Optical sensor interrogation system a method of manufacturing the optical sensor interrogation system
10267709 ยท 2019-04-23
Assignee
Inventors
- Lun Kai Cheng (Delft, NL)
- Remco Alexander Nieuwland (Delft, NL)
- Peter Martijn Toet (Delft, NL)
- Michiel Peter Oderwald (Delft, NL)
Cpc classification
Y10T29/49002
GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
G01D5/35335
PHYSICS
G01M11/30
PHYSICS
International classification
G01M11/00
PHYSICS
G01D5/353
PHYSICS
Abstract
An optical sensor interrogation system can have a light source arranged for emitting light; a first optical arrangement arranged for intercepting the light and to forward the light to an optical sensor and to receive light therefrom. The wavelength reference is adapted to provide a reference wavelength. The system can further have a second optical arrangement adapted to receive reflected light from the optical sensor, a lens system for transferring the light into a beam and a scanning assembly including a scanning unit and/or a diffractive optical element. The system can still further have a detector for receiving optical response from the scanning assembly and a data processing system. A method is used to manufacture an optical sensor interrogation system.
Claims
1. An optical sensor interrogation system for interrogating an optical sensor, the system comprising: a broadband light source and a single beam splitter, the broadband light source being arranged for emitting broadband light to the single beam splitter, wherein the single beam splitter is a single 22 beam splitter, wherein the single beam splitter is configured to simultaneously transmit a first beam of light through a first optical pathway, which is a reference pathway, and a second beam of light through a second optical pathway, which is a data pathway, wherein the first pathway comprises a gas cell, a first optical circulator, and a first photodiode, and the second pathway comprises a second optical circulator, a third optical circulator and a second photodiode, and wherein outputs from each of the first and second photodiodes are combined at an analog to digital converter, which is configured to generate a digital signal, and a first scanner for the first optical pathway and a second scanner for the second optical pathway, wherein the first and second scanners are configured to direct the first and second beams of light from the first and second optical circulators at different angles of incidence onto a first diffractive optical element of the first pathway and a second diffractive optical element of the second pathway, and wherein the first and second scanners are rotating mirrors.
2. The system according to claim 1, wherein the broadband light source is selected from the group consisting of a superluminescent diode (SLD), a source of amplified spontaneous emission (ASE), and a super continuum source.
3. The system according to claim 1, comprising a reference, wherein the reference, the optical sensor, or both comprise one or more Fiber Bragg gratings.
4. The system according to claim 3, wherein the reference, the optical sensor, or both comprise two Fiber Bragg gratings.
5. The system according to claim 3, wherein the reference is enclosed in an a-thermal package for stabilizing wavelength shifts.
6. The system according to claim 4, further comprising a second reference installed in the first optical pathway, after the beam splitter.
7. The system according to claim 1, wherein the first and second scanners comprise a multi-facet rotating mirror.
8. The system according to claim 7, wherein the multi-facet rotating mirror is driven by a motor causing the mirror to rotate about its central axis.
9. The system according to claim 7, wherein the multi-facet mirror is rotating with a constant speed.
10. The system according to claim 1, wherein the first and second scanners comprise rotating mirrors to direct the first and second beams at different angles of incidence onto a stationary diffraction grating, wherein the stationary diffraction grating is arranged at a pre-determined angle with respect to a direction of a light beam reflected from the mirror, wherein the pre-determined angle corresponds to the Littrow configuration.
11. The system according to claim 10, wherein the said angle is about 68.4 degrees for the center of the C-band (1530-1570 nm).
12. The system according to claim 1, comprising a diffraction grating, wherein the diffraction grating comprises at least 1200 lines per millimeter.
13. The system according to claim 12, wherein a temperature of the diffraction grating is maintained at a substantially constant value.
14. The system according to claim 12, wherein a temperature of the diffraction grating is variable, the system further comprises a temperature meter for providing data for enabling temperature correction.
15. The system according to claim 1, wherein the system comprises one or more grating elements, the system further comprising a fixed mirror arranged for measuring of both the +1 and 1 diffraction order of the grating elements.
16. The system according to claim 1, wherein the first and second scanners comprise a plurality of gratings, wherein each grating from the plurality of gratings is arranged such that each grating corresponds to a respective facet of a multi-facet mirror.
