FORMING METHOD OF PLASMA RESISTANT OXYFLUORIDE COATING LAYER
20230215701 · 2023-07-06
Inventors
Cpc classification
C23C14/26
CHEMISTRY; METALLURGY
H01J37/32477
ELECTRICITY
International classification
C23C14/26
CHEMISTRY; METALLURGY
Abstract
The present invention relates to a method of forming a plasma resistant oxyfluoride coating layer, including: mounting a substrate on a substrate holder provided in a chamber; causing an electron beam scanned from an electron gun to be incident on an oxide evaporation source accommodated in a first crucible, and heating, melting, and vaporizing the oxide evaporation source as the electron beam is incident on the oxide evaporation source; vaporizing a fluoride accommodated in a second crucible; and advancing an evaporation gas generated from the oxide evaporation source and a fluorine-containing gas generated from the fluoride toward the substrate, and reacting the evaporation gas generated from the oxide evaporation source and the fluorine-containing gas generated from the fluoride to deposit an oxyfluoride on the substrate. According to the present invention, it is possible to form a dense and stable oxyfluoride coating layer having excellent plasma resistance, suppressed generation of contaminant particles, and no cracks.
Claims
1. A method of forming a plasma resistant oxyfluoride coating layer, comprising: mounting a substrate on a substrate holder provided in a chamber; causing an electron beam scanned from an electron gun to be incident on an oxide evaporation source accommodated in a first crucible, and heating, melting, and vaporizing the oxide evaporation source as the electron beam is incident on the oxide evaporation source; vaporizing a fluoride accommodated in a second crucible; and advancing an evaporation gas generated from the oxide evaporation source and a fluorine-containing gas generated from the fluoride toward the substrate, and reacting the evaporation gas generated from the oxide evaporation source and the fluorine-containing gas generated from the fluoride to deposit an oxyfluoride on the substrate.
2. The method of claim 1, wherein the oxide evaporation source comprises one or more materials selected from the group consisting of Y.sub.2O.sub.3 and Al.sub.2O.sub.3.
3. The method of claim 1, wherein the fluoride is a solid material.
4. The method of claim 1, wherein the fluoride comprises one or more solid materials selected from the group consisting of NH.sub.4F, NH.sub.5F.sub.2, MgF.sub.2, AlF.sub.3, and YF.sub.3.
5. The method of claim 1, wherein a temperature of the substrate is set in a range of 100 to 700° C.
6. The method of claim 1, wherein power applied to the electron gun through a power supply is set in a range of 1 to 10 kW.
7. The method of claim 1, wherein a vacuum degree in the chamber is controlled to be in a range of 0.01 to 1 mTorr while the oxide evaporation source is evaporated.
8. The method of claim 1, wherein the substrate holder is set to rotate at a speed ranging from 1 to 100 rpm to form the oxyfluoride coating layer on the substrate.
9. The method of claim 1, wherein oxygen is supplied into the chamber through a gas supply device while the oxide evaporation source is evaporated, and a flow rate of the supplied oxygen is controlled to be in a range of 0.01 to 20 sccm.
10. The method of claim 1, wherein a deposition rate of the oxyfluoride coating layer is controlled to be in a range of 10 to 200 nm/min.
11. The method of claim 1, wherein a thickness of the oxyfluoride coating layer is controlled to be in a range of 0.2 to 50 μm.
12. The method of claim 1, wherein a fluorine content contained in the oxyfluoride is regulated by regulating the number of second crucibles accommodating the fluoride to adjust an evaporation amount of the fluoride.
13. The method of claim 1, wherein an evaporation amount of the fluoride is regulated by regulating an opening of a second crucible cover for accommodating the fluoride.
14. The method of claim 13, wherein a degree of opening and closing of the opening of the second crucible cover is controlled over time to control a fluorine content of the oxyfluoride coating layer formed by deposition.
15. The method of claim 1, wherein the fluoride is evaporated without additional heating or is evaporated using resistive electrical heating.
