OPTICAL DIFFRACTION COMPONENT FOR SUPPRESSING AT LEAST ONE TARGET WAVELENGTH BY DESTRUCTIVE INTERFERENCE
20200225586 ยท 2020-07-16
Inventors
- Heiko Feldmann (Aalen, DE)
- Valentin Bolsinger (Aalen, DE)
- William Peter Van Drent (Veldhoven, NL)
- Jozef Petrus Henricus Benschop (Veldhoven, NL)
Cpc classification
G02B5/1861
PHYSICS
G03F7/70191
PHYSICS
G03F7/702
PHYSICS
G03F7/70175
PHYSICS
G02B5/1819
PHYSICS
G03F7/70166
PHYSICS
G03F7/70575
PHYSICS
International classification
Abstract
An optical diffraction component is configured to suppress at least one target wavelength by destructive interference. The optical diffraction component includes at least three diffraction structure levels that are assignable to at least two diffraction structure groups. A first of the diffraction structure groups is configured to suppress a first target wavelength .sub.1. A second of the diffraction structure groups is configured to suppress a second target wavelength .sub.2, where (.sub.1.sub.2).sup.2/(.sub.1+.sub.2).sup.2<20%. A topography of the diffraction structure levels can be described as a superimposition of two binary diffraction structure groups. Boundary regions between adjacent surface sections of each of the binary diffraction structure groups have a linear course and are superimposed on one another at most along sections of the linear course.
Claims
1. A component, comprising: a periodic grating structure profile comprising diffraction structures configured so that a wavelength range around a first wavelength, is diffracted by the periodic grating structure profile, wherein: the first wavelength, .sub.1, is in the infrared wavelength range; the wavelength range comprises radiation components comprising at least three different phases which interfere with each other destructively in at least one order of diffraction; the at least one order of diffraction is selected from the group consisting of: the zero order of diffraction of the first wavelength, .sub.1; the + first order of diffraction of the first wavelength, .sub.1; and the first order of diffraction of the first wavelength, .sub.1; the diffraction structures comprise diffraction structure levels; the diffraction structure levels comprise: a neutral diffraction structure level corresponding to a reference height of zero; a positive diffraction structure level arranged higher by an optical path length of .sub.1/4+/20% relative to the neutral diffraction structure level; and a negative diffraction structure level arranged lower by an optical path length of .sub.1/4+/20% relative to the neutral diffraction structure level; and the diffraction structure levels define a topography of a grating period of a grating structure profile that is repeated regularly along a direction.
2.-5. (canceled)
6. The component of claim 1, wherein the grating period comprises: a first neutral diffraction structure section having the neutral diffraction structure level; a second neutral diffraction structure section having the neutral diffraction structure level; a positive diffraction structure section having the positive diffraction level; and a negative diffraction structure section having the negative diffraction structure level.
7. The component of claim 6, wherein the diffraction structure sections have the following sequence: the positive diffraction structure level; the first neutral diffraction structure level; the negative diffraction structure level; and the second neutral diffraction structure level.
8. The component of claim 1, wherein, along the direction, the diffraction structure sections have the same length within +/20%.
9.-15. (canceled)
16. The component of claim 1, wherein: the wavelength range further comprises a second wavelength, .sub.2; the wavelength, .sub.2, is different from the first wavelength, .sub.1; and the second wavelength, .sub.2, is in the infrared wavelength range.
17. The component of claim 16, wherein the diffraction structures are configured so that the wavelength range further comprises radiation components comprising at least three additional different phases which interfere with each other destructively in at least one order of diffraction selected from the group consisting of: the zero order of diffraction of the first wavelength, .sub.2; the + first order of diffraction of the first wavelength, .sub.2; and the first order of diffraction of the first wavelength, .sub.2.
18. The component of claim 16, wherein (.sub.1.sub.2).sup.2/(.sub.1+.sub.2).sup.2<20%.
19.-34. (canceled)
35. The component of claim 18, wherein (.sub.1.sub.2).sup.2/(.sub.1+.sub.2).sup.2>0.01%.
36.-38. (canceled)
39. The component of claim 16, wherein the wavelength range comprises radiation components comprising at least three different phases which interfere with one each other destructively in the zero order of diffraction of the first wavelength, .sub.2.
40. The component of claim 16, wherein the wavelength range comprises radiation components comprising at least three different phases which interfere with one each other destructively in the + first order of diffraction of the first wavelength, .sub.2.
41. The component of claim 16, wherein the wavelength range comprises radiation components comprising at least three different phases which interfere with one each other destructively in the first order of diffraction of the first wavelength, .sub.2.
42.-58. (canceled)
59. A component, comprising: at least three diffraction structure levels defining different structure depths relative to a reference plane, wherein: the three diffraction structure levels are assignable to at least first and second diffraction structure groups; the first diffraction structure group is configured to suppress the zero order of diffraction of a first wavelength, .sub.1; the second diffraction structure group is configured to suppress the zero order of diffraction of a second wavelength, .sub.2;
(.sub.1.sub.2).sup.2/+.sub.2).sup.2<20%; a topography of the diffraction structure levels comprises a superimposition of first and second binary diffraction structure groups; for each of the first and second binary diffraction structure groups: the binary diffraction structure group comprises first surface sections having a first structure depth and second surface sections having a second structure depth; and the first and second surface sections alternate along a direction; boundary regions between adjacent surface sections of the first and second binary diffraction structure groups have a linear course; and boundary regions of the first binary diffraction structure group and boundary regions of the second binary diffraction structure group are superimposed on each other at most along sections of their linear course.
60. The component of claim 59, wherein the boundary regions of the first binary diffraction structure group and the boundary regions of the second diffraction structure group run completely separately from one another.
61. The component of claim 59, wherein no sections of the boundary regions of the first binary diffraction structure group and boundary regions of the second binary diffraction structure group are superimposed on each other.
62. The component of claim 59, wherein: the first diffraction structure group comprises a first diffraction grating supported by a grating surface; the first diffraction grating has a first grating period; the first diffraction grating comprises first diffraction positive structures and first diffraction negative structures; the first diffraction positive structures are perpendicular to a section of the grating surface surrounding the first diffraction positive structures; the first diffraction negative structures are perpendicular to a section of the grating surface surrounding the first diffraction negative structures; the first diffraction grating has a first structure depth that is an optical path difference between the first diffraction positive structures and the first diffraction negative structures; the second diffraction structure group comprises a second diffraction grating supported by the grating surface; the second diffraction grating has a second grating period; the second diffraction grating comprises second diffraction positive structures and second diffraction negative structures; the second diffraction positive structures are perpendicular to a section of the grating surface surrounding the second diffraction positive structures; the second diffraction negative structures are perpendicular to a section of the grating surface surrounding the second diffraction negative structures; and the second diffraction grating has a second structure depth that is an optical path difference between the second diffraction positive structures and the second diffraction negative structures.
63. The component of claim 62, wherein: the first grating period runs along a first direction; the second grating period runs along a second direction; and the first and second directions are not parallel to each other.
64. The component of claim 59, wherein the component is configured so that, for the first and second diffraction gratings, surface areas of the diffraction positive structures and of the diffraction negative structures make identical contributions to the entire grating surface.
65. The component of claim 59, wherein the component is configured so that, for the first and second diffraction gratings, surface areas of the diffraction positive structures and of the diffraction negative structures make contributions to the entire grating surface that differ by at most 20% from each other.
66.-71. (canceled)
72. The component of claim 59, further comprising a third diffraction grating supported by the grating surface.
73. The component of claim 72, wherein: the third diffraction grating comprises third diffraction positive structures and third diffraction negative structures; the third diffraction grating has a third grating period; the third diffraction positive structures are perpendicular to a section of the grating surface surrounding the third diffraction positive structures; the third diffraction negative structures are perpendicular to a section of the grating surface surrounding the third diffraction negative structures; the third diffraction grating has a third structure depth that is an optical path difference between the third diffraction positive structures and the third diffraction negative structures.
