METHOD FOR WASHING DISPENSING PROBE INCLUDED IN AUTOMATED ANALYZER, AND AUTOMATED ANALYZER
20240230700 ยท 2024-07-11
Assignee
Inventors
- Akihiro NOJIMA (Tokyo, JP)
- Yosuke HORIE (Tokyo, JP)
- Masaaki HIRANO (Tokyo, JP)
- Eiichiro TAKADA (Tokyo, JP)
- Yuka MIYAKE (Tokyo, JP)
- Takamichi MORI (Tokyo, JP)
Cpc classification
G01N35/025
PHYSICS
International classification
G01N35/10
PHYSICS
Abstract
An object of the invention is to provide a technique capable of enhancing a cleaning effect of a dispensing probe while preventing an influence on an analysis throughput. In a method according to the invention, an inner surface of a dispensing probe is cleaned by repeating an inner surface liquid-feeding period in which a cleaning liquid is fed to an inside of the dispensing probe and an inner surface stop period in which the cleaning liquid is not fed.
Claims
1-4. (canceled)
5. A method for cleaning a dispensing probe included in an automatic analysis device configured to dispense a liquid, the method comprising: cleaning an inner surface of the dispensing probe, wherein the cleaning the inner surface includes performing an inner surface liquid-feeding period in which a cleaning liquid is fed to an inside of the dispensing probe and an inner surface stop period in which the cleaning liquid is not fed, and performing the inner surface liquid-feeding period again after the inner surface stop period, and the inner surface stop period is configured to be a maximum value under a condition that a sum of the inner surface liquid-feeding periods, the number of the inner surface liquid-feeding periods, and a sum of the inner surface liquid feeding periods and the inner surface stop periods are certain defined values, respectively.
6. A method for cleaning a dispensing probe included in an automatic analysis device configured to dispense a liquid, the method comprising: cleaning an inner surface of the dispensing probe, wherein the cleaning the inner surface includes cleaning the inner surface by repeating an inner surface liquid-feeding period in which a cleaning liquid is fed to an inside of the dispensing probe and an inner surface stop period in which the cleaning liquid is not fed, the cleaning the inner surface includes performing the inner surface liquid-feeding period twice or more, wherein lengths of at least two of the inner surface liquid-feeding periods are different from each other, and each of the inner surface stop periods is 25% or more of a sum of the inner surface liquid-feeding periods and the inner surface stop periods.
7. (canceled)
8. The method according to claim 6, wherein in the cleaning the inner surface, a time length of each of the inner surface liquid-feeding periods is 20% or more of a sum of time lengths of all the inner surface liquid-feeding periods.
9. The method according to claim 8 further comprising: cleaning an outer surface of the dispensing probe, wherein the cleaning the inner surface includes performing the inner surface liquid-feeding period three times or more, and the first surface liquid-feeding period is longest.
10. A method for cleaning a dispensing probe included in an automatic analysis device configured to dispense a liquid, the method comprising: cleaning an inner surface of the dispensing probe, wherein the cleaning the inner surface includes cleaning the inner surface by repeating an inner surface liquid-feeding period in which a cleaning liquid is fed to an inside of the dispensing probe and an inner surface stop period in which the cleaning liquid is not fed, the method further comprises cleaning an outer surface of the dispensing probe, the method initiates the cleaning the outer surface before initiating the cleaning the inner surface, the cleaning the outer surface includes one or more outer surface liquid-feeding periods in which a cleaning liquid is fed to the outer surface of the dispensing probe, and one or more outer surface stop periods in which the cleaning liquid is not fed, and the cleaning the outer surface includes, after a last one of the inner surface liquid-feeding period in the cleaning the inner surface is completed, starting a last one of the outer surface liquid-feeding period.
11. A method for cleaning a dispensing probe included in an automatic analysis device configured to dispense a liquid, the method comprising cleaning an inner surface of the dispensing probe, wherein the cleaning the inner surface includes cleaning the inner surface by repeating an inner surface liquid-feeding period in which a cleaning liquid is fed to an inside of the dispensing probe and an inner surface stop period in which the cleaning liquid is not fed, the method further comprises cleaning an outer surface of the dispensing probe, the method initiates the cleaning the outer surface before initiating the cleaning the inner surface, the cleaning the outer surface includes one or more outer surface liquid-feeding periods in which a cleaning liquid is fed to the outer surface of the dispensing probe, and one or more outer surface stop periods in which the cleaning liquid is not fed, the cleaning the outer surface includes, while the last inner surface liquid-feeding period in the cleaning the inner surface is performed, starting the last outer surface liquid-feeding period, and the cleaning the outer surface includes, after the last inner surface liquid-feeding period is completed, completing the last outer surface liquid-feeding period.