Description
BRIEF DESCRIPTION OF THE DRAWINGS
[0025] The above and other objects, features and advantages of the present disclosure will become more apparent to those of ordinary skill in the art by describing in detail exemplary embodiments thereof with reference to the accompanying drawings, in which:
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DETAILED DESCRIPTION OF EXEMPLARY EMBODIMENTS
[0037] Hereinafter, an embodiment of the present invention will be described in detail with reference to the accompanying drawings. However, the following examples are provided so that those of ordinary skill in the art can fully understand the present invention, and can be modified into various other forms, and the scope of the present invention is not limited to the examples described below.
[0038] When it is said that any one component “include(s)” another component in the detailed description or claims of the invention, this should not be construed as being limited to being made up of only the component, unless otherwise stated, and it should be understood that other components may be further included.
[0039] A method of forming a plasma resistant oxyfluoride coating layer according to an exemplary embodiment of the present invention includes: mounting a substrate in a substrate holder provided in a chamber; causing an electron beam scanned from an electron gun to be incident on an oxide evaporation source accommodated in a first crucible, and heating, melting, and vaporizing the oxide evaporation source as the electron beam is incident on the oxide evaporation source; vaporizing a fluoride accommodated in a second crucible; and advancing an evaporation gas generated from the oxide evaporation source and a fluorine-containing gas generated from the fluoride toward the substrate, and reacting the evaporation gas generated from the oxide evaporation source and the fluorine-containing gas generated from the fluoride to deposit an oxyfluoride on the substrate.
[0040] The oxide evaporation source may include one or more materials selected from the group consisting of Y.sub.2O.sub.3 and Al.sub.2O.sub.3.
[0041] The fluoride may be a solid material.
[0042] The fluoride may include one or more solid materials selected from the group consisting of NH.sub.4F, NH.sub.5F.sub.2, MgF.sub.2, AlF.sub.3, and YF.sub.3.
[0043] A temperature of the substrate may be set in a range of 100 to 700° C.
[0044] Power applied to the electron gun through a power supply may be set in a range of 1 to 10 kW.
[0045] The vacuum degree in the chamber may be controlled to be in a range of 0.01 to 1 mTorr while the oxide evaporation source is evaporated.
[0046] The substrate holder may be set to rotate at a speed ranging from 1 to 100 rpm to form the oxyfluoride coating layer on the substrate.
[0047] Oxygen may be supplied into the chamber through a gas supply device while the oxide evaporation source is evaporated, and a flow rate of the supplied oxygen may be controlled to be in a range of 0.01 to 20 sccm.
[0048] A deposition rate of the oxyfluoride coating layer may be controlled to be in a range of 10 to 200 nm/min.
[0049] A thickness of the oxyfluoride coating layer may be controlled to be in a range of 0.2 to 50 μm.
[0050] The fluorine content contained in the oxyfluoride may be regulated by regulating the number of second crucibles accommodating the fluoride to adjust the evaporation amount of the fluoride.
[0051] The evaporation amount of the fluoride may be regulated by regulating an opening of a second crucible cover for accommodating the fluoride.
[0052] The degree of opening and closing of the opening of the second crucible cover may be controlled over time to control the fluorine content of the oxyfluoride coating layer formed by deposition.
[0053] The fluoride may be evaporated without additional heating or evaporated using resistive electrical heating rather than a high energy heat source such as an electron beam.
[0054] Hereinafter, a method of forming a plasma resistant oxyfluoride coating layer according to an exemplary embodiment of the present invention will be described in more detail.
[0055] The present invention relates to a method of forming an oxyfluoride coating layer on a substrate using a reactive physical vapor deposition method, wherein the substrate for depositing a coating layer is mounted inside a chamber maintaining a vacuum, and an oxyfluoride is deposited on the substrate by evaporating an oxide (evaporation source) and a fluoride to be deposited on the substrate and reacting an evaporation gas of the oxide with a fluorine-containing gas.
