WORKPIECE HOLDER, MEASURING DEVICE AND MEASURING METHOD FOR MEASURING A WORKPIECE

Abstract

A workpiece holder, measuring device, and a method for executing a measurement by using the workpiece holder. The workpiece holder is configured to hold a workpiece with two opposite arranged workpiece surfaces to be measured in a way that both are accessible by a moveable probe unit and can thus be measured in one setting of the workpiece. For this the workpiece holder comprises a support and a holding body. The holding body has a holding end away from the support with at least one holding surface at which the workpiece is held. In the holding body a free space is formed that adjoins the workpiece surface facing the support when a workpiece is held and makes the workpiece surface accessible for measuring or probing. The accessibility for the probe unit is provided by a transverse channel extending obliquely or orthogonally to the longitudinal axis of the workpiece holder.

Claims

1. A workpiece holder (35) configured to hold a workpiece having two workpiece surfaces (24a, 24b) to be measured at opposite workpiece sides during a measurement with a probe unit (26) that is moveable along a workpiece surface (24a, 24b), the workpiece holder comprising: a support (36) that is configured to be connected with a clamping device (23) of a measuring device (20), and a holding body (39) that is attached with an attachment end (40) at the support (36) and that extends from the support (36) to a free holding end (41), that is arranged with a distance from the attachment end (40) in a direction of a longitudinal axis (L) of the workpiece holder (35), wherein at the holding end (41) at least one holding surface (42, 43) is present that is configured for contact at a peripheral region of the workpiece (24), and wherein in the holding body (39) a free space (47) is present through which the longitudinal axis (L) extends and that comprises at least one transverse channel (49) with a peripheral opening (50) for the probe unit (26), through which the free space (47) is accessible from outside radially with regard to the longitudinal axis (L).

2. The workpiece holder according to claim 1, wherein the at least one transverse channel (49) passes through the holding body (39) at the holding end (41) in a direction parallel to the longitudinal axis (L).

3. The workpiece holder according to claim 1, wherein the free space (47) comprises a plurality of transverse channels (49), each having a peripheral opening (50), wherein the peripheral openings (50) are arranged with a distance to each other in a circumferential direction (U) about the longitudinal axis (L) of the workpiece holder (35).

4. The workpiece holder according to claim 3, wherein the transverse channels (49) separate the holding body (39) into a plurality of holding body parts (54) that are arranged with a distance therebetween in the circumferential direction (U).

5. The workpiece holder according to claim 3, wherein the transverse channels (49) are arranged in a star form when viewed along the longitudinal axis (L).

6. The workpiece holder according to claim 1, wherein the free space (47) comprises a central region (48) with at least one cylindric or prismatic section in a region of the longitudinal axis (L).

7. The workpiece holder according to claim 1, wherein each transverse channel (49) comprises a main section (51) and a slit section (52) that is smaller in a circumferential direction (U) compared with the main section (51) and that adjoins the main section (51) in the direction of the longitudinal axis (L).

8. The workpiece holder according to claim 7, wherein the slit section (52) is arranged at the holding end (41) of the holding body (39).

9. The workpiece holder according to claim 7, wherein the main section (51) is arranged closer to the support (36) than the slit section (52).

10. The workpiece holder according to claim 1, wherein the holding body (39) comprises an axial holding surface (42) at the holding end (40) that faces away from the support (36).

11. The workpiece holder according to claim 4, wherein the holding body (39) comprises an axial holding surface (42) at the holding end (40) that faces away from the support (36), and an axial holding surface section (42a) of the axial holding surface (42) is present at each holding body part (54).

12. The workpiece holder according to claim 11, wherein the axial holding surface sections (42a) are oriented orthogonally with respect to the longitudinal axis (L).

13. The workpiece holder according to claim 1, wherein the holding body comprises a peripheral holding surface (43) at the holding end (41) that extends in a circumferential direction (U) about the longitudinal axis (L).

14. The workpiece holder according to claim 4, wherein the holding body comprises a peripheral holding surface (43) at the holding end (41) that extends in a circumferential direction (U) about the longitudinal axis (L), and the a peripheral holding surface section (43a) of the peripheral holding surface (43) is present at each holding body part (54).

