Sensor for non-destructive characterization of objects
10429322 · 2019-10-01
Assignee
Inventors
- Noël Deferm (Beverlo, BE)
- Tom Redant (Alken, BE)
- Wim Dehaene (Kessel-Lo, BE)
- Patrick Reynaert (Boutersem, BE)
Cpc classification
International classification
G01N21/898
PHYSICS
Abstract
The present invention relates to a millimeter or terahertz wave sensor for providing inline inspection, preferably including but not limited to continuous monitoring of objects, for example thin sheet dielectric material.
Claims
1. A method for estimating a specification of a medium or an object in a medium, said method comprising: generating a transmitting signal, wherein the transmitting signal is provided by using a periodic baseband input signal having a frequency which is mixed with a first frequency reference resulting in a signal comprising at least two tones; transmitting said transmitting signal through said object and/or medium; receiving the resulting transmitted signal, transmitted through the object and/or medium, resulting in a received signal wherein said received signal comprises a phase shift; wherein the received signal comprising the phase shift is mixed with the first frequency reference resulting in that the transmitting signal is generated with and the received signal is processed with the same frequency reference and therefore share the first frequency reference, and estimating the phase shift and relating the estimated phase shift to the medium's and/or object's specification such to estimate the medium's and/or object's specification.
2. The method according to claim 1, wherein a model is used to relate the estimated phase shift to the medium's and/or object's specification, wherein the model can be a mathematical expression or an empirically-obtained look-up table.
3. The method according to claim 1, wherein the mixing of the received signal with the first frequency reference comprises converting the received signal in an in-phase and/or quadrature component.
4. The method according to claim 3, further comprising a digitizing step, wherein said digitizing step comprises digitizing the in-phase and/or quadrature component and/or comprises providing a second reference frequency.
5. The method according to claim 4, wherein said second reference frequency is equal to the first reference frequency.
6. The method according to claim 1, wherein the specification of the object estimated is at least one of the following: a thickness of the object or weight of the object or a coating thickness of the object or a parameter indicative of the di-electric state of the object and/or the refractive-index and/or dielectric constant.
7. The method according to claim 4, wherein a thickness of the object is estimated using amplitude values of the in-phase component, the quadrature component or a combination of both.
8. The method according to claim 1, further comprising a monitoring step, wherein environmental parameters of the object in which the estimation is performed are obtained.
9. The method according to claim 8, wherein the environmental parameters are pressure, temperature and/or humidity.
10. The method according to claim 1, further comprising a calibration step comprising one of: tuning a delay of the transmitted signal electrically within a transmitter, or tuning a delay of the received signal electrically within the receiver, or tuning or sweeping a total distance between a signal generator arranged to generate a transmitting signal and a signal receiver arranged to receive the receiving signal mechanically, or tuning or sweeping a total distance between the signal generator and a reflector for reflecting mechanically, or angular tuning, said angular tuning comprising fine-tuning an angle of a signal path to an optimal value such as to prevent reflections towards the signal generator.
11. The method according to claim 1, wherein the object is a sheet material having a thickness in the micrometer to centimeter range and/or wherein the object and medium are adapted to at least be partially transparent for millimeter or terahertz waves and/or wherein the first reference frequency is in the order of 0.1 MHz to 3000 GHz, preferably 1 GHz to 300 GHz and more specifically 10 GHz to 150 GHz.
12. A computer program product for, if implemented on a control unit, performing a method according to claim 1.
13. A control unit programmed for performing a method according to claim 1.
14. The system according to claim 1, comprising a plurality of pairs of transmitting signal generators for generating a transmitting signal and receivers, wherein the plurality of transmitting signal generators and receivers are provided on a frame defining an opening which can be adjusted.
15. A system comprising: a plurality of pairs of transmitters and receivers, wherein the plurality of transmitters and receivers are provided on a frame defining an opening which can be adjusted; a control unit for performing a method according to claim 1.
16. A system for characterizing a medium or an object in a medium, said system comprising: at least one transmitting signal generator configured for generating a transmitting signal provided by using a periodic baseband input signal having a frequency which is mixed with a first frequency reference resulting in a signal comprising at least two tones, for transmitting the transmitting signal through the medium or the object in the medium; at least one transmitted signal receiver configured for receiving the transmitted signal, transmitted through the medium or the object in the medium, thus obtaining a received signal, the received signal comprising a phase shift; and a control unit programmed for mixing the received signal with the first frequency reference resulting in that the transmitting signal is generated with and the received signal is mixed with the same frequency therefore sharing the first frequency reference, estimating the phase shift, and relating the estimated phase shift to the medium's and/or object's specification such to estimate the medium's and/or object's specification.
