METHOD AND MEASURING ASSEMBLY FOR MEASURING LAYER THICKNESS AND SOUND VELOCITY IN SINGLE- OR MULTILAYERED SAMPLES USING ULTRASOUND, WITHOUT A PRIORI KNOWLEDGE OF THE OTHER VARIABLE
20200240821 ยท 2020-07-30
Inventors
Cpc classification
G01F1/667
PHYSICS
G01N2291/044
PHYSICS
G01N29/07
PHYSICS
G01N29/041
PHYSICS
International classification
Abstract
The disclosure relates to a measurement of the wall thickness of samples such as pipes, containers or panels in which the interior or underside is inaccessible and to a measurement of the layer thickness of coatings or linings of the samples. Disclosed are special measuring arrangements using ultrasonic transmitters and ultrasonic receivers with pitch-catch and pulse-echo configurations, and the associated method for determining the wall thickness without prior knowledge of the sound velocity in the sample. Measuring individual layer thicknesses of a multilayered system without prior knowledge of their sound velocities is also disclosed. The method and the measuring arrangement allow the wall thickness to be measured independently of the knowledge of the sound velocity of the sample. This reduces the measurement uncertainty for the wall thickness and inner diameter of the pipe and thus reduces the measurement uncertainty for a clamp-on ultrasonic flow meter.
Claims
1. A method for measuring layer thickness (w) and speed of sound (c) for a layer in a single- or multilayer sample via ultrasound, the method comprising: measuring time-of-flight differences (t.sub.1, t.sub.2) for ultrasonic signals that travel through the sample on at least two different sound paths (S.sub.1, S.sub.2), wherein the at least two different sound paths (S.sub.1, S.sub.2) run at different angles (.sub.1, .sub.2) at a matching speed of sound in the layer, wherein the at least two different sound paths (S.sub.1, S.sub.2) are produced by virtue of the surface of the single- or multilayer sample having at least one coupling body arranged thereon with at least two sound transducers configured to transmit the ultrasonic signals into the sample through the coupling body on the at least two different sound paths and receive the ultrasonic signals again, wherein the ultrasonic signals each include a sequence of echoes that arise as a result of multiple reflection inside the sample, wherein the echoes have each traveled on a different number of the at least two different sound paths (S.sub.1, S.sub.2) in the sample, wherein the time-of-flight differences (t.sub.1, t.sub.2) are the intervals of time between successive echoes, wherein the layer thickness (w) and speed of sound (c) in the layer are determined via equations
2. The method of claim 1, wherein the time of flight differences includes a first time-of-flight difference (t.sub.1) and a second time-of-flight difference (t.sub.2); the at least two sound transducers include a first sound transducer, a second sound transducer, a third sound transducer and a fourth sound transducer; the first time-of-flight difference (t.sub.1) is determined as a position of a first secondary maximum of an autocorrelation function of a first echo sequence, wherein the first echo sequence includes ultrasonic signals that have traveled from the first sound transducer at the angle (.sub.1) with respect to a perpendicular of the sample surface through the layer to be measured in the sample and back to the first sound transducer or third sound transducer via n back-wall reflection through the sample at least n times and n+1 times; and, the second time-of-flight difference (t.sub.2) is determined as the position of a first secondary maximum of an autocorrelation function of a second echo sequence, wherein the second echo sequence includes ultrasonic signals that have traveled from the fourth sound transducer or second sound transducer at the angle (.sub.2) with respect to the perpendicular of the sample surface through the layer to be measured in the sample and back to the fourth sound transducer, second sound transducer or third sound transducer via n back-wall reflection through the sample at least n times and n+1 times.
3. The method of claim 1 further comprising: switching-on and switching-off of individual piezo-elements of an active sound transducer surface area of the at least two sound transducers, which include multiple piezo-elements, so as to cause signal components that pass through the sample on the sound paths (S.sub.1, S.sub.2) and arrive at the sound transducer to be selected.
4. The method of claim 3, wherein the sample is a sample having at least two layers; and, the switching-on and switching-off of individual piezo-elements of an active sound transducer surface area of the at least two sound transducers results in the layer thickness (w) and the speed of sound (c) being determined for each of the at least two layers.
5. A measuring assembly for measuring layer thickness (w) and speed of sound (c) via ultrasound for a single- or multilayer sample, wherein the sample defines a surface, the measuring assembly comprising: at least one coupling body configured to be arranged on the surface of the sample; and, at least two sound transducers arranged on said coupling body at defined angles and configured such that ultrasound enters the sample through said coupling body at a beam angle (.sub.1, .sub.2) and passes through at least two sound paths (S.sub.1, S.sub.2) in a layer of the sample and is reflected back to said at least two sound transducers at an angle (.sub.1, .sub.2).
