Textured glass for light extraction enhancement of OLED lighting
11691909 · 2023-07-04
Assignee
Inventors
- Xinyu Cao (Shanghai, CN)
- Haixing Chen (Shanghai, CN)
- Ling Chen (Shanghai, CN)
- Chenglong Dai (Shanghai, CN)
- Kwang je Woo (Asan-si, KR)
- Jianqiang Zhu (Shanghai, CN)
Cpc classification
C03C15/00
CHEMISTRY; METALLURGY
Y02E10/549
GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
International classification
Abstract
A textured glass substrate along with articles comprising a textured glass substrate and methods of making are provided. The substrates retain the mechanical and optical properties of the untextured glass, while the process provides a reliable and low cost, easy scale up method. The resulting glass substrates are of particular use for light extraction in organic light emitting diode structures.
Claims
1. A device, comprising: an article comprising a textured glass substrate comprising a first face, a second face, a thickness of 30 μm to 2 mm measured from the first face to the second face, and at least one edge; the first face comprising an approximately planar surface comprising a first surface roughness, R.sub.a1, of less than 2 nm; and the second face comprising a textured surface comprising a second surface roughness, R.sub.a2, of from 200 nm to 600 nm and a plurality of surface features comprising a feature size, F, of 2 μm to 20 μm in diameter; a cathode; an anode; and at least one organic light emitting layer that is capable of emitting light, wherein the textured glass substrate is coupled to the device such that light emitted from the organic light emitting layer passes through the textured glass substrate.
2. The device of claim 1, wherein the textured glass substrate comprises a reflective haze of 0.5 or lower as measured by ASTM D4039.
3. The device of claim 1, wherein the textured glass substrate comprises a haze in transmission of greater than 80% as measure by ASTM D1003.
4. The device of claim 1, wherein the first surface roughness, R.sub.a1, is less than 1 nm.
5. The device of claim 1, wherein the second surface roughness, R.sub.a2, is from 400 to 540 nm.
6. The device of claim 1, wherein the feature size, F, is 2 μm to 15 μm in diameter.
7. The device of claim 1, wherein the textured glass substrate provides an enhancement to light output from the organic light emitting layer of greater than 50% when compared to a second device identical to the device except that the second device substitutes a planar, non-textured glass substrate of identical composition and thickness in place of the textured glass substrate, wherein the planar, non-textured glass substrate comprises: a first planar, non-textured face; a second planar, non-textured face; and at least one edge, the first planar, non-textured face comprising a surface roughness of less than 2 nm, and the second planar, non-textured face comprising a surface roughness of less than 2 nm.
8. The device of claim 1, wherein the plurality of surface features comprise a height of 2 μm to 8 μm.
9. The device of claim 1, wherein the textured surface faces away from the organic light emitting layer such that the light emitted from the organic light emitting layer passes through the approximately planar surface before passing through the textured surface.
10. The device of claim 1, wherein an external quantum efficiency of the device is 40% or greater.
11. The device of claim 10, wherein the external quantum efficiency of the device is 60% or greater.
Description
BRIEF DESCRIPTION OF THE DRAWINGS
(1) The accompanying drawings are included to provide a further understanding of the description, and are incorporated in and constitute a part of this specification. The drawings are not necessarily to scale, and sizes of various elements may be distorted for clarity. The drawings illustrate one or more embodiment(s) and together with the description serve to explain the principles and operation of the embodiments.
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DETAILED DESCRIPTION
(9) The present invention will now be described more fully hereinafter with reference to the accompanying drawings in which example embodiments of the claimed invention are shown. Whenever possible, the same reference numerals are used throughout the drawings to refer to the same or like parts. However, the claimed invention may be embodied in many different forms and should not be construed as limited to the embodiments set forth herein. These example embodiments are provided so that this disclosure will be both thorough and complete, and will fully convey the scope of the claimed invention to those skilled in the art.
(10) The challenge to improve the light efficiency of OLEDs is that the light loss caused by total internal reflection (TIR) within the device should be reduced as much as possible. The major loss of external quantum efficiency is the index mismatch in the interfaces between the various components within the device. For example, the one of the biggest losses occurs at the interface of the glass substrate (n˜1.52) and air (n˜1.0).
Article
(11) Described herein are substrates that are textured on at least one side, where the textured surface provides enhanced light extraction when the substrates are used in or in conjunction with OLED devices.
