TIME-MULTIPLEXED DUAL ATOMIC MAGNETOMETRY
20230236270 · 2023-07-27
Inventors
Cpc classification
G01R33/032
PHYSICS
International classification
Abstract
Time-multiplexed atomic magnetometry uses first and second atomic vapor cells to measure an external magnetic field. Each vapor cell operates according to a sequence of alternating pumping and probing stages. However, the sequences are temporally offset from each other such that the second vapor cell is pumped while the first vapor cell is probed, and the first vapor cell is pumped while the second vapor cell is probed. With this time-multiplexed operation, the external magnetic field can be measured without any time gaps. The Hilbert transform of the signals may be taken to obtain their instantaneous phases, which may then be interleaved to form a single gapless time sequence that represents the external magnetic field over a time window that lasts for several continuous pumping/probing stages.
Claims
1. A time-multiplexed dual atomic magnetometer, comprising: first and second vapor cells positioned such that an external magnetic field induces Larmor precession of atoms confined within the first and second vapor cells; a first polarimeter configured to measure a first polarization of a first probe beam after the first probe beam propagates through the first vapor cell; a second polarimeter configured to measure a second polarization of a second probe beam after the second probe beam propagates through the second vapor cell; and a controller configured to gate the first and second probe beams such that: the first probe beam propagates through the first vapor cell during a first measurement stage, the first measurement stage beginning when a second measurement stage ends, the second measurement stage beginning when the first measurement stage ends; the second probe beam does not propagate through the second vapor cell during the first measurement stage; the second probe beam propagates through the second vapor cell during the second measurement stage; and the first probe beam does not propagate through the first vapor cell during the second measurement stage.
2. The time-multiplexed dual atomic magnetometer of claim 1, wherein: the first measurement stage has a first duration; and the second measurement stage has a second duration that is the same as the first duration.
3. The time-multiplexed dual atomic magnetometer of claim 1, wherein: the first measurement stage has a first duration; and the second measurement stage has a second duration that is different than the first duration.
4. The time-multiplexed dual atomic magnetometer of claim 1, wherein the controller is configured to gate a first pump beam and a second pump beam such that: the first pump beam only propagates through the first vapor cell during a first pumping stage prior to the first measurement stage, the first pump beam spin-polarizing the atoms in the first vapor cell; and the second pump beam only propagates through the second vapor cell during a second pumping stage prior to the second measurement stage, the second pump beam spin-polarizing the atoms in the second vapor cell.
5. The time-multiplexed dual atomic magnetometer of claim 4, wherein: the first pumping stage has a first duration; and the second pumping stage has a second duration that is the same as the first duration.
6. The time-multiplexed dual atomic magnetometer of claim 4, wherein: the first pumping stage has a first duration; and the second pumping stage has a second duration that is different than the first duration.
7. The time-multiplexed dual atomic magnetometer of claim 1, further comprising at least one magnetic field coil configured to apply a magnetic bias field to the first and second vapor cells.
8. The time-multiplexed dual atomic magnetometer of claim 7, wherein: the first and second probe beams propagate along a common propagation direction; and the at least one magnetic field coil is positioned such that the magnetic bias field is parallel to the common propagation direction.
9. The time-multiplexed dual atomic magnetometer of claim 7, wherein: the first and second probe beams propagate along a common propagation direction; and the at least one magnetic field coil is positioned such that the magnetic bias field is perpendicular to the common propagation direction.
10. The time-multiplexed dual atomic magnetometer of claim 1, further comprising a sample cell shaped to confine a sample therein, the sample generating the external magnetic field.
11. A method for time-multiplexed dual atomic magnetometry, comprising: inducing, with an external magnetic field, Larmor precession of atoms that are confined within first and second vapor cells; measuring, with a first polarimeter, a first polarization of a first probe beam after the first probe beam propagates through the first vapor cell; measuring, with a second polarimeter, a second polarization of a second probe beam after the second probe beam propagates through the second vapor cell; and gating the first and second probe beams such that: the first probe beam propagates through the first vapor cell during a first measurement stage, the first measurement stage beginning when a second measurement stage ends, the second measurement stage beginning when the first measurement stage ends; the second probe beam does not propagate through the second vapor cell during the first measurement stage; the second probe beam propagates through the second vapor cell during the second measurement stage; and the first probe beam does not propagate through the first vapor cell during the second measurement stage.