[0056]
[0057] Referring to
[0058] In the reactive physical vapor deposition apparatus having the above structure, the electron beam scanned from the electron gun 20 is deflected by the permanent magnet and is incident on the oxide evaporation source accommodated in the first crucible 30, and accordingly, the oxide evaporation source is heated and melted. At this time, since the shutter 60 is provided under the substrate 50, the evaporation path of an evaporation gas generated by the oxide evaporation source is blocked. When the shutter 60 opens the evaporation path, the evaporation gas of the oxide evaporation source proceeds upward along the evaporation path and arrives at the substrate 50 mounted on the lower surface of the substrate holder 40. By the incident electron beam, the oxide evaporation source is heated, melted, and vaporized, thereby causing the evaporation gas to proceed upward along the evaporation path. The oxide evaporation source may include one or more materials selected from the group consisting of Y.sub.2O.sub.3 and Al.sub.2O.sub.3.
[0059] A fluorine-containing fluoride in a solid state is accommodated in the second crucible 35. The second crucible 35 accommodating the fluoride is placed in the chamber 10, but it is preferable to place it separately from the first crucible 30 accommodating the oxide evaporation source. The number of crucibles accommodating the fluoride may be one or more depending on the composition of the oxyfluoride to be coated. When it is desired to increase the fluorine content of the oxyfluoride coating layer, it is preferable to set the number of crucibles to two or more. In addition, a shutter (not shown) capable of controlling the opening of the crucible may be provided.
[0060] The fluoride acts as a source for supplying fluorine-containing gas, and it is preferable to use a raw material including fluorine and having high volatility. The fluoride may include one or more solid materials selected from the group consisting of NH.sub.4F, NH.sub.5F.sub.2, MgF.sub.2, AlF.sub.3, and YF.sub.3. Materials such as NH.sub.4F and NH.sub.5F.sub.2 contain highly reactive F.sup.− anions. In particular, fluorides such as NH.sub.4F and NH.sub.5F.sub.2 contain fluorine and are highly volatile, and thus may not require additional heating, and accordingly have a low sublimation temperature and are easy to handle because the fluorides are present in a solid state. Fluorides such as MgF.sub.2, AlF.sub.3, and YF.sub.3, are volatile raw materials containing fluorine, and are solid materials that can be volatilized by conventional resistive electrical heating rather than a high energy heating source.
[0061] A separate heating device (not shown) for heating the second crucible 35 accommodating the fluoride may be provided. The fluoride can be heated and vaporized more effectively by the heating device. The fluoride may be evaporated without additional heating or evaporated using resistive electrical heating. In the case of an ammonium fluoride-based fluoride accommodated in the second crucible, a sufficient amount of volatilization can be obtained only with the ambient temperature in the chamber whose inside is maintained in a high vacuum, so that gasification occurs easily without a separate heating device. The fluorides such as MgF.sub.2, AlF.sub.3, and YF.sub.3, accommodated in the second crucible are low-melting-point materials and are solid materials that can be evaporated by conventional resistive electrical heating rather than a high energy heating source such as an electron beam.
[0062] The fluorine content contained in the oxyfluoride may be regulated by regulating the number of second crucibles accommodating the fluoride to adjust the evaporation amount of the fluoride. For example, in Example 1 to be described below, a fluoride was put into one second crucible and deposited, and in Example 2, the fluoride was put into two second crucibles and deposited, and as in Example 2, when the fluoride was put into two second crucibles and deposited, it was found that the fluorine content of the oxyfluoride coating layer formed by deposition was higher than that of the oxyfluoride coating layer formed according to Example 1. Considering this point, as the number of second crucibles accommodating the fluoride increases, the fluorine content in the oxyfluoride coating layer formed by deposition may increase.
