ION GUIDE WITHIN PULSED CONVERTERS
20200168447 ยท 2020-05-28
Inventors
Cpc classification
H01J49/403
ELECTRICITY
H01J49/0036
ELECTRICITY
H01J49/025
ELECTRICITY
H01J49/408
ELECTRICITY
H01J49/405
ELECTRICITY
H01J49/401
ELECTRICITY
International classification
H01J49/42
ELECTRICITY
Abstract
Elongation of orthogonal accelerators is assisted by ion spatial transverse confinement within novel confinement means, formed by spatial alternation of electrostatic quadrupolar field (22). Contrary to prior art RF confinement means, the static means provide mass independent confinement and may be readily switched. Spatial confinement defines ion beam (29) position, prevents surfaces charging, assists forming wedge and bend fields, and allows axial fields in the region of pulsed ion extraction, this way improving the ion beam admission at higher energies and the spatial focusing of ion packets in multi- reflecting, multi-turn and singly reflecting TOF MS or electrostatic traps.
Claims
1. A pulsed ion accelerator for a mass spectrometer comprising: an ion guide portion having electrodes arranged to receive ions travelling along a first direction (Z-dimension), including a plurality of DC electrodes spaced along the first direction; DC voltage supplies configured to apply different DC potentials to different ones of said DC electrodes such that when ions travel through the ion guide portion along the first direction they experience an ion confining force, generated by the DC potentials, in at least one dimension (X- or Y-dimension) orthogonal to the first direction; and a pulsed voltage supply configured to apply a pulsed voltage to at least one electrode for pulsing ions in a second direction (X-dimension) substantially orthogonal to the first direction (Z-dimension).
2. The pulsed ion accelerator of claim 1, wherein the ion guide portion comprises a first pair of opposing rows of said DC electrodes on opposing sides of the ion guide portion, wherein each row extends in the first direction (Z-dimension), and wherein: (i) the rows are spaced apart in a third direction (Y-dimension) that is orthogonal to the first and second directions by a gap; and/or (ii) the DC voltage supplies are configured to maintain at least some of the adjacent DC electrodes in each row at potentials having opposite polarities.
3. The pulsed ion accelerator of claim 2, wherein the ion guide portion comprises a second pair of opposing rows of said DC electrodes on opposing sides of the ion guide portion, wherein each row extends in the first direction (Z-dimension), and wherein the DC voltage supplies are configured to maintain at least some of the adjacent DC electrodes in each row at potentials having opposite polarities.
4. The pulsed ion accelerator of any preceding claim, wherein the DC voltage supplies are configured to maintain the DC electrodes at potentials so as to form an electrostatic quadrupolar field in the plane orthogonal to the first direction, wherein the polarity of the quadrupolar field alternates as a function of distance along the first direction.
5. The pulsed ion accelerator of any preceding claim, wherein the DC electrodes are arranged to form a quadrupole ion guide that is axially segmented in the first direction, and wherein the DC voltage supplies are configured to maintain DC electrodes that are axially adjacent in the first direction at opposite polarities, and DC electrodes that are adjacent in a direction orthogonal to the first direction at opposite polarities.
6. The pulsed ion accelerator of any preceding claim, wherein the DC electrodes are arranged on one or more printed circuit board (PCB), insulating substrate, or insulating film.
7. The pulsed ion accelerator of any preceding claim, wherein the DC voltage supplies are configured to apply different DC voltages to the DC electrodes so as to form a voltage gradient in the first direction that increases the ion confining force as a function of distance in the first direction.
8. The pulsed ion accelerator of any preceding claim, wherein the DC electrodes are arranged in rows that are spaced apart in at least one dimension orthogonal to the first direction for confining the ions between the rows, and wherein the DC electrodes are spaced apart in said at least one dimension by an amount that decreases as a function of distance in the first direction.