15. The workpiece holder according to claim 14, wherein the peripheral holding surface (43) or the peripheral holding surface sections (43a) is or are facing the longitudinal axis (L).

16. A measuring device (20) that comprises the probe unit (26) moveable in a moving direction (B) and a clamping device (23) that is configured to clamp a support (36) of the workpiece holder (35) according to claim 1.

17. A measuring device according to claim 16, wherein the probe unit (26) is moveable or positionable orthogonally with respect to the longitudinal axis (L) and orthogonally with respect to the moving direction (B).

18. A measuring device according to claim 16, wherein the probe unit (26) comprises a probe arm (27) that comprises at a free probe end (28) thereof a first probe element (29) oriented orthogonally with respect to the probe arm (27) and a second probe element (30) oriented in an opposite direction compared to the first probe element (29).

19. A measuring device according to claim 18, wherein the probe arm (27) is pivotably supported about a pivot axis (S) that is oriented orthogonally with respect to the longitudinal axis (L) and orthogonally with respect to the moving direction (B) and a pivot movement can be measured.

20. A measuring method for measuring a workpiece (24) that comprises first and second workpiece surfaces (24a, 24b) that are present at opposite workpiece sides by using the workpiece holder (35) according to claim 1, the method comprising: arranging the workpiece (24) at the holding end (41) of the workpiece holder (35), measuring the first workpiece surface (24a) facing away from the support (36) of the workpiece holder (35) by moving the probe unit (26) along the first workpiece surface (24a), measuring the second workpiece surface (24b) facing the support (36) of the workpiece holder (35) by moving the probe unit (26) along the second workpiece surface (24b) in the free space (47) of the workpiece holder (35).

21. The workpiece holder according to claim 10, wherein the axial holding surface (42) is oriented orthogonally with respect to the longitudinal axis (L).

Description

BRIEF DESCRIPTION OF THE DRAWINGS

[0039] Subsequently, preferred embodiments of the invention are explained in detail with reference to the drawings. The drawings show:

[0040] FIG. 1 an embodiment of a measuring device,

[0041] FIG. 2 a schematic block-diagram-like illustration of an arrangement of a workpiece to be measured in a workpiece holder during the measurement of the workpiece surfaces with a tactile measuring probe unit,

[0042] FIG. 3 a schematic principle illustration of an alternative embodiment of a probe unit with contactless measuring probe elements,

[0043] FIG. 4 a top view onto an embodiment of a workpiece holder along the longitudinal axis,

[0044] FIG. 5 a perspective illustration of an embodiment of a workpiece holder,

[0045] FIG. 6 a side view of the workpiece holder of FIG. 5,

[0046] FIG. 7 a longitudinal section through the workpiece holder of FIGS. 5 and 6 along the line VII-VII in FIG. 6,

[0047] FIG. 8 a top view onto the workpiece holder according to FIGS. 5-7,

[0048] FIG. 9 a longitudinal section through the workpiece holder according to FIGS. 5-8 along line IX-IX in FIG. 8,

[0049] FIG. 10 a schematic exemplary measurement of two opposite workpiece surfaces of a workpiece and

[0050] FIGS. 11-14 a schematic principle illustration of different optical workpieces respectively that may be measured by means of the workpiece holder.

DETAILED DESCRIPTION

[0051] FIG. 1 shows an embodiment of a measuring device 20. The measuring device 20 has a machine basis 21. A cartesian coordinate system is especially fixed arranged to the machine basis 21 and defines an x-direction x, a y-direction y and a z-direction z.

[0052] At the machine basis 21 a clamping device 23 is arranged for clamping a workpiece 24 to be measured. The clamping device 23 is a manually positionable in x-direction and/or y-direction. It comprises a rotating drive with a rotating axis, by means of which workpiece 24 can be turned around its longitudinal axis L that is indirectly clamped by the clamping device 23. The rotating axis of the clamping device 23 can be positioned and aligned relative to the z-direction of the coordinate system x, y, z, for example manually. For doing this a controllable axes arrangement with with respective translational and/or rotational degrees of freedom may be present alternatively.