17. The system according to claim 16, the system comprising a digital platform configured for generating a periodic baseband input signal having a frequency.
18. The system according to claim 16, wherein the at least one transmitting signal generator for generating a transmitting signal and at least one receiver for receiving are provided opposite each other defining an opening with a distance, or wherein the receiver and the transmitting signal generator are positioned adjacent each other and the system further comprises a reflector for reflecting the resulting transmitted signal, wherein the receiver and the transmitting signal generator are positioned opposite to the reflector defining an opening with a distance, or wherein the at least one transmitting signal generator and receiver are provided on a C, U or O-frame, or wherein the at least one transmitting signal generator and receiver are adapted to move in a same direction with respect to an object when in use.
19. The system according to claim 18, wherein the defined openings can be adjusted.
20. The system according to claim 16, the system comprising an O-frame comprising a plurality of sensor head pairs, each pair comprising a signal generator and a receiver, and each pair separated by a distance D.
Description
BRIEF DESCRIPTION OF THE DRAWINGS
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(20) The drawings are only schematic and are non-limiting. In the drawings, the size of some of the elements may be exaggerated and not drawn on scale for illustrative purposes. Any reference signs in the claims shall not be construed as limiting the scope. In the different drawings, the same reference signs refer to the same or analogous elements.
DETAILED DESCRIPTION OF ILLUSTRATIVE EMBODIMENTS
(21) The present invention will be described with respect to particular embodiments and with reference to certain drawings but the invention is not limited thereto but only by the claims. The drawings described are only schematic and are non-limiting. In the drawings, the size of some of the elements may be exaggerated and not drawn on scale for illustrative purposes. The dimensions and the relative dimensions do not correspond to actual reductions to practice of the invention.
(22) Furthermore, the terms first, second and the like in the description and in the claims, are used for distinguishing between similar elements and not necessarily for describing a sequence, either temporally, spatially, in ranking or in any other manner. It is to be understood that the terms so used are interchangeable under appropriate circumstances and that the embodiments of the invention described herein are capable of operation in other sequences than described or illustrated herein.
(23) Moreover, the terms top, under and the like in the description and the claims are used for descriptive purposes and not necessarily for describing relative positions. It is to be understood that the terms so used are interchangeable under appropriate circumstances and that the embodiments of the invention described herein are capable of operation in other orientations than described or illustrated herein.
(24) It is to be noticed that the term comprising, used in the claims, should not be interpreted as being restricted to the means listed thereafter; it does not exclude other elements or steps. It is thus to be interpreted as specifying the presence of the stated features, integers, steps or components as referred to, but does not preclude the presence or addition of one or more other features, integers, steps or components, or groups thereof. Thus, the scope of the expression a device comprising means A and B should not be limited to devices consisting only of components A and B. It means that with respect to the present invention, the only relevant components of the device are A and B.
(25) Reference throughout this specification to one embodiment or an embodiment means that a particular feature, structure or characteristic described in connection with the embodiment is included in at least one embodiment of the present invention. Thus, appearances of the phrases in one embodiment or in an embodiment in various places throughout this specification are not necessarily all referring to the same embodiment, but may. Furthermore, the particular features, structures or characteristics may be combined in any suitable manner, as would be apparent to one of ordinary skill in the art from this disclosure, in one or more embodiments.
(26) Similarly, it should be appreciated that in the description of exemplary embodiments of the invention, various features of the invention are sometimes grouped together in a single embodiment, figure, or description thereof for the purpose of streamlining the disclosure and aiding in the understanding of one or more of the various inventive aspects. This method of disclosure, however, is not to be interpreted as reflecting an intention that the claimed invention requires more features than are expressly recited in each claim. Rather, as the following claims reflect, inventive aspects lie in less than all features of a single foregoing disclosed embodiment. Thus, the claims following the detailed description are hereby expressly incorporated into this detailed description, with each claim standing on its own as a separate embodiment of this invention.
