Circuitry including at least a delta-sigma modulator and a sample-and-hold element

11533061 · 2022-12-20

Assignee

Inventors

Cpc classification

International classification

Abstract

A circuitry for an incremental delta-sigma modulator includes at least an incremental delta-sigma modulator and a sample-and-hold element, the sample-and-hold element being arranged in front of the incremental delta-sigma modulator and providing an input voltage for the incremental delta-sigma modulator in the charged state, wherein the sample-and-hold element includes a capacitor for charging the input voltage for the incremental delta-sigma modulator, wherein a first switch is arranged in front of the capacitor, and a second switch is arranged behind the capacitor, wherein the first switch is open when the second switch is closed so as to provide, at the incremental delta-sigma modulator, an input voltage decreasing in amount, in particular a decaying input voltage, or wherein the second switch is open when the first switch is closed so as to charge the capacitor of the sample-and-hold element. In addition, a method of operating a circuitry for an incremental delta-sigma modulator is proposed.

Claims

1. Circuitry for an incremental delta-sigma modulator, the circuitry comprises at least an incremental delta-sigma modulator and a sample-and-hold element, the sample-and-hold element being arranged in front of the incremental delta-sigma modulator and providing an input voltage for the incremental delta-sigma modulator in a charged state, wherein the sample-and-hold element comprises a capacitor for charging the input voltage for the incremental delta-sigma modulator, wherein a first switch is arranged in front of the capacitor, and a second switch is arranged behind the capacitor, wherein the first switch is open when the second switch is closed so as to provide, at the incremental delta-sigma modulator, an input voltage decreasing in amount, in particular a decaying input voltage, or wherein the second switch is open when the first switch is closed so as to charge the capacitor of the sample-and-hold element, wherein the capacitor is configured such that a time constant for discharging the capacitor of the sample-and-hold element corresponds to an AD conversion.

2. Circuitry as claimed in claim 1, wherein the incremental delta-sigma modulator may be reset after each AD conversion.

3. Circuitry as claimed in claim 1, wherein the incremental delta-sigma modulator is an n.sup.th-order modulator, wherein n is a natural number, in particular n=1, 2, 3, 4, 5, or 6.

4. Circuitry as claimed in claim 1, wherein the sample-and-hold element is integrated in the incremental delta-sigma modulator or may be externally connected to the incremental delta-sigma modulator.

5. Circuitry as claimed in claim 1, wherein the incremental delta-sigma modulator comprises, in particular at its output, a decimation filter, wherein weighting of output bits within the decimation filter is adaptable because the input voltage decreases in amount.

6. Circuitry as claimed in claim 5, wherein the output bits exhibit, at the end of the AD conversion, a valency that is increased as compared to the weighting in case of a static input voltage that is present at the incremental delta-sigma modulator.

7. Circuitry as claimed in claim 5, wherein, for adapting weighting, an integrator of a decimation filter of the delta-sigma modulator is replaced by a so-called lossy integrator, wherein, in particular, an edge frequency f.sub.C=1/(2πRC) is defined by a time constant constituted by the input resistor R and by the capacitor C.

8. Method of operating a circuitry comprising at least an incremental delta-sigma modulator and a, in particular passive, sample-and-hold element, wherein the sample-and-hold element is arranged in front of an input of the incremental delta-sigma modulator; in particular, the circuitry being configured for an incremental delta-sigma modulator, the circuitry comprises at least an incremental delta-sigma modulator and a sample-and-hold element, the sample-and-hold element being arranged in front of the incremental delta-sigma modulator and providing an input voltage for the incremental delta-sigma modulator in a charged state, wherein the sample-and-hold element comprises a capacitor for charging the input voltage for the incremental delta-sigma modulator, wherein a first switch is arranged in front of the capacitor, and a second switch is arranged behind the capacitor, wherein the first switch is open when the second switch is closed so as to provide, at the incremental delta-sigma modulator, an input voltage decreasing in amount, in particular a decaying input voltage, or wherein the second switch is open when the first switch is closed so as to charge the capacitor of the sample-and-hold element, the method comprising: providing an input voltage at the incremental delta-sigma modulator, in particular by the capacitor of the sample-and-hold element, using an input voltage decreasing in amount so as to ensure random behavior of an output bitstream, wherein the capacitor is charged during a resetting phase of the delta-sigma modulator and is connected to the delta-sigma modulator during a conversion; wherein the capacitor of the sample-and-hold element is selected such that a time constant for discharging the capacitor of the sample-and-hold element corresponds to a duration of an AD conversion.