9. The pulsed ion accelerator of any preceding claim, configured to control the DC voltage supplies to switch off at least some of said DC potentials applied to the DC electrodes and then subsequently control the pulsed voltage supply to apply the pulsed voltage for pulsing ions out of the ion accelerator; and/or wherein the pulsed ion accelerator is configured to control the DC voltage supplies to progressively reduce the amplitudes of the DC potentials applied to the DC electrodes with time, and then subsequently control the pulsed voltage supply to apply the pulsed voltage for pulsing ions out of the ion accelerator.
10. The pulsed ion accelerator of any preceding claim, comprising electrodes spaced apart in the second direction (X-dimension) on opposite sides of the ion guide portion; wherein these electrodes are spaced apart in said second direction (X-dimension) by an amount that decreases as a function of distance in the first direction.
11. The pulsed ion accelerator of any preceding claim, comprising electrodes spaced apart in the second direction (X-dimension) on opposite sides of the ion guide portion; and wherein the average DC potential of said DC potentials is negative relative to said electrodes spaced apart in the second direction so as to form a quadrupolar field that compresses the ions in the second direction (X-dimension).
12. A mass spectrometer comprising: a time-of-flight mass analyser or electrostatic ion trap having the pulsed ion accelerator of any preceding claim, and electrodes arranged and configured to reflect or turn ions.
13. The mass spectrometer of claim 12 comprising: a multi-pass time-of-flight mass analyser or electrostatic ion trap having the pulsed ion accelerator of any one of claims 1-11, and electrodes arranged and configured so as to provide an ion drift region that is elongated in a drift direction (z-dimension) and to reflect or turn ions multiple times in an oscillating dimension (x-dimension) that is orthogonal to the drift direction.
14. The spectrometer of claim 13, wherein the drift direction (z-dimension) corresponds to said first direction and/or wherein the oscillating dimension (x-dimension) corresponds to said second direction; or wherein said first direction is tilted at an acute angle to the drift direction (z-dimension).
15. The spectrometer of claim 13 or 14, configured to pulse the ion packets so as to be displaced in the dimension (Y-dimension) orthogonal to the drift direction (Z-dimension) and the oscillating dimension (X-dimension).
16. The spectrometer of claim 13, 14 or 15, wherein: (i) the multi-pass time-of-flight mass analyser is a multi-reflecting time of flight mass analyser having two ion mirrors that are elongated in the drift direction (z-dimension) and configured to reflect ions multiple times in the oscillation dimension (x-dimension), wherein the pulsed ion accelerator is arranged to receive ions and accelerate them into one of the ion mirrors; or (ii) the multi-pass time-of-flight mass analyser is a multi-turn time of flight mass analyser having at least two electric sectors configured to turn ions multiple times in the oscillation dimension (x-dimension), wherein the pulsed ion accelerator is arranged to receive ions and accelerate them into one of the sectors.
17. The spectrometer of any one of claims 13-16, comprising an ion deflector located downstream of said pulsed ion accelerator, and that is configured to back-steer the average ion trajectory of the ions, in the drift direction, thereby tilting the angle of the time front of the ions received by the ion deflector.
18. The spectrometer of any one of claims 13-17, comprising an ion source and a lens system between the ion source and pulsed ion accelerator for telescopically expanding the ion beam from the ion source.
19. The spectrometer of any one of claims 13-18, comprising an ion source in a first vacuum chamber and the pulsed ion accelerator in a second vacuum chamber, wherein the vacuum chambers are separated by a wall and are configured to be differentially pumped, and wherein the ion guide portion protrudes from the second vacuum chamber through an aperture in the wall and into the first vacuum chamber
20. A method of mass spectrometry comprising: providing a pulsed ion accelerator or mass spectrometer as claimed in any preceding claim; receiving ions in said ion guide portion of the pulsed ion accelerator; applying different DC potentials to different ones of said DC electrodes such ions travelling through the ion guide portion along said first direction experience an ion confining force in at least one dimension (X- or Y-dimension) orthogonal to the first direction; and then applying a pulsed voltage to at least one of the electrodes of the pulsed ion accelerator so as to pulse ions out of the ion accelerator in the second direction (X-dimension).
