MASS SPECTROMETER
20230238229 · 2023-07-27
Inventors
Cpc classification
International classification
H01J49/04
ELECTRICITY
Abstract
A mass spectrometer, MS, 100 is described. A mass spectrometer comprises: a set of chambers, for receiving sample plate holders therein and/or therethrough, wherein the sample plate holders are arranged to hold respective subsets of sample plates therein and/or thereon and wherein the sample plate holders include respective identifiers, wherein the set of chambers is fluidically coupled to and/or comprises an ion source, an analyser and an ion detector, for mass spectrometry of samples included on the sample plates received therein; a reader configured to read a first identifier, of a set of identifiers, included on a first sample plate holder, of a set of sample plate holders, optionally including a first sample plate, of a set of sample plates, held therein and/or thereon, received in the set of chambers; and a controller configured to control the reader to read the first identifier of the first sample plate holder received in the set of chambers.
Claims
1. A mass spectrometer, MS, comprising: a set of chambers, for receiving sample plate holders therein and/or therethrough, wherein the sample plate holders are arranged to hold respective subsets of sample plates therein and/or thereon and wherein the sample plate holders include respective identifiers, wherein the set of chambers is fluidically coupled to and/or comprises an ion source, an analyser and an ion detector, for mass spectrometry of samples included on the sample plates received therein; a reader configured to read a first identifier, of a set of identifiers, included on a first sample plate holder, of a set of sample plate holders, optionally including a first sample plate, of a set of sample plates, held therein and/or thereon, received in the set of chambers; and a controller configured to control the reader to read the first identifier of the first sample plate holder received in the set of chambers, responsive to receiving the first sample plate holder therein.
2. The MS according to claim 1, wherein the set of chambers comprises a first chamber, comprising a set of ports closeable by respective doors, for receiving the sample plate holders therein and/or therethrough, and wherein the set of ports includes a first port having a first door; wherein the first chamber is fluidically coupled to and/or comprises the ion source, the analyser and the ion detector; wherein the controller is configured to control the reader to read the first identifier of the first sample plate holder received in the first chamber.
3. The MS according to claim 1, wherein the set of chambers includes: a first chamber, comprising a set of ports closeable by respective doors, for receiving the sample plate holders therein and/or therethrough and wherein the set of ports includes a first port having a first door and a second port having a second door; a second chamber, fluidically coupleable with the first chamber via the second port, wherein the second chamber is fluidically coupled to and/or comprises the ion source, the analyser and the ion detector; wherein the MS is arrangeable in: a first arrangement, wherein the first sample plate holder is received in the first chamber via the first port, wherein the first door is open and wherein the second door is closed; a second arrangement, wherein the first sample plate holder is in the first chamber, wherein the first door is closed and wherein the second door is closed; and a third arrangement, wherein the first sample plate holder is received in the second chamber via the second port, wherein the second door is closed; wherein the controller is configured to control the reader to read the first identifier of the first sample plate holder, when the MS is arranged in the third arrangement.
4. The MS according to claim 3, wherein the controller is configured to control the reader to read the first identifier of the first sample plate holder, in response to sensing closing of the second door, sensing receiving of the first sample plate holder in the second chamber and/or sensing a pressure in the second chamber.
5. The MS according to any of claims 3 to 4, wherein the first chamber comprises a first conveyor, for conveying the first sample plate holder from the first chamber to the second chamber via the second port and optionally, vice versa.
6. The MS according to any of claims 3 to 5, wherein the second chamber comprises a second conveyor, for conveying the first sample plate holder within the second chamber, for example relative to the reader.
7. The MS according to any previous claim, wherein the first identifier comprises and/or is a visual code, for example a 1D barcode or a 2D symbol, a magnetic strip, an RFID/NFC tag, an IC chip and/or a label.
8. The MS according to any previous claim, wherein the reader comprises and/or is a UDI reader, for example a 1D and/or a 2D reader, for example a 1D and/or a 2D barcode reader.
9. The MS according to any previous claim, wherein the controller is configured to control the reader to read the first identifier of the first sample plate holder, before mass spectrometry of the samples included on the first sample plate.
10. The MS according to any previous claim, wherein the reader is configured to transmit data corresponding to the first identifier to the controller.
11. The MS according to any previous claim, wherein the controller is configured to control mass spectrometry of the samples included on the first sample plate based, at least in part, on information obtained via the first identifier.
12. The MS according to any previous claim, wherein the controller is configured to implement a remedial action, in response to a determination that the first identifier is invalid.
