CHARGED PARTICLE DETECTION MATERIAL, AND CHARGED PARTICLE DETECTION FILM AND CHARGED PARTICLE DETECTION LIQUID USING THE SAME
20190241803 ยท 2019-08-08
Assignee
Inventors
Cpc classification
C09K9/00
CHEMISTRY; METALLURGY
G21K4/00
PHYSICS
F21K2/04
MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
C09K11/00
CHEMISTRY; METALLURGY
International classification
Abstract
[Problem]
To provide a charged particle detection material which can detect charged particles due to a discharge phenomenon or the like caused even in a very low voltage which cannot be observed by a prior art, as well as a charged particle detection film and a charged particle detection liquid using the material.
[Solution]
The charged particle detection material and the charged particle detection film according to the present invention contain at least one of a fluorescent substance, a luminescent substance, an electroluminescent substance, a fractoluminescent substance, a photochromic substance, an afterglow substance, a photostimulated luminescent substance and a mechanoluminescent substance and can easily detect emission or incidence of charged particles in real time.
Claims
1-10. (canceled)
11: A charged particle detection material for detecting charged particles with luminescence, characterized in that the charged particle detection material contains at least one of: an electroluminescent substance, a fractoluminescent substance, a photochromic substance, an afterglow substance and a photostimulated luminescent substance; and phosphorescent luminescent materials such as iridium complexes and platinum complexes which emit light by X-ray, ultraviolet ray or visible light, luminol, rofin, lucigenin, oxalate, photosensitive luminescent dye, and bioluminescent substances.
12: The charged particle detection material according to claim 11, characterized in that an electric field applied to the charged particles is within a range of 1 to 3000 V/mm in air.
13: The charged particle detection material according to claim 11, characterized in that a total weight ratio of: the electroluminescent substance, the fractoluminescent substance, the photochromic substance, the afterglow substance and the photostimulated luminescent substance; and the phosphorescent luminescent materials such as iridium complexes and platinum complexes which emit light by X-ray, ultraviolet ray or visible light, luminol, rofin, lucigenin, oxalate, the photosensitive luminescent dye, and the bioluminescent substances is 20 to 80 wt %.
14: The charged particle detection material according to claim 11, characterized in that the afterglow substance is a substance represented by SrAl.sub.2O.sub.4 which is doped with Eu.sup.2+ and Dy.sup.3+, a substance represented by SrAl.sub.2O.sub.4 which is doped with Eu.sup.2+, Dy.sup.2+ and M (M=monovalent to trivalent metal ions), or a substance represented by Zn.sub.3(PO.sub.4) which is doped with Mn.sup.2+ and M (M=monovalent to trivalent metal ions).
15: The charged particle detection material according to claim 12, characterized in that the afterglow substance is a substance represented by SrAl.sub.2O.sub.4 which is doped with Eu.sup.2+ and Dy.sup.3+, a substance represented by SrAl.sub.2O.sub.4 which is doped with Eu.sup.2+, Dy.sup.2+ and M (M=monovalent to trivalent metal ions), or a substance represented by Zn.sub.3(PO.sub.4) which is doped with Mn.sup.2+ and M (M=monovalent to trivalent metal ions).
16: A charged particle detection material for detecting charged particles with luminescence, characterized in that: the charged particle detection material contains at least a mechanoluminescent substance; and an electric field applied to the charged particles is within a range of 1 to 3000 V/mm in air.
17: The charged particle detection material according to claim 16, characterized in that a total weight ratio of the mechanoluminescent substance is 20 to 80 wt %.
18: The charged particle detection material according to claim 16, characterized in that the mechanoluminescent substance is a substance represented by SrAl.sub.2O.sub.4 which is doped with Eu.sup.2+, a substance represented by SrAl.sub.2O.sub.4 which is doped with at least one of Eu.sup.2+, Ho.sup.3+, Dy.sup.2, M.sub.1, M.sub.2 and M.sub.3 (M.sub.1, M.sub.2, M.sub.3=monovalent to trivalent metal ions different from each other), or a substance represented by CaYAl.sub.3O.sub.7 which is doped with Eu.sup.2+.
