Optical methods for observing samples and for detecting or metering chemical or biological species
10241311 · 2019-03-26
Assignee
- Centre National De La Recherche Scientifique (Paris, FR)
- Universite Du Maine (Le Mans, FR)
- UNIVERSITE D'AIX-MARSEILLE (Marseilles, FR)
Inventors
- Dominique Ausserré (Soulitré, FR)
- Ludovic Roussille (Marseilles, FR)
- Myriam Zerrad (Marseilles, FR)
- Fabien Lemarchand (Cabries, FR)
- Claude Amra (Marseilles, FR)
Cpc classification
G02B21/33
PHYSICS
G01N33/54373
PHYSICS
International classification
G02B21/34
PHYSICS
G01N33/543
PHYSICS
G02B21/33
PHYSICS
Abstract
The invention relates to a method for observing a sample under optical microscopy, in incoherent, unpolarised light, using a sample substrate including a contrast-amplifying layer having a complex index of refraction. The invention also relates to a method for detecting or metering at least one chemical or biological species using such a sample substrate.
Claims
1. A process for observing a sample, comprising the steps: a) providing a sample support comprising a transparent substrate (ST) on which is deposited a coating comprising at least one layer, termed contrast-amplifying layer, having a complex refractive index with an imaginary part greater than or equal to 0.001; b) placing the sample to be observed on said coating comprising the contrast-amplifying layer; c) directing onto said sample, through said substrate, a spatially incoherent and not polarized light beam, focused so as to form an illumination cone having an aperture half-angle greater than or equal to 20; and d) observing said sample through an objective and said substrate; said contrast-amplifying layer being proportioned so that said sample is observed with a higher contrast than in the absence of said support, wherein a thickness of said contrast-amplifying layer is determined so as to optimize, for at least one illumination wavelength, the contrast integrated on said illumination cone with which would be observed a reference sample made up of a variation in thickness of said contrast-amplifying layer.
2. The process for observing a sample as claimed in claim 1, wherein said contrast-amplifying layer is metallic.
3. The process for observing a sample as claimed in claim 1, wherein the aperture half-angle of said illumination cone is selected from the group consisting of between 20 and 75, between 30 and 70 and between 40 and 65, the axis of said cone being perpendicular to said substrate.
4. The process for observing a sample as claimed in claim 1, wherein said objective is used both for illuminating and for observing said sample.
5. The process for observing a sample as claimed in claim 1, wherein step d) is carried out while the contrast-amplifying layer and said sample are immersed in water or in an aqueous solution.
6. The process for observing a sample as claimed in claim 1, wherein said contrast-amplifying layer has a thickness gradient which, at least one location is determined so as to optimize, for at least one illumination wavelength, the contrast integrated on said illumination cone with which would be observed a reference sample made up of a variation in thickness of said contrast-amplifying layer.
7. The process for observing a sample as claimed in claim 1, comprising a preliminary step of proportioning said contrast-amplifying layer, comprising: calculating an area representing the contrast with which said reference sample would be observed as a function of the thickness of said layer, normalized with respect to an illumination wavelength, and the aperture half-angle of the illumination beam; identifying a crest or thalweg of said area, having an orientation approximately parallel to the axis representing said aperture half-angle ; identifying a value, or range of values, of thickness of said layer corresponding to said crest or thalweg; the thickness or a local thickness of said contrast-amplifying layer being chosen equal to the value, or within the value range, thus identified.
8. The process for observing a sample as claimed in claim 1, wherein said sample support has, above said contrast-amplifying layer, a functionalization layer capable of binding at least one chemical or biological species , the process also comprising a step of bringing said functionalization layer into contact with a solution of said chemical or biological species to be bound, as a result of which said chemical or biological species forms a layer above said functionalization layer, constituting the sample to be observed.
9. The process as claimed in claim 8, wherein said or at least one chemical or biological species is absorbent, having a complex refractive index with an imaginary part greater than or equal to 0.0001, or scattering.
10. The process as claimed in claim 8, wherein said functionalization layer is in the form of a plurality of spots capable of binding different chemical or biological species.
11. The process as claimed in claim 10, wherein said contrast layer is deposited only in positions corresponding to said spots.
12. The process as claimed in claim 10, wherein said support comprises, outside said spots, a passivation layer which prevents the binding of any chemical or biological species contained in said solution.
Description
BRIEF DESCRIPTION OF THE DRAWINGS
(1) Other characteristics, details and advantages of the invention will emerge on reading the description provided with reference to the appended drawings given by way of example and which represent, respectively:
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DETAILED DESCRIPTION
(11) A conventional antireflecting layer has a thickness equal to /4n.sub.1 ( being the wavelength of the light in a vacuum and n.sub.1 the refractive index of the layer, supposedly real), and a refractive index given by:
n.sub.1={square root over (n.sub.0n.sub.2 )}(1)
where n.sub.2 is the refractive index of the substrate on which the layer is deposited and n.sub.0 the refractive index of the medium which is above the layer (for example, air). The indices n.sub.0 and n.sub.2 are considered to be real, just like n.sub.1.
(12) A substrate on which an antireflecting layer is deposited can be used as a contrast-amplifying support, but it proves to be poorly suited to the observation of objects of low contrast under an optical microscope. The SEEC technique modifies the reflection suppression condition so as to adapt it to the case of an observation under polarized light and through a polarization analyzer, but it makes it possible to overcome this limitation only very partially, as has been discussed above.
(13) In order to obtain a satisfactory contrast amplification in a very wide range of angles of incidence of the illuminating light (and therefore, in particular, under a microscope with a large numerical aperture), the present invention proposes exploiting an additional degree of freedom: the imaginary part of the refractive index, which entails the use of an absorbent or metallic layer.
