Inertial Measurement Circuit, Corresponding Device and Method
20220390234 · 2022-12-08
Inventors
- Giacomo LANGFELDER (Milano, IT)
- Leonardo Gaffuri Pagani (Sesto San Giovanni, IT)
- Luca Guerinoni (Alzano Lombaro, IT)
- Luca Giuseppe Falorni (Limbiate (MB), IT)
- Patrick FEDELI (Senago, IT)
- Paola Carulli (Bari, IT)
Cpc classification
International classification
Abstract
In an embodiment a circuit includes an inertial measurement unit configured to be oscillated via a driving signal provided by driving circuitry, a lock-in amplifier configured to receive a sensing signal from the inertial measurement unit and a reference demodulation signal which is a function of the driving signal and provide an inertial measurement signal based on the sensing signal, wherein the reference demodulation signal is affected by a variable phase error, phase meter circuitry configured to receive the driving signal and the sensing signal and provide, as a function of a phase difference between the driving signal and the sensing signal, a phase correction signal for the reference demodulation signal and a correction node configured to apply the phase correction signal to the reference demodulation signal so that, in response to the phase correction signal being applied to the reference demodulation signal, the phase error is maintained in a vicinity of a reference value.
Claims
1. A circuit comprising: an inertial measurement unit configured to be oscillated via a driving signal provided by driving circuitry; a lock-in amplifier configured to: receive a sensing signal from the inertial measurement unit and a reference demodulation signal which is a function of the driving signal; and provide an inertial measurement signal based on the sensing signal, wherein the reference demodulation signal is affected by a variable phase error; phase meter circuitry configured to: receive the driving signal and the sensing signal; and provide, as a function of a phase difference between the driving signal and the sensing signal, a phase correction signal for the reference demodulation signal; and a correction node configured to apply the phase correction signal to the reference demodulation signal so that, in response to the phase correction signal being applied to the reference demodulation signal, the phase error is maintained in a vicinity of a reference value.
2. The circuit of claim 1, further comprising a trimming node arranged between the phase meter circuitry and the correction node, wherein the trimming node is configured to trim the phase correction signal by a reference phase correction value.
3. The circuit of claim 1, further comprising sensing circuitry arranged between the inertial measurement unit and the lock-in amplifier, wherein the sensing circuitry is configured to provide the sensing signal.
4. The circuit of claim 3, wherein the sensing circuitry is configured to provide the sensing signal to both, the lock-in amplifier and the phase meter circuitry.
5. The circuit of claim 1, wherein the phase meter circuitry is coupled to input signal paths for the driving signal and the sensing signal, respectively, the input signal paths comprising: bandpass filter circuitry; and/or saturation circuitry.
6. The circuit of claim 5, wherein the saturation circuitry comprises a cascaded arrangement of an instrumentation amplifier and a high-gain stage.
7. The circuit of claim 1, wherein the phase meter circuitry comprises a digital phase meter.
8. The circuit of claim 1, wherein the inertial measurement unit comprises a MEMS gyroscope.
9. A device comprising: the circuit according to claim 1; and user circuitry coupled to the lock-in amplifier in the circuit, wherein the user circuitry is configured to exploit the inertial measurement signal produced by the lock-in amplifier.
10. A method comprising: oscillating an inertial measurement unit via a driving signal provided by driving circuitry; receiving, by a lock-in amplifier, a sensing signal from the inertial measurement unit and a reference demodulation signal which is a function of the driving signal; providing, by the lock-in amplifier, an inertial measurement signal based on the sensing signal and the reference demodulation signal, wherein the reference demodulation signal is affected by a variable phase error, receiving, by a phase meter circuitry, the driving signal and the sensing signal, and providing, as a function of a phase difference between the driving signal and the sensing signal, a phase correction signal for the reference demodulation signal; and applying, by a correction node, the phase correction signal to the reference demodulation signal of the lock-in amplifier so that, in response to the phase correction signal being applied to the reference demodulation signal of the lock-in amplifier, the phase error is maintained in a vicinity of a reference value.
11. The method of claim 10, further comprising trimming, by a trimming node, the phase correction signal by a reference phase correction value.
12. The method of claim 10, further comprising providing, by a sensing circuitry arranged between the inertial measurement unit and the lock-in amplifier, the sensing signal.
