Residual stress detection device and detection method thereof

Abstract

A residual stress detection device for a curved surface coating and a detection method thereof is provided, where its structure includes: a detection piece carrier, configured to fix the detection piece, so that a to-be-detected point on the detection piece remains at a highest point; an X-ray generation source, radiating an X-ray to the to-be-detected point fixedly or along a path; a detection element, including a moving mechanism, where the moving mechanism moves the detection element along a path extending toward a direction orthogonal to an incident direction of the X-ray, so that the detection element receives and detects intensity of a diffraction X-ray at a position of the diffraction X-ray; and a stress calculation module, obtaining a strain value based on an intensity peak of the diffraction X-ray detected by the detection element, and calculating a residual stress value of the detection piece by using a formula.

Claims

1. A residual stress detection device, applied to detection and calculation of a surface residual stress performed for a detection piece having a curved surface coating, and comprising: a detection piece carrier, configured to fix the detection piece; an X-ray generation source, radiating an X-ray to the to-be-detected point fixedly or along a path; a detection element, comprising a moving mechanism, wherein the moving mechanism moves the detection element along the path, so that the detection element can receive and detect intensity of a diffraction X-ray toward a direction orthogonal to an incident direction of the X-ray; and a stress calculation module, obtaining a strain value based on an intensity peak of the diffraction X-ray detected by the detection element, and calculating a residual stress value of the detection piece by using a formula; wherein the formula is: ${\sigma }_f=E_f\left[\left(\frac{{\mathrm{.Math.}}_{\mathrm{XRD}}{E}_f{h}_f}{E_f{h}_f+E_s{h}_s}+{\mathrm{.Math.}}_{\mathrm{XRD}}\right)+\left(x-\frac{E_f{h}_f^2-E_s{h}_s^2}{2\left(E_f{h}_f+E_s{h}_s\right)}\right)k\right]$ wherein σ.sub.f is a residual stress of the coating, E.sub.f is a Young's modulus of the coating, ε.sub.XRD is the strain value obtained by the residual stress detection device of the present invention, E.sub.s is a Young's modulus of a substrate, h.sub.s is a substrate thickness, h.sub.f is a coating thickness, k is a curvature, and x is a depth position of the to-be-detected point.

2. The residual stress detection device according to claim 1, wherein the detection piece carrier further comprises a rotating mechanism, and the rotating mechanism may rotate the detection piece carrier to change an incident direction of an X-ray received by the detection piece.

3. The residual stress detection device according to claim 1, wherein the detection piece carrier comprises a detection piece fixing structure.

4. The residual stress detection device according to claim 3, wherein the detection piece fixing structure is a fixing groove and a locking structure, for locking the detection piece in the fixing groove, so that a to-be-detected point on the detection piece remains at a highest point relative to the fixing groove.

5. The residual stress detection device according to claim 3, wherein the detection piece fixing structure further comprises a level adjusting structure.

6. The residual stress detection device according to claim 4, wherein the detection piece fixing structure further comprises a level adjusting structure.

7. The residual stress detection device according to claim 5, wherein the level adjusting structure is an ejection form, and is disposed at the bottom of the fixing groove, and the to-be-detected point is adjusted to the highest point by ejecting a position at an end of the detection piece.

8. A residual stress detection method for a curved surface coating, comprising steps: providing a detection piece carrier, wherein the detection piece carrier comprises a detection piece fixing structure, and the detection piece fixing structure is a fixing groove and a locking structure; locking a to-be-detected piece having a curved surface coating in the fixing groove, and adjusting a to-be-detected point on the curved surface coating to a highest point relative to the fixing groove; radiating an X-ray to the to-be-detected point by using an X-ray generation source; moving a detection element, so that the detection element is toward a direction orthogonal to an incident direction of the X-ray, and receiving and detecting intensity of a diffraction X-ray to obtain a strain value; and calculating a residual stress value of the to-be-detected point by using the strain value and a formula; wherein the formula is: ${\sigma }_f=E_f\left[\left(\frac{{\mathrm{.Math.}}_{\mathrm{XRD}}{E}_f{h}_f}{E_f{h}_f+E_s{h}_s}+{\mathrm{.Math.}}_{\mathrm{XRD}}\right)+\left(x-\frac{E_f{h}_f^2-E_s{h}_s^2}{2\left(E_f{h}_f+E_s{h}_s\right)}\right)k\right]$ wherein σ.sub.f is a residual stress of the coating, E.sub.f is a Young's modulus of the coating, ε.sub.XRD is the strain value obtained by the residual stress detection device of the present invention, E.sub.s is a Young's modulus of a substrate, h.sub.s is a substrate thickness, h.sub.f is a coating thickness, k is a curvature, and x is a depth position of the to-be-detected point.