74.-86. (canceled)
87. The component of claim 73, wherein: the first grating period runs along a first direction; the third grating period runs along a third direction; and the first and third directions are not run parallel to each other.
88.-103. (canceled)
104. A collector, comprising: a component according to claim 1, wherein the collector is a lithography collector.
105. The collector of claim 104, wherein the collector mirror is configured to guide: used radiation toward a focal region; and radiation having the first wavelength, .sub.1, away from the focal region.
106. The collector of claim 104, wherein the collector is an EUV lithography collector.
107. An illumination system, comprising: a lithography collector comprising a component according to claim 1; and an illumination optical unit configured to illuminate an object field.
108. An optical system, comprising: a lithography collector comprising a component according to claim 1; an illumination optical unit configured to illuminate an object field; and a projection optical unit configured to image the object field into an image field.
109. An apparatus, comprising: a light source; a lithography collector comprising a component according to claim 1; an illumination optical unit configured to illuminate an object field; and a projection optical unit configured to image the object field into an image field, wherein the apparatus is a projection exposure apparatus.
110.-112. (canceled)
113. A method of using a projection exposure apparatus comprising an illumination optical unit and a projection optical unit, the method comprising: using the illumination optical unit to illuminate a reticle in an object field of the projection optical unit; and using the projection optical unit to project a structure of the reticle onto a light-sensitive material in an image field of the projection optical unit, wherein the illumination optical unit comprises a lithography collector comprising a component according to claim 1.
114.-116. (canceled)
117. A method, comprising: impinging a wavelength range of light onto a collector so that light having a first wavelength, .sub.1, is diffracted away from a focal region of the collector, wherein: the first wavelength, .sub.1, is within the wavelength range; the first wavelength, .sub.1, is in the infrared wavelength range; the wavelength range comprises radiation components comprising at least three different phases which interfere with each other destructively in at least one order of diffraction; and the at least one order of diffraction is selected from the group consisting of: the zero order of diffraction of the first wavelength, .sub.1; the + first order of diffraction of the first wavelength, .sub.1; and the first order of diffraction of the first wavelength, .sub.1.
118. The method of claim 117, further comprising, simultaneously with impinging the wavelength range of light onto the collector, impinging EUV light onto the collector so that the EUV light is diffracted toward the focal region of the collector.
119. The method of claim 117, wherein: the wavelength range further comprises a second wavelength, .sub.2; the method further comprises diffracting light having the second wavelength, .sub.2, away from the focal region of the collector; the wavelength, .sub.2, is different from the first wavelength, .sub.1; and the second wavelength, .sub.2, is in the infrared wavelength range.
119.-131. (canceled)
132. The component of claim 6, wherein: along the direction, extensions of the diffraction structure sections differ from each other in pairs; and a sum of a length of the positive diffraction structure along the direction and a length of the negative diffraction structure along the direction is equal to two times a length of the first neutral diffraction structure along the direction.
133. The component of claim 6, wherein: the positive diffraction structure level has a structure depth which is greater than .sub.1/4; the negative diffraction structure level has a structure depth which has the same absolute value as the structure depth of the positive diffraction structure level; and compared to .sub.1/4, structure depth variations of the positive diffraction structure level and of the negative diffraction structure level are such that phases of light which are reflected by the positive diffraction structure level and by the negative diffraction structure level yield an average value which is located at a phase position of destructive interference of the reflected light.
134. The component of claim 6, wherein the diffraction structure sections have the following sequence: the first neutral diffraction structure level; the second neutral diffraction structure level; the positive diffraction structure level; and the negative diffraction structure level.
Description
BRIEF DESCRIPTION OF THE DRAWINGS
[0091] Exemplary embodiments of the invention are explained in greater detail below with reference to the drawing. In the drawing:
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DESCRIPTION OF EXEMPLARY EMBODIMENTS
[0139] A projection exposure apparatus 1 for microlithography includes a light source 2 for illumination light or imaging light 3, which will be explained in yet more detail below. The light source 2 is an EUV light source, which produces light in a wavelength range of, for example, between 5 nm and 30 nm, in particular between 5 nm and 15 nm. The illumination light or imaging light 3 is also referred to as EUV used light below.
[0140] In particular, the light source 2 can be a light source with a wavelength of 13.5 nm or a light source with a wavelength of 6.9 nm. Other EUV wavelengths or else wavelengths in the DUV range of between 150 nm and 250 nm, for example of 193 nm, are also possible. A beam path of the illumination light 3 is illustrated extremely schematically in
[0141] An illumination optical unit 6 serves to guide the illumination light 3 from the light source 2 to an object field 4 in an object plane 5. The illumination optical unit includes a field facet mirror FF illustrated highly schematically in
[0142] Pupil facets (not illustrated in any more detail) of the pupil facet mirror PF are part of a transfer optical unit, which transfer, and in particular image, field facets (likewise not illustrated) of the field facet mirror FF into the object field 4 in a manner being superimposed on one another. An embodiment known from the prior art can be used for the field facet mirror FF on the one hand and the pupil facet mirror PF on the other hand. By way of example, such an illumination optical unit is known from DE 10 2009 045 096 A1.
[0143] Using a projection optical unit or imaging optical unit 7, the object field 4 is imaged into an image field 8 in an image plane 9 with a predetermined reduction scale. Projection optical units which may be used to this end are known from e.g. DE 10 2012 202 675 A1.
[0144] In order to facilitate the description of the projection exposure apparatus 1 and the various embodiments of the projection optical unit 7, a Cartesian xyz-coordinate system is indicated in the drawing, from which system the respective positional relationship of the components illustrated in the figures is evident. In
[0145] The object field 4 and the image field 8 are rectangular. Alternatively, it is also possible for the object field 4 and the image field 8 to have a bent or curved embodiment, that is to say, in particular, a partial ring shape. The object field 4 and the image field 8 have an x/y-aspect ratio of greater than 1. Therefore, the object field 4 has a longer object field dimension in the x-direction and a shorter object field dimension in the y-direction. These object field dimensions extend along the field coordinates x and y.
[0146] One of the exemplary embodiments known from the prior art can be used for the projection optical unit 7. What is imaged in this case is a portion of a reflection mask 10, also referred to as reticle, coinciding with the object field 4. The reticle 10 is carried by a reticle holder 10a. The reticle holder 10a is displaced by a reticle displacement drive 10b.
[0147] The imaging by way of the projection optical unit 7 is implemented on the surface of a substrate 11 in the form of a wafer, which is carried by a substrate holder 12. The substrate holder 12 is displaced by a wafer or substrate displacement drive 12a.
[0148]
[0149] The projection exposure apparatus 1 is of the scanner type. Both the reticle 10 and the substrate 11 are scanned in the y-direction during the operation of the projection exposure apparatus 1. A stepper type of the projection exposure apparatus 1, in which a stepwise displacement of the reticle 10 and the substrate 11 in the y-direction is implemented between individual exposures of the substrate 11, is also possible. These displacements are effected synchronously with one another by an appropriate actuation of the displacement drives 10b and 12a.
[0150]
[0151] The light source 2 is an LPP (laser produced plasma) source. For the purposes of producing plasma, tin droplets 15 are generated as a continuous droplet sequence by a tin droplet generator 16. A trajectory of the tin droplets 15 extends transversely to a principal ray direction 17 of the EUV used light 3. Here, the tin droplets 15 drop freely between the tin droplet generator 16 and a tin capturing device 18, with the droplets passing through a plasma source region 19. The EUV used light 3 is emitted by the plasma source region 19. When the tin droplet 15 arrives in the plasma source region 19, it is impinged upon there by pump light 20 from a pump light source 21. The pump light source 21 can be an infrared laser source in the form of e.g. a CO.sub.2 laser. Some other IR laser source is also possible, in particular a solid-state laser, for example an Nd:YAG laser. The pump light source 21 can include a light source unit for producing a light prepulse and a light source unit for producing a main light pulse. The light prepulse, on the one hand, and the main light pulse, on the other hand, can have different light wavelengths.
