Bonding apparatus and method of estimating position of landing point of bonding tool
10586781 ยท 2020-03-10
Assignee
Inventors
Cpc classification
H01L2224/43848
ELECTRICITY
H01L2924/00014
ELECTRICITY
H01L24/75
ELECTRICITY
H01L2924/00011
ELECTRICITY
H01L2924/00014
ELECTRICITY
H01L21/67138
ELECTRICITY
H01L2924/00011
ELECTRICITY
H01L2224/85121
ELECTRICITY
B23K1/0016
PERFORMING OPERATIONS; TRANSPORTING
H01L2224/43848
ELECTRICITY
International classification
H01L21/28
ELECTRICITY
B23K1/00
PERFORMING OPERATIONS; TRANSPORTING
H01L21/67
ELECTRICITY
Abstract
A bonding apparatus 10 having a diagonal optical system 30, the bonding apparatus moves a capillary 24 down to a first heightwise position to calculate a position A11 of a tip end portion of the capillary 24 and a position A12 of a tip end portion of the capillary in an image on an imaging plane of the diagonal optical system 30, and similarly moves the capillary 24 down to a further lower second heightwise position to calculate a position A21 of the tip end portion of the capillary 24 and a position A22 of the tip end portion of the capillary in the image on the imaging plane. The bonding apparatus then estimates the position of the landing point of the capillary 24 on a bonding target 8 based on positional data for the four calculated positions A11, A12, A21, and A22, the first heightwise position, and the second heightwise position. With this, it is possible to use the diagonal optical system in the bonding apparatus to further improve positional accuracy in the bonding process.
Claims
1. A bonding apparatus, comprising: a bonding tool attached to a bonding head; a stage configured to move the bonding head slidably in an XY direction; a Z-movement mechanism configured to move the bonding tool freely in a Z direction perpendicular to an XY plane; a bonding stage for holding a bonding target; a rail disposed under the bonding tool and adjacent to the bonding stage wherein an edge of the rail is parallel and perpendicular to an edge of the bonding stage; a mirror coupled to a top surface of the rail, wherein a top surface of the mirror is parallel to a top surface of the bonding target, and wherein the top surface of the mirror comprises a reference mark; a diagonal optical system having an imaging camera configured to observe the bonding tool and the mirror from an obliquely upward position, wherein the imaging camera is located a fixed offset distance from the bonding tool, and wherein the imaging camera is fixed at a predetermined angle toward a tip end portion of the bonding tool for simultaneously imaging the reference mark, the tip end portion, and a reflection of the tip end portion in the mirror; the bonding apparatus performs bonding on the bonding target by: detecting the position of the reference mark; performing offset movement of the bonding tool in a direction of the mirror; moving the bonding tool to a first height above the mirror; detecting a first position of the tip end portion and a second position of an image of the tip end portion in the mirror using the imaging camera; moving the bonding tool to a second height above the mirror, wherein the first height is greater than the second height; detecting a third position of the tip end portion and a fourth position of an image of the tip end portion in the mirror using the imaging camera; and estimating a position of a landing point based on the detected first position, second position, third position, and fourth position.
2. The bonding apparatus according to claim 1, wherein a control unit estimates the position of the landing point.
3. The bonding apparatus according to claim 1, wherein the bonding tool is one of a capillary that performs a wire bonding process, a tool that performs a die bonding process, and a tool that performs a flip-chip mounting process.
4. The bonding apparatus according to claim 1, wherein the diagonal optical system adjusts an optical length of one of the tip end portion of the bonding tool and the tip end portion of the bonding tool in the image received on the mirror so that the optical length becomes identical with an optical length of the other.
5. The bonding apparatus according to claim 2, wherein the control unit detects a change in a bonding offset generated during bonding based on a difference between a position of the reference mark and the estimated position of the landing point.
6. The bonding apparatus according to claim 1, wherein the control unit performs bonding by feeding back the detected change in the bonding offset.