9. Method as claimed in claim 8, wherein weighting of the output bits is adapted by means of a decimation filter; in particular, a valency that is increased as compared to weighting performed in the event of a constant input voltage is assigned to output bits at the end of an AD conversion.

10. Method as claimed in claim 8, wherein, for adapting weighting, an integrator of a decimation filter is replaced by a so-called lossy integrator, wherein, in particular, an edge frequency f.sub.C=1/(2πRC) is defined by a time constant constituted by the input resistor R and by the capacitor C.

11. Method as claimed in claim 8, wherein a digital output value is calculated as a weighted sum of the output bitstream.

Description

BRIEF DESCRIPTION OF THE DRAWINGS

(1) Embodiments of the present invention will be detailed subsequently referring to the appended drawings, in which:

(2) FIG. 1 shows a 3.sup.rd-order IDSM having an active sample-and-hold stage,

(3) FIG. 2 shows a typical decimation filter for a 3.sup.rd-order IDSM,

(4) FIGS. 3a and 3b shows an output signal and a variance with different input signals while using an active sample-and-hold stage known from conventional technology,

(5) FIG. 4 shows a typical output bitstream with an input signal with 90% full scale (FS),

(6) FIG. 5 shows an IDSM with a proposed passive sample-and-hold stage,

(7) FIG. 6 shows the progress of the sampled voltage during an AD conversion with an input signal with 90% FS and a passive sample-and-hold stage in accordance with FIG. 5,

(8) FIG. 7 shows an arising, quasi-random bitstream while using an IDSM in accordance with FIG. 5 and a voltage decreasing in amount in accordance with FIG. 6,

(9) FIG. 8 shows a decimation filter with a lossy integrator for an IDSM having a passive sample-and-hold stage,

(10) FIG. 9 shows an output signal and a variance with different input signals while using an inventive passive sample-and-hold stage.

DETAILED DESCRIPTION OF THE INVENTION

(11) The present invention will be described below while combining FIGS. 1 to 9, wherein FIGS. 1, 3, and 4 show a circuitry known from conventional technology (FIG. 1) and its measurable output signal and/or its variance (FIGS. 3a, 3b) as well as a typical output bitstream (FIG. 4).

(12) FIG. 1 shows an embodiment, known from conventional technology, of a circuitry 10 for an incremental delta-sigma modulator (IDSM) 1. The IDSM 1 includes, as shown in FIG. 1, three integrators 2, each of which comprises, in turn, a capacitor 3 and a switch 4. Following conversion of a sample, i.e. following an AD conversion, the integrators 2 are reset. To simplify matters, the IDSM has been drawn without the zeros that may be used for stability. The capacitor 3 of the integrator 2 serves as an analog memory wherein the input voltage U.sub.on is added over time. This results in integration over time t. Moreover, the IDSM includes, as is known and as does any DSM, input resistors 5 and a comparator 6. In addition, the IDSM includes a feedback component 8. In the simplest case, a feedback component 8 consists of two voltage sources providing a positive and a negative maximum signal, respectively. It is feasible, for example, to simply use GND and the supply voltage as a positive and negative maximum signal, respectively, and a controlled switch which applies some voltage to the resistor as a function of the output bit. With multi-bit implementations, a correspondingly larger number of different voltage levels is possible. A—in particular digital—filter 7, in particular a low-pass filter or an integrator, is arranged at the output of the IDSM. The circuitry 10 further includes a sample-and-hold element 9, which is connected upstream from the IDSM 1. The sample-and-hold element 9 provides an input voltage U.sub.on at the input of the IDSM 1. The sample-and-hold element 9 includes, as is known, a switch 11, a capacitor 12, and an active buffer 13, as a result of which a constant input voltage U.sub.on may be provided at the input of the IDSM 1. Within the context of the present application, a buffer is to be understood to mean an amplifier and/or an impedance converter.