[0053] The measuring device 20 further comprises a machine axes arrangement 25 for positioning and/or aligning a probe unit 26. The machine axes arrangement 25 has a translational degree of freedom Tz parallel to the z-direction, a translational degree of freedom Ty parallel to the y-direction and a translational degree of freedom Tx parallel to the x-direction, wherein this translational degree of freedom defines a moving direction B of the probe unit 26 during the measurement of a workpiece 24.

[0054] As it can be particularly seen in FIG. 2, in the present embodiment the probe unit 26 comprises a probe arm 27 that is pivotably supported around a pivot axis S, such that an additional rotational degree of freedom rS about the pivot axis S is formed. The pivot axis S extends orthogonally to the moving direction B, in which the probe arm 27 is moved during the measurement. In the present embodiment the pivot axis S is orientated parallel to the y-direction and the moving direction B is orientated parallel to the x-direction. The probe unit 26 can also be moved in y-direction before the measurement by means of the machine axes arrangement 25, in order to adjust the measuring plane or the measuring planes (x-z-plane) of the probe unit or the probe arm 27 respectively, in which is measured.

[0055] The machine axes arrangement 25 and the degrees of freedom for positioning and aligning the clamping device 23 are only exemplary. The number of translational and/or rotational degrees of freedom can be defined as suitable depending from the measuring task for which the measuring device 20 is configured and provided.

[0056] The probe arm 27 has a free probe end 28 distant to the pivot axis S, at which at least one probe element and in the present embodiment a first probe element 29 as well as the second probe element 30 are arranged. In the embodiment shown in FIG. 2, the probe elements 29, 30 are in the form of tactile probe elements 29, 30 and contact the workpiece 24 to be measured during the measurement. The probe elements 29, 30 are arranged at diametrical opposite sides of the probe arm 27 relative to the probe arm longitudinal axis. The probe elements 29, 30 extend so to say in opposite directions away from the probe arm 27. In the embodiment the probe elements 29, 30 each comprise a probe ball that contacts the workpiece 24 during the measurement.

[0057] As it is schematically illustrated in FIG. 3, the first and/or the second probe element 29, 30 can also be formed as contactless measuring probe elements that can be moved with distance to the workpiece surface 24a, 24b of the workpiece 24, for example, and create a measuring signal in order to be able to determine the distance of the probe elements 29, 30 to the workpiece surface 24a, 24b. For example, the probe elements 29, 30 can emit and receive light, particularly laser light, for the contactless measurement in order to evaluate the distance of the respective probe element 29, 30 to the workpiece surface of the workpiece 24.

[0058] For the measurement the probe arm 27 is moved in moving direction B and in so doing, the position in moving direction as well as the pivot position about the pivot axis S is measured. The pivot position is characteristic for a point on the workpiece surface of the workpiece 24 probed by the probe element 29, 30. Because the probe element 29, 30 does not move linearly orthogonally to the moving direction B during the pivot movement, a fault is created that is called cosine fault. This fault can be eliminated by calculation in a control and evaluation unit of the measuring device.

[0059] The workpiece 24 to be measured here is a workpiece 24 that comprises a first workpiece surface 24a to be measured at one workpiece side and a second workpiece surface 24b to be measured at the opposite other workpiece side. Both workpiece surfaces 24a, 24b are at least in sections curved to be concave and/or convex and can comprise radii of curvature in the concave and/or convex sections that are constant or varying. The workpiece 24 is particularly an optical workpiece with two optical workpiece surfaces 24a, 24b, e.g. a lens. The optical workpiece surface 24a, 24b can be, e.g. spherically or aspherically or can comprise a freeform or can be a lens array with a plurality of microlenses and optical axes Oi (i=1 . . . n). Different examples for arrangements and extensions for the workpiece surfaces 24a, 24b are schematically illustrated in FIGS. 11-14.

[0060] For such workpieces 24 it is important to determine one or more geometric parameters of each workpiece surface 24a, 24b and to additionally determine the relative position or relative orientation of the optical axes O1, O2, assigned to the workpiece surfaces 24a, 24b. The number of optical axes depends on the design of the workpiece and can be two or greater as two.

