DISPERSION MEASUREMENT DEVICE AND DISPERSION MEASUREMENT METHOD
20240210275 ยท 2024-06-27
Assignee
Inventors
- Koyo WATANABE (Hamamatsu-shi, Shizuoka, JP)
- Hisanari TAKAHASHI (Hamamatsu-shi, Shizuoka, JP)
- Takashi INOUE (Hamamatsu-shi, Shizuoka, JP)
Cpc classification
International classification
Abstract
A dispersion measurement device includes a pulse forming unit, an optical detection unit, and an arithmetic operation unit. The pulse forming unit includes an SLM that presents a phase pattern, and forms an optical pulse train from the first optical pulse, the optical pulse train including a plurality of second optical pulses having a time difference from each other and having center wavelengths different from each other. The optical detection unit detects a temporal waveform of the optical pulse train. An optical component is arranged on an optical path between the pulse forming unit and the optical detection unit. The arithmetic operation unit estimates a wavelength dispersion amount of the optical component based on a feature amount of the temporal waveform. The phase pattern gives a group delay dispersion having a sign opposite to the group delay dispersion of the optical component to the first optical pulse.
Claims
1. A dispersion measurement device measuring a wavelength dispersion amount of a measurement object having positive or negative group delay dispersion, the dispersion measurement device comprising: a light source configured to output a first optical pulse; a pulse forming unit including a spatial light modulator configured to present a phase pattern for generating modulated light by applying a predetermined phase shift for each wavelength to the first optical pulse, the pulse forming unit forming an optical pulse train from the first optical pulse, and the optical pulse train being the modulated light including a plurality of second optical pulses having a time difference from each other and having center wavelengths different from each other; an optical detection unit configured to detect a temporal waveform of the optical pulse train; and an arithmetic operation unit electrically connected to the optical detection unit, wherein the measurement object is arranged on an optical path between the light source and the pulse forming unit, or an optical path between the pulse forming unit and the optical detection unit, the arithmetic operation unit configured to estimate the wavelength dispersion amount of the measurement object based on a feature amount of the temporal waveform, the phase pattern includes a pattern for giving a group delay dispersion having a sign opposite to the group delay dispersion of the measurement object to the first optical pulse.
2. The dispersion measurement device according to claim 1, wherein the optical detection unit includes a correlation optical system configured to receive the optical pulse train and output correlated light including cross-correlation or autocorrelation of the optical pulse train, the optical detection unit being configured to detect a temporal waveform of the correlated light as the temporal waveform of the optical pulse train, and the arithmetic operation unit is configured to estimate the wavelength dispersion amount of the measurement object based on a feature amount of the temporal waveform of the correlated light.
3. The dispersion measurement device according to claim 1, wherein an absolute value of the group delay dispersion given to the first optical pulse by the phase pattern is within a predicted range of an absolute value of the group delay dispersion of the measurement object.
4. The dispersion measurement device according to claim 1, wherein an absolute value of the group delay dispersion given to the first optical pulse by the phase pattern is equal to an absolute value of the group delay dispersion on design of the measurement object.
5. The dispersion measurement device according to claim 1, wherein the measurement object is arranged on the optical path between the pulse forming unit and the optical detection unit.
6. The dispersion measurement device according to claim 1, wherein a wavelength characteristic of a spectral phase given to the first optical pulse by the phase pattern is symmetric with respect to a center wavelength of the first optical pulse, and has a characteristic in which the spectral phase increases and then decreases with increasing distance from the center wavelength.
7. The dispersion measurement device according to claim 1, wherein a wavelength characteristic of a spectral phase given to the first optical pulse by the phase pattern is symmetric with respect to a center wavelength of the first optical pulse, and has a characteristic in which the spectral phase decreases and then increases with increasing distance from the center wavelength.
8. The dispersion measurement device according to claim 1, further comprising: a control unit storing a first phase pattern that is the phase pattern for giving a positive group delay dispersion to the first optical pulse and a second phase pattern that is the phase pattern for giving a negative group delay dispersion to the first optical pulse, the control unit selectively outputting the first phase pattern and the second phase pattern to the spatial light modulator.
9. A dispersion measurement method for measuring a wavelength dispersion amount of a measurement object having positive or negative group delay dispersion, the dispersion measurement method comprising: outputting a first optical pulse; forming an optical pulse train from the first optical pulse, the optical pulse train being modulated light including a plurality of second optical pulses having a time difference from each other and having center wavelengths different from each other, by using a spatial light modulator configured to present a phase pattern for generating the modulated light by applying a predetermined phase shift for each wavelength to the first optical pulse; detecting a temporal waveform of the optical pulse train; and estimating the wavelength dispersion amount of the measurement object, wherein the optical pulse train is formed from the first optical pulse transmitted through the measurement object in the forming, or the temporal waveform of the optical pulse train transmitted through the measurement object is detected in the detecting, in the estimating, the wavelength dispersion amount of the measurement object is estimated based on a feature amount of the temporal waveform, and the phase pattern includes a pattern for giving a group delay dispersion having a sign opposite to the group delay dispersion of the measurement object to the first optical pulse.
10. The dispersion measurement method according to claim 9, wherein in the detecting, correlated light including cross-correlation or autocorrelation of the optical pulse train is generated, and a temporal waveform of the correlated light is detected as the temporal waveform of the optical pulse train, and in the estimating, the wavelength dispersion amount of the measurement object is estimated based on a feature amount of the temporal waveform of the correlated light.
11. The dispersion measurement method according to claim 9, wherein an absolute value of the group delay dispersion given to the first optical pulse by the phase pattern is within a predicted range of an absolute value of the group delay dispersion of the measurement object.
12. The dispersion measurement method according to claim 9, wherein an absolute value of the group delay dispersion given to the first optical pulse by the phase pattern is equal to an absolute value of the group delay dispersion on design of the measurement object.
13. The dispersion measurement method according to claim 9, wherein a wavelength characteristic of a spectral phase given to the first optical pulse by the phase pattern is symmetric with respect to a center wavelength of the first optical pulse, and has a characteristic in which the spectral phase increases and then decreases with increasing distance from the center wavelength.
14. The dispersion measurement method according to claim 9, wherein a wavelength characteristic of a spectral phase given to the first optical pulse by the phase pattern is symmetric with respect to a center wavelength of the first optical pulse, and has a characteristic in which the spectral phase decreases and then increases with increasing distance from the center wavelength.
