Method and system of testing slider body of thermally-assisted magnetic head

Abstract

A method of testing dynamic performances for a slider body of a thermally-assisted magnetic head includes: providing a slider body which is disconnected with a light source unit; removably mounting the slider body to a test head suspension assembly; keeping to provide a flat top beam to the slider body, the flat top beam being aligned with the optical waveguide, and a projection of an incident end of the optical waveguide being located within a light spot of the flat top beam; and testing the dynamic performance of the slider body. It can save the material cost and labor cost, and eliminate a precise optical alignment between an input light and an optical waveguide in the slider body to improve testing efficiency.

Claims

1. A method of testing dynamic performance for a slider body of a thermally-assisted magnetic head, the method comprising: providing the slider body, the slider body being disconnected with a light source unit and including a thermally-assisted magnetic head section, an air bearing surface and an optical waveguide; removably mounting the slider body to a test head suspension assembly loaded to a dynamic testing device; keeping to provide a flat top beam to the slider body along a direction vertical to an opposite surface of the air bearing surface, the flat top beam being aligned with the optical waveguide, and a projection of an incident end of the optical waveguide along said direction being located within a light spot of the flat top beam; and testing the dynamic performance of the slider body.

2. The method according to claim 1, wherein the projection of the incident end of the optical waveguide is located in a center of the light spot of the flat top beam.

3. The method according to claim 1, wherein the light spot of the flat top beam is in circle shape or oval shape.

4. The method according to claim 1, wherein the light spot of the flat top beam is in circle shape having a diameter that is less than 10 m.

5. The method according to claim 1, wherein an incident light power on the incident end of the optical waveguide is in a range of 30 mW1000 mW.

6. A system of testing dynamic performance for a slider body of a thermally-assisted magnetic head, the system comprising: a dynamic performance testing device, comprising a test head suspension assembly for supporting the slider body, the slider body being disconnected with a light source unit and including a thermally-assisted magnetic head section, an air bearing surface and an optical waveguide; and a light source supplying device, adapted for providing a flat top beam to the slider body along a direction vertical to an opposite surface of the air bearing surface, the flat top beam being aligned with the optical waveguide, and a projection of an incident end of the optical waveguide being located within a light spot of the flat top beam.

7. The system according to claim 6, wherein the projection of the incident end of the optical waveguide is located in a center of the light spot of the flat top beam.

8. The system according to claim 6, wherein the light spot of the flat top beam is in circle shape or oval shape.

9. The system according to claim 6, wherein the light spot of the flat top beam is in circle shape having a diameter that is less than 10 m.

10. The system according to claim 6, wherein an incident light power on the incident end of the optical waveguide is in a range of 30 mW1000 mW.

11. The system according to claim 6, wherein the light source supplying device comprises a laser device and a flat top beam shaper.

12. A method of testing dynamic performance for a slider body of a thermally-assisted magnetic head, the method comprising: providing the slider body, the slider body being disconnected with a light source unit and including a thermally-assisted magnetic head section, an air bearing surface and an optical waveguide; removably mounting the slider body to a test head suspension assembly loaded to a dynamic testing device, the test head suspension assembly being firmly connected with a test light source unit, and the test light source unit being configured to face to an opposite surface of the air bearing surface; controlling the test light source unit to provide a Gaussian beam to the slider body, the Gaussian beam aligning with the optical waveguide; and testing the dynamic performance of the slider body.

13. A method of testing dynamic performance for a slider body of a thermally-assisted magnetic head, the method comprising: providing the slider body, the slider body being disconnected with a light source unit and including a thermally-assisted magnetic head section, an air bearing surface and an optical waveguide; removably mounting the slider body to a test head suspension assembly loaded to a dynamic testing device; keeping to provide a Gaussian beam to the slider body along a direction vertical to an opposite surface of the air bearing surface, the Gaussian beam aligning with the optical waveguide; controlling the Gaussian beam to move synchronously with track motions of the slider body; and testing the dynamic performance of the slider body.

14. A method of testing dynamic performance for a slider body of a thermally-assisted magnetic head, the method comprising: providing the slider body and a light source unit, the light source unit being temporarily attached on an opposite surface of an air bearing surface of the slider body; aligning a Gaussian beam emitting from the light source unit with an optical waveguide of the slider body; and testing the dynamic performance of the slider body.