(12) Embodiments described herein provide enhancements or improvements in external quantum efficiency of greater than 1.4×, 1.5×, 1.6×, 1.7×, or 1.8× or more. These values are obtained from comparing an OLED device formed on the textured glass substrate described herein and comparing it to an identical OLED device formed on the equivalent (same composition, thickness, etc.) glass substrate that hasn't been subjected to the texturing processes described below.
(13) In some embodiments described herein, the OLED device on the textured glass substrate has an angle integrated external quantum efficiency of >40%, >45%, >50%, >55%, >60%, or >65%. The angle integrated external quantum efficiency is the numerical integration over the angles 0°, 15°, 30°, 45°, 60° and 70°, at which the luminance efficiency of OLED device was measured by the system utilizing the integrate sphere.
(14) Now looking at the surface morphology in
(15) The substrate surface facing the OLED device is generally kept smooth to provide an even coating surface. In some embodiments, one or more light extraction layers may be coated onto the substrate. These light extraction layers can be of any suitable form, but are often in the form of particles of high or low refractive index in a matrix that is either similar to the ITO or organic layer, or of opposite refractive index to the particles (low index matrix/high index particles or vice versa). In some embodiments, one or more transparent conductive oxides are coated onto the substrate. In some embodiments, the OLED-facing substrate has a surface roughness of less than 2 nm, less than 1.5 nm, less than 1 nm, less than 0.75 nm, or less than 0.5 nm when measured via ASME B46.1 standards.
(16) The substrate surface facing away from the OLED device is generally the textured face. It may be completely textured or textured in certain areas by use of a coating or laminate that protects areas of the glass that should remain untextured. The texturing of the face can be accomplished by any suitable method, but it has been found to be most cost effective and produce unexpected benefits when done via the etch cream processes described herein. In addition to the feature sizes described above, the textured surface can have an average surface roughness of from 200-800 nm, 250-700 nm, 300-600 nm, 400-550 nm, 450-525 nm, or 475-510 nm.
(17) In some embodiments, the haze of the substrates is critical to the output efficiency. The substrates have both transmission and reflection haze factors. Transmission haze is the scattering of light (at an angle greater than 2.5° from normal (ASTM D1003)) when passing through the glass. In some embodiments, the transmission haze is from 60-98%, 70-98%, 80-98%, 90-98%, 80-96%, 90-95%, or greater than 80% or greater than 90%.
(18) Alternatively, reflection haze is an optical phenomenon usually associated with high gloss surfaces where due to imperfections in the surface caused by microscopic structures or the reflection can appear milky or hazy reducing the quality of its overall appearance. In the embodiments described herein, the reflection haze is measured by ASTM D4039 standards. In some embodiments, the reflection haze is from 0.3-0.6, 0.35-0.55, 0.4-0.55, 0.45-0.55, or greater than 0.3, or greater than 0.4.
(19) The overall transmission through the glass should be maximized given the constraints described herein. Embodiments can have transmission values of greater than 60%, greater than 65% or greater than 70% for a 0.4 mm thick glass substrate at 500 nm.
(20) The textured glass substrate can be one of any number of compositions. The substrate may be of any suitable composition including alumino-silicate, boro-silicate, alumino-boro-silicate, and soda-lime-silicate, and either alkali-containing or alkali-free, depending upon their ultimate application. Additionally, the substrate may be made of one layer, as shown, or multiple layers (including multiple thin sheets) that are bonded together. Again, the glass substrate may be various types of glass, including, but not limited to, Gorilla® glass, Eagle XG® glass, Lotus™ glass, and soda-lime glass, or various types of thin flexible glass substrates, including, but not limited to, Willow™ glass
(21) Substrates can be any suitable size and thickness. For example substrates can be from 30 μm to 2 mm, 50 μm to 2 mm, 100 μm to 2 mm, 200 μm to 2 mm, 500 μm to 2 mm, 1 mm to 2 mm, 30 μm to 1 mm, 50 μm to 1 mm, 100 μm to 1 mm, 200 μm to 1 mm, 500 μm to 1 mm, 30 μm to 500 μm, 50 μm to 500 μm, 100 μm to 500 μm, 200 μm to 500 μm, 30 μm to 200 μm, 50 μm to 200 μm, or 100 μm to 200 μm.