19: The charged particle detection material according to claim 11, characterized in that: the charged particles are electrons; and an electric field applied to the charged particles is lower than a voltage calculated by Paschen's law.
20: The charged particle detection material according to claim 16, characterized in that: the charged particles are electrons; and an electric field applied to the charged particles is lower than a voltage calculated by Paschen's law.
21: The charged particle detection material according to claim 11, characterized in that the charged particle detection material is used in a non-vacuum state.
22: The charged particle detection material according to claim 12, characterized in that the charged particle detection material is used in a non-vacuum state.
23: The charged particle detection material according to claim 16, characterized in that the charged particle detection material is used in a non-vacuum state.
24: The charged particle detection material according to claim 21, characterized in that the non-vacuum state is under a pressure within a range of 10.sup.3 to 10.sup.5 Torr.
25: The charged particle detection material according to claim 22, characterized in that the non-vacuum state is under a pressure within a range of 10.sup.3 to 10.sup.5 Torr.
26: The charged particle detection material according to claim 23, characterized in that the non-vacuum state is under a pressure within a range of 10.sup.3 to 10.sup.5 Torr.
27: A charged particle detection film including the charged particle detection material according to claim 11.
28: A charged particle detection film including the charged particle detection material according to claim 16.
29: A charged particle detection liquid including the charged particle detection material according to claim 11.
30: A charged particle detection liquid including the charged particle detection material according to claim 16.
Description
BRIEF DESCRIPTION OF DRAWINGS
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DESCRIPTION OF EMBODIMENTS
[0084] A charged particle detection material according to the present invention detects emission of charged particles from a charged particle-emitting part or incidence of charged particles to a charged particle incident part.
[0085] Herein, the charged particle-emitting part and the charged particle incident part are not particularly limited as long as the charged particles can be emitted from or can enter a surface, respectively, when applying an electric field between the charged particle-emitting part and the charged particle incident part by applying voltages to them. Typical examples of substances constituting the charged particle-emitting part and the charged particle incident part include, but are not limited to: a conductor like a metal having a high electric conductivity such as tungsten, stainless steel, gold, silver and copper; a semiconductor such as silicon; and an insulator such as ceramics, polymer and resin. For example, when the charged particles are electrons, the charged particle-emitting part can be exemplified by aluminum or the like, and the charged particle incident part can be exemplified by vinyl chloride or the like.
[0086] Embodiments of ad charged particle detection system using a charged particle detection material according to the present invention will be explained below with reference to the accompanying drawings. Note that the present invention is not limited to the following embodiments.
Embodiment 1
[0087] A configuration will be explained, in which a charged particle detection film including a charged particle detection material containing at least one of a fluorescent substance, a luminescent substance, an electroluminescent substance, a fractoluminescent substance, a photochromic substance, a afterglow substance, a photostimulated luminescent substance and a mechanoluminescent substance is formed on surfaces of a charged particle-emitting part and a charged particle incident part, and when an electric field is applied between the charged particle-emitting part and the charged particle incident part, charged particles (e.g. N.sup.+, N.sup., electrons, etc.) caused by ionizing a gas around the electrode are emitted from the charged particle-emitting part and enter the charged particle incident part.
[0088]
[0089] A charged particle detection film 21 including a charged particle detection material containing a substance such as the above-described fluorescent substance is provided on the upper surface of the charged particle incident part 20 disposed below the charged particle-emitting part 10.