12. The method of claim 11, wherein said gating the first and second probe beams includes gating the first and second probe beams such the first measurement stage has a first duration and the second measurement stage has a second duration that is the same as the first duration.
13. The method of claim 11, wherein said gating the first and second probe beams includes gating the first and second probe beams such that the first measurement stage has a first duration and the second measurement stage has a second duration that is different than the first duration.
14. The method of claim 11, further comprising gating a first pump beam and a second pump beam such that: the first pump beam only propagates through the first vapor cell during a first pumping stage prior to the first measurement stage, the first pump beam spin-polarizing the atoms in the first vapor cell; and the second pump beam only propagates through the second vapor cell during a second pumping stage prior to the second measurement stage, the second pump beam spin-polarizing the atoms in the second vapor cell.
15. The method of claim 14, wherein said gating the first and second pump beams includes gating the first and second pump beams such that the first pumping stage has a first duration and the second pumping stage has a second duration that is the same as the first duration.
16. The method of claim 14, wherein said gating the first and second pump beams includes gating the first and second pump beams such that the first pumping stage has a first duration and the second pumping stage has a second duration that is different than the first duration.
17. The method of claim 11, further comprising applying a magnetic bias field to the first and second vapor cells.
18. The method of claim 17, wherein said applying includes applying the magnetic bias field such that a direction of the magnetic bias field is parallel to a common propagation direction of the first and second probe beams.
19. The method of claim 17, wherein said applying includes applying the magnetic bias field such that a direction of the magnetic bias field is perpendicular to a common propagation direction of the first and second probe beams.
20. The method of claim 11, further comprising placing a sample cell adjacent to the first and second vapor cells, the sample cell containing a sample that generates the external magnetic field.
Description
BRIEF DESCRIPTION OF THE DRAWINGS
[0014]
[0015]
[0016]
[0017]
[0018]
[0019]
[0020]
[0021]
DETAILED DESCRIPTION
[0022]
[0023] Similarly, a second pump beam (e.g., see second pump beam 640(2) in
[0024] The polarization of the first probe beam 130(1) oscillates at an instantaneous Larmor frequency ƒ.sub.L(t), assuming that magnetic field gradients are negligible (i.e., the atoms in the first atomic vapor 106(1) interacting with the first probe beam 130(1) are subjected to the same magnetic field). The instantaneous Larmor frequency ƒ.sub.L(t) depends on the scalar magnitude of the magnetic field, which has two components: a time-varying signal field
rising from the sample 110, and a constant (i.e., time-independent) bias field
. Thus, the instantaneous Larmor frequency ƒ.sub.L(t) can be represented mathematically as ƒ.sub.L(t) = γ|
for which
However, the bias field
[0025]
[0026] In some embodiments, the signal processor 144 also serves as a controller that outputs one or more timing signals 146 that control when the first and second pump beams and the first and second probe beams 130(1), 130(2) pass through the vapor cells 104(1) and 104(2). For example, the timing signals 146 may be used to gate (i.e., turn on and off) each of the pump beams and probe beams 130(1), 130(2) by driving a corresponding acousto-optic modulator, electro-optic modulator, or mechanical shutter. The timing signals 146 may also be used to change the frequency of one or more of the pump beams and the probe beams 130(1), 130(2). In other embodiments, a controller separate from the signal processor 144 implements timing control of the first and second pump beams and the first and second probe beams 130(1), 130(2).
