Modification arrangement for an X-ray generating device

Abstract

The invention relates to a modification arrangement for an X-ray generating device, a modification method, a computer program element for controlling such device and a computer readable medium having stored such computer program element. The modification arrangement comprises a cathode, an anode (2) and modification means, e.g. a modification device. The cathode is configured to provide an electron beam (15). The anode (2) is configured to rotate under impact of the electron beam (15) and is segmented by slits (21) arranged around the anode's circumference. The modification means are configured to modify the electron beam (15) when the electron beam (15) is hitting one of the anode's rotating slits (21).

Claims

1. A modification arrangement for an X-ray device, comprising a cathode configured to provide an electron beam; an anode configured to rotate under impact of the electron beam, the anode being segmented by slits arranged around a circumference of the anode; a modification device configured to modify the electron beam when the electron beam is hitting one of the slits of the anode, wherein the modification device is configured to deflect the electron beam tangentially forward in or backward against a direction of a rotational movement of the anode, and then backward against or forward in the direction of the rotational movement of the anode to reduce time during which the electron beam hits one of the slits.

2. The arrangement according to claim 1, wherein the modification device is configured to modify the electron beam when one of the slits is approaching and/or departing the electron beam.

3. The arrangement according to claim 1, wherein the modification device is further configured to widen or shorten the electron beam in a radial and/or tangential direction.

4. The arrangement according to claim 1, wherein the modification device is further configured to change a shape of a cross section of the electron beam in the plane of the slits.

5. The arrangement according to claim 4, wherein the modification device comprises an electric and/or magnetic sub-device.

6. The arrangement according to claim 1, wherein the anode is configured to output a photon flux when the electron beam hits the anode, and wherein the modification device is configured to modify the electron beam so that the generated photon flux is essentially stable when the electron beam hits one of the slits.

7. The arrangement according to claim 6, wherein the anode is configured to output a photon flux when the electron beam hits the anode, and wherein the modification device is configured to modify the electron beam so that the generated photon flux is fluctuating by less than 90% when the electron beam hits one of the slits compared to when the electron beam hits the anode outside of the slits.

8. An X-ray imaging system, comprising: an X-ray source that includes a modification arrangement comprising: a cathode configured to provide an electron beam; an anode configured to rotate under impact of the electron beam, the anode being segmented by slits arranged around a circumference of the anode; a modification device configured to modify the electron beam when the electron beam is hitting one of the slits of the anode, wherein the modification device is configured to deflect the electron beam tangentially forward in or backward against a direction of a rotational movement of the anode, and then backward against or forward in the direction of the rotational movement of the anode to reduce time during which the electron beam hits one of the slits; and an X-ray detector.

9. A method for modifying an electron beam in an X-ray device, comprising: providing an electron beam by the X-ray device; rotating an anode under impact of the electron beam, wherein the anode is segmented by slits being present radially inwards into a circumference of the anode traversing a focal track and substantially equidistantly arranged around the circumference; modifying the electron beam when hitting one of the rotating slits; and deflecting the electron beam tangentially forward in or backward against a direction of a rotational movement of the anode, and then backward against or forward in the direction of the rotational movement of the anode to reduce time during which the electron beam hits one of the slits.

10. The method according to claim 9, further comprising widening or shortening the electron beam.

11. A non-transitory computer-readable medium having one or more executable instructions stored thereon, which, when executed by a processor, cause the processor to perform a method for modifying an electron beam in an X-ray device, the method comprising: providing an electron beam; rotating an anode under impact of the electron beam, wherein the anode is segmented by slits being present radially inwards into a circumference of the anode traversing a focal track and substantially equidistantly arranged around the circumference; modifying the electron beam when hitting one of the rotating slits; and deflecting the electron beam tangentially forward in or backward against a direction of a rotational movement of the anode, and then backward against or forward in the direction of the rotational movement of the anode to reduce time during which the electron beam hits one of the slits.

Description

BRIEF DESCRIPTION OF THE DRAWINGS

(1) Exemplary embodiments of the invention will be described in the following with reference to the accompanying drawings:

(2) FIG. 1 shows a schematic drawing of an embodiment of a system for X-ray imaging and a modification arrangement according to the invention.

(3) FIG. 2 shows schematically and exemplarily an anode as part of a modification arrangement according to the invention.