Description
BRIEF DESCRIPTION OF DRAWINGS
[0017]
[0018]
[0019]
[0020]
[0021]
[0022]
[0023]
[0024]
[0025]
[0026]
[0027]
[0028]
[0029]
[0030]
[0031]
[0032]
[0033]
[0034]
[0035]
[0036]
[0037] (a) of
[0038] (a) of
[0039]
[0040]
[0041]
[0042]
[0043]
[0044]
[0045]
[0046] (a) of
[0047]
[0048]
[0049]
[0050]
[0051]
[0052]
[0053]
[0054]
[0055]
DESCRIPTION OF EMBODIMENTS
[0056] Hereinafter, embodiments of a dispersion measurement device and a dispersion measurement method according to the present disclosure will be described in detail with reference to the accompanying drawings. The same elements are denoted by the same reference signs in description of drawings, and the repetitive descriptions are omitted.
[0057]
[0058] The pulsed laser light source 2 outputs a coherent optical pulse Pa (first optical pulse). The pulsed laser light source 2 is, for example, a femtosecond laser, and is a solid-state laser light source such as an LD direct excitation Yb: YAG pulsed laser in an example. The temporal waveform of the optical pulse Pa has, for example, a Gaussian function shape. The full width at half maximum (FWHM) of the optical pulse Pa is, for example, in the range of 10 fs to 10,000 fs, and is 100 fs in an example. The optical pulse Pa is an optical pulse having a certain bandwidth and includes a plurality of continuous wavelength components. In an example, the bandwidth of the optical pulse Pa is 10 nm and the center wavelength of the optical pulse Pa is 1030 nm.
[0059] The pulse forming unit 3 is a part that forms an optical pulse train Pb from the optical pulse Pa. The optical pulse train Pb includes a plurality of optical pulses Pb.sub.1 and Pb.sub.2 (plurality of second optical pulses) having a time difference from each other and having different center wavelengths from each other. The optical pulse train Pb is a single pulse group generated by dividing a spectrum constituting the optical pulse Pa into a plurality of wavelength bands and using each wavelength band. At boundaries among the plurality of wavelength bands, the plurality of wavelength bands may overlap each other. In the following description, the optical pulse train Pb may be referred to as a band-controlled multi-pulse.
[0060]
[0061] The SLM 14 applies a predetermined phase shift for each wavelength to the optical pulse Pa in order to convert the optical pulse Pa into the optical pulse train Pb (modulated light). Specifically, the SLM 14 receives a control signal from the control unit 5a (see
[0062]
[0063] Each wavelength component of the modulated light P2 modulated by the SLM 14 is focused at a point on the diffraction grating 16 by the lens 15. At this time, the lens 15 functions as a focusing optical system for focusing the modulated light P2. The lens 15 may be a convex lens made of a light transmitting member or a concave mirror having a concave light reflection surface. The diffraction grating 16 functions as a combining optical system and combines the modulated wavelength components. That is, the plurality of wavelength components of the modulated light P2 are focused and combined with each other by the lens 15 and the diffraction grating 16 to obtain a band-controlled multi-pulse (optical pulse train Pb).
[0064]
[0065]
[0066]
[0067] Reference is again made to
[0068] The optical component 7 is, for example, a light guide member such as an optical fiber or an optical waveguide. Examples of the optical fiber include a single mode fiber, a multi-mode fiber, a rare-earth-doped fiber, a photonic crystal fiber, a dispersion shifted fiber, and a double clad fiber. Examples of the optical waveguide include semiconductor micro-waveguides of SiN, InP, and the like. The optical component 7 may be, for example, a semiconductor or a dielectric optical crystal. In this case, the optical component 7 may be diamond, SiO.sub.2, LiNbO.sub.3, LiTaO.sub.3, PLZT, Si, Ge, fullerene, graphite, graphene, carbon nanotube, GaN, GaAs, a magnetic body, an organic material, a polymer material, or the like.
[0069] The phase pattern presented on the modulation surface 17 of the SLM 14 is obtained by superimposing another phase pattern on the phase pattern for generating the optical pulse train Pb. The another phase pattern is a phase pattern for giving the optical pulse Pa a group delay dispersion having a sign opposite to that of the group delay dispersion of the optical component 7. That is, the another phase pattern is a phase pattern for making the optical pulse train Pb have a group delay dispersion having a sign opposite to that of the group delay dispersion of the optical component 7. Specifically, when the optical component 7 has a positive group delay dispersion, the another phase pattern provides a negative group delay dispersion to the optical pulse Pa. If the optical component 7 has a negative group delay dispersion, the another phase pattern provides a positive group delay dispersion to the light pulse Pa.
[0070]
[0071] In the spectral waveform shown in
[0072] In the spectral waveform shown in
[0073] The control unit 5a may store a first phase pattern for applying positive group delay dispersion to the optical pulse Pa and a second phase pattern for applying negative group delay dispersion to the optical pulse Pa, and selectively output the first phase pattern and the second phase pattern to the SLM 14. In this case, the control unit 5a may acquire information concerning the sign of the group delay dispersion of the optical component 7 through the input unit 5c.
[0074] The absolute value of the group delay dispersion given to the optical pulse Pa by the phase pattern is preferably close to the absolute value of the group delay dispersion of the optical component 7. For example, the absolute value of the group delay dispersion given to the optical pulse Pa by the phase pattern may be within a predicted range (for example, within an allowable error) of the absolute value of the group delay dispersion of the optical component 7. Alternatively, the absolute value of the group delay dispersion given to the optical pulse Pa by the phase pattern may be equal to the absolute value of the group delay dispersion on design of the optical component 7.
[0075] A change in a temporal waveform of the optical pulse train Pb caused by the group delay dispersion will be described.
[0076] As shown in
[0077] In the present embodiment, first, a positive or negative group delay dispersion is given to the optical pulse Pa by the SLM 14. When the positive group delay dispersion is given to the optical pulse Pa, the optical pulse train Pb has the positive group delay dispersion. Therefore, the peak intensities of the optical pulses Pb.sub.1 and Pb.sub.2 change in the direction of the arrow B11 shown in
[0078] When the group delay dispersion is applied to the optical pulse Pa by the SLM 14, the peak intensities of the optical pulses Pb.sub.1 and Pb.sub.2 in the time domain are reduced while the intensity of the optical pulses Pb.sub.1 and Pb.sub.2 in the spectrum domain are maintained.
