Stress-induced magnetic field signal acquisition method and stress measurement method based thereon

Abstract

A method for stress-induced magnetic field signal acquisition and stress measurement is disclosed. The method can include the following steps: a1, conducting AC magnetization on a to-be-tested structure by using an AC magnetic field with preset frequencies and strengths, and acquiring the excitation magnetic field signals in at least one cycle; a2, subtracting the excitation magnetic field signals in at least one cycle of a stress-free sample having the same material as the to-be-tested structure from the excitation magnetic field signals acquired in step a1 to obtain a stress-induced magnetic field signals of the to-be-tested structure; a3, quantitatively assessing the stresses in the to-be-tested structure by comparing the mean values of the stress-induced magnetic field signals acquired in step a2 with the pre-calibrated relationship of stresses and the mean values of the stress-induced magnetic field signals for the material of the to-be-tested structure.

Claims

1. A stress-induced magnetic field signal acquisition method, comprising the steps of: a1, conducting AC magnetization on a to-be-tested structure with a preset frequency and a preset strength, and acquiring excitation magnetic field signals in at least one cycle; a2, conducting the same AC magnetization as in step a1, on a sample of the same material as the to-be-tested structure in state of stress-free, and acquiring the excitation magnetic field signals in at least one cycle; and a3, subtracting the excitation magnetic field signals acquired in step a2 from the excitation magnetic field signals acquired in step a1 to obtain stress-induced magnetic field signals in at least one cycle of the to-be-tested structure.

2. A stress measurement method based on claim 1, comprising the steps of: b11, manufacturing a test sample with the same material as the to-be-tested structure; b12, loading different stresses or no stress to the test sample, conducting AC magnetization on the test sample with the preset frequency and the preset strength under different stress conditions and an unstressed condition, and acquiring stress-induced magnetic field signals of the test sample under different stress conditions; wherein the stress-induced magnetic field signals are acquired as in claim 1 by subtracting the excitation magnetic field signals in one cycle of the test sample under the unstressed condition from the excitation magnetic field signals in one cycle of the test sample under the different stress conditions; b13, calculating a series of mean values Hσ*(V) of the stress-induced magnetic field signals Hσ(V) in one cycle of the test sample under the same stress condition, matching stress values a of the test sample with the corresponding mean values Hσ*(V) of the stress-induced magnetic field signals under different stress conditions, and calibrating a quantitative relationship of the mean values of the stress-induced magnetic field signals of a material of the test sample and the stresses; b1, conducting the same AC magnetization as in step b12, on the to-be-tested structure, and acquiring an excitation magnetic field signal in one cycle; b2, subtracting the excitation magnetic field signals of the test sample having the same material with the to-be-tested structure in an unstressed state in step b12 from the excitation magnetic field signals in the one cycle of the to-be-tested structure to obtain stress-induced magnetic field signals of the to-be-tested structure, and calculating mean values of the stress-induced magnetic field signals in one cycle; b3, based on the quantitative relationship calibrated in step b13, quantitatively assessing the stresses corresponding to the mean values of the stress-induced magnetic field signals in one cycle acquired in step b2, to quantitatively assess stresses in the to-be-tested structure.

3. The stress measurement method according to claim 2, wherein in step b12, the loaded stresses are elastic stresses of 20 MPa, 40 MPa, 60 MPa, 80 MPa, 100 MPa, 120 MPa, 140 MPa, 160 MPa, 180 MPa, and 200 MPa, and the frequency of the AC magnetic field is 300 Hz.

Description

BRIEF DESCRIPTION OF THE DRAWINGS

(1) The accompanying drawings are provided for further understanding of the disclosed subject matter. The drawings constitute a part of the specification, and are intended to explain some example, non-limiting embodiments of the disclosed subject matter. In the accompanying drawings:

(2) FIG. 1 shows a relationship of a stress-induced magnetic field and an excited magnetic field according to an example embodiment of the disclosed subject matter.

(3) FIG. 2 shows a relationship of the stresses and the stress-induced magnetic field signal mean values according to an example embodiment of the disclosed subject matter.

(4) FIG. 3 shows a schematic flowchart of calculating the stress-induced magnetic field signals based on the excitation magnetic field signals under different stresses and the excitation magnetic field signals in an unstressed state.

(5) FIG. 4 shows a schematic diagram of steps in a stress detection method according to the present disclosure.