13. The MS according to any previous claim, comprising the first sample plate holder.
14. The MS according to any previous claim, wherein the first sample plate includes a first UDI of a set of UDIs.
15. The MS according to any of claims 13 to 14, wherein the first sample plate holder is arranged to hold a subset of the set of sample plates, wherein the subset includes N sample plates, wherein N is a natural number greater than or equal to 1, for example 1, 2, 3, 4, 5, 6, 7, 8, 9, 10 or more.
16. The MS according to any previous claim, wherein the reader is optically coupled to the set of chambers.
17. The MS according to claim 16, wherein the reader is optically coupled to the set of chambers via an optical coupling, for example a window or an optical fibre.
18. A method of controlling a mass spectrometer, MS, according to any of claims 1 to 17, the method comprising: receiving the first sample plate holder in the set of chambers; and reading the first identifier of the first sample plate holder received in the set of chambers.
19. A computer comprising a processor and a memory configured to implement, at least in part, a method according to claim 18, a computer program comprising instructions which, when executed by a computer comprising a processor and a memory, cause the computer to perform, at least in part, a method according to claim 18 or a non-transient computer-readable storage medium comprising instructions which, when executed by a computer comprising a processor and a memory, cause the computer to perform, at least in part, a method according to claim 18.
20. A sample plate holder arranged to hold a subset of sample plates therein and/or thereon, wherein the subset includes N sample plates, wherein N is a natural number greater than or equal to 1, and wherein the first sample plate holder includes a first identifier of a set of identifiers.
21. The sample plate holder according to claim 20, wherein the first identifier comprises and/or is a visual code, for example a 1D barcode or a 2D symbol, a magnetic strip, an RFID/NFC tag, an IC chip and/or a label.
22. The sample plate holder according to claim 21, wherein the first identifier comprises and/or is a visual code included on an upper surface thereof.
23. The sample plate holder according to any of claims 20 to 22, wherein the sample plate holder is arranged to hold the subset of sample plates therein and/or thereon by having a corresponding number of female members for receiving the subset of sample plates therein, optionally wherein each female member has a shape corresponding with a shape of a respective sample plate.
24. The sample plate holder according to any of claims 20 to 23, comprising a null UDI in a position corresponding to a position of a unique device identifier, UDI, included on a respective sample plate.
25. The sample plate holder according to any of claims 20 to 24, comprising one or more seats therein and/or thereon to receive a respective sample plate thereon.
26. A kit of parts comprising a sample plate holder according to any of claims 20 to 25 and a sample plate.
Description
BRIEF DESCRIPTION OF THE DRAWINGS
[0179] For a better understanding of the invention, and to show how exemplary embodiments of the same may be brought into effect, reference will be made, by way of example only, to the accompanying diagrammatic Figures, in which:
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DETAILED DESCRIPTION OF THE DRAWINGS
[0193]
[0194] The MS 100 comprises:
[0195] a first chamber 110, comprising a set of ports P closeable by respective doors, for receiving sample plates including respective unique device identifiers, UDIs, therein and/or therethrough, wherein the set of ports P includes a first port P1 having a first door D1 and a second port P2 having a second door D2;
[0196] a second chamber 120, fluidically coupleable with the first chamber 110 via the second port P2, wherein the second chamber 120 is fluidically coupled to and/or comprises an ion source 130, an analyser 140 and an ion detector 150, for mass spectrometry of samples included on the sample plates received therein; and
[0197] an imager 160, coupled to the second chamber 120, configured to image the UDIs of the sample plates;
[0198] a controller 170 (not shown) configured to control the imager 160;
[0199] wherein the MS 100 is arrangeable in:
[0200] a first arrangement, wherein a first sample plate 1A of a set of sample plates 1 is received in the first chamber 110 via the first port P1, wherein the first door D1 is open and wherein the second door D2 is closed, and wherein the first sample plate 1A includes a first UDI U1A of a set of UDIs;
[0201] a second arrangement, wherein the first sample plate 1A is in the first chamber 110, wherein the first door D1 is closed and wherein the second door D2 is closed; and
[0202] a third arrangement, wherein the first sample plate 1A is received in the second chamber 120 via the second port P2, wherein the second door D2 is closed;
[0203] wherein the controller 170 is configured to control the imager 160 to image the first UDI U1A of the first sample plate 1A, when the MS 100 is arranged in the third arrangement.
