ROTOR DEFLECTION MONITORING SYSTEM

Abstract

A system and method for measuring the deflections of a test object, such as a rotor or machine shaft. The system includes at least one probe/input circuit assembly in communication with a Host Data Manager. The at least one probe sensor one probe/input circuit assembly comprising a probe sensor and input circuit. The probe sensor having an ultrasonic speaker and an ultrasonic microphone. The probe sensor includes a temperature and relative humidity sensor. The input circuit comprising a microcomputer that generates deflection analysis data, and probe health diagnostics. The Host Data Manager in communication with at least one probe sensor one probe/input circuit assembly providing modal analysis.

Claims

1. A system for measuring rotor deflection of a rotor shaft including: a first probe senor for measuring rotor deflection of said rotor shaft and a data manager; said first probe sensor having an ultrasonic speaker positioned in a first opening; said first probe sensor having an ultrasonic microphone positioned in a second opening; said first probe sensor in communication with a first digital circuit; said first digital circuit measuring a rotor deflection data, wherein said first probe sensor and said first digital circuit measuring said rotor deflection of said rotor shaft; and said first digital circuit in communication with said data manger; wherein pulsed measurement counts are at least one of measured and calculated by said first digital circuit, and communicated to said data manager.

2. The system of claim 1 wherein said first probe sensor further includes a temperature and humidity sensor, wherein said temperature and humidity sensor provides for a self-calibration.

3. The system of claim 1 further including said system is a digital system.

4. The system of claim 1 further provides for an incident sound wave having at least one of at least substantially a 25 KHz frequency and at least substantially a 40 KHz frequency.

5. The system of claim 4 further provides for said incident sound wave having a frequency range from 25 KHz to 40 KHz.

6. The system of claim 1 further including said first digital circuit configured for measuring said rotor deflection and to perform a probe health diagnostics.

7. The system of claim 6 wherein said first digital circuit is configured to transmit said rotor defection data and a probe health diagnostics data via a serial digital network.

8. The system of claim 7 wherein said host data manager polls said rotor deflection data and said probe health diagnostics data.

9. The system of claim 1 wherein said host data manager polls said rotor deflection data.

10. The system of claim 1 wherein said host data manager performs a modal analysis.

11. The system of claim 1 wherein said system having a zero-phase pulse.

12. A method for measuring a rotor deflection of a rotor shaft including: providing a first probe senor for measuring a rotor deflection of said rotor shaft and a data manager; transmitting an ultrasonic signal from a ultrasonic speaker housed within a first probe sensor first opening; reflecting said ultrasonic signal from said rotor shaft as a reflected ultrasonic signal to an ultrasonic microphone housed within a first probe sensor second opening; transmitting said reflected signal to a first digital circuit; said first digital circuit performing a deflection analysis, wherein said first digital circuit performing at least one of measuring and calculating deflection of said rotor shaft; and transmitting said deflection analysis to a data manager.

13. The method of claim 12 further including applying corrections from a temperature and humidity compensation sensor to said reflected ultrasonic signal, compensating for a gain.

14. The method of claim 12 further including said first digital circuit performing at least one of measuring and calculating said rotor deflection and a probe health diagnostics, which comprise said deflection analysis.

15. The method of claim 14 further including wherein said first digital circuit transmitting a rotor defection data and a probe health diagnostics data via a serial digital network.

16. The method of claim 15 further including said host data manager polling said rotor deflection data and said probe health diagnostics data.

17. The method of claim 12 further including said host data manager polling said deflection analysis.

18. The method of claim 12 further including said host data manager performing a modal analysis.

19. The method of claim 18 further including comparing first and second modal deflections.

20. The method of claim 12 further including producing warnings for said rotor shaft proximity with at least one of stationary lands and stationary seals.

Description

BRIEF DESCRIPTION OF THE DRAWINGS

[0026] FIG. 1 is a view illustrating a sensor and input circuit of a system according to the present invention, the sensor positioned to measure deflections of a test object.

[0027] FIG. 2 is a perspective view of the sensor illustrated in FIG. 1.

[0028] FIG. 3 is a top planar view of the sensor illustrated in FIGS. 1 and 2.

[0029] FIG. 4 is an end view of the sensor illustrated in FIGS. 1-3.

