DETECTION OF AN AMORPHOUS AND/OR CRYSTALLINE STRUCTURE OF PHOSPHATE AND/OR SULPHATE SALTS ON THE SURFACE OF A SUBSTRATE OR WITHIN A SUBSTRATE WITH A LWIR IMAGING SYSTEM

Abstract

A method and an LWIR imaging system for detecting an amorphous and/or crystalline structure of phosphate and/or sulphate salts on the surface of a substrate or within a substrate are described. The method comprises the steps of i) providing an LWIR imaging system, the LWIR imaging system comprising a) an infrared light emitting source (A) that emits over the whole range of 8 to 14 micrometers, b) an LWIR detecting device (B) and c) a ToF distance sensor (C), ii) providing a substrate comprising an amorphous and/or crystalline structure of phosphate and/or sulphate salts on the surface of the substrate or within the substrate, ii) irradiating the provided substrate with the infrared light emitting source and iii) detecting, with the LWIR detecting device and using and/or based on the TOF distance sensor, the intensity of electromagnetic radiation scattered, emitted and/or reflected by the substrate and the amorphous and/or crystalline structure of phosphate and/or sulphate salts.

Claims

1. A method for detecting an amorphous and/or crystalline structure of phosphate and/or sulphate salts on the surface of a substrate or within a substrate, the method comprising the steps of i) providing a LWIR imaging system, the LWIR imaging system comprising a) an infrared light emitting source that emits over the whole range of 8 to 14 μm, b) a LWIR detecting device and c) a ToF distance sensor ii) providing a substrate comprising an amorphous and/or crystalline structure of phosphate and/or sulphate salts on the surface of the substrate or within the substrate, iii) irradiating the provided substrate with the infrared light emitting source and iv) detecting, with the LWIR detecting device and using and/or based on the TOF distance sensor, the intensity of electromagnetic radiation scattered, emitted and/or reflected by the substrate and the amorphous and/or crystalline structure of phosphate and/or sulphate salts.

2. The method according to claim 1, further comprising the step of determining and/or measuring a distance between the LWIR imaging system and the substrate based on and/or using the ToF distance sensor.

3. The method according to claim 1, further comprising the step of adjusting a distance between the LWIR imaging system and the substrate based on and/or using the ToF distance sensor.

4. The method according to claim 3, wherein adjusting the distance includes instructing a user and/or providing user instructions to a user to increase or decrease the distance between the LWIR imaging system and the substrate.

5. The method according to claim 3, wherein the distance between the LWIR imaging system and the substrate is adjusted, such that the amorphous and/or crystalline structure of phosphate and/or sulphate salts on the substrate or within the substrate is focusable with the LWIR detection device.

6. The method according to claim 1, further comprising focusing the LWIR detecting device onto the substrate based on determining a distance between the LWIR imaging system and the substrate using the ToF distance sensor.

7. The method according to claim 1, wherein the LWIR detecting device is a bolometer or a sensor comprising mercury cadmium telluride.

8. The method according to claim 1, wherein the LWIR imaging system further comprises at least one focusing/scattering device for focusing and/or scattering the irradiated infrared light from the infrared light emitting source, wherein the at least one focusing and/or focusing/scattering device is optionally located in the beam path between the infrared light emitting source and the LWIR detecting device.

9. The method according to claim 8, wherein the at least one focusing device is a collimator and/or the at least one focusing/scattering device is a lens.

10. The method according to claim 1, wherein the LWIR imaging system further comprises at least one collecting device for collecting and/or focusing the electromagnetic radiation that will be detected by the LWIR detecting device, wherein the at least one collecting device is optionally located in the beam path between the infrared light emitting source and the LWIR detecting device.

11. The method according to claim 10, wherein the at least one collecting device is an objective.

12. The method according to claim 1, wherein the LWIR imaging system further comprises at least one filtering device for filtering the electromagnetic radiation that will be detected by the LWIR detecting device, wherein the at least one filtering device is optionally located in the beam path between the infrared light emitting source and the LWIR detecting device.

13. The method according to claim 12, wherein the at least one filtering device is an optical filter.

14. The method according to claim 1, wherein the ToF distance sensor is located in the beam path between the infrared light emitting source and the LWIR detecting device and optionally is equidistant from the infrared light emitting source and the LWIR detecting device.

