Imaging device
10591822 ยท 2020-03-17
Assignee
Inventors
- Nir RUBIN BEN HAIM (Hod HaSharon, IL)
- Michael Nagler (Tel Aviv, IL)
- Benzion Landa (Nes Ziona, IL)
- Tamar KASHTI (Nes Ziona, IL)
- Ofer Aknin (Petach Tikva, IL)
- Ronen YOGEV (Kibbutz Hulda, IL)
- Itai TZUR (Kibbutz Na'an, IL)
Cpc classification
B41J2/451
PERFORMING OPERATIONS; TRANSPORTING
B41J2/45
PERFORMING OPERATIONS; TRANSPORTING
B41J2/447
PERFORMING OPERATIONS; TRANSPORTING
G03G15/342
PHYSICS
International classification
G03G15/04
PHYSICS
B41J2/455
PERFORMING OPERATIONS; TRANSPORTING
B41J2/45
PERFORMING OPERATIONS; TRANSPORTING
Abstract
An imaging device for projecting individually controllable laser beams onto an imaging surface movable in an X-direction. The device includes a plurality of semiconductor chips each comprising a plurality of laser beam emitting elements arranged in a main array of M.Math.N. The chips are mounted such that each pair of adjacent chips in the Y-direction are offset from one another in the X-direction and, if activated continuously, the emitted laser beams of the two chips of said pair trace on the imaging surface a set of parallel lines that are substantially uniformly spaced in the Y-direction. In addition to the M.Math.N elements of the main array, each chip comprises at least one additional column on one or each side, each additional column containing at least one selectively operable element capable of compensating for any misalignment in the Y-direction in the relative positioning of the adjacent chips on the support.
Claims
1. A method of projecting individually controllable laser beams onto an imaging surface that is movable relative to an imaging device, the method comprising: providing an imaging device for projecting individually controllable laser beams onto an imaging surface, the imaging device and imaging surface being movable relative to each other in a reference X-direction, the imaging device comprising: a plurality of semiconductor chips each of which comprises a plurality of individually controllable laser beam emitting elements arranged in a two dimensional main array of M rows and N columns, the emitting elements in each row having a uniform spacing A.sub.r and the emitting elements in each column having a uniform spacing a.sub.c; the chips are mounted on a support such that the main arrays of each pair of chips that are adjacent one another in a reference Y-direction, transverse to the X-direction, are offset from one another in the X-direction; wherein were all the emitting elements to be activated continuously and were the chips and the imaging surface to be relatively moved in the X-direction, the emitted laser beams of the two chips of the pair would trace on the imaging surface 2.Math.M.Math.N parallel lines that extend in the X-direction and are uniformly spaced from one another in the Y-direction, by a nominal distance A.sub.r/M, whereby the laser beams of each chip trace a set of M.Math.N lines without overlapping the set of lines of the other chip; each chip further comprises at least one additional column in addition to the N columns of elements of the main array, the additional column being disposed on one side of the main array along the Y-direction, and containing at least one selectively operable laser emitting element capable of tracing at least one additional line that lies between the respective sets of M.Math.N lines of each chip and that is spaced from two adjacent lines, each from a respective one of the sets, by a distance smaller than the uniform element spacing in each row A.sub.r; and, individually projecting the laser beams onto the imaging surface.
2. A method as claimed in claim 1, further comprising the step of controllably projecting a laser beam emanating from the at least one emitting element of the at least one additional column of a first of two adjacent chips, the laser beam impinging on the imaging surface between laser beams impinging on the imaging surface from at least two laser beams emanating from emitting elements at the edge of the respective main arrays of the first and a second of two adjacent chips.
3. A method as claimed in claim 2, wherein the additional column of the first chip of the pair of chips and the additional column of the second chip are disposed between the respective main arrays of the first and second chip, the method further comprising the step of controllably projecting a first laser beam emanating from one emitting element of the additional column of the first chip and a second laser beam emanating from the additional column of the second chip, such that the first and second laser beams impinge on the imaging surface at sufficient proximity to cause the energy of the respective laser beams to act additively thereupon.
4. A method as claimed in claim 3, further comprising the step of controlling the energy of each of the first and second laser beams such that each of the beams act on the imaging surface at an energy level below a predetermined threshold, and the additively combined energy level of the two beams surpasses the predetermined threshold, the additively combined energy level impinges on the imaging surface at a location between the respective first and second beam centers.
