Barrier Layer
20200154575 ยท 2020-05-14
Inventors
Cpc classification
H05K3/282
ELECTRICITY
Y02P70/50
GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
H05K1/09
ELECTRICITY
H05K2201/0218
ELECTRICITY
International classification
Abstract
A barrier layer is disposed on a copper surface, the barrier layer including an organic molecule. The organic molecule may be a nitrogen-containing molecule. The nitrogen-containing organic molecule includes 1 to 6 carbon atoms. The barrier layer may be deposited on an exposed copper surface before deposition of a surface finish.
Claims
1. A method for preparing a printed circuit board (PCB), comprising: depositing a barrier layer including at least one nitrogen-containing organic molecule on an exposed copper surface of the PCB; and applying solder over the barrier layer and the exposed copper surface.
2. The method of claim 1, wherein the solder is applied directly to the barrier layer.
3. The method of claim 1, wherein the barrier layer includes 1,4 diamine butane.
4. The method of claim 1, wherein the barrier layer includes diethylene triamine.
5. The method of claim 1, wherein the barrier layer attaches to a surface of the exposed copper surface and diffuses through grain boundaries and crevices into the surface of the exposed copper surface operable to passivate copper atoms on the surface and the grain boundaries and crevices.
6. The method of claim 1, wherein applying the solder forms a distinct intermetallics layer.
7. The method of claim 1, wherein the barrier layer includes a nitrogen-containing organic molecule(s) including one or more of: R.sup.1NH.sub.2, NH.sub.2R.sup.1NH.sub.2, NH.sub.2R.sup.1NH.sub.2NH.sub.2, NH.sub.2R.sup.1NH.sub.2R.sup.2NH.sub.2, R.sup.1NR.sup.2H, and R.sup.1NR.sup.2R.sup.3; wherein R.sup.1 is a first substituted or unsubstituted aliphatic group of C18 or less; wherein R.sup.2 is a second substituted or unsubstituted aliphatic group of C18 or less; and wherein R.sup.3 is a third substituted or unsubstituted aliphatic group of C18 or less.
8. The method of claim 1, wherein the barrier layer includes one or more of R.sub.1H.sub.3, OHCR.sub.1CHO, HOOCR.sub.1COOH and R.sub.1OR.sub.2, R.sub.1COR.sub.2, where R.sub.1 is a first substituted or unsubstituted aliphatic group of C18 or less; where R.sub.2 is a second substituted or unsubstituted aliphatic group of C18 or less; and where R.sup.3 is a third substituted or unsubstituted aliphatic group of C18 or less.
9. The method of claim 8 wherein R.sup.1, R.sup.2, and R.sup.3 are unsubstituted alkane groups.
10. The method of claim 8, wherein R.sup.1, R.sup.2, and R.sup.3 are substituted or unsubstituted aliphatic groups having one to six carbon atoms.
11. The method of claim 8, wherein R.sup.1, R.sup.2, and R.sup.3 are substituted or unsubstituted aliphatic groups having three to five carbon atoms.
12. The method of claim 8, wherein R.sup.1, R.sup.2, and R.sup.3 are, independently at each occurrence, a methyl group, a linear alkane, a branched alkane, or an unsaturated aliphatic group; and wherein R.sup.1, R.sup.2, and R.sup.3 are not cyclic groups.
13. The method of claim 1 further comprising: depositing a surface finish component compatible with Tin-Copper (SnCu)-based solder joints on the barrier layer prior to soldering an electronic component.
14. The method of claim 13, wherein the surface finish component is at least one of immersion gold, electroplated gold, electroless gold, immersion tin, immersion silver, electroplated silver, electroless silver, hot air solder leveling (HASL), or Organic Solderability Preservative (OSP).
15. A printed circuit board (PCB), comprising: a plurality of copper pads; and a barrier layer disposed on the copper pads, wherein the barrier layer includes one or more nitrogen-containing organic molecules.
16. The PCB of claim 15, further comprising: a surface finish component disposed over the barrier layer, wherein the surface finish component is compatible with Tin-Copper (SnCu) based solder joints.
17. The PCB of claim 16, wherein the surface finish component includes one of immersion gold, electroplated gold, electroless gold, immersion tin, immersion silver, electroplated silver, electroless silver, and Organic Solderability Preservative (OSP), Hot Air Solder Levelling (HASL).
18. A barrier layer, the barrier layer applied to a surface of copper or copper and nickel, comprising amine molecules, operable to attach to the surface and reduce copper dissolution into jet fuel.
Description
BRIEF DESCRIPTION OF THE DRAWINGS
[0006]
[0007]
DETAILED DESCRIPTION
[0008] In the following detailed description, reference is made to the accompanying drawings, which form a part hereof. In the drawings, similar symbols typically identify similar components, unless context dictates otherwise. Other embodiments may be used and/or other changes may be made without departing from the spirit or scope of the disclosure.