[0079] Next, when the optical pulse train Pb is transmitted through the optical component 7, the optical component 7 provides the optical pulse train Pb with a group delay dispersion having a sign opposite to that of the group delay dispersion provided to the optical pulse Pa by the SLM 14. When a negative group delay dispersion is applied to the optical pulse train Pb by the optical component 7, the peak intensities of the optical pulses Pb.sub.1 and Pb.sub.2 change in the direction of the arrow B31 shown in
[0080] As the absolute value of the group delay dispersion given to the optical pulses Pa by the SLM 14 are closer to the absolute value of the group delay dispersion given to the optical pulse train Pb by the optical component 7, the group delay dispersion of the optical pulse train Pb after being transmitted through the optical component 7 approaches zero. When the absolute group delay dispersion given to the optical pulse Pa by the SLM 14 is equal to the absolute group delay dispersion given to the optical pulse train Pb by the optical component 7, the group delay dispersion of the optical pulse train Pb after being transmitted through the optical component 7 becomes zero, so that the peak intensities of the optical pulses Pb.sub.1 and Pb.sub.2 become maximum and the pulse widths of the optical pulses Pb.sub.1 and Pb.sub.2 become minimum.
[0081]
[0082]
[0083] The correlation optical system 40 shown in
[0084] Here, a configuration example of the correlation optical system 40 will be described in detail.
[0085] In this example, the optical element 42 includes a non-linear optical crystal. The lens 41 focuses each of the optical pulse trains Pba and Pbb toward the optical element 42, and causes the optical axes of the optical pulse trains Pba and Pbb to intersect each other at a predetermined angle in the optical element 42. As a result, in the optical element 42 which is a non-linear optical crystal, a second harmonic wave is generated starting from the intersection of the optical pulse trains Pba and Pbb. The second harmonic wave is the correlated light Pc and includes autocorrelation of the optical pulse train Pb. The correlated light Pc is collimated or focused by the lens 43 and then input to the detector 400.
[0086]
[0087] Also in this example, the optical element 42 includes a non-linear optical crystal. The lens 41 focuses the optical pulse train Pb and the reference optical pulse Pr toward the optical element 42, and causes the optical axis of the optical pulse train Pb to intersect the optical axis of the reference optical pulse Pr at a predetermined angle in the optical element 42. As a result, in the optical element 42 which is a non-linear optical crystal, a second harmonic wave is generated starting from the intersection of the optical pulse train Pb and the reference optical pulse Pr. The second harmonic wave is the correlated light Pc and includes cross-correlation of the optical pulse train Pb. The correlated light Pc is collimated or focused by the lens 43 and then input to the detector 400.
[0088]
[0089] The polarization component of the optical pulse Pa in the first polarization direction is modulated in the SLM 14 and output from the pulse forming unit 3 as the optical pulse train Pb. On the other hand, the polarization component of the optical pulse Pa in the second polarization direction is output from the pulse forming unit 3 as it is without being modulated in the SLM 14. The unmodulated polarization component is provided to the correlation optical system 40 coaxially with the optical pulse train Pb as the reference optical pulse Pr that is a single pulse. The correlation optical system 40 generates correlated light Pc including cross-correlation of the optical pulse train Pb from the optical pulse train Pb and the reference optical pulse Pr. In this configuration example, since a delay is applied to the optical pulse train Pb in the SLM 14 and a delay time is made variable (arrow E in Figure), it is possible to make the time difference between the optical pulse train Pb and the reference optical pulse Pr (timing difference to reach the lens 41) variable. Therefore, it is possible to suitably generate the correlated light Pe including the cross-correlation of the optical pulse train Pb in the correlation optical system 40.
[0090] As illustrated in
[0091] In a case where the wavelength dispersion of the optical component 7 is not zero, the feature amounts (peak intensity, full width at half maximum, and peak time interval) of a temporal waveform of the plurality of optical pulses included in the correlated light Pc greatly change as compared with a case where the wavelength dispersion amount of the optical component 7 is zero. The amount of change depends on the wavelength dispersion amount of the optical component 7. Thus, by observing the change in the feature amount of the temporal waveform of the correlated light Pc, it is possible to accurately and easily known the wavelength dispersion amount of the optical component 7. However, in the above observation, the wavelength dispersion amount of the optical component 7 may be corrected by using a known wavelength dispersion amount of the pulsed laser light source 2.
[0092] As described above, in the present embodiment, the positive or negative group delay dispersion is applied to the optical pulse Pa by the SLM 14.
[0093]
[0094] Refer to
[0095] The arithmetic operation unit 5b is electrically connected to the detector 400. The arithmetic operation unit 5b estimates the wavelength dispersion amount of the optical component 7 based on the feature amount of the temporal waveform provided from the detector 400. As described above, according to the knowledge of the present inventor, in a case where the correlated light Pc including the cross-correlation or the autocorrelation of the optical pulse train Pb is generated, various feature amounts (for example, peak interval, peak intensity, pulse width, and the like) in the temporal waveform of the correlated light Pc have a significant correlation with the wavelength dispersion amount of the measurement object. Therefore, the arithmetic operation unit 5b can accurately estimate the wavelength dispersion amount of the optical component 7 as the measurement object by evaluating the feature amount of the temporal waveform of the correlated light Pc.
[0096] The input unit 5c receives an input from a user of the dispersion measurement device 1A. The input unit 5c acquires information about the sign of the group delay dispersion of the optical component 7. The information regarding the sign of the group delay dispersion of the optical component 7 is information indicating that the group delay dispersion of the optical component 7 is positive or information indicating that the group delay dispersion of the optical component 7 is negative.
[0097] The output unit 5d outputs an estimation result of the wavelength dispersion amount in the arithmetic operation unit 5b. The output unit 5d is, for example, a display device that displays an estimation result of the wavelength dispersion amount.
[0098]
[0099] The processor 51 of the computer can realize the function of the arithmetic operation unit 5b by a wavelength dispersion amount calculation program. In other words, the wavelength dispersion amount calculation program causes the processor 51 of the computer to operate as the arithmetic operation unit 5b. The wavelength dispersion amount calculation program is stored in a storage device (storage medium) inside or outside the computer, for example, the auxiliary storage device 57. The storage device may be a non-transitory recording medium. Examples of the recording medium include a recording medium such as a flexible disk, a CD, and a DVD, a recording medium such as a ROM, a semiconductor memory, and a cloud server. The output device 55 such as a display (including a touch screen) operates as the output unit 5d.
