Testing device
D0881730 ยท 2020-04-21
Inventors
- Sigeru Matsumoto (Tama, JP)
- Hiroshi Miyashita (Tama, JP)
- Kazuyoshi Tashiro (Tama, JP)
- Kazuhiro Murauchi (Tama, JP)
Cpc classification
International classification
Abstract
Claims
The ornamental design for testing device, as shown and described.
Description
(1) 1. Testing device
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