[0063] A cover (not shown) for covering the upper portion of the second crucible accommodating the fluoride may be provided, the second crucible cover may be provided with an opening, and the evaporation amount of the fluoride may be regulated by regulating the opening of the second crucible cover. For example, the evaporation amount of the fluoride may be regulated by regulating the number of openings and the size of the opening of the second crucible cover. For example, when the number of openings is large or the size of the opening is large, the evaporation amount of the fluoride is relatively large, and accordingly, the fluorine content in the oxyfluoride coating layer formed by deposition may increase.
[0064] In order to finely adjust the evaporation amount of the fluoride, the size of the opening of the second crucible cover may be arbitrarily set, and the size of the opening may be regulated during the deposition process. The opening of the second crucible cover may regulate the opening/closing degree (for example, opening/closing amount) through a control device, thereby controlling the size or number of openings to be opened.
[0065] In addition, the degree of opening and closing of the opening of the second crucible cover may be controlled over time to control the fluorine content of the oxyfluoride coating layer formed by deposition. For example, by closing the opening of the second crucible cover at the beginning of deposition and opening the opening after a certain period of time to allow the fluoride to be deposited, the fluorine content may be higher on the surface than inside the oxyfluoride coating layer. In addition, the opening of the second crucible cover may be closed at the beginning of deposition, and the amount of opening and closing of the opening may be increased over time to increase the fluorine content from the inside to the surface of the oxyfluoride coating layer. In this case, it is possible to suppress the generation of stress at an interface between the substrate material and the oxyfluoride coating layer, which usually have a large difference in coefficient of thermal expansion, so that the occurrence of defects, such as peeling of the coating layer after deposition, can be suppressed.
[0066] Since the shutter 60 is provided under the substrate 50, the evaporation path of the gas generated by the fluoride is blocked. When the shutter 60 opens the evaporation path, the gas generated from the fluoride proceeds upward along the evaporation path and arrives at the substrate 50 mounted on the lower surface of the substrate holder 40.
[0067] The oxyfluoride coating layer is formed on the substrate 50 through a reaction between the evaporation gas generated from the oxide evaporation source and the fluorine-containing gas generated from the fluoride.
[0068] Hereinafter, a method of forming an oxyfluoride coating layer using a reactive physical vapor deposition method will be described in more detail.
[0069] Suitable substrates for forming the oxyfluoride coating layer using the reactive physical vapor deposition method are silicon, oxide-based, nitride-based, carbide-based, non-oxide-based ceramics sintered bodies, and metal materials such as aluminum. In addition, in the case of an inner material for a plasma process for manufacturing a semiconductor device or display, quartz (SiO.sub.2) and silicon (Si) may be widely used in members such as a chamber liner, a CVD boat, a focus ring, and a wall liner, and ceramic materials such as alumina (Al.sub.2O.sub.3) and aluminum nitride (AlN) used in electrostatic chucks and heaters may be applied.
[0070] To form the oxyfluoride coating layer, it is preferable to coat the oxyfluoride after treating the substrate surface so that the average surface roughness Ra has a surface roughness of 100 nm or less through mirror polishing. This is because, when the average surface roughness Ra of the substrate is 100 nm or more, the microstructure and surface roughness of the oxyfluoride coating layer are adversely affected by the surface roughness.
[0071] The substrate is mounted on the substrate holder 40 provided in the chamber 10 of the reactive physical vapor deposition apparatus. It is preferable to set the temperature of the substrate 50 in the range of 100 to 700° C. using a heating device. The substrate holder 40 may be set to rotate at a speed ranging from 1 to 100 rpm.
[0072] The oxide evaporation source is accommodated in the first crucible 30, and the first crucible 30 accommodating the oxide evaporation source is mounted in the chamber 10.
[0073] The fluoride is accommodated in the second crucible 35, and the second crucible 35 accommodating the fluoride is mounted in the chamber 10.
[0074] The electron beam scanned from the electron gun 20 of the reactive physical vapor deposition apparatus is deflected by the permanent magnet to be incident on the oxide evaporation source accommodated in the first crucible. The power applied to the electron gun 20 through the power supply may be set in the range of 1 to 10 kW.