[0100] The auxiliary storage device 57 stores the feature amount of the temporal waveform of the correlated light Pc theoretically calculated in advance (or measured in advance) on the assumption that the wavelength dispersion amount of the optical component 7 is zero. By comparing the stored feature amount with the feature amount of the temporal waveform of the correlated light Pc detected by the detector 400, it can be seen how much the feature amount of the correlated light Pc has changed due to the wavelength dispersion amount of the optical component 7. Therefore, the arithmetic operation unit 5b can estimate the wavelength dispersion amount of the optical component 7 by comparing the feature amount stored in the auxiliary storage device 57 with the feature amount of the temporal waveform of the correlated light Pc detected by the detector 400.
[0101]
[0102] Then, in a pulse forming step S102, the pulse forming unit 3 receives the optical pulse Pa and generates an optical pulse train Pb. Specifically, the pulse forming unit 3 forms the optical pulse train Pb, which is modulated light including a plurality of optical pulses Pb.sub.1 and Pb.sub.2 having a time difference from each other and having different center wavelengths from each other, from the optical pulse Pa output from the pulsed laser light source 2. For example, a plurality of wavelength components included in the optical pulse Pa are spatially separated for each wavelength, and the phases of the plurality of wavelength components are shifted from each other by using the SLM 14. Then, the plurality of wavelength components are focused. Thus, it is possible to easily generate the optical pulse train Pb. In addition, in the pulse forming step S102, a phase pattern presented to the SLM 14 gives a positive or negative group delay dispersion to the optical pulse Pa.
[0103] Subsequently, in a detection step S103, the temporal waveform of the correlated light Pc is detected. Specifically, after the optical pulse train Pb output from the pulse forming unit 3 is transmitted through the optical component 7, the correlation optical system 40 receives the optical pulse train Pb output from the optical component 7, and outputs correlated light Pc that is cross-correlation or autocorrelation of the optical pulse train Pb. Then, the detector 400 detects the temporal waveform of the correlated light Pc. As an example, the correlation optical system 40 uses the optical element 42 including at least one of the non-linear optical crystal and the phosphor to generate the correlated light Pc including cross-correlation or autocorrelation of the optical pulse train Pb.
[0104] For example, as illustrated in
[0105] Subsequently, in an arithmetic operation step S104, the arithmetic operation unit 5b estimates the wavelength dispersion amount of the optical component 7 based on the feature amount of the temporal waveform of the correlated light Pc. Specifically, first, the arithmetic operation unit 5b acquires the feature amount of the temporal waveform of the correlated light Pc theoretically calculated in advance (or measured in advance) on the assumption that the wavelength dispersion of the optical component 7 is zero. Then, the arithmetic operation unit 5b acquires the feature amount of the temporal waveform of the correlated light Pc detected in the detection step S103. Here, the feature amount is, for example, at least one of a peak intensity, a full width at half maximum, and a peak time interval of a plurality of optical pulses included in the correlated light Pc. Subsequently, the arithmetic operation unit 5b estimates the wavelength dispersion amount of the optical component 7 by comparing the acquired feature amounts of the two temporal waveforms.
[0106] Here, phase modulation for generating a band-controlled multi-pulse in the SLM 14 of the pulse forming unit 3 illustrated in
[0107]
[0108] The modulation pattern calculation apparatus 20 in the present embodiment causes the control unit 5a to store a phase pattern including a phase pattern for phase modulation that gives a phase spectrum for obtaining a desired waveform to output light and a phase pattern for intensity modulation that gives an intensity spectrum for obtaining a desired waveform to output light. Therefore, as illustrated in
[0109] The processor of the computer can implement the above functions by a modulation pattern calculation program. Thus, the modulation pattern calculation program causes the processor of the computer to operate as the arbitrary waveform input unit 21, the phase spectrum design unit 22, the intensity spectrum design unit 23, and the modulation pattern generation unit 24 in the modulation pattern calculation apparatus 20. The modulation pattern calculation program is stored in a storage device (storage medium) inside or outside the computer. The storage device may be a non-transitory recording medium. Examples of the recording medium include a recording medium such as a flexible disk, a CD, and a DVD, a recording medium such as a ROM, a semiconductor memory, a cloud server, and the like.
[0110] The arbitrary waveform input unit 21 receives the desired temporal intensity waveform input from an operator. The operator inputs information on the desired temporal intensity waveform (for example, a peak interval, a pulse width, the number of pulses, and the like) to the arbitrary waveform input unit 21. The information on the desired temporal intensity waveform is provided to the phase spectrum design unit 22 and the intensity spectrum design unit 23. The phase spectrum design unit 22 calculates a phase spectrum of the output light of the pulse forming unit 3, which is suitable for realizing the given desired temporal intensity waveform. The intensity spectrum design unit 23 calculates an intensity spectrum of the output light of the pulse forming unit 3, which is suitable for realizing the given desired temporal intensity waveform. The modulation pattern generation unit 24 calculates a phase modulation pattern (for example, a computer-generated hologram) for applying the phase spectrum obtained in the phase spectrum design unit 22 and the intensity spectrum obtained in the intensity spectrum design unit 23 to the output light of the pulse forming unit 3. Then, a control signal SC including the calculated phase modulation pattern is provided to the SLM 14. The SLM 14 is controlled based on the control signal SC.
[0111]
[0112] Here, the desired temporal intensity waveform is expressed as a function in the time domain and the phase spectrum is expressed as a function in the frequency domain. Therefore, the phase spectrum corresponding to the desired temporal intensity waveform is obtained, for example, by an iterative Fourier transform based on the desired temporal intensity waveform.
[0113] The subscript n indicates after the n-th Fourier transform process. Before a first Fourier transform process, the initial phase spectrum function ?.sub.0(?) described above is used as the phase spectrum function ?.sub.n(?). i is an imaginary number.
[0114] Then, Fourier transform from the frequency domain to the time domain is performed on the function (a) (arrow A1 in Figure). As a result, a waveform function (b) in the time domain, which includes a temporal intensity waveform function b.sub.n(t) and a time-phase waveform function ?.sub.n(t), is obtained (process number (3) in Figure).
[0115] Subsequently, the temporal intensity waveform function b.sub.n(t) included in the function (b) is replaced with a temporal intensity waveform function Target.sub.0(t) based on a desired waveform (process numbers (4) and (5) in Figure).