12. A method for cleaning a dispensing probe included in an automatic analysis device configured to dispense a liquid, the method comprising cleaning an inner surface of the dispensing probe, wherein the cleaning the inner surface includes cleaning the inner surface by repeating an inner surface liquid-feeding period in which a cleaning liquid is fed to an inside of the dispensing probe and an inner surface stop period in which the cleaning liquid is not fed, the method further comprises cleaning an outer surface of the dispensing probe, the method initiates the cleaning the outer surface before initiating the cleaning the inner surface, the cleaning the outer surface includes one or more outer surface liquid-feeding periods in which a cleaning liquid is fed to the outer surface of the dispensing probe, and one or more outer surface stop periods in which the cleaning liquid is not fed, the cleaning the outer surface includes, after a second-to-last one of the inner surface liquid-feeding period in the cleaning the inner surface is completed, and before a last one of the inner surface liquid-feeding period is started, starting a last one of the outer surface liquid-feeding period, and the cleaning the outer surface includes, after the last inner surface liquid-feeding period is completed, completing the last outer surface liquid-feeding period.
13. A method for cleaning a dispensing probe included in an automatic analysis device configured to dispense a liquid, the method comprising cleaning an inner surface of the dispensing probe, wherein the cleaning the inner surface includes cleaning the inner surface by repeating an inner surface liquid-feeding period in which a cleaning liquid is fed to an inside of the dispensing probe and an inner surface stop period in which the cleaning liquid is not fed, the cleaning the inner surface includes feeding the cleaning liquid at a first flow rate from a first one of the inner surface liquid-feeding period to a second-to-last one of the inner surface liquid-feeding period, and the cleaning the inner surface includes feeding the cleaning liquid at a second flow rate lower than the first flow rate in the last inner surface liquid-feeding period.
14-15. (canceled)
16. An automatic analysis device configured to dispense a sample of a liquid, the automatic analysis device comprising: a dispensing probe configured to dispense the liquid; and a cleaning mechanism configured to clean an inner surface of the dispensing probe, wherein the cleaning mechanism performs an inner surface liquid-feeding period in which a cleaning liquid is fed to an inside of the dispensing probe and an inner surface stop period in which the cleaning liquid is not fed, and performs the inner surface liquid-feeding period again after the inner surface stop period, and the inner surface stop period is configured to be a maximum value under a condition that a sum of the inner surface liquid-feeding periods, the number of the inner surface liquid-feeding periods, and a sum of the inner surface liquid feeding periods and the inner surface stop periods are certain defined values, respectively.
Description
BRIEF DESCRIPTION OF DRAWINGS
[0010]
[0011]
[0012]
[0013]
[0014]
[0015]
[0016]
[0017]
[0018]
[0019]
[0020]
[0021]
[0022]
[0023]
DESCRIPTION OF EMBODIMENTS
First Embodiment
[0024]
[0025] The reagent dispensing mechanism 14 includes a reagent dispensing probe 21 (see
[0026] The sample dispensing mechanism 15 moves the sample dispensing probe 22 by a rotation operation to (a) a suction position at which the sample is suctioned from the sample container 23, (b) a discharge position at which the sample is discharged to the cell 25, and (c) a cleaning position at which the tip of the sample dispensing probe 22 is cleaned by a cleaning tank 26, respectively. Further, the sample dispensing mechanism 15 lowers the sample dispensing probe 22 in accordance with the height of each of the sample container 23, the cell 25, and the cleaning tank 26 at the suction position, the discharge position, and the cleaning position, respectively.
[0027] Similarly, the reagent dispensing mechanism 14 moves the reagent dispensing probe 21 to (a) a suction position at which the reagent is suctioned from the reagent container 11, (b) a discharge position at which the reagent is discharged to the cell 25, and (c) a cleaning position at which the tip of the reagent dispensing probe 21 is cleaned in the cleaning tank 28. Further, the reagent dispensing mechanism 14 lowers the reagent dispensing probe 21 in accordance with the height of each of the reagent container 11, the cell 25, and the cleaning tank 28 at the suction position, the discharge position, and the cleaning position, respectively.
[0028] The sample dispensing probe 22 and the reagent dispensing probe 21 each include a sensor (for example, a sensor using a change in capacitance or pressure) that detects a liquid level, and contact thereof with a target liquid (sample or reagent) can be confirmed from a sensor signal. In cleaning of the dispensing probe, since the contact range with the target liquid is limited, the amount of cleaning water can be reduced, and thus the range in which the dispensing probe is immersed into the target liquid is generally controlled. The limitation of the immersion range produces also an effect of suppressing variation in dispensing.
