ABSOLUTE PRESSURE SENSING MEMS MICROPHONE, MICROPHONE UNIT AND ELECTRONIC DEVICE

Abstract

Embodiments of the present disclosure provides an absolute pressure sensing MEMS microphone, a microphone unit and an electronic device. The absolute pressure sensing MEMS microphone includes: a diaphragm; a back electrode plate; a spacer between the diaphragm and the back electrode plate, wherein the diaphragm, the back electrode plate and the spacer form a vacuum cavity, an air pressure in the vacuum cavity is a first air pressure, wherein a gap separating the diaphragm from the back electrode plate by the spacer is a fabrication gap, wherein in a state where the air pressure inside and outside the diaphragm are both the first air pressure, an effective vacuum gap between the diaphragm and the back electrode plate is the first vacuum gap, and wherein the first vacuum gap is larger than the fabrication gap.

Claims

1. An absolute pressure sensing MEMS microphone, comprising: a diaphragm; a back electrode plate; a spacer between the diaphragm and the back electrode plate, wherein, the diaphragm, the back electrode plate and the spacer form a vacuum cavity having a first air pressure, wherein, the spacer forms a fabrication gap between the diaphragm and the back electrode plate, wherein, in a state where an air pressure outside the diaphragm is at the first air pressure, an effective vacuum gap between the diaphragm and the back electrode plate is a first vacuum gap, and wherein, the first vacuum gap is larger than the fabrication gap.

2. The absolute pressure sensing MEMS microphone according to claim 1, wherein the first vacuum gap is greater than or equal to twice the fabrication gap.

3. The absolute pressure sensing MEMS microphone according to claim 2, wherein the first vacuum gap is less than or equal to 10 times the fabrication gap.

4. The absolute pressure sensing MEMS microphone according to claim 1, wherein, at standard atmospheric pressure, the effective vacuum gap between the diaphragm and the back electrode plate is a second vacuum gap, and the second vacuum gap is larger than the fabrication gap.

5. The absolute pressure sensing MEMS microphone according to claim 1, wherein, at standard atmospheric pressure, under a state that an operating bias is applied, the effective vacuum gap between the diaphragm and the back electrode plate is a third vacuum gap, and the third vacuum gap is greater than or equal to 80% of the fabrication gap and less than or equal to 120% of the fabrication gap.

6. The absolute pressure sensing MEMS microphone according to claim 1, wherein the diaphragm is pre-deviated by a stress structure, so that the first vacuum gap is larger than the fabrication gap.

7. The absolute pressure sensing MEMS microphone according to claim 6, wherein the stress structure comprises the diaphragm and a compressive stress component, wherein, the diaphragm has a tensile stress along a surface direction of the diaphragm surface, and wherein, the compressive stress component is attached to outside of the diaphragm relative to the vacuum cavity, and has a compressive stress along the surface direction of the diaphragm.

8. The absolute pressure sensing MEMS microphone according to claim 6, wherein said stress structure comprises a composite layer of the diaphragm, wherein, the composite layer includes an inner film located inside the vacuum cavity and an outer film located outside, wherein, the inner film has a tensile stress along a surface direction of the diaphragm and the outer film has a compressive stress along the surface direction of the diaphragm.

9. The absolute pressure sensing MEMS microphone according to claim 6, wherein the stress structure includes the spacer and a fixing member securing the diaphragm to the spacer, wherein, the fixing member has a tensile stress along a surface direction of the diaphragm and is attached to an upper surface of the diaphragm, and the spacer has a compressive stress along the surface direction of the diaphragm and is attached to a lower surface of the diaphragm.

10. The absolute pressure sensing MEMS microphone according to claim 6, wherein the stress structure comprises a corrugated membrane structure on the diaphragm, so that the diaphragm bulges outwards relative to the vacuum cavity.

11. A microphone unit, comprising a unit shell, the absolute pressure sensing MEMS microphone according to claim 1 and an integrated circuit chip, wherein the absolute pressure sensing MEMS microphone and the integrated circuit chip are arranged in the unit shell.

12. An electronic device comprising the microphone unit according to claim 11.

Description

BRIEF DESCRIPTION OF THE DRAWINGS

[0020] In order to more clearly illustrate the technical solutions in the embodiments of the present disclosure or prior art, the following will briefly introduce the drawings used in the embodiments or prior art. Obviously, the drawings in the following description are only some embodiments described in the embodiments of present disclosure, and those skilled in the art can also obtain other drawings based on these drawings.

[0021] FIG. 1 shows states of an absolute pressure sensor under different conditions.

