RAMAN SCATTERING SPECTROMETRIC APPARATUS AND RAMAN SCATTERING SPECTROSCOPIC METHOD
20230236129 · 2023-07-27
Assignee
Inventors
Cpc classification
International classification
Abstract
The Raman scattering spectroscopic method according to the present invention include: preparing a chip having a channel in which a nanostructure is formed; introducing an analyte solution into a part of the channel in the chip; irradiating an interface of the analyte solution with a laser beam; and measuring Raman scattering light induced by the irradiation of the laser beam. The measurement may be performed, with a fixed laser beam irradiation position, both in a state where the interface of the analyte solution is included in the laser-beam-irradiation area and in a state where the interface of the analyte solution is not included in the laser-beam-irradiation area, or may be performed keeping the state where the interface of the analyte solution is maintained in the laser-beam-irradiation area by controlling the laser-beam-irradiation area according to the movement of the interface due to evaporation of the analyte solution.
Claims
1. A Raman scattering spectrometric apparatus, comprising: an irradiation unit configured to emit a laser beam; and a measuring unit configured to measure Raman scattering light induced by irradiation with the laser beam, wherein a measurement is performed by irradiating the laser beam to liquid-air interface of an analyte solution formed on a metal nanostructure with an irradiation direction of the laser beam being parallel to the interface, the analyte solution being introduced into a part of a channel in a chip having the channel in which the metal nanostructure is formed.
2. The Raman scattering spectrometric apparatus according to claim 1, comprising the chip.
3. The Raman scattering spectrometric apparatus according to claim 2, comprising a solution introducing unit configured to introduce the analyte solution into the part of the channel in the chip.
4. The Raman scattering spectrometric apparatus according to claim 1, wherein an irradiation position of the laser beam is fixed, and the irradiation of the laser beam and the measurement of the Raman scattering light are performed both in a state in which the interface of the analyte solution and air formed on the metal nanostructure is included in an irradiation area of the laser beam and in a state in which the interface of the analyte solution is not included in the irradiation area of the laser beam.
5. The Raman scattering spectrometric apparatus according to claim 1, further comprising a control unit configured to control the irradiation position of the laser beam in accordance with a movement of the interface due to evaporation of the analyte solution.
6. The Raman scattering spectrometric apparatus according to claim 1, wherein the metal nanostructure comprises a nano-dot structure or a nano-ripple structure.
7. A Raman scattering spectrometric method, comprising: preparing a chip having a channel in which a metal nanostructure is formed; introducing an analyte solution into a part of the channel in the chip; irradiating a liquid-air interface of the analyte solution formed on the metal nanostructure with a laser beam wherein an irradiation direction of the laser beam is parallel to the interface; and measuring Raman scattering light induced by the irradiation of the laser beam.
8. The Raman scattering spectrometric method according to claim 7, wherein a irradiation position of the laser beam is fixed, and the irradiation of the laser beam and the measurement of the Raman scattering light are performed both in a state in which the interface of the analyte solution and air formed on the metal nanostructure is included in an irradiation area of the laser beam and in a state in which the interface of the analyte solution and air is not included in the irradiation area of the laser beam.
9. The Raman scattering spectrometric method according to claim 7, further comprising a step of controlling the irradiation position of the laser beam in accordance with a movement of the interface due to evaporation of the analyte solution.
10. The Raman scattering spectrometric method according to claim 7, wherein the metal nanostructure comprises a nano-dot structure or a nano-ripple structure.
Description
BRIEF DESCRIPTION OF DRAWINGS
[0025]
[0026]
[0027]
[0028]
[0029]
[0030]
[0031]
[0032]
[0033]
[0034]
DESCRIPTION OF EMBODIMENTS
Summary
[0035] The present invention relates to a Raman scattering spectroscopy method that enables a measurement with a higher Raman scattering enhancement factor. More specifically, the present invention relates to a Raman scattering spectroscopy method that can achieve a detection sensitivity of 10 to 100 attomolar (aM) not only for a limited time but in a continuous manner.
[0036] The present invention is now described in summary. The present invention uses a 3D microfluidic SERS chip that includes a channel formed with a metal thin film nanostructure. An analyte solution is introduced into a part of the channel, and a Raman measurement is performed in a state where a liquid-gas interface of the analyte solution is positioned in the nanostructure (
[0037] The present inventors have given the name Liquid-Interface assisted SERS (LI-SERS) spectroscopy to the Raman scattering measurement method according to the present invention because it is a technique that uses the liquid interface of the analyte solution. Herein this technique shall be also called liquid-interface assisted SERS or LI-SERS.
Apparatus Configuration
[0038] As shown in
[0039] The 3D microfluidic SERS chip 20 (hereinafter also referred to simply as “chip 20”) has a channel (fluidic structure) formed with a nanostructure of a metal thin film. The chip 20 is described briefly here since the present inventors have already disclosed its structure and fabrication method in NPL 3. While NPL 3 describes fabrication of metal nano-dot structures (2D structures), it is also possible to adopt nano-ripple structures (lines and space patterns, or 1D structures).
[0040]
[0041] The microfluidic structure fabricated in this embodiment is 300 μm in width, 90 μm in height, and 2000 μm in total length, for example, 210 μm below the upper face of the glass substrate, and connected to two openings (each being 500 μm×500 μm×300 μm). The nanoripple structure has an average period of 140 nm and an average distance between grooves of 43 nm, for example.