(22) Another aspect comprises articles incorporating the textured substrates described herein. Articles include organic light emitting diode (OLED) devices, that optionally include one or more additional light extraction features within or adjacent to the OLED device. The OLED may comprise a cathode, an anode (typically a transparent conductive oxide), one or more organic layers, as well as internal light extraction layers that may be in any of the above layers or adjacent to any of the layers. Example internal light extraction layers include nanospheres or nanoparticles or microparticles, voids, microlenses, etc. Materials can include silica, titania, niobium oxide, etc.
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Process
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(25) Referring to the example illustrated in
(26) After rinsing 725, for example, in deionized water for 10 seconds, the glass substrate is exposed 730 to etching cream for a time period of from between 30 and 2400 seconds. In some embodiments, the etching powder used for the etching cream may be composed of 10-40 wt % of KF as a fluorine source, 10-40 wt % of KCL or KNO.sub.3 as an additional salt, 5-20 wt % of BaSO.sub.4 as filler, 1-10 wt % of starch, and 1-10 wt % of polyacrylamide. This powder may be dissolved in 20-50 wt % of concentrated HCl acid or a mixture of HCl acid and acetic acid to form the etching cream. Up to 20 wt % of water can be added if the slurry created by the dissolved powder is too thick. After dissolving, the etching cream can be kept at ambient conditions for 12 hours prior to use with manual agitation every 2-4 hours to reach chemical equilibrium.
(27) An alternative etching cream containing NH.sub.4HF.sub.2, NH.sub.4F, KCl, BaSO.sub.4, and HCl can also be used. This etching cream may be particularly useful when Gorilla® Glass is used as a glass substrate, and includes the surface to be roughened to provide the release area. Further, an etching cream composed of 10-20 wt % of NH.sub.4F, 10-20 wt % of NH.sub.4HF.sub.2, 0-10 wt % of KNO.sub.3 as additional salt, 5-20 wt % of BaSO.sub.4 as filler. 1-10 wt % of soluble starch, and 0-5 wt % of polyacrylamide can be used. The solids mentioned above can be combined with 36-38% concentrated HCl acid and prepared as stated above with respect to the etching cream being used for texturing the substrate. For this application, the method 700 may optionally include a second acid exposure 735 containing 15 wt % of H.sub.2SO.sub.4 and 5 wt % HCl after the exposure 730 to the etching cream for the required amount of time. Further, after the second acid exposure 735 and a deionized water rinse 540, an optional third acid exposure 745 containing 24 wt % HF and 45.5 wt % HCl may be conducted. After the third acid exposure, the substrate is again washed in a post cleaning step 740.
(28) Other soluble metal ions can be added or used, such as CaCl.sub.2, Ca.sub.2SO.sub.4, MgCl.sub.2, Mg.sub.2SO.sub.4, Mg(NO.sub.3).sub.2, FeCl.sub.3, Fe.sub.2(SO.sub.4).sub.3, Fe(NO.sub.3).sub.3, CoCl.sub.2, Co.sub.2SO.sub.4, Co(NO.sub.3).sub.2, NiCl.sub.2, Ni.sub.2SO.sub.4, Ni(NO.sub.3).sub.2, ZnCl.sub.2, Zn.sub.2SO.sub.4, Zn(NO.sub.3).sub.2, which may also generate the similar surface morphology for this kind application.
(29) After the exposure 730 to the etching cream for the required amount of time, the glass substrate may be rinsed 740, for example, in deionized water. Afterwards, the lamination may be removed and the glass substrate may be thoroughly rinsed 740 to remove the remaining acid and etching cream on the surface. Once the surfaces has been thoroughly cleaned, the substrate can be utilized in the formation of OLED devices by additional coatings of transparent conductive oxides or light extraction layers as known in the art.
(30) The roughness of the textured surface of the substrate can be controlled by the concentration of the etching cream and the time for which the glass substrate is exposed to the etching cream. Higher etching cream concentrations and longer etching cream processing times may lead to greater surface roughness. An increase in acid concentration or processing time also may lead to a rougher surface texture.
(31) Texture uniformity may be normally satisfied for square shaped substrates after exposure to the above-referenced etching cream as a dip. Alternatively, for rectangular or other irregular or 3D shaped samples, a spray of etching cream instead of a dip may show better texture uniformity. In the spray method, the etching cream can be allowed to spray onto the substrate surface either manually or using a pump. In the spray method, the substrate may be put in a rack with 30 degree of tilt from a horizontal plane. The substrate can be sprayed homogeneously with the same flow rate. An anti-acid pump with a flow rate ranging from 20 L/min to 50 L/min may be used for spraying the etching cream onto the substrate surface. Larger glass surfaces may require a spray having a higher flow rate. Any size or shape of the glass may be applicable either using the spray method or dipping method.