[0090] Herein, the charged particle detection film 21 provided on the surface of the charged particle incident part 20 is not particularly limited as long as it includes the charged particle detection material containing at least one of the above-described substances. The charged particle detection film 21 may be prepared by homogeneously mixing e.g. an epoxy resin or an urethane resin, a curing agent and a solvent for controlling crosslinking/curing reaction of these resins, the above-described substances, and a dispersant/adjuvant for homogeneously dispersing the substances, and applying/curing this mixture on the surface of the charged particle incident part 20. The concentration (weight ratio) of the above-described substances contained in the charged particle detection film 21 is not particularly limited, but a range of 20 to 80 wt % is preferable because light emission can be visually confirmed, and a range of 50 to 70 wt % is more preferable because light emission can be visually confirmed more obviously.
[0091] The DC high-voltage generator is not particularly limited as long as it can apply a predetermined electric field (generate a potential difference) between the charged particle-emitting part 10 and the charged particle incident part 20, and a commercial product may be used. The intensity of the electric field between the charged particle-emitting part 10 and the charged particle incident part 20 is also not particularly limited, but a range of 1 to 3000 V/mm is preferable because low-energy charged particles which have been unobservable by the conventional observation method can be easily detected in real time, and a range of 22 to 1000 V/mm is more preferable because the low-energy charged particles can be more easily detected.
Example 1
[0092] Stainless steel was used as the charged particle-emitting part 10, an aluminum foil was used as the charged particle incident part 20, and a mixture of a mechanoluminescent substance SrAl.sub.2O.sub.4:Eu.sup.2+ and photocurable acrylic resin (made by MICROJET Corporation) (weight ratio of SrAl.sub.2O.sub.4:Eu.sup.2+ is 70%) was applied and cured to use it as a charged particle detection film 21 (about 100 m in thickness) formed on the surface of the charged particle incident part 20. The DC high-voltage generator was operated in air at 1 atm, humidity of 30% and temperature of 10 C. so as to apply an electric field (100 to 800 V/mm) between the charged particle-emitting part 10 and the charged particle incident part 20 (10 mm). The result is shown in a figure.
[0093] As shown in
[0094] It was confirmed that the same experiment in air at 1 atm, 80% humidity and 80 C. resulted in light emission in a similar manner. Furthermore, it was confirmed that the same experiment in a state where the pressure inside the container housing the charged particle-emitting part 10 and the charged particle incident part 20 was reduced to 10.sup.3 Torr by a rotary pump resulted in light emission in a similar manner.
[0095] Next, as shown in
[0096] It was found that a luminescent part P3 was located under the aluminum foil before inserting the charged member 30 as shown in
[0097] Note that it was found that when the charged member 30 was pulled from between the charged particle-emitting part 10 and the charged particle incident part 20, the luminescent part P3 returned to the position before inserting the charged member 30 as shown in
[0098] From the above, it was found that the negatively-charged particles moved from the charged particle-emitting part 10 toward the charged particle incident part 20. Herein, the movement of the charged particles is considered to include not only a phenomenon that specific charged particles such as N.sup. and electrons directly move from the charged particle-emitting part 10 to the charged particle incident part 20, but also a phenomenon that some charged particles continuously push other charged particles like a chain-reaction collision, and as a result, the charged particles seem to move from the charged particle-emitting part 10 to the charged particle incident part 20. Furthermore, it is considered that the movement also includes a phenomenon that the gas molecules around the charged particle-emitting part 10 are ionized and move to the charged particle incident part 20 so that the charged particles seem to move from the charged particle-emitting part 10 to the charged particle incident part 20, is also included.
[0099] Charged particle detection films respectively containing similar mechanoluminescent substances SrAl.sub.2O.sub.4:Ho.sup.3+, Ce.sup.3+; CaYAl.sub.3O.sub.7:Eu.sup.2+; or SrAl.sub.2O.sub.4:Eu.sup.2+, Cr.sup.3+, Nd.sup.3+ instead of SrAl.sub.2O.sub.4:Eu.sup.2+ were prepared, and subjected to the same test. The test results are shown in
[0100] Furthermore, a test result when changing the polarity of the electrode in Example 1 is shown in
Example 2
[0101] In Example 1, the charged particle detection film including the charged particle detection material was formed on the surface of the charged particle incident part, but the present invention is not limited thereto. In this example, the same charged particle detection film (about 100 m in thickness) as the charged particle detection film used in Example 1 was formed on a surface of a cylindrical rod made of stainless steel. Then, a human hand was moved while a voltage was applied to the rod so as to apply an electric field between the rod and the human hand. The result is shown in a figure.