Measurement Method
[0042] The measurement method in this embodiment will be described in more detail with reference to
[0043] First, an analyte solution 210 (e.g., Rhodamine 6G, or R6G) is introduced into the channel 202 from one opening of the fabricated 3D microfluidic SERS chip 20. The introduction of the analyte solution 210 is performed with a micro syringe, for example. In introducing the analyte solution 210, the channel 202 is filled not fully but only partly with the analyte solution 210. For example, the analyte solution 210 is introduced into the channel 202 so that an irradiation area of the laser beam 211 is filled with the analyte solution 210 and that the liquid interface of the analyte solution 210 is slightly outside the irradiation area of the laser beam 211.
[0044] An excited laser beam is emitted from the laser light source 10 in this state to start Raman measurement.
[0045] At the start of the measurement, the analyte solution 210 is present over the entire laser-irradiated area so that the measurement takes place similarly to that of NPL 3, the Raman enhancement factor being about 10.sup.8. Accordingly, no Raman signal is detected from the 10.sup.−11 M R6G solution.
[0046] As time passes, the analyte solution 210 evaporates so that, as shown in
[0047] As time progresses further, the liquid interface moves gradually away from the laser-irradiated area so that the signal intensity lowers. Nevertheless, after the analyte solution 210 within the laser-irradiation area has completely evaporated, a constant signal intensity (about half of that of the dynamic mode) is continuously acquired (static mode), this signal intensity being far higher than that obtained when the laser beam is emitted into the solution.
[0048]
[0049]
[0050] In this measurement, the enhancement factor (EF) is EF.sub.dynamic=3.2×10.sup.13 and EF.sub.static=1.5×10.sup.12 in the dynamic mode and static mode, respectively. Here, the enhancement factor is defined by EF=(I.sub.SERS/I.sub.OR)/(C.sub.SERS/C.sub.OR) wherein I.sub.SERS and I.sub.OR respectively represent the Raman signal intensities of R6G on the SERS substrate and the glass substrate, and C.sub.SERS and C.sub.OR represent the respective molar concentrations.
[0051] Similar measurements were also made using a 3D microfluidic SERS chip having a metal thin film with a nano-dot structure.
[0052] The enhancement factor EF in conventional SERS measurements is approximately in the range of from 10.sup.5 to 10.sup.9, the detection limit being about 1 μM to 1 pM. With the technique of NPL 3, the enhancement factor EF is about 10.sup.8, and the detection limit is about 1 nM. No enhancement factor has been reported regarding the transient SERS of NPL 1 and NPL 2, which allows detection at 10 aM only for a limited period of time. The present technique is capable of continuous Raman measurement with a detection limit in the range of 10 aM to 100 aM. The enhancement factor can be increased even more to improve the detection limit by further reducing the spacing in the nanostructure of the metal thin film.
[0053] While the mechanism by which the present technique enhances the Raman signal intensity has not been fully clarified yet, it is assumed to be caused by R6G molecules that are decomposed by the heat generated by laser irradiation of metal and gather around the metal nanostructure due to Marangoni convection, which is created at the same time by the heat in the solution. Some of the R6G molecules gathering around the metal nanostructure are assumed to remain on the metal thin film even after the liquid has evaporated, making the static mode analysis possible. In fact, the presence of remnant deposition in the laser-irradiated area after evaporation of the liquid has been confirmed.
[0054]
[0055] The present technique is also applicable to other solutions than R6G.
[0056] The above shows that the present technique (LI-SERS) enables a continuous Raman measurement of not only specific samples but a wider variety with the detection limit of fM to aM. The present technique is also expected to find applications in a wider range of fields for realizing ultrahigh-sensitivity rapid material analysis, pathological diagnosis, environmental measurement, and food safety control.
Variation Example
[0057] The present invention is not limited to the specific configurations described above and allows various modifications to be made within the technical concept shown in the present disclosure.
[0058] The 3D microfluidic SERS chip or metal nanostructure for example may be of other materials or sizes than those described above. While the enhancement factor can be further increased by making the metal nanostructure even finer as already mentioned, it is also possible to perform liquid-interface assisted SERS with a lower enhancement factor, using a metal nanostructure of a larger size than those mentioned above. Other metal nanostructures than nano-ripple structures or nano-dot structures, or dispersed metal nano-particles may also be used. The width, height, and length of the microfluidic channel are not limited to particular ranges. While the height should preferably be set in an appropriate range, the width and length can be as large as desired. The channel may have any length in the width direction.
[0059] In the description above, the laser irradiation position and 3D microfluidic SERS chip position are fixed during the measurement so that the liquid interface of the analyte solution moves away from the laser-irradiated area as time passes. Instead, the laser irradiation position may be moved relative to the chip in accordance with the movement of the liquid interface as the analyte solution evaporates. To carry out this control, for example, the information processing apparatus 16 may acquire an image of the laser-irradiated area, and move the sample stage 15 following the position of the liquid interface. This configuration allows for continuous measurement in the dynamic mode since the liquid interface of the analyte solution is always positioned at the laser-irradiated area.
REFERENCE SIGNS LIST
[0060] 10 Laser light source
[0061] 11 Beam splitter
[0062] 12 Object lens
[0063] 13 Spectrometer
[0064] 14 CCD detector
[0065] 15 Sample stage
[0066] 20 3D microfluidic SERS chip
[0067] 200 Photosensitive glass
[0068] 201 Femtosecond laser
[0069] 202 3D fluidic structure (channel)
[0070] 203 Metal thin film