21. A method of mass spectrometric analysis within an isochronous electrostatic field, comprising the following step: (a) forming electrostatic quadrupolar field in the XY-plane, which is spatially alternated along the orthogonal Z-direction; (b) passing an ion beam along the Z-direction; (b) pulsed accelerating of the moving ions in the X-direction, thus forming ion packets;
22. The method as in claim 21, further comprising a step of forming a constant per Z-direction quadrupolar electrostatic field in said XY-plane to produce an additional ion beam confinement in the X-direction.
23. The method as in claim 21 or 22, at the step of pulsed orthogonal acceleration in the X-direction, further comprising a step of switching off of said quadrupolar confining fields to a different field being uniform in the Z-direction for minimizing time, and/or angular aberrations, and/or energy spread of said extracted ion packets.
24. The method as in claims 21 to 23, further comprising a step of arranging adiabatic conditions at ion beam entrance and the ion packet exit into and from said quadrupolar fields comprising at least one step of the group: (i) arranging spatial gradual in space rise of said quadrupolar confining field; and (ii) arranging gradual in time switching of said quadrupolar field; wherein gradual means that the moving ions sense the quadrupolar field rise and fall within several cycles of the quadrupolar field alternations.
25. The methods as in claims 21 to 24, wherein said Z-axis is generally curved.
26. The methods as in claims 21 to 25, wherein said quadrupolar confining field is arranged to protrude through walls separating differentially pumped stages of an ion source generating said ion beam.
27. The method as in claims 21 to 26, wherein said fields of isochronous electrostatic analyzer comprise either isochronous fields of gridless ion mirrors or isochronous fields of electrostatic sectors; and wherein said fields are arranged for either time-of-flight analysis or for ion trapping with measuring frequency of their oscillations within said isochronous electrostatic fields.
28. The method as in claims 27, wherein said field of electrostatic analyzer is two-dimensional and substantially extended along a tilted Z-axis; wherein axes Z and Z are arranged as mall angle for isochronous steering of ion packets; wherein said steering angles are adjusted for aligning the ion packets time front with the axis Z.
29. The method as in claim 27 or 28, further comprising a step of ion packet spatial focusing in the Z-direction past said step of ion pulsed ejection; wherein said spatial focusing comprises one step of the group: (i) spatial focusing or steering by a field of trans-axial lens/wedge, complimented with curved electrodes in the pulsed extraction region; (ii) spatial focusing and/or steering by multiple segments of deflecting fields, forming a Fresnel lens/deflector; (iii) by arranging a negative spatial-temporal correlation of ion beam within said ion storage gap at ion beam injection into said storage gap; (iv) by arranging a Z-dependent deceleration of ion beam within said ion guide.
30. The method as in claims 27 to 29, past said accelerator, further comprising a step of pulsed displacing of said ion packets in the Y-direction to bring said ion packets onto an isochronous surface of mean ion trajectory within said fields of isochronous electrostatic analyzers.
31. The method as in claim 30, wherein the timing and the duration of said pulsed ion packet displacement in the Y-direction is arranged for reducing the mass range of the ion packet and wherein the period of said pulsed acceleration is arranged shorter compared to flight time of the heaviest ion species in said isochronous analyzer.
32. A mass spectrometer, comprising: (a) An ion source, generating an ion beam along a first drift Z-direction at some initial energy; (b) An orthogonal accelerator, admitting said ion beam into a storage gap, pulsed accelerating a portion of said ion beam in the second orthogonal X-direction, thus forming ion packets with a smaller velocity component in the Z-direction and with the major velocity component in the X-direction; (c) An electrostatic multi-pass (multi-reflecting or multi-turn) mass analyzer, built of ion mirrors or electrostatic sectors, substantially elongated in said Z-direction to form an electrostatic field in an XY-plane orthogonal to said Z-direction; said two-dimensional field provides for a field-free ion drift in the Z-direction towards a detector, and for an isochronous repetitive multi-pass ion motion within an isochronous mean ion trajectory surfaceeither symmetry s-XY plane of said ion mirrors or curved s-surface of electrostatic sectors; (d) within said storage gap of said orthogonal accelerator, an ion guide composed of electrodes, symmetrically surrounding said ion beam; said electrodes are energized by at least two distinct DC potentials to form an electrostatic quadrupolar field in the XY-plane, which is spatially alternated along the Z-direction;