[0030] FIG. 5 is a partial cut away and cross sectional view of the sensor illustrated in FIGS. 1-4, taken along lines 5-5 of FIG. 2, and showing an ultrasonic speaker and an ultrasonic microphone.

[0031] FIG. 6 is a view similar to that of FIG. 5, but showing the sensor positioned to measure the deflections of the test object.

[0032] FIG. 7 is a view similar to that of FIG. 6, but showing the sensor measuring the deflections of the test object.

[0033] FIG. 8 is a block diagram of an input circuit of the system according to the present invention.

[0034] FIG. 9A is a graphical illustration of a phase offset between a reflected waveform and an incidence waveform, illustrating at least substantially minimal deflection in the test object.

[0035] FIG. 9B is a graphical illustration of a phase offset between a reflected waveform and an incidence waveform illustrating deflection in the test object in a direction of the sensor.

[0036] FIG. 9C is a graphical illustration of a phase offset between a reflected waveform and an incidence waveform illustrating deflection in the test object in a direction opposite the sensor.

[0037] FIG. 10 is a diagram of the system of the present invention applying multiple sensors used in a network for rotor deflection detection.

[0038] FIG. 11 is a polar vector graphical display identifying a 1.sup.st Mode deflection and a 2.sup.nd Mode deflection of the test object.

[0039] FIG. 12 is a graphical illustration of the 1.sup.st Mode deflection of the test object.

[0040] FIG. 13 is a graphical illustration of the 2.sup.nd Mode deflection of the test object.

[0041] FIG. 14 is a graphical illustration of a comparison of combined 1.sup.st and 2.sup.nd Mode deflections of the test object to internal seal clearances of the test object.

DESCRIPTION OF THE PREFERRED EMBODIMENT

[0042] Although the disclosure hereof is detailed and exact to enable those skilled in the art to practice the invention, the physical embodiments herein disclosed merely exemplify the invention which may be embodied in other specific structures. While the preferred embodiment has been described, the details may be changed without departing from the invention, which is defined by the claims.

[0043] With reference to FIGS. 1, 2 and 10, a system 2 having at least one probe/input circuit assembly 10, Host Data Manager 110 according to the present invention may be seen. As shown in FIG. 10, the system 2 provides a device and method adapted to measure the deflection of a test object, rotor, 14, such as a machine shaft or other rotating object.

[0044] As seen in FIGS. 1 and 2, the probe/input circuit assembly 10 includes a probe sensor 12 having a housing 16, an extension tube support 18, and a input circuit 20. As seen in FIG. 2, a probe sensor 12 for use with the probe/input circuit assembly 10 preferably includes an ultrasonic speaker 22 and an ultrasonic microphone 24. The probe sensor 12 may further include a temperature and relative humidity sensor 26, as will be discussed (see FIG. 5). FIGS. 3 and 4 illustrate top and end views, respectively, of the probe sensor 12 shown in FIGS. 1 and 2.

[0045] With attention now to the cross sectional view of FIG. 5, the sensor 12 with the ultrasonic speaker 22 and ultrasonic microphone 24 are seen as preferably fitted into the housing 16. The housing is a molded housing 15. The housing 16 includes cradle openings 28 and foam isolation jackets 30 to attenuate the incident frequency conduction in the housing 16. An extension tube 18 channels component wiring 32 to an input circuit 20 (see FIG. 8), as will be discussed. The extension tube 18 may be of any length necessary for the specific application, and is determined by the particular requirements of the housing 16 and test object, rotor, 14 (see FIG. 6). As shown, the probe/input circuit assembly 10 uses a fixed alignment ultrasonic speaker 22 and ultrasonic microphone 24, each placed at a fixed distance D2 (31) (see FIG. 6) from the test object 14.