6. The measuring assembly of claim 5, wherein said coupling body defines a basic shape; said basic shape is a cuboid having an upper top face; and, said upper top face has beveled longitudinal lateral edges.
7. The measuring assembly of claim 5 further comprising a plurality of reflectors configured to be arranged on the sample or on layers of the sample, so that transmitted ultrasonic signals pass through the sample on the sound paths (S.sub.1, S.sub.2) at least twice and are received again by said at least two sound transducers.
8. The measuring assembly of claim 5 further comprising: a third sound transducer arranged perpendicularly to the sample surface.
9. The measuring assembly of claim 5, wherein said at least two sound transducers including a first sound transducer and a second sound transducer, the measuring assembly further comprising: a third sound transducer; said first sound transducer and said second sound transducers being configured as clamp-on flow sensors; and, said third sound transducer being configured as an ultrasonic wall thickness gauge.
10. The measuring assembly of claim 5, wherein two transmitter/receiver pairs each comprising two sound transducers are arranged on said coupling body at angles (.sub.1, .sub.2) such that a first transmitter/receiver pair is at a first angle (.sub.1) with respect to the sample surface that is different than a second angle (.sub.2) of the second transmitter/receiver pair.
11. The measuring assembly of claim 5, wherein said at least two sound transducers include sound transducer arrays having at least one piezo-element.
12. The measuring assembly of claim 11, wherein said at least two sound transducers are configured to define an active sound transducer surface area with multiple piezo-elements via switching-on and switching-off of individual ones of said piezo-elements.
13. The measuring assembly of claim 5, wherein said at least two sound transducers includes a first sound transducer configured to transmit ultrasound at a first beam angle .sub.1 through said coupling body along a first beam path S.sub.1; and; said at least two sound transducers includes a second sound transducer configured to transmit ultrasound at a second beam angle .sub.2 through said coupling body along a second beam path S.sub.2.
14. A method for measuring layer thickness (w) and speed of sound (c) for a layer in a single- or multilayer sample via ultrasound, the method comprising: transmitting ultrasonic signals through a coupling body arranged on a surface of the sample into the sample via at least two sound transducers, wherein the ultrasonic signals travel through the sample on at least two different sound paths (S.sub.1, S.sub.2) wherein the sound paths (S.sub.1, S.sub.2) run at different angles (.sub.1, .sub.2) at the same speed of sound in the same layer; receiving the ultrasonic signals again via the at least two sound transducers, wherein the ultrasonic signals each include a sequence of echoes that arise as a result of multiple reflection inside the sample, wherein the echoes have each traveled on a different number of the at least two different sound paths (S.sub.1, S.sub.2) in the sample; determining time-of-flight differences (t.sub.1, t.sub.2) of the ultrasonic signals, wherein the time-of-flight differences (t.sub.1, t.sub.2) are intervals of time between successive echoes; and, determining the layer thickness (w) and speed of sound (c) in the layer via equations
Description
BRIEF DESCRIPTION OF THE DRAWINGS
[0024] The invention will now be described with reference to the drawings wherein:
[0025]
[0026]
[0027]
[0028]
[0029]
[0030]
[0031]
[0032]
[0033]
DESCRIPTION OF THE PREFERRED EMBODIMENTS OF THE INVENTION
[0034]
[0035] The sound transducers are arranged on the coupling body 2. In principle, all sound transducers can be embodied as sound transducer arrays, that is, they can consist of one or more piezo-elements, which means that the active sound transducer surface area can be changed by switching the piezo-elements on and off. The sound transducers are oriented at different angles with respect to the sample surface, so that transmitted ultrasonic signals pass through the sample 1 on sound paths S.sub.1 and S.sub.2 at least twice and are received again by the sound transducers.
[0036]
[0037] In
[0038]
[0039]
[0040]
[0041]
[0042]
[0043] The method for determining the layer thickness w and the speed of sound c of a sample 1 is based on the time-of-flight measurement of two ultrasonic signals that have traveled on different sound paths S.sub.1 and S.sub.2 through the sample 1. The sound paths S.sub.1 and S.sub.2 are characterized in that they differ in their angle to the sample surface and length, whereas the speed of sound of the ultrasonic waves on the two sound paths S.sub.1 and S.sub.2 is the same. The sound paths S.sub.1 and S.sub.2 in the sample 1 can be realized by means of different measuring arrangements. The realization of the time-of-flight measurement of signals on the sound paths S.sub.1 and S.sub.2 through the sample 1 and the unilateral coupling of the measuring arrangement to the sample 1 are common to the different measuring arrangements.