33. The spectrometer as in claims 32, wherein said Z-axis is generally curved.
34. The spectrometer as in claim 32 or 33, wherein said ion guide is arranged extended beyond said storage gap of said orthogonal accelerator.
35. The spectrometer as in claims 32 to 34, wherein said ion guide is arranged to protrude through walls of differentially pumped stages.
36. The spectrometer as in claims 32 to 35, wherein said isochronous electrostatic analyzer comprise either isochronous gridless ion mirrors or isochronous electrostatic sectors; and wherein said fields are arranged for either time-of-flight analysis or for ion trapping with measuring frequency of their oscillations within said isochronous electrostatic fields.
37. The spectrometer as in claims 32 to 36, wherein said electrostatic analyzer forms two-dimensional fields substantially extended along a Z-axis; wherein axes Z and Z are arranged at mall angle for isochronous steering of ion packets; wherein said steering angles are adjusted for aligning the ion packets time front with the axis Z.
38. The spectrometer as in claims 32 to 37, past said orthogonal accelerator, further comprising one means for ion packet spatial focusing in the Z-direction; wherein said spatial focusing comprises one means of the group: (i) a trans-axial lens/wedge, complimented with curved electrodes in the pulsed extraction region; (ii) a Fresnel lens/deflector; (iii) pulsed or time variable signals applied upstream of said orthogonal accelerator for arranging a negative spatial-temporal correlation of ion beam within said ion storage gap; (iv) a Z-dependent voltage gradient within said guide for deceleration of said ion beam.
39. The spectrometer as in claims 32 and 38, further comprising at least a pair of deflectors or sectors, placed immediately after said orthogonal accelerator for pulsed displacing of said ion packets in the Y-direction to bring said ion packets onto an isochronous surface of mean ion trajectory.
Description
BRIEF DESCRIPTION OF THE DRAWINGS
[0123] Various embodiments will now be described, by way of example only, and with reference to the accompanying drawings in which:
[0124]
[0125]
[0126]
[0127]
[0128]
[0129]
[0130]
DETAILED DESCRIPTION
[0131] Referring to
[0132] Continuous ion beam 11 propagates along the Z-axis and enters the space between push P and mesh G electrodes. Within this space, confining electric field 12 is arranged with the aid of auxiliary electrodes 13, connected to some electric signal U, either RF (in device 15) or DC (in device 17). Periodic pulses are applied to electrodes P and N to extract ion packets 14 out of continuous beam 11 for injection into a TOF MS mass analyser.
[0133] OA 15 of prior art U.S. Pat. Nos. _5,763,878 or U.S. Pat. No. 8,373,120, proposes the spatial confinement of the ion beam 11 by radiofrequency RF radial field 16, generated by applying an RF signal to side electrodes 13. Optionally, the RF field is switched off before ion extraction pulses are applied (to P and N). Both the effective potential well of the RF field and the micro-oscillations of the ions depend on ion mass to charge ratio m/z=. Parameters of the ion beam 11 and of pulsed ion packets 14 depend on , on the RF phase at switching off, and on the time delay to pulses. In addition, OA 15 has two major drawbacks: (a) the RF field limits the transmitted mass range and (b) the extraction pulses induce strong oscillations onto resonant RF generators, thus impeding transmission, resolution and mass accuracy of TOF MS.
[0134] OA 17, proposed in RU2013149761 employs a rectilinear electrostatic quadrupolar field 18, formed by applying a negative DC potential to electrodes 13. A weak electrostatic quadrupolar field focuses and confines the ion beam in the critical TOF X-direction (towards the ion mirror), while defocusing the ion beam in the non-critical transverse Y-direction. The method allows moderate elongation of ion packets 14, estimated to a length in the z-direction of about L.sub.Z50 mm. Longer OAs suffer strong ion losses in the Y-direction.
