METHOD FOR MANUFACTURING A PROBE OF A THERMAL, FLOW MEASURING DEVICE, A PROBE AND A FLOW MEASURING DEVICE

Abstract

The invention relates to a method for manufacturing a probe (10) of a thermal, flow measuring device for measuring mass flow of a liquid in a measuring tube, wherein the method comprises steps as follows:

introducing a probe core comprising a hard solder and a core element into a first probe sleeve, wherein the first probe sleeve has an open first end and a closed second end away from the first end;
melting the hard solder;
affixing the core element by cooling the hard solder to a temperature less than the solidification temperature;
applying a thermoelement to a contact area of the core element or of the solidified hard solder.

The invention relates, furthermore, to a probe resulting from the manufacturing process as well as to a flow measuring device having at least one probe of the invention.

Claims

1. Method for manufacturing a probe of a thermal, flow measuring device for measuring mass flow of a liquid in a measuring tube, wherein the method comprises steps as follows: introducing a probe core (13) comprising a hard solder (19) and a core element (18) into a first probe sleeve (11), wherein the first probe sleeve (11) has an open first end (21) and a closed second end (22) away from the first end; melting the hard solder (19); affixing the core element by cooling the hard solder (19) to a temperature less than the solidification temperature; applying a thermoelement (31) to a contact area (14) of the core element (18) or of the solidified hard solder (19).

2. Method as claimed in claim 1, wherein, after solidification of the hard solder (19), the hard solder completely surrounds the core element (18).

3. Method as claimed in claim 1, wherein the core element (18) has a center of mass (17), a second end toward the second end (22) on one side of the center of mass and a first end away from the second end on the other side of the center of mass (17), wherein, after solidification of the hard solder, the first end of the core element is at least partially free of hard solder (19).

4. Method as claimed in one of the preceding claims, wherein the contact area (14) for the application of the thermoelement is prepared by mechanical processing.

5. Method as claimed in one of the preceding claims, wherein, after application of a thermoelement (31) on the contact area (14), a second probe sleeve (12) with an open third end (23) and an open fourth end (24) is joined, especially welded, via the third open end (23) leak tightly to the first end (21), wherein the second probe sleeve (12) completely grips around a first region of the probe core (13).

6. Method as claimed in claim 5, wherein the first region (13) of the probe core is spaced in a subregion (16) from all surfaces of the first probe sleeve (11) and/or the second probe sleeve (12), wherein the subregion includes all first cross sections of the probe core (13), which first cross sections intersect or contact the contact area (14).

7. Method as claimed in one of the preceding claims, wherein the thermoelement (31) is placed on the contact area (14) by means of a solder- or sinter layer (32).

8. Probe (10) of a thermal, flow measuring device for measuring mass flow of a liquid in a measuring tube produced by a method as claimed in one of the preceding claims, comprising: a first probe sleeve (11) with an open first end (21) and a closed second end (22); a probe core (13), which at least partially fills out the first probe sleeve (11), wherein the probe core has a hard solder (19) and a core element (18); a thermoelement (31), which is thermally coupled with the probe core (13), wherein the thermoelement is adapted to increase or to register the temperature of the probe core; characterized in that the probe core (13) is formed by melting the hard solder (19) in the first probe sleeve.

9. Probe (10) as claimed in claim 8, wherein the probe core (13) includes a first longitudinal axis (15), a lateral surface mechanically connected with the first probe sleeve (11), a center of mass, and a contact area (14) away from the second end (22) of the probe core (13) on the other side of the center of mass, wherein the thermoelement (31) is placed on the contact area (14) by means of a solder- or sinter layer (32), wherein the contact area is an area of the core element and/or of the hard solder.

10. Probe as claimed in claim 8 or 9, wherein the probe core (13) includes a first region, which protrudes out from the first probe sleeve (11) in the axial direction, wherein the first region contains the contact area (14).

11. Probe (10) as claimed in claim 10, wherein the first region is surrounded by a second probe sleeve (12) with an open third end (23) and an open fourth end (24), which second probe sleeve (12) is joined, especially welded, via the third end (23) leak tightly to the open first end of the first probe sleeve (11) wherein the first region is spaced in a subregion from all surfaces of the first probe sleeve (11) and/or second probe sleeve (12), wherein the subregion includes all first cross sections of the probe core (13), which intersect or include the contact area (14).