15. The method according to claim 1, wherein the LWIR imaging system further comprises a graphical image device.

16. The method according to claim 1, wherein the LWIR imaging system is located in a housing and the housing is optionally connectable to a computer device.

17. The method according to claim 16, wherein the housing further comprises a button for activating the LWIR detecting device and/or the graphical image device without direct operation of the computer device.

18. The method according to claim 1, wherein the LWIR imaging system is located in or on a snap-on device that can be mounted on a mobile phone or wherein parts of the LWIR imaging system are located in or on a snap-on device that is mounted on a mobile phone and the remaining parts are located on the mobile phone.

19. The method according to claim 12, wherein the at least one filtering device is i) a bandpass filter or ii) a combination of a long pass and short pass filter, or iii) a tunable filter.

20. The method according to claim 12, wherein the at least one filtering device is i) a bandpass filter in the range of 8.8 to 9.3 μm or 10.0 to 10.6 μm or 11.3 to 11.8 μm or ii) a combination of a long pass filter of 8 μm and a short pass filter of 8.8 μm or a combination of a long pass filter of 10.3 μm and a short pass filter of 10.8 μm, or iii) a tunable MEMS Fabry-Perot filter in the range of 8 to 14 μm and the tunable MEMS Fabry-Perot filter optionally has a spectral resolution of 100 nm and below.

21. A LWIR imaging system for detecting an amorphous and/or crystalline structure of phosphate and/or sulphate salts on the surface of a substrate or within a substrate, the system comprising a) an infrared light emitting source that emits over the whole range of 8 to 14 μm configured to irradiate a substrate, b) a LWIR detecting device configured to detect the intensity of electromagnetic radiation scattered, emitted and/or reflected by the substrate and the amorphous and/or crystalline structure of phosphate and/or sulphate salts and c) a ToF distance sensor configured to determine a distance between the substrate and the LWIR detecting device.

22. The LWIR imaging system according to claim 21, wherein the infrared light emitting source is a Peltier element or a resistance based coil heater, the Peltier element is optionally configured to irradiate the substrate homogeneously.

23. The LWIR imaging system according to claim 21, wherein the LWIR imaging system detects the intensity of the contrast of electromagnetic radiation scattered and/or emitted and/or reflected by a substrate and an amorphous and/or crystalline structure of phosphate and/or sulphate salts, due to the irradiation with the infrared light emitting source.

24. The LWIR imaging system according to claim 21, wherein the LWIR imaging system provides at least two recordings per second of an identical part of the substrate comprising the amorphous and/or crystalline structure of phosphate and/or sulphate salts, and optionally combines these pictures to reduce the signal to noise ratio.

Description

FURTHER ASPECTS

[0270] Aspect 1: According to another aspect of the present invention a LWIR imaging system for detecting an amorphous and/or crystalline structure of phosphate and/or sulphate salts on the surface of a substrate or within a substrate is provided, the system comprising [0271] a) an infrared light emitting source that emits over the whole range of 8 to 14 μm, [0272] b) a LWIR detecting device and [0273] c) a ToF distance sensor.

[0274] Aspect 2: The LWIR imaging system according to aspect 1, wherein the LWIR detecting device is a bolometer or a sensor comprising mercury cadmium telluride and preferably the LWIR detecting device is a bolometer.

[0275] Aspect 3: The LWIR imaging system according to any of the preceding aspects, wherein the system further comprises at least one focusing/scattering device for focusing and/or scattering the irradiated infrared light from the infrared light emitting source, wherein the at least one focusing and/or focusing/scattering device is preferably located in the beam path between the infrared light emitting source and the LWIR detecting device.

[0276] Aspect 4: The LWIR imaging system according to aspect 3, wherein the at least one focusing device is a collimator and/or the at least one focusing/scattering device is a lens.

[0277] Aspect 5: The LWIR imaging system according to any of the preceding aspects, wherein the system further comprises at least one collecting device for collecting and/or focusing the electromagnetic radiation that will be detected by the LWIR detecting device, wherein the at least one collecting device is preferably located in the beam path between the infrared light emitting source and the LWIR detecting device.

[0278] Aspect 6: The LWIR imaging system according to aspect 5, wherein the at least one collecting device is an objective, preferably a lens.