[0204]
[0205] The first sample plate 1A is described with respect to
[0206] In this example, the TOF MS 100 comprises and/or is a linear TOF MS 100, for example having a linear flight tube arranged between the second set of electrodes and the ion detector 150.
[0207] In this example, the first chamber 110 comprises a first conveyor 180 (also known as a transporter), for conveying the first sample plate 1A from the first chamber 110 to the second chamber 120 via the second port P2 and optionally, vice versa. In this example, the first conveyor 180 comprises a 1D translator such as an x stage translator for example a linear actuator such as a screw thread or a belt drive, for conveying the first sample plate 1A from the first chamber 110 to the second chamber 120 by the second port P2 and optionally, vice versa. In this example, the set of ports P includes only the first port P1 having the first door D1 and the second port P2 having the second door D2.
[0208] In use, the second chamber 120 is maintained at vacuum, for example at an operating pressure of at most 5×10.sup.−6 mbar. In this example, the second chamber 120 comprises a second conveyor 190, for conveying the first sample plate 1A within the second chamber 120, for example relative to the imager 160. In this example, the ion source 130 is a MALDI ion source 130, the analyser 140 is a linear TOF analyser 140 and the ion detector 150 is a MCP detector. In this example, a height of the first sample plate 1A, for example an upper surface thereof, is controlled using an adjustable stage, to within 0.025 mm.
[0209] In this example, the imager 160 is a 1D and a 2D barcode reader, for example a 1D and/or a 2D barcode reader. In this example, the imager 160 is configured to image the UDIs of the sample plates, wherein the UDIs conform with one or more 1D and/or 2D barcode standards, as described previously.
[0210] In this example, the imager 160 is supplied by Marson Technology Co., Ltd. and includes a MT85HD imager and a MTD20 decoder. The MT85HD imager is specified thus:
[0211] CCD Camera: 1280×800 pixel sensor.
[0212] Illumination source: 3000K CCT LED
[0213] Acquisition rate: 60 fps
[0214] Typical Resolution: 0.1 mm (QR Code)
[0215] Pitch/Skew/Roll Angle: ±60°/±30°/360°
[0216] Scan Angle Horizontal: 37°
[0217] Scan Angle Vertical: 24°
[0218] Print Contrast Ratio: 30%
[0219] Width of Field: 65 mm (13 Mil Code39)
[0220] Typical D.O.F (@800 lux): UPC/EAN 13 Mil: 47˜170 mm [0221] QR Code 15 Mil: 35˜157 mm
[0222] In this example, the imager 160 is configured to transmit data corresponding to the first UDI U1A to the controller 170. In this example, the controller 170 is configured to control the imager 160 and/or the controller 170 and the imager 160 are communicatively coupled, for example bidirectionally.
[0223] In this example, the imager 160 is optically coupled to the second chamber 120 via an optical coupling 165, particularly a window. In this example, the optical coupling 165 comprises is formed from UV-grade fused silica. In this example, the optical coupling 165 has an antireflective coating provided on both sides thereof. In this example, the optical coupling 165 is provided in a wall of the second chamber 120.
[0224] In this example, the controller 170 is configured to control the ion source 130, the analyser 140 and/or the ion detector 150, for example to control mass spectrometry of the samples included on the first sample plate 1A. In this example, the controller 170 is configured to control moving from the first arrangement to the second arrangement, from the second arrangement to the third arrangement, and/or vice versa, for example responsive to instructions received from a user. In this example, the controller 170 is configured to conditionally control moving from the first arrangement to the second arrangement, from the second arrangement to the third arrangement, and/or vice versa, for example based on presence or absence of a sample plate in the first chamber 110 and/or second chamber 120 and/or respective pressures in the first chamber 110 and/or second chamber 120. In this example, the controller 170 is configured to control opening and/or closing of the first door D1 and/or the second door D2. In this example, the controller 170 is configured to deny a request to open the first door D1 and the second door D2 in use, whereby the first door D1 and the second door D2 are open, at least partially, simultaneously. In this example, the controller 170 is configured to control the imager 160 to image the first UDI U1A of the first sample plate 1A, when the MS 100 is arranged in the third arrangement, responsive to the MS 100 moving to the third arrangement. In this example, the controller 170 is configured to control the imager 160 to image the first UDI U1A of the first sample plate 1A responsive to sensing the first sample plate 1A in the second chamber 120. In this example, the MS 100 comprises a set of sensors communicatively coupled to the controller 170, wherein the set of sensors optionally includes a first sensor such as a microswitch for sensing closing of the second door D2, a second sensor such as a microswitch for sensing receiving of the first sample plate 1A in the second chamber 120 and/or a third sensor such as a pressure sensor for sensing a pressure in the second chamber 120. In this example, the controller 170 is