Description
BRIEF DESCRIPTION OF DRAWINGS
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DESCRIPTION OF EMBODIMENT
(14) Hereinafter, an embodiment according to the present invention will be described in detail with reference to the drawings. Examples of a bonding apparatus include an apparatus performing a bonding process using a bonding tool such as a wire bonding apparatus, a die bonding apparatus, and a flip-chip mounting apparatus. In the following, a description is given taking a wire bonding apparatus using a capillary as a bonding tool unless otherwise stated.
(15) Hereinafter, like components are denoted by like reference numbers throughout the drawing, and will not be described repeatedly.
(16)
(17) The bonding apparatus 10 performs a normal bonding process using the capillary 24, and estimates a position of a landing point of the capillary 24 on the bonding target 8 using the diagonal optical system 30.
(18) It should be noted that a perpendicular xy coordinate system is used in order to indicate a planar position on an imaging plane in the diagonal optical system 30. In the xy coordinate system, x direction and y direction are different from the X direction and the Y direction in
(19) In the following description, a focus is placed on a function of the estimation of the position of the landing point of the capillary 24 on the bonding target 8, and the normal bonding process will be described to the necessary extent.
(20) A bonding stage 13 is a bonding target holding stage on which the bonding target 8 is placed, and a bonding target is transferred from a loader by a feeding pawl of a feeder that is not illustrated. The bonding target 8 is a substrate on which a semiconductor device is mounted, for example. In this case, a pad of the semiconductor device and a lead of the substrate are targets of bonding in the actual wire bonding process. In this case, the landing point in the estimation of the position of the landing point is either a point at which a tip end portion of the capillary 24 lands on a surface of the pad of the semiconductor device, or a point at which the tip end portion of the capillary 24 lands on a surface of the lead of the substrate. In the following description, the point at which the tip end portion of the capillary 24 lands on the surface of the semiconductor pad is taken as the landing point.
(21) In
(22) A reference mark 18 engraved in the top surface of the mirror 16 is a reference pattern used as a positional reference in the bonding process, and a cross pattern is used in the example of
(23) When the bonding target 8 is mounted or discharged, the bonding target 8 is transferred to the bonding stage 13 on the mounting table 12. In the wire bonding process, the capillary 24 faces toward the bonding target 8 as illustrated in
(24) As the bonding stage 13, a movable table made of metal may be used. Here, a direction in which the bonding stage 13 moves with respect to the mounting table 12 is the X direction. the bonding stage 13 is connected to a reference potential such as a ground potential of the bonding apparatus 10. If insulation from the bonding target is required, an insulating process is performed to a required portion of the bonding stage 13.
(25) An XY stage 15 is a moving stage having a bonding head 20, for moving the bonding head 20 to a desired position within the XY plane with respect to the mounting table 12 and the bonding stage 13. The XY stage 15 is driven and moved by a linear motor 17 under control of the control unit 40.
(26) The bonding head 20 is a movement mechanism that is mounted and fixed to the XY stage 15 and includes a Z motor, and rotation control of which causes the capillary 24 to move in the Z direction perpendicular to the XY plane by a bonding arm 21 and a transducer 22. As the Z motor, a linear motor may be used.
(27) As described above, the XY stage 15 and the bonding head 20 are a movement mechanism unit for driving the capillary 24 to move to a predetermined position with respect to the bonding stage 13 in the X direction, the Y direction, and the Z direction according to predetermined procedure.
(28) The bonding arm 21 is a member to which the transducer 22 is attached, and that may be rotated by rotation control of the Z motor about a rotational center provided for the bonding head 20.
(29) The transducer 22 is an elongated stick member attached to the bonding arm 21 at its base portion, and to the capillary 24 at its tip end portion. The transducer 22 includes an ultrasonic transducer attached thereto, and transmits ultrasonic energy generated by driving the ultrasonic transducer as bonding energy to the capillary 24. The transducer 22 is configured in a horn shape tapered toward a tip end side so that the ultrasonic energy from the ultrasonic transducer may be efficiently transmitted to the capillary 24. As the ultrasonic transducer, a piezoelectric device is used.
