Systems and methods for materials analysis

Abstract

A system for the x-ray topography analysis of a sample, comprising in combination, a goniometer having a base, a tube arm rotatably associated with the base, a detector arm rotatably associated with the base, and a sample stage operatively associated with the base. The system also includes an x-ray source operatively coupled with the tube arm and is capable of emitting a non-collimated beam of x-rays. A collimator is operatively associated with the x-ray source and converts the non-collimated beam of x-rays into a collimated beam of x-rays having a quasi-rectangular shape with a divergence less than three degrees in all directions. A detector operatively coupled to the detector arm.

Claims

1. A method for the characterization of micro-textured regions in a sample containing more than one crystalline phase, comprising: providing an x-ray diffraction system, the system having a base, a tube arm rotatably associated with the base, a detector arm rotatably associated with the base, and a sample stage that includes three axes of translation and three axes of rotation, an x-ray source capable of emitting a non-collimated beam of x-rays, and a collimator operatively associated with the x-ray source, the collimator capable of converting the non-collimated beam of x-rays into a collimated beam of x-rays having a quasi-rectangular shape with a divergence less than one degree in all directions, wherein the collimated beam of x-rays is directed towards a surface of a sample on the sample stage at an angle of incidence relative to the surface of the sample; activating the pixelated area detector operatively coupled to the detector arm, the detector continuously creating an output signal, wherein the detector has a detector surface and the detector arm is an automated detector arm capable of varying the distance between the detector surface and the sample and an angle between the collimated beam of x-rays and the detector surface, wherein the detector captures quasi-parallel x-rays diffracted off the surface of the sample at an angle of reflection relative to the surface of the sample, wherein the angle of reflection is different from the angle of incidence, and wherein the detector is located at the angle of reflection; turning on the X-ray source; moving the sample stage, the X-ray source and the detector until a portion of the collimated beam of X-rays is diffracted from the sample into the detector; and sending the output signal to a computer.

2. The method of claim 1, wherein the moving the sample stage is translation and further comprises the step of translating the sample stage in one hundred micrometer increments along all three axes of translation.

3. The method of claim 2, wherein the computer quantifies the shape, size, density and orientation of the micro-textured regions in the sample.

4. The method of claim 1, wherein the moving the sample stage is rotation and further comprises the step of rotating the sample stage in one hundred micrometer increments along one axis of rotation.

5. The method of claim 4, wherein the computer quantifies the shape, size, density and orientation of the micro-textured regions in the sample.

Description

BRIEF DESCRIPTION OF THE DRAWINGS

(1) FIG. 1 is a side elevation view of an X-ray diffraction system for the characterization of micro-textured regions in a metal sample containing more than one crystalline phase constructed in accordance with the present disclosure.

(2) FIG. 2 is a partial isometric side view depicting the operation of the diffraction-detection portion of X-ray diffraction system of FIG. 1.

(3) FIG. 3 is a flowchart depicting an exemplary method for the characterization of micro-textured regions in a metal sample containing more than one crystalline phase utilizing a system depicted in FIG. 1.

(4) These and other aspects and features of the present disclosure will be more readily understood when read in conjunction with the accompanying drawings.

DETAILED DESCRIPTION OF THE DISCLOSURE

(5) Referring now to the drawings, and with specific reference to FIG. 1, an X-ray diffraction system for the characterization of micro-textured regions in a metal sample containing more than one crystalline phase constructed in accordance with the present disclosure is generally referred to by reference numeral 10. The X-ray diffraction system includes a goniometer 12 having a base 14, a tube arm 16 rotatably associated with the base 14, a detector arm 18 rotatably associated with the base 14 and a sample stage 20 operatively associated with the base 14.

(6) The X-ray diffraction system 10 may further include a computer 22. This computer 22 may be in electrical communication with the goniometer 12 and include a first algorithm 24. The first algorithm 24 may control the movement of the tube arm 16, the detector arm 18 and the sample stage 20. Accordingly, the movement of the tube arm 16, the detector arm 18 and sample stage 20 may be automated by their interaction with the computer 22.

(7) The tube arm 16 may rotate around the base 14 between an angle of zero degrees and one hundred seventy degrees. Like the tube arm 16, the detector arm 18 may also rotate around the base 14 between an angle of zero degrees and one hundred and seventy degrees. The arms 16, 18 are rotatable around the base 14 so that a sample 26 may be analyzed from multiple locations.

(8) Still referring to FIG. 1, the X-ray diffraction system further comprises an X-ray source 28 that is operatively coupled to the tube arm 16. Since the X-ray source 28 is coupled to the tube arm 16, the movement of the source 28 coincides with the automated movement of the arm 16. This X-ray source 28 is capable of radiatively supplying an array of non-collimated x-rays. While not all inclusive, examples of an x-ray source 28 that may be used with this system include a copper target, molybdenum target, nickel target, titanium target and silver target sources.

(9) A collimator 30 may be operatively associated with and located downstream of the X-ray source 28. As the X-rays from the source 28 pass through the collimator 30, the array of non-collimated X-rays may be converted into a collimated beam of x-rays. In one embodiment, this collimated beam may have a quasi-rectangular shape with a divergence less than three degrees in all directions. In another embodiment, this collimated beam may have a quasi-rectangular shape with a divergence less than two degrees in all directions. In a further embodiment, this collimated beam may have a quasi-rectangular shape with a divergence less than one degree in all directions. While not meant to be exhaustive, collimator 30 that may be used with a system 10 constructed in accordance with the present disclosure include slits and X-ray lenses on optical fibers.