[0046] As mentioned, the sensor 12 preferably includes a temperature and relative humidity sensor 26. The temperature and relative humidity sensor 26 detects and compensates for temperature and relative humidity in the volume of air 29 along the distance D1 (27), since the ambient temperature and relative humidity in the volume of air along the distance D1 (27) affects the speed of sound by up to 25% in the application (e.g. turbine monitoring) atmosphere. It is noted, the distance D1 (27) is a distance from at least one of an ultrasonic speaker face 111 and an ultrasonic microphone face 115. Wherein at least one of the ultrasonic speaker face 111 and the ultrasonic microphone face 115 is positioned at least one of towards the test object, rotor, 14 and in a test object direction 117 allowing for transmission of continuous ultrasonic acoustical carrier signal 38 from the ultrasonic speaker 22 and receipt of the reflected wave 36 by the ultrasonic speaker 24. Since detection is through timing, the measurements of temperature and relative humidity correct the timing counts of the probe/input circuit assembly 10. Further since detection is through timing only and the measurements of temperature and relative humidity correct the timing counts of the probe/input circuit assembly 10, calibration of the probe/input circuit assembly 10 as to the metallurgy is not required as in eddy current proximity probes.

[0047] As seen particularly in FIGS. 6 and 7, the ultrasonic microphone 24 of the probe/input circuit assembly 10 is preferably positioned in exact coincidence with the opposite direction of the reflected ultrasonic waves 36. As shown in FIG. 6, a preferred position is a fixed 30 degree incidence and 30 degree reflection positioning of the ultrasonic speaker 22 and ultrasonic microphone 24. The probe 12 is further preferably positioned a predetermined distance D2 (31), from the target test object 14. As illustrated in FIG. 7, the distance D2 (31) of the probe 12 to the test object 14, provides for the distance D1 (27) from the ultrasonic speaker 22 to test object 14 and the distance D1 (27) from ultrasonic microphone 24 to the test object 14. Preferably, distance D1 (27) equates to a distance from of an inch up to and including 1 inches. Alternatively, the distance D1 (27) equates less than of an inch. Alternatively, the distance D1 (27) equates to more than 1 inches. Further, the probe 12 targets a surface area (not illustrated in the figures) of the test object, rotor, 14 wherein the target surface area (not illustrated in the figures) of the test object is of a size (not illustrated in the figures) to minimize effects of anomalies on the test object surface 149. The probe 12 preferably targets a surface area (not illustrated in the figures) of the test object, rotor, 14 wherein the target surface area (not illustrated in the figures) of the test object is at least substantially a 1-inch diameter circle. Alternatively, the probe 12 preferably targets a surface area (not illustrated in the figures) of the test object, rotor, 14 wherein the target surface area (not illustrated in the figures) of the test object is less than a 1-inch diameter circle. Alternatively, the probe 12 preferably targets a surface area (not illustrated in the figures) of the test object, rotor, 14 wherein the target surface area (not illustrated in the figures) of the test object is greater than a 1-inch diameter circle. The minimization of the effect of the anomalies on the test object surface 149 results because the elastic properties of air smooth anomalies in the test object surface 149 within -inch of reflection.

[0048] In use, and as shown in FIG. 7, the ultrasonic speaker 22 transmits a continuous ultrasonic acoustical carrier signal 38, an incidence wave 35, in a first preferred embodiment preferably a 25.000 KHz (+/200 Hz) incidence wave frequency, toward the test object 14 in the direction A (39). The ultrasonic speaker 22 transmits a continuous ultrasonic acoustical carrier signal 38, an incidence wave 35, in a second preferred embodiment preferably a 40.000 KHz (+/200 Hz) incidence wave frequency, toward the test object 14 in the direction A (39). Alternatively, the ultrasonic speaker 22 transmits a continuous ultrasonic acoustical carrier signal 38, an incidence wave 35, in a incidence wave frequency range from 20.000 KHz (+/200 Hz) to 45.000 KHz (+/200 Hz), toward the test object 14 in the direction A (39). Prior art devices for measuring blood flow apply a high incidence wave frequency, in the range of 200.000 KHz. A 200.000 KHz incidence wave frequency would cause the distance D1 (27) to be reduced in dimension such that an operator could not adjust the distance D1 (27) accurately. The ultrasonic speaker 22 transmits a continuous ultrasonic acoustical carrier signal 38, incidence wave 35. The continuous ultrasonic acoustical carrier signal 38, incidence wave 35, strikes the test object, rotor, 14. The incidence wave 35 is reflected off the test object, rotor, 14 and travels in the direction B (43) towards the ultrasonic microphone 24. The reflected wave 36 is received by the ultrasonic microphone 24.