[0102]
[0103] Herein, since the potential of the human hand was lower than the potential (voltage) applied to the rod, it was found that the charged particles were emitted from the rod (charged particle-emitting part) toward the human hand (charged particle incident part).
Example 3
[0104] Examples 1 and 2 were explained using the charged particle detection film containing the mechanoluminescent substance as the charged particle detection material, but the charged particle detection material according to the present invention is not limited thereto. In this example, a charged particle detection film (about 100 m in thickness) containing SrAl.sub.2O.sub.4:Eu.sup.2+, Dy.sup.3+ as an afterglow substance instead of the mechanoluminescent substance SrAl.sub.2O.sub.4:Eu.sup.2+ was used. Then, an electric field (100 to 800 V/mm) was applied between the charged particle-emitting part 10 and the charged particle incident part 20 (gap distance: 10 mm) by activating the DC high-voltage generator in the same manner as in Example 1. The result is shown in a figure.
[0105] As shown in
[0106] As described above, it was found that emission of the charged particles or incidence of the charged particles could be easily detected in real time similarly to Examples 1 and 2 by using the charged particle detection material containing the afterglow substance and the charged particle detection film including the material. In addition, it was found that even charged particles which were generated by a discharge phenomenon caused in an extremely weak electric field (low potential difference, low energy) and had been unobservable by the prior art could be easily detected in real time by using the charged particle detection material according to the present embodiment.
Example 4
[0107] In this example, a charged particle detection film (about 50 m in thickness) containing Y.sub.2O.sub.2S:Tb.sup.3+ as a fluorescent substance instead of the mechanoluminescent substance SrAl.sub.2O.sub.4:Eu.sup.2+ in Example 1 was used. Then, a voltage (7 kV) was applied between the charged particle-emitting part and the charged particle incident part (gap distance: 10 mm) by activating the DC high-voltage generator in the same manner as in Example 1. The result is shown in
[0108] As shown in
[0109] As described above, it was found that emission of the charged particles or incidence of the charged particles could be easily detected in real time similarly to above-described Example 1 by using the charged particle detection material containing the fluorescent substance and the charged particle detection film including the material. In addition, it was found that even charged particles which were generated by a discharge phenomenon caused in an extremely weak electric field (low potential difference, low energy) and had been unobservable by the prior art could be easily detected in real time by using the charged particle detection material according to the present embodiment.
Example 5
[0110] In this example, a charged particle detection film (about 50 m in thickness) containing methyl salicylate as a fractoluminescent substance instead of the mechanoluminescent substance SrAl.sub.2O.sub.4:Eu.sup.2+ in Example 1 was used. Then, the result of a test under similar conditions to those in Example 1 is shown in
[0111] As shown in
Example 6
[0112] In this example, a fractoluminescent substance Eu(TTA).sub.3phen ([1,10-phenanthroline) tris [4,4,4-trifluoro-1-(2-thienyl)-1,3-butanedionato]europium(III)]) was used as a charged particle detection material instead of the mechanoluminescent substance SrAl.sub.2O.sub.4:Eu.sup.2+ in Example 1. Then, the result of a test under similar conditions to those in Example 1 is shown in
[0113] As shown in
Example 7
[0114] In this example, a charged particle detection films (about 50 m in thickness; weight ratio of the afterglow substance: 70%) respectively containing SrAl.sub.2O.sub.4:Eu.sup.2+, Dy.sup.3+ and -Zn.sub.3(PO4).sub.2:Mn, Ga as the fluorescent substances instead of the mechanoluminescent substance SrAl.sub.2O.sub.4:Eu.sup.2+ in Example 1 was used. Then, a voltage (10 kV) was applied between the charged particle-emitting part and the charged particle incident part (gap distance: 10 mm). The result is shown in
[0115] As shown in
Embodiment 2
[0116] Although Embodiment 1 was intended to detect the charged particles by forming the charged particle detection film including the charged particle detection material on the surface of the charged particle-emitting part 10 or the charged particle incident part 20, the present invention is not limited to this embodiment.
