Instrument with multiple optical paths

11703386 · 2023-07-18

Assignee

Inventors

Cpc classification

International classification

Abstract

Disclosed is an instrument including a multipath, monolithic optical component, made up of a portion of a transparent material between two opposite faces of the component. One of the two faces of the component is formed by a first refracting surface, and the other face includes several second refracting surfaces which are juxtaposed. Each optical path of the component is formed by one of the second refracting surfaces in combination with a corresponding portion of the first refracting surface. One such component is suited for being part, within the instrument, of a detection module with multiple optical paths arranged in parallel, with a matrix photodetector shared by the optical paths. Such a detection module may be compact enough in order to be integrated into a cryostat cold screen, improving cooling thereof, and may be combined with an objective in order to form an instrument with multiple optical paths.

Claims

1. An instrument with multiple optical paths, having a field of view which is shared by said optical paths, wherein the optical paths are arranged in parallel, each between an optical entrance of the instrument which is shared by said optical paths, and a matrix photodetector which is also shared by said optical paths, with a portion of said matrix photodetector which is dedicated to each optical path separately from any other optical path, wherein said instrument comprises a multipath, monolithic optical component which is made up of a portion of a material which is transparent to a use radiation, said portion being contained between two faces of the component which are each turned towards a side opposite the other face, so that the radiation incident on one of the two faces passes through the portion between both sides and exits through the other face, a first of the two faces of the component is formed by a first refracting surface which has an optical axis, the other face of the component, referred to as second face, comprises several second refracting surfaces which are juxtaposed without overlap in said second face, each second refracting surface having another optical axis separately from each other second refracting surface, where the optical axis of at least one of the second refracting surfaces is offset relative to the optical axis of the first refracting surface, the second refracting surfaces are distributed in the second face of the component so that a light ray which passes through the first refracting surface exits from the component through at most one of the second refracting surfaces, each second refracting surface thus forming with a respective portion of the first refracting surface an optical path for transmission which is separated from each other second refracting surface, respective curvature values of the first refracting surface hand each second refracting surface of the component are non-zero at at least one respective point of each of the first and second refracting surfaces, so that each of the first and second refracting surfaces individually modifies a convergence of a radiation beam which passes through said first or second refracting surfaces at the point corresponding to the non-zero curvature, each optical path of the optical component for which the optical axis of the second refracting surface is offset relative to the optical axis of the first refracting surface produces a non-zero prismatic deflecting power which is also effective for the radiation beam transmitted by said optical path between the two sides of the component, and at least one from the value and the orientation of the prismatic deflecting power is different between at least two of the optical paths of the component, the multipath, monolithic optical component is arranged so that each optical transmission path of said component is dedicated to one of the optical paths of the instrument, the instrument further comprising an objective and a detection module with multiple optical paths, the objective comprising at least one lens which is shared by all the optical paths of the detection module, the detection module comprising the optical component and the matrix photodetector, and being coupled to the objective so that said optical component is located in an exit pupil of the objective, and so that a scene which is contained in the field of view of the instrument is imaged through the objective of the optical component, for each optical path, onto the matrix photodetector.

2. The instrument according to claim 1, wherein respective curvature values of the first refracting surface and each second refracting surface of the monolithic optical component are such that said component has, separately for each optical path, a non-zero optical power which is effective for the radiation beam transmitted by said optical path between both sides of the component.

3. The instrument according to claim 1, wherein at least one among the first refracting surface and the second refracting surfaces of the monolithic optical component is of free-surface type.

4. The instrument according to claim 1, wherein two of the optical paths of the optical component for which the respective optical axes of the second refracting surfaces are symmetrically offset relative to the optical axis of the first refracting surface, have optical powers which are equal and have prismatic deflecting powers which are equal in absolute value but oriented symmetrically relative to said optical axis of the first refracting surface.

5. The instrument according to claim 1, wherein the second refracting surfaces of the monolithic optical component are juxtaposed in the second face of said component in order to form a 2×2, 2×3, 3×3, 3×4 or 4×4 matrix.