[0027]
[0028] The first timing sequence 300(1) is formed from a first repeating frame 302(1) that has: (i) a first pumping stage 304(1) with a first pumping duration
(ii) a first measurement stage 306(1) with a first measurement duration
and (iii) a first dead stage 308(1) with a first dead-time duration
During the first pumping stage 304(1), the first probe beam 130(1) is blocked while the first pump beam spin-polarizes the first atomic vapor 106(1). During the first measurement stage 306(1), the first pump beam is blocked while the first probe beam 130(1) propagates through the first atomic vapor 106(1). The first polarimeter 140(1) measures the polarization of the first probe beam 130(1) to obtain a first data block 340(1) of the first polarization signal 142(1). During the first dead stage 308(1), no first polarization signal 142(1) is obtained (e.g., both the first probe beam 130(1) and the first pump beam are blocked, or the output of the first polarimeter 140(1) is ignored). The first timing sequence 300(1) is therefore periodic with a first period
and has a measurement duty cycle
[0029] The second timing sequence 300(2) is similar to the first timing sequence 300(1) except that it is delayed with respect to the first timing sequence 300(1) by a second dead-time duration
of a second dead stage 308(2). Specifically, the second timing sequence 300(2) is formed from a second repeating frame 302(2) that has: (i) a second pumping stage 304(2) with a second pumping duration
(ii) a second measurement stage 306(2) with a second measurement duration
and (iii) the second dead stage 308(2). During the second measurement stage 306(2), the first polarimeter 140(2) measures the polarization of the second probe beam 130(2) to obtain a second data block 340(2) of the second polarization signal 142(2). The second timing sequence 300(2) therefore is periodic with a second period
and has a measurement duty cycle =
[0030] The duration
is selected such that the second pumping stage 304(2) ends when the first measurement stage 306(1) ends. This allows the second measurement stage 306(2) to begin immediately when the first measurement stage 306(1) ends, eliminating any gap between the data blocks 340(1) and 340(2). Similarly, the duration
is selected such that the first pumping stage 304(1) ends when the second measurement stage 306(2) ends. This allows the first measurement stage 306(1) to resume immediately when the second measurement stage 306(2) ends, eliminating any gap between the second data block 340(2) and a subsequent third data block 340(3).
[0031] The polarization signal 142 within each data block 340 approximates an exponentially-decaying sine wave at the instantaneous Larmor frequency. The time constant of the exponential decay is determined by transverse spin relaxation of the atoms in the vapors 106. The vapor cells 104 may be filled with a buffer gas (e.g., N.sub.2 or .sup.4He) and/or lined with an anti-relaxation coating (e.g., paraffin) to reduce spin relaxation and increase the time constant. Dephasing times T.sub.2 are typically between a fraction of a millisecond and several tens of milliseconds, depending on the geometry and size of the vapor cells 104, the pressures of the vapors 106 and buffer gas (when included), the choice of atomic species for the vapors 106 (e.g., Rb, Cs, K, Na, etc.), the choice of species for the buffer gas (when included), the type of anti-relaxation coating (when included), etc. The dephasing time T.sub.2 is the primary determinant of the measurement durations
as the signal-to-noise ratio decays with T.sub.2.
[0032] If general, the first and second measurement durations
do not need to be equal. Similarly, the first and second pumping durations
do not need to be equal. In some embodiments, the first and second measurement durations
are equal, as shown in
are all similar. In some embodiments, the first and second pumping durations
are similar.
[0033]
is obtained mathematically as the argument of an analytic phase
:
where φ.sup.(i)(t) is the measured polarization angle of the data block 340(i), and H{} indicates a Hilbert transform. In
after unwrapping. The derivative of the instantaneous phase
after unwrapping, gives the instantaneous Larmor frequency for the data block 340(i):
The magnetic field sensed by the atoms in the vapor 106 during the data block 340(i) is directly proportional to the instantaneous Larmor frequency
as described previously.
