Carrier for temporary bonded wafers
10354905 · 2019-07-16
Assignee
Inventors
Cpc classification
B22F7/004
PERFORMING OPERATIONS; TRANSPORTING
B22F3/002
PERFORMING OPERATIONS; TRANSPORTING
B22F2999/00
PERFORMING OPERATIONS; TRANSPORTING
B32B15/01
PERFORMING OPERATIONS; TRANSPORTING
H01L2221/68381
ELECTRICITY
B22F3/11
PERFORMING OPERATIONS; TRANSPORTING
B22F7/004
PERFORMING OPERATIONS; TRANSPORTING
B32B15/14
PERFORMING OPERATIONS; TRANSPORTING
H01L2221/68318
ELECTRICITY
B22F2999/00
PERFORMING OPERATIONS; TRANSPORTING
B24B37/30
PERFORMING OPERATIONS; TRANSPORTING
B22F3/11
PERFORMING OPERATIONS; TRANSPORTING
International classification
B22F3/11
PERFORMING OPERATIONS; TRANSPORTING
B22F7/00
PERFORMING OPERATIONS; TRANSPORTING
B32B15/04
PERFORMING OPERATIONS; TRANSPORTING
B32B15/14
PERFORMING OPERATIONS; TRANSPORTING
B24B37/30
PERFORMING OPERATIONS; TRANSPORTING
B32B15/01
PERFORMING OPERATIONS; TRANSPORTING
Abstract
Carrier onto which a wafer can be temporarily bonded. The carrier comprises a plate shaped laminate. The plate shaped laminate comprises a first layer. The first layer comprises a metal foil or a metal sheet. The plate shaped laminate comprises a second layer comprising a porous metal medium with three-dimensional open pores. The porous metal medium comprises metal fibers. The first layer is permanently bonded to the porous metal medium thereby closing the pores of the porous metal medium at the side where the first layer is located.
Claims
1. Carrier onto which a wafer can be temporarily bonded, wherein the carrier comprises a plate shaped laminate, the plate shaped laminate comprises: a first layer, wherein the first layer comprises a metal foil or a metal sheet; and a second layer comprising a porous metal medium with three-dimensional open pores; wherein the porous metal medium comprises metal fibers; wherein the first layer is permanently bonded to the porous metal medium thereby closing the pores of the porous metal medium at the side where the first layer is located.
2. Carrier as in claim 1, wherein the first layer comprises the same metal or alloy as the porous metal medium.
3. Carrier as in claim 1, wherein said porous metal medium comprises stainless steel, titanium, palladium or tungsten; or comprises alloy comprising for more than 50% by weight of titanium, palladium or tungsten.
4. Carrier as in claim 1, wherein the first layer is permanently bonded to the porous metal medium by means of metallic bonds.
5. Carrier as in claim 1, wherein the first layer is permanently bonded to the porous metal medium by means of an adhesive.
6. Carrier as claim 1, wherein the porosity of the porous metal medium is between 30 and 80%.
7. Carrier as in claim 1, wherein the equivalent diameter of the metal fibers is between 2 and 50 m.
8. Carrier as in claim 1, wherein the porous metal medium has a surface for being bonded onto a wafer, wherein this surface is parallel with the first layer; and wherein this surface is polished so that the carrier has a total thickness variation (TTV) less than 10 m.
9. Carrier as in claim 1, wherein the porous metal medium comprises a first porous layer and a second porous layer, wherein the first porous layer is provided between the first layer and the second porous layer; and wherein the porosity of the first porous layer is higher than the porosity of the second porous layer.
10. Carrier as in claim 1, wherein the second layer comprises a contact layer for being bonded onto a wafer, wherein the contact layer comprises a mixture of metal fibers and metal powder, wherein the metal fibers and the metal powder are permanently bonded to each other at their contacting points.
11. Carrier as in claim 1, wherein the side edges of the porous metal medium are permanently sealed so that no open pores are present at the side edges of the porous metal medium.
12. Assembly of a wafer and a carrier as in claim 1, wherein the wafer is bonded onto said second layer by means of an adhesive.
13. Method for the processing of wafers, comprising the steps of temporarily adhering a wafer to a carrier as in claim 1 by means of an adhesive, processing the wafer temporarily adhered to the carrier; debonding the wafer from the carrier, by means of a debonding liquid breaking up the temporary adhesive bond between the wafer and the carrier; wherein the debonding liquid penetrates into the porous metal medium from the side edges of the assembly of the wafer bonded by means of adhesive to the carrier.
