of layers 125 and 127. Due to the different CTEs of layers 125 and 127, deformable membrane 121 (comprising layers 125 and 127) shows large thermos-mechanical deformation.

[0042] Deformation of deformable membrane 121 can be proportional to the amount of heat generated by the absorbed light; and the amount of heat generated by the absorbed light can be proportional to the intensity of the absorbed light. In a simple approximation, deformation that can be measured by the linear displacement of the geometrical center of deformable membrane 121 is proportional to the intensity of the absorbed incident light, wherein the linear displacement is along the normal direction of the plane of deformable membrane 121. By quantitatively measuring the displacement of deformable membrane 121, the intensity of the incident light can be obtained.

[0043] In order to measure the displacement of deformable membrane 121, detection mechanism 123 is provided, as illustrated in FIG. 5. Detection mechanism 123 is a remote sensing mechanism wherein the sensor and the object to be sensed or measured are not physically connected or attached. In this example, detection mechanism 123 is based upon magnetic field sensing technique. Specifically, detection mechanism 123 comprises magnetic source 122 and magnetic sensor 124. Magnetic sensor 122 is attached to the bottom surface of deformable membrane 121 such that magnetic sensor 122 moves with the deforming membrane 121. Magnetic source 122 provides magnetic field. Magnetic sensor 124 is attached to the top surface of substrate 130 and at a location in the vicinity of magnetic source 122. It is preferred, though not required that magnetic sensor 124 is disposed at a location wherein the magnetic field gradient generated by magnetic source 122 is primarily maximized.

[0044] When deformable membrane 121 is deformed due to exposure to the incident light of interest, magnetic source 122 moves with the deforming membrane 121, resulting in a change of the distance between magnetic source 122 and magnetic sensor 124. This distance change causes the change of the magnetic field at the location of magnetic sensor 124, wherein the change of the magnetic field comprises changes of both of the direction and strength components of the magnetic field. By measuring the change in the strength component, the change in distance between magnetic source 122 and magnetic sensor 124 can be obtained. The obtained change in distance can be used to calculate the deformation of deformable membrane 121. As discussed above, the deformation can be proportional to the intensity of the absorbed incident light. From the obtained deformation of deformable membrane 121, intensity of the absorbed incident light can be calculated.

[0045] The magnetic source (122) can be composed of any suitable magnetic materials such as hard magnetic materials or soft magnetic materials. In examples wherein magnetic source 122 is composed of a hard magnetic material such as permanent magnet, magnetic source 122 continuously generates magnetic field. In examples wherein magnetic source 122 is composed of a soft magnetic material such as NiFe, external magnetic field maybe needed to magnetize the magnetic source. In the presence of the external magnetic field, magnetic source composed of a soft magnetic material is magnetized. The magnetized magnetic source 122 generates magnetic field that is used to quantitatively measure the deformation of deformable membrane 121. When the external magnetic field is withdrawn, magnetic source 122 may not generate magnetic field. Deformation of deformable membrane 121 may not be achieved.

[0046] In some applications, using a soft magnetic material for magnetic source may be preferred because such configuration can be of advantageous in measuring the deformation of deformable membrane in a more controlled way. When measuring the deformation of deformable membrane 121 is not expected such as during calibration or other applications, external magnetic field can be removed at any time.

[0047] The external magnetic field can be generated in many ways. For example, a permanent magnetic field can be provided across the entire optical structure 120, or across the entire FPA composed of an array of optical device 120. Alternatively, a wire can be provided in the vicinity of magnetic source that is composed of a soft magnetic material. For example, a wire can be disposed on substrate 130 in the vicinity of magnetic sensor 124. During operation, a substantially constant current is driven through the wire so as to generate an excitation magnetic field. The soft material of magnetic source 122 can be magnetized with such excitation magnetic field. In this instance, the magnetic field at the location of magnetic sensor 124 is a combination of the excitation magnetic field and magnetic field generated by magnetic source 122. Because the excitation magnetic field is static and known from the constant current flowing through the wire, the instant magnetic field generated by magnetic source 122 can be calculated.