(27) Furthermore, while some embodiments described herein include some but not other features included in other embodiments, combinations of features of different embodiments are meant to be within the scope of the invention, and form different embodiments, as would be understood by those in the art. For example, in the following claims, any of the claimed embodiments can be used in any combination.
(28) In the description provided herein, numerous specific details are set forth. However, it is understood that embodiments of the invention may be practiced without these specific details. In other instances, well-known methods, structures and techniques have not been shown in detail in order not to obscure an understanding of this description.
(29) Where in embodiments of the present invention reference is made to through, reference is made to moving in one side and out of the other side of an object. In embodiments this may refer to a signal which goes through an object or in other words where sufficient amount of power is transmitted through an object in a medium and wherein the medium enables the latter (e.g. is not 100% reflective).
(30) Where in embodiments of the present invention reference is made to object, reference is made to objects comprising materials which are preferably sheet-like, for example a web-based sheet or a dense sheet. Also layers of biological materials can be characterized. Moreover, reference is made to, but not limited to, materials which are adapted to transmit optical signals and thus are, at least partially, transparent for optical signals. In preferred embodiments said optical signal is an electromagnetic signal. In preferred embodiments an object is capable or adapted to be partially transparent for light and/or electromagnetic waves.
(31) The term microwaves designate the electromagnetic (EM) frequency spectrum occupying the range between 3 MHz and 300,000 MHz (300 GHz). The upper decade of this band with wavelengths below 1 centimeter is referred to as millimeter wave region. Penetration of electromagnetic energy inside an object, for example comprising dielectric media, and its sensitivity of minute changes in material medium coupled with availability of relatively large bandwidths are of great significance for nondestructive evaluation applications of millimeter wave system. Both macroscopic and microscopic properties such as density, homogeneity, for example, internal flaws, structure, porosity, moisture content, state of cure, and molecular structure have been examined in materials in solid, liquid and gaseous phase. Interaction of EM field with the medium in general takes place either with conduction electrons or with molecular dipoles resulting in attenuation and phase variation of the traveling wave. The electrical properties of non-magnetic material media can be described in terms of the constitutive parameter .sub.r=.sub.rj.sub.r, referred to as the relative complex dielectric constant. This quantity once measured based on the change in the through transmitted radiation, can provide accurate information about the electrical properties of the medium and subsequently be related to various material characteristics. Furthermore, polarization dependency of a coherent electromagnetic wave can provide information about orientation related properties, for example, orientation of internal flaws or fiber reinforcements in composites.
(32) Where in embodiments of the present invention reference is made to terahertz, reference is made to electromagnetic waves within a designated band of frequency from 0.3 to 3 terahertz (THz, where 1 THz=1e12 Hz). Wavelengths of radiation in the terahertz band correspondingly range from 1 mm to 0.1 mm (or 100 m). Because terahertz radiation begins at a wavelength of one millimeter and proceeds into shorter wavelengths, it is sometimes known as the submillimeter band, and its radiation as submillimeter waves.
(33) It is to be noted that where in embodiments of the present invention reference is made to a means for generating a transmitting signal, reference may be made to a transmitting signal generator, where reference is made to a means for transmitting, reference may be made to a transmitter, where reference is made to a means for receiving, reference is made to a receiver.
(34) All embodiments described in the present invention can be used interchangeably with millimeter waves or terahertz waves. As millimeter waves exhibit significantly longer wave lengths than optical light beams, they advantageously hardly face any scattering on rough surfaces. Furthermore, millimeter waves are robust when facing fog, dust and changing light conditions.
(35) Where in embodiments of the present invention reference is made to electrical length, reference is made to the length of a transmission medium expressed as the number of wavelengths of the signal propagating in the medium. For instance, electromagnetic waves propagate more slowly in a medium than in free space, so a wave traveling through a medium will cover a larger number of wavelengths than a wave of the same frequency propagating over the same distance in free space. Alternatively put, one medium can be physically longer than another medium.
(36) However, a situation can happen where the second medium is electrically longer than the first one. In preferred embodiments the invention provides a method and device which is enabled to measure the electrical length. If we know the electrical properties of a medium, then we can extract the physical length from this electrical length. We can do this using the following formula:
electrical length*=physical length(Eq. 1)
wherein is the wavelength of the frequency in the medium for which the electrical and/or physical length is measured. As a result, in order to retrieve the physical length, we need to know the wavelength () of the wave. This can be calculated as follows: c=*f, wherein c is the speed of light in the medium. Advantageously in embodiments of the invention f is known, as f is the frequency of the carrier which is applied. If we know the speed of light in the medium (i.e. the electrical property of the medium), then we know and thus the physical length. Knowledge of this speed of light in the medium is required to retrieve the physical length.