[0075] As the electron beam is incident on the oxide evaporation source, the oxide evaporation source is heated, melted, and vaporized to cause the evaporation gas to proceed upward along the evaporation path. Due to the high energy of the electron beam, the oxide evaporation source is heated to a temperature of 1000° C. or higher, so that evaporation occurs and gas vapor is generated.
[0076] The fluoride accommodated in the second crucible 35 is also vaporized so that the fluorine-containing gas proceeds upward along the evaporation path. Fluorides such as NH.sub.4F and NH.sub.5F.sub.2 contain fluorine and have high volatility, and thus do not require separate heating, and vaporization occurs in the environment in the chamber 10 without additional heating to generate the fluorine-containing gas. Fluorides such as AlF.sub.3 and YF.sub.3 can be volatilized by conventional resistive electrical heating rather than a high energy heating source, and vaporization occurs by such heating to generate the fluorine-containing gas.
[0077] The shutter 60 located under the substrate 50 is opened to allow the evaporation gas of the oxide evaporation source to proceed along the evaporation path toward the substrate 50, the gas vaporized from the fluoride also proceeds along the evaporation path toward the substrate 50, so that the oxyfluoride is deposited on one surface of the substrate 50 mounted on the lower surface of the substrate holder 40. Oxygen is supplied into the chamber 10 through the gas supply device 90 while the oxide evaporation source is evaporated, and a flow rate of the supplied oxygen is controlled to be in the range of 0.01 to 20 sccm. It is preferable to control the vacuum degree in the chamber 10 to be in the range of 0.01 to 1 mTorr while the oxide evaporation source is evaporated.
[0078] The oxyfluoride coating layer is formed on the substrate 50 through a reaction between the evaporation gas generated from the oxide and the fluorine-containing gas generated from the fluoride.
[0079] It is preferable that a deposition rate of the oxyfluoride coating layer is controlled to be in the range of 10 to 200 nm/min, and the thickness of the oxyfluoride coating layer is controlled to be in the range of 0.2 to 50 μm. It is preferable that the oxyfluoride coating layer to be coated on the substrate is formed to the thickness of 0.2 to 50 μm. The reason is that in the case of 0.2 μm or less, the lifetime of the plasma resistant member is short, and in the case of 50 μm or more, the coating layer may peel off due to cracks caused by the difference in thermal stress between the substrate and the coating layer, which may cause serious problems during the plasma process.
[0080] The oxyfluoride coating layer formed by the method according to an exemplary embodiment of the present invention does not have large pores of 0.1 μm or more, has a surface roughness (Ra) of 100 nm or less, and is stable against chemical reactions on the surface in a plasma environment, so that it maintains a stable state in a plasma corrosive environment, and thus contaminant particles are not generated, and even when used as a plasma resistant member, a lifetime can be improved.
[0081] The oxyfluoride coating layer coated on the substrate for use as the plasma resistant member shows excellent etch resistance in a plasma environment containing a halogen gas. According to the research of the present inventors, since the oxyfluoride is stable against chemical reactions in a fluorine-based plasma environment, it maintains a stable state in a plasma corrosive environment.
[0082] Since the oxyfluoride coating layer formed by the conventional thermal spraying method has a surface roughness of 500 nm or more and contains many pores therein, the reactive gas penetrates into the coating layer through the pores, thereby increasing the occurrence frequency of contaminant particles and causing selective etching due to high surface roughness, which is a major cause of shortening the lifetime of the plasma resistant member.
[0083] Hereinafter, Experimental Examples according to the present invention are specifically presented, and the present invention is not limited to the Experimental Examples presented below.