[0009]
[0010] The copper layer 10, of which only a top three layers of atoms are shown in
[0011] A surface finish component, superjacent layer 14 may include electroplated gold (Au), electroless gold (Au), immersion gold (Au), electroplated silver (Ag), electroless silver (Ag), immersion silver (Ag), immersion tin (Sn), organic solderability preservative (OSP), Hot Air Solder Levelling (HASL), etc. According to an embodiment, the superjacent layer 14 may include gold. For example, the superjacent layer 14 may be provided by electroplating, electroless plating, or immersion coating onto the copper layer 10 and barrier layer 12 assemblage.
[0012] According to an embodiment, the superjacent layer 14 may include silver. For example, the superjacent layer 14 may be provided by electroplating, electroless plating, or immersion coating onto the copper layer 10 and barrier layer 12 assemblage.
[0013] The instant disclosure involves interfacial engineering and inclusion of the barrier layer 12 on the surface of copper layer 10. A surface finish component, superjacent layer 14 may include gold (electroless, electroplated, immersion), silver (electroplated, electroless, immersion), immersion tin (Sn), organic solderability preservative (OSP), Hot Air Solder Levelling (HASL), etc. that is deposited on top of the barrier layer 12. Inclusion of the barrier layer 12 on a copper layer 10 surface may lead to robust solder joints following a solder reflow process (soldering). Barrier chemistry of barrier layer 12 can include at least one nitrogen-containing organic molecule. In some embodiments, the nitrogen-containing organic molecule is an aliphatic amine. In embodiments, the nitrogen-containing organic molecule can be a non-cyclic aliphatic amine.
[0014] Embodiments related to making the barrier layer may include providing a water solution carrying a nitrogen-containing organic molecule. Making the water solution of the nitrogen-containing organic molecule may include making a solution, in deionized water, of a nitrogen-containing organic molecule. Making a water solution of a nitrogen-containing organic molecule may include making a solution of 0.1 to 1 molar 1,4 diamine butane or making a solution of 0.1 to 1 molar diethylene triamine. Making a water solution of a nitrogen-containing organic molecule may include making a water solution of a non-cyclic aliphatic amine. Making the water solution of the nitrogen-containing organic molecule may include adjusting the pH to about 12. Ammonium hydroxide may be used to adjust the pH.
[0015] For embodiments where a less-soluble nitrogen-containing organic molecule is used, making the water solution may include adding an emulsifier and/or a detergent to the water. The nitrogen-containing organic molecule(s) may include one or more of R1-NH2, NH2-R1-NH2, NH2-R1-NH2NH2, NH2-R1-NH2-R2-NH2, R1-N-R2H, and R1-N-R2R3; R1 is a first substituted or unsubstituted aliphatic group of C18 or less; where R2 is a second substituted or unsubstituted aliphatic group of C18 or less where R3 is a third substituted or unsubstituted aliphatic group of C18 or less.
[0016] In an embodiment, the nitrogen-containing organic molecule includes 1 to 6 carbon atoms. In another embodiment, the nitrogen-containing molecule includes 3 to 5 carbon atoms. In an embodiment, the nitrogen-containing molecule includes 1,4 diamine butane. In an embodiment, the nitrogen-containing molecule includes diethylene triamine.
[0017] R.sup.1, R.sup.2, and R.sup.3 can be, independently at each occurrence, a methyl group, a linear alkane, a branched alkane, an unsaturated aliphatic group, and not a cyclic saturated or unsaturated aliphatic group. In an embodiment, the carbon-based barrier layer includes or consists essentially of 1,4 diamine butane.
[0018] A barrier layer is applied to the copper, the barrier layer including at least a portion of a nitrogen-containing organic molecule. In an embodiment, applying the barrier layer to the copper layer 10 may include maintaining the temperature of the water solution at 30-80 C. while exposing the water solution of the nitrogen-containing organic molecule to the copper layer 10 for 5-40 minutes.
[0019] In an alternative embodiment, applying the barrier layer 12 to the copper layer 10 can include dissolving the nitrogen-containing organic molecule in a vapor and condensing the nitrogen-containing molecule out of the vapor onto the copper layer 10. For example, a molecule such as 1,4 diamine butane may be carried by a butane vapor and may be condensed onto the copper layer 10 therefrom.
[0020] According to another embodiment, the barrier layer 12 is deposited onto the copper layer 10 from a high molecular weight matrix by adhesion of a solid or viscous liquid layer such as a polyester-supported polymethyl methacrylate host polymer carrying a nitrogen-containing molecule guest, followed by peeling away of the polyester, optionally, aided by application of heat.
[0021] In an alternative embodiment, applying the barrier layer 12 to the copper layer 10 may include embedding the nitrogen-containing organic molecule in a polymer matrix supported by a transfer film, placing polymer matrix side of the transfer film in close proximity to the copper layer 10 surface, and applying heat to the transfer film to cause the nitrogen-containing organic molecule to diffuse out of the polymer matrix and condense on the copper layer 10.