[0116] Subsequently, inverse Fourier transform from the time domain to the frequency domain is performed on a function (d) (arrow A2 in Figure). As a result, a waveform function (e) in the frequency domain, which includes an intensity spectrum function B.sub.n(?) and the phase spectrum function ?.sub.n(?), is obtained (process number (6) in Figure).
[0117] Subsequently, in order to restrain the intensity spectrum function B.sub.n(?) included in the function (e), the intensity spectrum function B.sub.n(?) is replaced with the initial intensity spectrum function A.sub.0(?) (process number (7) in Figure).
[0118] Thereafter, by repeatedly performing the above processes (2) to (7) a plurality of times, the phase spectrum shape represented by the phase spectrum function ?.sub.n(?) in the waveform function can be brought close to the phase spectrum shape corresponding to the desired temporal intensity waveform. The finally obtained phase spectrum function ?.sub.IFTA(?) is the basis of the modulation pattern for obtaining the desired temporal intensity waveform.
[0119] However, the iterative Fourier method as described above has a problem that, although the temporal intensity waveform can be controlled, it is not possible to control the frequency component (band wavelength) constituting the temporal intensity waveform. Therefore, the modulation pattern calculation apparatus 20 in the present embodiment calculates the phase spectrum function and the intensity spectrum function that are the basis of the modulation pattern, by using a calculation method described below.
[0120] Subsequently, the Fourier transform unit 25 of the phase spectrum design unit 22 performs the Fourier transform on the function (g) from the frequency domain to the time domain (arrow A3 in Figure). As a result, a second waveform function (h) in the time domain, which includes the temporal intensity waveform function a.sub.0(t) and the time-phase waveform function ?.sub.0(t), is obtained (Fourier transform step, process number (13)).
[0121] Subsequently, the function replacement unit 26 of the phase spectrum design unit 22 substitutes the temporal intensity waveform function Target.sub.0(t) based on the desired waveform input by the arbitrary waveform input unit 21 into a temporal intensity waveform function b.sub.0(t) as illustrated in the following formula (i) (process number (14)).
[0122] Subsequently, the function replacement unit 26 of the phase spectrum design unit 22 substitutes the temporal intensity waveform function a.sub.0(t) with the temporal intensity waveform function b.sub.0(t), as represented by the following formula (j). That is, the temporal intensity waveform function a.sub.0(t) included in the function (h) is replaced with the temporal intensity waveform function Target.sub.0(t) based on the desired waveform (function replacement step, process number (15)).
[0123] Subsequently, the waveform function modification unit 27 of the phase spectrum design unit 22 corrects the second waveform function such that the spectrogram of the second waveform function (j) after the replacement is close to the target spectrogram generated in advance in accordance with a desired wavelength band. First, by performing time-frequency transform on the second waveform function (j) after the replacement, the second waveform function (j) is converted into a spectrogram SG.sub.0,k(?, t) (process number (15a) in Figure). The subscript k indicates k-th conversion processing.
[0124] Here, the time-frequency transform refers to performing frequency filter processing or numerical arithmetic operation processing (processing of obtaining a spectrum for each time by performing multiplication while shifting a window function) on a composite signal such as a temporal waveform to convert the composite signal into three-dimensional information including time, frequency, and intensity (spectrum intensity) of a signal component. In the present embodiment, the transform result (time, frequency, and spectrum intensity) is defined as a spectrogram.
[0125] Examples of the time-frequency transform include short-time Fourier transform (STFT), wavelet transform (Halle wavelet transform, Gabor wavelet transform, Mexican-hat wavelet transform, Morley wavelet transform), and the like.
[0126] The target spectrogram TargetSG.sub.0(?, t) generated in advance in accordance with the desired wavelength band is read from the target generation unit 29. The target spectrogram TargetSG.sub.0(?, t) has substantially the same value as the target temporal waveform (the temporal intensity waveform and the frequency component constituting the temporal intensity waveform), and is generated in the target spectrogram function of the process number (15b).
[0127] Then, the waveform function modification unit 27 of the phase spectrum design unit 22 performs pattern matching between the spectrogram SG.sub.0,k(?, t) and the target spectrogram TargetSG.sub.0(?, t), and examines the similarity (how much the spectrogram SG.sub.0,k(?, t) and the target spectrogram TargetSG.sub.0(?, t) match with each other). In the present embodiment, an evaluation value is calculated as an index representing the similarity. Then, in the subsequent process number (15c), it is determined whether or not the obtained evaluation value satisfies a predetermined end condition. When the condition is satisfied, the process proceeds to a process number (16). When the condition is not satisfied, the process proceeds to a process number (15d). In the process number (15d), the time-phase waveform function ?.sub.0(t) included in the second waveform function is changed to a certain time-phase waveform function ?.sub.0,k(t). The second waveform function after changing the time-phase waveform function is converted into a spectrogram again by time-frequency transform such as STFT. Thereafter, the above-described process numbers (15a) to (15d) are repeatedly performed. In this manner, the second waveform function is corrected such that the spectrogram SG.sub.0,k(?, t) is gradually brought close to the target spectrogram TargetSG.sub.0(?, t) (waveform function correction step).
[0128] Then, the inverse Fourier transform unit 28 of the phase spectrum design unit 22 performs an inverse Fourier transform on the corrected second waveform function (arrow A4 in Figure) and generates a third waveform function (k) in the frequency domain (inverse Fourier transform step, process number (16)).
[0129] The phase spectrum function ?.sub.0,k(?) included in the third waveform function (k) becomes a desired phase spectrum function ?.sub.TWC-TFD(?) to be finally obtained. The phase spectrum function ?.sub.TWC-TFD(?) is provided to the modulation pattern generation unit 24.
[0130]
[0131] Then, the inverse Fourier transform unit 28 of the intensity spectrum design unit 23 performs an inverse Fourier transform on the corrected second waveform function (arrow A4 in Figure) and generates a third waveform function (m) in the frequency domain (inverse Fourier transform step, process number (16)).
