Gain control amplification device

Abstract

Provided is a gain control amplification device having a wide range and high accuracy and configured to adapt measurement target current to the input range of an A/D converter. The gain control amplification device includes: a plurality of differential amplifiers having different gains with respect to measurement target current or voltage; a threshold control circuit for comparing output of the differential amplifier with threshold voltage; a switch for selecting output of one of the plurality of differential amplifiers on the basis of output of the threshold control circuit; and an offset control circuit OF and an addition circuit for adding offset voltage to output of one of the differential amplifiers.

Claims

1. A gain control amplification device comprising: a plurality of differential amplifiers having different gains with respect to measurement target current or voltage; a threshold control circuit configured to compare output of any of the differential amplifiers with threshold voltage; a switch configured to select output of one of the plurality of differential amplifiers on the basis of output of the threshold control circuit; and an offset control circuit and an addition circuit configured to add offset voltage to output of one of the differential amplifiers.

2. The gain control amplification device according to claim 1, wherein for the plurality of differential amplifiers, a high-accuracy amplifier and a low-accuracy amplifier are allocated, and the threshold control circuit compares output voltage of the low-accuracy amplifier with the threshold voltage, and if the output voltage is smaller than the threshold voltage, the switch selects output of the high-accuracy amplifier.

3. The gain control amplification device according to claim 1, wherein for the plurality of differential amplifiers, a high-accuracy amplifier and a low-accuracy amplifier are allocated, and the threshold control circuit compares output voltage of the low-accuracy amplifier with the threshold voltage, and if the output voltage is greater than the threshold voltage, the switch selects output of the low-accuracy amplifier, and the offset control circuit and the addition circuit add the offset voltage to the output of the low-accuracy amplifier.

4. The gain control amplification device according to claim 2, wherein if the output voltage is greater than the threshold voltage, the switch selects output of the low-accuracy amplifier, and the offset control circuit and the addition circuit add the offset voltage to the output of the low-accuracy amplifier.

Description

BRIEF DESCRIPTION OF THE DRAWINGS

(1) FIG. 1 is a diagram showing the configuration of a gain control amplification device according to embodiment 1 of the present invention;

(2) FIG. 2 is a diagram showing an amplification factor and an offset for realizing different required accuracies on the basis of the gain control amplification device according to embodiment 1 of the present invention;

(3) FIG. 3 is a diagram showing an amplification factor for high accuracy requirement;

(4) FIG. 4 is a diagram showing an amplification factor and an offset for low accuracy requirement;

(5) FIG. 5 is a graph showing an input example of measurement target current; and

(6) FIG. 6 is a diagram showing the configuration of a general differential amplification circuit.

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS OF THE INVENTION

First Embodiment

(7) Hereinafter, a gain control amplification device according to embodiment 1 of the present invention will be described with reference to FIG. 1 to FIG. 5.

(8) FIG. 1 is a circuit configuration diagram of the gain control amplification device according to embodiment 1 of the present invention. The gain control amplification device includes: a shunt resistor Rshunt used for measurement of measurement target current I0; a plurality of differential amplifiers A1, A2 having different gains; input resistors R1 and feedback resistors R2, R3 for the differential amplifiers A1, A2; a PMOS switch M1; an NMOS switch M2; a threshold control circuit A3 configured to perform ON/OFF control of the MOS switches M1, M2 on the basis of comparison with threshold voltage Vref; an offset control circuit OF and an addition circuit KA for providing offset voltage to an output potential of the differential amplifier A2; and an output voltage terminal V3 serving as an interface to an A/D input of an microcomputer (MCU). Normally, the output voltage terminal V3 (voltage of the terminal is V3) is connected to an input terminal of an A/D converter of the MCU.

(9) Here, the differential amplifier A1 is a high-accuracy amplifier realizing a high gain R2/R1, and the differential amplifier A2 is a low-accuracy amplifier realizing a low gain R3/R1. In addition, the threshold voltage Vref is a reference value for excluding measurement results that are outside the ranges of measurements performed with the respective differential amplifiers A1, A2, and is variably set as appropriate.

(10) In the present invention, the differential amplifiers A1, A2 having a plurality of detection accuracies and a plurality of gains are prepared depending on the required detection accuracy. For example, if, as in the above example, the detection accuracy for a range from 0 [A] to 0.5 [A] is required to be 2 [mA] and the detection accuracy for a range from 0.5 [A] to 5 [A] is required to be 6 [mA], two differential amplifiers having these detection accuracies are prepared.