[0152] The pump light 20 is transferred into the plasma source region 19 by way of a mirror 22, which can be a mirror that is tiltable in a controlled fashion, and by way of a focusing lens element 23. A plasma emitting the EUV used light 3 is produced by the pump light impingement from the tin droplet 15 arriving in the plasma source region 19. A beam path of the EUV used light 3 is illustrated in
[0153] The field facet mirror FF is disposed downstream of the intermediate focus 26 in the beam path of the EUV used light 3, in the region of a far field of the EUV used light 3.
[0154] The EUV collector 24 and further components of the light source 2, which may be the tin droplet generator 16, the tin capturing device 18 and the focusing lens element 23, are arranged in a vacuum housing 27. The vacuum housing 27 has a passage opening 28 in the region of the intermediate focus 26. In the region of an entrance of the pump light 20 into the vacuum housing 27, the latter includes a pump light entrance window 29 for the light prepulse and for the main light pulse.
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[0156] Optionally, guidance of the pump light 20 to the source region 19 may include multiple passage openings in the collector 24 and/or may involve guidance of the pump light 20 to the source region 19 from multiple different directions without having the pump light 20 pass through a passage opening in the collector 24. Referring again to
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[0158] The grating surface of the optical grating 34 can be embodied as plane or else curved, e.g. concave like the impingement surface 33 in the case of the collector mirror 24 according to
[0159] The optical grating 34 has, as diffraction structure groups, two diffraction gratings 35, 36 arranged on the grating surface 33. The diffraction grating 35 is also referred to hereinafter as first diffraction grating. The diffraction grating 36 is also referred to hereinafter as second diffraction grating.
[0160] In the case of the diffraction grating 35, diffraction positive structures 37 and diffraction negative structures 38 run alternately in each case horizontally in
[0161] In
[0162] The diffraction structures 37, 38 and 40, 41 of the two diffraction gratings 35, 36 of the optical grating 34 are realized by four diffraction structure types or diffraction structure levels, which differ in their structure depth and are illustrated in
[0163] The respective structure depth can be assigned a depth value relative to a reference plane, wherein as a general rule the reference plane chosen is the one for which no material is removed (structure depth=0).
[0164] The respective areas of the diffraction structure types 1 to 4 are square in each case. Other boundary shapes of the diffraction structure types which result in complete coverage of the grating surface are also possible. Such boundary shapes include, for example, those having straight sides, such as, for example, rectangular, trapezoidal, triangular, scalene, pentagonal, hexagonal, octagonal, and/or parallelogram, generally so long as complete coverage of the grating surface is achieved via the use such boundary shapes.
[0165] The diffraction structure type 3 has a structure depth dh, once again measured relative to the diffraction structure type 1 perpendicularly to the plane of the drawing in
[0166] In the case of the optical grating 34, the four diffraction structure types 1 to 4 are respectively arranged in a 22 array, wherein the diffraction structure type 1 is arranged at the top left, the diffraction structure type 2 is arranged at the top right, the diffraction structure type 3 is arranged at the bottom left and the diffraction structure type 4 is arranged at the bottom right. These 22 arrays of such groups of the 4 diffraction structure types in each case are in turn arranged in a superstructure in the form of a 33 array in the embodiment according to
[0167] Diffraction positive structures 37 and diffraction negative structures 38 situated at a position deeper by the structure depth dh in comparison therewith thus succeed one another in the period running direction 39 of the first diffraction grating 35. In the case of the second diffraction grating 36, one of the diffraction positive structures 40 is respectively followed, in the period running direction 42, by a diffraction negative structure 41 situated at a position deeper by the structure depth dv. Two diffraction gratings 35, 36 being superimposed on one another and having respective structure depths dh and dv are thus realized in the optical grating 34.
[0168] In the case of the embodiment according to
[0169] On the diffraction positive structures 37, 40 and the diffraction negative structures 38, 41, over the whole area it is possible to apply a highly reflective coating on the optical grating 34, and optionally also an auxiliary layer.
[0170] The auxiliary layer, which is arranged below the highly reflective coating, can be a layer that increases a lifetime of the optical grating 34. Alternatively or additionally, an auxiliary layer can also be applied on the highly reflective coating in order to protect the latter against damage.
[0171] The highly reflective coating can be a multilayer, such as is known for the highly effective reflection of, in particular, radiation having EUV wavelengths.
[0172] The diffraction gratings 35, 36 of the optical grating 34 are embodied in each case as a binary grating. Here the surface area of the diffraction positive structures is equal to the surface area of the diffraction negative structures.
[0173] A grating period of the diffraction grating 35 can be in the range of between 0.5 mm and 5 mm (e.g., from 0.5 mm to 4.5 mm, from 0.5 mm to 4 mm, from 0.5 mm to 3.5 mm, from 0.5 mm to 3 mm, from 0.5 mm to 2.5 mm, from 0.5 mm to 2 mm, from 0.5 mm to 1.5 mm, from 0.5 mm to 1 mm, from 1 mm to 5 mm, from 1.5 mm to 5 mm, from 2 mm to 5 mm, from 2.5 mm to 5 mm, from 3 mm to 5 mm, from 3.5 mm to 5 mm, from 4 mm to 5 mm, from 4.5 mm to 5, 2 mm). A grating period of the diffraction grating 36 can be in the range of between 0.5 mm and 5 mm (e.g., from 0.5 mm to 4.5 mm, from 0.5 mm to 4 mm, from 0.5 mm to 3.5 mm, from 0.5 mm to 3 mm, from 0.5 mm to 2.5 mm, from 0.5 mm to 2 mm, from 0.5 mm to 1.5 mm, from 0.5 mm to 1 mm, from 1 mm to 5 mm, from 1.5 mm to 5 mm, from 2 mm to 5 mm, from 2.5 mm to 5 mm, from 3 mm to 5 mm, from 3.5 mm to 5 mm, from 4 mm to 5 mm, from 4.5 mm to 5, 0.5 mm, 1 mm, 1.5 mm, 2 mm, 2.5 mm, 3 mm, 3.5 mm, 4 mm, 4.5 mm, 5 mm).
[0174] Such a grating period is designated by P for the second diffraction grating 36 in
[0175]
[0176] For the two target wavelengths 10.2 m (.sub.1) and 10.6 m (.sub.2) it holds true that:
(.sub.1.sub.2).sup.2/(.sub.1+.sub.2).sup.2=3.77.Math.10.sup.4
[0177] For this normalized target wavelength ratio it thus holds true that:
(.sub.1.sub.2).sup.2/(.sub.1+.sub.2).sup.2<10%
[0178] This normalized target wavelength ratio can also be less than 20%.
[0179] A reflectivity curve R () taking account of specific tolerances as far as firstly the accuracy of the production of the structure depths dv and dh and also the sidewall steepness are concerned is plotted at 44 in
[0180] A reference reflectivity curve 45 is also entered in
[0181] The two diffraction gratings 35, 36 have a ratio between a grating period (2 mm) and a structure depth (in the region of 2.6 m) which is significantly greater than 10 and is actually greater than 500 and is in the region of 1000. Exemplary ratios include 100, 150, 200, 250, 300, 350, 400, 450, 500, 550, 600, 650 700, 750, 800, 850, 900, 950 and 1000.
[0182] On account of the embodiment of the two diffraction gratings 35, 36 as binary gratings, a surface area ratio of the surface areas of the diffraction positive structures 37, 40 to surface areas of the diffraction negative structures 38, 41 is 1. Depending on the embodiment of the optical grating 34, the surface area ratio can also deviate from 1 and can be in the range of between 0.9 and 1.1 (e.g., 0.9, 0.95, 1, 1.05, 1.1).