Description

BRIEF DESCRIPTION OF THE DRAWINGS

(1) The accompanying drawings facilitate an understanding of the various embodiments of this invention. In such drawings:

(2) FIG. 1A is a perspective view of a conventional thermally-assisted magnetic head;

(3) FIG. 1B is a simplified schematic view showing the conventional testing process;

(4) FIG. 1C shows the amplitude distribution of Gaussian beam emitted from a laser diode;

(5) FIG. 2 is a simplified schematic view showing a testing device accordingly to the present invention;

(6) FIG. 3 is a perspective view of a thermally-assisted magnetic head slider with a thermally-assisted magnetic head section according to an embodiment of the present invention;

(7) FIG. 4 is a cross-section view of the thermally-assisted magnetic write head section of FIG. 3;

(8) FIG. 5 is a simplified flowchart of a method of testing dynamic performances for a slider body of a thermally-assisted magnetic head according to a first embodiment of the present invention;

(9) FIG. 6 is a simplified schematic view showing the testing process by using a flat top beam with circular light spot on the ABS image, according to one embodiment;

(10) FIGS. 7A-7B showing an ABS image of the slider body showing oval light spot of the flat top beam;

(11) FIG. 8 shows a light power amplitude distribution of a flat top beam;

(12) FIG. 9A is a side view showing a slider body is clamped by a test head suspension assembly with a light source unit is bonded thereon;

(13) FIG. 9B is a simplified flowchart of a method of testing dynamic performances for a slider body of a thermally-assisted magnetic head according to a second embodiment of the present invention;

(14) FIG. 10A is a simplified schematic view showing the testing process by using a Gaussian beam according to another embodiment;

(15) FIG. 10B is a simplified flowchart of a method of testing dynamic performances for a slider body of a thermally-assisted magnetic head according to a third embodiment of the present invention; and

(16) FIG. 11 is a simplified flowchart of a method of testing dynamic performances for a slider body of a thermally-assisted magnetic head according to a fourth embodiment of the present invention;

DETAILED DESCRIPTION OF ILLUSTRATED EMBODIMENTS

(17) Various preferred embodiments of the invention will now be described with reference to the figures, wherein like reference numerals designate similar parts throughout the various views. As indicated above, the invention is directed to methods and systems of testing dynamic performances for a slider body of a thermally-assisted magnetic head, the testing is carried out in slider level without attaching a light source unit thereon, thus the material cost and labor cost in subsequent process are saved, furthermore a precise optical alignment between an input light and an optical waveguide in the slider body is unnecessary to improve testing efficiency. By dynamically testing the slider body before the light source unit is bonded thereon, a defective slider body can be individually scrapped rather than the entire thermally-assisted magnetic head.

(18) In the present invention, a sample slider body is mounted to a test head suspension assembly to undergo the dynamic performance testing. FIG. 2 illustrates a partial dynamic performance testing device 210 including a test head suspension assembly 211, a test disk 212 and a spindle motor 213 connected to the test disk 212, and a sample slider body 230 is supported by the test head suspension 211 to form a test disk drive unit which is connected to a computing device (not shown) so as to carry out the dynamic performance testing. As an aspect of the instant invention, a light source supplying device 220 is configured to provide light beams to the slider body and the disk so as to test the performances such as the writing performance.

(19) As shown in FIG. 3, the sample slider body 230 of a thermally-assisted magnetic head before a light source unit is connected thereon includes a substrate 203, and a thermally-assisted magnetic read write head 340 embedded in the substrate 203 for reading and writing. The substrate 203 may be substantially formed as a hexahedron, for example, and one surface thereof corresponds to an ABS 241 that is disposed in proximity to and to face the recording surface of the magnetic disk 212. When the disk 212 is rotated at a high speed, the slider 230 will move above the front surface of the magnetic disk 212 to be in a load state. The high-speed rotation of the magnetic disk 212 causes an air flow between the recording surface and the ABS 241, and the resulting lift force leads to a state where the slider 230 floats to maintain a certain distance (magnetic spacing) in a direction orthogonal to the recording surface.

(20) Specifically, referring to FIG. 3 again, the substrate 203 includes a leading edge (not shown), a trailing edge 205, an ABS 241 facing to the disk and processed so as to provide an appropriate flying height, an opposite surface 242 opposite to the ABS 241, and a thermally-assisted magnetic read write head 340 embedded in the trailing edge 205. The trailing edge 205 has multiple bonding pads 207, such as eight, to couple with the test head suspension assembly 211.