9. A residual stress detection device, applied to detection and calculation of a surface residual stress performed for a detection piece having a curved surface coating, and comprising: a detection piece carrier, configured to fix the detection piece; an X-ray generation source, radiating an X-ray to the to-be-detected point fixedly or along a path; a detection element, comprising a moving mechanism, wherein the moving mechanism moves the detection element along the path, so that the detection element can receive and detect intensity of a diffraction X-ray toward a direction orthogonal to an incident direction of the X-ray; and a stress calculation module, obtaining a strain value based on an intensity peak of the diffraction X-ray detected by the detection element, and calculating a residual stress value of the detection piece by using a formula; wherein the detection piece carrier comprises a detection piece fixing structure; and the detection piece fixing structure further comprises a level adjusting structure.

Description

BRIEF DESCRIPTION OF THE DRAWINGS

(1) FIG. 1A is a schematic structural diagram of a residual stress detection device according to the present invention;

(2) FIG. 1B is a schematic diagram of a detection manner of the residual stress detection device according to the present invention;

(3) FIG. 1C is a schematic structural diagram of a detection piece having a curved surface coating according to the present invention;

(4) FIG. 2A is a schematic diagram of a detection piece carrier according to an embodiment of the present invention;

(5) FIG. 2B is a schematic diagram of a detection piece carrier according to another embodiment of the present invention; and

(6) FIG. 3 is a flowchart of a residual stress detection method according to the present invention.

DETAILED DESCRIPTION

(7) As shown in FIG. 1A to FIG. 1C, the present invention discloses a residual stress detection device 1, applied to detection and calculation of a surface residual stress performed for a detection piece 10 having a curved surface coating, where its structure includes: a detection piece carrier 13, configured to fix the detection piece 10, so that a to-be-detected point T of the detection piece 10 remains at a highest point; an X-ray generation source 11, radiating an X-ray 110 to the to-be-detected point T fixedly or along a path P; a detection element 12, including a moving mechanism, where the moving mechanism moves the detection element 12 along the path P toward a direction orthogonal to an incident direction of the X-ray 110, that is, the path P is orthogonal to both the incident direction of the X-ray 110 and an emergent direction of a diffraction X-ray 120, so that the detection element 12 receives and detects intensity of the diffraction X-ray 120 at a position of the diffraction X-ray 120; and a stress calculation module 14, obtaining a strain value ε based on an intensity peak of the diffraction X-ray 120 detected by the detection element 12, and calculating a residual stress value of the detection piece 10 by using a formula.

(8) As shown in FIG. 1B, a residual stress detection method performed by the residual stress detection device of the present invention includes steps: fixing the detection piece 10 to the detection piece carrier 13, and adjusting the to-be-detected point T to the highest point; radiating the X-ray 110 generation source 11 to the to-be-detected point T; as shown in FIG. 1A, moving the detection element 12 along a path P, so that the detection element 12 can be toward a direction orthogonal to the incident direction of the X-ray 110, and receiving and detecting intensity of the diffraction X-ray 120 to obtain a strain value ε; and calculating the residual stress value of the to-be-detected point T by using the stress calculation module 14 shown in FIG. 1A and the strain value ε.

(9) In the foregoing embodiment, the formula is

(10) ${\sigma }_f=E_f\left[\left(\frac{{\mathrm{.Math.}}_{\mathrm{XRD}}{E}_f{h}_f}{E_f{h}_f+E_s{h}_s}+{\mathrm{.Math.}}_{\mathrm{XRD}}\right)+\left(x-\frac{E_f{h}_f^2-E_s{h}_s^2}{2\left(E_f{h}_f+E_s{h}_s\right)}\right)k\right],$

(11) where σ.sub.f is a residual stress of the coating, E.sub.f is a Young's modulus of the coating, ε.sub.XRD is the strain value obtained by the residual stress detection device of the present invention, E.sub.s is a Young's modulus of a substrate, h.sub.s is a substrate thickness, h.sub.f is a coating thickness, k is a curvature of the to-be-detected point T, and x is a depth position of the to-be-detected point T.

(12) In the embodiment of FIG. 1B, the detection piece carrier 13 includes a detection piece fixing structure 130, and the detection piece fixing structure 130 is a fixing groove 1301 and a locking structure 1302, for locking the detection piece 10 in the fixing groove 1301.

(13) In an embodiment, the detection piece carrier 13 further includes a rotating mechanism, and the rotating mechanism may rotate the detection piece carrier 13 to change an incident direction of an X-ray 110 received by the detection piece 10.

(14) In the foregoing embodiment, the rotating mechanism may rotate by two-dimensional 360 degrees.

(15) In the foregoing embodiment, the rotating mechanism may rotate by three-dimensional 360 degrees.

(16) By using the foregoing residual stress detection device, when the X-ray 110 is shone on the to-be-detected point T of the detection piece 10, the detection element 12 may receive the intensity of the diffraction X-ray 120, and obtain an intensity peak to further obtain the strain value c of the to-be-detected point T.