[0183] The two diffraction gratings 35, 36 have the same grating period p, and so a period ratio of the two grating periods is 1 (e.g., 0.9, 0.95, 1, 1.05, 1.1). Depending on the embodiment of the optical grating 34, the period ratio can be in the range of between 0.9 and 1.1 (e.g., 0.9, 0.95, 1, 1.05, 1.1). The differences between the two grating periods can also be significantly greater, such that for example a period ratio of 1:2 or of 1:5 results.
[0184] The optical grating 34 constitutes an optical diffraction component for suppressing at least one target wavelength .sub.1, .sub.2 by destructive interference including at least three diffraction structure levels corresponding to the diffraction structure types 1 to 4. The diffraction structure levels N.sub.1 to N.sub.4 predefine different structure depths d.sub.i relative to a reference plane. The diffraction structure levels N.sub.1 to N.sub.4 can be assigned to the two diffraction gratings, that is to say two diffraction structure groups 35, 36, which in turn serve for suppressing respectively one of the two target wavelengths .sub.1, .sub.2. The first of the diffraction structure groups, that is to say the diffraction grating 35, serves for suppressing the first target wavelength .sub.1 in the zero order of diffraction and the second of the diffraction structure groups, that is to say the diffraction grating 36, serves for suppressing the second target wavelength .sub.2 in the zero order of diffraction.
[0185] The topography of the diffraction structure levels N.sub.1 to N.sub.4 can be described as a superimposition of the two binary diffraction structure groups 35 and 36. Each of these two binary diffraction structure groups has first surface sections having a first structure depth and second surface sections having a second structure depth, which alternate with the first surface sections along a running direction of the respective diffraction structure group 35, 36. Boundary regions between these adjacent surface sections of each of the binary diffraction structure groups have a linear course. Depending on the embodiment of the optical grating 34, the linear course corresponds to the rows and columns of the diffraction structure type arrangement resembling a checkerboard in
[0186] The diffraction grating 35 has a first grating period having a first structure depth, measured as optical path difference between first diffraction positive structures 37 and first diffraction negative structures 38 perpendicular to a surface section of the grating surface 33 that respectively surrounds these first structures. The second diffraction grating 36 has a second grating period and a second structure depth, which is in turn embodied as optical path difference between the second diffraction positive structures 40 and second diffraction negative structures 41 perpendicular to a surface section of the grating surface 33 that respectively surrounds these second structures. The two period running directions along which the two grating periods of these gratings 35, 36 run are perpendicular to one another, that is to say do not run parallel to one another.
[0187] On account of the optical grating 34, the collector mirror of the EUV collector 24 is embodied such that it guides the EUV radiation 3 through towards the focal region 26, wherein the grating 34 is embodied as an optical diffraction component such that the optical diffraction component guides the radiation 30 of the at least one target wavelength, that is to say the stray light, away from the focal region 26.
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[0190] The optical grating 46 according to
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[0192] The optical grating 47 has a total of three diffraction gratings as diffraction structure groups, wherein two of these three diffraction gratings correspond to the diffraction gratings 35 and 36 of the embodiment according to
[0193] A third diffraction grating 48 of the optical grating 47 has diffraction positive structures 49 and diffractive negative structures 50 running diagonally with respect to the diffraction structures 37, 38 and 40, 41 of the first two diffraction gratings 35, 36. In comparison with the diffraction positive structures 49, the diffraction negative structures 50 have a structure depth illustrated by dd in
[0194] An overall height profile over the entire illustrated section of the grating surface of the optical grating 47 can be understood as a juxtaposition of basic sections in the form of 24 arrays, which are predefined by the boundaries of the horizontally running diffraction structures 37, 38 of the diffraction grating 35 and the vertically running diffraction structures 40, 41 of the diffraction grating 36. Diffraction structure types or diffraction structure levels on this 24 array are designated by 000, 001, 010, 011, 100, 101, 110 and 111 on the 24 array arranged at the top left in
[0195] The table below indicates the structure depths of these diffraction structure types and also the surface area proportions thereof in units of the grating periods ph, pv:
TABLE-US-00001 TABLE 1 Diffraction Surface area structure type Structure depth proportion 000 0 (ph + pv)/4 001 dd (ph + pv)/4 010 dv (ph + pv)/4 011 dv + dd (ph + pv)/4 100 dh (ph + pv)/4 101 dh + dd (ph + pv)/4 110 dh + dv (ph + pv)/4 111 dh + dv + dd (ph + pv)/4
[0196] All diffraction structure types 000 to 111 have the same surface area proportion (ph+pv)/4 of the total surface area of the optical grating 47. This ensures that all three diffraction gratings 35, 36 and 48 of the optical grating 47 constitute binary gratings and the diffraction positive structures 37, 40, 49 thereof have a surface area ratio of 1 in each case with respect to the diffraction negative structures 38, 41, 50 thereof.
[0197] A period running direction 51 of the third diffraction grating 48 runs along a grating period pd at an angle of approximately 23 with respect to the period running direction 39 of the diffraction grating 35. This period running direction 51 is chosen together with an offset of an arrangement of the diffraction structures 49, 50 of the third diffraction grating 48 such that boundaries between the diffraction structures 49, 50 of the third diffraction grating 48 run along diagonals of two structure zones lying horizontally next to one another, which are formed by the diffraction structures 37, 38, firstly, and 40, 41, secondly, that intersect one another. An offset variation of this arrangement of the diffraction structures 49, 50 along the period running direction 51 of the third diffraction grating 48 is possible, as indicated by a double-headed arrow 52 in
[0198] The grating period pd of the third diffraction grating 48 is of the order of magnitude of the grating periods ph, pv and is approximately 1.7 mm in the case of the optical grating 47.
[0199]
[0200] A reflectivity for the ideal case of preferably steep sidewalls (sidewall extension 0) for the diffraction gratings 35, 36 and 48 is illustrated at 53 in
[0201] As reference values,
[0202]
[0203] dh=2.55 m, dv=2.65 m and dd=0.26 m.
[0204] The structure depth dd of the diagonally running diffraction structures 49, 50 is thus smaller than the structure depths of the diffraction structures 37, 38, 40, 41 of the diffraction gratings 35, 36 of the optical grating 47 by approximately a factor of 10.
[0205] The reflectivity once again for an ideal design of such an optical grating 47 with a sidewall extension 0 is illustrated at 55 in
[0206] For the two IR wavelengths .sub.2 that are suppressed as target wavelengths by the optical grating 47, the explanation given above in association with the optical grating 34 according to
[0207] A reflectivity curve having predefined tolerances for the structure depths, firstly, and the sidewall extension, secondly, is in turn calculated at 56 in
[0208] In the case of the optical grating 47, a diffraction grating 48 having a further grating period pd and a further structure depth dd is thus present, the structure depth being measured as optical path difference between the diffraction positive structures 49 and the diffraction negative structures 50 perpendicular to a surface section of the grating surface 33 that respectively surrounds these two structures 49, 50. The ratio pd/dd between the grating period pd of the diffraction grating 48 and the structure depth dd of the diffraction grating 48 is greater than 10. Alternatively or additionally, the period ratio ph/pd can be in the range of between 0.9 and 1.1 (e.g., 0.9, 0.95, 1, 1.05, 1.1). Alternatively or additionally, the first grating period ph can run along the first period running direction 39 of the first diffraction grating 35 and the further grating period pd can run along the further period running direction 51 of the further diffraction grating 48 and the two period running directions 39, 51 run parallel to one another.
[0209] The surface areas of the diffraction positive structures 37, 40, 49 and of the diffraction negative structures 38, 41, 50 of the various diffraction structure groups 35, 46, 48 make identical contributions to the entire grating surface 33.