12. Probe (10) as claimed in one of claims 8 to 11, wherein the first probe sleeve (11) comprises a stainless steel; and wherein the core element (13) has a thermal conductivity greater than 100 W/(m.Math.K), wherein the core element comprises at least one of the following list: copper, silver, aluminum, nickel, indium, gold, tin, and wherein the hard solder has a melting temperature below the melting temperature of the core element.

13. Probe (10) as claimed in one of claim 12, wherein the hard solder comprises silver or copper.

14. Thermal, flow measuring device (40) for measuring mass flow of a liquid in a measuring tube and having at least one probe (10), especially as claimed in one of the preceding claims 9 to 13, wherein the thermal, flow measuring device comprises: a measuring tube with a second longitudinal axis; wherein the at least one probe (10) is introduced into the measuring tube; an electronic operating circuit, which is adapted to operate the at least one probe (10).

15. Thermal, flow measuring device (40) as claimed in claim 14, wherein the thermal, flow measuring device includes at least two probes (10), wherein the electronic operating circuit is adapted to heat at least a first probe (10.1), wherein the electronic operating circuit is adapted to determine the temperature of the liquid by means of at least a second probe (10.2).

Description

[0022] The invention will now be described based on examples of embodiments illustrated in the appended drawing, the figures of which show as follows:

[0023] FIG. 1 a schematic process flow diagram of manufacture of a probe of the invention.

[0024] FIGS. 2 a) to c) cross sections of a probe of the invention in different stages of manufacture.

[0025] FIG. 3 an enlarged and not to scale view of the manufacturing stage illustrated in FIG. 2 c).

[0026] FIG. 4 schematic examples of embodiments of the probe of the invention.

[0027] FIG. 5 a schematic front view of a thermal, flow measuring device having two probes of the invention.

[0028] FIG. 1 shows a form of embodiment of a process flow 100 for manufacture of a probe 10 of the invention.

[0029] In a first step 101, a probe core 13 comprising a core element 18 and a hard solder 19 is inserted into a first probe sleeve 11, wherein the core element 18 comprises copper or silver, and wherein the first probe sleeve 11 is formed of a stainless steel, and wherein the first probe sleeve 11 has an open first end 21 and a closed second end 22 away from the first end.

[0030] In a second step 102, the hard solder 19 is melted, so that the liquid material of the hard solder 19 collects in an intermediate region between core element 18 and first probe sleeve 11 down to the closed second end 22 of the first probe sleeve 11. While the hard solder 19 is liquid, there arises in an interface between hard solder 18 and first probe sleeve 11 and in an interface between hard solder 18 and core element 18, in each case, an intermetallic connecting layer, in which the material of the hard solder 19 mixes with the material of the first probe sleeve 11, and with the material of the core element 19, as the case may be.

[0031] In a third step 103, the probe core 13 is cooled to a temperature less than the solidification temperature of the hard solder 19. Due to the forming of the intermetallic connecting layers, the contact between probe core 13 and first probe sleeve 11 remains after solidification of the probe core.

[0032] In a fourth step 104, a thermoelement is placed by means of a solder-, or sinter layer on a contact area 14 of the probe core 13.

[0033] In a fifth step 105, a second probe sleeve 12 with an open third end 23 and an open fourth end 24 is joined, especially welded, via the open third end leak tightly to the open first end 21 of the first probe sleeve, wherein the second probe sleeve 12 completely grips around a first region of the probe core 13, wherein the probe core in a subregion 16 of the first region is spaced from all surfaces of the first probe sleeve 11 and/or the second probe sleeve 12.

[0034] FIG. 2 shows cross sections of a probe 10 of the invention in different stages of manufacture.

[0035] FIG. 2 a) shows a cross section of the probe 10 in a phase, in which the first probe sleeve 11 contains the probe core 13 composed of core element 18 and hard solder 19, wherein the figure could represent the hard solder in the liquid state or in the solidified state. First probe sleeve 11 has the open first end 21 and the closed second end 22. Core element 18 includes, in such case, the contact area 14, which is adapted to accommodate the thermoelement 31.

