ORGANIC SOLAR CELL FOR CURRENT-VOLTAGE TEST AND PREPARATION METHOD THEREOF

Abstract

The present invention relates to an organic solar cell for a current-voltage test and a preparation method thereof. The disclosed organic solar cell for the current-voltage test comprises a substrate with a preset ITO pattern, wherein ITO on the substrate with the preset ITO pattern is used as the anode layer, and a hole transport layer, an active layer, an electron transport layer and a cathode layer are stacked successively to form a solar cell. A plurality of cell positions are designed on the substrate in the present invention. Each cell has an independent cathode test site and an anode test site. The distance between the test site of each cell and the cell is kept the same and the distance is short enough; and the cells are distributed evenly on the substrate discretely. The present invention has high substrate utilization rate, high data accuracy and good parallelism.

Claims

1. An organic solar cell for a current-voltage test, comprising a substrate S0, an anode layer S1, a hole transport layer S2, an active layer S3, an electron transport layer S4 and an electrode coating S5 successively, wherein the substrate S0 has a preset ITO pattern.

2. The organic solar cell for the current-voltage test according to claim 1, wherein the substrate S0 is made of a square glass material.

3. The organic solar cell for the current-voltage test according to claim 2, wherein the ITO coating of the substrate S0 with the preset ITO pattern is the anode layer Si, and the regions of the ITO coating are a plurality of rectangles N1 with long sides of L1 and wide sides of M1, and distributed evenly in a plurality of positions on the surface of the substrate discretely.

4. The organic solar cell for the current-voltage test according to claim 3, wherein rectangular regions N2 without the hole transport layer S2, the active layer S3 and the electron transport layer S4 coating are arranged at a parallel edge of the substrate S0 perpendicular to the direction of ITO to expose the ITO coating; and the rectangular regions N2 without the coating are perpendicular to the long side L1 of the region N1 of the rectangle ITO and parallel to the wide side M1 of the region N1 of the rectangle ITO, and are in one-to-one correspondence with the positions of current-voltage test electrodes.

5. The organic solar cell for the current-voltage test according to claim 1, wherein the hole transport layer S2 is PEDOT: PSS.

6. The organic solar cell for the current-voltage test according to claim 1, wherein the active layer S3 comprises a donor material and an acceptor material, and the donor material comprises PM6, D18 or B1; and the acceptor material comprises Y6, BO-4C1, BTP-eC9, L8-BO or OSe.

7. The organic solar cell for the current-voltage test according to claim 1, wherein the electron transport layer S4 is PDIN, PDINN or PNDIT-F3N.

8. The organic solar cell for the current-voltage test according to claim 4, wherein the electrode coating S5 comprises L-shaped regions N3 and rectangular regions N4 which are distributed evenly on the surface of the substrate discretely, and the rectangular regions N4 are in one-to-one correspondence with the rectangular regions N1 of the anode layer Si; and the long side L4 of the rectangular region N4 is less than the long side L1 of the rectangular region N1, and the wide side M4 of the rectangular region N4 is equal to the wide side M1 of the rectangular region N1; the L-shaped region N3 is composed of a rectangle N31 and a rectangle N32, the wide side M4 of the rectangular region N4<the long side L311 of N31the long side L321 of N32, and the wide side M311 of N31 is equal to the wide side M4 of the rectangular region N4; the wide side M321 of N32the wide side M1 of the rectangular region N1, and the long side L4 of the rectangular region N4<the long side L321 of N32the long side Ll of the rectangular region N1.

9. The organic solar cell for the current-voltage test according to claim 8, wherein the L-shaped regions N3 and the rectangular regions N4 have opposite polarities; and the L-shaped regions N3 are cathode layers of the organic solar cell; and the rectangular regions N4 and the ITO are conducted and jointly used as anodes of the organic solar cell.

10. The organic solar cell for the current-voltage test according to claim 8, wherein the long side L2 of the rectangular region N2 without the coating is equal to the side length of the substrate S0, and the wide side M2 of the rectangular region N2 without the coatingthe long side L4 of the rectangle N4.

11. The organic solar cell for the current-voltage test according to claim 9, wherein an arrangement region Q1 of the cell is a region where the anode layer ITO S1, the hole transport layer S2, the active layer S3, the electron transport layer S4 and the cathode layer N3 on the substrate S0 with the preset ITO pattern are overlapped.

12. A preparation method of the organic solar cell for the current-voltage test in claim 1, comprising the following steps: I. cleaning and treating the substrate S0 with the preset ITO pattern by an ultrasonic cleaning method and an ultraviolet ozone method; II. preparing the hole transport layer S2, the active layer S3 and the electron transport layer S4 successively on the surface of the substrate S0 by a spin-coating method, wherein spin-coating area is the size of the substrate S0; III. removing the spin-coating coating from the parallel edge of the surface of the substrate S0 perpendicular to the direction of ITO to the interior of the surface of the substrate S0 to form rectangular regions N2 without the spin-coating coating; IV. evaporating a metallic silver electrode S5 on the substrate through a vacuum evaporation method of the substrate obtained in step III combined with a mask plate with a preset pattern to obtain the organic solar cell for the current-voltage test.