(14) The case, illustrated in
(15) As in the case of a conventional antireflecting substrate (.sub.1=0), the contrast with which the sample is viewed depends greatly on the complex index and on the thickness of the layer, and more specifically has a marked extremum as a function of the thickness. This extremum itself takes an extremal value and abruptly changes sign when the real and imaginary parts of the complex index .sub.1=n.sub.1j.sub.1 of the layer satisfy the relationship:
n.sub.1.sup.2.sub.1.sup.2=n.sub.0n.sub.2(2)
(16) The relationship (2) can be considered to be a generalization of the relationship (1) in the case of a layer having a complex refractive index.
(17) When n.sub.0 and n.sub.2 are fixed, the reflectivity of the surface depends only on the angle , on (wavelength), on n.sub.1 and on .sub.1. Since it is expressed as a function of Fresnel's coefficients (which do not explicitly involve the wavelength , but only the indices of the media and the angles) and of the thickness e.sub.1 of the layer (which is involved only through the ratio), it is possible to calculate the contrast of an achromatic reference object as a function of n.sub.1, .sub.1 and, this calculation being valid for all metals and all wavelengths. It is thus possible to adjust the operating point by changing metal (or more generally material with a complex refractive index), by changing layer thickness, or by changing wavelength.
(18) In
(19) It is advantageous to plot the areas (
(20) Empirically, the relationship which links the critical thickness (e/).sub.c to the imaginary part of the index of the contrast-amplifying layer can be written in the form:
(e/).sub.c=C/(3)
where C is a constant which, in the example considered here, is 0.01. There still remains a parameter of free proportioning, n.sub.1, which can be used to choose the best compromise between acceptable numerical aperture (length of the crest or of the thalweg) and contrast (height of the crest or depth of the valley) for a given application. Indeed, the closer the (n.sub.1, .sub.1) pair is to the contrast inversion line, the higher the contrast will be at low aperture (or for a predetermined angle of incidence), but the more rapidly it will become unconfined with the numerical aperture of the objective.
(21) A crest or thalweg is also observed in the case of observation under polarized light (between a polarizer and an analyzer which are crossed, or in any event forming an angle between them), and in particular for .sub.1>n.sub.1, but the critical thickness and the condition linking the refractive indices to one another are different than in the case of observation under unpolarized light.
(22) As shown in
(23) In order to move in the plane (n.sub.1, .sub.1), it is possible to adjust the composition of the contrast-amplifying layerwhich may even in fact by a multilayer, thereby giving the designer great freedomand/or the illumination wavelength throughout the range permitted by the optical elements of the system, generally from near UV (=200 nm) to near infrared (=2 m). The UV and infrared wavelengths have the advantage of making it possible to exploit the natural absorption bands of the molecules visualized in order to obtain a better contrast and, where appropriate, a contrast specific for the species sought. By way of example, the Au curve in
(24) The case of gold is particularly interesting since it constitutes a norm for biological sensors. The case of a gold film consisting of nanoparticles is particularly advantageous since it is possible to adjust n.sub.1 and .sub.1 by adjusting the concentration and the density of the particles of which it is formed.
(25) The principle that has just been described makes it possible to observe microscopic objects of low contrast. It also makes it possible to produce biochips for detecting and/or quantitatively determining chemical or biological species. For example, as illustrated in
(26) The sensitivity of the detection will be considerably improved if the species bound are themselves at least slightly optically absorbent for the useful wavelength of the illumination, for example if the imaginary part of their index is greater than 0.0001, and preferably greater than 0.001, and preferably greater than 0.01.
(27) The contrast is also increased if the contrast-amplifying layer is deposited only in positions corresponding to said spots.
(28) Preferably, outside the spots, a passivation layer which prevents the binding of any chemical or biological species contained in said solution can be envisioned. A polyethylene glycol, a fluorinated polymer or a fluorinated alkyl, for example functionalized with thiols in the case of gold, can, for example, be used. This passivation layer may be deposited by vapor deposition after the production of the spots.
(29) When it is desired to detect or deposit chemical or biological species, it is also possible to use a substrate only provided with a functionalization layer.
(30) According to a first embodiment, illustrated in
(31) As a variant, the metal nanoparticles can be replaced with an absorbent label, for example a fluorescent molecule (it should be noted that the fluorescence, per se, is not exploited, but a fluorescent molecule is strongly absorbent).
(32) The drawback of the first embodiment is that it allows only the detection of a labeled chemical or biological species. The following embodiments do not have this drawback.
(33) According to the second embodiment (
(34) The technique can be quantitative if the species to be detected is present in sufficient amount to saturate the functionalization layer and, on the other hand, the auxiliary species is present in excess. In this case, in fact, the effective thickness and the effective index of the layer CMand therefore the intensity of the light signal observedwill depend on the concentration of the species to be detected.
(35) This second embodiment can be used only if the chemical or biological species to be detected has at least two active sites; it does not therefore apply, for example, to haptens. In addition, it is quite complex to implement.
(36) The following embodiments do not have this drawback.
(37) According to the third embodiment (
(38) According to a fourth embodiment (
(39) The chemical or biological species may be, for example, antibodies, antigens, proteins, microorganisms, etc.
(40) Instead of being metallic or absorbent, the label may be a scattering label. Indeed, it is known that the effect of scattering can be expressed via a refractive index which has an imaginary part.
(41) The techniques for detection or quantitative determination described above also apply when the functionalization layer is deposited on a contrast-amplifying layer as described above. The functionalized layer and, where appropriate, the contrast-amplifying layer may be structured in spots, and the surface outside these spots may be passivated, as explained above.