(30) The capillary 24 is a bonding tool that is in a circular cone shape whose tip end surface is flat, and has a center hole through which a bonding wire that is not illustrated may be inserted along a longitudinal direction. The capillary 24 may be made of ceramic which is an insulating body.
(31) While not illustrated, the bonding wire is a thin wire made of gold, silver, copper, aluminum, or the like.
(32) The positioning camera 26 is a camera used for positioning so that the position of the tip end portion of the capillary 24 comes immediately above a position of the pad of the semiconductor device as a target of the bonding process. Here, the positioning is performed by driving the XY stage 15 to move by the linear motor 17 under control of the control unit 40 so that a coordinate center of the positioning camera 26 comes immediately above the reference mark 18.
(33) The positioning camera 26 is provided distant from the capillary 24 by a predetermined offset interval D0 in +X direction and attached to the bonding head 20 similarly to the capillary 24. Therefore, if the coordinate center of the positioning camera 26 is positioned at a coordinate center of the reference mark 18, the tip end position of the capillary 24 comes immediately above the reference mark 18 by moving the bonding head 20 from this position by D0 in +X direction. Therefore, the tip end portion of the capillary 24 comes right at a position of a desired pad by performing positioning so that the coordinate center of the positioning camera 26 comes to the position of the desired pad of the semiconductor device, driving the bonding arm 21 to move by the linear motor 17 in this state by D0 in +X direction, and moving the capillary 24 down in Z direction at this position. Performing the bonding process at this position allows bonding of the bonding wire to the desired pad.
(34) A lighting apparatus 28 is an apparatus that employs a LED (Light Emitting Diode) or the like and emits light to a bonding target from an obliquely upward position of the capillary 24. When the mirror 16 is used to estimate the position of the landing point, the light is turned off. In a different embodiment, if a diffuser plate 62 (cf.
(35) While attached to the bonding head 20, the lighting apparatus 28 may be provided separately from the bonding head 20 in some cases. An inclination angle of a lighting direction of the lighting apparatus 28 with respect to the longitudinal direction of the capillary 24 is preferably, but not necessarily, the same as an inclination angle of an optical axis of the diagonal optical system 30 with respect to the longitudinal direction of the capillary 24.
(36) The diagonal optical system 30 is an optical system that is disposed on a side opposite of the lighting apparatus 28 with the capillary 24 interposed therebetween, and observes the capillary 24 and the mirror 16 from an obliquely upward position. The diagonal optical system 30 is attached to the bonding head 20, but may be provided separately from the bonding head 20 in some cases.
(37) The diagonal optical system 30 includes an imaging camera 31 having a telecentric optical system 32 and an imaging plane 34 (cf.
(38) The imaging camera 31 included in the diagonal optical system 30 is an imaging apparatus that projects the tip end portion of the capillary 24 and a virtual image of the capillary 24 reflected on the mirror 16 on the imaging plane 34 using the telecentric optical system 32, and transmits image data of the image to the control unit 40 via an appropriate signal line. As the imaging camera 31, a two-dimensional CCD imaging apparatus is used.
(39) Referring back to
(40) These functions may be realized by executing software on the bonding apparatus 10. Specifically, these functions may be realized by executing the bonding program. A part of these functions may be realized in hardware manner.
(41) Actions of the bonding apparatus 10, in particular, functions of the control unit 40 will be described in further detail with reference to
(42) In the bonding apparatus 10, the offset interval D0 between the capillary 24 and the positioning camera 26 is calibrated before performing the bonding process. For this purpose, the bonding head 20 is driven and moved in X direction to move the positioning camera 26 to a position immediately above the mirror 16. Then, detection of the position of the reference mark 18 as the position reference pattern engraved in the mirror 16 is performed by the positioning camera 26 (S10). Specifically, positioning is performed so that a cross pattern intersection in the reference mark 18 is taken as a coordinate center, and a center mark as the coordinate center in a view field of the positioning camera 26 is aligned with the cross pattern intersection while driving the XY stage 15 to be moved by the linear motor 17. Further, instead of aligning to the center of the view field, a position of the reference mark 18 within the view field may be detected by image processing to take this position as a reference.