[0061] Before the actual measurement, during which the probe unit 26 is moved along the respective workpiece surface 24a, 24b in moving direction B within the measuring plane (x-z-plane) the apex for the workpiece surface 24a, 24b is determined first that characterizes the puncture point optical axes O1, O2 through the workpiece surface 24a, 24b. This can be executed manually or automatically. For example, two curves can be measured first that are offset to each other in y-direction, that is in direction of the pivot axis S, within a respective x-z-plane and based on the known desired geometry the y-position of the measuring plane (x-z-plane) can be determined by calculation. In x-direction the position of the apex must not be necessarily precisely known, because during the measurement, measurement values are determined in x-direction along the total workpiece surface 24a, 24b anyway.

[0062] After determination of the y-position of the apex, that defines the position of the measuring plane, the respective workpiece surface 24a or 24b is measured respectively. The procedure of determination of the y-position of the apex or the measuring plane respectively is executed for the respective workpiece surface 24a or 24b before the measurement. In doing so, it is guaranteed that the measurement at the two workpiece surfaces extends through the apex.

[0063] In FIG. 10 a first curve K1 is illustrated, for example, that describes the extension of the first workpiece surface 24a in an x-z-plane including the apex (maximum) of the convex form. A second curve K2 describes the extension including the apex (maximum) of the convex form of the opposite second workpiece surface 24b also in an x-z-plane. Based on the curves K1, K2, a first optical axis 1 of the workpiece 24 at the first workpiece surface 24a and a second optical axis O2 of the workpiece 24 at the second workpiece surface 24b can be determined respectively. The direction of each optical axis O1, O2 can be determined by calculation based on a mathematical relationship, particularly polynomial that characterizes the desired geometry of the respective workpiece surface 24a, 24b. In doing so, an offset d in x- and/or y-direction and/or a tilting between the two optical axes O1, O2 can be determined for example.

[0064] For determination of the apex and the measurement of the two workpiece surfaces, the workpiece is not reclamped. The measurement or determination of the optical axes O1, O2 is therefore quickly and easily possible.

[0065] The measurement is executed in a way that the probe unit 26 and for example the probe arm 27 is subsequently moved one time along the first workpiece surface 24a and one time along the second workpiece surface 24b, wherein the sequence does not play any role, which of the workpiece surfaces 24a, 24b is measured first. During the measurements the workpiece 24 is not changed regarding its position or orientation. In doing so, a line-shaped measurement along the two workpiece surfaces 24a, 24b is executed respectively. During these measurements a first curve K1 or K2 respectively is measured for each workpiece surface 24a, 24b, as they are exemplarily illustrated in FIG. 10. The measurement of the two workpiece surfaces 24a, 24b can be executed in a plurality of rotational positions of the workpiece 24 about the longitudinal axis L. After a first measurement of the curves K1, K2 in a first rotational position about the longitudinal axis L the clamping device 23 of the measuring device 20 can turn the workpiece 24 about the longitudinal axis L with a desired turning angle, wherein the longitudinal axis L corresponds to a rotational axis of the clamping device 23. In this further rotational position the first and second curves K1, K2 can be measured again.

[0066] In order to be able to measure the two workpiece surfaces 24a, 24b of a workpiece 24 in one setting, a workpiece holder 35 is present according to the invention. The workpiece holder 35 is configured to provide accessibility to the two workpiece surfaces 24a, 24b without reclamping of the workpiece 24, such that the two workpiece surfaces 24a, 24b can be reached by the probe unit 26 and for example the probe elements 29, 30 of the probe arm 27.

[0067] The workpiece holder 35 is illustrated highly schematically in FIG. 2. The workpiece holder 35 has a support 36 that is configured to clamp the workpiece holder 35 in the clamping device 23. In the embodiment the support 36, therefore, comprises a clamping pin 37 that extends along the longitudinal axis L of the workpiece holder 35, wherein the clamping pin has for example a circular cylindrical shape. At one end of the clamping pin 37 the support 36 comprises a circular-shaped support plate 38, the diameter of which is larger than the diameter of the clamping pin 37. The support plate 38 is arranged coaxially to the longitudinal axis L.

[0068] At the support 36 and for example the support plate 38 a holding body 39 is arranged. The holding body 39 has an attachment end 40 that is connected with the support 36 and according to the example with the support plate 38.

[0069] In a preferred embodiment the holding body and the support 36 are integrally formed without seam or connection location and can be manufactured from plastic or a metallic material.