[0034] In some embodiments, and as shown in
of each instantaneous-phase block 440(i) is fit to a straight line (e.g., via linear regression) to obtain a corresponding slope m.sub.i that represents the average value of
(i.e., the average Larmor frequency) over the measurement duration
of the corresponding data block 340(i). Dividing m.sub.i by the gyromagnetic ratio γ gives a single corresponding magnetic-field value B.sub.i. A sequence of several consecutive magnetic-field values {B.sub.i} can then be used to identify changes in the magnetic field between data blocks 340(i). For example, the Fourier transform of the sequence {B.sub.i} can be calculated to identify components of
[0035] In some embodiments, and as shown in
of the phase block 440(i). For example, when each phase block 440(i) is represented as a temporal phase sequence of N instantaneous-phase values Φ.sup.(i) = {ϕ.sub.1, ϕ.sub.2, ...,ϕ.sub.N} equally spaced in time by a point spacing Δt, then the corresponding frequency block 540(i) can be represented as a temporal frequency sequence of N – 2 values F.sup.(i) = {ƒ.sub.j = (ϕ.sub.j+1 - ϕ.sub.j-1/(2Δt)} for j = 2 to N – 1. Other methods of numerical differentiation may be used to calculate the temporal frequency sequence from the temporal phase sequence (e.g., the method of finite difference coefficients) without departing from the scope hereof. Such methods may also be used to obtain frequencies points corresponding to ϕ.sub.1 and ϕ.sub.N such that the frequency sequence F.sup.(i) and the phase sequence Φ.sup.(i) have the same number of points, and the points are aligned in time.
[0036] As shown in
[0037] In other embodiments, the instantaneous-phase blocks 440(i) are concatenated together to form the single gapless temporal sequence 502. The time derivative of the temporal sequence 502 may then be calculated, after which each point is divided by the gyromagnetic ratio y to obtain the magnetic-field sequence {B.sub.j}. In these embodiments, concatenating before the time derivative may improve estimates of the instantaneous frequency at the boundaries of the phase blocks 440(i).
[0038] In the example of
along the propagation direction of the probe beams 130(1), 130(2). The vapor cells 104(1), 104(2) and sample 110 are located along an axis of the solenoid 114 where the homogeneity of the bias field
may be alternatively generated with one or other magnetic coils, such as a pair of Helmholtz coils. Furthermore, one or more layers of magnetic shielding 112 may surround the solenoid 114 (or other magnetic coils), the sample cell 102, and the vapor cells 104 to block external magnetic fields.
[0039] The instantaneous Larmor precession frequency ƒ.sub.I(t) is given mathematically by
For
Eqn. 3 simplifies to
where the Taylor expansion in Eqn. 4 assumes
Eqn. 4 shows that ƒ.sub.L(t) approximately equals the nominal Larmor frequency
but is modulated primarily (i.e., to first order) by the z-component
of the signal field
only modulate the instantaneous Larmor frequency ƒ.sub.L(t) to second order in the Taylor expansion, and are therefore suppressed relative to
Accordingly, the setup shown in
of the signal field
[0040]
The instantaneous Larmor precession frequency ƒ.sub.I(t) is given mathematically by
Now,
only modulate the instantaneous Larmor frequency ƒ.sub.L(t) to second order in the Taylor expansion, and are therefore suppressed relative to
Accordingly, the setup shown in
of the signal field
only modulate the instantaneous Larmor frequency ƒ.sub.L(t) to second order, and are therefore suppressed. Thus, the dual atomic magnetometer 100 can be used to preferentially measure a component of the signal field
[0041]
[0042]
[0043] Optical pumping of the vapors 106(1) and 106(2) may be implemented using a technique known in the art. For example, when the bias field
[0044] In some embodiments, more than two vapor cells 104 are placed around the sample cell 102. For example, in the dual atomic magnetometer 100 shown in
[0045] Some embodiments include only the signal processor 144, wherein all other components (e.g., the vapor cells 104(1) and 104(2), the sample cell 102, the polarimeters 140(1) and 140(2), etc.) are provided by a third party. Other embodiments exclude the signal processor, 144, which is provided by a third party.
[0046] Changes may be made in the above methods and systems without departing from the scope hereof. It should thus be noted that the matter contained in the above description or shown in the accompanying drawings should be interpreted as illustrative and not in a limiting sense. The following claims are intended to cover all generic and specific features described herein, as well as all statements of the scope of the present method and system, which, as a matter of language, might be said to fall therebetween.