Description

DETAILED DESCRIPTION

[0042] The technical solutions in the embodiments of the present invention will be clearly and fully described below in combination with the drawings. Apparently, the described embodiments are merely part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments in the present invention, all other embodiments obtained by those ordinary skilled in the art without contributing creative labor will belong to the protection scope of the present invention.

[0043] Each embodiment in the description is described in a progressive way. The difference of each embodiment from each other is the focus of explanation. The same and similar parts among all of the embodiments can be referred to each other. For a device disclosed by the embodiments, because the device corresponds to a method disclosed by the embodiments, the device is simply described. Refer to the description of the method part for the related part.

Embodiment 1

[0044] A substrate S0 with a preset ITO pattern (as shown in FIG. 1) is cleaned and treated by an ultrasonic cleaning method and an ultraviolet ozone method. Specifically, firstly, the substrate is ultrasonically cleaned in a cleaning agent for 2 h and rinsed with deionized water for 5 times; then the substrate is ultrasonically cleaned with deionized water for 3 times, and finally put into anhydrous ethanol for ultrasonic cleaning for 15 min. Then, the anhydrous ethanol attached to the surface of the cleaned substrate is blown dry with a nitrogen gun, and then the substrate is put into UVO for ozone treatment for 15 min. The substrate with the preset ITO pattern is placed on a spin coater to spin coating the hole transport layer; the material is PEDOT: PSS; the spin coating time is 40 s, the rotational speed is 5000 RPM, and the thickness of the hole transport layer is about 30 nm. Then, the substrate is placed on a heating table at 150 C. and thermally annealed for 10 min. The annealed substrate is transferred to a glove box filled with high purity nitrogen and cooled to room temperature. An active layer S3 is spin-coated on the obtained substrate by the spin coater. A donor material is PM6 and an acceptor material is BO-4C1, which are weighed by a mass ratio of 1:1.2. A CB solvent is used for dissolving at the donor concentration of 10 mg/mL, and the materials are heated and stirred at 75 C. on a magnetic heating table for 3 h. The spin coating time is 30 s, the rotational speed is 3000 RPM, and the film thickness is 110 nm. The obtained substrate is placed on the heating table and thermally annealed at 80 C. for 10 min. Then, the obtained substrate is placed on the spin coater to spin coating the electron transport layer S4; the material is PDIN; the spin coating time is 30 s, and the rotational speed is 5000 RPM. The thickness is about 100 nm. A certain width of the coating is scraped into the substrate at a certain distance from two parallel sides perpendicular to the long side L1 of the rectangular ITO S1 and parallel to the wide side M1 to expose the ITO layer (as shown in FIG. 2 and FIG. 5), which corresponds to the position of the current-voltage test electrode one by one. A metallic silver electrode S5 (as shown in FIG. 3) is evaporated on the substrate through a vacuum evaporation method of the substrate combined with a mask plate with a preset pattern. A region where the anode layer ITO Si, the hole transport layer S2, the active layer S3, the electron transport layer S4 and the cathode layer N4 on the substrate S0 with the preset ITO pattern are overlapped is a cell, and the cell region is a square Q1 (as shown in FIG. 4). Current-voltage curve acquisition is conducted for the formed Glass/ITO/PEDOT:PSS/PM6:BO-4C1/ PDIN/ Ag organic solar cell. The results are shown in Table 1.

[0045] In order to better illustrate the embodiment, the traditional in-line cell and a matched test fixture are used to measure the cell performance parameters of the same system, as shown in Table 2.

TABLE-US-00001 TABLE 1 Cell Performance Parameters of PM6:BO4Cl System Based on the Test Substrate J.sub.SC V.sub.OC FF PCE PM6:BO4Cl [mA cm.sup.2] [V] [%] [%] 1 26.41 0.852 77.95 17.54 2 26.29 0.852 78.61 17.61 3 26.44 0.851 78.00 17.55 4 26.25 0.853 77.83 17.42 5 26.37 0.853 78.12 17.57 6 26.34 0.854 78.05 17.56 (Note: the data in each table comes from an effective test unit on the same substrate)

TABLE-US-00002 TABLE 2 Cell Performance Parameters of PM6:BO4Cl System Based on Traditional In-Line ITO Substrate J.sub.SC V.sub.OC FF PCE PM6:BO4Cl [mA cm.sup.2] [V] [%] [%] 1 26.39 0.851 78.45 17.61 2 26.18 0.853 77.29 17.26 3 26.09 0.851 75.76 16.82 4 25.88 0.853 73.18 16.16 (Note: the data in each table comes from an effective test unit on the same substrate)

[0046] It can be seen from Table 1 that six groups of data values from the same substrate are relatively consistent. The maximum PCE value of the six groups of data is 17.61%, the minimum value is 17.42%, the average PCE is 17.54%, and the standard deviation is 0.059. It can be seen from Table 2 that in four groups of data from the same substrate, the maximum PCE is 17.61%, the minimum PCE is 16.16%, the average PCE of the four groups of data is 16.16% and the standard deviation is 0.54. It can be seen that the preparation efficiency and experimental success rate of the cell based on the substrate of the present invention are greatly improved, and the data are accurate, stable and good in parallelism.