(13) The IDSM 1 is a modified form of a delta-sigma modulator, wherein no continuous AD conversion of the input voltage U.sub.on takes place. The IDSM 1 is, or can be, reset after each AD conversion. Within the context of sampling a voltage, a sample is to be understood to mean the instantaneous value of the voltage at the time of sampling. Said instantaneous value is then maintained on the capacitor during the S&H stage. In the example of FIG. 1 which is shown, resetting of the integrators is effected by the switches 4 located above the integration capacitances, or the capacitors 3. Resetting of the IDSM 1 enables multiplexing operation, wherein analog signals of various input sources are converted to the digital domain by means of an IDSM.

(14) In a typical case, what will serve as an input stage for the IDSM 1 is a sample-and-hold element 9, which is also known as a sample-and-hold (S&H) stage, wherein the input voltage U.sub.on to be converted is stored on the capacitor 12 and is connected to the input of the IDSM 1 with the aid of the active buffer 13. The buffer 13 serves to ensure that the stored input voltage U.sub.on is not influenced by the input resistances. Alternatively, it is also possible to dispense with the storage capacitance, or the capacitor 12. The input voltage U.sub.on will then be applied to the buffer 13 during the AD conversion.

(15) FIG. 2 shows a possible filter 7 which may be employed at the output of the IDSM 1, namely a decimation filter 7′. An advantage of IDSM 1 as compared to DSMs is the possibility of being able to employ the simpler digital decimation filter 7′ for processing the bitstream. A typical decimation filter 7′ for a 3.sup.rd-order IDSM consists of three digital integrators 20, as shown in FIG. 2. The number of integrators 20 determines the order of the filter 7, 7′. The integrators 20 may be implemented as summators. As with the analog part of the IDSM 1, the summators are reset after each AD conversion is completed. The digital output Out of the decimation filter 7′ is calculated as Out=ΣΣΣBit.sub.N. By way of substitution, the three integrators 20 may also be replaced by using a look-up table (LUT) and one single summator since the influence of each bit on the digital output signal may be pre-calculated.

(16) FIG. 3 shows a typical output signal with an associated variance when using a known circuitry 10 for an IDSM 1 comprising a known sample-and-hold element 9. A known disadvantage of DSMs and also of IDSMs is that when an input signal is present in the vicinity of the so-called full-scale value, increased noise occurs in the digital output signal. The full-scale value corresponds to a maximally possible resetting voltage. FIG. 3a shows the relationship between a normalized input signal and a normalized output value (output), and FIG. 3b shows the relationship between a normalized input signal and the variance of the digital output signal (of FIG. 3a) with a 3.sup.rd-order IDSM. On the x axes of FIGS. 3a, b, a maximum positive input signal adopts the value of +1, and a maximum negative input signal adopts the value of −1. (On the y axis of FIG. 3a, a normalized output signal is presented, while on the y axis of FIG. 3b, the variance of the output signal (output) is depicted with manifold conversion of the same value. The variance is also shown to be normalized.

(17) One can see that with high input signals, i.e. with a maximum positive voltage and with a minimum negative voltage, a clear increase in the variance occurs. The variance indicates the fluctuation of the output value with various AD conversions at a same, i.e. constant, input value. However, this is problematic in case a signal and an associated reference signal are to be converted, which is also referred to as double sampling. The reference signal typically is located in the vicinity of the full-scale signal, and the actual signal is typically more positive than the reference signal (unipolar measurement). In this case, the overall noise of the calculated end signal would typically be dominated by the noise of the reference signal, even if the signal lies within the medium range of the IDSM 1 and if a small noise contribution might be achieved there. This results in that a large range of the input signal range (approx. 40-50%) cannot be employed in a useful manner due to the high level of noise.

(18) FIG. 4 shows the known temporal progress of an (output) bitstream with an input signal having 90% full scale (FS), i.e. with an input voltage of 90% of the maximally possible resetting voltage. Normally, the bitstream of a DSM and/or a IDSM 1 exhibits a quasi-random behavior. Said random behavior is the basis for interpreting and calculating the behavior of the DSM. With input signals located in the vicinity of the full-scale value, this random behavior no longer occurs. By way of example, FIG. 4 shows an output bitstream with an input signal having 90% FS. Almost all output bits here are at one value, namely 1.