[0117] For example, the charged particle detection material can be configured using a transparent/translucent material like glass or acrylic resin containing at least one of a fluorescent substance, a luminescent substance, an electroluminescent substance, a fractoluminescent substance, a photochromic substance, an afterglow substance, a photostimulated luminescent substance and a mechanoluminescent substance.
[0118] When the charged particles are made to enter the charged particle detection material, the surface or the inside of the glass or the like emits light, and it is also possible to detect the depth of incidence of the charged particles inside of the glass or the like.
Embodiment 3
[0119] Although the above-described embodiment was intended to detect the charged particle by forming the charged particle detection film including the charged particle detection material containing the mechanoluminescent substance and the like, the present invention is not limited to this embodiment. For example, a mechanoluminescent substance (powder) may be used as it is as the charged particle detection material.
[0120]
[0121] In addition, a luminescent sheet prepared using the charged particle detection material may be used instead of the mechanoluminescent substance (powder), in which a fine particle made of the mechanoluminescent substance and the like is dispersed.
[0122]
Embodiment 4
[0123] In the above-described embodiment, the charged particle detection film including the charged particle detection material was formed on the charged particle-emitting part or the charged particle incident part having a certain thickness, but the present invention is not limited to this embodiment. For example, the same charged particle detection film as used in Example 1 may be formed on an aluminum foil.
[0124] In addition, the charged particle detection material may be dispersed in e.g. a nonwoven fabric or the like.
Embodiment 5
[0125] Although the above-described embodiment was intended to detect the charged particles using the charged particle detection film or the charged particle detection material, the present invention is not limited to this embodiment. For example, the charged particles may be detected by using a charged particle detection liquid prepared by dispersing a charged particle detection material in a liquid.
[0126] Charged particles entering a measurement object having a complicated shape can be easily visualized by using the charged particle detection liquid. In addition, the charged particle detection material is three-dimensionally dispersed in the charged particle detection liquid so that the trajectory of the charged particles moving in the liquid can be visualized.
Example 8
[0127] A charged particle detection liquid was prepared, in which a mechanoluminescent substance SrAl.sub.2O.sub.4:Eu.sup.2+ (made by Sakai Chemical Industry Co., Ltd.) was dispersed in a transparent photocurable acrylic resin (VisiJet CR-CL, made by 3D Systems Corporation) (weight ratio of SrAl.sub.2O.sub.4:Eu.sup.2+: 70%). Then this charged particle detection liquid was dropped onto the stainless steel plate to form a puddle, to which the charged particles were made to enter from above in the same manner as in Example 1. The result is shown in
[0128] As a result, as shown in
[0129] Next, this liquid mixture was irradiated with ultraviolet ray at 365 nm (0.7 mW/cm.sup.2) for 10 minutes to cure only the surface of the charged particle detection liquid and then the charged particles were made to enter the surface similarly to the above. The result is shown in
OTHER EMBODIMENTS
[0130] If the charged particle detection material can be three-dimensionally dispersed in a gas such as air similarly to the above-described charged particle detection liquid, the trajectory of the charged particles moving in the gas can be detected.
[0131] It should be noted that this application claims priority based on Japanese Patent Application No. 2016-149215 filed on Jul. 29, 2016, and the content of this application is incorporated herein as a reference.
REFERENCE NUMERALS
[0132] 1 charged particle detection system [0133] 10 charged particle-emitting part [0134] 20 charged particle incident part [0135] 21 charged particle detection film [0136] 30 charged member [0137] P, P2, P3 luminescent part