17. The system according to claim 1, comprising a reference, wherein the reference comprises at least one optically stabilized laser.
18. The system according to claim 1, comprising a reference, wherein the reference comprises the gas cell.
19. The system according to claim 1, comprising a plurality of signal analysis channels, each signal analysis channel comprising a dedicated optical fiber sensor.
20. The system according to claim 1, including a data processor arranged to calculate the wavelength of the optical sensor using at least the data of the detector, preferably at least in combination with the reference wavelength or an associated parameter such as an angle of the first and second scanners.
21. A method of interrogating an optical sensor, comprising: providing an optical sensor interrogation system according to claim 1; emitting the broadband light to the single beam splitter to produce the first beam of light and the second beam of light; simultaneously transmitting the first beam of light through the first optical pathway, and the second beam of light through the second optical pathway; and generating the digital signal from the analog to digital converter.
22. The optical sensor interrogation system according to claim 1, wherein the system comprises a fixed mirror arranged for measuring of both a +1 diffraction order and a 1 diffraction order.
23. The optical sensor interrogation system according to claim 1, wherein each of the scanners comprises a multi facet rotating element.
24. The optical sensor interrogation system of claim 1, wherein the first diffractive optical element is configured to direct light at different angles of incidence to the first optical circulator through a first collimating lens.
25. The optical sensor interrogation system of claim 24, wherein the second diffractive optical element is configured to direct light at different angles of incidence to the third optical circulator through a second collimating lens.
Description
BRIEF DESCRIPTION OF THE DRAWINGS
(1)
(2)
(3)
(4)
(5)
(6)
(7)
DETAILED DESCRIPTION OF THE DRAWINGS
(8)
(9) The light source (1) is preferably fiber coupled to a beam splitting device (2) (e.g. a fiber optic coupler or an optical circulator). It will be appreciated that the principle of operation of abeam splitting device is known per se in the art.
(10) Accordingly, light (e.g. broadband light emanating from the light source (1)) travels from the splitting device (2) to a wavelength reference (3) and one or more optical fiber sensors (4). In the example, light may travel from the splitting device (2) via the wavelength reference (3) to the one or more optical fiber sensors (4).
(11) In the present example, the wavelength reference (which can also be called a reference wavelength provider) is configured to generate reference light having at least one reference wavelength (for example a first reference wavelength .sub.ref1 provided by a first part of the reference wavelength provided, e.g. a first FBG, and optionally a second reference wavelength .sub.ref2 provided by an optional second reference wavelength provided, e.g. a second FBG, wherein the second reference wavelength .sub.ref2 and first reference wavelength .sub.ref1 are different wavelengths). In the example, the reference wavelengths correspond with associated parameters, including associated angles of incidence .sub.1, .sub.2, associated reference mirror angles m.sub.1, m.sub.2 and associated reference times t.sub.1, t.sub.2.
(12) Returning to
(13) As will be appreciated by the skilled person, Fiber Bragg Grating sensors are configured to reflect incoming light having a particular wavelength (the so called Bragg wavelength). Thus, the present one or two Fiber Bragg Gratings may provide one or two reference Bragg wavelengths, i.e. reflect incoming light having such wavelength(s), the reflected light being reference wavelength light.
(14) In order to maintain wavelength shift stability the wavelength reference (3) may be enclosed in an a-thermal package or in other means stabilizing the wavelength. The optical fiber sensors (4) are preferably, but not limited to, the Fiber Bragg Grating sensors.
(15) The system (12) is operable using a wavelength dependant reflective response of the sensors (4).
(16) Particularly, a said reference wavelength .sub.ref1, .sub.ref2 is not the same as the sensor wavelength s. For example, different Fiber Bragg Gratings may be used (providing different Bragg wavelengths) in the said reference wavelength provider 3 and the sensor(s) 4.