[0210] A further embodiment of an optical grating 57, once again including three diffraction gratings 35, 36, 48, is described below with reference to
[0211] The optical grating 57 differs from the optical grating 47 primarily in the orientation of the three period running directions 39, 42 and 51 of the three diffraction gratings 35, 36 and 48 placed one above another. The period running direction 39 of the first diffraction grating 35 runs at an angle of approximately 23 with respect to the vertical in
[0212] The period running direction 42 of the second diffraction grating 36 runs horizontally.
[0213] The period running direction 51 of the third diffraction grating 48 runs in turn at an angle of approximately 23 with respect to the vertical, wherein the two period running directions 39 and 51 firstly of the first diffraction grating 35 and secondly of the third diffraction grating 48 assume an angle of approximately 46 with respect to one another.
[0214]
[0215] In the case of the optical grating 57, an offset of structure boundaries of the third diffraction grating 48 along the period running direction 51 is such that structure boundaries between the diffraction structures 37, 38 of the first diffraction grating 35, between the diffraction structures 40, 41 of the second diffraction grating 36 and between the diffraction structures 49, 50 of the third diffraction grating 48 intersect in each case at a point P in the centre of the basic section illustrated in
[0216] In the case of the optical grating 57, the grating period ph is approximately 3.25 mm, the grating period pv is 2 mm and the grating period pd is of exactly the same magnitude as the grating period ph.
[0217]
[0218] The assignment of the structure depths and the surface area proportions of the diffraction structure types 000 to 111 indicated within the highlighted unit cells in
[0219] A further embodiment of an optical grating 60 as an optical diffraction component for suppressing at least one target wavelength by destructive interference is explained below with reference to
[0220] The optical grating 60 is embodied as a superimposition of two diffraction gratings 61, 62, which are illustrated individually in
[0221] The diffraction grating 61 has a structure depth d.sub.1 and a grating period p.sub.1. The diffraction grating 62 has a structure depth d.sub.2 and a grating period p.sub.2. The two diffraction gratings 61, 62 are embodied in each case as a binary grating.
[0222] The optical grating 60 resulting from the superimposition of the two diffraction gratings 61, 62 has a total of three diffraction structure levels or diffraction structure types having structure depths 0 (diffraction structure level N.sub.1), structure depth d.sub.2 (diffraction structure level N.sub.2), having structure depth d.sub.1 (diffraction structure level N.sub.3) and having structure depth d.sub.1+d.sub.2 (diffraction structure level N.sub.4).
[0223] The grating periods p.sub.1 and p.sub.2 are identical in the case of the optical grating 60. The structure depths d.sub.1, d.sub.2 are different in the case of the optical grating 60. In relation to a common period running direction x of the diffraction gratings 61 and 62, these two diffraction gratings 61 and 62 are phase-shifted with respect to one another by one quarter of the common period, that is to say by p.sub.1/4=p.sub.2/4 with respect to one another.
[0224] An overlay error 63 along the period running direction x is illustrated in a dashed manner in
[0225] For the case where the two structure depths d.sub.1 and d.sub.2 are identical in an alternative embodiment of the optical grating 60, the two diffraction structure levels N.sub.2, N.sub.3 degenerate into a common structure level, with the result that such an optical grating consisting of two diffraction gratings having identical structure depths has exactly three diffraction structure levels.
[0226] In the case of the optical grating 60, the surface sections of the diffraction structure groups are designated by 61.sub.P and 61.sub.N. Boundary regions of the first 61 of the two binary diffraction structure groups 61, 62 of the optical grating 60, that is to say the sidewalls between the levels N.sub.i of the diffraction structure group 61, and boundary regions of the second 62 of the two binary diffraction structure groups 61, 62, that is to say the level sidewalls N.sub.i/N.sub.j in
[0227] A further embodiment of an optical grating 60 as an optical diffraction component for suppressing at least one target wavelength by destructive interference is explained below with reference to
[0228]
[0229] In the case of the diffraction gratings 65, 66 it holds true that:
p.sub.1=p.sub.2 and d.sub.1=d.sub.2.
[0230] A phase offset of the two diffraction gratings 65, 66 with respect to one another along the period running direction x is p.sub.1/4=p.sub.2/4.
[0231] An extension ratio between diffraction positive structures 67, 68 of the diffraction gratings 65, 66, firstly, and the associated diffraction negative structures 69, 70, secondly, is exactly inverted with respect to one another, with the result that the diffraction positive structures 67 have the same extension along the period running direction x as the diffraction negative structures 70 of the diffraction grating 66 and the diffraction negative structures 69 of the diffraction grating 65 have the same extension along the period running direction x as the diffraction positive structures 68 of the diffraction grating 66. The extensions of the diffraction positive structures 67, 68, firstly, and of the diffraction negative structures 69, 70, secondly, are thus not identical in the respective diffraction grating 65, 66, and so in this sense the two diffraction gratings 65, 66 are not binary gratings. The extension ratio can deviate very significantly from 1:1 and is approximately 1:3 in the case of the diffraction gratings 65, 66. A different extension ratio between the diffraction positive structures 67, 68, firstly, and the diffraction negative structures 69, 70, secondly, of the respective diffraction grating 65, 66 in the range of between 10:1 and 1:10 is also possible.
[0232] An overlay error 63 is once again indicated in
[0233] The optical grating 64 thus constitutes an optical diffraction component including a periodic grating structure profile including diffraction structures, having three diffraction structure levels (N.sub.1 to N.sub.3), which predefine different structure depths d.sub.i relative to a reference plane.
[0234] In the case of the optical grating 64, the arrangement of the diffraction structures is such that a wavelength range around a first target wavelength .sub.1 in the infrared wavelength range, which first target wavelength is diffracted by the grating structure profile, has radiation components having at least three different phases which interfere with one another destructively at least in the zero and/or +/ first order(s) of diffraction of the first target wavelength .sub.1.
[0235] The diffraction structure levels N.sub.1 to N.sub.3 predefine a topography of a grating period of the grating structure profile that is repeated regularly along a period running direction x. The diffraction structure levels N.sub.1 to N.sub.3 include the neutral diffraction structure level N.sub.2 having a reference height of 0, the positive diffraction structure level N.sub.1, which is arranged higher by an optical path length of .sub.1/4 relative to the neutral diffraction structure level N.sub.2, wherein a tolerance of +/20% is possible for the optical path length, and the negative diffraction structure level N.sub.3 which is arranged lower by an optical path length of .sub.1/4+/20% relative to the neutral diffraction structure level N.sub.2.
[0236] The grating period of the grating structure profile of the optical grating 64 is subdivided into four period sections of the diffraction structure levels N.sub.1 to N.sub.3, wherein two of the four period sections, namely the two sections having the diffraction structure level N.sub.2, are embodied as neutral diffraction structure sections, one of the four period sections, namely the period section having the diffraction structure level N.sub.1, is embodied as a positive diffraction structure section and one of the four period sections, namely the period section having the diffraction structure level N.sub.3, is embodied as a negative diffraction structure section.
[0237] These four period sections (sequence e.g. N.sub.2, N.sub.1, N.sub.2, N.sub.3) have in each case the same length along the period running direction x, once again a tolerance range of +/20% being possible here, too.
[0238] A further embodiment of an optical grating 60 as an optical diffraction component for suppressing at least one target wavelength by destructive interference is explained below with reference to
[0239]
[0240] The diffraction grating 72 has a structure depth d.sub.1 and a grating period p.sub.1. The diffraction grating 73 has a structure depth d.sub.2 and a grating period.
[0241] p.sub.2=2p.sub.1. It holds true that: d.sub.1 d.sub.2.
[0242] Both diffraction gratings 72, 73 are embodied as binary gratings having an identical extension of the diffraction positive structures and of the diffractive negative structures along the period running direction x.
[0243] The optical grating 71 has four diffraction structure levels, namely N.sub.1 (structure depth 0), N.sub.2 (structure depth d.sub.2), N.sub.3 (structure depth d.sub.1) and N.sub.4 (structure depth d.sub.1+d.sub.2).