EXAMPLES
(32) Pre-cleaned glass is laminated on one side with the anti-acid protection film. Then it is immersed into acid solution for pre-cleaning comprising 9 wt % of HF and 9 wt % HCl aqueous solution. After that, the glass is rinsed in deionized water for 10 s and quickly put into the etching cream for 2 m-10 m for surface treatment. The etching cream that is used to roughen the surface of glass is composed of 10-20 wt % NH.sub.4F and 10-20 wt % NH.sub.4HF.sub.2, 0-10 wt % KNO.sub.3, 5-20 wt % BaSO.sub.4 as filler, 1-10 wt % soluble starch, 0-5 wt % polyacrylamide, 1-25 wt % CuCl.sub.2. To prepare the etching cream, the solid powder chemicals are first weighted and mixed in a plastic container, and then 10-40 wt % of deionized water is added into the container with manual agitation. After that, 5-20 wt % of concentrated HF acid (40%) solution is added slowly with manual agitation with a plastic stick. When all the HF acid is added, the manual agitation is continued until a fluid slurry is formed. Then this etching slurry is further agitated by mechanical agitator for another 2 hours or kept at 20-25° C. for 24 hours before use to reach the chemical equilibrium. After rinsing in alkaline solution for 10 s, the substrate is subjected to post-cleaning to remove the residuals on the glass surface, then thoroughly cleaned with deionized water and delaminated. A cross-section image of textured glass after the etching process is shown in
(33) Table 1, provided below, summarizes the surface texture attributes of glass generated by this process. Surface properties were determined using standard techniques including scanning electron microscopy (
(34) TABLE-US-00001 Sample Gloss Trans Haze- Ra Feature ID 20° 60° 80° DOI Haze-R Rspec (%) Tx (μm) size (μm) 1 0.3 9.77 40.64 0.00 0.46 0.07 75.7 95.8 0.48 9.24 2 0.31 9.75 38.14 0.00 0.48 0.07 76.2 96.2 0.50 9.04 3 0.31 9.75 40.91 0.00 0.45 0.07 75.9 96.0 0.46 9.10 4 0.31 9.66 41.21 0.00 0.43 0.07 76.3 95.7 0.47 9.15 5 0.31 9.88 39.24 0.00 0.46 0.07 76.4 96.1 0.48 9.48
wherein DOI is the distinctness of image, Haze-R is the reflective haze, Rspec is the peak relectance, Trans is the percent transmittance, Haze-Tx is the transmitted haze, and Ra is the average roughness, and feature size is the average size of the surface elements on the roughened glass surface.
(35) The textured glass is then moved used to fabricate a WOLED, which includes an ITO layer as anode, a hole injection layer (HIL), a hole transport layer (HTL), an emission layer (EL), an electron transport layer (ETL), an electron injection layer (EIL) and a metal layer (silver or aluminum) as cathode. Finally, an encapsulation glass issued for sealing the whole device. The external quantum efficiency of fabricated WOLED with untreated glass substrate and textured glass substrate were measured with the measurement system utilizing the integrating sphere as well as the I-V-L characteristics of device, chromaticity coordinate (CIEx, CIEy) in color space were also measure and showed in Table 2. The maximum angle integrated EQE reaches 68.5% in the case of textured glass compared with an average of 42% in the case of untreated glass, providing an effective quantum efficiency (EQE) improvement of 1.63 times.
(36) TABLE-US-00002 TABLE 2 Luminous Color Color Luminous Angle Current Voltage Luminance Efficiency Space Space Efficiency integrated (J) (V) (cd/m.sup.2) (cd/A) (CIEx) (CIEy) (lm/W) EQE EQE Glass 1.8 8.8 2970 165.0 0.469 0.418 58.9 81.8 43.4% 2.0 8.3 2970 149.0 0.468 0.414 56.6 74.4 41.1% 2.1 8.3 3050 145.0 0.467 0.414 55.2 72.9 41.6% Textured 2.7 9.7 3050 113.0 0.468 0.416 36.7 56.4 48.3% Glass 1.8 9.3 2980 165.0 0.470 0.416 56.1 82.7 68.5% 1.8 9.2 3000 167.0 0.469 0.416 57.3 83.0 67.0%