5. A method as claimed in claim 1, further comprising the step of controllably projecting a first and second laser beams emanating respectively from two emitting elements adjacent in the Y direction, at controlled intensity such that the first and second laser beams impinge on the imaging surface at sufficient proximity and intensity to cause the energy of the respective beams to act additively thereupon.
6. A method as claimed in claim 5, further comprising the step of controlling the energy of first and second laser beams such that each of the beams act on the imaging surface at an energy level below a predetermined threshold, and the additively combined energy level of the first and second laser beams surpasses the predetermined threshold, the additively combined energy level impinges on the imaging surface at a location between the respective first and second beam centers.
7. A method as claimed in claim 1, wherein the at least one additional column comprises a plurality of emitting elements.
8. A method as claimed in claim 1, wherein the imaging device further comprises a plurality of lens systems, each serving to focus the laser beams of all the emitting elements of a respective chip onto the imaging surface.
9. A method as claimed in claim 8, wherein at least one of the plurality of lens systems comprises at least one gradient index (GRIN) rod.
10. A method as claimed in claim 9, wherein the at least one GRIN rod is of circular cross-section having a diameter equal to 2.Math.N.Math.A.sub.r.
11. A method as claimed in claim 1, wherein each chip comprises at least a second additional column, such that at least one additional column is disposed on each side of the respective main array, the second additional column comprising at least one individually controllable laser beam emitting element.
12. A method as claimed in claim 1, wherein each chip has an equal number of rows and columns of emitting elements in the main array.
13. A method as claimed in claim 1, wherein the surface of the support is formed of, or coated with, an electrical insulator, and further comprising a plurality of thin film conductors formed on the electrically insulating surface for supplying electrical signals and power to the chips.
14. A method as claimed in claim 1, wherein the support is liquid cooled.
15. A method as claimed in claim 1, wherein the emitting elements of at least one chip are of vertical cavity surface emitting lasers (VCSEL) type.
Description
BRIEF DESCRIPTION OF THE DRAWINGS
(1) Some embodiments of the imaging device are described herein with reference to the accompanying drawings. The description, together with the figures, makes apparent to a person having ordinary skill in the art how the teachings of the disclosure may be practiced, by way of non-limiting examples. The figures are for the purpose of illustrative discussion and no attempt is made to show structural details of an embodiment in more detail than is necessary for a fundamental and enabling understanding of the disclosure. For the sake of clarity and simplicity, some objects depicted in the figures are not to scale.
(2) In the Figures:
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DETAILED DESCRIPTION
(15) The imaging device will be described herein mainly by reference to its application in digital printing systems however its use is not limited to this application, and different aspects of the invention may be implemented to controllably project image forming light beams onto any surface with relative motion between the surface and the chips.
(16) Overall Description of an Exemplary Printing System
(17)
(18) The term tacky as used herein is intended to mean that the irradiated particle coating is not necessarily tacky to the touch but only that it is softened sufficiently to be able to adhere to the surface of a substrate when pressed against it in the impression station 19.
(19) The regions on the imaging surface 12 corresponding to the selected tacky areas transferred to the substrate 20 consequently become exposed, being depleted by the transfer of particles. The imaging surface 12 can then complete its cycle by returning to the coating station 14 where a fresh monolayer particle coating is applied only to the exposed regions from which the previously applied particles were transferred to the substrate 20 in the impression station 19.
(20) Advantageously, a monolayer of particles facilitates the targeted delivery of radiation as emitted by the laser elements of an imaging device according to present teachings. This may ease the control of the imaging device and process, as the selectively irradiated particles reside on a single defined layer. When considered for use in a printing system, an imaging device targeting a monolayer can preferably focus the laser radiation to form upon transfer to a substrate a dot of approximately even thickness and/or relatively defined contour.
(21) Reverting to the coating station 14, it may comprise a plurality of spray heads 1401 that are aligned with each other along the axis of the drum 10 and only one is therefore seen in the section of
(22) The imaging device 15 in
(23) Each chip has individually controllable laser beam emitting elements arranged in a two dimensional main array of M rows and N columns (M.Math.N), the elements in each row having a uniform spacing A.sub.r and the elements in each column having a uniform spacing a.sub.c. As disclosed below, at least one additional column is also provided.