13. The method of claim 12, wherein the sensing circuitry provides the sensing signal to both, the lock-in amplifier and the phase meter circuitry.
Description
BRIEF DESCRIPTION OF THE DRAWINGS
[0042] One or more embodiments will now be described, by way of example only, with reference to the annexed figures, wherein:
[0043]
[0044]
[0045]
[0046]
[0047] Corresponding numerals and symbols in the different figures generally refer to corresponding parts unless otherwise indicated. The figures are drawn to clearly illustrate the relevant aspects of the embodiments and are not necessarily drawn to scale. The edges of features drawn in the figures do not necessarily indicate the termination of the extent of the feature.
DETAILED DESCRIPTION OF ILLUSTRATIVE EMBODIMENTS
[0048] In the ensuing description, various specific details are illustrated in order to provide an in-depth understanding of various examples of embodiments according to the description. The embodiments may be obtained without one or more of the specific details, or with other methods, components, materials, etc. In other cases, known structures, materials, or operations are not illustrated or described in detail so that various aspects of the embodiments will not be obscured.
[0049] Reference to “an embodiment” or “one embodiment” in the framework of the present description is intended to indicate that a particular configuration, structure, or characteristic described in relation to the embodiment is comprised in at least one embodiment. Hence, phrases such as “in an embodiment”, “in one embodiment”, or the like, that may be present in various points of the present description do not necessarily refer exactly to one and the same embodiment. Furthermore, particular configurations, structures, or characteristics may be combined in any adequate way in one or more embodiments.
[0050] The headings/references used herein are provided merely for convenience and hence do not define the extent of protection or the scope of the embodiments.
[0051] For the sake of brevity and simplicity, a same designation may be used in the following to designate both a certain circuit node or line and a signal (a voltage signal, for instance) occurring at that node or line.
[0052] By way of general introduction to the instant detailed description, reference may be had to document US 2020/400434 A1. That document discloses a MEMS gyroscope having a mobile mass carried by a supporting structure to move in a driving direction and in a first sensing direction, perpendicular to each other.
[0053] The structure of such a gyroscope will be assumed to be generally known to those of skill in the art. A detailed description will not be repeated here for brevity.
[0054] For the purposes herein one may briefly recall the principle underlying operation of such gyroscopes: a vibrating body tends to continue vibrating in a same plane even if its support is caused to rotate. Due to the Coriolis effect, the vibrating body exerts an apparent force on the support. The rate of rotation can be determined by measuring the displacement produced by that force.
[0055] Reliable and inexpensive vibrating structure gyroscopes can be manufactured with MEMS technology. These are used in mobile communication devices, electronic games, cameras and various other applications.
[0056] An overview of MEMS gyroscope technology is provided in A. A. Trusov: “Overview of MEMS Gyroscopes: History, Principles of Operations, Types of Measurements” MicroSystems Laboratory, Mechanical and Aerospace Engineering University of California, Irvine, Calif., 92697, USA May 10, 2011 (see uci.edu).
[0057] Also, S. Facchinetti, L. Guerinoni, L. G. Falorni, A. Donadel and C. Valzasina, in: “Development of a complete model to evaluate the Zero Rate Level drift over temperature in MEMS Coriolis Vibrating Gyroscopes” 2017 IEEE International Symposium on Inertial Sensors and Systems (INERTIAL), 2017, pp. 125-128, doi:10.1109/ISISS.2017.7935673 present a comprehensive model to analytically estimate the Zero Rate Level (ZRL) variation over temperature in micro-machined Coriolis Vibratory Gyroscopes (CVG) with associated electronics, with the goal of providing solid guidelines for the development of high-stability MEMS Inertial Measurement Units (IMUs).
[0058] The examples presented herein rely on a compensation method based on the direct measurement of the phase error Φerr.
[0059] Specifically, the method as exemplified exploits the quadrature channel to recover the phase information.
[0060] It was noted that the quadrature channel signal is oftentimes (much) larger than the rate full-scale signal.
[0061] This may be particularly the case if embedded quadrature compensation electrodes are used to decompensate the phase, on purpose. These were found to be easy to increase, “chop” or modulate in order to increase the resolution in phase measurement.
[0062] Various implementation options can be considered.