(21) More specifically, the thermally-assisted magnetic head 340 includes a magnetoresistive (MR) read head section (not shown) formed on the substrate 203 and a write head section 342 formed on the MR read head. For example, the MR read head can be Current Perpendicular to Plane (CPP) sensor, Current In Plane (CIP) sensor, tunnel magnetoresistive (TMR) sensor, giant magnetoresistive (GMR) sensor, or anisotropic magnetoresistive (AMR) sensor and the like.

(22) FIG. 4 is an enlarged sectional view of the thermally-assisted magnetic write head section 342 of the thermally-assisted magnetic read write head 340 according to an embodiment. Specifically, the thermally-assisted magnetic write head section 342 includes a magnetic pole 344 in which several coils (not shown) are sandwiched, an optical waveguide 354 formed adjacent to the magnetic pole 344 for guiding light generated by the light source unit 220, and a plasmon generator 356 sandwiched between the magnetic pole 344 and the optical waveguide 354 for propagating near-field light to the ABS 241. And a gap 343 is formed between the optical waveguide 354 and the plasmon generator 356. The optical waveguide 354 is formed by a dielectric material that allows laser light to pass therethrough. And a cover layer 401 is covered to form the ABS 241.

(23) As an embodiment, as shown in FIG. 6, the light source supplying device 220 includes a laser device (not shown) and a flat top beam shaper (not shown), which is adapted for providing a flat top beam 261 to the slider body 230 along a direction vertical to the opposite surface 242 of the ABS 241, the flat top beam 261 is aligned with the optical waveguide 354, and a projection of an incident end 354a of the optical waveguide 354 along the direction is located within a light spot 262 of the flat top beam 261.

(24) FIG. 5 shows a simplified flowchart of a method of testing dynamic performances for a slider body of a thermally-assisted magnetic head, the method includes the following steps:

(25) S501, providing a slider body 230 which is disconnected with a light source unit;

(26) S502, removably mounting the slider body 230 to the test head suspension assembly 211;

(27) S503, providing a flat top beam 261 to the slider body 230 along a direction vertical to the opposite surface 242 of the ABS 241; and

(28) S504, testing the dynamic performance of the slider body 230.

(29) Specifically, in the step S503, the flat top beam 261 is aligned with the optical waveguide 354, and a projection of the incident end of the optical waveguide 354 is located within the light spot 262 of the flat top beam 261. Preferably, the flat top beam 261 is emitted from a laser device (not shown) and transmitted through a flat top beam shaper (not shown), such as an aspheric beam shaper.

(30) As a preferable embodiment, the flat top beam 261 is positioned to align with the optical waveguide 354 to make the projection of the incident end of the optical waveguide 354 is located in a center of the light spot 262 of the flat top beam 261, as shown in FIG. 6. Specifically, the shape of the light spot of the flat top beam can be circular or oval, and the shape of the projection of the incident end of the optical waveguide is rectangular.

(31) In this embodiment, an incident light power on the incident end of the optical waveguide is in a range of 30 mW1000 mW, which is dependent on the detailed design of the thermally-assisted magnetic heads. As well known by persons skilled in the art, a light power density at the incident end of the optical waveguide should be maintained in a certain valve, thus the area of the light spot of the flat top beam and the light power should be controlled. For example, in this embodiment, the light power density at the incident end of optical waveguide is 10 mW/m.sup.2, the light spot of the flat top beam is circular and has a diameter of 10 m, and thus the required light power is 1000 mW. Although the size of the light spot of the flat top beam can be changed, a suitable light power of the flat top beam is desirable to make the testing feasible. Preferably, the light spot of the flat top beam is in circle shape whose diameter is less than 10 m.

(32) Alternatively, the shape of the light spot 262 of the flat top beam 261 can be controlled as oval, as illustrated in FIGS. 7A and 7B, which is dependent on the shape of the optical waveguide 354.

