Transimpedance amplifier with variable inductance input reducing peak variation over gain
10574195 ยท 2020-02-25
Assignee
Inventors
Cpc classification
H03F2203/45528
ELECTRICITY
H03F3/45179
ELECTRICITY
International classification
H03F1/34
ELECTRICITY
H03F1/08
ELECTRICITY
H03F1/32
ELECTRICITY
Abstract
A transimpedance amplifier (TIA) structure includes an input node with a variable inductance component serving to reduce variation in peak amplitude over different gain conditions. According to certain embodiments, an inductor at the TIA input has a first node in communication with a Field Effect Transistor (FET) drain, and a second node in communication with the FET source. A control voltage applied to the FET gate effectively controls the input inductance by adding a variable impedance across the inductor. Under low gain conditions, lowering of inductance afforded by the control voltage applied to the FET reduces voltage peaking. TIAs in accordance with embodiments may be particularly suited to operate over a wide dynamic range to amplify incoming electrical signals received from a photodiode.
Claims
1. A method comprising: adding variable impedance at an input terminal of a variable-gain transimpedance amplifier that is coupled to a photodetector in order to reduce a peak voltage at an output terminal of the transimpedance amplifier, by: determining a control voltage according to a gain of the transimpedance amplifier, and adding the variable impedance by applying the control voltage to a variable inductance component located between the photodetector and the input terminal, wherein the variable inductance component consists of a two-terminal inductor and a switch, the switch comprising, a control contact receiving the control voltage, a first contact in communication with a first node of the two-terminal inductor, the first node in communication with a photodiode, and a second contact at a second node of the two-terminal inductor, the second node in communication with the input terminal.
2. The method of claim 1 wherein the switch comprises a transistor.
3. The method of claim 2 wherein the switch comprises a field-effect transistor (Fet).
4. The method of claim 3 wherein: the control contact comprises a gate of the Fet in communication with a variable voltage source; the first contact comprises a drain of the Fet; and the second contact comprises a source of the Fet.
5. The method of claim 3 wherein the Fet comprises a JFET.
6. The method of claim 3 wherein the Fet comprises a FinFet.
7. The method of claim 3 wherein the Fet comprises a MOSFET.
8. The method of claim 7 wherein the Fet comprises a SiGe bi-CMOS field effect transistor having: a gate receiving the control voltage from a variable voltage source through a resistor, a drain at a first node of the inductor and in communication with a photodiode, and a source at a second node of the inductor and in communication with the input terminal.
9. The method of claim 8 wherein the transimpedance amplifier is configured to operate with a dynamic range of about 18 dB to about 20 dB.
10. The method of claim 8 wherein the transimpedance amplifier is configured to operate with a dynamic range of about 15 dB to about 18 dB.
11. The method of claim 8 wherein the variable control voltage is configured to reduce the peak voltage at the output terminal under low gain conditions.
12. The method of claim 1 further comprising providing another two-terminal inductor between the photodiode and the input terminal.
13. The method of claim 1 wherein the input terminal is in electrical communication with the photodiode across a chip boundary.
14. The method of claim 1 wherein the transimpedance amplifier is configured to operate with a dynamic range of about 18 dB to about 20 dB.
15. The method of claim 1 wherein the transimpedance amplifier is configured to operate with a dynamic range of about 15 dB to about 18 dB.
16. The method of claim 1 wherein the variable control voltage is configured to reduce the peak voltage at the output terminal under low gain conditions.
17. The method of claim 1 wherein the peak voltage is reduced by about 3 dB.
18. The method of claim 13 wherein further comprising providing another two-terminal inductor between the photodiode and the chip boundary.
19. The method of claim 1, wherein the gain of the transimpedance amplifier is controlled using a gain voltage, and wherein the control voltage is determined using the gain voltage.
20. The method of claim 1, wherein the variable impedance decreases in response to the gain of the transimpedance amplifier decreasing, and wherein the variable impedance increases in response to the gain of the transimpedance amplifier increasing.
Description
BRIEF DESCRIPTION OF THE DRAWINGS
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DETAILED DESCRIPTION
(6) Embodiments are directed to apparatuses and methods of providing trans-impedance amplifiers. More specifically, particular embodiments provide transimpedance amplifiers with variable inductance input to reduce peaking behavior over different gain conditions. There are other embodiments as well.
(7) The following description is presented to enable one of ordinary skill in the art to make and use the invention and to incorporate it in the context of particular applications. Various modifications, as well as a variety of uses in different applications will be readily apparent to those skilled in the art, and the general principles defined herein may be applied to a wide range of embodiments. Thus, the present invention is not intended to be limited to the embodiments presented, but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.