Example 1
[0084] A sapphire ceramic substrate having a diameter of 50 mm and mirror-polished to an average surface roughness of 10 nm or less was mounted on a substrate holder of an electron beam deposition apparatus, and an electron beam scanned from an electron gun was deflected by a permanent magnet to be incident on an evaporation source made of Y.sub.2O.sub.3 accommodated in a first crucible. At this time, power applied to the electron gun through a power supply was set to 150 mA. A distance between the substrate and the evaporation source was about 480 mm. A temperature of the substrate was set to 200° C. by temperature, and the substrate holder was set to rotate at a speed of about 20 rpm. A flow rate of oxygen introduced into a chamber through a gas supply device was set to about 5 sccm. A vacuum degree in the chamber was set to approximately 0.1 mTorr.
[0085] As a raw material containing fluorine, NH.sub.4F was used. NH.sub.4F having a low sublimation temperature has the advantage of being easy to handle as it is present in a solid state. A second crucible having a size of 30 cc was filled with 6 g of NH.sub.4F. The second crucible filled with NH.sub.4F was placed at a position separate from the evaporation source made of Y.sub.2O.sub.3 in the chamber, and there was no heating device.
[0086] First, when the electron beam was incident on the Y.sub.2O.sub.3 evaporation source, the evaporation source was heated and melted, and vaporization started, a shutter placed above the evaporation source was opened to allow an evaporation gas of the evaporation source to proceed along an evaporation path toward the substrate, and the gas vaporized from the fluoride also proceeded along the evaporation path toward the substrate to be deposited on one surface of the substrate mounted on the lower surface of the substrate holder. A deposition rate of the YOF coating layer deposited on the substrate surface was sensed through a sensor, and the deposition rate measured through the sensor was about 2 nm/sec.
[0087] The YOF coating layer deposited on the substrate was formed to a thickness of 6 μm.
TABLE-US-00001 TABLE 1 Composition Element (at %) O 50.2 F 22.3 Y 27.5 total 100.00
Example 2
[0088] A sapphire ceramic substrate having a diameter of 50 mm and mirror-polished to an average surface roughness of 10 nm or less was mounted on a substrate holder of an electron beam deposition apparatus, and an electron beam scanned from an electron gun was deflected by a permanent magnet to be incident on an evaporation source made of Y.sub.2O.sub.3 accommodated in a first crucible. At this time, power applied to the electron gun through a power supply was set to 150 mA. A distance between the substrate and the evaporation source was about 480 mm. A temperature of the substrate was set to 200° C. by temperature, and the substrate holder was set to rotate at a speed of about 20 rpm. A flow rate of oxygen introduced into a chamber through a gas supply device was set to about 5 sccm. A vacuum degree in the chamber was set to approximately 0.1 mTorr.
[0089] As a raw material containing fluorine, NH.sub.4F was used. Two 30 cc-sized second crucibles were each filled with 6 g of NH.sub.4F. The two second crucibles filled with NH.sub.4F was placed at positions separate from the evaporation source made of Y.sub.2O.sub.3 in the chamber, and there was no heating device.
[0090] First, when the electron beam was incident on the Y.sub.2O.sub.3 evaporation source, the evaporation source was heated and melted, and vaporization started, a shutter placed above the evaporation source was opened to allow an evaporation gas of the evaporation source to proceed along an evaporation path toward the substrate, and the gas vaporized from the fluoride proceeded along the evaporation path toward the substrate to be deposited on one surface of the substrate mounted on the lower surface of the substrate holder. A deposition rate of the YOF coating layer deposited on the substrate surface was sensed through a sensor, and the deposition rate measured through the sensor was about 2 nm/sec.
[0091] The YOF coating layer deposited on the substrate was formed to a thickness of 5 μm.
TABLE-US-00002 TABLE 2 Composition Element (at %) O 14.1 F 46.3 Y 39.6 total 100.00
Example 3
[0092] A sapphire ceramic substrate having a diameter of 50 mm and mirror-polished to an average surface roughness of 10 nm or less was mounted on a substrate holder of an electron beam deposition apparatus, and an electron beam scanned from an electron gun was deflected by a permanent magnet to be incident on an evaporation source made of Y.sub.2O.sub.3 accommodated in a first crucible. At this time, power applied to the electron gun through a power supply was set to 150 mA. A distance between the substrate and the evaporation source was about 480 mm. A temperature of the substrate was set to 400° C. by temperature, and the substrate holder was set to rotate at a speed of about 20 rpm. A flow rate of oxygen introduced into a chamber through a gas supply device was set to about 5 sccm. A vacuum degree in the chamber was set to approximately 0.1 mTorr.