[0135] Referring to
[0136] In operation, downstream of ion source 27, lens system 28 may expand the ion beam telescopically and form a nearly parallel ion beam 21 along the Z-axis. The telescopic expansion is preferably used to optimize so-called phase balancing of the ion beam 21 within ion guide 23, where initial angular divergence and width of the ion beam 21 provide for about equal impact onto thickness of the confined ion beam 29.
[0137] Ion beam 21 enters the P-N gap and becomes spatially confined in the region 22 by a set of alternating electrodes with distinct DC voltages DC1 and DC2, generating a spatially alternating quadrupolar DC field E(X,Y), approximated at the field axis by a transverse field distribution:
E(X,Y)=E.sub.0*(XY)/R*sin(2Z/H) (Eq.1)
[0138] where E, Y and Z are the dimensions of the ion guide; H is spatial period of quadrupolar field alternation, and R is the characteristic field radius.
[0139] For ions having mass to charge ratio =m/z at specific axial (along Z-axis) energy U.sub.Z, the axial velocity is V.sub.Z=(2U.sub.Z/).sup.0.5. The spatial alternation of the quadrupolar DC field is sensed by ions moving through the DC field as if a periodic RF signal was being applied, which is known to radially confine ions to the field axis. The frequency of the sensed RF field F=H/V.sub.Z is inversely proportional to .sub.0.5. Then the effective potential well D(r) of the sensed RF field depends on the ion radial position r (where r.sup.2=X.sup.2+Y.sup.2). It is important to note that D(r) is independent of the ion mass to charge ratio :
D(r)=E.sub.0.sup.2 *(r.sup.2/R.sup.2)/(2F).sup.2=[E.sub.0.sup.2H.sup.2/2U.sub.Z]*(r.sup.2/R.sup.2) (Eq. 2)
[For reference: D(r)=E.sub.0.sup.2*(r.sup.2/R.sup.2)/(2F).sup.2=E.sub.0.sup.2*(r.sup.2/R.sup.2)/V.sub.Z.sup.2(2/H).sup.2]
[0140] Thus, the novel electrostatic ion guide equally confines ions of all mass to charge ratios , e.g. assuming they have similar axial and radial energies.
[0141] The alternating quadrupolar field indefinitely (per Z) confines ion beam 29 in both transverse directions (i.e. X and Y directions), producing a spatially tight ion beam within substantially elongated orthogonal accelerators or other pulsed converters. Electrical pulses may be applied to electrodes P and N to convert the continuous ion beam 29 into pulsed ion packets 24 by orthogonal pulsed extraction. Preferably, voltages DC1 and DC2 are switched to zero or to different setting U1 and U2 at the time of the pulsed ion ejection so as to improve the electric field distribution at ion ejection.
[0142] The novel electrostatic quadrupolar ion guide 23 provides for indefinite ion beam confinement. Relative to the RF confinement of prior art device 15 (see
[0143] Referring to
[0144] In operation, as best seen in 3D view 31, electrodes 34 and 35 form a local quadrupolar electrostatic field 22 in every XY-cross section. The polarity of the quadrupolar field changes when shifting in the Z-direction. Ion beam 21 at specific mean energy U.sub.Z may be formed in an ion source 27, and may be shaped by lens 28. Ion beam 21 enters quadrupolar field 22 along the Z-axis. From this point the ion beam is denoted by number 29. Because of the periodically spatially alternating DC quadrupolar field, ions moving along the Z-axis sense a quadrupolar field that periodically changes with time, which is known to provide radial ion confinement towards the field axis (in a similar manner to an RF field acting on a static ion). The ion beam stays spatially confined in the x-y plane at limited angular divergence, without limits on the Z-length. The beam 29 is refocused multiple times by the quadratic field, eventually mixing ions within a limited phase space.