[0044] Two transmitting and receiving sound transducer pairs 3, 6 and 4, 5 that are at different beam angles .sub.1 and .sub.2 with respect to the perpendicular of the sample surface can be used to produce the sound paths S.sub.1 and S.sub.2 at an angle .sub.1 and .sub.2, see
[0045] An ultrasonic signal transmitted by the transmitting sound transducer 3, 4 via the coupling body 2 into the sample 1 passes through the sound path S.sub.1 or S.sub.2 at least once. When the ultrasonic signal leaves the sample 1, the ultrasonic signal is split into two components: one component is transmitted into the coupling body and routed to the receiving sound transducer 5 or 6, and another component is reflected back into the sample 1 and passes through an additional sound path S.sub.1* or S.sub.2* (see
[0046] Below, all sound paths in the sample 1 that have the same length and the same angle to the sample surface as S.sub.1 and S.sub.2 but are shifted parallel thereto inside the sample on account of a reflection at the interface between coupling body 2 and sample 1 are also referred to as sound path S.sub.1 or S.sub.2.
[0047] The above-described multiple reflections inside the sample 1 mean that the receiving ultrasonic signals consist of the superimposition of multiple signal components that have traveled on a different number of the sound paths S.sub.1 and S.sub.2 in the sample. The individual signal components therefore have different times of arrival at the receiving sound transducer. The superimposition of the described signal components is referred to as an echo sequence: the signal component that is first in time has never traveled on the sound path S.sub.1 or S.sub.2 (was reflected by the sample surface and routed to the receiver), the second signal component has traveled on the sound path S.sub.1 or S.sub.2 once, and later signal components have traveled on sound paths with the length of S.sub.1 or S.sub.2 repeatedly.
[0048] Each time the sample 1 is passed through on sound paths S.sub.1 and S.sub.2, the time of arrival of the respective signal component at the receiver is delayed by the time-of-flight difference t.sub.1 or t.sub.2. An ultrasonic signal in the form of an echo sequence is therefore obtained at the receiver 5 or 6. The interval of time between the arriving signal components (echo sequence interval) within the ultrasonic signal over the sound path S.sub.1 or S.sub.2 is the time-of-flight difference t.sub.1 or t.sub.2. The time-of-flight difference t.sub.1 or t.sub.2 is determined by the layer thickness w of a layer of the sample 1, the speed of sound c in a layer of the sample 1, the speed of sound ca in the coupling body 2 and the beam angle .sub.1 or .sub.2. The sound paths S.sub.1 and S.sub.2 themselves are determined by means of the layer thickness w and by means of the law of refraction by means of the beam angle .sub.1 or .sub.2. These angles are known from the configuration of the measuring arrangement. Ultimately, two equations for the two unknowns layer thickness w and speed of sound c can be established on the basis of the measured variables time-of-flight difference t.sub.1 and t.sub.2.
In this instance, the abbreviated notation
is used, where K.sub..sub.
The sensor constants K.sub..sub.
with i={1,2} and
c.sub. speed of sound in the coupling body (2),
.sub.i angle of the sound ray with respect to the perpendicular in the coupling body (2).
[0049] The text below takes the exemplary measuring arrangement from
[0050] So that the speed of sound in the sample 1 is the same on both sound paths S.sub.1 and S.sub.2, the angle of the oblique arrangement needs to be below the first critical angle as far as possible. If the angle of the oblique measurement is above the first critical angle but below the second critical angle, performance of the method requires a transverse wave perpendicular sound transducer to be used for perpendicular measurement. This is the case for the embodiment depicted in
[0051] The formulae for the special case of performance using a perpendicular measuring arrangement and an oblique measuring arrangement are disclosed below.
[0052] To determine the speed of sound c in the sample 1, the measuring arrangements depicted above (oblique measurement and perpendicular measurement) are used to determine the time-of-flight differences t.sub.1 and t.sub.perpendicular. Using the equations from (1.3), these two measured values can be used to determine the speed of sound c and the layer thickness w in the sample 1. Formula (1.3) is obtained as a special case from (1.1) with
.sub.2=.sub.2=0 and t.sub.2=t.sub.perpendicular.