(19) FIG. 5 shows an embodiment of a circuitry 10 in accordance with the proposal for an incremental delta-sigma modulator 1. So as to ensure the quasi-random behavior of the output bitstream even with input signals located in the vicinity of FS, a decaying input signal (a decaying input voltage U.sub.on as shown in FIG. 6) is used. This is achieved by dispensing with the active buffer 13 (as compared to FIG. 1) between the sampling capacitor 12 and the input resistor 5 of the IDSM 1, as shown in FIG. 5. In accordance with the proposal, a switch 14 is integrated into the sample-and-hold element instead of an active buffer 13 (FIG. 1), so that the capacitor 12 will be arranged between the switches 11 and 14. According to the proposal, a passive sample-and-hold element 9′ (FIG. 5) is used, instead of a known active sample-and-hold element 9 (FIG. 1), for supplying the IDSM 1 with an input voltage U.sub.on. When using an active sample-and-hold element 9, the IDSM is supplied with a constant input voltage U.sub.on, whereas the IDSM 1 is supplied with a temporally decaying input voltage U.sub.on in case a passive sample-and-hold element 9′ in accordance with the proposal is used. The capacitor 12 is charged to the input voltage U.sub.on during the reset phase of the IDSM 1 and is connected to the input resistor 5 of the IDSM 1 during conversion. The sampling capacitor 12 advantageously is selected such that the time constant constituted by the sampling capacitor 12 and the input resistor 5 of the IDSM 1 corresponds to the conversion period duration T, in particular to the AD conversion duration, which is defined as the number of bits/clock frequency.

(20) By discharging the capacitor 12 during the AD conversion, the voltage U.sub.on present on the capacitor 12 decreases from the sampled starting value, as shown in FIG. 6. Since the voltage U.sub.on present on the capacitor 12 decreases during the conversion, i.e. during the AD conversion, it is ensured that the arising bitstream of the IDSM 1 will again exhibit a quasi-random pattern after several clocks, as shown in FIG. 7.

(21) Due to the input signal U.sub.on of the IDSM 1, which is now temporally variable and is given by the decrease in the capacitor discharge, it is useful to adapt the weighting of the output bits within the decimation filter 7′. Due to the decreasing input signal U.sub.on, the bits will involve, at the end of the AD conversion, an increased valency as compared to weighting in the event of a constant input signal U.sub.on. As shown in FIG. 8, for the purpose of adapting the weighting, one of the integrators 20 of the decimation filter 7″ (as compared to decimation filter 7′ of FIG. 2) is replaced by a “lossy integrator” 21. The edge frequency of the “lossy integrator” 21 here is advantageously defined by the time constant constituted by the input resistor 5 and the sampling capacitor 12, namely by f.sub.C=1/(2πRC). One may freely select which of the integrators 20 will be replaced. As with the decimation filter 7′ of FIG. 2, calculation of the digital output value as a weighted sum of the bitstream is also possible with the decimation filter 7″ of FIG. 8.

(22) When using a passive sample-and-hold element 9′, or a passive S&H stage 9′, as well as, in particular, when adapting the decimation filter 7″, one achieves a clear improvement in the variance of the digital output value in the vicinity of FS. FIG. 9 shows the variance of the digital output value when using a passive sample-and-hold element 9′, or a passive S&H stage 9′. The reduced variance with input values in the vicinity of the FS value enables using the entire input range. Due to the larger usable range, over-dimensioning of the IDSM, which might otherwise be performed, can be avoided. In addition, improved optimization of the analog circuit components with regard to thermal noise and power consumption is possible. Moreover, both power and circuit area as well as development time can be saved as a result of the active buffer 13 being dispensed with.

(23) While this invention has been described in terms of several embodiments, there are alterations, permutations, and equivalents which fall within the scope of this invention. It should also be noted that there are many alternative ways of implementing the methods and compositions of the present invention. It is therefore intended that the following appended claims be interpreted as including all such alterations, permutations and equivalents as fall within the true spirit and scope of the present invention.