6. The instrument according to claim 1, further comprising at least one of the following elements: an angular field limiter arranged for filtering light rays which pass through the monolithic optical component according to the inclination thereof relative to the optical axis of the first refracting surface of said component, so that the inclinations of the light rays which are incident on said optical component are selectively less than an inclination threshold set by the angular field limiter; at least one set of separating walls which are arranged between the monolithic optical component and the matrix photodetector in order to isolate radiations transmitted by different optical paths; and a mask with openings, said mask having one opening per optical path in order to limit the transverse section of said optical path, and/or to mask zones of the monolithic optical component which are not useful for an imaging function of the instrument, and/or to eliminate parasitic images formed by radiation not having passed through useful zones of the monolithic optical component, and/or to set the respective pupils of the optical paths of the instrument.

7. The instrument according to claim 1, wherein at least two of the second refracting surfaces of the monolithic optical component carry respective spectral filters, one filter per second refracting surface, these filters having spectral filtering features which are different between two of said second refracting surfaces.

8. The instrument according to claim 1, wherein each optical path of said instrument comprises at least one filter in addition to the corresponding portion of the matrix photodetector and to the corresponding path of the monolithic optical component, said filter determining a spectral transmission band of said optical path of the instrument, which is different from the spectral transmission band of at least one of the other optical paths of the instrument.

9. The instrument according to claim 8, wherein two of the second refracting surfaces, which are associated with different filters in the respective optical paths, have different curvatures in order to compensate for a longitudinal chromatism that is effective between two wavelengths of radiation which are each transmitted separately by one of said filters.

10. The instrument according to claim 1, further comprising a combination of a cryostat and a cooling machine, and wherein, inside the cryostat, the matrix photodetector is arranged on a support which is thermally coupled to the cooling machine, and wherein the multipath, monolithic optical component is surrounded laterally by a screen which is also in thermal contact with the support of the matrix photodetector.

11. A multispectral image capture unit comprising the instrument of claim 1.

12. A spectrometer comprising the instrument of claim 1.

13. A three-dimensional imaging system comprising the instrument of claim 1.

14. The instrument according to claim 2, wherein at least one among the first refracting surface and the second refracting surfaces of the monolithic optical component is of free-surface type.

15. The instrument according to claim 2, wherein two of the optical paths of the optical component for which the respective optical axes of the second refracting surfaces are symmetrically offset relative to the optical axis of the first refracting surface, have optical powers which are equal and have prismatic deflecting powers which are equal in absolute value but oriented symmetrically relative to said optical axis of the first refracting surface.

16. The instrument according to claim 3, wherein two of the optical paths of the optical component for which the respective optical axes of the second refracting surfaces are symmetrically offset relative to the optical axis of the first refracting surface, have optical powers which are equal and have prismatic deflecting powers which are equal in absolute value but oriented symmetrically relative to said optical axis of the first refracting surface.

17. The instrument according to claim 2, wherein the second refracting surfaces of the monolithic optical component are juxtaposed in the second face of said component in order to form a 2×2, 2×3, 3×3, 3×4 or 4×4 matrix.

18. The instrument according to claim 3, wherein the second refracting surfaces of the monolithic optical component are juxtaposed in the second face of said component in order to form a 2×2, 2×3, 3×3, 3×4 or 4×4 matrix.

19. The instrument according to claim 4, wherein the second refracting surfaces of the monolithic optical component are juxtaposed in the second face of said component in order to form a 2×2, 2×3, 3×3, 3×4 or 4×4 matrix.