(8) In the following detailed description, numerous specific details are set forth in order to provide a more thorough understanding of the present invention. However, it will be apparent to one skilled in the art that the present invention may be practiced without necessarily being limited to these specific details. In other instances, well-known structures and devices are shown in block diagram form, rather than in detail, in order to avoid obscuring the present invention.
(9) The reader's attention is directed to all papers and documents which are filed concurrently with this specification and which are open to public inspection with this specification, and the contents of all such papers and documents are incorporated herein by reference. All the features disclosed in this specification, (including any accompanying claims, abstract, and drawings) may be replaced by alternative features serving the same, equivalent or similar purpose, unless expressly stated otherwise. Thus, unless expressly stated otherwise, each feature disclosed is one example only of a generic series of equivalent or similar features.
(10) Furthermore, any element in a claim that does not explicitly state means for performing a specified function, or step for performing a specific function, is not to be interpreted as a means or step clause as specified in 35 U.S.C. Section 112, Paragraph 6. In particular, the use of step of or act of in the Claims herein is not intended to invoke the provisions of 35 U.S.C. 112, Paragraph 6.
(11) Please note, if used, the labels left, right, front, back, top, bottom, forward, reverse, clockwise and counter clockwise have been used for convenience purposes only and are not intended to imply any particular fixed direction. Instead, they are used to reflect relative locations and/or directions between various portions of an object.
(12) The trans-impedance amplifier or TIA is a key component in high-speed communication (e.g., fiber optic) networks and systems. To accommodate the continual demand for more data bandwidth over such networks and systems, multi-level signaling (e.g., pulse-amplitude modulation or PAM) has been deployed. The use of multi-level signaling in turn demands higher performance from the TIAs in the system. Specifically, the TIA needs to accurately reproduce the multiple levels of the signal with low distortion (e.g., high linearity), low noise, and wide bandwidth, while leveraging power-efficient and cost-effective semiconductor manufacturing processes and materials (e.g., Si CMOS).
(13)
(14) As shown in
(15) The plurality of TIAs 108 are a critical component of fiber optic communication system 100 in that they enable an accurate (e.g., low BER) recovery of the information contained within input data 110. The plurality of TIAs 108 accomplishes this, in part, by converting the optical representation of input data 110 into the voltage representation of input data 110. As more sophisticated signal modulation and longer links are deployed, techniques are needed meet these requirements by implementing a low cost TIA that exhibits high linearity, low noise, low power, and wide bandwidth.
(16)
(17) As shown in
(18) In some embodiments, each of the plurality of buffers 203 is configured to be a unity gain buffer with very low output impedance. In certain embodiments, voltage V.sub.TUNEn 212 and voltage V.sub.TUNEp 214 are controlled by analog AC control loop 205 to produce a fixed peak-to-peak output voltage determined by the difference between a negative output voltage V.sub.OUTn 215 and a positive output voltage V.sub.OUTp 216, respectively. In some embodiments, analog AC control loop 205 can include an analog power rectifier and comparator, and an analog control loop. In certain embodiments, the bias or DC voltage at the input of first inverting amplifier 202.sub.1 is controlled, in part, by analog DC control loop 204 through a transistor T.sub.PDCn 217 and first feedback resistor RF 206.sub.1, and the bias or DC voltage at the input of second inverting amplifier 202.sub.2 is controlled, in part, by analog DC control loop 204 through a transistor T.sub.DCp 218 and second feedback resistor RF 206.sub.2. Such control of the DC voltages at the input of first inverting amplifier 202.sub.1 and second inverting amplifier 202.sub.2 can serve to prevent unwanted DC currents that can increase power dissipation and degrade total harmonic distortion or THD.