[0048] Magnetic sensor 124 can be any suitable sensors capable of measuring magnetic field. However, it is expected that magnetic sensor 124 is a MEMS sensor and can be integrated with the other MEMS components such as deformable membrane 121 and magnetic source 122. It is further expected that magnetic sensor 124 has sufficient sensibility and accuracy in measuring the deformation of deformable membrane 121. This is because the deformation of deformable membrane 121 can be small. For example, the displacement of the geometric center of deformable membrane 121 can be in the order of several angstroms, several to ten of nanometers. In order to accurately measure such small displacement, magnetic sensor 124 is expected to have high accuracy and sensitivity, in addition to the MEMS expectation. A group of good candidates of magnetic sensor 124 is MR (magnetic sensors), such as AMR (anisotropic Magneto-Resistance), GMR (Giant Magneto-Resistance) that is also referred to as Spin-Valve, and TMR (Tunnel-Magneto-Resistance) that is also referred to as MTJ (Magnetic Tunnel Junction). Other types of magnetic sensors, such as MEMS flux-gates are also applicable. Because there are many disclosures of MR (Magnetic Sensors) including AMR, GMR, and TMR in the art, these MR will not be discussed in herein for simplicity.

[0049] For measuring the magnetic field generated by magnetic source 122, a constant sensing current is driven through magnetic sensor 124 during operation, for example, through a control circuit that can be disposed in substrate 130, which is not shown in the figure for simplicity. By measuring the voltage drop across magnetic sensor 124, instant value of the resistance of magnetic sensor 124 can be obtained given that the sensing current flowing through magnetic sensor 124 is substantially constant. Because the instant resistance of magnetic sensor 124 is substantially proportional to the instant magnetic field at the location of magnetic sensor 124, the instant magnetic field can be obtained. The instant magnetic field is a known function of the distance between magnetic source 122 and magnetic field 124. The instant distance, and thus the deformation of deformable membrane 121, can thus be calculated based upon the known function and the obtained instant magnetic field.

[0050] In the example discussed above with reference to FIG. 5, FIG. 6a, and FIG. 6b, magnetic sensor 124 is disposed on substrate 130; and magnetic source 122 is attached to deformable membrane 121. In an alternative example, magnetic sensor 124 can be attached to deformable membrane 121; and magnetic source 122 can be disposed on substrate 130, which is not shown for simplicity.

[0051] Because magnetic sensor 124 and magnetic source 122 (and thus deformable membrane 121) are physically isolated and untouched, heat generated by the current flowing through magnetic sensor 124 can be significantly isolated from heat generated by the absorption of deformable membrane 121. This feature can be of great importance in forming a large array, such as a FPA as illustrated in FIG. 7. Referring to FIG. 7, a 7×12 array composed of optical device shown in FIG. 5 is illustrated for demonstration. It will be appreciated by though skilled in the art that the 7×12 in FIG. 7 is for demonstration purpose, and should not be interpreted as a limitation. FPA 132 composed of optical device of FIG. 5 may have any desired resolutions, such as 640×480, 800×600, 1024×768, and other resolutions. It is noted that each pixel of FPA 132 comprises a detection mechanism associated with the MEMS deformable membrane of the pixel, which is better illustrated in a side view of row 134 of FPA 132 in FIG. 8. Referring to FIG. 8, row 134 comprises a series of pixels that are MEMS optical devices such as MEMS optical device 120 as discussed above with reference to FIG. 5. The pixels of row 134 share a common substrate, such as substrate 130. Each pixel has an independent detection mechanism and deformable membrane as shown in FIG. 5. It is further noted that substrate 130 may comprise an electrical circuit for reading the outputs of the magnetic sensors of the row (and the FPA). Reading the magnetic sensors in the FPA can be achieved by row decoder and line decoder, which will not be detailed herein.

[0052] As discussed above with reference to FIG. 6a, deformable membrane 121 can be a laminate composed of multiple layers of different optical and/or mechanical properties. In one example, top layer 125 as illustrated in FIG. 6a can be configured into multiple slits to enhance the optical absorption as illustrated in FIG. 9 and FIG. 10.

[0053] Referring to FIG. 9, MEMS optical device 136 comprises deformable membrane 127 that is supported above substrate 130 by posts such that deformable membrane 127 is capable of deforming above substrate 130. Detection mechanism 123 comprising magnetic source 122 and magnetic sensor 124 are disposed between deformable membrane 127 and substrate 130. Substrate 130, which may comprise circuits, is provided, on which other components of the device can be formed. Deformable membrane 127, detection mechanism 123 and magnetic source 122 and magnetic sensor 124 thereof, and substrate 130 can be the same as those discussed above with reference to FIG. 5.