configured to control the imager 160 to image the first UDI U1A of the first sample plate 1A, when the MS 100 is arranged in the third arrangement, before mass spectrometry of the samples included on the first sample plate 1A. In this example, the controller 170 is configured to control mass spectrometry of the samples included on the first sample plate 1A based, at least in part, on information obtained via the first UDI U1A. In this example, the controller 170 is configured to store, for example locally and/or remotely such as in a database, MS 100 data and/or results of one or more of the samples included on the first sample plate 1A, for example responsive to performing the mass spectrometry of one or more of the samples included on the first sample plate 1A, for example after mass spectrometry of each sample, for example using the first UDI U1A and/or a well position, at least in part, as a key. In this example, the controller 170 is configured to control the imager 160 to image the first identifier of the first sample plate holder 10A, when the MS 100 is arranged in the third arrangement. In this example, the controller 170 is configured to control the imager 160 to image the first UDI U1A of the first sample plate 1A, when the MS 100 is arranged in the third arrangement, responsive to imaging the first identifier of the first sample plate holder 10A. That is, the first identifier of the first sample plate holder 10A may be read first, from information encoded a type sample plate holder, a number of sample plates receivable therein and/or thereon and/or a type of sample plates receivable therein and/or thereon may be determined and the first sampler plate holder conveyed to a predetermined position for imaging the first UDI U1A. In this example, the controller 170 is configured to control the imager 160 to image the first identifier of the first sample plate holder 10A, when the MS 100 is arranged in the third arrangement, responsive to the MS 100 moving to the third arrangement. In this example, the controller 170 is configured to control the imager 160 to image the first identifier of the first sample plate holder 10A, when the MS 100 is arranged in the third arrangement, before mass spectrometry of the samples included on the first sample plate 1A. In this example, the controller 170 is configured to control mass spectrometry of the samples included on the first sample plate 1A based, at least in part, on information obtained via the first identifier I1A. In this example, the controller 170 is configured to obtain the information, for example locally and/or remotely such as from a database, for example using the first identifier and/or the first UDI U1A, at least in part, as a key.
[0225] In this example, the first sample plate holder 10A is arranged to hold a subset of a set of sample plates 1, wherein the subset includes N sample plates, wherein N is 3. In this example, three first sample plates 1A, 1B, 1C, are held in the first sample plate holder 10.
[0226] In this example, the first sample plate 1A is held in and/or on a first sample plate holder 10A (also known as a carrier) of a set of sample plate holders. In this example, the first sample plate holder 10A is arranged to hold a subset of up to 3 sample plates therein and/or thereon, by having a corresponding number of female members particularly machined concavities for receiving the subset of sample plates therein.
[0227] In this example, the first sample plate holder 10A is a generally rectangular or square flat plate, formed from stainless steel, having a regular array of 1×3 female members in and/or on a first portion of an upper surface thereof, relatively more proximal a first end of the first sample plate holder 10A, for holding respective sample plates 1 therein. In this example, each female member has a shape corresponding with a shape, for example an asymmetric shape, of a respective sample plate. In this example, the first sample plate holder 10A includes no human-readable, for example alphanumeric, labels to identify positions of the female members by row and column. In this example, a second portion of the upper surface, relatively more proximal a second end of the first sample plate holder 10A, mutually opposed to the first end, has no female members therein, for holding of the first sample plate holder 10A by an operator. In this example, the first sample plate holder 10A has an asymmetric shape, having a reduced number of planes of symmetry, having a single plane of symmetry orthogonal to the upper surface.
[0228] In this example, the first sample plate holder 10A is a multi-use sample plate holder, intended for reuse, for example following appropriate cleaning.
[0229] In this example, the first sample plate holder 10A includes a first identifier I1A of a first set of identifiers. In this example, the first identifier I1A is included, for example by printing, as a label, or engraving, in the second portion of the upper surface of the first sample plate holder 10A. In this example, the first identifier I1A is a 2D symbol. In this example, the first identifier I1A comprises a UDI. In this example, the first identifier I1A encodes information including one or more of: a type sample plate holder, a number of sample plates receivable therein and/or thereon and/or a type of sample plates receivable therein and/or thereon.