[0022] FIG. 2 shows state changes of an absolute pressure sensing MEMS microphone under different conditions according to one embodiment.

[0023] FIG. 3 shows states of an absolute pressure sensing MEMS microphone under different conditions according to one embodiment.

[0024] FIG. 4 shows a schematic diagram of an absolute pressure sensing MEMS microphone according to one embodiment.

[0025] FIG. 5 shows a schematic diagram of an absolute pressure sensing MEMS microphone according to another embodiment.

[0026] FIG. 6 shows a schematic diagram of an absolute pressure sensing MEMS microphone according to yet another embodiment.

[0027] FIG. 7 shows a schematic diagram of an absolute pressure sensing MEMS microphone according to yet another embodiment.

[0028] FIG. 8 shows a schematic diagram of a microphone unit according to an embodiment disclosed herein.

[0029] FIG. 9 shows a schematic diagram of an electronic device according to an embodiment disclosed herein.

DETAILED DESCRIPTION

[0030] Various exemplary embodiments will now be described in detail with reference to the accompanying drawings.

[0031] The following description of at least one exemplary embodiment is merely illustrative in nature and is in no way intended to limit the invention, its application or uses.

[0032] It should be noted that similar reference numerals and letters refer to similar items in the following figures, and thus once an item is defined in one figure, it is possible that it need not be further discussed for following figures.

[0033] Various embodiments and examples of the present disclosure are described with reference to the accompanying drawings.

[0034] It is proposed here that in absolute pressure sensing MEMS microphones, the diaphragm is pre-bent to increase the sensitivity of the microphone.

[0035] For example, see FIG. 2, which illustrates state changes of an absolute pressure sensing MEMS microphone under different conditions according to one embodiment. The absolute pressure sensing MEMS microphone includes: a diaphragm, a back electrode plate 32 and a spacer 33.

[0036] Reference numerals 311, 312, and 313 are the positions of the diaphragm under different conditions. Curve 311 indicates the position of the diaphragm when both of the air pressures inside and outside the diaphragm are the first air pressure. The inside of the diaphragm refers to the side where the diaphragm is located in the vacuum cavity 34. Curve 312 indicates the position of the diaphragm when the air pressure outside the diaphragm is 1 atmosphere. Curve 313 indicates the position of the diaphragm when the air pressure outside the diaphragm is 1 atmosphere and an operating bias is applied between the diaphragm and the back electrode plate 32.

[0037] The spacer 33 is located between the diaphragm and the back electrode plate 32. The spacer 33 can be a separate spacer layer, or a part of a chip substrate.

[0038] The diaphragm, the back electrode plate 32 and the spacer 33 form the vacuum cavity 34. The air pressure in the vacuum cavity 34 is the first air pressure. In reality, an absolute vacuum cannot be achieved. Therefore, an environment whose air pressure is much lower than atmospheric pressure is generally called vacuum environment. In this vacuum environment, there is still a zero-approaching air pressure. Here, the zero-approaching air pressure is defined as the first air pressure.

[0039] As shown in FIG. 2, the gap Gf separating the diaphragm and the back electrode plate 32 by the spacer 33 is a fabrication gap. The fabrication gap Gf can be a distance between the back electrode plate 32 and the flat position P of the diaphragm.

[0040] In the state where the air pressure inside and outside the diaphragm is the first air pressure, the diaphragm is at the position of the curve 311, and the effective vacuum gap (for example, the average vacuum gap) between the diaphragm position curve 311 and the back electrode plate 32 is the first vacuum gap. The first vacuum gap is larger than the fabrication gap Gf.

[0041] Here, the vacuum pressure sensing device is used for the MEMS microphone, so that the advantages of the vacuum pressure sensing device can be utilized.

[0042] In addition, in order to improve the sensitivity of the MEMS microphone, the diaphragm is pre-bent, so that the soft diaphragm can also be used to form a vacuum cavity, so that the absolute pressure sensor can be used as a microphone to provide a sensitivity similar to conventional MEMS microphone.

[0043] For example, the first vacuum gap is greater than or equal to twice the fabrication gap. In addition, the first vacuum gap is less than or equal to 10 times the fabrication gap.

[0044] In addition, at standard atmospheric pressure, the effective vacuum gap between the diaphragm (curve 312) and the back electrode plate 32 is the second vacuum gap. The second vacuum gap is larger than the fabrication gap Gf. In this way, the extent of downward bending of the diaphragm (curve 313) which is applied an operating bias is reduced.