[0244]
[0245] On account of the dimensional ratios of the two diffraction gratings 72, 73, the overlay errors 63, as far as the relative extensions of the diffraction structure levels N and N.sub.2 are concerned, indeed stand out such that, as viewed in each case over a period p.sub.2 of the optical grating 71, the ratio of extensions of the diffraction structure levels N.sub.1 and N.sub.2 does not change independently of the size of the overlay error 63.
[0246] On account of the dimensional ratios of the two diffraction gratings 72, 73, level changes arise which are brought about by the diffraction grating 73, respectively for one diffraction structure type of the diffraction grating 72, in this case for the diffraction positive structures thereof. The phase relationship between the two diffraction gratings 72, 73 along the period running direction x is such that sidewalls F of the diffraction gratings 72, 73 are not superimposed at the same location along the period running direction x.
[0247]
[0248] Tolerances of the structure depths and/or of the sidewall steepness are taken into account in the associated reflectivity curve 74.
[0249] The nearer the second structure depth d.sub.2 comes to the fixed first structure depth d.sub.1 of 2.65 m, the better the suppression of the target wavelength. An improvement in the suppression effect achieved by the first diffraction grating having a structure depth d.sub.1 is already evident in the range of the structure depth d.sub.2 of between 0 and approximately double the structure depth d.sub.1, that is to say in the range of between approximately 0.2 m and 5 m in
|.sub.2.sub.1|/.sub.1<0.5
[0250] Assuming that the two target wavelengths do not differ from one another to an excessively great extent, this condition can be written as follows independently of whether it is related to the first wavelength .sub.1 or to the second wavelength .sub.2 and without an absolute value:
(.sub.1.sub.2).sup.2/(.sub.1+.sub.2).sup.2<0.1
[0251] In so far as this condition is met for the two target wavelengths .sub.2 which are intended to be suppressed with the two diffraction gratings, that is to say the two diffraction structure groups of the optical diffraction component, the suppressions are mutually reinforced in the case of the two target wavelengths .sub.1, .sub.2.
[0252] This is plotted in
[0253] A further embodiment of an optical grating 60 as an optical diffraction component for suppressing at least one target wavelength by destructive interference is explained below with reference to
[0254]
[0255] d.sub.1>d.sub.2>d.sub.3.
[0256] The three diffraction gratings 77 to 79 are embodied in each case as a binary grating.
[0257] For the ratio of the grating periods p.sub.1, p.sub.2 and p.sub.3 of the three diffraction gratings 77 to 79 it holds true that:
[0258] p.sub.1:p.sub.2:p.sub.3=1:2:4.
[0259] The result is an optical diffraction component with which, in principle, three different target wavelengths can be suppressed by destructive interference and which includes three diffraction structure groups with the three diffraction gratings 77 to 79. On account of this period ratio, the optical grating 76 is not sensitive to an overlay error, that is to say in relation to a possible phase offset of the diffraction structures of the three diffraction gratings 77 to 79 along the period running direction x.
[0260] The optical grating 76 has the following eight diffraction structure levels: N.sub.1 (structure depth 0), N.sub.2 (structure depth d.sub.3), N.sub.3 (structure depth d.sub.2), N.sub.4 (structure depth d.sub.1), N.sub.5 (structure depth d.sub.2+d.sub.3), N.sub.6 (structure depth d.sub.3+d.sub.1), N.sub.7 (structure depth d.sub.1+d.sub.2) and Ng (structure depth d.sub.1+d.sub.2+d.sub.3). These diffraction structure levels can be assigned to the three diffraction structure groups of the three diffraction gratings 77 to 79.
[0261] A further embodiment of an optical grating 60 as an optical diffraction component for suppressing at least one target wavelength by destructive interference is explained below with reference to
[0262]
[0263] p.sub.1:p.sub.2:p.sub.3=2:2:1.
[0264] An overlay error of a phase relationship between the diffraction structures of the three diffraction gratings 81 to 83 along the period running direction x, in line with what has been explained above concerning the embodiments according to
[0265] The optical grating 80 also has correspondingly eight different diffraction structure levels which can be assigned to the three diffraction structure groups of the three diffraction gratings 81 to 83.
[0266]
[0267] A reflectivity curve 84 shows the wavelength-dependent suppression for the structure depths d.sub.1=2.65 m, d.sub.2=2.55 m and d.sub.3=2.60 m, that is to say embodied for suppressing the target wavelengths 10.2 m, 10.40 m and 10.6 m, assuming a sidewall extension F of 0 along the period running direction x, that is to say an ideally steep course of the diffraction structures of the associated diffraction gratings. A suppression of better than 10.sup.11 results for the three target wavelengths.
[0268] A reflectivity curve that in turn takes account of structure depth and/or sidewall steepness tolerances is plotted at 85 in
[0269] The reflectivity curves 44 and 45 for an optical grating including exactly two diffraction gratings and for an optical grating including exactly one diffraction grating (cf. also
[0270]
[0271] The optical grating 86 results as a superimposition of a total of three diffraction gratings 87, 88, 89. Two of these diffraction gratings, namely the diffraction gratings 87 and 88, have a period running direction x that runs horizontally in
[0272] In the case of the embodiment in accordance with the optical grating 86, a suppression of the respective target wavelength is independent of overlay errors.
[0273] As far as the number of diffraction structure levels is concerned, reference is made to the above explanations concerning the embodiments of the optical gratings 76 according to
[0274] On the basis of the example of an optical diffraction component 91 including three diffraction structure levels as illustrated in
[0275] The target wavelength to be suppressed has a wavelength of .sub.N.
[0276] The diffraction structure level N.sub.1 has a structure depth of 0. The diffraction structure level N.sub.2 has a structure depth d of .sub.N/6. The deepest diffraction structure level N.sub.3 has a structure depth of 2d (=.sub.N/3).
[0277] A superimposition of a total of n diffraction gratings having structure depths d.sub.1, d.sub.2, do is suitable for suppressing a total of n target wavelengths .sub.1, .sub.2, . . . .sub.n. In this case, the number of possible diffraction structure levels is 2.sup.n. Given three structure depths d.sub.1, d.sub.2, d.sub.3, therefore, as explained above, eight diffraction structure levels N.sub.1 to N.sub.8 result. Preferably, the various diffraction structure levels N.sub.1 are arranged such that all the diffraction structure levels N.sub.1 occupy identical surface area proportions of the total surface area of the diffraction component 91.
[0278] The optical diffraction component 91 constitutes as a variant a so-called m-level grating having in this case three levels. Such an m-level grating consists of m different diffraction structure levels, which each occupy identical surface areas and have structure height differences of in each case d=.sup.N/(2 m) with respect to one another. A good suppression of the target wavelength .sub.N once again results, with lower wavelength sensitivity.
[0279] The three-level grating according to
[0280]
[0281] An intensity of reflected light in the zero order of diffraction can be written as follows, proceeding from the Fraunhofer approximation for the diffracted far field, in a simplified manner for an N-level, periodic phase grating:
[0282] In this case, I(0) is the intensity in the zero order of diffraction, that is to say the square of the absolute value of the field amplitude of the diffracted far field.
[0283] N is the number of levels of the phase grating. L.sub.n is a phase term, assigned to the respective grating level. This phase term L.sub.n, which corresponds to the extension of the respective diffraction structure level N.sub.i along the period running direction x, is illustrated in
[0284] A further embodiment of an optical diffraction component 93 for suppressing at least one target wavelength by destructive interference is explained below with reference to
[0285]
[0286] The diffraction component 93 thus has a total of four diffraction structure levels N.sub.1 to N.sub.4, the structure depths of which differ in each case by h.sub.0. It holds true here that h.sub.0=.sub.N/4, wherein .sub.N is the target wavelength to be suppressed.