(24) Preferably, the chips can be individually or collectively associated with an array of corresponding lenses 18 that focus the laser beams on the imaging surface 12 is also used.
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(26) The support 16 is a rigid and in some embodiments at least partially hollow elongate body fitted with connectors 34 to allow a cooling fluid to flow through its internal cavity. In some embodiments, the body of the support may be made of an electrically insulating material, such as a suitable ceramic, or it may be made of a metal and at least its surface 36 on which the chips 30 are mounted may be coated with an electrical insulator. This enables a circuit board made of thin film conductors (partial and symbolic depiction of the conductors is schematically shown to the lower-right chip at
(27) In some embodiments, the individually controllable laser elements of a chip can emit laser beams having variable energy that is preferably digitally controllable in discrete steps, allowing the laser intensity to be set at discrete levels such as 2, 4, 8, 16 . . . and the like, and in some embodiments individual laser beam sources may be controllably set to emit up to 4096 levels or more. The lowermost level of energy is defined as 0, where the individual laser element is not activated, the uppermost level of energy can be defined as 1. The distinct intermediate levels therebetween may be considered analogous in the field of printing to grey levels, each level providing for a gradually distinct intensity (e.g., shade when considering a colored output). Taking for instance, a laser beam emitting element having 16 levels of activation, level 0 would result in lack of impression (e.g., leaving a substrate bare or white if originally so) and level 1 would result in transfer of a tacky film formed by a particle irradiated at maximum energy (e.g., forming a full black dot in the event the particles are so colored). In previous illustrative example, levels 1/16, 2/16, 3/16 and so on would correspond to increasingly stronger shades of grey, comprised between white (0) and black (1). Typically, the energy levels are evenly spaced.
(28) In an alternative embodiment, the individually controllable laser elements of a chip can emit laser beams having variable energy that can be modulated in a continuous analogue manner.
(29) Once a region of the imaging surface has reached a temperature at which the particles become tacky, any further increase in temperature will not have any effect on the transfer to the substrate. However, it should also be noted that as the intensity of the laser is increased the size of the dot that is rendered tacky also increases.
(30) The energy profile of each dot resembles the plots shown in
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(32) It should be mentioned that it is possible for the elements to lie in a square array where the columns are perpendicular to the rows. In this case, the chips would need to be mounted askew on their support and compensation would need to be applied to the timing of the control signals used to energize the individual elements.
(33) As is clear from
(34) If one wishes to provide compensation for defective elements, the array could include additional rows of laser emitting elements 40, but it is alternatively possible to compensate for a defective element by increasing the intensity of the laser beams generated by the laser emitting elements that trace the two adjacent parallel lines.
(35) In addition to the M by N array of elements 40, each chip has at least one additional column that is arranged along the Y-direction on the side of the main array, the additional column containing at least one laser beam emitting element 42. These further elements 42 are represented in
(36) Any additional element 42 of an additional column can be positioned in the column at any desired distance from the edge element of the main array, the distance in the Y-direction depending on the total numbers of additional elements/additional columns each two sets of main arrays of a pair of chips to be aligned would bound. Assuming n additional elements 42 between a first and second main array, n being a positive integer number, each additional element can be spaced from the edge element of the main arrays or from one another in the Y-direction by a distance equal to A.sub.r/(n+1), namely the spacing of the adjacent elements in each row divided by one more than the number of additional elements in the gap. Considering now the X-direction, the additional elements can either be aligned with a row of elements of their respective main arrays or positioned at any desired intermediate position above or below such rows. Preferably the positioning of an additional element 42 with respect to adjacent elements of the main array shall minimize thermal interference. Notably, the additional element or elements may be disposed at any position along the X-direction of the chip.
(37) In practice n elements 42 positioned in any of the additional columns on one or both sides of the main array, can correct for alignment errors of up to about a 1/(n+1) of the nominal spacing between the edge elements of two adjacent chips. If, by way of example, the edge elements of the two chips are at a distance of 20 m (micrometers) in the Y-direction, and there is a single additional laser emitting element on adjacent sides of each array, such elements may correct a spacing error of up to about one third of the nominal spacing, in the exemplified case approximately 7 m. Any positional deviation from the desired position on the chip (e.g., with respect to its edges) or nominal distance between elements not exceeding 10%, is considered within tolerances, however in most cases due to the high precision of the semiconductor manufacturing methods, such errors are unlikely.