[0045] FIG. 3(A), FIG. 3(B), and FIG. 3(C) respectively show the states of the diaphragm 31 under different conditions. In FIG. 3, a diaphragm 31, a back electrode plate 32 and a spacer 33 form a vacuum cavity 34.

[0046] In the state shown in FIG. 3(A), both of the air pressures inside and outside the diaphragm are vacuum air pressure. In this case, the pressure on both sides of the diaphragm 31 is the same, and the diaphragm 31 is in a free state. The diaphragm 31 is pre-bent to deviate from the flat position P.

[0047] In the state shown in FIG. 3(B), both of the air pressures inside and outside the diaphragm are atmospheric pressure. In this case, the pressure outside of the diaphragm 31 is greater than the pressure inside of the diaphragm 31. The diaphragm 31 is pressed toward the back electrode plate 32 by atmospheric pressure. In FIG. 3(B), due to being pre-bent, the diaphragm 31 is still located outside the flat position P.

[0048] In the state shown in FIG. 3(C), the air pressure outside the diaphragm 31 is atmospheric pressure and an operating bias is applied between the back electrode plate 32 and the diaphragm 31. In this case, due to the action of the operating bias, the diaphragm 31 is attracted by the back electrode plate 32 and further approaches the back electrode plate 32. In FIG. 3(B), due to being pre-bent, the extent of deviation of the diaphragm 31 from the flat position P is small. In FIG. 3(B), the diaphragm 31 is located at the side of the flat position P close to the back electrode plate 32. However, by setting the extent of pre-bending of the diaphragm 31, the diaphragm 31 can still be located outside the flat position P when an operating bias is applied.

[0049] When the diaphragm 31 is working, try to set the diaphragm 31 near the flat position P to provide better performance of the MEMS microphone. For example, at the standard atmospheric pressure, the effective vacuum gap between the diaphragm (curve 313) and the back electrode plate 32 is the third vacuum gap when an operating bias is applied. The third vacuum gap is greater than or equal to 80% of the fabrication gap and less than or equal to 120% of the fabrication gap. In this way, it is possible to ensure that the diaphragm (curve 313) is in a proper working position, so as to ensure that the diaphragm is in a good working condition.

[0050] The diaphragm can be pre-deviated through the stress structure, so that the first vacuum gap is larger than the fabrication gap.

[0051] By using the stress of the diaphragm (thin film) to pre-deviate the diaphragm 31 to deviate from the back electrode plate 32, a large initial gap Gi (that is, the effective vacuum gap between the diaphragm curve 311 and the back electrode plate 32 when the air pressure outside the diaphragm 31 Po=0) required for high sensitivity can be obtained without increasing the difficulty of fabricating process (for example, the fabrication gap Gf). In this way, when the air pressure outside the diaphragm 31 Po=1 atm (that is, one standard atmosphere), the gap Go between the diaphragm 31 (curve 312) and the back electrode plate 32 is relatively large, and the VP (Collapse voltage) of the microphone can be increased, thereby improving the sensitivity of the MEMS microphone.

[0052] A detailed analysis of the performance of the microphone is as follows. Here, it is assumed that the mechanical sensitivity of the MEMS microphone is linear.

[0053] Assume that when Po=0, the first vacuum gap is Gi, that is, the effective vacuum gap between the curve 311 and the back electrode plate 32 in FIG. 1; when Po=1 atm, effective value of the mechanical sensitivity of the diaphragm 31 is Sm.sup.0, the second vacuum gap is Go, that is, the effective vacuum gap between the curve 312 and the back electrode plate 32 in FIG. 1; when Po=1 atm and an operating bias VB is applied between the diaphragm 31 and the back electrode plate 32, the third vacuum gap is Ge, that is, the effective vacuum gap between the curve 313 and the back electrode plate 32 in FIG. 1.

[0054] Maximum open circuit sensitivity of microphones Soc.max˜(k.Math.VP/Ge).Math.Sm.sup.0. Usually, the maximum value of the VB/VP ratio is 75%, therefore, k˜75%. Here, “˜” means approximately or approximately equal to.

[0055] VP=(8Go.sup.3/27ε.sub.0Sm.sup.0).sup.0.5, where ε.sub.0 is the vacuum dielectric constant.

[0056] Wo=Sm.sup.0Po=(Gi−Go)/Po, where Wo is the effective deformation of the diaphragm caused by the atmospheric pressure Po.

[0057] Therefore, the maximum sensitivity of the MEMS microphones Soc.max˜(Go.sup.3Sm.sup.0/6ε.sub.0Ge.sup.2).sup.0.5=[Go.sup.3(Gi−Go)/12ε.sub.0PoGe.sup.2].sup.0.5.