[0287] One complete period p of the diffraction component in the period running direction R includes firstly the four descending diffraction structure levels N.sub.1 to N.sub.4 and then two succeeding, reascending diffraction structure levels N.sub.5, N.sub.6, wherein a structure depth of the diffraction structure level N.sub.5 corresponds to that of the diffraction structure level N.sub.3 and a structure depth of the diffraction structure level N.sub.6 corresponds to that of the diffraction structure level N.sub.2.
[0288] Further embodiments of optical diffraction components 94, 95 for suppressing at least one target wavelength by destructive interference are described below with reference to
[0289] The diffraction component 94 according to
[0290] In the case of the diffraction component 95 according to
[0291] Proceeding from the equation described above in association with
[0292] In this case, .sub.1 and .sub.2 are the two target wavelengths which are intended to be suppressed by destructive interference via the diffraction components 94 and 95, respectively. It holds true that: h.sub.1=.sub.1/4 and h.sub.2=.sub.2/4.
[0293] For =.sub.1 and also for =.sub.2 it holds true that: I (0)=0. These two wavelengths are thus optimally suppressed.
[0294] Such a multilevel grating of the type of the gratings of the embodiments in
h.sub.1<h.sub.i<h.sub.i+.sub.1<2h.sub.1
[0295] With the optical diffraction components described above, as an alternative or in addition to target wavelengths suppressed in the infrared wavelength range, for example, wavelengths in other wavelength ranges can also be suppressed, for example in the range of DUV wavelengths.
[0296]
[0297] The reflectivity curve 96 shows a suppression for the two target wavelengths .sub.1180 nm and .sub.2210 nm.
[0298] For the difference measure of these two target wavelengths .sub.1, .sub.2 it holds true that:
(.sub.1.sub.2).sup.2/(.sub.1+.sub.2).sup.2=0.006
[0299] The suppression at these two DUV wavelengths here is better than 10.sup.5.
[0300]
[0301] A wavelength-dependent reflectivity curve 97 shown in
[0302] In addition, corresponding to the two structure depths d.sub.1 and d.sub.2, the grating with the reflectivity curve 97 also suppresses the two DUV wavelengths .sub.1equal to 180 nm and .sub.2equal to 210 nm with a suppression of better than 10.sup.6, as shown by the magnified detail in the DUV range in
[0303]
[0304] A reflectivity curve for an optical diffraction component including exactly one diffraction structure group, that is to say including exactly one diffraction grating, is illustrated at 98 in
[0305] 99 indicates a reflectivity curve for an optical diffraction component including two diffraction gratings as diffraction structure groups, which have identical structure depths d.sub.1=d.sub.2 of 2.65 m in each case and for which a ten-fold tolerance bandwidth of 5% is permitted. In the region of the target wavelength, in the case of the reflectivity curve 99, a suppression results which, despite the tolerance bandwidth being ten times higher, is better than in the case of the reflectivity curve 98.
[0306] In
[0307] In
[0308] On account of the mutually reinforcing suppression effects of the three diffraction gratings in the region of the target wavelength, this very high tolerance bandwidth in turn results in a very good suppression corresponding to the suppression better than 10.sup.4.
[0309]
[0310] The lithographic mask structure 105 illustrated as closest adjacent to the optical grating 60 in
[0311] Arranged offset with respect hereto along the period running direction x is the second lithographic mask structure 106 having mask regions 109 and mask gaps 110. A periodicity of this second lithographic mask structure 106 corresponds to that of the diffraction grating 61 according to
[0312] A topography of the diffraction structure levels N.sub.1 to N.sub.4 of the optical grating 60 can be described as a superimposition of two binary structures, namely of the diffraction structure groups 61, 62 that are producible with the aid of the lithographic mask structures 105, 106 (also cf.
[0313] A further characteristic of the optical grating 60 is that, as viewed along the period running direction x, each rising level sidewall, that is to say
[0314] N.sub.3/N.sub.1, firstly, and N.sub.4/N.sub.3, secondly, is respectively assigned a falling level sidewall of the same structure depth. In this case, the rising level sidewall N.sub.3/N.sub.1 is assigned the falling level sidewall N.sub.2/N.sub.4. The rising level sidewall N.sub.4/N.sub.3 is assigned the falling level sidewall N.sub.1/N.sub.2. The firstly assigned level sidewalls N.sub.3/N.sub.1 and N.sub.2/N.sub.4 in this case have the structure depth d.sub.1. The level sidewalls N.sub.4/N.sub.3 and N.sub.1/N.sub.2 likewise assigned to one another have the structure depth d.sub.2.
[0315] During the production of the optical grating 60, firstly one of the two mask structures 105, 106, for example the mask structure 105, is used and, in the region of the mask gaps 108, in a first etching step using an etching region, provided by a corresponding source, negative structures having the width of the mask gaps 108 with a predefined first etching depth d.sub.2 are produced in a substrate. Afterwards, the mask structure 105 is removed and the mask structure 106 is used and, in a further etching step, the substrate is etched further with the depth d.sub.1 until the diffraction structure levels N.sub.1 to N.sub.4 corresponding to the illustration at the bottom of
[0316] The production method can also include more than two etching steps and it is also possible to use more than two different mask structures and/or more than two etching steps.
[0317]
[0318] In
[0319] During the lithographic production of the optical grating 64, the lithography mask structure 111 defines the level sidewalls N.sub.3/N.sub.2, firstly, and N.sub.2/N.sub.3, secondly, and the further lithographic mask structure 112 defines the level sidewalls N.sub.2/N.sub.1, firstly, and N.sub.1/N.sub.2, secondly. Here, too, the optical grating 64 results as a superimposition of two binary structures 65, 66 (cf.
[0320] Here, too, it holds true again that, as viewed along the period running direction x, each rising level sidewall, that is to say the sidewalls N.sub.2/N.sub.1 and N.sub.3/N.sub.2, is once again assigned a falling level sidewall of the same structure depth, namely the rising level sidewall N.sub.2/N.sub.1 is assigned the falling level sidewall N.sub.1/N.sub.2, and the rising level sidewall N.sub.3/N.sub.2 is assigned the falling level sidewall N.sub.2/N.sub.3.
[0321] The optical gratings 71, 76, 80 described above in particular with reference to
[0322] In the case of the above-described optical diffraction components having period running directions of the diffraction structure groups that are not parallel to one another, this results in an intersection of the level sidewalls, that is to say of the boundary regions between the different surface sections of the diffraction structures. In this case, too, the boundary regions are superimposed on one another only at points, that is to say at most along sections of the linear course of the level sidewalls, namely where the latter intersect.
[0323] A further embodiment of an optical diffraction component 117, once again in the form of an optical grating, for suppressing at least one target wavelength by destructive interference is described below with reference to
[0324] The optical grating 117 is embodied as a grating structure profile that is periodic along the period running direction x, including diffraction structures having three diffraction structure levels N.sub.1, N.sub.2, N.sub.3.
[0325] The middle diffraction structure level N.sub.2 predefines a reference height of 0 (d=0) and is therefore also referred to as a neutral diffraction structure level. The further diffraction structure level N.sub.1 has a structure depth of d=+/4, measured relative to the reference height, and is therefore also referred to as a positive diffraction structure level. The third diffraction structure level N.sub.3 has a structure depth of d=/4, measured relative to the reference height, and is therefore also referred to as a negative diffraction structure level.
[0326] The three diffraction structure levels N.sub.1 to N.sub.3 thus predefine different structure depths relative to the reference plane d=0.
[0327] A grating period p of the grating structure profile of the optical grating 117 is subdivided into a total of four period sections of the diffraction structure levels N.sub.1 to N.sub.3. Two of these four period sections are embodied as the neutral diffraction structure level N.sub.2, one of the four period sections is embodied as the positive diffraction structure level N.sub.1 and the fourth of the four period sections is embodied as the negative diffraction structure level N.sub.3. The sequence along the unit cell chosen in
[0328] Along the period running direction x, the four period sections within one grating period p have the same structure length x.sub.N.