(43) Next, the bonding head 20 is moved by an offset of a predetermined distance (S12). Here, when the position of the reference mark 18 detected in the image processing is taken as the reference, the bonding head 20 is moved by an offset taking this position as the reference. The processing procedure is executed by a function of the offset movement processor 46 of the control unit 40. Specifically, the bonding head 20 is driven and moved in +X direction by the offset interval D0. With this, the capillary 24 is moved to the position immediately above the reference mark 18.
(44) The procedure hereinafter is a procedure for estimating the position of the landing point. Specifically, while moving the capillary 24 downward should bring its tip end portion right at the reference mark 18 by performing S12, the actual position of the landing point is not the position of the reference mark 18 in some cases. Conceivable reasons of this include a set value of the offset interval D0 being not correct, a direction of the downward movement of the capillary 24 being not parallel with the optical axis of the positioning camera 26, and a possible temperature change. The estimation of the position of the landing point is performed by moving the capillary 24 downward, and calculating a position at which its tip end portion is brought into contact with the surface of the mirror 16 as a landing point. The following describes the procedure for the estimation of the position of the landing point without having the capillary 24 actually make landing.
(45) Thus, the capillary 24 is moved downward to a predetermined first height Z1 (S14). This process is executed by a function of the tool-height change processor 48 of the control unit 40. Specifically, by driving the Z motor provided within the bonding head 20, the bonding arm 21 is rotated so that the capillary 24 moves downward. As an amount of movement of the Z motor is measured by an encoder, a value measured by the encoder is converted into a heightwise position Z of the capillary 24, and the capillary 24 is moved down to and stopped at a heightwise position within a range in which the capillary 24 is not brought into contact with the mirror 16. The heightwise position Z in this state is a first heightwise position Z1.
(46) The first heightwise position Z1 may be set to a predetermined heightwise position within the range in which the capillary 24 is not brought into contact with the mirror 16. For example, a position at a searching height used in the wire bonding process may be set as the first heightwise position Z1. When the capillary 24 is moved from a position of a first bonding point to a position of a second bonding point in the wire bonding process, the capillary 24 is first moved down at high speed, and then the speed is switched to a low speed as the capillary 24 reaches a predetermined height immediately above the second bonding point. This position of the height is a position of the searching height. The position of the searching height is previously set according to specification of the bonding apparatus 10. For example, the searching height position is set in a range of hundreds m from a surface of a bonding target.
(47) Next, calculation of the positions of the capillary 24 as the bonding tool and its image is performed (S16). The processing procedure is executed by a function of the imaging processor 50 for tool and its image of the control unit 40. The position of the capillary 24 and the position of its virtual image are the positions in the two-dimensional xy coordinate system on the imaging plane 34 shown by taking an image of the capillary 24 and its virtual image by an imaging camera 31 provided for the diagonal optical system 30. Here, assuming that the two-dimensional coordinate on the imaged plane is (x, y), a relation between the two-dimensional coordinate (x, y) and the two-dimensional coordinate (X, Y) on the XY stage 15 in
(48)
(49) The first heightwise position Z1 is a value calculated based on a value of the encoder provided for the Z motor, and not necessarily based on a heightwise position of the top surface of the mirror 16. However, in
(50) The mirror 16 is a member configured such that a reflective material is applied to a back surface of a glass plate, and the glass back surface to which the reflective material is applied constitutes a reflecting surface. When the reflecting surface is seen obliquely, the virtual image 60 of the capillary 24 is shown virtually on the back side of the reflecting surface opposite to the side on which the capillary 24 is present.
(51) When an image of the capillary 24 and the mirror 16 is taken using the imaging camera 31 provided for the diagonal optical system 30, light from the capillary 24 is shown as it is on the imaging plane 34 of the imaging camera 31 via the telecentric optical system 32. Similarly, light from the reference mark 18 is shown as it is on the imaging plane 34 via the telecentric optical system 32. Further, the light from the capillary 24 reflected on the mirror 16 is shown on the imaging plane 34 via the telecentric optical system 32 as if the light is light from the virtual image 60 of the capillary 24. Here, in the figure, an influence of a refractive index of the glass plate of the mirror 16 is not shown.