[0058] When Ge is guaranteed so that the MEMS can work stably, the maximum value Soc of the sensitivity of the MEMS microphone is located at Go=¾Gi. The sensitivity at this time is Soc.max˜( 9/16)Gi.sup.2/[Ge(12ε.sub.0Po).sup.0.5]. It is in direct correlation to the initial gap Gi after pre-deviated.

[0059] In existing absolute pressure sensors, the pressure sensing membrane is not pre-deviated. That is to say, in the existing absolute pressure sensors, Gi in the above formula is equal to the fabrication gap Gf, that is, Gi=Gf.

[0060] Here, the extent of pre-deviation can be increased so that Gi>>Gf, so that the sensitivity and SNR (signal-to-noise ratio) of the MEMS microphone are greatly improved.

[0061] In addition, since the diaphragm is pre-deviated, a small fabrication gap can be used, so that the diaphragm can also be small, thereby reducing the cost of the chip.

[0062] FIGS. 4-7 illustrate various embodiments of using stress structures to pull the diaphragm into a desired state. Here, the fabrication gap (i.e., thickness of sacrificial layer in the MEMS microphone) Gf=0.1-2 um. After the MEMS microphone is released, the back electrode plate and the diaphragm form a vacuum cavity. When both inside and outside the vacuum cavity are vacuum, the ratio of the effective gap between the diaphragm and the back electrode plate to the second vacuum gap G at standard atmospheric pressure Gi/Gf>>1 (for example, Gi is 2-10 times Gf).

[0063] In the embodiment of FIG. 4, the diaphragm 314, the back electrode plate 320, and the spacer 331 form a vacuum cavity 340.

[0064] In the embodiment of FIG. 4, the stress structure includes a diaphragm 314 and a compressive stress component 315. The diaphragm 314 has a tensile stress along the surface direction of the diaphragm. The compressive stress component 315 is attached to outside of the diaphragm 314 relative to the vacuum cavity 340, and has a compressive stress along the surface direction of the diaphragm 314.

[0065] In the embodiment of FIG. 5, the diaphragms 316, 317, the back electrode plate 320, and the spacer 331 form a vacuum cavity 340. The fixing member 332 fixes the diaphragm 316, 317 to the spacer 331.

[0066] In the embodiment of FIG. 5 the stress structure includes complex layers 316, 317 of the diaphragm.

[0067] Complex layers 316, 317 include an inner film 317 located inside the vacuum cavity and an outer film 316 located outside. The inner film 317 has a tensile stress along the surface direction of the diaphragm, and the outer film 316 has a compressive stress along the surface direction of the diaphragm.

[0068] In the embodiment of FIG. 6, the diaphragm 318, the back electrode plate 320, and the spacer 331 form a vacuum cavity 340. The fixing member 332 fixes the diaphragm 318 to the spacer 331. The fixing member 332 has a tensile stress in the surface direction of the diaphragm and is attached to the upper surface (i.e., the outer surface) of the diaphragm. The spacer 331 has a compressive stress in the direction of the surface of the diaphragm and is attached to the lower surface (i.e., inner surface) of the diaphragm.

[0069] In the embodiment shown in FIG. 7, the stress structure includes a corrugated membrane structure 319 on the diaphragm, so that the diaphragm bulges outwards relative to the vacuum cavity.

[0070] FIG. 8 shows a schematic diagram of a microphone unit according to an embodiment disclosed herein.

[0071] As shown in FIG. 8, the microphone unit 40 includes a unit shell 41, the above-described absolute pressure sensing MEMS microphone 42 and an integrated circuit chip 43. An absolute pressure sensing MEMS microphone 42 and an integrated circuit chip 43 are arranged in the unit shell The absolute pressure sensing MEMS microphone 42 corresponds to an inlet of the unit shell 41. The absolute pressure sensing MEMS microphone 42, the integrated circuit chip 43 and the circuit in the unit shell 41 are connected through leads 44.

[0072] FIG. 9 shows a schematic diagram of an electronic device according to an embodiment disclosed herein.

[0073] As shown in FIG. 9, the electronic device 50 may include the microphone unit 51 shown in FIG. 8. The electronic device 50 may be a mobile phone, a tablet computer, a wearable apparatus, and the like.

[0074] The above is only the specific implementation of the embodiment of the present disclosure. It should be pointed out that for those of ordinary skill in the art, without departing from the principle of the embodiment of the present disclosure, some improvements and modifications can also be made. These improvements and modifications should also be regarded as the scope of the embodiments of the present disclosure.