[0279] Aspect 7: The LWIR imaging system according to any of the preceding aspects, wherein the system further comprises at least one filtering device for filtering the electromagnetic radiation that will be detected by the LWIR detecting device, wherein the at least one filtering device is preferably located in the beam path between the infrared light emitting source and the LWIR detecting device and preferably between the objective if present and the LWIR detecting device.

[0280] Aspect 8: The LWIR imaging system according to aspect 7, wherein the at least one filtering device is an optical filter and preferably

[0281] i) a bandpass filter, preferably in the range of 8.8 to 9.3 μm or 10.0 to 10.6 μm or 11.3 to 11.8 μm or

[0282] ii) a combination of a long pass and short pass filter, preferably a combination of a long pass filter of 8 μm and a short pass filter of 8.8 μm or a combination of a long pass filter of 10.3 μm and a short pass filter of 10.8 μm, or

[0283] iii) a tunable filter, preferably a tunable MEMS Fabry-Perot filter, wherein the tunable filter in the range of 8 to 14 μm has preferably a spectral resolution of 100 nm and below.

[0284] Aspect 9: The LWIR imaging system according to any of the preceding aspects, wherein the ToF distance sensor is located in the beam path between the infrared light emitting source and the LWIR detecting device and preferably is equidistant from the infrared light emitting source and the LWIR detecting device.

[0285] Aspect 10: The LWIR imaging system according to any of the preceding aspects, wherein the system further comprises a graphical image device, preferably a CCD camera.

[0286] Aspect 11: The LWIR imaging system according to any of the preceding aspects, wherein the system is located in a housing, preferably in a handheld housing, and the housing is preferably connectable to a computer device, preferably a mobile phone.

[0287] Aspect 12: The LWIR imaging system according to aspect 11, wherein the housing further comprises a button for activating the LWIR detecting device and/or the graphical image device without direct operation of the computer device.

[0288] Aspect 13: The LWIR imaging system according to any of the preceding aspects, wherein the system is located in or on a snap-on device that can be mounted on a mobile phone or wherein parts of the system are located in or on a snap-on device that is mounted on a mobile phone and the remaining parts are located on the mobile phone.

[0289] Aspect 14: Use of the LWIR imaging system according to aspects 1 to 13 for detecting the intensity of the contrast of electromagnetic radiation scattered and/or emitted and/or reflected by a substrate and an amorphous and/or crystalline structure of phosphate and/or sulphate salts, due to the irradiation with the infrared light emitting source.

[0290] Aspect 15: The use according to aspect 14, wherein the system provides at least two recordings per second of an identical part of the substrate comprising the amorphous and/or crystalline structure of phosphate and/or sulphate salts and combining these pictures in order to reduce the signal to noise ratio.

[0291] Further clauses describing one or more aspects of the present disclosure are provided in the following.

[0292] Clause 1: A method for detecting an amorphous and/or crystalline structure of phosphate and/or sulphate salts on the surface of a substrate or within a substrate, the method comprising the steps of

[0293] i) providing a LWIR imaging system, the LWIR imaging system comprising [0294] a) an infrared light emitting source that emits over the whole range of 8 to 14 μm, [0295] b) a LWIR detecting device and [0296] c) a ToF distance sensor

[0297] ii) providing a substrate comprising an amorphous and/or crystalline structure of phosphate and/or sulphate salts on the surface of the substrate or within the substrate,

[0298] ii) irradiating the provided substrate with the infrared light emitting source and

[0299] iii) detecting, with the LWIR detecting device and using and/or based on the TOF distance sensor, the intensity of electromagnetic radiation scattered, emitted and/or reflected by the substrate and the amorphous and/or crystalline structure of phosphate and/or sulphate salts.

[0300] Clause 2: The method according to clause 1, further comprising the step of determining and/or measuring a distance between the LWIR imaging system and the substrate based on and/or using the ToF distance sensor.

[0301] Clause 3: The method according to any of the preceding clauses, further comprising the step of adjusting a distance between the LWIR imaging system and the substrate based on and/or using the ToF distance sensor.

[0302] Clause 4: The method according to clause 3, wherein adjusting the distance includes instructing a user and/or providing user instructions to a user to increase or decrease the distance between the LWIR imaging system and the substrate.

