Adaptive nulling metasurface retrofit
10573963 ยท 2020-02-25
Assignee
Inventors
Cpc classification
H01Q15/0053
ELECTRICITY
International classification
Abstract
An adaptive detection and nulling system includes an antenna or radio frequency aperture, an electronically tunable radome placed over the antenna or radio frequency aperture, the radome including a plurality of scatterers on a substrate, and one or more tunable reactance elements connecting at least two of the scatterers, a microcontroller coupled to the tunable reactive elements and configured to control the reactance values of the one or more tunable reactance elements, and a sensing circuit coupled to the microcontroller, wherein inputs from the sensing circuit are used by the microcontroller to adaptively determine bias voltages to the one or more tunable reactance elements using characterization data of the radome to control the tunable reactance elements to form one or more nulls in a receive radiation pattern of the antenna.
Claims
1. An adaptive detection and nulling system comprising: an antenna or radio frequency aperture; an electronically tunable radome placed over the antenna or radio frequency aperture, the radome comprising: a plurality of scatterers on a substrate; and one or more tunable reactance elements connecting at least two of the scatterers; a microcontroller coupled to the tunable reactive elements and configured to control the reactance values of the one or more tunable reactance elements; and a sensing circuit coupled to the microcontroller, wherein inputs from the sensing circuit are used by the microcontroller to adaptively determine bias voltages to the one or more tunable reactance elements using characterization data of the radome to control the tunable reactance elements to form one or more nulls in a receive radiation pattern of the antenna.
2. The adaptive nulling system of claim 1, wherein the microcontroller is located outside the radome.
3. The adaptive nulling system of claim 1, wherein the spacing between two adjacent scatterers is equal to or less than one fourth of a wavelength of interest.
4. The adaptive nulling system of claim 1, wherein the scatterers comprise crossed dipoles.
5. The adaptive nulling system of claim 1, wherein the one or more tunable reactance elements are surface integrated reactance banks.
6. The adaptive nulling system of claim 1, wherein the tunable reactance elements comprise one or more switches, or GaN or SiC transistors.
7. The adaptive nulling system of claim 1, wherein the one or more sensing circuits comprise one or more limiters.
8. The adaptive nulling system of claim 7, wherein the one or more sensing circuits further comprise automatic protection for a receiver from a high power interferer.
9. The adaptive nulling system of claim 1, wherein the one or more sensing circuits comprise one or more microprocessors.
10. The adaptive nulling system of claim 1, wherein the one or more sensing circuits are on the electronically tuned radome.
11. The adaptive nulling system of claim 1: wherein the antenna or radio frequency aperture is an existing antenna or radio frequency aperture; and wherein the existing antenna or radio frequency aperture is not changed or modified by the radome.
12. The adaptive nulling system of claim 1: wherein resistively loaded bias lines on the radome connect the microcontroller and the tunable reactance elements; or wherein capacitively loaded bias lines on the radome connect the microcontroller and the tunable reactance elements.
13. An electronically tunable radome comprising: a plurality of scatterers on a substrate; one or more tunable reactance elements connecting at least two of the scatterers; and a microcontroller configured to adaptively determine bias voltages to the one or more tunable reactance elements using characterization data of the radome to control the tunable reactance elements, wherein the microcontroller generates different receive radiation patterns to locate a bearing of an interferer and to place a receive null at the bearing of the interferer that the radome is activated to protect.
14. The tunable radome of claim 13, wherein the reactance elements are surface integrated reactance banks.
15. The tunable radome of claim 13, wherein the tunable reactance elements comprise one or more switches, or GaN or SiC transistors.
16. The tunable radome of claim 13 further comprising; an antenna, wherein the radome is over the antenna; a receiver; a sensing circuit coupled to the antenna and the receiver; wherein the sensing circuit automatically protects the receiver from high power from the interferer; and wherein the sensing circuit provides an input to the microcontroller for controlling the tunable reactance elements to null the interferer.
17. The tunable radome of claim 16: wherein the antenna is an existing antenna; and wherein the existing antenna is not changed or modified.
18. The tunable radome of claim 13: wherein resistively loaded bias lines on the radome are coupled between the microcontroller and the tunable reactance elements; or wherein capacitively loaded bias lines on the radome are coupled between the microcontroller and the tunable reactance elements.
19. The adaptive nulling system of claim 13, wherein the spacing between two adjacent scatterers is equal to or less than one fourth of a wavelength of interest.