[0049] As shown in FIGS. 7 and 8, the continuous ultrasonic acoustical carrier signal 38 is internally generated at an adjustable rate from an output capture pin 48 on the microcomputer 56. The carrier signal generated by the output capture pin 48 is converted to a sine wave by a pulse shaper circuit 50 before speaker output 76 transmission through the ultrasonic speaker 22. As previously mentioned, the probe/input circuit assembly 10, and the system 2 as a whole, uses in a first preferred embodiment the reflection of the continuous 25.000 KHz frequency (ultrasound) ultrasonic acoustical carrier signal 38, incidence wave 35, to detect immediate displacement, deflection C (45) of the test object, rotor, 14. As previously mentioned, the probe/input circuit assembly 10, and the system 2 as a whole, uses in a second preferred embodiment the reflection of the continuous 40.000 KHz frequency (ultrasound) ultrasonic acoustical carrier signal 38, incidence wave 35, to detect immediate displacement, deflection C (45) of the test object, rotor, 14. As previously mentioned, the probe/input circuit assembly 10, and the system 2 as a whole, uses in an alternative embodiment, the reflection of the continuous ultrasonic acoustical carrier signal 38, incidence wave 35, in the range of 20.000 KHz to 45.000 KHz frequency (ultrasound) to detect immediate displacement, deflection C (45) of the test object, rotor, 14. The transmitted continuous ultrasonic acoustical carrier signal 38, incidence wave 35, is reflected from the test object, rotor, 14 as reflected waves 36 in the direction B (43), and is detected by the ultrasonic microphone 24.

[0050] As shown in FIGS. 9A, 9B and 9C, at any fixed probe distance D2 (32) of the probe sensor 12 from the test object, rotor, 14, the reflected wave 36, received by the ultrasonic microphone 24, will have a reflected waveform 47 at a fixed phase offset 51 from the incidence waveform 53 of the continuous ultrasonic acoustical carrier signal 38, incidence wave 35. The phase offset 51 is the difference 59 between the pulsed time width of the incidence wave form 55, and the pulsed time width of the reflected wave form 57. An immediate displacement C (45) in the rotating test object, rotor, 14 due to rotor deflection will cause the difference 59 between the pulsed time width of the incidence wave form 55, and the pulsed time width of the reflected wave form 57 to increase and decrease. As illustrated in FIG. 9A, where substantially minimal deflection in the test object, rotor, 14 exists at the probe sensor 12, a steady state phase offset 63 exists. As illustrated in FIG. 9B, a deflection in the test object, rotor, 14 away from the probe sensor 12 will result in a waveform differential increase 119 in the difference 59 between the pulsed time width of the incidence wave form 55 and the pulsed time width of the reflected wave form 57 to a second difference 123. As illustrated in FIG. 9C, a deflection in the test object, rotor, 14 towards the probe sensor 12 will result in a waveform differential decrease 121 in the difference 59 between the pulsed time width of the incidence wave form 55 and the pulsed time width of the reflected wave form 57 to a third difference 125.

[0051] As shown in FIG. 8, an output signal from the ultrasonic microphone 24 is then transmitted to an input circuit 20 by way of wiring 32 or other conventional means through microphone input 40. The input circuit 20 is powered by power supply 74. A microcomputer 56 receives temperature and humidity input corrections 25 via a Serial Peripheral Interface link 44 and digitally, within its code, applies the input corrections 25. This retains the system 2 (see FIG. 7) in acceptable calibration at all times, by self-calibration. Due to the application of a digital system noise issues are minimized. Mechanical acoustical isolation, such as the jackets 30 shown (see FIG. 5), are present to reduce any system noise. In regards to self-calibration, any changes in the distance D1 (27) affect only the steady state phase offset 63. Further, the changes are subtracted in real time analysis from the actual deflection of the test object, rotor, 14,

[0052] Measurements counts from the microphone input 40 are sent to the input circuit 20. The input circuit 20 comprises the speaker pulse shaper 50, a microphone pulse shaper 65, an XOR gate 69, a second grouping of digital gates 71, a clock generator 73, a counter 75, and a microcomputer 56. The combination of the speaker pulse shaper 50, the microphone pulse shaper 65, the XOR gate 69, the second grouping of digital gates 71, the clock generator 73, and the counter 75 produce a sequence of immediate differential pulse width measurement counts. The pulse width measurement counts are proportional to the instantaneous distance D1 (27) to the test object, rotor, 14. Preferably, the pulse width measurement counts are proportional to the instantaneous distance D1 (27) to the rotor with an accuracy of at least +/0.0001 inch (+/0.0001 inch and greater accuracy than +/0.0001 inch). Alternatively, the pulse width measurement counts may be proportional to the instantaneous distance D1 (27) to the rotor with an accuracy of less than +/0.0001 inch.