(52)
(53) Each position of these predetermined points on the imaging plane 34 is represented in the xy coordinate system in such a manner that its x position is indicated by a distance from the origin O along the x axis and its y position is indicated by a distance from the origin O along the y axis. Therefore, the position of the corresponding predetermined point is calculated as a two-dimensional coordinate A (x, y).
(54)
(55) Referring back to
(56) The second heightwise position Z2 is a position lower than Z1, that is, a heightwise position closer to the mirror 16, and may be set to a predetermined heightwise position within the range in which the capillary 24 is not brought into contact with the mirror 16. For example, it is possible to set such that Z2=100 m, where Z1=200 m.
(57)
(58)
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(60) S14, S16, S18, and S20 are executed by a function of the imaging processor 50 for tool and its image of the control unit 40.
(61) Referring back to
(62)
(63) An interval between the two lines along the y direction decreases as the heightwise position Z of the capillary 24 comes closer to the surface of the mirror 16. In other words, as the heightwise position Z of the capillary 24 comes closer to the surface of the mirror 16, the tip end portion of the capillary 25 and the tip end portion of the capillary in the virtual image 61 come closer to each other. At the landing point, the tip end portion of the capillary 25 and the tip end portion of the capillary in the virtual image 61 should be brought into contact with each other. Therefore, calculating a position of an intersection P between the line connecting y11 and y21 and the line connecting y12 and y22 results in an estimated position of the y position at the landing point. In this manner, calculation of the y position at the landing point is performed.
(64) Here, while a line connecting y1R and y2R indicates a change in the position of the reference mark 19 when the heightwise position Z of the capillary 24 changes from Z1 to Z2, the change is almost negligibly small. This is because the reference mark 18 is engraved in the surface of the mirror 16 and not related to the downward movement of the capillary 24.
(65) As illustrated in
(66) Referring back to
(67) In the above description, the virtual image 60 of the capillary 24 reflected on the mirror 16 is used.
(68)
(69) Here, while the mirror 16 may be used as it is, a planar body that is suited to receive the shadow image of the capillary 24 may also be used. For example, it is possible to use the diffuser plate 62 having a surface with a diffusing plane of suitable coarseness, instead of a mirror plane, that does not make regular reflection according to the law of reflection but produces scattering or diffusion according to the coarseness. The diffuser plate 62 is provided, in place of the mirror 16, on a top surface of the transfer rail 14 of the bonding stage 13. As the diffuser plate 62, a common planar plate having the reference mark 18 may be used.
(70) The diagonal optical system 30 takes an image of the capillary 24 and the shadow image 64 on the diffuser plate 62 via the telecentric optical system 32 using an imaging camera 31. The imaging plane 34 that has been taken is similar to those shown in
(71) When the bonding target has a characteristic pattern on a surface in a mirror or diffusing plane, it is possible to have the bonding target receive the shadow image of the capillary 24. Examples of such a bonding target include a semiconductor device and a film substrate.
(72) As described above, when the bonding target has a surface in a mirror or diffusing plane and a characteristic pattern, taking an image of the characteristic pattern using the diagonal optical system 30 eliminates the necessity of a special reference member, and the necessity of positioning of the positioning camera 26 to the special reference member may also be eliminated.
(73) In the above description, it is assumed that the bonding apparatus 10 is a wire bonding apparatus, and the bonding tool is the capillary 24. However, the bonding apparatus may be a die bonding apparatus or a flip-chip mounting apparatus, and the bonding tool may be a die bonding tool or a flip-chip tool.
(74)
(75) The flip-chip mounting apparatus 70 picks up a chip with a single bump from a wafer 74 on which bumps are formed, transfers the chip to the intermediate stage 76, and flips the chip so that a surface on which the bump is formed faces down. The chip with a bump in this state is held by the flip-chip tool 72, positioning to a pad on a substrate 80 is performed using a rear camera 78, and then the flip-chip tool 72 is moved down to perform mounting. Here, the estimation of the position of the landing point of the flip-chip tool 72 may be performed using the reference mark 18 and the diagonal optical system 30.