(17) As shown in FIG. 1C, according to the structure, the detection piece 10 having a curved surface coating may be divided into a substrate layer 100 and a coating layer 101, which respectively have a substrate thickness h.sub.s and a coating thickness h.sub.f. After the strain value ε of the to-be-detected point T is obtained by using the detection device and the detection method of the present invention, the strain value ε may be substituted into the formula:

(18) ${\sigma }_f=E_f\left[\left(\frac{{\mathrm{.Math.}}_{\mathrm{XRD}}{E}_f{h}_f}{E_f{h}_f+E_s{h}_s}+{\mathrm{.Math.}}_{\mathrm{XRD}}\right)+\left(x-\frac{E_f{h}_f^2-E_s{h}_s^2}{2\left(E_f{h}_f+E_s{h}_s\right)}\right)k\right]$
to calculate the residual stress value σ.sub.f.

(19) In the formula, σ.sub.f is a residual stress of the coating, E.sub.f is a Young's modulus of the coating, ε.sub.XRD is the strain value obtained by the residual stress detection device of the present invention, E.sub.s is a Young's modulus of a substrate, h.sub.s is a substrate thickness, h.sub.f is a coating thickness, k is a curvature, and x is a depth position of the to-be-detected point T.

(20) Referring to FIG. 2A and FIG. 2B, FIG. 2A and FIG. 2B are schematic diagrams of different embodiments of the detection piece carrier 13 according to the present invention.

(21) As shown in FIG. 2A, the detection piece carrier 13 of the present invention includes a detection piece fixing structure 130, where the detection piece fixing structure 130 is a fixing groove 1301 and a locking structure 1302, for locking the detection piece 10 in the fixing groove 1301, to ensure that the to-be-detected point T may remain at a position of the highest point shown in FIG. 1B. Remaining the to-be-detected point T at the highest point may reduce detection errors and decrease curved surface impact factors, so as to effectively master geometric characteristics, and break through detection errors caused by the to-be-detected point on curved surface shape deviation.

(22) As shown in FIG. 2B, the detection piece carrier 13 of the present invention includes a detection piece fixing structure 130, where the detection piece fixing structure 130 is a fixing groove 1301, a locking structure 1302, and a level adjusting structure 1303. The level adjusting structure 1303 is an ejection form, and is disposed at the bottom of the fixing groove 1301, and the level adjusting structure 1303 adjusts the to-be-detected point T to the highest point by ejecting a position at an end of the detection piece 10, to further reduce detection errors and decrease curved surface impact factors, so as to effectively master geometric characteristics, and break through detection errors caused by the to-be-detected point on curved surface shape deviation.

(23) Referring to FIG. 3, FIG. 3 is a residual stress detection method S1 performed by applying the foregoing residual stress detection device 1, and the method S1 includes steps:

(24) Step S11: Fix the detection piece to the detection piece carrier, and adjust the to-be-detected point to the highest point.

(25) Step S12: Radiate the X-ray generation source to the to-be-detected point.

(26) Step S13: Move the detection element, so that the detection element can be toward a direction orthogonal to an incident direction of the X-ray, and receive and detect intensity of the diffraction X-ray to obtain a strain value.

(27) Step S14: Calculate a residual stress value of the to-be-detected point by using the stress calculation module and the strain value.

(28) In an embodiment, the detection piece carrier may rotate to change an incident direction of an X-ray received by the detection piece, to detect intensity of an X-ray diffracted by the to-be-detected point from a different angle, to further obtain an accurate strain value of the to-be-detected point.

(29) The strain value obtained by using the foregoing method is substituted into the following formula:

(30) ${\sigma }_f=E_f\left[\left(\frac{{\mathrm{.Math.}}_{\mathrm{XRD}}{E}_f{h}_f}{E_f{h}_f+E_s{h}_s}+{\mathrm{.Math.}}_{\mathrm{XRD}}\right)+\left(x-\frac{E_f{h}_f^2-E_s{h}_s^2}{2\left(E_f{h}_f+E_s{h}_s\right)}\right)k\right]$
to calculate the residual stress value σ.sub.f.

(31) In the formula, σ.sub.f is a residual stress of the coating, E.sub.f is a Young's modulus of the coating, ε.sub.XRD is the strain value obtained by the residual stress detection device of the present invention, E.sub.s is a Young's modulus of a substrate, h.sub.s is a substrate thickness, h.sub.f is a coating thickness, k is a curvature of the to-be-detected point, and x is a depth position of the to-be-detected point.

(32) The residual stress detection device and the detection method thereof in the present invention have the following features: 1. The present invention breaks through the known problem that residual stress detection is only applicable to a plane detection piece, and may be applied to detection of a residual stress value of a curved surface coating piece; 2. The stress calculation module and the detection piece carrier provided in the present invention may be integrated in a currently used X-ray generator, and no significant costs need to be increased; and 3. Adjusting the to-be-detected point to the highest point can reduce detection errors and decrease curved surface impact factors, so as to effectively master geometric characteristics, and break through detection errors caused by the to-be-detected point on curved surface shape deviation.

(33) The foregoing description only records implementations or embodiments of technical means used in the present invention to resolve the problem, and is not used to limit the scope of the patent implementation of the present invention. Any equivalent change or modification conforming to the content of the claims of the present invention, or made without departing from the claims of the present invention shall fall within the patent scope of the present invention.