[0047] Embodiment 2

[0048] A substrate S0 with a preset ITO pattern (as shown in FIG. 1) is cleaned and treated by an ultrasonic cleaning method and an ultraviolet ozone method. Specifically, firstly, the substrate is ultrasonically cleaned in a cleaning agent for 2 h and rinsed with deionized water for 5 times; then the substrate is ultrasonically cleaned with deionized water for 3 times, and finally put into anhydrous ethanol for ultrasonic cleaning for 15 min. Then, the anhydrous ethanol attached to the surface of the cleaned substrate is blown dry with a nitrogen gun, and then the substrate is put into UVO for ozone treatment for 15 min. The substrate with the preset ITO pattern is placed on a spin coater to spin coating the hole transport layer; the material is PEDOT: PSS; the spin coating time is 35 s, the rotational speed is 5000 RPM, and the thickness of the hole transport layer is about 30 nm. Then, the substrate is placed on a heating table at 150 C. and thermally annealed for 15 min. The annealed substrate is transferred to a glove box filled with high purity nitrogen and cooled to room temperature. An active layer S3 is spin-coated on the obtained substrate by the spin coater. A donor material is PM1 and an acceptor material is OSe, which are weighed by a mass ratio of 1:1.25. A CF solvent is used for dissolving at the donor concentration of 8.8 mg/mL, and the materials are heated and stirred at 45 C. on a magnetic heating table for 2.5 h. The spin coating time is 30 s, the rotational speed is 3000 RPM, and the film thickness is 110 nm. The obtained substrate is placed on the heating table and thermally annealed at 80 C. for 5 min. Then, the obtained substrate is placed on the spin coater to spin coating the electron transport layer S4; the material is PDIN; the spin coating time is 30 s, and the rotational speed is 6000 RPM. The thickness is about 100 nm. A certain width of the coating is scraped into the substrate at a certain distance from two parallel sides perpendicular to the long side L1 of the rectangular ITO S1 and parallel to the wide side M1 to expose the ITO layer (as shown in FIG. 2 and FIG. 5), which corresponds to the position of the current-voltage test electrode one by one. A metallic silver electrode S5 (as shown in FIG. 3) is evaporated on the substrate through a vacuum evaporation method of the substrate combined with a mask plate with a preset pattern. A region where the anode layer ITO Si, the hole transport layer S2, the active layer S3, the electron transport layer S4 and the cathode layer N4 on the substrate S0 with the preset ITO pattern are overlapped is a cell, and the cell region is a square Q1 (as shown in FIG. 4). Current-voltage curve acquisition is conducted for the formed Glass/ITO/PEDOT:PSS/PM1:0Se/PDIN/Ag organic solar cell. The results are shown in Table 3.

[0049] In order to better illustrate the embodiment, the traditional in-line cell and a matched test fixture are used to measure the cell performance parameters of the same system, as shown in Table 4.

TABLE-US-00003 TABLE 3 Cell Performance Parameters of PM1:OSe System Based on the Test Substrate J.sub.SC V.sub.OC FF PCE PM1:OSe [mA cm.sup.2] [V] [%] [%] 1 25.96 0.870 75.28 17.00 2 25.92 0.870 76.95 17.35 3 25.77 0.869 76.33 17.09 4 25.71 0.869 77.08 17.22 5 25.91 0.868 76.90 17.29 6 25.95 0.867 75.60 17.01 (Note: the data in each table comes from an effective test unit on the same substrate)

TABLE-US-00004 TABLE 4 Cell Performance Parameters of PM1:OSe System Based on Traditional In-Line ITO Substrate J.sub.SC V.sub.OC FF PCE PM1:OSe [mA cm.sup.2] [V] [%] [%] 1 25.99 0.867 76.32 17.20 2 25.97 0.866 74.80 16.82 3 25.94 0.865 73.31 16.45 4 25.71 0.864 71.40 15.86 (Note: the data in each table comes from an effective test unit on the same substrate)

[0050] It can be seen from Table 3 that six groups of data values from the same substrate are relatively consistent. The maximum PCE value of the six groups of data is 17.35%, the minimum value is 17.00%, the average PCE is 17.16%, and the standard deviation is 0.148.

[0051] It can be seen from Table 4 that in four groups of data from the same substrate, the maximum PCE is 17.20%, the minimum PCE is 15.86%, the average PCE of the four groups of data is 16.58% and the standard deviation is 0.571. It can be seen that the preparation efficiency and experimental success rate of the cell based on the substrate of the present invention are greatly improved, and the data are accurate, stable and good in parallelism.

[0052] The above description of the disclosed embodiments enables those skilled in the art to realize or use the present invention. Many modifications to these embodiments will be apparent to those skilled in the art. The general principle defined herein can be realized in other embodiments without departing from the spirit or scope of the present invention. Therefore, the present invention will not be limited to these embodiments shown herein, but will conform to the widest scope consistent with the principle and novel features disclosed herein.