20. The instrument according to claim 2, further comprising at least one of the following elements: an angular field limiter arranged for filtering light rays which pass through the monolithic optical component according to the inclination thereof relative to the optical axis of the first refracting surface of said component, so that the inclinations of the light rays which are incident on said optical component are selectively less than an inclination threshold set by the angular field limiter; at least one set of separating walls which are arranged between the monolithic optical component and the matrix photodetector in order to isolate radiations transmitted by different optical paths; and a mask with openings, said mask having one opening per optical path in order to limit the transverse section of said optical path, and/or to mask zones of the monolithic optical component which are not useful for an imaging function of the instrument, and/or to eliminate parasitic images formed by radiation not having passed through useful zones of the monolithic optical component, and/or to set the respective pupils of the optical paths of the instrument.

Description

BRIEF DESCRIPTION OF THE DRAWINGS

(1) Other particulars and advantages of the present invention will appear in the following description of a non-limiting embodiment example provided with reference to the attached drawings in which:

(2) FIG. 1a and FIG. 1b are two perspective views of an optical component which may be used in an instrument according to the invention, from two opposite sides of the component;

(3) FIG. 2 is a plan view of another optical component which can be used in an instrument according to the invention;

(4) FIG. 3a and FIG. 3b are cross-section views of two instruments which conform to the invention and which each incorporates an optical component conforming to FIG. 2; and

(5) FIG. 4 is a detailed section view of a part of the instruments of FIG. 3a and FIG. 3b.

DETAILED DESCRIPTION OF INVENTION EMBODIMENTS

(6) For clarity sake, dimensions of elements which are represented in these figures do not correspond either to actual dimensions or actual ratios of dimensions. Further, identical references which are indicated in different figures denote elements which are identical or which have identical functions.

(7) With reference to FIG. 1a and FIG. 1b, an optical component 1 which is used for the invention may be made of germanium, in order to be transparent for electromagnetic radiation with a wavelength comprised between 2 μm and 14 μm. The component 1 has two opposite faces, which may be connected by a peripheral rib 2. For illustration, the component 1 from FIG. 1a and FIG. 1b has a square periphery. The first face of the component 1, which is directly visible on FIG. 1a, is formed by a refracting surface S.sub.1, which may for example be spherical or aspherical. A.sub.1 denotes the optical axis of the refracting surface S.sub.1. The second face of the component 1, which is directly visible on FIG. 1b, may be formed by four refracting surfaces S.sub.2 which are juxtaposed in a 2×2 matrix and which may each be spherical or aspherical, again as an example. A.sub.2 denotes the respective optical axis of each refracting surface S.sub.2. Each optical axis A.sub.2 may be parallel to the optical axis A.sub.1, and offset laterally relative thereto. When each of the surfaces S.sub.1 and S.sub.2 is also a sphere portion, with a sphere center located on the corresponding optical axis A.sub.1 or A.sub.2, then each refracting surface S.sub.2 has a midplane which is not parallel to the midplane of the portion of the refracting surface S.sub.1 through which passes the same radiation beam as passes through this surface S.sub.2. For this reason, each refracting surface S.sub.2 and the corresponding portion of the refracting surface S.sub.1 together produce a prismatic deflecting power for the radiation beam which passes through them. Such a prismatic deflecting power therefore results from average inclinations of the two refracting surfaces which are different. For the component 1 shown, the refracting surface S.sub.1 is concave and substantially spherical, and each refracting surface S.sub.2 is convex and substantially spherical. Then the prismatic deflection of each optical path formed by one of the refracting surfaces S.sub.2 with the corresponding portion of the refracting surface S.sub.1 has the effect of separating the average direction of propagation of a plane-wave beam which is incident parallel to the optical axis A.sub.2 of the refracting surface S.sub.2 from this optical axis.

(8) If the refracting surface S.sub.1 and one of the refracting surfaces S.sub.2 have identical curvatures, for the component 1 of FIG. 1a and FIG. 1b, then a convergence or divergence of the radiation beam is unchanged when it passes through these two surfaces. Conversely, if the refracting surface S.sub.1 and the refracting surface S.sub.2 have different curvatures, the convergence or divergence of the radiation beam is changed when it passes through the two surfaces. In other words, the optical path which is formed by these two refracting surfaces has a non-zero optical power value. In particular, the optical power of each optical path of the component 1 is positive, corresponding to a converging lens effect, when the radius of curvature of the corresponding refracting surface S.sub.2 is smaller than the radius of curvature of the refracting surface S.sub.1, with these radii of curvature being considered in absolute value.

