Electrical storage system with a sheet-like discrete element, sheet-like discrete element, method for producing same, and use thereof
10566584 ยท 2020-02-18
Assignee
Inventors
- Thorsten DAMM (Nieder-Olm, DE)
- Ulrich Peuchert (Bodenheim, DE)
- Nikolaus Schultz (Essenheim, DE)
- Miriam KUNZE (Saulheim, DE)
- Clemens Ottermann (Hattersheim, DE)
Cpc classification
C03C3/078
CHEMISTRY; METALLURGY
C03C17/3668
CHEMISTRY; METALLURGY
Y02P70/50
GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
H01M4/525
ELECTRICITY
Y02E60/10
GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
C03C3/083
CHEMISTRY; METALLURGY
H01M50/131
ELECTRICITY
C03C3/087
CHEMISTRY; METALLURGY
H01M10/0585
ELECTRICITY
H01M4/131
ELECTRICITY
H01M10/0436
ELECTRICITY
H01M10/0525
ELECTRICITY
H01M2220/30
ELECTRICITY
International classification
C03C3/087
CHEMISTRY; METALLURGY
H01M10/0525
ELECTRICITY
C03C3/078
CHEMISTRY; METALLURGY
C03C23/00
CHEMISTRY; METALLURGY
C03C3/083
CHEMISTRY; METALLURGY
Abstract
An electrical storage system is provided that has a thickness of less than 2 mm and includes comprises at least one sheet-like discrete element. At least one surface of the at least one sheet-like discrete element is designed to be chemically reactive to a reduced degree, inert, and/or permeable to a reduced degree, and/or impermeable with respect to materials coming into contact with the surface. Also provided are a sheet-like discrete element and to the production and use thereof.
Claims
1. An electrical storage system, comprising: a thickness of less than 2 mm; a sheet-like discrete element made of glass; a barrier layer on a surface of the sheet-like discrete element, the barrier layer being permeable to a reduced degree with respect to lithium coming into contact with the surface, wherein the barrier layer comprises an element selected from the group consisting of a nitride of Si, oxide of Si, carbide of Si, nitride of Al, nitride of Cr, nitride of Ti, nitride of Zr, nitride of Hf, nitride of Ta, oxide of Al, oxide of Cr, oxide of Ti, oxide of Zr, oxide of Hf, oxide of Ta, and any combinations thereof, and an anode, a cathode, and an electrolyte on the barrier layer, wherein the glass is selected from any of the following composition ranges, in wt %: TABLE-US-00039 No. 1 No. 2 No. 3 No. 4 No. 5 SiO.sub.2 30-85 58-65 64-74 75-85 50-65 B.sub.2O.sub.3 3-20 6-10.5 8-18 0-6 Al.sub.2O.sub.3 0-15 14-25 0.5-4.5 15-20 Li.sub.2O 0-6 Na.sub.2O 3-15 6-10 1.5-5.5 8-15 K.sub.2O 3-15 6-10 0-2 0-5 MgO 0-3 0-5 CaO 0-0.1 0-9 5-9 0-7 BaO 3-8 0-4 0-4 ZnO 0-12 0-2 2-6 0-4 TiO.sub.2 0.5-10.sup. 0-2 0-1 MgO + CaO + .sup.8-18. BaO
2. The electrical storage system as claimed in claim 1, wherein the glass further comprises from 0 to 1 wt % of refining agents selected from the group consisting of SnO.sub.2, CeO.sub.2, As.sub.2O.sub.3, Cl.sup., F.sup., and sulfates.
3. The electrical storage system as claimed in claim 1, wherein the barrier layer comprises a vertical composition variation of the surface so as to provide no direct diffusion paths into the sheet-like discrete element.
4. The electrical storage system as claimed in claim 3, wherein the vertical composition variation comprises getter materials for alkali and/or alkaline earth metals.
5. The electrical storage system as claimed in claim 3, wherein the vertical composition variation comprises a sequence of at least adjacent layers having a different composition.
6. The electrical storage system as claimed in claim 1, wherein the barrier layer is a plasma-assisted coating or an atomic layer deposition (ALD) coating.
7. The electrical storage system as claimed in claim 1, wherein the barrier layer has a barrier effect initiated by a separate annealing step prior to application of a current conductor or the anode.
8. The electrical storage system as claimed in claim 1, wherein the barrier layer has a barrier effect initiated during annealing of the anode.