(17) The light, reflected from the one or more sensors (4), travels towards a scanning assembly (7, 8), wherein the light is collimated before being received the scanning assembly. The scanning assembly particularly includes a diffractive optical element (8) and is configured to direct the beam at different angles of incidence onto the diffractive optical element. In the first embodiment, the scanning assembly e.g. includes a motor driven mirror (8) and a (stationary) diffractive optical element (7). As an alternative, e.g., the scanning assembly may include a motor driven diffractive optical element 32 (see
(18) In the example of
(19) In the example, the diffractive optical element (7) is a reflection diffraction grating, in which incident and diffracted rays lie on the same side of the grating. Preferably angle is selected from the Littrow configuration to maximize the reflection efficiency. In the preferred embodiment of the invention the angle is about 68.4 for the centre of the C-band (i.e. 1530 to 1570 nanometer). The diffractive optical element (7) may e.g. comprise 1200 lines per millimeter.
(20) It will be appreciated that the system (12) may be operable with another wavelength regions and other line spacing of the diffractive optical element.
(21) The (Littrow) angle for both the wavelength reference (3) and optical fiber sensors (4) must be different, whereby both angles are addressed by the suitable rotation of the mirror (8). Once the angle of either the wavelength reference (3) or the optical fiber sensors (4) matches the well-known grating equation m*=2*d*sin (i.e. in the Littrow configuration), the light will be reflected from the diffractive optical element (7) towards the mirror (8) and back in to the beam circulator (5) after focusing by the lens (6). In said grating equitation, is the wavelength of the light, is the angle of incidence and reflection (see
(22) It should be observed that said reflections of light at the reference wavelengths .sub.ref1, .sub.ref2 by the grating at certain reference angles of incidence .sub.1, .sub.2 will occur at respective rotating mirror reference angles m.sub.1, m.sub.2, at respective reference times t.sub.1, t.sub.2. Thus, as an example, a said rotating mirror reference angle m.sub.1, m.sub.2 is directly correlated with a respective reference wavelength .sub.ref1, .sub.ref2 and may even be used instead of that reference wavelength (i.e. as an indirect reference wavelength) reference in a dataprocessing to calculate a sensor wavelength s (provided that the mirror angle versus time is detected, and the orientation of the diffractive optical element 7 with respect to the mirror is known).
(23) A photodiode (10) detects the light (that has been reflected from the diffractive optical element (7) back towards the mirror (8), back in to the beam circulator (5) after the focusing by the lens (6)) and converts the light (optical signals) into the electrical domain after which data may be processed by an analogue to digital converter (11). Particularly, the analogue to digital converter (11) may generate a digital signal from an electrical signal (V), received from the photodiode (1), which digital signal can be processed by a signal or data processor (e.g. a computer).
(24) The optical sensor interrogation system (12), particularly a said signal or data processor thereof, is configured to convert the wavelength information of the optical fiber sensor (4) to the time domain (see
(25) Preferably, the angular speed of the rotating mirror is constant; in that case, the angle of the mirror (8) as a function of time can be simply correlated to the wavelength information of the photodiode signal using the known reference wavelength(s) and the above-mentioned grating equation. Alternatively, the angle of the mirror as a function of time is detected/measured by a suitable detector. In the preferred embodiment of the system (12) the wavelength bandwidth of the detection system is smaller than that of the optical fiber sensors. In addition, two stabilized Fiber Bragg Gratings may be used in/as reference wavelength provider (3) to account, for example, for variations in the angular rotation speed of the mirror.
(26) An example of the above-mentioned conversion is shown in
(27) In the exemplary signal (V), various peaks P1-P4 are shown, namely a first peak P1 relating to a reflection of the light of the first reference wavelength .sub.ref1 by the diffractive optical element (7) at a first reference time t.sub.1. A second peak P2 at a second reference time t.sub.2 may relate e.g. to a reflection of light of the second reference wavelength .sub.ref2. A third peak P3 at time t.sub.n relates to a second reflection of the light of the first reference wavelength .sub.ref1. A sweeptime t.sub.n-t.sub.1 indicated, the sweeptime e.g. being a scanning period or rotation period of the diffractive optical element (7).
(28) It follows that a said signal/dataprocessor of optical sensor interrogator system (12) can be configured to detect the reference peaks (P1, P2, P3) in the photodiode signal (V), and correlate those peaks to the mirror angles (including the afore-mentioned reference angles .sub.1, .sub.2 of incidence, depicted in
(29) Further, the processor can be configured to detect a sensor (4) related peak P4 in the photodiode signal (V), use the earlier correlation to determine the corresponding angle .sub.a of incidence, and use the afore-mentioned grating equation to calculate the wavelength corresponding to that corresponding angle .sub.s. The resulting wavelength is the sensor wavelength s.