[0053] The speaker output 76 is electrically connected to the speaker pulse shaper 50 via a speaker output/speaker pulse shaper connection 85. The speaker pulse shaper 50 is electrically connected to the XOR gate 69 through a speaker pulse shaper/XOR gate connection 79. The microphone input 40 is electrically connected to the microphone pulse shaper 65 through the microphone input/microphone pule shaper connection 87. The microphone pulse shaper 65 is electrically connected to the XOR gate 69 through a microphone pulse shaper/XOR gate connection 77. The microphone pulse shaper/XOR gate connection and the speaker pulse shaper/XOR gate connection 79 provide the two inputs required for the XOR gate 69. An XOR gate/logic gate connection 89 electrically connects the XOR gate 69 to an AND1 gate 72 of the second grouping of digital gates 71. The XOR gate/logic gate connection 89 is an output for the XOR gate and a subsequent input for the AND1 gate 72. Wherein the XOR output is combined with a microcomputer port control. Speaker pulse shaper/XOR gate connection 79 is in electrical communication with a first intermediate connection 83 at a first connection junction 81. The first junction 81 and an AND2 gate 91 are in electrical connection through the first intermediate connection 83. At a second connection junction 90, along a first intermediate connection length 93 of the first intermediate connection 83, a first NOT gate connection 94 electrically connects the first intermediate connection 83 and a NOT gate 95. The AND2 gate 91 and the microcomputer 56 are electrically connected through the AND2 gate/microcomputer connection 96. The AND2 gate/microcomputer connection 96 and the first intermediate connection 83 provide the input connections to the AND2 gate 91.

[0054] The AND2 gate 91 and the clock generator 73 are electrically connected through the AND2 gate/clock generator connection 97. The AND2 gate/clock generator connection 97 provides for the output from the AND2 gate 91 and an input to the clock generator 73 to enable the clock generator 73.

[0055] A microcomputer/AND1 gate connection 98 provides electrical communication between the microcomputer 56 and the AND1 gate 72. A second NOT gate connection 99 provides for electrical communication between the NOT gate 95 and the AND2 gate/clock generator connection 97, wherein the second NOT gate connection 99 provides for an output from the NOT gate 95. The second NOT gate connection 99 contacts the microcomputer/AND1 gate connection 98 at a third connection junction 100. The microcomputer/AND1 gate connection 98 and the XOR gate/logic gate connection 89 provide the input connections to the AND1 gate 72.

[0056] The AND1 gate 72 is in electrical communication with an AND3 gate 104 through an AND1 gate/AND3 gate connection 102. The clock, generator 73 is in electrical communication with the AND3 gate 104 through a clock generator/AND3 gate connection 101. The AND1 gate/AND3 gate connection 102 and the clock generator/AND3 gate connection 101 provide the inputs into the AND3 gate 104. Wherein the XOR output is combined with a high speed clock, signal from the clock, generator 73. The high speed clock signal is preferably at least substantially 170 MHz. Alternatively, the high speed clock signal may be less than substantially 170 MHz. Alternatively, the high speed clock signal may be more than substantially 170 MHz. The AND3 gate 104 is in electrical communication with the counter 75 through an AND3 gate/counter connection 105. The AND3 gate/counter connection 105 provides for an output from the AND3 gate and an input into the counter 75. The counter 75 is preferably a 12-bit counter (4096 count). Alternatively, the counter 75 may be greater than a 12-bit counter. Alternatively, the counter 75 may be less than a 12-bit counter. The counter 75 measures the pulse width of the differences in the real time waveform of the incidence waveform 53 and the reflected waveform 47. The counter 75 and the microcomputer 56 are in electrical connection the counter/microcomputer connection 106. Where the counter/microcomputer connection 106 provides for transfer of counting displacement date to the microcomputer 56. The counter/microcomputer connection 106 connect to microcomputer input ports 147 for parallel data reads. Internal timing features of the microcomputer adjust a counter sampling rate to each one-degree of shaft turn. Over sampling of five test object, rotor, 14 turns is performed and stored in a memory. The oversampling data is corrected to a bipolar signal by subtracting the DC component from the difference 59.