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(38) The means for generating a transmitting signal 11 is adapted to emit or transmit radiation in the EM field, whereas the means for receiving 21 is adapted to receive radiation in the EM field. The opening or gap D is representative of the electrical length without an object. The means for generating a transmitting signal 11 and receiving 21 may comprise a transmitting and receiving end respectively, such that when provided at opposite sides, the ends are pointed towards each other and substantially along a common axis. As illustrated, a signal pathway is provided when a transmitter generates a signal and transmits a signal through the means for transmitting, which goes through a medium or an object 100 (e.g. a test sample) in the medium when provided in the signal pathway, which is then received by the means for receiving and further processed by the receiver. When an object is inserted in the signal pathway the electrical length is increased, however the gap opening D remains fixed.
(39) In preferred embodiments of the present invention the opening (D, D) defined by the means for generating a transmitting signal and receiving means, and optionally at least one reflector, is between 10 to 60 cm, and more preferably higher than 60 cm. In preferred embodiments the object is provided in between the means for generating a transmitting signal and receiving or in between the means for generating a transmitting signal/receiving means and reflector, and more preferably in the middle, at substantially an equal distance between the means for transmitting and receiving or between the means for transmitting/receiving and reflector.
(40) In embodiments of the present invention the transmitted signal preferably is provided by using a periodic baseband input signal having a frequency which is mixed with a first frequency reference (f.sub.r), by for example a transmitter, resulting in a signal comprising at least two tones. In further preferred embodiments the transmitted signal comprises an up-converted or up-mixed signal. The transmitting signal is then transmitted through the medium or the object or the object in the medium. Then the transmitted signal, which is transmitted through the object, the medium or the object in the medium, is received resulting in a received signal (R.sub.x) wherein said received signal comprises a phase shift (.sub.0). In preferred embodiments the received signal (R.sub.x) comprising a phase shift (.sub.0) is mixed with the first frequency reference (f.sub.r), by for example a receiver, resulting in that the transmitting signal (T.sub.x) is generated with and the received signal (R.sub.x) is processed by the same frequency and therefore share the first frequency reference (f.sub.r). In a final step, the phase shift (.sub.0) is estimated and related to the object's specification such to estimate the objects specification.
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(42) In preferred embodiments both the transmitter (T.sub.x) and receiver (R.sub.x) share the same timing information, so they preferably share the same frequency reference (like e.g. a carrier frequency f.sub.c). In a practical implementation, this means that either the transmitter or receiver share the same source of oscillation performing the up conversion in the transmitter (T.sub.x) and down conversion in the receiver (R.sub.x), or that the transmitter (T.sub.x) and receiver (R.sub.x) use two different sources of oscillation that are phase-locked with respect to each other to perform the up- and down conversion according to embodiments of the invention. It is an advantage of embodiments of the present invention that a shared or same frequency reference provides a reliable sensor value. It is a further advantage of embodiments of the present invention that possible drift in measurements is reduced to a minimum since frequencies for the up and down conversion cannot drift with respect to each other, which reduces calibration overhead.
(43) To obtain a practically useful resolution of the electrical and/or physical length measurement problem, the frequency of this shared reference is preferably high. With a wavelength ranging from 10 mm down to 1 mm, sub-millimeter electrical and/or physical length estimation accuracy can be achieved with millimeter wave frequencies (e.g. in the range of 30 to 300 GHz). Any frequency in this band can be used as a reference frequency for the proposed measurement system. Moreover, frequencies higher than 300 GHz, which are generally referred to as terahertz waves are also preferred for embodiments of the present invention.