(76) As illustrated in
(77)
(78) In the meantime, when the diagonal optical system 30 is used, optical lengths from the capillary 24, the virtual image 60 in the mirror 16, and the shadow image 64 in the diffuser plate 62 as imaging targets to the imaging plane 34 are different from each other. Therefore, while magnitudes of objects as imaging targets and an image projected on the imaging plane 34 are made constant using the telecentric optical system 32, if the objects as imaging targets are largely displaced form the depth of field, the projected image becomes blurry to a large extent. A method that allows suppression of blurring on the imaging plane 34 due to a difference between the optical lengths will be described with reference to
(79)
(80) Therefore, by arranging the image forming plane 94 of the lens 92 in the following manner, the shadow image 64 as a whole on the surface of the diffuser plate 62 may be focused on the image forming plane 94. Specifically, the image forming plane 94 is disposed such that the straight line 96 by which the image forming plane 94 of the lens 92 intersects with the diffuser plate 62 coincides with the straight line 96 by which the surface of the diffuser plate 62 intersects with the main surface of the lens 92.
(81) As an image projected on the image forming plane 94 is focused without blurring, an image of the image forming plane 94 is taken via the telecentric optical system 32 and shown on the imaging plane 34. As illustrated in
(82) As the image forming plane 94, a transmissive screen, a fiber optical plate, an image conduit, or the like may be used so that an image may be taken from a side opposite on which the first optical system 90 is disposed.
(83)
(84) Where a thickness of the parallel planar plate glass 98 is d, and a refractive index of the parallel planar plate glass 98 is n, a focus position may be compensated by L=d{1(1/n)}. As one example, L=0.34 mm, where d=1 mm and n=1.52. In this case, while a distance that can be compensated is not large, it is possible to make the optical length closer to the focus position.
(85)
(86) Here, providing the parallel planar plate glass 98 for compensation of the optical length between the object 102 and the telecentric optical system 32 changes the area 108 to a focused area on the imaging plane 34. The area 106 remains as an unfocused area. By using the parallel planar plate glass 98 of an appropriate shape, it is also possible to change the area 108 to a focused area. As described above, using the parallel planar plate glass 98 for compensation of the optical length decreases an unfocused area on the imaging plane 34 of the diagonal optical system 30.
(87) The present invention is not limited to the embodiment described above, and includes any alteration and modification without departing from the technical scope and the spirit of the present invention as defined in the appended claims.
REFERENCE SIGNS LIST
(88) 8: Bonding target 10: (Wire bonding) Apparatus 11: Apparatus main body 12: Mounting table 13: Bonding stage 14: Transfer rail 15: XY stage 16: Mirror 17: Linear motor 18: Reference mark (reference pattern as reference for positioning) 19: Reference mark (on imaging plane) 20: Bonding head 21: Bonding arm 22: Transducer 24: Capillary 25: Capillary (on imaging plane) 26: Positioning camera 28: Lighting apparatus 30: Diagonal optical system 32: Telecentric optical system 32a: Lens 32b: Diaphragm 32c: Object plane 34: Imaging plane 40: Control unit 42: Bonding processor 44: Tool landing position estimating unit 46: Offset movement processor 48: Tool-height change processor 50: Imaging processor for tool and its image 52: Landing position calculation processor 60: (Capillary'S) Virtual image 61: Capillary virtual image (on imaging plane) 62: Diffuser plate 64: (Capillary'S) Shadow image 66: Semiconductor device 68: Positioning pattern 69: Pad 70: Flip-chip mounting apparatus 71: Die bonding apparatus 72: Flip-chip tool (tool for die bonding apparatus) 74: Wafer 76: Intermediate stage 78: Rear camera 80: Substrate 82: (Flip-chip tool's) Shadow image 90: First optical system 92: Lens 94: Image forming plane 96: Straight line 98: Parallel planar plate glass 100, 102: Object 104, 106, 108: Area