[0022] In one embodiment, surface finish component is not deposited on barrier layer 12. Instead, solder in a solder process is applied directly to barrier layer 12. In this embodiment, the barrier layer 12 is suitable to properly passivate copper layer 10 to reduce oxidation or corrosion.
[0023] The barrier layer 12 is deposited on the surface of copper layer 10, in the illustrated embodiment, typically from a water-based solution. In an experiment, a water-based solution prepared by dissolving or suspending diamine butane in water to form a 0.5 molar solution. The pH was adjusted to 12 by adding ammonium hydroxide. Similar solutions or suspensions of functionalized carbon chains of 3 atoms or higher may provide similar activity. Functionalized carbon chains of 8 atoms or fewer may also provide similar activity. Longer length carbon chain water solutions may be enabled by addition of detergent or other functionalized lipids.
[0024] Carbon functional groups from barrier layer 12 attach (chemisorb) to copper atoms on the surface of copper layer 10 as well as diffusing through intergranular boundaries in the copper layer 10. The chemisorption passivates the surface of copper layer 10, decreases migration of oxygen into the copper layer 10, and reduces the risk of oxidation of the copper layer 10. The reduction in copper oxidation further reduces subsequent risk of degradation of solderability.
[0025] Chemisorption of barrier layer 12 on copper layer 10 or diffusion of barrier layer 12 chemistry through the intergranular boundaries will eventually result in achieving robust solder joints 20 including intermetallics, as illustrated in
[0026] In embodiments, a solder process is applied directly to the barrier layer 12. Preferably, the barrier layer 12 is suitable to properly passivate copper layer 10 to reduce oxidation/corrosion prior to placement of solder paste and reflow.
[0027] Referring to
[0028] The presence of the barrier layer 12 may help to keep the solder joints 20 (intermetallics) thin and well-defined, which has been found to improve solder joint strength. The chemistry and structure of the intermetallics, including solder (tin alloy), copper layer 10 and the barrier layer 12 chemistry is more robust and shows desired ductile behavior compared to a solder joint formed from components that do not include the barrier layer 12. The ductility reduces the incidence brittle failures, including failures responsive to shock and vibration.
[0029] In one aspect, embodiments include a cost-effective barrier layer 12 which is deposited on copper layer 10 to achieve robust SnCu based solder joints 20. In one embodiment, surface finish with SnCu based solder joints (e.g., immersion Ag, immersion Sn, OSP, etc.) is deposited on top of barrier layer 12 which get dissolved during solder reflow (soldering process).
[0030] One embodiment of the disclosure includes a cost-effective barrier layer 12 on a surface of copper layer 10 to achieve robust SnCu based solder joints for better reliability of electronic assemblies. One embodiment includes barrier layer 12 on the surface of copper layer 10 before the deposition of surface finish (SnCu solder joints based surface finish, e.g., immersion Ag, immersion Sn, OSP, etc.) to eliminate corrosion/oxidation of the copper layer 10 surface. The presence of barrier layer 12 passivates the copper layer 10 surface and minimizes the risk of reducing solderability. Following the solder reflow process, the surface finish and partial barrier layer 12 get dissolved in molten solder. The disclosed barrier layer 12 on a copper layer 10 surface is a cost-effective way to reduce oxidation/corrosion of a copper layer 10 surface and generate robust solder joints at potentially less expensive costs.
[0031] In another embodiment, the barrier layer is applied to copper or copper/nickel surface to form chelating chemistry on a metal surface, for example, a tank for jet fuel. The barrier layer molecules may penetrate through a top layer of copper or copper/nickel surface through intergranular boundaries leaving a few nm of the top layers completely passivated. Due to the size of the amine molecules (butane, octane, etc. aliphatic groups), the passivation layer may penetrate through the intergranular boundaries or crevices up to few hundred nm and may form part of copper grains instead of being a separate layer. This may be effective in eliminating dissolution of Cu atoms into jet fuel and improving the stability of the fuel.
[0032] The organic molecule(s) may include one or more of: R.sub.1H3, OHCR.sub.1CHO, HOOCR.sub.1COOH, R.sub.1OR.sub.2, R.sub.1COR.sub.2; where R.sub.1 is a first substituted or unsubstituted aliphatic group of C18 or less; where R.sub.2 is a second substituted or unsubstituted aliphatic group of C18 or less; where R3 is a third substituted or unsubstituted aliphatic group of C18 or less.
[0033] In an embodiment, the organic molecule includes 1 to 6 carbon atoms. In another embodiment, the organic molecule includes 3 to 5 carbon atoms. R1, R2, and R3 can be, independently at each occurrence, a methyl group, a linear alkane, a branched alkane, an unsaturated aliphatic group, and not a cyclic saturated or unsaturated aliphatic group. In an embodiment, the carbon-based barrier layer includes or consists essentially of butane.
[0034] While various aspects and embodiments have been disclosed herein, other aspects and embodiments are contemplated. The various aspects and embodiments disclosed herein are for purposes of illustration and are not intended to be limiting, with the true scope and spirit being indicated by the following claims.