[0036] FIG. 2 b) shows a cross section of the probe 10 in a phase, in which after solidification and cooling of the hard solder 19 the thermoelement 31 is placed on the contact area 14 of the core element 18 by means of a solder-, or sinter layer 32.

[0037] FIG. 2 c) shows a cross section of a readied probe 10 with a second probe sleeve 12, which is joined, especially welded, via a third end 23 of the second probe sleeve to the first end 21 of the first probe sleeve 11.

[0038] FIG. 3 shows an enlarged view of the cross section of the readied probe 10 shown in FIG. 2 c), wherein the presentation is horizontally not to scale, in order to show details better.

[0039] Thermoelement 31 is held on the contact area 14 of the core element 18 via a solder-, or sinter layer 32. Core element 18 has a center of mass 17 and is, in such case, embodied in the subregion 16 in such a manner that it is spaced from all surfaces of the second probe sleeve 12. The separation of the core element 18 from the second probe sleeve, or from the first probe sleeve and the second probe sleeve in the subregion 16 leads to a homogeneous distribution of temperature in the probe core 13. In this way, in the case of application of the probe 10 as a heating element, a uniform heat emission to the liquid in the dotted region is assured. Conversely, in the case of application of the probe as a temperature sensor, a uniform loading of the thermoelement 31 with the temperature of the liquid is assured.

[0040] FIGS. 4 a) to c) show schematic cross sections of three forms of embodiment for the probe of the invention, wherein for purposes of perspicuity the second probe sleeve is not shown. FIG. 4 a) shows the form of embodiment shown in FIGS. 2 a) to d) and in FIG. 3. FIG. 4 b) shows a form of embodiment with contact area 14 inclined relative to the first longitudinal axis 15. FIG. 4 c) shows a form of embodiment with contact area 14 perpendicular to the longitudinal axis 15. The forms of embodiment shown in FIGS. 4 a) and b) enable manufacture of thin probes in the case of a given thermoelement 31.

[0041] FIG. 5 shows a schematic front view of a thermal, flow measuring device 40 of the invention with a measuring tube 42, two probes 10 of the invention, which are arranged in the lumen of the measuring tube 42, and a housing 41, which has an electronic operating circuit, which is adapted to operate the probes 10.

[0042] In order to measure the mass flow of a liquid through the measuring tube 42, for example, a probe 10.1 in the liquid flowing through the measuring tube 42 is heated in such a manner that a temperature difference remains constant relative to the media temperature. Advantageously, a second probe 10.2 is used for temperature measurement of the liquid and is arranged before or as shown in FIG. 2 beside the heated probe 10.1, in order to maintain the temperature difference. Assuming that media properties, such as density or composition, remain constant, the mass flow of the liquid can be ascertained via the heating current needed for holding the temperature.

[0043] The probes 10 can also be arranged one after the other in the flow direction, wherein a first, upstream probe heats the liquid flowing past and thus also a second, downstream probe. In such case, the heating power of the first probe required for maintaining a temperature difference is inversely proportional to the flow velocity of the liquid.

LIST OF REFERENCE CHARACTERS

[0044] 10 probe [0045] 10.1 first probe [0046] 10.2 second probe [0047] 11 first probe sleeve [0048] 12 second probe sleeve [0049] 13 probe core [0050] 14 contact area [0051] 15 first longitudinal axis [0052] 16 subregion [0053] 17 center of mass [0054] 18 core element [0055] 19 hard solder [0056] 21 first end [0057] 22 second end [0058] 23 third end [0059] 24 fourth end [0060] 31 thermoelement [0061] 32 solder layer/sinter layer [0062] 34 separation [0063] 40 thermal, flow measuring device [0064] 41 housing [0065] 42 measuring tube [0066] 100 method for manufacturing a probe of the invention [0067] 101 introducing a probe core comprising a core element and a hard solder into a first probe sleeve [0068] 102 melting the hard solder [0069] 103 cooling the hard solder to below solidification temperature [0070] 104 mounting a thermoelement on a contact area by means of a solder-, or sinter layer [0071] 105 attaching a second probe sleeve on the first probe sleeve