(33) FIG. 8 shows a light power amplitude distribution of a flat top beam, it can be seen that, the amplitudes in the effective range are the same, in other words, the light power of the flat top beam located in the light spot area is even and the same. Therefore, based on the introduction of the flat top beam instead of a Gaussian beam, there is no need to do a precise optical alignment between the flat top beam and the incident end of the optical waveguide to find the maximum light power position before the dynamic performance testing is started, instead, it's enough to do a rough and simple optical alignment to make sure that the projection of the incident end of the optical waveguide is located within the light spot of the flat top beam. Furthermore, since the dynamic performance testing is carried out in slider level without attaching a light source unit thereon, if the slider body is qualified after the testing, a light source unit will be bonded thereon by YAG laser or UV epoxy bonding; if the slider body is defective after the testing, it will be discarded, thus the material cost and labor cost are reduced by comparison of the conventional TAMR-level testing.

(34) As a second embodiment of the present invention, the dynamic performance testing is performed by using a test head suspension assembly and a test light source unit which is firmly connected to the test head suspension assembly, as shown in FIGS. 9A and 9B. In this embodiment, test is carried out at slider level as well.

(35) Specifically, the testing method includes the following steps:

(36) S601, providing a slider body 230 which disconnects with a light source unit;

(37) S602, removably mounting the slider body 230 to a test head suspension assembly 211 which is loaded to a dynamic testing device; specifically, the test head suspension assembly 211 is firmly connected with a test light source unit 260, and the test light source unit 260 is configured to face to an opposite surface 242 of the ABS 241 of the slider body 230;

(38) S603, controlling the test light source unit 260 to provide a Gaussian beam to the slider body 230, with the Gaussian beam aligning with the optical waveguide; and

(39) S604, testing the dynamic performance of the slider body 230.

(40) In the step of S602, the test light source unit 260 is accurately bonded to the test head suspension assembly 211 in advance, and the mounting position of the slider body 230 has been set accurately as well, if a slider body 230 is clamped and positioned on the test head suspension assembly 211, a fine alignment between the test light source unit 260 and the slider body 230 is unnecessary. Therefore the test is efficient.

(41) As a third embodiment of the present invention, the dynamic performance testing is performed by using a test head suspension assembly, a light source supplying device for emitting Gaussian beams and a movement controller connected with the light source supplying device, as shown in FIGS. 10A and 10B.

(42) Specifically, the testing method includes the following steps:

(43) S701, providing a slider body 230 which is disconnected with a light source unit;

(44) S702, removably mounting the slider body 230 to a test head suspension assembly which is loaded to a dynamic testing device;

(45) S703, keeping to provide a Gaussian beam 271 to the slider body 230 along a direction vertical to an opposite surface of the ABS, with the Gaussian beam 271 aligning with the optical waveguide;

(46) S704, controlling the Gaussian beam 271 to move synchronously with track motions of the slider body 230; and

(47) S705, testing the dynamic performance of the slider body 230.

(48) In the step of S703, the Gaussian beam 271 is emitted by a light source supplying device 270, such as a laser device. In the step of S704, a movement controller 272 is connected with the light source supplying device 270 to control the light source supplying device 270 to move, so that the Gaussian beam 271 is kept to move synchronously with track motions of the slider body 230 to make sure the optical alignment between the Gaussian beam 271 and the optical waveguide 354.

(49) As a fourth embodiment of the present invention, FIG. 11 shows a testing method which is performed at TAMR level with a light source unit is temporarily bonded. The method includes the following steps:

(50) S801, providing a slider body and a light source unit, with the light source unit being temporarily attached on an opposite surface of an air bearing surface of the slider body;

(51) S802, aligning a Gaussian beam emitting from the light source unit with an optical waveguide of the slider body; and

(52) S803, testing the dynamic performance of the slider body.

(53) In the step of S801, the light source unit is temporarily bonded to the slider body via weak UV epoxy. After the dynamic performance testing is done, for a qualified slider body, the light source unit and the slider body will be connected in a permanent manner, for example the light source unit will be bonded to the slider body by YAG laser or UV epoxy permanent bonding, and for a defective slider body, the light source unit will be removed from the slider body and be used for next sample slider body, and the defective slider body will be discarded. In such a way, the material cost and the labor cost are still reduced by comparison with the conventional testing method.

(54) While the invention has been described in connection with what are presently considered to be the most practical and preferred embodiments, it is to be understood that the invention is not to be limited to the disclosed embodiments, but on the contrary, is intended to cover various modifications and equivalent arrangements included within the spirit and scope of the invention.