9. The electrical storage system as claimed in claim 1, wherein the sheet-like discrete element comprises a substrate having a transmittance selected from the group consisting of: 0.1% or more in a range from 200 nm to 270 nm at a thickness of 30 m; more than 0.5% at 222 nm at a thickness of 30 m; more than 0.3% at 248 nm at a thickness of 30 m; more than 3% in at 282 nm at a thickness of 30 m; more than 50% at 308 nm at a thickness of 30 m; more than 88% at 351 nm at a thickness of 30 m; 0.1% or more in a range from 200 nm to 270 nm at a thickness of 100 m; more than 0.5% at 222 nm at a thickness of 100 m; more than 0.3% at 248 nm at a thickness of 100 m; more than 0.1% at 282 nm at a thickness of 100 m; more than 30% at 308 nm at a thickness of 100 m; and more than 88% at 351 nm at a thickness of 100 m.
10. The electrical storage system as claimed in claim 1, wherein the sheet-like discrete element has transmittance values that, due to the barrier layer, are reduced by less than 60%.
11. The electrical storage system as claimed in claim 1, wherein the barrier coating is amorphous.
12. The electrical storage system as claimed in claim 1, wherein the sheet-like discrete element has thickness variation of not more than 25 m based on a wafer size in a range of >100 mm in diameter.
13. The electrical storage system as claimed in claim 1, wherein the sheet-like discrete element has a water vapor transmission rate (WVTR) of <10.sup.3g/(m.sup.2.Math.d).
14. The electrical storage system as claimed in claim 1, wherein the sheet-like discrete element has a thickness selected from the group consisting of less than 2 mm, less than 1 mm, less than 500 m, less than or equal to 200 m, and not more than 100 m.
15. The electrical storage system as claimed in claim 1, wherein the sheet-like discrete element has a property selected from the group consisting of: a specific electrical resistance at a temperature of 350 C. and at an alternating current with a frequency of 50 Hz of greater than 1.0*10.sup.6 Ohm.Math.cm, a maximum load temperature .sub.Max of at least 300 C., a coefficient of linear thermal expansion in a range from 2.0*10.sup.6/K to 10*10.sup.6/K, a relationship of a product of the maximum load temperature .sub.Max and the coefficient of linear thermal expansion of: 600.Math.10.sup.6.sub.Max.Math.<8000.Math.10.sup.6, and combinations thereof.
16. A sheet-like discrete element made of glass for use in an electrical storage system, comprising: a glass substrate having a surface; and a barrier layer on the surface, the barrier layer being a barrier against the diffusion of lithium, wherein the barrier layer wherein the barrier layer comprises an element selected from the group consisting of a nitride of Si, oxide of Si, carbide of Si, nitride of Al, nitride of Cr, nitride of Ti, nitride of Zr, nitride of Hf, nitride of Ta, oxide of Al, oxide of Cr, oxide of Ti, oxide of Zr, oxide of Hf, oxide of Ta, and any combinations thereof, wherein the barrier layer provides to direct diffusion paths into the glass, and wherein the glass substrate comprises glass is selected from any of the following composition ranges, in wt %: TABLE-US-00040 No. 1 No. 2 No. 3 No. 4 No. 5 SiO.sub.2 30-85 58-65 64-74 75-85 50-65 B.sub.2O.sub.3 3-20 6-10.5 8-18 0-6 Al.sub.2O.sub.3 0-15 14-25 0.5-4.5 15-20 Li.sub.2O 0-6 Na.sub.2O 3-15 6-10 1.5-5.5 8-15 K.sub.2O 3-15 6-10 0-2 0-5 MgO 0-3 0-5 CaO 0-0.1 0-9 5-9 0-7 BaO 3-8 0-4 0-4 ZnO 0-12 0-2 2-6 0-4 TiO.sub.2 0.5-10.sup. 0-2 0-1 MgO + CaO + .sup.8-18. BaO
17. The sheet-like discrete element as claimed in claim 16, wherein the glass further comprises from 0 to 1 wt % of refining agents selected from the group consisting of SnO.sub.2, CeO.sub.2, As.sub.2O.sub.3, Cl.sup., F.sup., and sulfates.
18. The sheet-like discrete element as claimed in claim 16, wherein the barrier layer comprises a vertical composition variation so as to provide no direct diffusion paths into the glass.
19. The sheet-like discrete element as claimed in claim 18, wherein the composition includes getter materials for alkali and/or alkaline earth metals.
20. The sheet-like discrete element as claimed in claim 16, wherein the composition is varied vertically by comprising a sequence of at least two layers having a different composition.
