WELDING FAILURE INSPECTION METHOD

Abstract

A method for inspecting a welding defect of the present invention includes: a threshold resistance setting step (S100) of measuring a resistance of a welded portion of a sample group and deriving a threshold resistance value which becomes an evaluation standard of a weak welding; a resistance measuring step (S200) of measuring a resistance value of a welded portion to be inspected; and a step (S300) of determining as a weak welding if the resistance value measured in the resistance measuring step exceeds the threshold resistance value, wherein the threshold resistance setting step (S100) and the resistance measuring step (S200) include measuring a resistance using a microresistance measuring instrument having a resolution of nanoohm to microohm units.

The welding defect inspection method of the present invention shows excellent detection power for the welding defect by a weak welding.

Claims

1. A method for inspecting a welding defect, comprising: setting a threshold resistance including measuring a first resistance of a first welded portion of a sample group using a microresistance measuring instrument having a resolution of nanoohm to microohm units, and deriving a threshold resistance value which becomes an evaluation standard of a weak welding; measuring a second resistance of a second welded portion to be inspected using the microresistance measuring instrument; and determining the second welded portion as a weak welding when the second resistance exceeds the threshold resistance value.

2. The method of claim 1, wherein the resistance measuring of the second resistance includes contacting two resistance measuring probes with the second welded portion.

3. The method of claim 2, further comprising: measuring a total resistance of the second welded portion by contacting one resistance measuring probe with one end of the second welded portion and contacting another resistance measuring probe with an other end of the second welded portion.

4. The method of claim 2, wherein the two resistance measuring probes each include a voltage probe and a current probe.

5. The method of claim 1, wherein the measuring of the second resistance includes measuring the second resistance by a 4-wire type measuring scheme.

6. The method of claim 1, wherein the measuring of the second resistance includes measuring the second resistance by a direct current scheme.

7. The method of claim 1, wherein the setting of the threshold resistance further comprises: constructing data including measuring a microresistance of nanoohm and microohm units for a sample group and storing the measured microresistance; and deriving the threshold resistance value by processing data accumulated in the constructing of data by a statistical scheme.

8. The method of claim 7, wherein a number of objects of the sample group is equal to or greater than 100,000.

9. The method of claim 7, wherein resistance values of the sample group form a normal distribution curve.

10. The method of claim 9, wherein the threshold resistance value is an average value+6δ.

11. The method of claim 3, wherein the second welded portion is an ultrasonic weld.

12. The method of claim 11, wherein the measuring of the total resistance includes contacting the resistance measuring probes with a boundary line of the second welded portion.

13. The method of claim 3, wherein the second welded portion is a laser weld.

14. The method of claim 13, wherein the measuring of the total resistance includes contacting the resistance measuring probes with an outer peripheral surface of the second welded portion.

15. The method of claim 1, wherein the second welded portion is one selected from a welded portion between an electrode lead and an electrode tab of a pouch-type secondary battery, and a welded portion between an electrode tab and an electrode tab of a pouch-type secondary battery.

Description

BRIEF DESCRIPTION OF THE DRAWINGS

[0028] FIG. 1 is a flowchart illustrating a method of inspecting a welding defect of the present invention.

[0029] FIG. 2 is a graph showing the correlation between welding strength and resistance.

[0030] FIG. 3 is a normal distribution curve of resistance values of a sample group according to an embodiment of the present invention.

[0031] FIG. 4 is a schematic diagram showing a method of measuring a resistance according to an embodiment of the present invention.

[0032] FIG. 5 is a schematic diagram showing a method of measuring a resistance according to another embodiment of the present invention.

[0033] FIG. 6 is a schematic diagram of a resistance measuring probe of the present invention.

[0034] FIG. 7 is a schematic diagram showing a method of measuring a resistance of a welded portion by ultrasonic welding according to an embodiment of the present invention.

[0035] FIG. 8 is a schematic diagram showing a method of measuring a resistance of a welded portion by laser welding according to an embodiment of the present invention.

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

[0036] Hereinafter, preferred embodiments of the present invention will be described in detail with reference to the accompanying drawings. The terms and words used in the present specification and claims should not be construed as limited to ordinary or dictionary terms and the inventor may properly define the concept of the terms in order to best describe its invention. The terms and words should be construed as meaning and concept consistent with the technical idea of the present invention.

[0037] Accordingly, the embodiments described in the specification and the configurations described in the drawings are only the most preferred embodiments of the present invention, and do not represent all of the technical ideas of the present invention. It is to be understood that there may be various equivalents and variations in place of them at the time of filing the present application.

[0038] Also, throughout the specification, when an element is referred to as “including” an element, it is understood that the element may include other elements as well unless specifically stated otherwise.