[0053] t.sub.perpendicular is the time-of-flight difference on the sound path S.sub.2 and corresponds to the echo sequence interval between ultrasonic signals that have traveled through the sample 1 and back to the receiver 8 (by means of n back-wall reflections in the sample 1) from the transmitter 8 perpendicularly to the sample surface n times and n+1 times. In the case of perpendicular measurement, the transmitter and the receiver are the same sound transducer. In the case of oblique measurement, the transmitter 3 and the receiver 6 are different sound transducers.
[0054] t.sub.1 is the time-of-flight difference on the sound path S.sub.1 and corresponds to the echo sequence interval between ultrasonic signals that have traveled through the sample 1 and back to the receiver 6 (by means of n back-wall reflection through the sample 1) from the transmitter 3 at the angle .sub.1 with respect to the perpendicular of the sample surface n times and n+1 times. Sound paths 10 and 11 are this instance for n=1.
[0055] The echo sequence intervals are determined by using the autocorrelation function from the picked-up echo sequences.
[0056] The echo sequence for the oblique measurement in the example from
[0057] To determine the individual layer thicknesses w in multilayer systems, each individual layer 16 and 17 of the sample 1 is measured using the method described above. In order to be able to evaluate the times-of-flight from the individual layers 16 and 17, the superimposition of the echo sequences is avoided by switching-on and switching-off of individual piezo-elements 301, 601.
[0058] The echo sequence from the perpendicular measurement using the sound transducer 8 in
[0059] Accordingly, formula (1.3) can be used to determine the layer thickness w and the speed of sound c for the upper layer 16 of the sample 1.
[0060] In order to measure the lower level 17 of the sample 1, those elements on the receiver of the sound transducer pair 15 that are situated further to the right are activated (depicted without crosses) and the previously activated elements (depicted with a cross) are switched off. An echo sequence consisting of multiple reflections in the lower layer 17 is now picked up (echo sequence consists of signal components that have passed through the layer 17 obliquely at least once) and the pulse sequence time interval on the basis of multiple reflection in layer 17 is evaluated. This is successful only if either further echoes from the upper layer 16 can be largely masked by the change in the receiving transducer surface area or multiple reflections in the upper layer 16 are attenuated to a greater extent than in the lower layer 17. Furthermore, the previously obtained knowledge of the layer thickness of the upper layer 16 can be used to predict the timing of the echoes from the upper layer 16 and hence to remove it from the evaluation of the pulse sequence time intervals for the lower layer 17.
[0061] The echo sequence from perpendicular measurement 8 in
[0062] It is understood that the foregoing description is that of the preferred embodiments of the invention and that various changes and modifications may be made thereto without departing from the spirit and scope of the invention as defined in the appended claims.
REFERENCE SIGNS
[0063] 1 Sample [0064] 2 Coupling body [0065] 201 Coupling face [0066] 202 Top face of the coupling body 2 [0067] 203, 204, 205, 206 longitudinal lateral edges [0068] 3 Sound transducer [0069] 301 Piezo-elements [0070] 4 Sound transducer [0071] 5 Sound transducer [0072] 6 Sound transducer [0073] 601 Piezo-elements [0074] 7 Reflectors [0075] 8 Sound transducer [0076] 801 Piezo-elements [0077] 9 Sound path [0078] 10 Sound path [0079] 11 Sound path [0080] 12 Sound path [0081] 13 Sound transducer (clamp-on flow sensors) [0082] 131 Piezo-elements [0083] 14 Sound transducer (ultrasonic wall thickness gauge) [0084] 141 Piezo-elements [0085] 15 Sound transducer [0086] 16 upper layer of the sample 1 [0087] 17 lower layer of the sample 1 [0088] 18 Sound path [0089] 19 Sound path [0090] .sub.1, .sub.2 Angle of the sound ray with respect to the perpendicular in the coupling body 2 [0091] .sub.1, .sub.2 Angle of the sound ray with respect to the perpendicular in the in the sample 1 [0092] S.sub.1, S.sub.2 Sound paths in a layer of the sample [0093] S.sub.1*, S.sub.2* Sound paths in a layer of the sample, shifted parallel to S.sub.1, S.sub.2 [0094] t.sub.1, t.sub.2Time-of-flight differences in the ultrasound on sound path S.sub.1, S.sub.2 [0095] t.sub.perpendicular Time-of-flight difference on sound path S.sub.1 for the perpendicular measurement [0096] c Speed of sound in the sample 1 [0097] c.sub. Speed of sound in the coupling body 2 [0098] w Layer thickness [0099] K.sub..sub.