[0057] It is observed alternative embodiments of the second grouping of digital gates 71 may comprise at least one of an AND gate, an OR gate, a NAND gate, a NOR gate, an XOR gate, a XNOR gate, and a NOT gate to perform the at least one function of the second grouping of digital gates 71 as described in this application.

[0058] Firmware located in the microcomputer 56 performs deflection analysis. The firmware operates on the bipolar deflection signal using a demodulation technique to resolve a data set of the running speed frequency (Hz), (1) peak-to-peak deflection amplitude and phase, the half running speed frequency () peak-to-peak deflection amplitude, the twice running speed frequency (2) peak-to-peak deflection amplitude. The microcomputer 56 uses a buffered, zero-phase pulse 54 transmitted from zero phase probe 84 as a once-per-shaft revolution timing signal reference to generate time-dependent vibration analysis data.

[0059] As illustrated in FIGS. 8 and 10, the microcomputer 56 is in electrical connection with a bus 107 through a microcomputer/bus communication 108. Wherein deflection data is communicated to the bus 107 from the microcomputer 56. The bus 107, and in turn the input circuit 20, is in electrical communication with a communication interface module 140 of the Host Data Manager 110 through a serial digital interface network 109. The communication interface module 140 of the Host Data Manager 110 is in electrical communication with a touch screen PC, industrial computer, 70 of the Host Data Manager 110 through a communications interface module/touch screen PC communication 143.

[0060] Upon query from the Host Data Manager 110, any or all of this deflection data is delivered via the serial digital network 109 to the Host Data Manager 110. The serial communications network 109 comprises at least one serial communications port 60 in communication with an RS-485 connection 78, wherein each at least one serial communications port 60 is in electrical communication with the RS-485 connection 78 through a connection extension 145, wherein the extension connection 145 is a continuation of the RS-485 connection 78. The at least one serial communications port 60 is buffered with a transceiver chip. The serial communications port 60 is in electrical communication with the bus 107. Wherein the serial communications port 60 receives queries from the Host Data manager 110 and transmits the deflection analysis requested to the Host Data Manager 110 by way of at least one of the connection extension 145 and the RS-485 connection 78. The Host Data Manager 110 automatically polls the deflection data from each probe sensor 20 in less than 0.0417 seconds, and stacks the deflection data from multiple probe sensors 20 into one message that is provided to the touch screen PC, industrial computer, 70 at a rate of once per second. The touch screen PC, industrial computer, 70 is equipped with software to provide graphical data displays, diagnostics, and alarms. The data sets from all probes are combined by the communication interface module 140 and sent to the touch screen PC, industrial computer, 70.

[0061] As best shown in FIG. 10, multiple probe/input circuit assemblies 10, the probe sensor 12 and the input circuit 20, can be used together in a network to provide vibration analysis at a variety of locations along a large test object, rotor, 14, such as a large tandem compound turbine-generator. Zero-phase probe 84 provides a timing reference for deflection analysis performed by the input circuit 20. The wiring connection between the probe sensor 12 and input circuit 20 is preferably protected by flexible, armored cable 82 to provide strain relief and adjustable probe sensor 12 placement. Each probe sensor 12 and input circuit 20 of each probe/input circuit assembly 10 is paired with a redundant assembly 112. Wherein there is a primary assembly 116 and a redundant assembly 112 in a paired assembly 114. There is at least one paired assemblies 114 measuring the test object, rotor, 14. It is noted the primary assembly 116 and the redundant assembly 112 of the paired assemblies 114 are located substantially at the same location along a test object length 118, and positioned at a different radial location about a circumference 120 of the test object, rotor, 14. Wherein the primary assembly 116 is located at a first radial location 122 about the circumference 120 and the redundant assembly 112 is located at a second radial location 124 about the circumference 120. It is noted the components of the primary assembly 116 and the redundant assembly 112 incorporate the elements as described in the probe/input circuit assembly 10, which include the probe sensor 12, input circuit 20, and elements of the probe sensor 12 and elements of the input circuit 20.