(9) The implementation variant of the component 1 which is shown in FIG. 2 has a rib 2 which is circular apart from a straight-line edge segment B. The refracting surfaces S.sub.1 and S.sub.2 each have a peripheral limit which is circular. Further, the refracting surfaces S.sub.2 have different positions along the x and y directions relative to the refracting surface S.sub.1: two refracting surfaces S.sub.2 which are adjacent along the y direction are tangent, and two refracting surfaces S.sub.2 which are adjacent along the x direction are separated, and all of the refracting surfaces S.sub.2 are symmetrically distributed relative to the optical axis A.sub.1.

(10) As an example, the following dimensions may be used: outer radius R.sub.0 of the rib 2 parallel to the x-y plane: about 8.4 mm; radius R.sub.1 of the peripheral limit of the refracting surface S.sub.1 parallel to the x-y plane: about 6.75 mm; radius R.sub.2 of the peripheral limit of each refracting surface S.sub.2 parallel to the x-y plane: about 2.5 mm; distance D between the optical axes A.sub.2 of two refracting surfaces S.sub.2 which are adjacent along the x direction: about 6.25 mm; distance between the optical axes A.sub.2 of two refracting surfaces S.sub.2 which are adjacent along the y direction: about 5.0 mm; radius of curvature of the refracting surface S.sub.1, assumed approximately spherical and concave: about 160 mm; radius of curvature of each refracting surface S.sub.2, assumed approximately spherical and convex: about 83 mm; thickness of component 1, measured parallel to the optical axis A.sub.1 between the periphery of the refracting surface S.sub.1 and the center of each refracting surface S.sub.2: about 0.50 mm; and distance W between the straight edge segment B and the optical axis A.sub.1: about 5.95 mm.

(11) Starting from these dimensions, the person skilled in the art knows how to determine the values of the prismatic deflecting power and the optical power of each optical path of component 1 either by an approximate calculation or by a ray-tracing method. These values are non-zero for the specific dimensions indicated above.

(12) In accordance with FIG. 3a, an optical instrument 100 comprises a detection module 10 and an objective 20 which are assembled with each other in a way which is not shown, for example by means of mounting rings or any other connecting device.

(13) The objective 20 may be a retrofocus wide field-of-view model with a focal length of 39.5 mm as shown in FIG. 3a. However, the objective 20 may be interchangeable for other models, like for example, a narrow field-of-view re-imager type objective 20′ with a focal length of 158 mm, as shown in FIG. 3b. The person skilled in the art is capable of determining the numeral data for lenses 21, 22 and 23 of the objective 20 shown in FIG. 3a, or the lenses 21′-26′ of the objective 20′ shown in FIG. 3b, and similarly for the lenses of any other objective model which is intended to be used alternatively with the detection module 10. E.sub.20 designates the optical entrance of the objective 20 or 20′.

(14) The detection module 10 which is shown in FIG. 3a and FIG. 3b comprises, in the order along the direction of propagation of the radiation which is transmitted by the objective 20 or 20′: a window 11, a wideband spectral filter 12, the optical component 1 of FIG. 2, narrowband spectral filters 13a, 13b, etc. and a matrix photodetector 14. The detection module 10 and each objective 20 or 20′ are designed so that, when they are assembled together so that the instrument 100 is operational, the optical component 1 is located in the exit pupil of the objective 20 or 20′. Additionally, the lenses 21-23 of the objective 20, or those 21′-26′ of the objective 20′, have respective optical axes which coincide with the optical axis A.sub.1 of the refracting surface S.sub.1 of the optical component 1, and that axis passes preferably by a geometric center of the photosensitive surface of the matrix photodetector 14.