[0145] Preferably, lens 28 reshapes the phase space of the ion beam 21 entering the ion guide 23 for optimal balance between width and divergence of the confined ion beam 29. Preferably, the average potential (DC1+DC2)/2 is slightly negative relative to P and N electrodes to form a combination of the alternating quadrupolar field 22 with a constant per Z quadrupolar field, thus providing stronger compression of the ion beam 29 in the X-direction Vs Y-direction.
[0146] Embodiment 30 is further improved by arranging so-called adiabatic entrance 36 and adiabatic exit 37 conditions for ion beam 29.
[0147] For adiabatic entrance 36, there is arranged a smooth spatial rise of quadrupolar DC field, spread for at least 2-3 spatial periods of the DC field alternation. The smooth rise of the quadrupolar field may be arranged either by the illustrated Y-spreading of ion guide 23 electrodes, and/or by narrowing of the storage gap between electrodes N and P in the X-direction, and/or by arranging a gradient of DC voltages in the Z-direction, e.g. by resistive dividers.
[0148] Ions staying on axis of the guide 23 experience zero transverse field and have zero micro-motion, however, radially distant ions do not. For adiabatic exit 37 of radially distant ions at pulsed extraction of ion packets, embodiments of the invention initially maintain the DC1 and DC2 amplitudes constant and then switch the amplitudes to gradually decrease with time, e.g. as shown for DC1 in graph 37. The switching time may correspond to the time after the ion has passed through several DC alternations of the ion guide 23, as shown in plot 37 by time variation 38 of sensed quadrupolar field for some probe ion. This adiabatic switching reduces the energy of micro-motion of the ions within the confined ion beam 29 before pulsed ejection.
[0149] Referring to
[0150] One particular embodiment 40 of the static quadrupolar guide 23 comprises a set of four parallel-aligned printed circuit boards (PCB) 47. Conductive pads on each board 47 form a row of alternated electrodes 34 and 35, distinct in the drawing by color coding as described above. Two DC potentials are interconnected with the conductive pads through displaced PCB vias, DC1 to electrodes 35 and DC2 to electrodes 34. Each side (in the Y-direction) of ion guide 40 is formed by a pair of boards 47, separated by an insulating plate, which is preferably also a PCB. Alternatively, the pair may be arranged within a single thick multilayer PCB for better precision. Since boards 47 are set distant from spatially confined ion beam 29, only limited care shall be used to shield insulating surfaces from stray ions. Since DC1 and DC2 potentials are expected to be in the range of several tens of Volts, the insulating ridges may be thin. Still, edge slots and edge conductive coatings are preferred for the ion guide robustness against the charging by stray ions.
[0151] Another particular embodiment 41 employs conductive electrodes 34 and 35 attached to both sides of a single PCB support 47. This is equivalent to one pair of boards 47 shown in embodiment 40. Another PCB support 47 with conductive electrodes 34 and 35 attached to both sides thereof would be required to form the ion guide 23 according to embodiment 41.
[0152] Yet another particular embodiment 42 comprises a row of alternating electrodes 34 and 35 constructed of two thin electrode plates that are spaced apart by a thin insulator such as a film, say, PTFE or Kapton film. Extending electrode ribs appear mutually displaced in the X-direction by the thickness of the insulator, which is expected to generate only minor Z-modulation of the quadrupolar field on the beam 29 axis. This is equivalent to one pair of boards 47 shown in embodiment 40. Another corresponding structure would be required to form the ion guide 23 according to embodiment 42.
[0153] Ion guides 42-44 are preferred for their compatibility with heating to approximately 150-200 C. for robust operation of the guide, for preventing built-up of insulating coatings or deposition of droplets from ESI sources.
[0154] Yet another particular embodiment 43 comprises machined (say by EDM) electrodes with bent extending electrode ribs. Optionally, ribs may be slightly bent in embodiment 42 as well.