(4) FIG. 3 shows schematically and exemplarily several views of an anode and a focal spot of an electron beam.

(5) FIG. 4 shows basic steps of an example of a modification method.

DETAILED DESCRIPTION OF EMBODIMENTS

(6) FIG. 1 shows schematically and exemplarily an embodiment of a system 10 for X-ray imaging according to the invention. The system 10 comprises a gantry 11 with an X-ray source 12 and an X-ray detector. The gantry 11 is rotatable about a patient 101 under examination. The X-ray source 12 generates an e.g. cone shaped beam of X-rays 13. Opposite to the X-ray source 12 on the gantry 11 is a detector system, which converts the attenuated X-rays 13 to electrical signals. A computer system (not shown) reconstructs an image of the patient's inner morphology.

(7) The X-ray source 12 comprises an exemplary embodiment of a modification arrangement 1 according to the invention. The modification arrangement 1 comprises a cathode, an anode and a modification device. The cathode provides an electron beam. The anode rotates under impact of the electron beam. The modification device comprises an electric and/or magnetic subdevice.

(8) FIG. 2 shows schematically and exemplarily the anode 2. The anode 2 is segmented by slits 21 arranged around the anode's circumference. The modification device modifies the electron beam 15 when the electron beam 15 is hitting one of the anode's rotating slits 21. The modification device also modifies the electron beam 15 when one of the slits 21 is approaching and departing the electron beam 15. This means, as soon as one of the slots which rotates with the anode 2 approaches the position where the electron beam 15 hits the anode 2 and where the X-radiation is generated, the electron beam 15 is modified. The modification of the electron beam 15 can be understood as a modification of a focal spot of the electron beam 15 at a position, where the electron beam 15 impinges on the anode 2.

(9) In a time sequence, first, when no slit is close to the position where the electron beam 15 hits the anode 2, the electron beam 15 is not modified. It this initial position I, the focal spot of the electron beam 15 is stable.

(10) Then, when a slit 21 approaches the position where the electron beam 15 hits the anode 2, the electron beam 15 is modified, namely is here deflected in a tangential deflection relative to the rotational movement of the anode 2. In FIG. 2, the electron beam 15 is deflected forward in the direction of the anode's rotational movement to a position A (as shown by the arrow).

(11) When the slit 21 has passed the position where the electron beam 15 originally hit the anode 2 at position I, the electron beam 15 is again modified, which means here rapidly deflected in the opposite direction. In FIG. 2, the electron beam 15 is deflected backward against the direction of the anode's rotational movement to a position B (as shown by the arrow). Thereby, the time during which the electron beam 15 hits one of the slits 21 is reduced.

(12) When the slit 21 has departed also the region next to the position where the electron beam 15 hits the anode 2, the electron beam 15 is again modified, which means deflected in the opposite direction back to the initial position I.

(13) Thereby, the electron beam 15 passes the slit 21 in a fast pace so the period of time is minimized during which the photon flux is reduced. Thereby, a stabilizing of the photon flux from the segmented rotating anode 2 is achieved. In other words, a dip of the photon flux during passage of a slit 21 in the anode 2 is reduced. No or nearly no signal bursts appear and the corresponding undesired noise is also completely or nearly avoided. As a result, the detection and/or reconstruction of an image are improved and thereby the quality of image data is increased.

(14) This modifying of the electron beam 15 by deflection can be extended (or replaced) by a widening or shortening of the electron beam 15. It can further be extended (or replaced) by a change of shape of the electron beam 15, e.g. from a rectangular shape to a diagonal trapezoid shape.

(15) FIG. 3 shows schematically and exemplarily several views of a rotating anode 2 with a slit 21 and a focal spot 14 of an electron beam (not shown). The focal spot 14 is at the position, where the electron beam hits or impinges the anode 2. In FIG. 3a, the focal spot 14 is not modified.

(16) In FIGS. 3b to 3d, the focal spot 14 is modified. In FIG. 3b, the focal spot 14 is widened in a tangential direction. The widening of the electron beam leads to an enlargement of the focal spot 14. In FIG. 3c, the focal spot 14 is shortened or shrunken in a tangential direction.