[0132] Subsequently, in the process number (17), a filter processing unit of the intensity spectrum design unit 23 performs filter processing based on the intensity spectrum of the input light, on the intensity spectrum function B.sub.0,k(?) included in the third waveform function (m) (filter processing step). Specifically, in the intensity spectrum obtained by multiplying the intensity spectrum function B.sub.0,k(?) by a coefficient ?, a portion exceeding the cutoff intensity for each wavelength determined based on the intensity spectrum of the input light is cut. This is performed in order to prevent an occurrence of a situation in which an intensity spectrum function ?B.sub.0,k(?) does not exceed the spectrum intensity of the input light in all the wavelength ranges. In an example, the cutoff intensity for each wavelength is set to coincide with the intensity spectrum of the input light (the initial intensity spectrum function A.sub.0(?) in the present embodiment). In this case, as represented in the following formula (n), at frequencies where the intensity spectrum function ?B.sub.0,k(?) is larger than the intensity spectrum function A.sub.0(?), the value of the intensity spectrum function A.sub.0(?) is taken as the value of the intensity spectrum function A.sub.TWC-TFD(?). At frequencies where the intensity spectrum function ?B.sub.0,k(?) is equal to or smaller than the intensity spectrum function A.sub.0(?), the value of the intensity spectrum function ?B.sub.0,k(?) is taken as the value of the intensity spectrum function A.sub.TWC-TFD(?) (process number (17) in Figure).
[0133] The intensity spectrum function A.sub.TWC-TFD(?) is provided to the modulation pattern generation unit 24 as the desired spectrum intensity to be finally obtained.
[0134] The modulation pattern generation unit 24 calculates a phase modulation pattern (for example, a computer-generated hologram) for giving, to the output light, the spectrum phase represented by the phase spectrum function ?.sub.TWC-TFD(?) calculated in the phase spectrum design unit 22 and the spectrum intensity represented by the intensity spectrum function A.sub.TWC-TFD(?) calculated in the intensity spectrum design unit 23 (data generation step).
[0135]
[0136] Then, the target generation unit 29 calculates a phase spectrum function ?.sub.IFTA(?) for realizing the temporal intensity waveform function Target.sub.0(t), for example, by using the iterative Fourier transform method illustrated in
[0137] Subsequently, the target generation unit 29 calculates an intensity spectrum function A.sub.IFTA(?) for realizing the temporal intensity waveform function Target.sub.0(t) by an iterative Fourier transform method using the previously obtained phase spectrum function ?.sub.IFTA(?) (process number (23)).
[0138] Referring to
[0139] The subscript k indicates after the k-th Fourier transform processing. Before the first Fourier transform processing, the intensity spectrum function A.sub.k=0(?) described above is used as the intensity spectrum function A.sub.k(?). i is an imaginary number.
[0140] Then, Fourier transform from the frequency domain to the time domain is performed on the function (o) (arrow A5 in Figure). As a result, a waveform function (p) in the time domain, which includes the temporal intensity waveform function b.sub.k(t), is obtained (process number (33) in Figure).
[0141] Subsequently, the temporal intensity waveform function b.sub.k(t) included in the function (p) is replaced with the temporal intensity waveform function Target.sub.0(t) based on a desired waveform (process numbers (34) and (35) in Figure).
[0142] Subsequently, inverse Fourier transform from the time domain to the frequency domain is performed on a function (r) (arrow A6 in Figure). As a result, a waveform function (s) in the frequency domain, which includes an intensity spectrum function C.sub.k(?) and the phase spectrum function ?.sub.k(?), is obtained (process number (36) in Figure).
[0143] Subsequently, in order to restrain the phase spectrum function ?.sub.k(?) included in the function (s), the phase spectrum function ?.sub.k(?) is replaced with the initial phase spectrum function ?.sub.0(?) (process number (37a) in Figure).
[0144] In addition, filter processing based on the intensity spectrum of the input light is performed on the intensity spectrum function C.sub.k(?) in the frequency domain after the inverse Fourier transform. Specifically, in the intensity spectrum represented by the intensity spectrum function C.sub.k(?), a portion exceeding a cutoff intensity for each wavelength determined based on the intensity spectrum of the input light is cut. In an example, the cutoff intensity for each wavelength is set to coincide with the intensity spectrum (for example, the initial intensity spectrum function A.sub.k=0((?)) of the input light. In this case, as represented in the following formula (u), at frequencies where the intensity spectrum function C.sub.k(?) is larger than the intensity spectrum function A.sub.k=0(?), the value of the intensity spectrum function A.sub.k=0(?) is taken as the value of the intensity spectrum function A.sub.k(?). At frequencies where the intensity spectrum function C.sub.k(?) is equal to or smaller than the intensity spectrum function A.sub.k=0((?), the value of the intensity spectrum function C.sub.k(?) is taken as the value of the intensity spectrum function A.sub.k(?) (process number (37b) in Figure).
[0145] The intensity spectrum function C.sub.k(?) included in the function (s) is replaced with the intensity spectrum function A.sub.k(?) after the filter processing in accordance with the above formula (u).
[0146] Thereafter, by repeatedly performing the above processes (32) to (37b), the phase spectrum shape represented by the intensity spectrum function A.sub.k(?) in the waveform function can be brought close to the intensity spectrum shape corresponding to the desired temporal intensity waveform. Finally, the intensity spectrum function A.sub.IFTA(?) is obtained.
[0147] Refer to
[0148] The Fourier transform unit 29a of the target generation unit 29 performs the Fourier transform on the waveform function (v). As a result, a fourth waveform function (w) in the time domain is obtained (process number (25)).
[0149] The spectrogram modification unit 29b of the target generation unit 29 converts the fourth waveform function (w) into a spectrogram SG.sub.IFTA(?, t) by time-frequency transform (process number (26)). Then, in the process number (27), the target spectrogram TargetSG.sub.0(?, t) is generated by correcting the spectrogram SG.sub.IFTA(?, t) based on the time function p.sub.0(t) including the desired frequency (wavelength) band information. For example, a characteristic pattern appearing in the spectrogram SG.sub.IFTA(?, t) configured by two-dimensional data is partially cut out, and a frequency component of this portion is operated based on the time function p.sub.0(t). Specific examples thereof will be described below in detail.
[0150] For example, consider a case where a triple pulse having a time interval of 2 picoseconds is set as the desired temporal intensity waveform function Target.sub.0(t). In that case, the spectrogram SG.sub.IFTA(?, t) has a result as illustrated in
[0151] In a case where it is desired to control only the temporal intensity waveform of the output light (to simply obtain a triple pulse), it is not necessary to operate the domains D.sub.1, D.sub.2, and D.sub.3. However, in a case where it is desired to control the frequency (wavelength) band of each pulse, it is necessary to operate the domains D.sub.1, D.sub.2, and D.sub.3. That is, as illustrated in
[0152] For example, when the time function p.sub.0(t) is described such that the peak wavelength of the domain D.sub.2 is kept at 800 nm and the peak wavelengths of the domains D.sub.1 and D.sub.3 are translated by ?2 nm and +2 nm, respectively, the spectrogram SG.sub.IFTA(?, t) changes to the target spectrogram TargetSG.sub.0(?, t) illustrated in
[0153] Effects obtained by the dispersion measurement device 1A and the dispersion measurement method in the present embodiment described above will be described.