[0155] Yet another particular embodiment 44 may have a curved Z axis, e.g. for reducing gas flux, for removal of charged droplets from ESI ion source, for removal of light and metastable particles from EI source, or for convenience of instrumental packaging. Initially turned electrodes may be machined by EDM.
[0156] Again referring to
[0157] Again referring to
[0158] Referring to
[0159] In operation, ion beam 21 is generated by source 27, formed by ion optics 28, and entering OA 51 along the Z-direction. Ion beam is transverse confined with guide 51, as described in
[0160] Downstream of OA 51, elongated ion packets 58 are pulsed displaced in the Y direction by deflectors 54 and 55, thus bypassing the Y-displaced OA 52 and returning to the axis of ion mirrors M (best seen in the X-Y plane view). Ions are reflected between ion mirrors M in the X-direction within the s-XZ symmetry plane while drifting towards the detector 59 in the z-direction. Since ion packets are focused by trans-axial lens 53 in the Z-direction, they reach the face of detector 59 without hitting the rims of the detector. The duty cycle of the OA-MPTOF 50 may be improved, e.g. to above 50% from the several percent in conventional MPTOFs. The method becomes possible because of ion beam spatial confinement within the OA by the novel quadrupolar electrostatic ion guides. While embodiment 50 depicts multi-reflecting TOF MS (MR TOF), similar improvements are applicable to sector multi-turn TOF MS (MT TOF) and to singly reflecting TOF MS. The injection scheme of circular embodiment 50C may be useful for ion injection into cylindrical electrostatic traps.
[0161] Referring to
[0162] The figures show iso-potential lines and ion trajectories. According to simulations, the trans-axial lens 53 serves for: (a) terminating the electrostatic DC accelerating field; (b) providing for ion spatial focusing in the XZ-plane to focal plane f2, in all cases simulated for F=5 m focal distance; and (c) providing substantial parallel beam in the XY-plane. Graph 63 shows time spreads introduced by spatial ion Z-focusing, simulated for 1000 amu ions. The trans-axial lens 53 alone in the embodiment 60 introduces positive T|ZZ aberration with additional time spread dT(z)=T|ZZ*z.sup.2. The long focal distance F=5 m helps keeping the aberration moderate and allows focusing L.sub.Z=20 mm long ion packets at dT(z)=0.3 ns amplitude.
[0163] Use of curved extraction field 64 in the embodiment 61 allows reverting the sign of the overall T|ZZ aberration, which may be further optimized for complete mutual compensation of T|ZZ aberrations. Without describing exhaustive details of ion optical simulation, the novel quadrupolar electrostatic ion guide 23 was found an important part of the Z-focusing trans-axial system: it retains the ion beam at limited width and diameter; it controls initial starting position at acceleration; it helps forming a T|ZZ compensating curvature of extracting pulsed field; it helps forming spatially focusing in Y-directions, while eliminating multiple time per Y aberrations.
[0164] Referring to
[0165] Within ion packets 58, ions retain the V.sub.Z velocity of ion beam in the z-direction. If forming a negative correlation between V.sub.Z and z-coordinate in guide 51, ion packets 58 would be naturally focused onto detector 59.
[0166] Focusing condition 71 for a narrow range of mass to charge ratios =m/z may be achieved by pulsing of ion source or transfer optics, where V.sub.Z(z) is the ion axial velocity in guide 51, V.sub.Z0=V.sub.Z(z=0), and D.sub.Z is the OA-detector distance:
V.sub.Z(z)/V.sub.Z0=1z/D.sub.z@=m/z (eq. 3)
[0167] For this purpose, the embodiment 70 may comprise one of the following means: an RF ion guide 73 with optional auxiliary electrodes 74 and an exit gate 75; a pulse generator; a time dependent U(t) signal generator.