DETAILED DESCRIPTION

(6) The following describes examples of the disclosed subject matter with reference to the accompanying drawings.

(7) One example embodiment of the disclosed subject matter provides a stress measurement method based on the acquisition of stress-induced magnetic field signals, which can include the following two stages:

(8) stage 1: relation modeling and parameter measuring, which can include the following steps:

(9) b11, manufacturing a test sample by utilizing the same material with a to-be-tested component, wherein in one example embodiment, a silicon steel material can be utilized;

(10) b12, referring to FIG. 1, respectively loading elastic stresses of, e.g., 20 MPa, 40 MPa, 60 MPa, 80 MPa, 100 MPa, 120 MPa, 140 MPa, 160 MPa, 180 MPa and 200 MPa to the test sample, simultaneously conducting AC magnetization on the test sample under the above stresses by utilizing an AC magnetic field with a preset frequency (e.g., 300 Hz) and a preset strength; acquiring series of excitation magnetic field signals H(V) in one cycle of the test sample under different stresses; acquiring an excitation magnetic field signal in one cycle of the test sample in an unstressed state; and subtracting the excitation magnetic field signal in one cycle of the test sample in the unstressed state from the excitation magnetic field signals in one cycle of the test sample under different stresses to obtain the stress-induced magnetic field signals Hσ(V) of the test sample under different stresses; and

(11) b13, referring to FIG. 2, calculating a series of mean values Hσ*(V) of the stress-induced magnetic field signals Hσ(V) of the test sample under different stresses, matching stress values 6 of the test sample with the corresponding mean values Hσ*(V) of the stress-induced magnetic field signals under different stresses, and calibrating the relationship of stresses and the stress-induced magnetic field signal mean values of a material of the test sample, wherein silicon steel can be utilized according to one example embodiment.

(12) stage 2: stress assessment of a to-be-tested structure, which can include the following steps:

(13) b1, conducting AC magnetization on a to-be-tested structure by using an AC magnetic field with the same frequency and strength in the assessment stage, and acquiring an excitation magnetic field signal in one cycle;

(14) b2, subtracting the excitation magnetic field signal in one cycle of a structure having the same material with the to-be-tested structure in an unstressed state from the excitation magnetic field signal of the to-be-tested structure in one cycle to obtain a stress-induced magnetic field signal of the to-be-tested structure; and

(15) b3, calculating the mean values Hσ*(V) of the stress-induced magnetic field signals Hσ(V) of the test structure; and

(16) b4, assessing the stresses in the to-be-tested structure by comparing the mean values of the stress-induced magnetic field signals of the to-be-tested structure acquired in step b3 with the calibrated quantitative relationship of the stresses and the stress-induced magnetic field signals of a material of the to-be-tested structure in stage 1.

(17) A procedure for calculating the magnetic field signals is as illustrated in FIG. 3. AC magnetization is conducted on the sample 12 (including the to-be-tested structure or the test sample) using the AC excitation magnetic 11, and the excitation magnetic field signals are acquired. Then, the excitation magnetic field signals 13 of the sample (the to-be-tested structure or the test sample) in a stress-free state are acquired. Finally, the stress-induced magnetic field signals 14 are acquired by a subtraction operation.

(18) Referring to FIG. 4, steps in a typical procedure in the detection method according to the present application are illustrated.

(19) To sum up, compared with technologies of conducting quantitative characterization on the stress based on the induced magnetic field signals of the magneto-mechanical effect in the prior art, embodiments of the disclosed technology can acquire the excitation magnetic field signals of the magneto-mechanical effect of the test sample under different stresses. Therefore, the stress-induced magnetic field signals of the test sample under different stresses can be obtained, and the quantitative relationship of stress and the stress-induced magnetic field signal of the test material can be calibrated. The quantitative relationship can be applied to nondestructive quantitative assessment of the stress of the structure having the same material with the test sample. Because the excitation magnetic field signal is influenced by a few factors and the measurement of the excitation magnetic field signal does not require a magnetic field sensor, the disclosed method can improve the accuracy of stress assessment and simplify the devices of the magneto-mechanical assessment technologies.

(20) In view of the many possible embodiments to which the principles of the disclosed subject matter may be applied, it should be recognized that the illustrated embodiments are only representative examples and should not be taken as limiting the scope of the claims to those preferred examples. Rather, the scope of the claimed subject matter is defined by the following claims. We therefore claim as our invention all that comes within the scope of these claims.