21. The sheet-like discrete element as claimed in claims 16, wherein the barrier layer is a plasma-assisted layer or an atomic layer deposition (ALD) layer.
22. The sheet-like discrete element as claimed in claim 16, wherein the glass substrate has a transmittance selected from the group consisting of: 0.1% or more in a range from 200 nm to 270 nm at a thickness of 30 m; more than 0.5% at 222 nm at a thickness of 30 m; more than 0.3% at 248 nm at a thickness of 30 m; more than 3% in at 282 nm at a thickness of 30 m; more than 50% at 308 nm at a thickness of 30 m; more than 88% at 351 nm at a thickness of 30 m; 0. 1% or more in a range from 200 nm to 270 nm at a thickness of 100 m; more than 0.5 % at 222 nm at a thickness of 100 m; more than 0.3% at 248 nm at a thickness of 100 m; more than 0.1% at 282 nm at a thickness of 100 m; more than 30% at 308 nm at a thickness of 100 m; and more than 88% at 351 nm at a thickness of 100 m.
23. The sheet-like discrete element as claimed in claim 16, wherein the sheet-like discrete element has transmittance values that, due to the barrier layer, are reduced relative to those of the glass substrate by less than 60%.
24. The sheet-like discrete element as claimed in claims 16, wherein the barrier layer is amorphous.
25. The sheet-like discrete element as claimed in claim 16, wherein the glass substrate has a thickness variation of not more than 25 m based on wafer or substrate sizes in a range of >100 mm in diameter.
26. The sheet-like discrete element as claimed in claim 16, wherein the glass substrate has a thickness selected from the group consisting of less than 2 mm, less than 1 mm, less than 500 m, less than or equal to 200 m, and not more than 100 m.
27. The sheet-like discrete element as claimed in claim 16, further comprising a property selected from the group consisting of a water vapor transmission rate (WVTR) of <10.sup.3g/(m.sup.2.Math.d), a specific electrical resistance at a temperature of 350 C. and at an alternating current with a frequency of 50 Hz of greater than 1.0*10.sup.6 Ohm.Math.cm, a maximum load temperature .sub.Max of at least 300 C., a coefficient of linear thermal expansion a in a range from 2.0*10.sup.6/K to 10*10.sup.6/K, a relationship of a product of the maximum load temperature .sub.Max and the coefficient of linear thermal expansion of: 600.Math.10.sup.6<.sub.Max.Math.<8000.Math.10.sup.6, and combinations thereof.
28. A sheet-like discrete element made of glass for use in an electrical storage system, comprising: a glass substrate having a surface; and a barrier layer on the surface, the barrier layer being a barrier against the diffusion of lithium and comprising Si.sub.3N.sub.4, wherein the glass substrate comprises glass is selected from any of the following composition ranges, in wt %: TABLE-US-00041 No. 1 No. 2 No. 3 No. 4 No. 5 SiO.sub.2 30-85 58-65 64-74 75-85 50-65 B.sub.2O.sub.3 3-20 6-10.5 8-18 0-6 Al.sub.2O.sub.3 0-15 14-25 0.5-4.5 15-20 Li.sub.2O 0-6 Na.sub.2O 3-15 6-10 1.5-5.5 8-15 K.sub.2O 3-15 6-10 0-2 0-5 MgO 0-3 0-5 CaO 0-0.1 0-9 5-9 0-7 BaO 3-8 0-4 0-4 ZnO 0-12 0-2 2-6 0-4 TiO.sub.2 0.5-10 0-2 0-1 MgO + CaO + BaO 8-18.
29. The sheet-like discrete element as claimed in claim 28, wherein the barrier is a PICVD layer.
30. The sheet-like discrete element as claimed in claim 28, wherein the barrier is an MF sputtered layer.
Description
DESCRIPTION OF THE DRAWINGS
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DETAILED DESCRIPTION
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(5) In the context of the present invention, any material which prevents or greatly reduces the attack of fluids or other corrosive materials on the electrical storage system 1 is considered as an encapsulation or sealing of the electrical storage system 1.
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LIST OF REFERENCE NUMERALS
(11) 1 Electrical storage system 2 Sheet-like discrete element used as a substrate 21 Diffusion barrier layer on substrate 3 Cathode collector layer 4 Anode collector layer 5 Cathode 6 Electrolyte 7 Anode 8 Encapsulation layer 10 Sheet-like discrete element in the form of a sheet-like shaped body 101 Diffusion barrier layer on sheet-like discrete element