(11) As shown in FIG. 2, the input range of the A/D converter for measurement results in a current detection range from 0 [A] to 0.5 [A] is allocated to 2.sup.8 steps from 0 [V] to 1.25 [V], and the input range of the A/D converter for measurement results in a current detection range from 0.5 [A] to 5 [A] is allocated to 32.sup.8 steps from 1.25 [V] to 5 [V], whereby input range allocation of 10 bits (2.sup.10) is performed. Accordingly, the detection accuracy for the former detection range becomes about 1.95 [mA], and the detection accuracy for the latter detection range becomes about 5.86 [mA]. Thus, the detection accuracy requirement is satisfied. The amplification gains with respect to input current are 2500 times and 833 times, respectively.

(12) Since the former current measurement range is from 0 [A] to 0.5 [A], as shown in FIG. 3, a value multiplied by 2500 is outputted and measurement results beyond 0.5 [A] are excluded. Since the latter current measurement range is from 0.5 [A] to 5 [A], as shown in FIG. 4, a value multiplied by 833 is outputted and measurement results equal to or smaller than 0.5 [A] are excluded, and in addition, the differential amplification voltage value corresponding to this current measurement result, i.e., about 0.4165 [V] needs to be corrected (offset) to 1.25 [V]. The reason why the offset is performed is to buffer a difference caused due to the different gains of both differential amplifiers when the output of the differential amplifier to be made effective is switched.

(13) In order to exclude measurement results that are outside the range, as shown in FIG. 1, the threshold control circuit A3 for which here the threshold voltage Vref is set at about 0.4165 [V] is used. That is, when output Va2 of the differential amplifier A2 is smaller than the threshold voltage Vref, the PMOS switch M1 is turned on and the NMOS switch M2 is turned off, so that output Va1 of the differential amplifier A1 is outputted. On the other hand, when output Va2 of the differential amplifier A2 is equal to or greater than the threshold voltage Vref, the PMOS switch M1 is turned off and the NMOS switch M2 is turned on, so that output Va2 of the differential amplifier A2 is outputted. At this time, in order to shift 0.4165 [V] which is the value of output Va2 at 0.5 [A], to 1.25 V, the offset control circuit OF is used and the offset voltage value thereof is added to the measurement result by the addition circuit KA.

(14) As described above, in the present invention, the voltage difference (V2V1) between voltages applied to the terminal V1 and the terminal V2 via the shunt resistor Rshunt on the basis of the measurement target current I0 is converted to predetermined output voltage V3 while the differential amplifier to be used is dynamically switched between the differential amplifier A1 and the differential amplifier A2 depending on the measurement amount thereof, and then, on the basis of the voltage V3, determination for the measurement target current I0 is performed using the MCU.

(15) That is, from the voltage value inputted via the A/D converter, the MCU normalizes the input voltage in accordance with the measurement accuracy thereof, in this example, at intervals of 4.88 m[V] because the range is from 0 [V] to 5 [V] and the number of steps is 10 bits, i.e., 2.sup.10=1024. Then, the original input current value is backwardly calculated using a conversion map stored in the MCU.

Example 1

(16) In this example, an example in which input current shown in FIG. 5 is measured via the gain control amplification device of the present invention will be described. A target for which current is to be measured is a dynamically varying analog value of a camshaft position, a vehicle speed, a heater, or the like. The horizontal axis indicates a measurement time [ms] and the vertical axis indicates input current [A] at each measurement time.

(17) In FIG. 5, input currents at respective times are as follows: 0.3 [A] at T1 [ms], 0.5 [A] at T2 [ms], 1.6 [A] at T3 [ms], 0.5 [A] at T4 [ms], and 0.4 [A] at T5 [ms]. As described above, the gains of the differential amplifier A1 and the differential amplifier A2 are 2500 times and 833 times, respectively, the shunt resistor Rshunt is 1 m, the threshold voltage Vref is 0.4165 [V], and the offset voltage Voffset is (1.25-0.4165)=0.8335 [V]. Hereinafter, the circuit operation will be described in chronological order.