(15) Within the detection module 10, the optical component 1 may be positioned so that the refracting surface S.sub.1 thereof is turned towards the objective 20 or 20′, and the refracting surfaces S.sub.2 determine the optical paths of the instrument 100. The lenses 21-23 of the objective 20 or those 21′-26′ of the objective 20′, the window 11, the wideband spectral filter 12 and the matrix photodetector 14 are common to the four optical paths. The photosensitive surface of the matrix photodetector 14 is perpendicular to the optical axis A.sub.1, and located about 21.5 mm behind the optical component 1, so that a portion 14a of the photosensitive surface of the matrix photodetector 14 is dedicated to the optical path 1a, and another portion 14b of the photosensitive surface thereof, disjoint from portion 14a, is dedicated to the optical path 1b. Two other portions, still of the photosensitive surface of the matrix photodetector 14, mutually disjoint, and disjoint from portions 14a and 14b, are dedicated to two other optical paths (not shown). The filter 13a is arranged selectively on the optical path 1a, the filter 13b on the optical path 1b, and two other narrowband spectral filters (not shown) for the two other optical paths, one per optical path. The narrowband spectral filters 13a, 13b, etc. may advantageously be assembled in a 2×2 matrix within a single rigid component that is easy to mount in the detection module 10. In particular, the filters 13a, 13b, etc. may be either held individually in a shared mounting, or be butt-joined using adhesive to form an overall plate, or made by photolithography and thin layer deposition on a plate serving as common substrate for these filters. For example, each spectral filter 13a, 13b, etc. may have a thickness of about 0.5 mm. But in alternative embodiments, which may be better suited depending on the application of the instrument 100, each spectral filter 13a, 13b, etc. may be secured to the component 1 by being carried by one of the refractive surfaces S.sub.2 thereof.

(16) In this way, the four optical paths 1a, 1b, etc. simultaneously form respective images of a single content in the field of view of the instrument 100 on the corresponding portions 14a, 14b, etc. of the photosensitive surface of the matrix photodetector 14. These images which together form a multispectral image with four spectral components, one per optical path, are simultaneously captured during a single operating sequence of the matrix photodetector 14. Because of the use of the optical component 1, the four images are simultaneously sharp. With the numeral values which were cited with reference to FIG. 2, the instrument 100 has an overall focal length of 25 mm when the retrofocus type wide field-of-view objective 20 with a 39.5 mm focal length is used, and an overall focal length of 100 mm when the re-imager type narrow field-of-view objective 20′ with a focal length of 158 mm is used. The distance between the front face of the window 11 and the photosensitive surface of the matrix photodetector 14 is about 26.37 mm. The shape of the refracting surfaces S.sub.2 of the optical component 1 could be adjusted differently between different optical paths, according to the narrow spectral band of the filter 13a, 13b, etc. of this optical path. In particular, this additional adjustment can compensate for variations in the values of the indices of refraction of the materials of lenses 21-23 or 21′-26′ and of the component 1 with the wavelength of the radiation. FIG. 3a and FIG. 3b each further show a planar wave radiation beam which enters into the instrument 100 by the optical entrance E.sub.20 and which is simultaneously focused on the portions 14a, 14b, etc. of the photodetector 14.

(17) An instrument like 100 may be designed for operating in one of the visible spectral domains, near-infrared known under the acronym NIR, or in the SWIR domain. In these cases, cooling for the detection module 10 might not need to be provided.