[0062] The input circuit 20 of at least one of the primary assembly 116 and the redundant assembly 112 of each paired assemblies 114 communicates with communication interface module 140 of the Host Data Manager 110 via the RS-485 connection 78. The communication interface module 140 of the Data Host manager 110 requests and reads polling data much faster than a typical computer USB port. So the use of the communication interface module 140, which stacks all data into one, once per second message, as an intermediary between the input circuits 20 and the touch screen PC, industrial computer, 70, allows up to 32 probes to be used in a single network. Communication interface modules 140 may be employed to raise probe counts of a system in quantities of thirty-two each. The high volume of probe sensors and deflection data gives the user an incredibly accurate sampling of deflection phenomena.

[0063] In the event that at least one of the probe 20 and microcomputer 56 of the primary assembly 116 fails to respond to the Host Data Manager 110 polling data query or receives a failure notice from the microcomputer 56, the redundant assembly 112 of the paired assemblies 114 is polled by the Data Host Manager 110 for deflection data. This eliminates loss of function for a single probe or analyzer failure.

[0064] As illustrated in FIG. 10, the probe sensors 12 of the primary assembly 116 and the redundant assembly 112 are rigidly mounted and located along the test object length 118 in order to maximize model deflection. Thus the probe sensors 12 of the primary assembly 116 and the redundant assembly 112 are distant from the support bearings 153 along the test object length 118.

[0065] As illustrated in FIGS. 10, 11, 12 and 13, the deflection data gathered by the communication interface module 140 of the Host Data Manager 110 is sent to the touch screen PC, industrial computer, 70 through the communications interface module/touch screen PC communication 143. The touch screen PC, industrial computer, 70 performs a modal analysis for each test object, rotor, 14 using the deflection data sets of the test object, rotor, 14. Each rotor end pair of probe data (or redundant spares) is used for the rotor deflection analysis.

[0066] As illustrated in FIG. 11, the modal analysis proceeds as follows. The running speed amplitude and phase vectors (combined as 126) from the primary assembly 116 and redundant assembly 112 of each paired assembly 114 are summed to yield the Static Resultant 128. The original running speed amplitude and phase vectors (combined as 126) have one-half of the Static Resultant 128 magnitudes subtracted, opposite a Static Resultant phase 133, from running speed amplitude and phase vectors (combined as 126) to establish dynamic resultants, DR1 and DR2, 132.

[0067] The Static Resultant 128 identifies a 1.sup.st Mode Magnitude and Phase 127 at the probe sensor 12 finite elements (not illustrated in the figures). A 1st Mode full rotor span deflection is calculated using extrapolation of the rotor end probe sensor 12 longitudinal locations 134 along the test object length 118 and amplitudes to a full set of 100 finite elements between the rotor support bearing 153 centerlines utilizing a 1st Mode deflection curve 135 established based upon the particular rotor bearing span and stiffness. The curve is a 3rd-order polynomial. FIG. 12 illustrates a typical 1st Mode plot.

[0068] The Dynamic Resultants 132 identify a 2.sup.nd Mode Magnitude and Phase 129 at the probe sensor 12 finite elements (not illustrated in the figures). A 2.sup.nd Mode full rotor span deflection is calculated using extrapolation of the rotor end probe sensor 12 longitudinal locations 134 along the test object length 118 and amplitudes to a full set of 100 finite elements between the rotor support bearing 153 centerlines utilizing a 2nd Mode deflection curve 137 established based upon the particular rotor bearing span and stiffness. The curve is also a 3rd-order polynomial. FIG. 13 illustrates a typical 2nd Mode plot.

[0069] A combined 1st Mode and 2nd Mode rotor deflection curve 139 (see FIG. 14) is calculated by one-half the vector sum of the 1st Mode deflection curve 135 and the 2nd Mode deflection curve 137 at each of the 100 finite elements.

[0070] A seal clearance array of values at the same finite element rotor end probe sensor 12 longitudinal locations 134 along the test object length 118 used for the deflection curve generation is pre-assigned to touch screen PC, industrial computer, 70 memory. The source of the seal clearance array of values is the seal clearances measured at a last turbine overhaul inspection.