[0039] FIG. 1 is a flowchart of a method for inspecting a welding defect according to the present invention. Referring to FIG. 1, a method for inspecting a welding defect of the present invention includes: a threshold resistance setting step (S100) of measuring a resistance of a welded portion of a sample group and deriving a threshold resistance value which becomes an evaluation standard of a weak welding; a resistance measuring step (S200) of measuring a resistance value of a welded portion to be inspected; and a determination step (S300) of determining the welded portion as a weak welding if the resistance value measured in the resistance measuring step exceeds the threshold resistance value, wherein the threshold resistance setting step (S100) and the resistance measuring step (S200) include measuring a resistance using a microresistance measuring instrument having a resolution of nanoohm to microohm units.

[0040] The inventors of the present invention have found that the electric resistance value of the welded portion having a low welding strength was greater than the electric resistance value of the welded portion having a normal welding strength, which has led them to the present invention. Referring to FIG. 2, a resistance value of a welded portion having been welded by a normal welding strength of 22 kgf or more is smaller than a resistance value of a welded portion having been welded by a weak welding strength less than 22 kgf. Conventionally, there was a technology of inspecting a welding defect by measuring the resistance of the welded portion and comparing the measured resistance value with the threshold resistance value. However, in the conventional technology, the method of deriving the threshold resistance value was not specific, or a process of measuring the tensile strength of the welded portion was necessary because the correlation between the tensile strength of the welded portion and the resistance was used when deriving the threshold resistance value.

[0041] However, the present invention is characterized in introducing a statistical scheme in deriving a threshold resistance value while not relying on a correlation between a tensile strength and a resistance of a welded portion and in precisely measuring a resistance by measuring the resistance up to nanoohm to microohm levels by increasing the resolution.

[0042] Namely, when the resistances for objects forming a large amount of sample groups are measured, the measured resistance values form a normal distribution curve. In the normal distribution curve, an object having a large deviation may be easily assumed as being defective from a standpoint of a statistical probability, and thus a predetermined deviation is determined as a threshold resistance value. Further, this approach is based on a premise that data for the sample group are reliable. Hence, a microresistance measuring instrument capable of precisely measuring the resistance up to nanoohm to microohm levels for the sample group is used in the process of setting a threshold value, and a microresistance measuring instrument capable of precisely measuring the resistance up to nanoohm to microohm levels is used when measuring the resistance for the object to be inspected. Likewise, in the present invention, a threshold resistance value is statistically derived from a large amount of sample groups when deriving the threshold resistance value. Hence, it is not necessary to separately measure the tensile strength of the welded portion in order to set the threshold resistance value unlike the conventional technology.

[0043] First, the threshold resistance setting step (S100) will be described.

[0044] The threshold resistance setting step (S100) according to an embodiment of the present invention includes: a data construction step (S110) of measuring a microresistance of nanoohm and microohm units for a sample group and storing the measured microresistance; and a threshold resistance value deriving step (S120) of deriving a threshold value by processing data accumulated by the data construction step (S110) by a statistical scheme.

[0045] The data construction step (S110) includes a process of measuring the resistance of a welded portion for objects which form a sample group. At this time, the number of objects of the sample group is at least 100,000, preferably 200,000, and it is preferable to have as many objects of the sample group as possible in terms of reliability.

[0046] In the data construction step (S110), resistances for objects of the sample group are measured by using a microresistance measuring instrument having a resolution of nanoohm (nΩ) to microohm (uΩ) units. This is to accumulate more reliable data. Further, the microresistance measuring method is performed in the same manner as that of the scheme of measuring the resistance of the welded portion in the resistance measuring step (S200). The threshold resistance value deriving step (S120) includes deriving a threshold resistance value by processing data accumulated by the data construction step (S110) by a statistical scheme. The statistical processing method according to an embodiment of the present invention is to obtain a normal distribution curve of the resistance value of an object of the sample group and to the +66 value in the normal distribution curve as the threshold resistance value.

[0047] FIG. 3 shows an example of a distribution curve of resistances of a sample group according to an embodiment of the present invention. Referring to FIG. 3, when the sample group shows a normal distribution curve as in FIG. 3, the majority of objects have values close to the average value (μ), and the number of objects having a value, which is significantly deviated from the average value (μ), is small. Therefore, objects having a value, which is significantly deviated from the average value, may be stochastically assumed as being defective. Specifically, the probability that an object having a deviation of 16 (standard deviation) appears is about 32%, the probability that an object having a deviation of 26 appears is about 5%, the probability that an object having a deviation of 36 appears is about 0.3%, the probability that an object having a deviation of 46 appears is about 0.01%, the probability that an object having a deviation of 56 appears is about 0.001%, and the probability that an object having a deviation of 66 appears is about 0.0000001%.