(44) If one assumes no other signal than the at least two transmitted tones is present at the receiver's front-end, the working of a sensor of the present invention can be described as follows: Let A be a value proportional to the amplitude of both the lower (f.sub.cf/2) and upper (f.sub.c+f/2) dominant spectral peaks, wherein f.sub.c is the carrier frequency. Note that these peaks are spaced by a frequency of f. Due to the electrical length of the medium, up and down conversion is not performed on the same waveforms s(t). Instead, the waveform has undergone a time shift of t, yielding s(tt). t represents the time.
s(tt)=A.Math.cos(2(f/2+f.sub.c).Math.(tt))+A.Math.cos(2(f/2+f.sub.c).Math.(tt))(Eq. 2)
(45) Let ref.sub.up(t) be the reference frequency for the non-quadrature up conversion in the transmitter (T.sub.x) and ref.sub.down(t) the reference frequency for the quadrature down conversion. If one assumes the following:
ref.sub.up(t)=cos[2f.sub.c.Math.t],(Eq. 3)
then taking into account a fully quadrature reference for down conversion according to embodiments of the present invention, the reference frequency for the down conversion can be expressed as follows:
ref.sub.down=exp(I.Math.2f.sub.c.Math.t).(Eq. 4)
where I is the imaginary unit.
(46) This time-shift t can be expressed as a phase shift .sub.0, satisfying the following conditions:
.sub.0=mod(2f.sub.c.Math.t, 2).(Eq. 5)
(47) In the latter expression, mod(x, y) stands for the modulo operator. The relation between electrical length, physical length and the phase shift .sub.0 is visualized in
(48) The received quadrature down converted signal then equals:
S.sub.received(t)=A.Math.exp(I.Math.[2f/2.Math.(tt)+.sub.0])+A.Math.exp(I.Math.[2f/2.Math.(tt)+.sub.0])(Eq. 6)
(49) Wherein A is a proportionality constant.
(50) Taking respectively the real and imaginary parts of this complex received signal yields both in-phase and quadrature received signals, I and Q respectively:
S.sub.received I(t)=2.Math.cos(2f/2.Math.(tt)).Math.cost.sub.0.Math.A(Eq. 7)
|S.sub.received Q(t)=2.Math.cos(2f/2.Math.(tt)).Math.sin.sub.0.Math.A(Eq. 8)
(51) The amplitudes of both I and Q signals the can be written as follows:
|S.sub.received I(t)|=|2.Math.cos .sub.0.Math.A|(Eq. 9)
|S.sub.received Q(t)|=|2.Math.sin .sub.0.Math.A|(Eq. 10)
(52) These amplitudes can then be used to estimate the phase .sub.0:
.sub.0=acos(|S.sub.received I(t)|/2A)(Eq. 11)
.sub.0=asin(|S.sub.received Q(t)|/2A)(Eq. 12)
.sub.0=atan(|S.sub.received Q(t)|/|S.sub.received I(t)|)(Eq. 13)
(53) A increases monotonically with increased received signal powers. The measurement should preferably not be dependent on the received power. Therefore, estimation of .sub.0 is preferably done based on the atan-formula provided in Eq. 13. Using the atan-formula, the estimate is not a function of A.
(54) As shown in
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(56) In the following an estimation of a thickness of an object as specification of an object, for example of a dielectric object, according to embodiments of the invention is provided. The phase .sub.0 or an electrical length of a medium can be related to the thickness of a dielectric object that is put in the medium in the signal pathway between transmitter and receiver. The index of refraction n.sub.material of the material in which the object is realized is known. Although sensing the thickness of objects is an important field of applications, the invention does not merely restrict itself to applications of this kind. Linking or relating the estimated .sub.0, obtained by embodiments of the present invention, to an object's thickness requires an adequate model. This model can either be a mathematical expression or an empirically-obtained look-up table. If one assumes a setup as indicated in an embodiment of the invention as illustrated in
.sub.0=(2(D).Math.f.sub.c)/c.sub.0+(2.Math.f.sub.c.Math.n.sub.material)c.sub.0(Eq. 14)
(57) Where D is the distance between the means for generating a transmitting signal and receiving and c.sub.0 the speed of light in vacuum. If the latter would be applied for the setup as illustrated in
=(c.sub.0.sub.02.Math.f.sub.c.Math.D)/(2f.sub.c.Math.[n.sub.material1])(Eq. 15)
(58) As a result, an implementation of a technique for material thickness characterization based on a transmission measurement is provided. The model in this example which is used is a simple first-order model, however embodiments of the present invention is not restricted to usage of this simplified model. More complex models can be used, which can advantageously provide a more accurate view on the object's thickness. In embodiments, if the material's density is known, then, the object's thickness can be related to the weight of the material. The approach for material thickness sensing using Eq. 15 assumes that the value of n.sub.material, the refractive index of the material for the applied waves, is known. If not known, the sensor using the sensor concept would suffer from both a sensitivity to the material's thickness as for its value of n.sub.material. This so-called cross-sensitivity to both thickness and material property (n.sub.material) can be exploited for characterization of foams, meaning both for characterization of its thickness and its weight. Experiments showed that n.sub.foam is a sufficient weighed average between n.sub.gas and n.sub.polymer, with their weights proportional to its volume fraction in the foam material. n.sub.gas is the refractive index of the foam's gas. n.sub.polymer is the refractive index of the foam's solid material, commonly a polymer. n.sub.foam therefore is a monotonic function of the foam's weight. Combination of the device's measurement with for example a thickness sensor (e.g. contact-caliper), can enable the device to sense foam weights. Apart from contact-calipers several other techniques (not limited to the techniques as listed here) can be applied to assist in measuring the object's thickness: laser triangulation, ultrasound, the here-presented invention but applied using a different carrier frequency, etc.