[0230] In this example, the first sample plate holder 10A is arranged to hold a subset of the set of sample plates 1, wherein the subset includes N sample plates 1A, 1B, 1C, wherein N is 3. In this example, three first sample plates 1A, 1B, 1C are held in the first sample plate holder 10A.
[0231] The first sample plate 2A is generally as described with respect to the first sample 1A of
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[0233] In this example, the first sample plate holder 20A is arranged to hold a subset of a set of sample plates 2, wherein the subset includes N sample plates, wherein N is 6. In this example, six first sample plates 2A, 2B, 2C, 2D, 2E, 2F are held in the first sample plate holder 20.
[0234] In this example, the first sample plate holder 20A is arranged to hold a subset of up to 6 sample plates therein and/or thereon, by having a corresponding number of female members particularly machined concavities for receiving the subset of sample plates therein.
[0235] In this example, the first sample plate holder 20A is a generally rectangular or square flat plate, formed from stainless steel, having a regular array of 2×3 female members in and/or on a first portion of an upper surface thereof, relatively more proximal a first end of the first sample plate holder 20A, for holding respective sample plates 1 therein.
[0236]
[0237] In this example, a thickness of the first sample plate 3A is 0.3 mm+/−0.03 mm i.e. tightly toleranced. Flatness and parallelism of the first sample plate 3A is within 0.03 mm.
[0238] In this example, the first sample plate holder 30A is a generally rectangular or square flat plate, formed from stainless steel, having a regular array of 1×3 female members 31A, 31B, 31C in and/or on a first portion of an upper surface thereof, relatively more proximal a first end of the first sample plate holder 30A, for holding respective sample plates 3 therein.
[0239] In this example, the female members 31A, 31B, 31C each include 2 machined pads 32 to receive the sample plates 3 thereon. In this example, a thickness of the pads 32 is 4.97 mm+0.00 mm/−0.03 mm i.e. very tightly toleranced.
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[0241] In this example, the first sample plate holder 40A is a generally rectangular or square flat plate, formed from stainless steel, having a regular array of 1×1 female members 41A in and/or on a first portion of an upper surface thereof, relatively more proximal a first end of the first sample plate holder 40A, for holding respective sample plates 4 therein.
[0242] In this example, the female member 41A each include 3 machined pads 42 to receive the sample plates 4 thereon. In this example, a thickness of the pads 42 is 4.97 mm+0.00 mm/−0.03 mm i.e. very tightly toleranced.
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[0245] At S1201, the method comprises arranging the MS in a first arrangement, comprising opening the first door while the second door is closed and receiving a first sample plate of a set of sample plates in the first chamber via the first port, wherein the first sample plate includes a first UDI of a set of UDIs.
[0246] At S1202, the method comprises arranging the MS in a second arrangement, comprising closing the first door, wherein the first sample plate is in the first chamber, wherein the second door is closed.
[0247] At S1203, the method comprises arranging the MS in a third arrangement, comprising opening the second door, receiving the first sample plate in the second chamber via the second port and closing the second door thereafter.
[0248] At S1204, the method comprises imaging, by the imager, the first UDI of the first sample plate, when the MS is arranged in the third arrangement.
[0249]
[0250] At S1301, the method comprises receiving the first sample plate holder in the set of chambers. At S1302, the method comprises reading the first identifier of the first sample plate holder received in the set of chambers.
[0251] Alternatives Although a preferred embodiment has been shown and described, it will be appreciated by those skilled in the art that various changes and modifications might be made without departing from the scope of the invention, as defined in the appended claims and as described above.
[0252] Attention is directed to all papers and documents which are filed concurrently with or previous to this specification in connection with this application and which are open to public inspection with this specification, and the contents of all such papers and documents are incorporated herein by reference.
[0253] All of the features disclosed in this specification (including any accompanying claims and drawings), and/or all of the steps of any method or process so disclosed, may be combined in any combination, except combinations where at most some of such features and/or steps are mutually exclusive.
[0254] Each feature disclosed in this specification (including any accompanying claims, and drawings) may be replaced by alternative features serving the same, equivalent or similar purpose, unless expressly stated otherwise. Thus, unless expressly stated otherwise, each feature disclosed is one example only of a generic series of equivalent or similar features.
[0255] The invention is not restricted to the details of the foregoing embodiment(s). The invention extends to any novel one, or any novel combination, of the features disclosed in this specification (including any accompanying claims and drawings), or to any novel one, or any novel combination, of the steps of any method or process so disclosed.