(10) This X-ray diffraction system may further include a detector 32 that is operatively coupled to the detector arm 18. Since the detector 32 is coupled to the detector arm 18, the movement of the detector 32 coincides with the automated movement of the detector arm 18. Additionally, the tube arm 18 may also move so that the distance between the sample 26 and the detector 32 is adjustable. This movement allows for focusing of the detector 32 with respect to the sample 26 when the system 10 is in operation.

(11) The detector 32 may be a pixelated area detector that comprises a plurality of pixels that extend in a first direction from a point, and the plurality of pixels may also extend in a second direction from the same point thereby generating an area of pixels. Each pixel of this detector 32 may act as an individual detector having a detection surface, and the width of each detection surface may be between one micrometer and one thousand micrometers. In one instance, the detector 32 may be a charge-coupled device. In another instance, a detector 32 that may be used with this system 10 is an active pixel sensor. In yet other examples, the detector 32 may be a scintillation detector, Xe-field detector or even a solid-state detector.

(12) The detector 32 may generate an output signal 34. This output signal 34 may then be sent to the computer 22 that comprises a second algorithm 36 that is utilized to characterize the sample 26 for the presence of micro-textured regions 38. The second algorithm 36 may further quantify the shape, size, density and orientation of any micro-textured regions 38 present in the sample 26. Limits may be set on the shape, size, density and orientation of any micro-textured regions 38 in the sample 26, and the computer 22 may provide a report whether the sample 26 falls below such limits.

(13) If the system 10 is utilized in a manufacturing environment, then the computer 22 may be pre-loaded with multiple first algorithms 24 based on the shape of the sample 26 such as by Computer Aided Design (CAD) drawings. Then, when a sample 26 having a particular shape is loaded onto the system 10, a first algorithm 24 specific to the shape of the sample 26 may be utilized to control the movement of the tube arm 16, detector arm 18 and the sample stage 20.

(14) The operation of the diffraction-detection portion of the X-ray diffraction system manufactured in accordance with the present disclosure is depicted in FIG. 2. As seen there, the collimated beam of X-rays is emitted upon the sample 26. Then, the incoming angle 40 of collimated beam of X-rays with respect to a surface of the sample 26 is adjusted until a portions of the X-rays diffract away from, rather than transmitting through, the sample 26. These diffracted X-rays will be captured by the detector 32. More specifically, the sample 26 will diffract X-rays in locations where micro-textured regions 38 are present. The capture of diffracted X-rays by the detector 32 confirms the presence of these micro-textured regions in the sample 26 under analysis.

(15) Referring next to FIG. 3, steps of a method for the characterization of micro-textured regions in a metal sample containing more than one crystalline phase are illustrated. At a step 40, an x-ray diffraction system, the system having a sample stage that includes three axes of translation and three axes of rotation, an x-ray source, a collimator that provides a collimated beam of x-rays with a divergence less than three degrees in all directions, a pixelated area detector whose distance between it and the sample stage is variable, and wherein the angle between the X-ray source and the pixelated area detector may be varied between zero degrees and one hundred and seventy degrees is provided. At a step 42, the pixelated detector is turned on and continuously creates an output signal. At a step 44, the X-ray source is turned on. At a step 46, the sample stage, the X-ray source and the detector are moved until a portion of the collimated beam of X-rays is diffracted from the metal sample into the detector. At a step 48, the output signal is sent to a computer.

(16) If the moving the sample stage is translation, then at a step 50, the method further comprises the step of translating the sample stage in one hundred micrometer increments along three axes of rotation. If the moving the sample stage is translation, then at a step 52, the method further includes the computer quantifying the shape, size, density and orientation of the micro-textured regions in the sample.

(17) If the moving the sample stage is rotation, then at a step 54, the method further comprises the step of rotating the sample stage in one hundred micrometer increments along one axis of rotation. If the moving the sample stage is rotation, then at a step 56, the method further includes the computer quantifying the shape, size, density and orientation of the micro-textured regions in the sample.

INDUSTRIAL APPLICABILITY

(18) In operation, the X-ray diffraction system for the characterization of micro-textured regions in a metal sample containing more than one crystalline phase can find use in many industrial settings, such as in a manufacturing environment. More specifically, such a system finds use as a quality control tool in the manufacturing processes of aerospace component manufacturers, such as in the manufacture of gas turbine engines. Such a system includes a goniometer having a base, an automated tube arm rotatably associated with the base, an automated detector arm rotatably associated with the base, and an automated sample stage operatively associated with the base. The system may also include an x-ray source that radiatively supplies an array of non-collimated x-rays coupled to the automated tube arm. A collimator may also be included that is operatively associated with and downstream of the x-ray source, the collimator providing a beam of x-rays that has a divergence in all directions less than or about equal to three degrees. A pixelated area detector may be coupled to the automated detector arm. The detector may have a plurality of pixels that extend in a first direction from a point and extend in a second direction from the point, each pixel having a detection surface having a width between one micrometer and one thousand micrometers and the detector may generate an output signal. Finally, a computer may be in electrical communication with the goniometer and contain a first algorithm that controls the movement of the automated tube arm, the automated detector arm and the automated stage. The computer may also comprise a second algorithm that quantifies the shape, size, density and orientation of micro-textured regions in sample.

(19) The above description is meant to be representative only, and thus modifications may be made to the embodiments described herein without departing from the scope of the disclosure. Thus, these modifications fall within the scope of present disclosure and are intended to fall within the appended claims.