(18) At time T1, V2V1 is 0.3 [A]0.001 []=0.3 [mV], and therefore Va1 and Va2 are 0.32500=0.75 [V] and 0.3833=0.25 [V], respectively. Here, since Va2<Vref is satisfied, the PMOS switch M1 is turned on and the NMOS switch M2 is turned off. Thus, voltage 0.75 [V] of output Va1 of the differential amplifier A1 is directly outputted to the output voltage terminal V3 and is read into the A/D converter. As shown in FIG. 3 and FIG. 4, the MCU is provided with a table for backwardly converting the input voltage value read in the A/D converter to the original current value, whereby the original current value is calculated.

(19) At time T2, V2V1 is 0.5 [A]0.001 []=0.5 [mV], and therefore Va1 and Va2 are 0.52500=1.25 [V] and 0.5833=0.4165 [V], respectively. Here, since the value of Va2 is to exceed the threshold voltage Vref, the PMOS switch M1 is turned from on to off and the NMOS switch M2 is turned from off to on. Thus, the voltage value to be outputted to the output voltage terminal V3 is switched to a value obtained by adding an addition (offset) value by the addition circuit KA, in this example, 0.8335 [V], to output Va2 of the differential amplifier A2, i.e., 0.4165+0.8335=1.25 [V].

(20) At time T3, V2V1 is 1.6 [A]0.001 []=1.6 [mV], and therefore Va1 and Va2 are 1.62500=4.000 [V] and 1.6833=1.333 [V], respectively. Here, since Va2>Vref is satisfied, the PMOS switch M1 is turned off and the NMOS switch M2 is turned on. Thus, voltage 2.1665 [V] obtained by adding 0.8335 [V] to voltage 1.333 [V] of output Va2 of the differential amplifier A2 is outputted to the output voltage terminal V3 and is read into the A/D converter. As described above, the MCU calculates the original current value by using the table for backwardly converting the input voltage value read in the A/D converter.

(21) At time T4, V2V1 is 0.5 [A]0.001 []=0.5 [mV], and therefore Va1 and Va2 are 0.52500=1.25 [V] and 0.5833=0.4165 [V]. Here, since Va2 is to become smaller than the threshold voltage Vref, the PMOS switch M1 is turned from off to on and the NMOS switch M2 is turned from on to off. Thus, the voltage value to be outputted to the output voltage terminal V3, which has been the value obtained by adding the addition value by the addition circuit KA to output Va2 of the differential amplifier A2 until now, is switched to 1.25 [V] of output Va1 of the differential amplifier A1.

(22) At time T5, V2V1 is 0.4 [A]0.001 []=0.4 [mV], and therefore Va1 and Va2 are 0.42500=1.000 [V] and 0.4833=0.333 [V]. Here, since Va2<Vref is satisfied, the PMOS switch M1 is turned on and the NMOS switch M2 is turned off. Thus, the voltage 1.000 [V] of output Va1 of the differential amplifier A1 is directly outputted to the output voltage terminal V3 and is read into the A/D converter. As described above, the MCU calculates the original current value by using the table for backwardly converting the input voltage value read in the A/D converter.

(23) Thus, a necessary gain and the offset voltage can be dynamically switched depending on the input current, whereby required current accuracy can be ensured. It is noted that, although the case where the measurement target is current has been described, the same applies to the case where the measurement target is voltage.

(24) As described above, in the present invention, differential amplifiers having different detection accuracies and different gains are used, and the required accuracy switching threshold is calculated on the basis of the stored number of bits and the input voltage standard of the A/D converter serving as an output interface. In order that the input range of the A/D converter is matched with output voltage of each amplifier, the high-accuracy amplifier and the low-accuracy amplifier are allocated and the gain of each amplifier is set. The output of the amplifier to be made effective is switched by the threshold control circuit using a set switching point as a threshold. In order to buffer a difference caused due to the different gains of both amplifiers, the offset control circuit is used and the offset voltage value given by the offset control circuit is added to a measurement result by the addition circuit.

(25) In this way, even if the measurement range is wide and high accuracy is required, it becomes possible to dynamically control the measurement accuracy automatically on the basis of the measurement value of current or voltage.

(26) While the embodiments of the present invention have been described above, the present invention is not limited to the above embodiment, but various design modifications can be made. Accordingly, within the scope of the present invention, the above embodiment may be modified or simplified as appropriate.

(27) Various modifications and alterations of this invention will be apparent to those skilled in the art without departing from the scope and spirit of this invention, and it should be understood that this is not limited to the illustrative embodiments set forth herein.