[0063] In certain examples, no compensation electrodes are provided, and the measurement relies on the quadrature signal that is (unavoidably) present in the system output.
[0064] In other examples, with the provision of quadrature compensation electrodes, quadrature can be deliberately increased (or modulated) to facilitate phase measurements.
[0065] In either case, the procedure can be applied in continuous-time mode or at certain times only (every now and then) having regard to the temperature drift transients involved.
[0066] An underlying principle is thus to aim at keeping null(zero), continuously, via a closed-loop feedback, the term Φerr, so that the offset and its associated drifts are nulled.
[0067] In a conventional, uncompensated configuration as exemplified in
[0068] During a drive mode the gyroscope 12—represented here in a deliberately simplified manner—is sustained in oscillation along a driving direction (which may be assumed to be horizontal in the figure) via a primary phase loop comprising first electrodes 14A, 14B driven by drive stages 16A (D.sub.+) and 16B (D.sub.−) in turn coupled to a variable gain amplifier (VGA) 18.
[0069] Second electrodes 20A, 20B sensitive to the oscillation in the driving direction produce signals that are applied to a differential stage 22 which supplies a phase regulator/gain stage 24, 26. The output from the gain stage closes the loop to the MEMS 12 via the variable gain amplifier 18.
[0070] Oscillation sustained via the primary phase loop just discussed is precisely controlled in amplitude by an automatic gain control (AGC) negative feedback loop comprising a rectifier circuit 28 coupled to the output from the differential amplifier stage 22.
[0071] The output from the rectifier circuit 28 is applied, via a low-pass filter 30, to a first input (inverting, for instance) of a comparator 32 having its second input (non-inverting, for instance) coupled to a reference voltage Vref.
[0072] The output from the comparator 32 in turn controls the gain of the variable-gain amplifier 18.
[0073] As illustrated, sensing in the sensing direction (which may be assumed to be vertical in the figures) is via an open loop chain, including third electrodes 34A, 34B.
[0074] The signals produced by the third electrodes 34A, 34B are applied to a fully differential stage 36 which supplies differential output signals S.sub.+, S.sub.− to a lock-in amplifier (LIA) 38 which produces the desired output signal Vout.
[0075] A LIA is an amplifier capable of extracting a signal with known carrier from a (quite) noisy environment. It can be implemented as a homodyne detector having cascaded an adjustable low-pass filter.
[0076] As illustrated in
[0077] In
[0078] Those of skill in the art will otherwise appreciate that the conventional implementation illustrated in
[0079] A variety of alternative implementations are possible both for the driving chain and for the sensing chain associated with the gyroscope 12: in fact, the examples provided herein are largely “transparent” to the specific implementation of the driving chain and/or the sensing chain.
[0080] It is noted that, in principle, an “optimum” demodulation phase can be calibrated (finding Φopt in a reference condition). Drifts in Φopt, due both to the mechanical elements (the MEMS gyroscope 12, primarily) and the electronic elements in the driving and sensing chains will adversely affect the output signal Vout in operation.
[0081] The principles underlying the embodiments are exemplified in
[0082] As noted, corresponding numerals and symbols in the different figures generally refer to corresponding parts unless otherwise indicated. Consequently, parts or elements like parts or elements already discussed in connection with
[0083] It will be otherwise appreciated that a certain part or element being designated by like numerals or symbols in
[0084] Also, in
[0085] This may be any type of circuitry configured to exploit the inertial measurement (gyroscopic) output signal Vout, in a product such as, for instance, an augmented reality/virtual reality (AR/VR) viewer, a navigation device for the automotive sector, for instance.
[0086] As illustrated in
[0087] As illustrated in
[0088] As likewise illustrated in
[0089] The output from the phase meter 40 is a measure of the phase difference between the signals D.sub.sq and S.sub.sq (see ΔΦ.sub.ds in
[0090] A reference phase delay Φer0 at T.sub.o is added (with sign, namely subtracted) to the output of the phase meter 40 at a trimming node 54 and the result is used to correct the phase of the signal Φopt at T.sub.0 at a node 56.
[0091] The LIA phase regulator thus closes a feedback on the phase of the reference demodulation wave entering the lock-in amplifier 38, so that Φer (the phase difference between the signals D.sub.sq and S.sub.sq) is in the end kept close to Φer0 (a reference phase delay) by the feedback action.