[0048] As such, in an embodiment of the present invention, the sum of the average value and 66 was set as the threshold resistance value.

[0049] Hereinafter, the resistance measuring step (S200) will be described in detail.

[0050] FIG. 4 is a schematic diagram showing a method of measuring a resistance according to an embodiment of the present invention. Referring to FIG. 4, a microresistance measuring instrument, which is used for resistance measurement in the resistance measuring step (S200) of the present invention, includes two resistance measuring probes 100, and resistances are measured by allowing the two resistance measuring probes to contact the welded portion 30.

[0051] The resistance of the entire welded portion 30 can be measured by allowing one resistance measuring probe to contact one end 31 of the welded portion and allowing the other resistance measuring probe to contact the other end of the welded portion.

[0052] Further, as illustrated in FIG. 4(b), the welded portion 30 can be divided into a welded portion 33 of the electrode tab 20 portion and a welded portion 34 of the electrode lead 10, and as illustrated in FIG. 4(b), both of the two resistance measuring probes can be allowed to contact the welded portion 33 of the electrode tab 20. Unlike this, both of the two resistance measuring probes may be allowed to contact the welded portion 34 of the electrode lead 10. Alternatively, as illustrated in FIG. 5, one resistance measuring probe may be allowed to contact the welded portion 33 of the electrode tab 20, and the remaining one resistance measuring probe may be allowed to contact the welded portion 34 of the electrode lead 10, to thereby measure the resistance. Among the above embodiments, it was most preferable to measure the resistance in the form of contacting both of the two resistance measuring probes on the welded portion 33 of the electrode tab 10 in terms of the detection power of detecting a weak welding.

[0053] FIG. 6 shows a schematic diagram of a resistance measuring probe of the present invention, and referring to FIG. 6, the resistance measuring probe 100 of the present invention includes a current probe 110 and a voltage probe 120. The current probe applies current to a welded portion to be measured, and the voltage probe measures voltages. As such, the resistance of the welded portion can be measured.

[0054] In the present invention, the resistance is measured by allowing two resistance measuring probes to contact the welded portion. As such, the resistance of the welded portion can be measured by a 4-wire type measuring scheme. Since the 4-wire type resistance measuring scheme is less influenced by the contact resistance compared to the 2-wire type resistance measuring scheme, the microresistance can be more precisely measured in the 4-wire type resistance measuring scheme, in which the resistance can be measured even in nanoohm units.

[0055] In one specific example, the resistance measuring step (S200) includes measuring a resistance of a welded portion by a direct current scheme. The direct current scheme has an advantage that high-precision resistance measurement is possible, compared to the alternating current scheme.

[0056] The welding defect inspection method of the present invention can be widely applied to the welded portion of the secondary battery and can be applied to the welded portion according to various welding schemes. Namely, the welding defect inspection method of the present invention can be applied to a welded portion between an electrode tab and an electrode tab, a welded portion between an electrode tab and an electrode lead, and a welded portion between an electrode lead and a bus bar in a battery pack, and may also be applied to a welded portion by ultrasonic welding and a welded portion by laser welding, etc.

[0057] FIG. 7 is a schematic diagram showing a method of measuring a resistance to a welded portion according to an ultrasonic welding scheme. Referring to FIG. 7, a welded portion 30 formed by the ultrasonic welding scheme has the form of a line or a surface. As such, the contact position 40 of the resistance measuring probe for resistance measurement is positioned on the boundary line of the welded portion. The resistance of the entire welded portion can be measured by allowing the resistance measuring probe to contact the boundary line of the welded portion. There are 4 contact positions 40 of the resistance measuring probe. Herein, the current probe contacts two of the contact positions 40, and the voltage probe contacts the remaining two of the contact positions 40.

[0058] FIG. 8 is a schematic diagram showing a method of measuring a resistance to a welding portion according to a laser welding scheme. Referring to FIG. 8, the welded portion 30 formed by the laser welding scheme has a dotted shape. In order to measure the resistance of the entire welded portion, it is desirable to determine the contact position 40 of the resistance measuring probe on the outer peripheral surface with a virtual line obtained by connecting points at the outermost portions of the points as the boundary. There are 4 contact positions 40 of the resistance measuring probe. Herein, the current probe contacts two of the contact positions 40, and the voltage probe contacts the remaining two of the contact positions 40.

[0059] According to the welding inspection method of the present invention, resistances of a sample group are measured, a threshold resistance value is set from a normal distribution curve of the measured resistance values, and resistances are precisely measured by using a microresistance measuring instrument having a resolution of nanoohm to microohm levels when measuring resistances for the sample group and the welded portion to be inspected, thereby showing an excellent detection power for a weak welding defect.