20. A method of adaptive nulling, comprising: providing a plurality of scatterers on a substrate forming a radome; providing one or more reactive elements connecting at least two of the scatterers; placing the radome over an existing antenna; correlating received voltage amplitudes with a known array manifold characterization of the radome to determine a bearing of an interferer; and generating one or more nulls in the direction of the bearing of the interferer by controlling the reactive elements with a microcontroller, wherein the existing antenna is not changed or modified.
21. A method for an electronically tunable radome, comprising: providing a plurality of scatterers on a substrate forming a radome; providing one or more reactive elements connecting at least two of the scatterers; correlating received voltage amplitudes with a known array manifold characterization of the radome to determine a bearing of an interferer; and generating one or more nulls in the direction of the bearing of the interferer by controlling the reactive elements with a microcontroller.
Description
BRIEF DESCRIPTION OF THE DRAWINGS
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DETAILED DESCRIPTION
(11) In the following description, numerous specific details are set forth to clearly describe various specific embodiments disclosed herein. One skilled in the art, however, will understand that the presently claimed invention may be practiced without all of the specific details discussed below. In other instances, well known features have not been described so as not to obscure the invention.
(12) To overcome the many deficiencies in the prior arts and to meet the urgent needs of communication and sensing systems that operate with high sensitivity, several embodiments of a radome are disclosed which can be placed over existing antennas to autonomously identify the bearing of one or more high power threats and subsequently null said threats without changing or replacing the existing antennas.
(13) An exploded view of a high power adaptive radome 202 is illustrated in
(14) As illustrated in
(15) System 400 in
(16) a=Board Width=285.75 mm
(17) b=Board Length=285.75 mm
(18) s=Element Spacing=47.625 mm
(19) g=Gap Distance=18.875 mm
(20) u=Unit Cell Size=28.75 mm
(21) w=Trace Width=9.25 mm
(22) d=Radome Spacing=36 mm
(23) Though the preferred value of the radome spacing d from the antenna is less than or equal to /4, where , is the wavelength of the interferer where the null is being steered, it can be greater than /4 as well. The element spacing s can be /4 or less. The elements are typically made with electrical conductors such as copper.
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(25) To determine the bearing of the high power interferer in the environment and subsequently place a null in the direction of the interference, as illustrated in
(26) The method 700 illustrated via a flow chart in
(27) If in step 732 a threat is identified and the limiter is turned on, then the process begins to locate the bearings of the incident threat and to create a null in the direction of the threat. This location of the bearings and the subsequent nulling process includes one or more of three distinct steps 734, 735 and 736. First, in step 734, at least three different bias configurations are supplied to the reactance elements of the radome in sequence, generating at least three different receive radiation patterns sequentially. A bias configuration of the radome comprises of a matrix of reactance values of the elements (a.sub.11 through a.sub.MN where there are M rows and N columns of reactance elements in the radome). In a voltage controlled reactance bank, reactance values are changed by changing the voltage applied to the reactance elements. Bias lines in the radome are used to apply these bias voltages to the reactance elements. Each bias configuration is applied one at a time. As bias voltages are applied to the reactance elements in the radome to create each bias configuration, the received I&Q values are measured by sensing circuits 650 and stored by the microcontroller 660, as shown in
(28) If there are multiple interferers in the field of view, the highest amplitude interferer is first nullified and the process is repeated to sequentially nullify additional interferers. The reactance bank 208 array can also be subdivided into sub arrays to cover each of the interferers. Additional sensing circuits 650 can be added as needed.
(29) The process of detecting the bearings of the interferer and the subsequent nulling is illustrated in system 800 of
(30) The location in azimuth and elevation of the peak of this correlation function should correspond to the bearing of the high power threat. Once the bearing 805 is determined, the microcontroller reconfigures the bias voltages supplied to the radome to place a null in the direction of the interferer 804. The exact combination of voltages required to generate a null in a desired direction may be determined before installation using a combination of full wave simulation and measurements. Once a null has been placed in the direction of the interferer the limiting portion of the circuit deactivates automatically and allows the receiver to continue functioning normally at other angles.