[0092] Briefly, the exemplary circuit 10 of
[0093] The lock-in amplifier 38 receives a sensing signal S.sub.+, S.sub.− from the inertial measurement unit 12 as well as a reference demodulation signal that is a function of the driving signals D.sub.+, D.sub.−, which finally give rise to the signal Dsq.
[0094] The lock-in amplifier 38 is configured to produce the inertial measurement signal Vout based on the sensing signal S.sub.+, S.sub.− from the inertial measurement unit 12 and the reference demodulation signal, which is affected by a variable phase error Φer.
[0095] The phase meter circuitry 40 is configured to receive the driving signal (D.sub.+, D.sub.−>>>Dsq) and the sensing signal (S.sub.+, S.sub.−>>>Ssq) and produce, as a function of the phase difference ΔΦds between the driving signal Dsq and the sensing signal Ssq (see
[0096] A correction node such as 56 is provided configured to apply such a phase correction signal to the reference demodulation signal of the lock-in amplifier 38.
[0097] In response to the phase correction signal being applied to the reference demodulation signal of the lock-in amplifier 38, the associated phase error Φer is maintained in the vicinity of a (constant) reference value, namely Φer0.
[0098] A trimming node 54 can be provided intermediate the phase meter circuitry 40 and the correction node 56, with the trimming node 54 configured to trim the phase correction signal by a reference value Φer0 at T.sub.o.
[0099] A circuit 10 as illustrated in
[0100] As discussed in the following, while advantageous for reliability, such quadrature electrodes (and pads) are not mandatory and can be dispensed with, e.g., in an On/Act/On option combined with electronic compensation as discuses in the following.
[0101] As illustrated in
[0102] Advantageously, the phase meter 40 can be implemented in the digital domain (see
[0103] As illustrated in
[0104] As illustrated, these input signal paths comprise:
[0105] bandpass filter circuitry (e.g., the filters 42A, 42B; 48A, 48B), and/or
[0106] saturation circuitry, optionally comprising a cascaded arrangement of an instrumentation amplifier such as 44 or 50 and a high-gain stage such as 46 or 52.
[0107] The LIA 38 with phase regulator can be implemented either in the analog or in the digital domain.
[0108] The pre-filtering (BPF) stages 42A, 42B, 48A, 48B, the INA amplifiers 44, 50 and the hiG stages 46 and 52 are analog stages.
[0109] As illustrated, pre-filtering (BPF) and saturation (INA+hiG) are applied to the sensing and reference signals before (upstream) the phase meter. This is found to improve the resolution in phase measurements, reducing noise folding.
[0110] Architecture as exemplified in
[0111] In an On/Act/Off approach, combined with electronic compensation, quadrature can be increased intentionally (“on” step) and the optimal phase measured and corrected (“act” step). In a last step, the intentional increase of the quadrature is removed and quadrature itself is again compensated (“off” step).
[0112] This option does not require, in principle, dedicated quadrature electrodes and pads.
[0113] In a stand-alone approach, applied continuously with quadrature modulation, quadrature can be again increased intentionally, with “chopping” applied at a frequency higher than the sensing bandwidth of the Coriolis channel. The modulated quadrature can be used to detect phase and apply a (continuous) correction.
[0114] Of course, this option involves quadrature electrodes and pads.
[0115] A further On/Act/Off approach, combined with electro-mechanical compensation, may be similar to the first approach discussed previously with quadrature again increased and compensated with electro-mechanical methods.
[0116] This (more reliable) option again involves quadrature electrodes and pads.
[0117] Examples as discussed herein thus improve the Zero Rate Output (ZRO) stability of inertial measurement units (IMUs) such as MEMS gyroscopes by intervening essentially at the hardware level.
[0118] Examples as discussed herein are however adapted to co-operate with adequate software in acting on the phase meter and the phase regulator (as exemplified by blocks 38 and 40 in
[0119] It will be appreciated that arrangements as exemplified herein can be applied to multi-axis, multi-parameter IMUs, the instant description being deliberately simplified for the sake of explanation and understanding.
[0120] Without prejudice to the underlying principles, the details and embodiments may vary, even significantly, with respect to what has been described by way of example only, without departing from the extent of protection. The extent of protection is determined by the annexed claims.