MEASUREMENT METHOD FOR CHARACTERIZATION OF A PHOTODETECTOR

20240247977 ยท 2024-07-25

    Inventors

    Cpc classification

    International classification

    Abstract

    A measurement method for characterization of a photodetector includes illumination of the photodetector with a variable electromagnetic radiation. The variable electromagnetic radiation has a temporally oscillating radiation intensity with fixed period and amplitude. The method also includes illumination of the photodetector with a first electromagnetic radiation having a temporally constant first radiation intensity and measurement of a first output signal at the photodetector. The method further includes illumination of the photodetector with a second electromagnetic radiation having a temporally constant second radiation intensity different from the first radiation intensity and measurement of a second output signal at the photodetector. The method additionally includes determination of a non-linearity of the photodetector by comparing the measurements of the first and second output signals.

    Claims

    1. A measurement method for characterization of a photodetector, comprising the following steps: illumination of the photodetector with a variable electromagnetic radiation, the variable electromagnetic radiation having a temporally oscillating radiation intensity with a fixed period and amplitude, illumination of the photodetector with a first electromagnetic radiation having a temporally constant first radiation intensity, and measurement of a first output signal at the photodetector, illumination of the photodetector with a second electromagnetic radiation having a temporally constant second radiation intensity different from the first radiation intensity and measuring a second output signal at the photodetector, determination of a nonlinearity of the photodetector by comparing the measurements of the first and second output signals, wherein the photodetector is a photodiode connected in series with an ohmic resistor at which a photocurrent produces a measurable voltage drop, a bias voltage at the photodiode is kept constant by readjustment, and the measurement of the output signal at the photodetector is performed using a phase-sensitive rectifier which is fed with a reference signal of the same period and phase as the period and phase of the variable electromagnetic radiation.

    2. (canceled)

    3. The measurement method according to claim 1, wherein the variable electromagnetic radiation has a temporal oscillation with a period between 0.0004 and 0.04 seconds.

    4. The measurement method according to claim 1, wherein the variable electromagnetic radiation has a temporal oscillation with a sinusoidal or rectangular waveform.

    5. The measurement method according to claim 1, wherein the first or the second radiation intensity is zero.

    6. The measurement method according to claim 1, wherein the measurement of the first and second output signals is performed more than once and the measurement results are averaged.

    7. The measurement method according to claim 1, wherein the variable electromagnetic radiation is emitted from a light-emitting diode which is operated in the linear region of the current-voltage characteristic.

    Description

    [0030] Further advantages, advantageous embodiments and further developments follow from the exemplary embodiments described in connection with the figures below.

    [0031] FIG. 1 shows a schematic representation of a measurement setup according to an exemplary embodiment.

    [0032] FIG. 2 shows a schematic circuit diagram of the measurement setup of an exemplary embodiment.

    [0033] FIG. 3 shows exemplary measurement curves of a nonlinearity of different photodetectors.

    [0034] In the exemplary embodiments in the figures, identical, similar or similarly acting elements may each be provided with the same reference sign. The elements shown and their proportions to one another are not to be regarded as true to scale. Rather, individual elements and areas may be shown exaggeratedly large or small for better representability and/or better understanding.

    [0035] FIG. 1 shows the schematic measurement setup according to an exemplary embodiment. The photodetector 3, for example a photodiode or a phototransistor, is illuminated by a first illumination element 1 and a second illumination element 2. The first illumination element 1 thereby emits a time-variable electromagnetic radiation, while the second illumination element 2 emits a temporally constant first or second electromagnetic radiation. The electromagnetic radiation is, for example, light in the infrared, visible or ultraviolet spectral range. The first illumination element 1, for example a light-emitting diode, is thereby fed by a signal generator 5, which provides a constant voltage for setting the operating point, as well as a temporally oscillating voltage with a fixed period and amplitude for generating the time-variable electromagnetic radiation. The temporally oscillating signal from the signal generator is also fed as a reference signal to the corresponding input of the phase-sensitive rectifier 6.

    [0036] The second illumination element 2, for example a light-emitting diode, generates a temporally constant first or second electromagnetic radiation and is operated, for example, by means of a first source-measure-unit 4, which allows to measure the electric current received by the illumination element.

    [0037] In this embodiment, the photodetector 3 to be characterized, for example a photodiode, is connected in series with an ohmic resistor 7 and is supplied by a second source-measure unit 8. The latter is used to set a constant bias voltage at the photodiode. In particular, the bias voltage at the photodiode is kept constant during the measurement process in order to keep the operating point of the photodiode stable. The photocurrent generated by the incident light on the photodiode produces a voltage drop across the ohmic resistor, which forms the output signal of the photodetector 3 and thus the input signal at the phase-sensitive rectifier 6.

    [0038] For example, at a constant amplitude of the temporally oscillating signal generated by means of the signal generator 5, the measurement signal of the phase-sensitive rectifier 6 is a constant directly proportional to the amplitude of the temporally oscillating component of the output signal at the photodetector.

    [0039] FIG. 2 shows the schematic circuit diagram of an embodiment, whereby in the example shown the photodetector is a photodiode 3. The two illumination elements, which generate the time-variable as well as the temporally constant electromagnetic radiation, are designed as light-emitting diode 1 and light-emitting diode 2 in this exemplary embodiment. The first light-emitting diode 1, which serves as a time-variable radiation source, is operated by a signal generator 5, whose temporally oscillating output signal also serves as a reference input signal at the phase-sensitive rectifier 6.

    [0040] In this exemplary embodiment, the second light-emitting diode 2, which emits a temporally constant electromagnetic radiation, is operated by a first source-measure unit 4. Apart from setting the desired intensity of the light, the SMU allows a measurement of the electric current flowing through the light-emitting diode 2. Here, the voltage drop generated by the photocurrent across the ohmic resistor 7, which is connected in series with the photodiode 3, forms the output signal of the photodetector, which is measured by the phase-sensitive rectifier 6. A second source-measure unit 8 serves to keep the bias voltage at the photodiode constant.

    [0041] FIG. 3 shows five exemplary measurement curves of a nonlinearity of five different photodetectors, measured in ppm as a function of the electric current flowing through the illumination element 2 during the measurement of the second output signal in this exemplary embodiment. Alternatively, the nonlinearity can also be represented as a function of the brightness of this illumination element, but this would require an external calibration of the illumination element 2. Here, each measurement curve consists of several measurement points, wherein each measurement point represents a comparison of a second output signal with a first output signal. In the exemplary embodiment shown here, the temporally constant first radiation intensity for each measuring point is zero and forms the reference value for determining a nonlinearity. In this exemplary embodiment, the nonlinearity at each measurement point is determined by the difference between the second and the first, i.e. the reference measurement signal, that is output from the phase-sensitive rectifier, divided by the first, i.e. the reference measurement signal, multiplied by 10{circumflex over ()}6, thereby expressing the nonlinearity in the unit ppm (parts per million). For example, the output signal measured by the phase sensitive rectifier in this exemplary embodiment is the electrical voltage drop across the ohmic resistor caused by the photocurrent from the photodiode.

    [0042] This patent application claims the priority of the German patent application 102021113849.3, the disclosure content of which is hereby incorporated by reference.

    [0043] The invention is not limited to specific embodiments by the description on the basis of said embodiments. Rather, the invention encompasses any new feature as well as any combination of features, which in particular includes any combination of features in the patent claims, even if this feature or combination itself is not explicitly stated in the patent claims or embodiments.