(30) In an alternative embodiment, the system can be provided with a reference adapted to provide a reference wavelength, based on the angle of the rotating mirror (8). For example, the angle of the mirror (8) can be detected by a suitable angle detector (not shown), e.g. an encoder or a different detector, particularly to determine afore-mentioned rotating mirror reference angles m.sub.1, m.sub.2, at respective reference times t.sub.1, t.sub.2. Based on this information, the associated reference angles .sub.1, .sub.2 can be calculated using a predetermined orientation of the diffractive optical element (7) with respect to the mirror 8 (see
(31) It should be observed that correlating the sensor signal (time measurement) to angles of incidence can be achieved in various ways, e.g. as in the above-described manner or differently, as will be appreciated by the skilled person. Particularly, associating time to angle using a reference can be achieved via a reference in wavelength, or e.g. with a reference concerning the angle of the rotating light reflecting component (the rotating mirror, in
(32)
(33) In this example, the system further comprises the motor driven mirror 22 (similar to the mirror (8) shown in
(34) In this embodiment a fixed mirror 28 is added to allow measurement of both the +1 and 1 diffraction order of the grating. Particularly, as follows from the drawing, the fixed mirror 28 is arranged/oriented such that the mirror 28 can receive light that is reflected by the rotating grating 27 at an angle away from the rotating mirror 22, and to reflect that light back towards the rotating mirror 22.
(35) As a result, both +1 and 1 order light reflections can be returned to the optical circulator (5), to be detected by the photodiode (10) and processed by the signal processor of the system.
(36) Preferably, the system is configured to compensate for variations in the diffraction grating pitch of the diffraction grating 7 (e.g. variations be caused by temperature fluctuations of the grating). To this aim, preferably, the system is configured to detect both +1 and 1 order reflections of the diffraction grating.
(37)
(38) For example, to carry out compensation, the signal processor may be provided (e.g. in a memory thereon with information regarding a predetermined distance between a +1 and 1 order reflection of the light having a said reference wavelength .sub.ref1, for example a +1 1 order distance when the grating is at a predetermined initial temperature T.sub.1 (e.g. room temperature, e.g. 20 C.). This distance will change when the grating is at a different temperature T.sub.2 (see
(39) An alternative embodiment of the system (30) it may comprise a suitable plurality of diffractive optical elements cooperating with, for example, a multi-facet mirror. In this case facet of the polygon mirror may be provided with a diffractive optical element. Preferably, an 8-facet mirror is used.
(40)
(41) This embodiment has an advantage that the laser light is stable with respect to the wavelength shift.
(42)
(43) It will be further appreciated that in order to incorporate a gas cell into the system (50) provision of an optical circulator (5), a collimator lens (6) a diffractive optical element (7) a displaceable mirror (8) and a motor (9) may be required. For processing light from the wavelength reference a dedicated photodiode (10) may be used. Respective outputs from the photodiodes (10) forming part of the reference circuit and the data circuit are combined at the analogue to digital converter 11.
(44) It will be appreciated, however, that although
(45)
(46) In the foregoing specification, the invention has been described with reference to specific examples of embodiments of the invention. It will, however, be evident that various modifications and changes may be made therein without departing from the broader spirit and scope of the invention as set forth in the appended claims.
(47) In the claims, any reference signs placed between parentheses shall not be construed as limiting the claim. The word comprising does not exclude the presence of other features or steps then those listed in a claim. Furthermore, the words a and an shall not be construed as limited to only one, but instead are used to mean at least one, and do not exclude a plurality. The mere fact that certain measures are recited in mutually different claims does not indicate that a combination of these measures cannot be used to advantage.
(48) For example, the reference can be adapted to provide a reference wavelength in different ways, e.g. by providing light having the reference wavelength, or indirectly by providing such a reference wavelength based on a reference of the angle of the scanning assembly.
(49) Also, for example, a wavelength reference can also be provided by a reference signal for the angle of the rotating device, e.g. using an encoder, or when the beam is incident perpendicular to the grating (angle =0).