(38) As can be seen from
(39) One of the additional lines 46 is spaced by a distance A.sub.r/3M from the last adjacent line 44a traced, for example, by the array 130a in
(40) While the two additional elements 42 in the present embodiment are shown in
(41) While in
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(43) The result of repeating such a dot pattern diagonally is shown in
(44) The interaction of energies from nearby laser elements can also be used to compensate for missing or inoperative elements in that the elements producing the two adjacent raster lines can be used to combined in the same manner as previously explained to fill in a gap between them.
(45) For the arrays 130a and 130b in
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(47) Though the lens 18 has been schematically illustrated in
(48) The radiation guided by GRIN rod 18a, the proximal end of which is arranged at a distance WD.sub.o from the chip, may be captured by the corresponding GRIN rod 18b which can collect the collimated light emerging from rod 18a on the same light path and focus it at a distance WD.sub.i from the distal end of the second GRIN rod 18b. When the two GRIN rods are made of the same material and the same radial gradient profile and WD.sub.o=WD.sub.i a magnification of M.sub.o=+1 or 1 can be obtained.
(49) Notably, with straight or folded path light paths, the magnification should be considered substantially equal to its nominal value if within 0.5% or even 1% or 2%.
(50) Laser elements that are away from the longitudinal axis of the GRIN rod 18a will leave the distal end of the GRIN lens collimated but at an angle to the axis. In certain cases, it is necessary for the distance between the two rods 18a and 18b to be large, causing the off axis collimated beams exiting the first rod segment to miss partially or entirely the second segment. It is possible to take advantage of Snell's law and cause the beam exiting the first rod to travel through a glass with a high refractive index, thus causing the angle the collimated beam makes with the optical axis to decrease and enabling a larger separation between the rods before the collimated beams leaving the first rod miss the entrance to the second rod.
(51) In the description and claims of the present disclosure, each of the verbs, comprise include and have, and conjugates thereof, are used to indicate that the object or objects of the verb are not necessarily a complete listing of members, components, elements, steps or parts of the subject or subjects of the verb.
(52) As used herein, the singular form a, an and the include plural references and mean at least one or one or more unless the context clearly dictates otherwise.
(53) Positional or motional terms such as upper, lower, right, left, bottom, below, lowered, low, top, above, elevated, high, vertical, horizontal, backward, forward, upstream and downstream, as well as grammatical variations thereof, may be used herein for exemplary purposes only, to illustrate the relative positioning, placement or displacement of certain components, to indicate a first and a second component in present illustrations or to do both. Such terms do not necessarily indicate that, for example, a bottom component is below a top component, as such directions, components or both may be flipped, rotated, moved in space, placed in a diagonal orientation or position, placed horizontally or vertically, or similarly modified.
(54) Unless otherwise stated, the use of the expression and/or between the last two members of a list of options for selection indicates that a selection of one or more of the listed options is appropriate and may be made.
(55) The imaging device is described herein mainly by reference to its application in digital printing systems however its use is not limited to this application, and different aspects of the invention may be implemented to project light beams onto any surface with relative motion between the surface and the chips.
(56) In the disclosure, unless otherwise stated, adjectives such as substantially and about that modify a condition or relationship characteristic of a feature or features of an embodiment of the present technology, are to be understood to mean that the condition or characteristic is defined to within tolerances that are acceptable for operation of the embodiment for an application for which it is intended. For instance, each two adjacent elements of the group of elements under consideration (such as by way of example of a chip row, of a chip column, or of adjacent chip arrays, when applicable) are considered substantially uniformly spaced if the deviation of each pair of adjacent elements from a desired nominal distance does not exceed 10% of this predetermined spacing. Pairs of adjacent elements deviating from the nominal distance by less than 5%, 4%, 3%, 2% or 1% are further considered substantially uniformly spaced or having a substantially uniform spacing. By way of example, assuming a desired A.sub.r=20 micrometers, and the desired nominal spacing in the Y-direction between corresponding main array laser emitting elements in two adjacent chips equals A.sub.r.Math.N, spacing deviations resulting from manufacturing tolerance of no more than 2 m, are considered to fall within the nominal spacing. Clearly, smaller or no deviations are desired.
(57) While this disclosure has been described in terms of certain embodiments and generally associated methods, alterations and permutations of the embodiments and methods will be apparent to those skilled in the art. The present disclosure is to be understood as not limited by the specific embodiments described herein.