[0168] In one method, an ion extracting pulse is applied to gate 75. The extracting pulse is known to generate an ion bunch with an energy spread in spite of gaseous dampening at about 10 mTorr gas pressures. Deeper starting ions will arrive to the OA 52 at later time, appear at smaller z within the guide 51, but will have larger V.sub.Z. This produces ion packet compression 71 (eq. 3) at the detector 59. Though the method looks similar to the known Pulsar method, here ions are Z-compressed at the D.sub.Z distance of detector 59, rather than at the OA center of conventional TOF instruments. Note that the correlation 71(eq. 3) occurs for narrow range only, controlled by the time delay between extraction and OA pulses. The embodiment is attractive for target analysis, where a narrow mass range is selected intentionally, while TOF data may be acquired at maximal OA frequency and at maximal dynamic range of the MRTOF detector.
[0169] In another method, to arrange the correlation 71 (eq. 3), either ion guide 73 and/or extraction electrode 75 and/or lens 28 are arranged into an elevator system, whose reference potential is time variable U(t). The effect of the time variable elevator is very similar to the above described bunching effect, though the elevator exit may be set closer to the OA entrance and may allow somewhat wider range. In both above methods, a nearly unity duty cycle of OA is expected for narrow range, thanks to the novel confinement means 51, permitting substantial OA elongation.
[0170] Yet in another method, to obtain focusing conditions for a wide mass range i.e. for all , the z-dependent specific energy U(z) (energy per charge) may be arranged with a resistive divider within confining means 51. For optimal ion packet compression onto detector 59, the U(z) shall satisfy condition 72, where U.sub.Z0=U(z=0):
U(z)/U.sub.Z0=(1z/D.sub.Z).sup.2 (eq. 4)
[0171] Ion beam 29 slows down in a Z-dependent axial potential distribution U(z) of confinement means 51. The desired z-focusing of ion packets is achieved for the entire ionic mass range, i.e. occurs for ions of all , while confinement means 51 provide mass independent radial confinement, as has been explained with equation Eq. 2. The method may be particularly attractive when using a soft and prolonged Pulsar mode, where open gate forms a prolonged quasi-continuous ion beams.
[0172] Again referring to
[0173] Referring to
[0174] Annotations
[0175] Coordinates and Times: [0176] x,y,zCartesian coordinates; [0177] X, Y, Zdirections, denoted as: X for time-of-flight, Z for drift, Y for transverse; [0178] Z.sub.0initial width of ion packets in the drift direction; [0179] Zfull width of ion packet on the detector; [0180] D.sub.X and D.sub.Zused height (e.g. cap-cap) and usable width of ion mirrors [0181] Loverall flight path [0182] Nnumber of ion reflections in mirror MRTOF or ion turns in sector MTTOF [0183] ux-component of ion velocity; [0184] wz-component of ion velocity; [0185] Tion flight time through TOF MS from accelerator to the detector; [0186] Ttime spread of ion packet at the detector;
[0187] Potentials and Fields: [0188] Upotentials or specific energy per charge; [0189] U.sub.Z and U.sub.Zspecific energy of continuous ion beam and its spread; [0190] U.sub.Xacceleration potential for ion packets in TOF direction; [0191] K and Kion energy in ion packets and its spread; [0192] =K/Krelative energy spread of ion packets; [0193] Ex-component of accelerating field in the OA or in ion mirror around turning point; [0194] =m/zions specific mass or mass-to-charge ratio;
[0195] Angles: [0196] inclination angle of ion trajectory relative to X-axis; [0197] angular divergence of ion packets; [0198] tilt angle of time front in ion packets relative to Z-axis [0199] tilt angle of starting equipotential to axis Z, where ions either start accelerating or are reflected within wedge fields of ion mirror [0200] tilt angle of the entire ion mirror (usually, unintentional); [0201] steering angle of ion trajectories or rays in various devices; [0202] steering angle in deflectors [0203] spread in steering angle in conventional deflectors;
[0204] Aberration Coefficients [0205] T|Z, T|ZZ, T|, T|, etc;
[0206] indexes are defined within the text
[0207] Although the present invention has been describing with reference to preferred embodiments, it will be apparent to those skilled in the art that various modifications in form and detail may be made without departing from the scope of the present invention as set forth in the accompanying claims.