(19) In some embodiments, the desired operation and performance of the implementation shown in schematic 200 can require that both first buffer 203.sub.1 and second buffer 203.sub.2 have a very high bandwidth and very low output impedance (e.g., a few ohms at frequencies greater than 1 GHz). Such performance cannot be achieved using a cost-effective semiconductor manufacturing process (e.g., 28 nm CMOS) with either widely used device structures (e.g., planar FET) or specialized device structures (e.g., FinFET). This is due, in part, to differences in device transconductance or g.sub.m among various semiconductor manufacturing processes (e.g., CMOS FET g.sub.m is less than SiGe bipolar g.sub.m). For example, transistor T.sub.GCn 211 and transistor T.sub.GCp 213 that are tuned by analog AC control loop 205 would need to range from a very small impedance (e.g., 2-3) to a very large impedance (e.g., over 100 k). If implemented in CMOS, the size of transistor T.sub.GCn 211 and transistor T.sub.GCp 213 required to meet these metrics would result in parasitic capacitances that would significantly limit the TIA bandwidth (e.g., when gain control is not needed). Further, high linearity is difficult to achieve using transistor T.sub.GCn 211 and transistor T.sub.GCp 213 in a series configuration as the characteristics of the devices will change as various device voltages (e.g., V.sub.GS and V.sub.BS) change with first current I.sub.PD 220.sub.1 and second current I.sub.PD 220.sub.2, respectively. Further, in some embodiments, distortion can increase as more AC current is shunted away from first inverting amplifier 202.sub.1 and second inverting amplifier 202.sub.2, and into first buffer 203.sub.1 and second buffer 203.sub.2, respectively. Thus, there is a need for techniques implementing a TIA that exhibits high linearity, low noise, low power, and wide bandwidth.
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(21) Several inductances are represented in the connection between the PD and the TIA. The inductance L.sub.bw 308 represents the inductance of the bond wire (bw) between the PD and the chip including the TIA. The inductance L.sub.1 310 represents at least the inherent inductance offered by electrical conductors present on the chip leading to the TIA.
(22) It is noted that the PD is expected to operate under a variety of conditions. That is, the PD is designed to produce a corresponding output current in response to incoming optical signals varying over a wide range of intensities (weak to strong).
(23) It is the responsibility of the TIA to amplify this incoming electrical signal. To accommodate the variance in input current, the TIA is configured to operate under different gain conditions (represented by the arrow 312). In some embodiments this dynamic range of TIA operation may be about 20 dB, may be about 18 dB, may be about 15 dB, may be about 10 dB, or may be about 5 dB.
(24) However, one result of operating the TIA under such a wide spectrum of possible gain conditions, is that the optimal input impedance of the TIA also changes. This, in combination with capacitance effects, gives rise to unwanted distortion in output of the TIA. In particular, output voltage of the TIA may exhibit peaking under low gain conditions.
(25) Accordingly, in order to avoid this distortion, embodiments provide the TIA structure with a variable inductance component 320 at the input node 322. That variable inductance component functions to reduce variation in peak amplitude over different gain conditions.
(26) In the particular embodiment of
(27) In certain embodiments the FET 328 may be of a SiGe bi-CMOS design. However this is not required, and the FET could be of other designs, including but not limited to JFET or FinFet.
(28) A control voltage V.sub.L 332 from a voltage source 334 is applied to the FET gate 335 via resistor 336. This control voltage effectively controls the input inductance to the TIA by adding a variable impedance across the inductor L.sub.2.
(29) Under high gain conditions, the optimal input impedance of the TIA is high. Thus an elevated effective input inductance (e.g., the full L.sub.bw+L.sub.1+L.sub.2) is needed in order to achieve bandwidth. The Fet1 control bias is small or zero.
(30) Under low gain conditions, the optimal input impedance of the TIA is lower. A high Fet1 control bias V.sub.L, V.sub.L>>V.sub.in+V.sub.th applied to the Fet1 shorts out the inductor L.sub.2. The effective inductance from the photodiode (PD) to the TIA is then reduced from L.sub.bw+L.sub.1+L.sub.2 to L.sub.bw+L.sub.1.
(31) As mentioned above, unwanted voltage peaking behavior may be observed for a TIA that is operated under lower gain conditions. According to embodiments, this unwanted peaking behavior may be reduced or eliminated by applying a control voltage to the FET.
(32) Specifically, at intermediate control voltages V.sub.L the inductance L.sub.2 is not fully shorted. It then becomes a resistor-inductor-capacitor (RLC) network as shown in
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Here, the second term represents parasitic capacitance effects arising from the FET gate (g). Reduced peaking variation is achieved by actively controlling the effective inductance at the input of the TIA.
(34)
(35) In
(36) Low gain conditions 502: Vgc=0, 0.5, and 1.0
(37) High gain conditions 504: Vgc=1.5, 2.0, and 2.5
(38) A total of twelve (12) gain curves are shown in
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(41) Returning to
(42) Other embodiments, however, may feature different structures in place of the Fet architecture. One example could be a micro-electrical mechanical system (MEMS) comprising a switch including a moveable element (e.g., a deformable membrane).
(43) While the above is a full description of the specific embodiments, various modifications, alternative constructions and equivalents may be used. Therefore, the above description and illustrations should not be taken as limiting the scope of the present invention which is defined by the appended claims.