[0154] When the wavelength dispersion amount of the optical component 7 is measured, optical pulses Pb.sub.1 and Pb.sub.2 having a time difference and having center wavelengths different from each other are transmitted through the optical component 7. Then, the wavelength dispersion amount of the optical component 7 can be estimated based on the temporal waveform (for example, peak interval) of the correlated light Pc obtained from the optical pulses Pb.sub.1 and Pb.sub.2. However, in the conventional dispersion measurement device, when the optical pulses Pb.sub.1 and Pb.sub.2 are transmitted through the optical component 7, the pulse widths of the optical pulses Pb.sub.1 and Pb.sub.2 gradually increase and the peak intensities of the optical pulses Pb.sub.1 and Pb.sub.2 gradually decrease due to the wavelength dispersion of the optical component 7.
[0155] In the dispersion measurement device 1A and the dispersion measurement method of the present embodiment, in the pulse forming unit 3 (pulse forming step S102), a group delay dispersion having a sign opposite to that of the group delay dispersion of the optical component 7 is given to the optical pulse Pa. As a result, the peak intensities of the light pulses Pb.sub.1 and Pb.sub.2 incident on the optical component 7 temporarily decrease and the pulse widths of the light pulses Pb.sub.1 and Pb.sub.2 incident on the optical component 7 temporarily increase. However, during a period from when the optical pulses Pb1 and Pb.sub.2 enter the optical component 7 to when the optical pulses Pb1 and Pb.sub.2 exit the optical component 7, the peak intensity of each of the optical pulses Pb.sub.1 and Pb.sub.2 increases and the pulse width of each of the optical pulses Pb.sub.1 and Pb.sub.2 decreases due to the group delay dispersion of the optical component 7. As described above, according to the present embodiment, since the pulse widths of the light pulses Pb.sub.1 and Pb.sub.2 emitted from the optical component 7 are reduced, it is possible to suppress a decrease in the detection accuracy of the peak interval of the light pulses Pb.sub.1 and Pb.sub.2 (in the present embodiment, the peak interval of the plurality of light pulses included in the correlated light Pc). Since the peak intensities of the light pulses Pb.sub.1 and Pb.sub.2 emitted from the optical component 7 increase, it is possible to suppress a decrease in the detection accuracy of the temporal waveform of the light pulse train Pb (in the present embodiment, the temporal waveform of the correlated light Pc). Therefore, it is possible to accurately measure the wavelength dispersion amount of the optical component 7.
[0156] Effects of the dispersion measurement device 1A and the dispersion measurement method according to the present embodiment will be described in detail.
[0157]
[0158] The magnitude of the group delay dispersion of the optical component 7 also affects a change rate of the peak interval of the correlated light Pc with respect to the change of the group delay dispersion of the optical component 7. White circle plots D41 in
[0159] On the other hand, when the group delay dispersion of ?20000 fs.sup.2, for example, is given to the optical pulse Pa, the relationship between the group delay dispersion of the optical component 7 and the change amount of the peak interval of the correlated light Pc is shifted by 20000 fs.sup.2 as indicated by the black square plots D42 in
[0160] As in the present embodiment, the light detection unit 4 may include a correlation optical system 40 that receives the optical pulse train Pb and outputs correlated light Pc including cross-correlation or autocorrelation of the optical pulse train Pb, and may detect the temporal waveform of the correlated light Pc as the temporal waveform of the optical pulse train Pb. Then, the arithmetic operation unit 5b may estimate the wavelength dispersion amount of the optical component 7 based on the feature amount of the temporal waveform of the correlated light Pc. Similarly, in the detection step S103, the correlated light Pc including cross-correlation or autocorrelation of the optical pulse train Pb may be generated, and the temporal waveform of the correlated light Pc may be detected as the temporal waveform of the optical pulse train Pb. In the arithmetic operation step S104, the wavelength dispersion amount of the optical component 7 may be estimated based on the feature amount of the temporal waveform of the correlated light Pc. In this case, for example, even when the optical pulses Pb.sub.1 and Pb.sub.2 are ultrashort pulses on the order of femtoseconds, the temporal waveform of the optical pulse train Pb can be measured. Therefore, it is possible to more accurately measure the wavelength dispersion amount of the optical component 7 by using the ultrashort pulse.
[0161] As described above, the absolute value of the group delay dispersion given to the optical pulse Pa by the phase pattern may be within the predicted range of the absolute value of the group delay dispersion of the optical component 7. In this case, the absolute value of the group delay dispersion given to the optical pulse Pa by the phase pattern can be brought close to the absolute value of the group delay dispersion of the optical component 7. Therefore, in the optical component 7, it is possible to further reduce the pulse widths of the light pulses Pb.sub.1 and Pb.sub.2, and it is possible to further suppress a decrease in detection accuracy of the peak interval of the light pulses Pb.sub.1 and Pb.sub.2 (in the present embodiment, the peak interval of the plurality of light pulses included in the correlated light Pc). The peak intensities of the light pulses Pb.sub.1 and Pb.sub.2 in the optical component 7 can be further increased, and a decrease in the detection accuracy of the temporal waveform of the light pulse train Pb (in the present embodiment, the temporal waveform of the correlated light Pc) can be further suppressed.
[0162] As in the present embodiment, the absolute value of the group delay dispersion given to the optical pulse Pa by the phase pattern may be equal to the absolute value of the group delay dispersion in the design of the optical component 7. Also in this case, the absolute value of the group delay dispersion given to the optical pulse Pa by the phase pattern can be brought close to the absolute value of the group delay dispersion of the optical component 7. Therefore, it is possible to further reduce the pulse widths of the light pulses Pb.sub.1 and Pb.sub.2 in the optical component 7, and it is possible to further suppress a decrease in detection accuracy of the peak interval of the light pulses Pb.sub.1 and Pb.sub.2 (in the present embodiment, the peak interval of the plurality of light pulses included in the correlated light Pc). The peak intensities of the light pulses Pb.sub.1 and Pb.sub.2 in the optical component 7 can be further increased, and a decrease in the detection accuracy of the temporal waveform of the light pulse train Pb (in the present embodiment, the temporal waveform of the correlated light Pc) can be further suppressed.