(18) Alternatively, the instrument 100 may be designed for operating in one of the spectral domains designated by MWIR or LWIR. In these other cases, it may be necessary to provide a cooling system for the detection module 10. FIG. 4 shows a possible configuration for such a detection module 10 intended to be cooled. The matrix photodetector 14 is fixed, for example by adhesive, onto a support 16, commonly called cold table or cold finger in the jargon of the person skilled in the art, so as to produce a good thermal contact between the photodetector 14 and the support 16. The support 16 is out of a thermally conducting material and is coupled to a cooling machine (not shown). A lateral wall 17 surrounds the optical part of the detection module 10, i.e. the component 1, the spectral filters, in particular the filters 13a, 13b, etc. which are individually dedicated to each optical path 1a, 1b, etc., and other optional components of the module 10 such as diaphragms, masks, separating walls between the optical paths, etc. The posterior end of the lateral wall 17 is in thermal contact with the cold table 16 in order to be cooled at the same time as this latter. For this reason, the lateral wall 17 is commonly called cold screen. Further, the assembly which was just described, intended to be cooled, can be contained in an empty enclosure, which constitutes a cryostat. The lateral wall 18 of the cryostat is not in thermal contact with the parts intended to be cooled which were just described, and it is tightly sealed by the window 11 on the side of the objective 20. The window 11 is made of a material which is transparent for the operating spectral domain of the instrument 100.

(19) In order to reduce parasitic radiation and/or parasitic images which could degrade the quality of the images formed on the photodetector 14 by the optical paths 1a, 1b, etc., the detection module 10 may further comprise at least one of the following supplemental elements: an angular field limiter 15 which may be placed right upstream of the optical component 1 along the direction of propagation of the radiation in the instrument 100. Such an angular field limiter may have the shape of a tube segment or conic trunk which is coaxial with the optical axis A.sub.1. It could be formed by an extension of the cold screen 17 upstream from the optical component 1; a mask with openings 15′, for example between the optical component 1 and the narrowband spectral filters 13a, 13b, etc., for occulting parts of the optical component 1 which are intermediate between two adjacent refracting surfaces S.sub.2, and also possibly an exposed part of the rib 2. The mask 15′ may have a different opening for each optical path 1a, 1b, etc., which is separated from the opening dedicated to each other optical path. Given that the optical component 1 is located in an exit pupil of the objective 20 or 20′, and when the mask with openings 15′ is near the optical component 1, each of the openings thereof determines a pupil for the corresponding optical path of the instrument 100; and a matrix of separating walls 19, where each wall 19 is arranged longitudinally between the optical component 1 and the matrix photodetector 14, or between the narrowband spectral filters 13a, 13b, etc. on one end and the photodetector 14 on the other, with a separating wall between two optical paths 1a, 1b, etc. which are adjacent along any one of the directions of the matrix of the second refracting surfaces S.sub.2 of the optical component 1.

(20) It is understood that the invention may be reproduced by adapting secondary features thereof relative to the embodiments which were described in detail above. In particular, the number of refracting surfaces S.sub.2 and all the numeral values which were given were only indicated for purpose of illustration.

(21) Finally, other optical instruments than a multispectral image capture unit like the one which was just described with reference to FIG. 3a, FIG. 3b and FIG. 4 may reproduce the invention. In particular, such different instrument may in particular be used in a multipath spectrometer. For example, each of the optical paths of the spectrometer, such as determined by an optical component 1 conforming to the invention, may be dedicated to a respective spectral interval in order to direct the radiation from this spectral interval towards a diffraction network which is suited to that interval.

(22) The invention may also be used for a three-dimensional imaging system. Such a system may have a structure which is similar to that of the instrument 100 from FIG. 3a or FIG. 3b, without the narrowband spectral filters 13a, 13b, etc. being necessary for the operation of the three-dimensional imaging. Further, the instrument is focused for scene elements to be imaged which are located in a limited separation-distance interval in front of the objective. All the optical paths then simultaneously collect light rays which are coming from a single scene element contained in the entrance optical field of the instrument. But the pupils which are effective for different optical paths of the instrument are transversely offset from each other. For this reason, the images from the same scene element which are formed respectively by the optical paths are each located at the interior of the portion of the photosensitive surface of the photodetector which corresponds to the relevant optical path, in an area of this portion of the photosensitive surface which depends on the distance of the scene element. By comparing the respective positions of these elements formed by all the optical paths, it is possible to get an estimate of the separation distance of the scene element relative to the instrument. The three-dimensional imaging function that an instrument conforming to the invention thus allows is a stereoscopic image acquisition type.