[0303] Clause 5: The method of any of clauses 3 and 4,

[0304] wherein the distance between the LWIR imaging system and the substrate is adjusted, such that the amorphous and/or crystalline structure of phosphate and/or sulphate salts on the substrate or within the substrate is focusable with the LWIR detection device.

[0305] Clause 6: The method according to any of the preceding clauses, further comprising:

[0306] focusing the LWIR detecting device onto the substrate based on determining a distance between the LWIR imaging system and the substrate using the ToF distance sensor.

[0307] Clause 7: The method according to any of the preceding clauses, wherein the LWIR detecting device is a bolometer or a sensor comprising mercury cadmium telluride and preferably the LWIR detecting device is a bolometer.

[0308] Clause 8: The method according to any of the preceding clauses, wherein the LWIR imaging system further comprises at least one focusing/scattering device for focusing and/or scattering the irradiated infrared light from the infrared light emitting source, wherein the at least one focusing and/or focusing/scattering device is preferably located in the beam path between the infrared light emitting source and the LWIR detecting device.

[0309] Clause 9: The method according to clause 8, wherein the at least one focusing device is a collimator and/or the at least one focusing/scattering device is a lens.

[0310] Clause 10: The method according to any of the preceding clauses, wherein the LWIR imaging system further comprises at least one collecting device for collecting and/or focusing the electromagnetic radiation that will be detected by the LWIR detecting device, wherein the at least one collecting device is preferably located in the beam path between the infrared light emitting source and the LWIR detecting device.

[0311] Clause 11: The method according to clause 10, wherein the at least one collecting device is an objective, preferably a lens.

[0312] Clause 12: The method according to any of the preceding clause, wherein the LWIR imaging system further comprises at least one filtering device for filtering the electromagnetic radiation that will be detected by the LWIR detecting device, wherein the at least one filtering device is preferably located in the beam path between the infrared light emitting source and the LWIR detecting device and preferably between the objective if present and the LWIR detecting device.

[0313] Clause 13: The method according to clause 12, wherein the at least one filtering device is an optical filter and preferably

[0314] i) a bandpass filter, preferably in the range of 8.8 to 9.3 μm or 10.0 to 10.6 μm or 11.3 to 11.8 μm or

[0315] ii) a combination of a long pass and short pass filter, preferably a combination of a long pass filter of 8 μm and a short pass filter of 8.8 μm or a combination of a long pass filter of 10.3 μm and a short pass filter of 10.8 μm, or

[0316] iii) a tunable filter, preferably a tunable MEMS Fabry-Perot filter, wherein the tunable filter in the range of 8 to 14 μm has preferably a spectral resolution of 100 nm and below.

[0317] Clause 14: The method according to any of the preceding clauses, wherein the ToF distance sensor is located in the beam path between the infrared light emitting source and the LWIR detecting device and preferably is equidistant from the infrared light emitting source and the LWIR detecting device.

[0318] Clause 15: The method according to any of the preceding clauses, wherein the LWIR imaging system further comprises a graphical image device, preferably a CCD camera.

[0319] Clause 16: The method according to any of the preceding clauses, wherein the LWIR imaging system is located in a housing, preferably in a handheld housing, and the housing is preferably connectable to a computer device, preferably a mobile phone.

[0320] Clause 17: The method according to clause 16, wherein the housing further comprises a button for activating the LWIR detecting device and/or the graphical image device without direct operation of the computer device.

[0321] Clause 18: The method according to any of the preceding clauses,

[0322] wherein the LWIR imaging system is located in or on a snap-on device that can be mounted on a mobile phone or

[0323] wherein parts of the LWIR imaging system are located in or on a snap-on device that is mounted on a mobile phone and the remaining parts are located on the mobile phone.

[0324] Clause 19: Use of the LWIR imaging system according to clauses 1 to 18 for detecting the intensity of the contrast of electromagnetic radiation scattered and/or emitted and/or reflected by a substrate and an amorphous and/or crystalline structure of phosphate and/or sulphate salts, due to the irradiation with the infrared light emitting source.

[0325] Clause 20: The use according to clause 19, wherein the system provides at least two recordings per second of an identical part of the substrate comprising the amorphous and/or crystalline structure of phosphate and/or sulphate salts and combining these pictures in order to reduce the signal to noise ratio.