[0071] Due to the 0.0001 inch vector accuracy of the deflection data, the system may also calculate optimum balance weight installations in test objects, rotors, 14 to minimize operation test object, rotor, 14 deflection.

[0072] As previously noted, the touch screen PC, industrial computer, 70 computes 1.sup.st, as illustrated by the 1st Mode deflection curve 135, and 2.sup.nd modal deflection phases and magnitudes, as illustrated by the 2nd Mode deflection curve 137, of the test objects, rotors, 14. The touch screen PC, industrial computer, 70 further computes the 1.sup.st and 2.sup.nd modal deflection over a set of finite elements over the test object length 128 between support bearings 153, as illustrated by the combined 1st Mode and 2nd Mode rotor deflection curve 139.

[0073] As illustrated in FIG. 14, the touch screen PC, industrial computer, 70 compares the combined 1.sup.st and 2.sup.nd modal element set of combined deflections, as illustrated by the combined 1st Mode and 2nd Mode rotor deflection curve 139, to internal seal clearances of the test objects, rotors, 14 at the longitudinal locations 134 of the finite elements, and provides warning to operators when the deflection is impeding contact with the turbine seals of the test object, rotor, 14 at the 100 finite element longitudinal locations along the test object length 128. If the deflection 138 has consumed 75% of the clearance distance 136 to a clearance limit value 155 at any elements an advisory alarm is generated to caution operators. A second notice is produced if the deflection 138 has consumed 90% of the clearance distance 136 the clearance limit value 155 at any elements. Specifically, the system 2 provides warnings to minimize test object, rotor, 14 contact with stationary seals and rotating seal contact with stationary lands.

[0074] As illustrated in FIG. 10, the touch screen PC, industrial computer, 70 outputs a condensed serial data stream for each probe/input circuit assembly 10 to the Communications Interface Module 140 of the Host Data Manager 110 which maintains a data update with a plant computer or Distributed Control System (DCS) 88 through a Plant computer/Data host manager interface 80 to inform operators. Notices, as described, are displayed on the touch screen PC, industrial computer, 70 and are used by operators to avoid a continuing startup of the turbines through the rotor critical speeds which maximize rotor deflection, by slow rolling the test object, rotors, 14 to reduce deflection.

[0075] The microcomputer 56 also generates diagnostic data such as probe signal loss, carrier frequency loss, and demodulator power loss. Said diagnostic data is sent to the Data Host manager 110 prior to any deflection data to prevent the Data Host Manager 110 from interpreting these events as deflection phenomena in the industrial machine being monitored. This prevents false emergency shutdowns of the monitored machine. Said diagnostic data is delivered via the same serial digital network 109 as said deflection data. By utilizing a polled digital serial data stream, the present system prevents the possibility of introducing transmission noise prior to deflection analysis.

[0076] As shown in FIG. 8, further configuration can be performed by manually toggling a pair of eight-position Dual in-line Package (DIP) switches 64 and 66 which connect to two eight-bit microcomputer ports 68. DIP switches 64 and 66 provide direct manual configuration of the microcomputer 56 by the user. DIP switch 64 provides manual assignment of the engineering units desired for the deflection data output and also provides manual assignment of the direction of shaft rotation. The second DIP switch 66 provides manual input of the serial network drop code and transceiver drop code.

[0077] An intended benefit of the present invention is a monitoring system testing rotor deflection to ensure the turbine rotor contact with stationary seals is minimized and rotating seal contact with stationary lands is minimized.

[0078] An intended benefit of the present invention is a monitoring system testing rotor deflection which measures a large area of the test object minimizing the effect of surface anomalies.

[0079] An intended benefit of the present invention is a monitoring system testing rotor deflection system having a design which minimizes thermal noise levels.

[0080] An intended benefit of the present invention is a monitoring system testing rotor deflection system which is self-calibrating.

[0081] The foregoing is considered as illustrative only of the principles of the invention. Furthermore, since numerous modifications and changes will readily occur to those skilled in the art, it is not desired to limit the invention to the exact construction and operation shown and described. While the preferred embodiment has been described, the details may be changed without departing from the invention, which is defined by the claims.