[0329] Alternatively, it is also possible for the lengths of the period sections, that is to say the x-extensions of the respective diffraction structure levels N.sub.1 to N.sub.3, to differ from one another in pairs. The following should then be satisfied as a constraint for the lengths x.sub.Ni of the period sections of the diffraction structure levels N.sub.1 to N.sub.3:
X.sub.N1+X.sub.N3=2x.sub.N2
[0330] The sum of the extensions of the levels deviating from the neutral diffraction structure level should thus be, to a good approximation, equal to double the extension of the neutral diffraction structure level.
[0331] The described arrangement, that is to say the structure depths and the lengths along the period running direction x, of the diffraction structure levels N.sub.1 to N.sub.3 is such that a first target wavelength .sub.1 in the infrared wavelength range, which is diffracted by the grating structure profile, has radiation components having three different phases which interfere with one another destructively in the zero order of diffraction of the first target wavelength .sub.1. A suppression effect thus results, as has been explained above inter alia in association with the other optical diffraction components according to
[0332] The target wavelength can once again be in the range of between 10 m and 11 m.
[0333] The influence of a structure depth error on the diffraction efficiency is explained below with reference to
[0334] Regions of identical phase P.sub.0 of the wave of the reflected light are illustrated by filled-in dots in
[0335] /2, which, in the case of the perfect /4 structure depths in
[0336]
[0337] Regions of identical phase P.sub.0, d of the light reflected by the positive diffraction structure level N.sub.1, firstly, and by the negative diffraction structure level N.sub.3, secondly, are illustrated by open circles in
[0338] As shown by the comparison of the positions in the beam direction of the reflected light of these two phases P.sub.0, a which are reflected by the levels N.sub.1 and N.sub.3, respectively, with the corresponding phase positions P.sub.0 in the case of the perfect suppression situation according to
[0339]
[0340]
[0341]
[0342]
[0343] The additional diffraction structure levels N.sub.4 in the case of the optical grating 120 and N.sub.4, N.sub.5 in the case of the optical grating 121 result in an additional reinforcement of the diffraction effect, that is to say in a further reinforcement of the destructive interference of the target wavelength .
[0344]
[0345]
[0346] Components and functions corresponding to those which have already been explained above with reference to
[0347] For the optical grating 64,
[0348] During the lithographic production of the optical grating 64, the mask region 128 of the mask structure 126 defines the level sidewalls N.sub.3/N.sub.2, firstly, and N.sub.1/N.sub.2, secondly. The further mask region 129 of the mask structure 126 defines the level sidewalls N.sub.2/N.sub.1 and N.sub.2/N.sub.3 for the next sequence of the diffraction structure levels of the optical grating 64 that follows in the period running direction x. The further lithographic mask structure 127 defines, with the mask region 132, the level sidewalls N.sub.2/N.sub.1 and N.sub.2/N.sub.3 of the period of the diffraction structure levels N.sub.i leading in the period running direction x and the mask region 133 of the mask structure 127 defines the level sidewalls N.sub.3/N.sub.2 and N.sub.1/N.sub.2 of the next period of the diffraction structure levels N.sub.i. The optical grating 64 correspondingly results as a superimposition of two binary structures whose boundary regions, perpendicular to the period running direction x (perpendicular to the plane of the drawing in
[0349] The mask structures 128, 129, firstly, and 132, 133, secondly, have in each case the same x-extension, namely in each case 2x.sub.N. The mask gaps 131, firstly, and 134, secondly, have in each case the same x-extension, namely in each case x.sub.N. The mask structures 130 and 135 likewise have in each case the same x-extension, namely in each case 3x.sub.N.
[0350] The mask structures 126, 127 thus predefine alternately different level sidewalls for the respectively successive periods p of the optical grating 64. By shilling by a period length p, most mask structures 126 and 127 can be converted into one another.
[0351]
[0352] The mask structure 136 has mask regions 138, 139 and intervening mask gaps 140, 141. The mask structure 137 has mask regions 142, 143 and intervening mask gaps 144 and 145. An x-extension of the mask regions 138, firstly, and 143, secondly, is 3x.sub.N and thus three times the magnitude of an x-extension of the mask regions 139, firstly, and 142, secondly, which is x.sub.N. The mask gaps 140, 141, 144 and 145 have in each case an extension of 2x.sub.N.
[0353] During the lithographic production of the optical grating 64, the lithographic mask structure 136 defines, with the mask region 138, the level sidewalk N.sub.3/N.sub.2 and N.sub.2/N.sub.3 of the first period p of the diffraction structure levels N.sub.1 to N.sub.3 of the grating 64 and the mask region 139 defines the level sidewalls N.sub.2/N.sub.1, firstly, and N.sub.1/N.sub.2, secondly, of the second period p of the diffraction structure levels N.sub.1 to N.sub.3. The further lithographic mask structure 137 defines, with the mask region 142, the level sidewalls N.sub.2/N.sub.1 and N.sub.1/N.sub.2 of the first period and, with the mask region 143, the level sidewalls N.sub.3/N.sub.1 and N.sub.2/N.sub.3 of the succeeding period p of the diffraction structure levels N.sub.1 to N.sub.3.
[0354] It holds true here, too, in a manner similar to that in the case of the embodiment according to
[0355] The relations during the production of a further embodiment of an optical grating 146 with two mask structures 147, 148 will be described with reference to
[0356] The mask structure 147 has per period p mask regions 149, 150 and intervening mask gaps 151, 152 and the mask structure 148 has per period p exactly one assigned mask region 153 and one mask gap 154. The mask region 149 and the mask region 150 have an extension of 2x.sub.N. The mask gaps 151, 152 have an extension of x.sub.N. The mask region 153 has an extension of 3x.sub.N. The mask gap 154 likewise has an extension of 3x.sub.N.
[0357] Within the sequence of the level sidewalls over the period p along the period running direction x, the following assignment holds true as far as the predefinition of the respective level sidewall by the mask region of the respective mask structure is concerned:
TABLE-US-00002 Level Predefining sidewall mask region N.sub.2/N.sub.1 153 N.sub.1/N.sub.2 149 N.sub.2/N.sub.1 150 N.sub.1/N.sub.2 153 N.sub.2/N.sub.3 150 N.sub.3/N.sub.2 149 N.sub.2/N.sub.1 153 etc. etc.
[0358] The relations during the production of a further embodiment of an optical grating 155 with two mask structures 156, 157 will be described with reference to
[0359] For the production of the optical grating 155, once again two lithographic mask structures 156 and 157 are illustrated in
[0360] The following holds true for the assignment of the mask regions to the level sidewalls during the lithographic production of the optical grating 155:
TABLE-US-00003 Level Predefining sidewall mask region N.sub.3/N.sub.2 162 N.sub.2/N.sub.1 158 N.sub.1/N.sub.2 158 N.sub.2/N.sub.3 162 N.sub.3/N.sub.2 159 N.sub.2/N.sub.3 159 N.sub.3/N.sub.2 162 etc. etc.
[0361] The above-explained structurings of the optical gratings can have the effect that stray light radiation having an infrared wavelength, for example, that is reflected by the EUV collector 24 interferes destructively in a zero order and a stray light intensity is thus suppressed in the zero order. In this case, the optical diffraction components described above are generally used as reflective components.
[0362] A main body of the EUV collector 24 can be manufactured from aluminium. Alternative materials for this main body are copper, alloys including the constituent copper and/or aluminium or alloys, produced by powder metallurgy, of copper and aluminium oxide or silicon.
[0363] In order to produce a microstructured or nanostructured component, the projection exposure apparatus 1 is used as follows: first, the reflection mask 10 or the reticle and the substrate or the wafer 11 are provided. Subsequently, a structure on the reticle 10 is projected onto a light-sensitive layer of the wafer 11 with the aid of the projection exposure apparatus 1. Then, a microstructure or nanostructure on the wafer 11, and hence the microstructured component, is produced by developing the light-sensitive layer.