(59) Due to second-order effects it is however possible that the linear relationship between the electric length and the detected phase .sub.0 is limited. In such a case, the electrical length of the medium without an object inserted in the signal pathway may be calibrated or tuned to work in its operating point where linearity is at its maximum. Therefore, careful calibration or tuning of the reference phase value is provided according to preferred embodiments of the present invention. The latter can be enabled using various embodiments, like for instance:
(60) (1) tuning the delay of the transmitted signal electrically within the transmitter, which for example can be done by a phase shifting circuit;
(61) (2) tuning the delay of the received signal electrically within the receiver. This can be done by a phase shifting circuit; and/or
(62) (3) tuning the total distance between means for generating a transmitting signal and receiving means (D, D) mechanically and optionally angular tuning can also be performed where the angle of a signal path can be fine-tuned to an optimal value such to prevent reflections towards the means for generating a transmitting signal.
(63) Tuning a total distance between the means for generating a transmitting signal and receiving means (D) or the means for generating a transmitting signal/receiving means and reflector (D) can for example be achieved in two possible ways either by tuning the means for generating a transmitting signal-receiving means distance (D) directly, when using the instrument setup illustrated in
(64) An advanced possible approach of sweeping and tuning of the distance (D or D) results in a more optimal situation in which the device is fully-calibrated. Whereas the tuning as mentioned above discusses mechanically moving one of the components of device to an operating point in which linearity is maximized, the following approach enables the device to respond more accurately, even when linearity is poor in a specific measurement range and measurement speed requirements are stringent. However, it is at the cost of a slightly more time-consuming calibration operation. This advanced approach (full-calibration) is now discussed. Periodic execution of this full-calibration operation not only takes care of the device's linearity (caused by imperfect IQ-imbalance, near-field effects, . . . ) as is countered by the tuning approach as explained above, but also counters the effects of varying temperatures, varying humidity and varying pressure. It is based on measuring the electrical length of the gap D (or D) between the means for generating a transmitting signal and the means for receiving by means of the device itself, at different (but known) values of the gap D (or D). This is preferably done by sweeping the gap in a range [D1,D2] (technique referred to as mechanical sweep), with the gap D (the final operating point) lying somewhere in between the extreme values D1 and D2. The sweep is carried out within steps, said steps comprising a distance of a few millimeters typically (about one wavelength of the used wave). Note that for the explanation as written above D can be replaced by D if required. The sweep is typically performed automatically and implemented by putting either the means for transmitting or the means for receiving on a linear drive unit which is on its turn driven by a motor. The device captures data while sweeping, generating a vector of measurement points (m.sub.vec) and a vector of position-data (p.sub.vec) read from the linear drive unit. This sweep can be carried out in both the case when an object with known object parameters is present in the gap or when nothing is present in the gap. The collected m.sub.vec and p.sub.vec values may provide important values which will are used in the actual calibration operation. In other embodiments, one may come to a usable p.sub.vec and m.sub.vec is not to sweep the gap D (or D), but to only collect m.sub.vec-data for a few discrete values of D (or D) (at least two) (technique of discrete displacements). These collected values can then on their turn be used in the actual calibration operation.