(31) The characterization of the proposed radome will help determine the bias voltages required to create the receive patterns that will generate a null in a given direction. The characterization data of the radome is obtained in a two-step test process. The augmentation matrix A, part of the characterization data, is the result of the characterization of the array manifold data. This is the first step in the characterization process. The second step in the test process is the characterization of the bias voltages to yield a specific receive pattern and to measure the received voltages at the various sensor locations in order to create a correlation data table, part of the characterization data of the radome, correlating the bias voltages to the measured sensor voltages. In this illustration, V1, V2 and V3 are measured voltages in the three sensor locations in response to a receive radiation pattern.
(32) To determine the augmentation matrix A, the radome is subjected to a far-field characterization test in an antenna test environment. A known interferer is introduced with a predetermined amplitude and frequency for a given set of bias voltages, the sensors are read out for received voltages. The test is repeated as the location of the interferer is moved around in lateral as well as in azimuth directions. The bias voltages and the amplitude of the interferer are kept the same. The augmentation matrix can be computed with the measured test data.
(33) The second step in the characterization process is to measure the impact of bias voltages on measured sensor voltages for the given radome with a known augmentation matrix from the first step. This test is also carried out in an antenna far-field characterization lab. A known interferer is introduced with a known amplitude and frequency and the sensor voltages are measured for a given set of bias voltages. Without moving the interferer, the bias voltages are changed and the corresponding sensor voltages are measured. Change of bias voltages change the reactance values of the reactance elements in the radome, which in turn changes the sensed voltages. Note that the sensors are located under the radome and are influenced by the reactivity of the radome. The test set can also be repeated for additional locations of the interferer. From this test data, one can create a characterization table that will help determine the range of bias voltages to be applied to the reactance elements in the radome to create corresponding sensor voltages.
(34) The inventive concepts described above can be implemented in a variety of ways. The sensor 220 may be as described with reference to
(35) In particular configurations, it may be desirable to have the sensing circuits and bias control circuits be built into the radome. In other configurations, the sensing circuit and the bias control circuits along with a microprocessor can be located on a separate card or unit located nearby or between the antenna and the receiver.
(36) This invention potentially has significant value to various airborne and maritime platforms containing sensitive navigation, communication, and sensing platforms. Furthermore, this invention is useful for traditional RF communication systems of various kinds. Satellite receivers can use this invention to protect their circuits from nearby transmitters.
(37) Having now described the invention in accordance with the requirements of the patent statutes, those skilled in this art will understand how to make changes and modifications to the present invention to meet their specific requirements or conditions. Such changes and modifications may be made without departing from the scope and spirit of the invention as disclosed herein.
(38) The foregoing Detailed Description of exemplary and preferred embodiments is presented for purposes of illustration and disclosure in accordance with the requirements of the law. It is not intended to be exhaustive nor to limit the invention to the precise form(s) described, but only to enable others skilled in the art to understand how the invention may be suited for a particular use or implementation. The possibility of modifications and variations will be apparent to practitioners skilled in the art. No limitation is intended by the description of exemplary embodiments which may have included tolerances, feature dimensions, specific operating conditions, engineering specifications, or the like, and which may vary between implementations or with changes to the state of the art, and no limitation should be implied therefrom. Applicant has made this disclosure with respect to the current state of the art, but also contemplates advancements and that adaptations in the future may take into consideration of those advancements, namely in accordance with the then current state of the art. It is intended that the scope of the invention be defined by the Claims as written and equivalents as applicable. Reference to a claim element in the singular is not intended to mean one and only one unless explicitly so stated. Moreover, no element, component, nor method or process step in this disclosure is intended to be dedicated to the public regardless of whether the element, component, or step is explicitly recited in the Claims. No claim element herein is to be construed under the provisions of 35 U.S.C. Sec. 112, sixth paragraph, unless the element is expressly recited using the phrase means for . . . and no method or process step herein is to be construed under those provisions unless the step, or steps, are expressly recited using the phrase comprising the step(s) of . . . .
(39) Modifications, additions, or omissions may be made to the systems, apparatuses, and methods described herein without departing from the scope of the invention. The components of the systems and apparatuses may be integrated or separated. Moreover, the operations of the systems and apparatuses may be performed by more, fewer, or other components. The methods may include more, fewer, or other steps. Additionally, steps may be performed in any suitable order. As used in this document, each refers to each member of a set or each member of a subset of a set.
(40) To aid the Patent Office, and any readers of any patent issued on this application in interpreting the claims appended hereto, applicants wish to note that they do not intend any of the appended claims or claim elements to invoke paragraph 6 of 35 U.S.C. Section 112 as it exists on the date of filing hereof unless the words means for or step for are explicitly used in the particular claim.