[0070] From the attachment end 40 the holding body 39 extends away from the support 36 to a free holding end 41. The holding end 41 of the holding body 39 is configured to position and support workpiece 24. For this at least one holding surface and in the embodiment an axial holding surface 42 as well as a peripheral holding surface 43 is present at the holding end 41. The axial holding surface 42 faces away from the support 36 and comprises, for example, a normal vector that is orientated substantially parallel to the longitudinal axis. The peripheral holding surface 43 faces toward the longitudinal axis L and can be orientated orthogonally to the axial holding surface 42. A normal vector of the peripheral holding surface 43 is for example orientated radially to the longitudinal axis L.

[0071] In the holding body 39 a free space 47 is present. In the embodiment the free space 47 has a central region 48 with one or more cylindrical or prismatic sections. The central region 48 is preferably symmetrically formed with regard to the longitudinal axis L. The longitudinal axis L extends anyway through the central region 48. The central region 48 is axially open at the side facing away from the support 36 and thus accessible from the holding end 41 in the region of the longitudinal axis L.

[0072] The free space 47 further comprises a transverse channel 49 and in the present embodiment a plurality of transverse channels 49, e.g. three transverse channels 49 (FIG. 4) or four transverse channels 49 (FIGS. 5-9). Each transverse channel extends starting from the central region 48 radially with regard to the longitudinal axis L to a peripheral opening 50. At the peripheral opening 50 the respective transverse channel 49 ends at the outside of the holding body 39 and is thus accessible through the peripheral opening 50 from outside radially to the longitudinal axis L. Through the peripheral opening 50 and through the transverse channel 49 the probe unit, particularly a probe arm 27 with a least one probe element 29, 30 can be arranged in the free space 47 and moved therein. In doing so, measuring of the workpiece surface that faces the support, for example the second workpiece surface 24b, is possible in the same setting in which also the opposite workpiece surface 24a can be measured by the probe unit 26.

[0073] With view along the longitudinal axis L the transverse channels 49 are arranged in a star-like manner. They are for example uniformly distributed in circumferential direction U about the longitudinal axis L. The peripheral openings 50 of the transverse channels 49 are arranged with distance and for example with uniform distance from each other in circumferential direction U about the longitudinal axis L.

[0074] The number of transverse channels 49 can vary. It is preferred, if at least two transverse channels 49 are arranged along a common radial axis orthogonal to the longitudinal axis L, so to say aligned. In doing so, a probe unit 26 can be moved along the aligned transverse channels 49 at or along the total diameter of the second workpiece surface 24b. In the embodiment according to FIGS. 5-9, two of the transverse channels 49 are respectively aligned with each other that oppose each other diametrically with regard to the longitudinal axis L.

[0075] In the illustrated embodiment each transverse channel 49 has a main section 51 and a slit section 52 adjoining thereto. The main section 51 and the slit section 52 adjoin each other in axial direction parallel to the longitudinal axis L. The slit section 52 is present at the holding end 41 of the holding body 39, whereas the main section 51 is arranged between the slit section 52 and the support 36 or between the holding end 41 and the support 36 respectively. The main section 51 can be arranged with distance to the support 36 or adjoin the support 36 directly. In the embodiment according to FIGS. 5-9, the main section 51 of each transverse channel 49 ends with distance to the support 36 with view parallel to the longitudinal axis L, such that a ring-shaped closed ring part 53 of the holding body is present that is free from peripheral openings 50 and comprises a closed peripheral surface.

[0076] The transverse channels 49 are open at the axial side of the workpiece holder 35 that faces away from the support 36 or the ring part 53 and pass completely through the holding body 39 at the side facing away from the support 36. In doing so, separate holding body parts 54 are created that are separated by the transverse channels 49. In the described preferred embodiment that is illustrated in FIGS. 5-9 the main section 51 of each transverse channel 49 has in circumferential direction U, a larger width than the slit section 52. With radial view to the longitudinal axis L each holding body part 54 thus obtains a T-shaped form with a longitudinal bar 54a extending parallel to the longitudinal axis and a transverse bar 54b extending in circumferential direction U and provided at the holding end 41 of the holding body 39. At each transverse bar 54b an axial holding surface section 42a of the axial holding surface 42 and a peripheral holding surface section 43a of the peripheral holding surface 43 is present. All of the axial holding surface sections 42a are aligned in a common plane orthogonal to the longitudinal axis L. All of the peripheral holding surface sections 43a are arranged in a common cylinder skin surface coaxially to the longitudinal axis L, if the holding body parts 54 are free of forces and not deflected from their respective rest positions.