[0163] As in the present embodiment, the optical component 7 may be arranged on the optical path between the pulse forming unit 3 and the light detection unit 4. In the detection step S103, the temporal waveform of the optical pulse train Pb transmitted through the optical component 7 (in the present embodiment, the temporal waveform of the correlated light Pc) may be detected. According to the present embodiment, like this, for example, the optical component 7 to be measured can be arranged at an arbitrary position on the optical path. Therefore, the degree of freedom in spatial design of the device is high, and it is possible to design the device so as to reduce the size of the device and improve convenience such as ease of attachment and ease of removal of the optical component 7.
[0164] As in the present embodiment, the dispersion measurement device 1A may include a control unit 5a that stores the first phase pattern for applying positive group delay dispersion to the optical pulse Pa and the second phase pattern for applying negative group delay dispersion to the optical pulse Pa, and selectively outputs the first phase pattern and the second phase pattern to the SLM 14. In this case, the phase pattern can be easily switched between the case where the optical component 7 has positive group delay dispersion and the case where the optical component 7 has negative group delay dispersion.
FIRST MODIFICATION
[0165] According to the inventors' findings, various feature amounts (for example, a pulse interval of the optical pulses Pb.sub.1 and Pb.sub.2, a peak intensities of the optical pulses Pb.sub.1 and Pb.sub.2, pulse widths of the optical pulses Pb.sub.1 and Pb.sub.2, and the like) of the temporal waveform of the optical pulse train Pb also have a significant correlation with the wavelength dispersion amount of the optical component 7. Therefore, the wavelength dispersion amount of the optical component 7 can be estimated by evaluating the temporal waveform of the optical pulse train Pb instead of the correlated light Pc.
[0166]
[0167] In a case where the light detection unit 4A does not include the correlation optical system 40 as in the present modification, in the detection step S103 illustrated in
[0168] In this modification, in the arithmetic operation step S104 shown in
[0169] In the present modification, as the above-described embodiment, since the pulse widths of the light pulses Pb.sub.1 and Pb.sub.2 emitted from the optical component 7 are reduced, it is possible to suppress a decrease in the detection accuracy of the peak interval of the light pulses Pb.sub.1 and Pb.sub.2. Since the peak intensities of the optical pulses Pb.sub.1 and Pb.sub.2 emitted from the optical component 7 increase, it is possible to suppress a decrease in the detection accuracy of the temporal waveform of the optical pulse train Pb. Therefore, it is possible to accurately measure the wavelength dispersion amount of the optical component 7.
SECOND MODIFICATION
[0170]
[0171] In the present modification, after the optical pulse Pa is transmitted through the optical component 7, the pulse forming unit 3 forms the optical pulse train Pb from the optical pulse Pa in the pulse forming step S102. At this time, a group delay dispersion having a sign opposite to that of the group delay dispersion of the optical component 7 is given to the optical pulse Pa. Then, in the detection step S103, the correlation optical system 40 generates the correlated light Pc from the optical pulse train Pb, and the detector 400 detects the temporal waveform of the correlated light Pc. Alternatively, as in the first modification, the correlation optical system 40 may not be provided, and the temporal waveform of the optical pulse train Pb may be detected by the detector 400. The arithmetic operation unit 5b estimates the wavelength dispersion amount of the optical component 7 from the temporal waveform of the correlated light Pc or the optical pulse train Pb.
[0172] As in the present modification, the optical component 7 to be measured may be arranged on the optical path between the pulsed laser light source 2 and the pulse forming unit 3. Even in this case, as in the above-described embodiment, since the pulse widths of the light pulses Pb.sub.1 and Pb.sub.2 emitted from the optical component 7 are reduced, it is possible to suppress a decrease in detection accuracy of the peak interval of the light pulses Pb.sub.1 and Pb.sub.2 (or the peak interval of the plurality of light pulses included in the correlated light Pc). Since the peak intensities of the light pulses Pb.sub.1 and Pb.sub.2 emitted from the optical component 7 increase, it is possible to suppress a decrease in the detection accuracy of the temporal waveform of the light pulse train Pb (or the temporal waveform of the correlated light Pc). Therefore, it is possible to accurately measure the wavelength dispersion amount of the optical component 7.
INDUSTRIAL APPLICABILITY
[0173] The embodiment can be used as a dispersion measurement device and a dispersion measurement method capable of more accurately measuring a wavelength dispersion amount of a measurement object.
REFERENCE SIGNS LIST
[0174] 1A, 1B: dispersion measurement device, 2: pulsed laser light source, 3: pulse forming unit, 3a: light input end, 3b: light output end, 4, 4A: light detecting unit, 4a: light input end, 5: control device, 5a: control unit, 5b: arithmetic operation unit, 5c: input unit, 5d: output unit, 7: optical component, 7a: light input end, 7b: light output end, 12: diffraction grating, 13: lens, 14: spatial light modulator (SLM), 15: lens, 16: diffraction grating, 17: modulation surface, 17a: modulation region, 20: modulation pattern calculation apparatus, 21: arbitrary waveform input unit, 22: phase spectrum design unit, 23: intensity spectrum design unit, 24: modulation pattern generation unit, 25: fourier transform unit, 26: function replacement unit, 27: waveform function modification unit, 28: inverse fourier transform unit, 29: target generation unit, 29a: fourier transform unit, 29b: spectrogram modification unit, 40, 40A, 40B, 40C: correlation optical system, 40b: light output end, 40c to 40f: optical path, 41: lens, 42: optical element, 43: lens, 44: beam splitter, 45, 46: mirror, 47, 49: moving stage, 48: mirror, 51: processor (CPU), 52: ROM, 53: RAM, 54: input device, 55: output device, 56: communication module, 57: auxiliary storage device, 400: detector, A, B: direction, P1: light, P2: modulated light, Pa: optical pulse (first optical pulse), Pb, Pba, Pbb: optical pulse train, Pb.sub.1, Pb.sub.2: optical pulse (second optical pulse), Pc: correlated light, Pd: optical pulse train, Pd.sub.1, Pd.sub.2: optical pulse, Pr: reference optical pulse, S101: output step, S102: forming step, S103: detection step, S104: arithmetic operation step, SC: control signal.