[0093] As a raw material containing fluorine, NH.sub.4F was used. NH.sub.4F having a low sublimation temperature has the advantage of being easy to handle as it is present in a solid state. A second crucible having a size of 30 cc was filled with 6 g of NH.sub.4F. The second crucible filled with NH.sub.4F was placed at a position separate from the evaporation source made of Y.sub.2O.sub.3 in the chamber, and there was no heating device.
[0094] First, when the electron beam was incident on the Y.sub.2O.sub.3 evaporation source, the evaporation source was heated and melted, and vaporization started, a shutter placed above the evaporation source was opened to allow an evaporation gas of the evaporation source to proceed along an evaporation path toward the substrate, and the gas vaporized from the fluoride also proceeded along the evaporation path toward the substrate to be deposited on one surface of the substrate mounted on the lower surface of the substrate holder. A deposition rate of the YOF coating layer deposited on the substrate surface was sensed through a sensor, and the deposition rate measured through the sensor was about 2 nm/sec.
[0095] The YOF coating layer deposited on the substrate was formed to a thickness of 5 μm.
TABLE-US-00003 TABLE 3 Composition Element (at %) O 43.23 F 27.95 Y 28.82 total 100.00
Example 4
[0096] A sapphire ceramic substrate having a diameter of 50 mm and mirror-polished to an average surface roughness of 10 nm or less was mounted on a substrate holder of an electron beam deposition apparatus, and an electron beam scanned from an electron gun was deflected by a permanent magnet to be incident on an evaporation source made of Al.sub.2O.sub.3 accommodated in a first crucible. At this time, power applied to the electron gun through a power supply was set to 150 mA. A distance between the substrate and the evaporation source was about 480 mm. A temperature of the substrate was set to 200° C. by temperature, and the substrate holder was set to rotate at a speed of about 20 rpm. A flow rate of oxygen introduced into a chamber through a gas supply device was set to about 5 sccm. A vacuum degree in the chamber was set to approximately 0.1 mTorr.
[0097] As a raw material containing fluorine, NH.sub.4F was used. NH.sub.4F having a low sublimation temperature has the advantage of being easy to handle as it is present in a solid state. A second crucible having a size of 30 cc was filled with 6 g of NH.sub.4F. The second crucible filled with NH.sub.4F was placed at a position separate from the evaporation source made of Al.sub.2O.sub.3 in the chamber, and there was no heating device.
[0098] First, when the electron beam was incident on the Al.sub.2O.sub.3 evaporation source, the evaporation source was heated and melted, and vaporization started, a shutter placed above the evaporation source was opened to allow an evaporation gas of the evaporation source to proceed along an evaporation path toward the substrate, and the gas vaporized from the fluoride also proceeded along an evaporation path toward the substrate to be deposited on one surface of the substrate mounted on the lower surface of the substrate holder. A deposition rate of the AlOF coating layer deposited on the substrate surface was sensed through a sensor, and the deposition rate measured through the sensor was about 2 nm/sec.
[0099] The AlOF coating layer deposited on the substrate was formed to a thickness of 4 μm.
TABLE-US-00004 TABLE 4 Composition Element (at %) O 41.7 F 13.3 Al 45.0 total 100.00
Example 5
[0100] A sapphire ceramic substrate having a diameter of 50 mm and mirror-polished to an average surface roughness of 10 nm or less was mounted on a substrate holder of an electron beam deposition apparatus, and an electron beam scanned from an electron gun was deflected by a permanent magnet to be incident on an evaporation source made of Al.sub.2O.sub.3 accommodated in a first crucible. At this time, power applied to the electron gun through a power supply was set to 150 mA. A distance between the substrate and the evaporation source was about 480 mm. A temperature of the substrate was set to 200° C. by temperature, and the substrate holder was set to rotate at a speed of about 20 rpm. A flow rate of oxygen introduced into a chamber through a gas supply device was set to about 5 sccm. A vacuum degree in the chamber was set to approximately 0.1 mTorr.