(65) It should be stressed that the full-calibration approach as shown above uses data captured at varying geometrical conditions (mechanical sweep or discrete displacements). However, the full-calibration approach is not limited to varying geometrical conditions only. A similar calibration approach can be set-up using captured data at varying electrical conditions. These electrical conditions are typically realized when an electrical-delay-tuning element or an electromagnetical delay-tuning element is introduced.
(66) Analysis of both the I and Q amplitudes may be performed by a computing device, preferably a field-programmable gate array (FPGA device). Depending on the sampling speed of the data acquisition device, embodiments of the present invention can be implemented in many more technologies: PCB-level electronics, laptop, full custom ASIC, DSP processors, etc. In further embodiments, the linear relationship between the electric length and the detected phase .sub.0 may be increased by providing at least one radio-absorbing material nearby either the means for generating a transmitting signal or receiving means, or both. This is illustrated in
(67) In embodiments the means for transmitting and means for receiving are provided and positioned such that the direction of the radiation emitted by the means for generating a transmitting signal is substantially perpendicular to the object's, e.g. sheet-like object's, surface. Alternatively, the means for generating a transmitting signal and means for receiving can be put in a way that the direction of the radiation emitted by the means for generating a transmitting signal is non-perpendicular to the material's surface. In that way, the effects of surface reflection and possible standing waves may be reduced as well. This on its turn suppresses the measurement's sensitivity to the object's position in between the two means for generating a transmitting signal and receiving means.
(68) The analysis of the amplitudes of both I and Q signals is preferably processed in real-time on a dedicated platform. If connectivity to a host e.g. a general-purpose pc, laptop or industrial pc is required, it may be realized by an implementation of a commercially-available bus protocol. In embodiments of the present invention a USB 2.0 is used in its current state, but it is not restricted to latter. Measurement data is preferably processed by the host by either one of the following ways, for example: (a) interfacing the custom API as part of the invention, (b) interfacing the end-user graphical user interface as displayed in
(69) A first implementation of an instrument setup for a sensor according to the present invention is illustrated in
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(71) For industrial inline measurement applications, a device as schematically illustrated in
(72) A total instrument setup of a sensor according to embodiments of the invention is illustrated in
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(74) In embodiments a 60 GHz carrier frequency may be used. However, any millimeter-wave or terahertz frequency can be used to make a similar setup. Implementations are not restricted to this 60 GHz.
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(77) Such an O-frame containing an array of pairs of means for generating a transmitting signal and receiving means can be mounted on a linear drive unit 750, as depicted in
(78)
(79) In embodiments of the present invention calibration or tuning of the system or may be performed. Calibration or tuning of the measurement is preferably performed for every pair of means for generating a transmitting signal and receiving means. It can be done for every pair in one of the ways as described above (e.g. tuning a total distance between means for generating a transmitting signal and means for receiving (D,D)), or by taking over the calibration or tuning information from another pair (=reference pair) of means for generating a transmitting signal and means for receiving. According to embodiments this can either be done by: 1. Taking over the exact copy of the calibration information (e.g. an offset value, or a gain value, . . . ) from the reference pair, and thus assuming that all pairs face the same non-idealities that destroy their calibration state over time. This is an acceptable way of calibration whenever the requirements for precision are less stringent (when the electrical distance needs to be determined with a precision of 0.01 or worse.) 2. Letting calibration data (e.g. an offset value, or a gain value) from the reference pair ripple over the width of the material to the specific pair that needs to be calibrated. This is preferably done by creating a structure as shown in
(80) It is to be understood that this invention is not limited to the particular features of the means and/or the process steps of the methods described as such means and methods may vary. It is also to be understood that the terminology used herein is for purposes of describing particular embodiments only, and is not intended to be limiting. It is also to be understood that plural forms include singular and/or plural referents unless the context clearly dictates otherwise. It is moreover to be understood that, in case parameter ranges are given which are delimited by numeric values, the ranges are deemed to include these limitation values.
(81) The above description is for the purpose of teaching the person of ordinary skill in the art how to practice the present invention, and it is not intended to detail all those obvious modifications and variations of it which will become apparent to the skilled worker upon reading the description. It is intended, however, that all such obvious modifications and variations be included within the scope of the present invention, which is defined by the following claims. The claims are intended to cover the claimed components and steps in any sequence which is effective to meet the objectives there intended, unless the context specifically indicates the contrary.