Description
BRIEF DESCRIPTION OF FIGURES IN THE DRAWINGS
(1)
(2)
(3)
MODE(S) FOR CARRYING OUT THE INVENTION
(4)
(5)
(6)
(7) Preferably, the metal foil or metal sheet and the metal fibers of both sintered nonwoven metal fiber webs are out of the same metal or alloy. The nonwoven metal fiber webs 322, 324 are permanently bonded to each other and to the first layer 310, e.g. by means of an adhesive (e.g. an epoxy adhesive); or by means of sintering or by means of welding (e.g. capacity discharge welding).
(8) Instead of one or both of the nonwoven metal fiber webs, sintered porous powder layers and/or metal foam layers can be used for the first porous layer and/or for the second porous layer.
(9)
(10) An alternative method for creating the sealing edges is by machining a plate so that the upstanding edges are created. The porous metal medium is then inserted in the cup that is created by the machining. Subsequently, bonding of the porous metal medium onto the first layer is performed. When a temporary bonded wafer is to be debonded from this carrier, initially no wicking of the debonding liquid occurs in the porous metal medium and initial debonding happens on the thin layer of adhesive between the carrier and the wafer. When this thin adhesive layer is broken down, the debonding speed increases by having an increased wicking of the debonding liquid in the porous metal medium through the openings created by dissolving the glue layer at the edge.
(11)
(12) Preferably, the metal foil or metal sheet, the metal fibers and the metal powder are out of the same metal or alloy.
(13) The different layers are permanently bonded to each other by means of sintering or by means of welding (e.g. capacity discharge welding). Instead of the nonwoven metal fiber web as additional layer, sintered porous powder layers and/or metal foam layers can be used.
(14)
(15) As an example of the invention, a carrier has been made. The carrier comprises a 100 m thick titanium foil and a porous nonwoven titanium fiber medium of 600 m thickness. The carrier has a total thickness of 700 m. The nonwoven titanium fiber medium was sintered directly onto the titanium foil; and is a fiber sheet of 22 m diameter fibers with a density 1000 g/m.sup.2, meaning 56% porosity.
(16) As an example of the invention, a carrier has been made. The carrier comprises a 100 m thick titanium foil and a porous nonwoven titanium fiber medium of 600 m thickness. The porous metal medium comprises a first porous layer and a second porous layer. The first porous layer comprises titanium fibers of 22 m equivalent diameter and has 74 m thickness. The second porous layer comprises titanium fibers of 14 m equivalent diameter and has 526 m thickness.
(17) As an example of the invention, a carrier has been made having a first layer out of a 150 m thick titanium foil. A nonwoven titanium fiber medium of 500 g/m.sup.2 consisting out of titanium fibers of 22 m equivalent diameter and 14 mm fiber length was sintered onto the titanium foil, thereby establishing sinter bonds between contacting titanium fibers on the one hand; and between the titanium fibers and the titanium foil on the other hand, resulting in a total thickness 400 m of the structure. The porosity of the porous layer was 56%. The surface of the carrier to be bonded onto a wafer can be polished below a total thickness variation (TTV) of the carrier of 10 m.
(18) A150 mm by 150 mm square sized carrier has been temporarily glued using a standard available silicon based adhesive to a glass substrate of the same size. The glass substrate simulates a wafer. Immersing the solution in a debonding liquid (Daeclean 300a commercially available solvent system for removal of cured siliconewas used) showed proper debonding by wicking of the debonding liquid inside the titanium medium from the side edges of the carrier. The wicking could be followed by visual observation through the glass plate. The debonding liquid fully wicked inside the porous metal medium in a short time period of 2 minutes 40 seconds, resulting in fully debonding the carrier from the glass plate. It will be clear to the skilled person that in the same way as a metal fiber nonwoven web, a sintered metal powder layer or metal foam can be used as porous metal medium. However, metal fiber nonwovens are preferred because, due to the elongated shape of the fibers, a different pore size is obtained which is believed to optimize wicking.
(19) Preferably, the carrier is provided such that when applying a pressure of 4 bar onto it, the permanent deformation of the carrier is less than 5% of its original thickness before applying the pressure. This can be tested by measuring the thickness of the carrier before and after applying a pressure of 4 bar during a time period of 20 seconds. A carrier according to this embodiment can be made by prepressing the carrier or the porous metal layer or porous metal layers in it so that future permanent deformation is limited. Such embodiments surprisingly synergistically improve the properties of the wafer after its processing (e.g. thinning) while being temporarily adhered to the carrier.