[0077] By the axial holding surface sections 42a, 43a, the workpiece 24 is supported at its peripheral region at a plurality and for example three or four peripheral locations in circumferential direction U. In doing so, the axial holding surface sections 42a contact the peripheral region of the lower workpiece surface 24b and the peripheral holding surface sections 43a contact a peripheral edge or peripheral surface of the workpiece 24. Preferably the workpiece 24 lies only by its own weight on the holding body 39 or on the axial holding surface sections 42a. Alternatively, by elastic deflection of the holding body parts 54 away from the longitudinal axis L, a clamping force can be applied by the peripheral holding surface sections 43a onto the workpiece 24. The clamping force can be low, because during a contactless measurement no measuring forces act upon the workpiece 24 and during a tactile measurement the measuring forces are extremely small, particularly smaller than 5 mN.

[0078] In the preferred embodiment the workpiece 24 is not overlapped at the first workpiece surface 24a, such that the first workpiece surface 24a is completely free and not overlapped by parts of the workpiece holder 35.

[0079] The shown embodiments of the workpiece holder 35 are configured for holding of round or circular workpieces. In a non-illustrated embodiment the holding body 39 of the workpiece holder 35 can have a prismatic form in sections and can be configured for holding workpieces 24 with a polygonal cross-section.

[0080] The invention refers to a workpiece holder 35 as well as a measuring device 20 and a method for executing a measurement by using the workpiece holder 35. The workpiece holder 35 is configured to hold a workpiece 24 with two opposite arranged workpiece surfaces 24a, 24b to be measured in a way that both are accessible by a moveable probe unit 26 and can thus be measured in one setting of the workpiece 24. For this the workpiece holder 35 comprises a support 36 and a holding body 39. The holding body 39 has a holding end 41 away from the support 36 with at least one holding surface 42, 43 at which the workpiece 24 is held. In the holding body 39 a free space 47 is formed that adjoins the workpiece surface 24b facing the support when a workpiece 24 is held and makes the workpiece surface 24b accessible for measuring or probing. The accessibility for the probe unit 26 is provided by a transverse channel 49 extending obliquely or orthogonally to the longitudinal axis L of the workpiece holder 35.

LIST OF REFERENCE SIGNS

[0081] 20 measuring device

[0082] 21 machine basis

[0083] 23 clamping device

[0084] 24 workpiece

[0085] 24a first workpiece surface

[0086] 24b second workpiece surface

[0087] 25 machine axes arrangement

[0088] 26 probe unit

[0089] 27 probe arm

[0090] 28 free probe end

[0091] 29 first probe element

[0092] 30 second probe element

[0093] 35 workpiece holder

[0094] 36 support

[0095] 37 clamping pin

[0096] 38 support plate

[0097] 39 holding body

[0098] 40 attachment end

[0099] 41 holding end

[0100] 42 axial holding surface

[0101] 42a axial holding surface section

[0102] 43 peripheral holding surface

[0103] 43a peripheral holding surface section

[0104] 47 free space

[0105] 48 central region

[0106] 49 transverse channel

[0107] 50 peripheral opening

[0108] 51 main section

[0109] 52 slit section

[0110] 53 ring part of the holding body

[0111] 54 holding body part

[0112] 54a longitudinal bar of the holding body part

[0113] 54b transverse bar of the holding body part

[0114] B moving direction

[0115] d offset

[0116] K1 first curve

[0117] K2 second curve

[0118] L longitudinal axis

[0119] O1 first optical axis

[0120] O2 second optical axis

[0121] Oi optical axes of a lens array

[0122] rS rotational degree of freedom about the pivot axis

[0123] S pivot axis

[0124] Tx translational degree of freedom in x-direction

[0125] Ty translational degree of freedom in y-direction

[0126] Tz translational degree of freedom in z-direction

[0127] U circumferential direction

[0128] x x-direction

[0129] y y-direction

[0130] z z-direction