[0054] Absorption layer 125 is disposed on the top surface of deformable membrane 127. In this example, absorption layer 125 is configured into multiple slits as illustrated in FIG. 10. Referring to FIG. 10, absorption layer 125 comprises multiple slits such as slit 140 on deformable membrane 127. The slits are configured such that the absorption of the incident light of specific wavelength or wavelength is maximized. In one example, the slits absorbed the incident light based upon the resonance of surface plasmon. The slits of absorption layer 125 may have substantially the geometry (e.g. length, width, and thickness). The pitch of the slits, which is defined as the center-to-center distance between adjacent slits, may or may not be the same. The slits may have different dimensions. For example, the slits may have different width (the dimension of the slit along the direction perpendicular to the length of the slit) but substantially the same thickness and length. Such non-uniform width configuration can be important especially when incident light of multiple wavelengths or a range of wavelength are desired to be absorbed. In instance of non-uniform width slits being used, the slits may or may not have the same pitch (i.e. the center-to-center distance between adjacent slits in the slit array).

[0055] When exposed to incident light of interest, absorbing layer absorbs the incident light of interest and generates heat. Due to the different CTE (Coefficient of Thermo-Expansion) of absorbing layer 125 and deformable membrane 127, deformable layer 127, as well as absorbing layer 125 deforms, as illustrated in FIG. 11. Similar to that discussed above with reference to FIG. 5 and FIG. 6b, the deformation can be proportional to the intensity of absorbed light. As deformable membrane 127 deforms, magnetic source 122 moves with deformable membrane 127 such that the relative distance between magnetic source 122 and magnetic sensor 124 changes. The magnetic field generated by magnetic source 122 at the location of magnetic sensor 124 changes. The magnetic resistance of magnetic sensor 124 changes accordingly. By analyzing the change of the magnetic resistance of magnetic sensor 124, the distance change between magnetic source 122 and magnetic sensor 124 can be calculated, from which, intensity of absorbed incident light can be obtained.

[0056] For the same or similar reason that the magnetic sensor is spaced apart from the deformable membrane 127 and/or absorption layer 125 as discussed above with reference to FIG. 5 and FIG. 6b, MEMS optical device 136 as illustrated in FIG. 9, FIG. 10, and FIG. 11 can be used to form an array, such as FPA. FIG. 12 illustrates an example of a FPA composed of MEMS optical device of FIG. 9. FPA 140 in FIG. 12 is a 7×12 array for demonstration. It will be appreciated by though skilled in the art that the 7×12 in FIG. 12 is for demonstration purpose, and should not be interpreted as a limitation. FPA 140 may have any desired resolutions, such as 640×480, 800×600, 1024×768, and other resolutions.

[0057] In examples illustrated in FIG. 5 and FIG. 9, light absorbing elements (e.g. 125 in FIG. 9) and deformable element (e.g. 127 in FIG. 9) are laminated. For example in FIG. 9, a major surface of absorbing layer 125 (the bottom surface) is directly positioned on a major surface (the top surface) of deformable layer 127. In an alternative example, light absorbing element and deformable element can be separated, an example which is illustrated in FIG. 13.

[0058] Referring to FIG. 13, MEMS optical device 142 and upper wafer and lower wafer. The upper wafer comprises heat plate 144, deformable arms 150 and 154 that are connected to heat plate 144 through connectors 148 and 158. Deformable arms 150 and 154 are connected to posts 152 and 156. Magnetic source 146 (shown as dashed lines) is disposed at the bottom surface of heat plate 144, which is better illustrated in the side sectional view in FIG. 15. Referring to FIG. 15, magnetic source 146 is attached to the bottom surface of heat plate 144, and magnetic sensor 160 is disposed at the top surface of substrate 162. Heat plate 144 is capable of moving towards or away from substrate 162 because of the deformation of deformable arms that are not shown in FIG. 15.