[0326] Clause 21: A LWIR imaging system for detecting an amorphous and/or crystalline structure of phosphate and/or sulphate salts on the surface of a substrate or within a substrate, the system comprising [0327] a) an infrared light emitting source that emits over the whole range of 8 to 14 μm configured to irradiate a substrate, [0328] b) a LWIR detecting device configured to detect the intensity of electromagnetic radiation scattered, emitted and/or reflected by the substrate and the amorphous and/or crystalline structure of phosphate and/or sulphate salts and [0329] c) a ToF distance sensor configured to determine a distance between the substrate and the LWIR detecting device.

[0330] Clause 22: The LWIR imaging system according to clause 21, wherein the infrared light emitting source is a Peltier element or a resistance based coil heater, the Peltier element preferably being configured to irradiate the substrate homogeneously.

EXAMPLES

Example 1

[0331] Example 1 refers to the geometry and the arrangement of the single components in the LWIR imaging system.

[0332] FIG. 1 shows the principle for a transmission-based setup and FIGS. 2 and 3 show the principle for a reflectance-based setup. The LWIR imaging system consist of the following parts:

[0333] a: lens and/or collimator

[0334] b: infrared light emitting source or sources

[0335] c: lens

[0336] d: bandpass filter

[0337] e: LWIR detecting device (image sensor)

[0338] g: ToF distance sensor

[0339] Furthermore the printed substrate for the detection (f) is shown which is not a part of the LWIR imaging system

Example 2

[0340] The selection of the filtering device, for example the bandpass filter, depends on the substrate and the amorphous and/or crystalline structure of the phosphate and sulphate salts within the print on the substrate. In FIG. 4 the spectral ranges of an 80 g/m.sup.2 calcium carbonate containing paper with calcium phosphate containing printed pattern on the surface are shown where the contrast signal to noise ratio is as high as possible. Bandpass filter options to detect the particular calcium phosphate containing pattern could be selected from A, (8.8-9.3 μm), B (10.0-10.6 μm) or C (11.3-11.8 μm).

[0341] The spectra in FIG. 4 is measured at 27.9° C. and 49% relative humidity, with an BRUKER VERTEX 70v FTIR Spectrometer having a Li—N.sub.2 cooled MCT detector with MIR sources, with the following specifications and settings:

[0342] 6 mm Aperture, Resolution 4 cm, Scans 1024, Signals around 80-350 back ground signal 17, Transmission signal 22,000, reflectivity 2,000.

Example 3

[0343] The LWIR imaging system according to the present invention or parts thereof can be located in a housing and the housing can be connectable to a mobile phone as shown in FIGS. 5 and 6.

[0344] Abbreviations A, B, C, D, E and F have the following meanings:

[0345] A: Infrared light emitting source that emits over the whole range of 8 to 14 μm

[0346] B: LWIR detecting device

[0347] C: ToF distance sensor

[0348] D: Opening for CCD camera located on the mobile phone

[0349] E: Button for activating the LWIR detecting device

[0350] F: Opening for touch screen of the mobile phone

Example 4

[0351] The LWIR imaging system or parts of the LWIR imaging system can be located in a snap-on device that can be connected to a mobile phone, for example via USB connection as shown in FIG. 8.

[0352] Abbreviations A, B and C have the following meanings:

[0353] A: LWIR imaging system in the form of a snap-on device (1 IR-light emitting source, 2 ToF distance sensor, 3 LWIR camera with lens)

[0354] B: USB connection

[0355] C: mobile phone

Example 5

[0356] Pictures are taken with a standard visible camera (FIG. 9, left) and an LWIR imaging system according to the present invention, wherein the infrared light emitting source is a Peltier element (FIG. 9, right) of a substrate comprising an amorphous and/or crystalline structure of phosphate and/or sulfate salts on the surface in the form of a printed label on a plastic bag. As can be seen in FIG. 9, left, it is not possible to detect the QR code with the human eye or a standard visible camera.

[0357] However, the data matrix code pattern is indeed visible, when detected with the LWIR imaging system of the present invention.

[0358] It is to be noted that the LWIR imaging system and/or LWIR imaging arrangement may include further components and/or elements, such as e.g. the control circuitry, one or more processors, one or more communication interfaces, one or more data storages, one or more communication circuitries, as described hereinabove, which are not shown in the figures.