(17) In FIG. 3d, the shape of the focal spot 14 is changed. In other words, the cross section of the electron beam in the plane of the slit 21 is changed. The initial square shape of the focal spot 14 as shown in FIG. 3a with the square standing on one of its sides is tilted or rotated so that the square now stands rhomb like on one of its corners. In comparison to the square shape standing on one of its sides, the rhomb like square standing on one of its corners is jammed in the slit 21, so that larger parts of the electron beam do not disappear in the slit 21. Further, this change of shape of the cross section of the electron beam in the plane of the slit 21 is combined with a widening as shown in FIG. 3b. The square focal spot 14 is slightly enlarged into a rectangular shape, which further enlarges the amount of the electron beam not disappearing in the slit 21.

(18) FIG. 4 shows a schematic overview of steps of a modification method for an X-ray generating device. The method comprises the following steps, not necessarily in this order: In a first step S1, providing an electron beam 15. In a second step S2, rotating an anode 2 under impact of the electron beam 15, wherein the anode 2 is segmented by slits 21 being present radially inwards into the outer circumference of the anode traversing the focal track and substantially equidistantly arranged around the anode's circumference. In a third step S3, modifying the electron beam 15 when hitting one of the anode's rotating slits 21.

(19) The modification device can also be configured to modify the electron beam 15 when one of the slits 21 is approaching and/or departing the electron beam 15.

(20) The modification of the electron beam can be understood as a modification of a focal spot of the electron beam at a position, where the electron beam impinges on the anode 2. The modification can be a deflection, a change of shape and/or a widening or shortening of the electron beam.

(21) In another exemplary embodiment of the present invention, a computer program or a computer program element is provided that is characterized by being adapted to execute the method steps of the method according to one of the preceding embodiments, on an appropriate system.

(22) The computer program element might therefore be stored on a computer unit, which might also be part of an embodiment of the present invention. This computing unit may be adapted to perform or induce a performing of the steps of the method described above. Moreover, it may be adapted to operate the components of the above described apparatus. The computing unit can be adapted to operate automatically and/or to execute the orders of a user. A computer program may be loaded into a working memory of a data processor. The data processor may thus be equipped to carry out the method of the invention.

(23) This exemplary embodiment of the invention covers both, a computer program that right from the beginning uses the invention and a computer program that by means of an up-date turns an existing program into a program that uses the invention.

(24) Further on, the computer program element might be able to provide all necessary steps to fulfil the procedure of an exemplary embodiment of the method as described above.

(25) According to a further exemplary embodiment of the present invention, a computer readable medium, such as a CD-ROM, is presented wherein the computer readable medium has a computer program element stored on it, which computer program element is described by the preceding section.

(26) A computer program may be stored and/or distributed on a suitable medium, such as an optical storage medium or a solid state medium supplied together with or as part of other hardware, but may also be distributed in other forms, such as via the internet or other wired or wireless telecommunication systems.

(27) However, the computer program may also be presented over a network like the World Wide Web and can be downloaded into the working memory of a data processor from such a network. According to a further exemplary embodiment of the present invention, a medium for making a computer program element available for downloading is provided, which computer program element is arranged to perform a method according to one of the previously described embodiments of the invention.

(28) It has to be noted that embodiments of the invention are described with reference to different subject matters. In particular, some embodiments are described with reference to method type claims whereas other embodiments are described with reference to the device type claims. However, a person skilled in the art will gather from the above and the following description that, unless otherwise notified, in addition to any combination of features belonging to one type of subject matter also any combination between features relating to different subject matters is considered to be disclosed with this application. However, all features can be combined providing synergetic effects that are more than the simple summation of the features.

(29) While the invention has been illustrated and described in detail in the drawings and foregoing description, such illustration and description are to be considered illustrative or exemplary and not restrictive. The invention is not limited to the disclosed embodiments. Other variations to the disclosed embodiments can be understood and effected by those skilled in the art in practicing a claimed invention, from a study of the drawings, the disclosure, and the dependent claims.

(30) In the claims, the word comprising does not exclude other elements or steps, and the indefinite article a or an does not exclude a plurality. A single processor or other unit may fulfil the functions of several items re-cited in the claims. The mere fact that certain measures are re-cited in mutually different dependent claims does not indicate that a combination of these measures cannot be used to advantage. Any reference signs in the claims should not be construed as limiting the scope.