[0101] As a raw material containing fluorine, NH.sub.4F was used. Two 30 cc-sized second crucibles were each filled with 6 g of NH.sub.4F. The two second crucibles filled with NH.sub.4F were placed at positions separate from the evaporation source made of Al.sub.2O.sub.3 in the chamber, and there was no heating device.
[0102] First, when the electron beam was incident on the Al.sub.2O.sub.3 evaporation source, the evaporation source was heated and melted, and vaporization started, a shutter placed above the evaporation source was opened to allow an evaporation gas of the evaporation source to proceed along an evaporation path toward the substrate, and the gas vaporized from the fluoride also proceeded along the evaporation path toward the substrate to be deposited on one surface of the substrate mounted on the lower surface of the substrate holder. A deposition rate of the AlOF coating layer deposited on the substrate surface was sensed through a sensor, and the deposition rate measured through the sensor was about 2 nm/sec.
[0103] The AlOF coating layer deposited on the substrate was formed to a thickness of 5 μm.
TABLE-US-00005 TABLE 5 Composition Element (at %) O 37.0 F 17.8 Al 45.2 total 100.00
[0104] According to the present invention, a substrate for depositing a coating layer is mounted inside a chamber maintaining a vacuum, and an oxyfluoride is deposited on the substrate by evaporating an oxide (evaporation source) and a fluoride, such as ammonium fluoride, etc., to be deposited on the substrate and reacting an evaporation gas of the oxide with a fluorine-containing gas.
[0105] According to the present invention, a desired oxyfluoride coating layer can be obtained by only changing a fluoride, which is easily evaporated, without regulating evaporation process parameters of an oxide evaporation source using a high energy heat source that is difficult to control, such as an electron beam.
[0106] According to the present invention, since the evaporation amount of a fluoride is proportional to an area where a raw material is exposed to vacuum, the content of fluorine included in a coating layer can be easily regulated by changing the amount of a fluoride raw material included in a crucible, that is, the number of crucibles accommodating the fluoride, or the size of the opening of the crucible cover.
[0107] According to the present invention, an oxyfluoride coating layer can be formed using a fluoride, such as ammonium fluoride, that easily evaporates without heating in a vacuum environment.
[0108] According to the present invention, an oxyfluoride coating layer can be formed by using a fluoride, such as MgF.sub.2, AlF.sub.3, YF.sub.3, etc., having a low melting point that is easily evaporated by conventional resistive electrical heating rather than a high energy heat source.
[0109] According to the present invention, it is possible to form a thick oxyfluoride coating layer of 0.2 to 50 μm without cracking by alleviating the difference in shrinkage and expansion between a substrate and an oxyfluoride coating layer.
[0110] The oxyfluoride coating layer formed by the present invention does not have large pores of 0.1 μm or more, has a surface roughness (Ra) of 100 nm or less, and is stable against chemical reactions on the surface in a plasma environment, so that it maintains a stable state in a plasma corrosive environment, and thus contaminant particles are not generated, and even when used as a plasma resistant member, a lifetime can be improved.
[0111] The oxyfluoride coating layer coated on the substrate for use as a plasma resistant member shows excellent etch resistance in a plasma environment containing a halogen gas. As the oxyfluoride is suppressed in chemical reaction in a fluorine-based plasma environment, the spatial uniformity of the silicon etching process can be improved, and as changes over time are suppressed, the stability of the etching process can be improved.
[0112] As mentioned above, although exemplary embodiments of the present invention have been described in detail, the present invention is not limited to the above Examples, and various modifications are possible by those skilled in the art.