[0059] Referring again to FIG. 13, the lower substrate comprises substrate 162 and magnetic sensor 160 that is disposed on substrate 162. The upper substrate and bottom substrate are connected through posts 152 and 156. Specifically, deformable arms 150 and 154 are connected to posts 152 and 156 at one ends such that the ends of the deformable arms connected to the posts are substantially non-movable. It is preferred that the ends of the deformable arms connecting to the posts 152 and 156 have a substantially constant temperature, wherein the constant temperature is substantially the temperature of substrate 162. This temperature preference can be of great importance in obtaining a linear response of the deformation of deformable arms to the temperature (and thus the intensity of the absorbed light by heat plate 144) of heat plate 144 that is connected to the other ends of deformable arms.

[0060] Referring again to FIG. 13, heat plate 144 is designated for absorbing incident light of interest. Heat plate 144 can be a single layer or a laminate comprising multiple layers of different optical and/or mechanical properties, as layers 121 discussed above with reference to FIG. 5, FIG. 6a, FIG. 9, and FIG. 10.

[0061] Deformable arms 150 and 154 each can be a bi-morph as illustrated in FIG. 14. Referring to FIG. 14, deformable arms 150 and 154 each may comprise top layer 166 and bottom layer 168, wherein top layer 166 and bottom layer 168 have different CTEs (Coefficient of Thermo-Expansion). Top layer 166 may have a larger CTE than bottom layer 168. In this instance, bi-morph 150 and 154 deform “downwards” when heated. In examples wherein top layer 166 has a smaller CTE than bottom layer, bi-morph 150 and 154 deform “upwards.”

[0062] With this configuration, heat plate 144 can move towards or away from substrate 162 when deformable arms 150 and 154 deform, which is better illustrated in FIG. 16. Referring to FIG. 16, the deformable arms 150 and 156 are configured into moving downwards when heated up. This is achieved by the top layer 166 as shown in FIG. 14 having a higher CTE than bottom layer 168 as shown in FIG. 14. The distance between magnetic source 146 and magnetic sensor 160 changes according to the amount of deformation of deformable arms.

[0063] Referring back to FIG. 13, heat plate 144 absorbs incident light of interest. The absorbed light is converted into heat and the heat is transferred to deformable arms 150 and 154 through connectors 148 and 158. Upon heated, deformable arms deform “downwards” or “upwards.” Because one ends of deformable arms 150 and 154 are fixed to posts 152 and 156, the other ends connecting to heat plate 144 move towards or away from substrate 162, resulting in the movement of heat plate 144 moving “towards” or “away from” substrate 162. Because magnetic source 146 is attached to the bottom surface of heat plate 144; and magnetic sensor 160 is positioned on the top surface of substrate 162, the distance between magnetic source 146 and magnetic sensor 160 changes with the moving heat plate 144. Such distance change causes the magnetic field change at the location of magnetic sensor on substrate 162. The magnetic field change consequently causes change of the magnetic resistance of magnetic sensor 160. By measuring the resistance change of magnetic sensor 160, the deformation of the deformable arms 150 and 154 can be calculated. From the calculated deformation, the intensity of the light absorbed by heat plate 144 can be obtained.

[0064] MEMS optical device 142 can be used to form an array, such as FPA. The FPA may have any desired resolutions, such as 640×480, 800×600, 1024×768, and other resolutions.

[0065] The MEMS optical devices as discussed above with reference to FIG. 5 through FIG. 16 each can be packaged at a lower pressure than the atmosphere. This vacuumed packaging can be of great importance in obtaining a higher Q factor, such 200 or higher, 500 or higher, 1000 or higher, 2000 or higher, 5000 or higher, 10,000 or higher. Moreover, the vacuumed packaging can significantly reduce the transfer of the heat generated by the current flowing through magnetic sensors to heat plate 144, which in turn increases measurement accuracy.

[0066] It will be appreciated by those of skilled in the art that a new and useful MEMS optical device and an array composed thereof have been described herein. In view of the many possible embodiments, however, it should be recognized that the embodiments described herein with respect to the drawing figures are meant to be illustrative only and should not be taken as limiting the scope of what is claimed. Those of skill in the art will recognize that the illustrated embodiments can be modified in arrangement and detail. Therefore, the devices and methods as described herein contemplate all such embodiments as may come within the scope of the following claims and equivalents thereof. In the claims, only elements denoted by the words “means for” are intended to be interpreted as means plus function claims under 35 U.S.C. §112, the sixth paragraph.