Method and Structure for Conductive Elastomeric Pin Arrays Using Conductive Elastomeric Interconnects and/or metal Caps through a Hole or An Opening in a Non-Conductive Medium
20190348787 ยท 2019-11-14
Assignee
Inventors
- Charles William Martin (Wind Gap, PA, US)
- Christopher Matthew Beers (Everett, WA, US)
- JAMES V. RUSSELL (BASKING RIDGE, NJ, US)
Cpc classification
H01R12/714
ELECTRICITY
H01R12/79
ELECTRICITY
H01R12/523
ELECTRICITY
H01R12/73
ELECTRICITY
H01R12/52
ELECTRICITY
H01R12/7082
ELECTRICITY
International classification
H01R43/00
ELECTRICITY
Abstract
An improved method and structure is provided for constructing elastomeric pin arrays using a non-conductive medium and compression limiters. Pin to pin of the same elastomeric material, pin to pin of similar elastomeric material, or pin to metal cap structure interconnects are constructed using an elastomeric connection through a non-conductive medium. Compression limiting structures are mated to the non-conductive medium. This structure eliminates the need for PCB structures as the medium reducing manufacturing cost.
Claims
1. An electrical interconnect, comprising: elastomeric pin arrays formed of elastomeric material joined together using a conductive elastomer through a hole or opening in a non-conductive medium; and compression limiting structures mated to said non-conductive medium, said compression limiting structures being used to limit conductive elastomeric strokes to within target ranges thereby forming an electrical interconnect and negating a need for a PCB based through via/pad structure and reducing manufacturing costs.
2. The electrical interconnect of claim 1 wherein said elastomers are the same elastomeric material.
3. The electrical interconnect of claim 1 wherein said elastomers are the similar elastomeric material.
4. The electrical interconnect according to claim 1 wherein said target ranges are 10%-40% of the non-compressed height of the elastomers.
5. The electrical interconnect of claim 1 wherein said compression limiting structures, such as but not limited to Kapton or FRW, are used to limit conductive elastomeric interconnect compression strokes to within target ranges of 10%-40% of the non-compressed height of the elastomers.
6. An electrical interconnect, comprising: pin arrays formed of elastomeric pin to metal cap structure interconnects using a conductive elastomer and metal cap through a hole or opening in a non-conductive medium; and compression limiting structures mated to said non-conductive medium, said compression limiting structures being used to limit conductive elastomeric strokes to within target ranges thereby forming an electrical interconnect and negating a need for a PCB based through via/pad structure and reducing manufacturing costs.
7. An electrical interconnect, comprising: a PCB or IC ball grid array interconnect using a mating pad, a compression limiter, a conductive elastomer, a non-conductive medium and ball.
8. A method for forming an electrical interconnect, the steps comprising: forming elastomeric pin arrays elastomeric material joined together using a conductive elastomer through a hole or opening in a non-conductive medium; and compression limiting structures mated to said non-conductive medium, said compression limiting structures limiting conductive elastomeric strokes to within a target range thereby forming an electrical interconnect and negating a need for a PB based through via/pad structure and reducing manufacturing costs.
9. The method of claim 8 wherein said elastomers are the same elastomeric material.
10. The method of claim 8 wherein said elastomers are the similar elastomeric material.
11. A method of forming an electrical interconnect, the steps comprising: forming arrays formed of elastomeric pin to metal cap structure interconnects using a conductive elastomer and metal cap through a hole or opening in a non-conductive medium; and compression limiting structures mated to said non-conductive medium, said compression limiting structures limiting conductive elastomeric strokes to within target ranges thereby forming an electrical interconnect and negating a need for a PCB based through via/pad structure and reducing manufacturing costs.
12. A method of forming an electrical interconnect, the steps comprising: forming a PCB to IC ball grid array interconnect by joining and connecting mating pads, a compression limiter, a conductive elastomer, a non-conductive medium and a ball.
Description
BRIEF DESCRIPTION OF THE DRAWINGS
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DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENT(S)
[0010] Referring to the drawings of
[0011] The conductive elastomer 3 is connected with compression limiters 2 on both sides of the conductive elastomer 3 and a non-conductive medium 4 by a non-conductive medium having a hole or opening with elastomeric material and/or metal caps feeding through the hole or opening. A mating pad is provided on a portion of a top surface of the second PCB substrate 5b to connectedly be attached, preferably with adhesive material, to the bottom surface of the conductive elastomer 3.
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[0016] While certain embodiments have been shown and described, it is distinctly understood that the invention is not limited thereto but may be otherwise embodied within the scope of the appended claims.