[0029] The automatic analysis device 10 analyzes the concentration of a predetermined component in the sample and the like by the following procedure, for example. First, the sample container 23 conveyed by the rack 24 moves to the sample suction position. Next, the sample dispensing probe 22 is rotated to the sample suction position by the sample dispensing mechanism 15 to suction the sample from the sample container 23. Thereafter, the sample is rotationally moved while being held in the sample dispensing probe 22, and then is discharged into the cell 25. Thereafter, the sample dispensing probe 22 is rotationally moved to the cleaning tank 26 by the sample dispensing mechanism 15, and then is cleaned. Next, the cell 25 is rotated by the reaction disk 13, and then is moved to the discharge position of the reagent dispensing probe 21. The reagent container 11 is moved to the suction position of the reagent dispensing probe 21 by the reagent disk 12. Thereafter, the reagent dispensing probe 21 is moved by the reagent dispensing mechanism 14 to the suction position where the reagent container 11 is positioned, and suctions the reagent from the reagent container 11. The reagent dispensing probe 21 is moved to the discharge position by the reagent dispensing mechanism 14 while holding the reagent, and discharges the reagent to the cell 25 from which the sample has already been discharged. The cell 25 from which the sample and the reagent have been discharged is rotated by the reaction disk 13, and the stirring mechanism 27 is moved to a stirring position where the solution in the cell 25 can be stirred. The mixed liquid of the sample and the reagent in the cell 25 is stirred by the stirring mechanism 27, whereby the reaction between the sample and the reagent in the cell 25 is promoted. The reaction liquid between the sample and the reagent is subjected to photometry using a light source 29 and a photometer 30, whereby the concentration of a predetermined component in the sample and the like can be analyzed.
[0030] In the above procedure, each device operation has been sequentially described; however, since each mechanism can operate independently, it is possible to reduce the total operation period by performing the operations in parallel. Therefore, usually, the analysis throughput defined as the number of tests that can be processed per unit time by the automatic analysis device 10 is determined by the period of the most time-consuming process among the processes.
[0031] In other words, the number of tests that can be performed per unit time by the automatic analysis device 10 is determined by any one of the following: (a) in the case of sample dispensing by the sample dispensing probe 22, the time from when the sample dispensing probe 22 starts suctioning the sample to perform analysis until the sample dispensing probe 22 starts suctioning the sample to analyze the next sample or to analyze another item of the same sample: and (b) in the case of reagent dispensing by the reagent dispensing probe 21, the time from when the reagent dispensing probe 21 starts suctioning a reagent to perform analysis until the reagent dispensing probe 21 starts suctioning the reagent to perform analysis using the next reagent or to perform analysis on a different sample using the same reagent. The above (a) and (b) are referred to as cycle time. The cycle time may vary depending on an analysis target item or the like. Here, the shortest cycle time among the cycle times of a specific individual automatic analysis device 10 is referred to as the shortest cycle time in the specific automatic analysis device 10.
[0032] When dispensing is performed in the shortest cycle time, the time that can be used to clean the inner surface of the dispensing probe is calculated by subtracting the time required for the movement, suction, and discharge of the dispensing probe from the shortest cycle time, and is usually shorter than the time required for the movement, suction, and discharge of the dispensing probe, and is often 2 seconds or less, and typically about 1 second or less.
[0033]
[0034] The cleaning effect was evaluated using the flow channel configuration of
[0035] First, a solution containing a simulated reagent component is suctioned and discharged by the reagent dispensing probe 21. In the case of using the automatic analysis device 10 in
[0036]
[0037] In the time chart of the cleaning operation shown in the lower part of
[0038] The pulse cleaning includes one or more pulses, and the pulse is referred to as a first pulse, a second pulse, and the like in the order from the earliest one. The total cleaning time of the pulses is shorter than the shortest cycle time of the automatic analysis device 10, for example, about 1 second or less, as in the case of continuously feeding the cleaning liquid described above. In addition, the time from the start of the first cleaning pulse to the end of the last cleaning pulse is similarly shorter than the shortest cycle time, and is, for example, about 1 second or less to about 2 seconds.
[0039]
[0040] The higher cleaning effect with the same amount of cleaning liquid obtained through suspending the feeding of the cleaning liquid is considered to be due to the following factors. Typically, when cleaning is performed by continuously feeding the cleaning liquid, a portion with a high flow rate near the center of a hollow portion of the dispensing probe can be efficiently cleaned along the velocity field of the cleaning liquid. On the other hand, near the wall of the hollow portion of the dispensing probe, the flow rate is relatively low, and the cleaning cannot be efficiently performed by the effect of the velocity field of the cleaning liquid. Therefore, after the simulated reagent component has diffused to the vicinity of the center of the hollow portion of the dispensing probe with the high flow rate of the cleaning liquid, the simulated reagent component is cleaned along the velocity field of the cleaning solution being fed. When the feeding of the cleaning liquid is suspended, the cleaning by the velocity field of the cleaning liquid is not performed, but since the cleaning liquid exists in the hollow portion, the diffusion of the simulated reagent component continues. Therefore, when the feeding of the cleaning liquid is suspended, the simulated reagent component is diffused into the central portion of the hollow portion of the dispensing probe. As a result, when cleaning is performed with the second pulse, the simulated reagent component diffused into the central portion is efficiently cleaned along the velocity field of the cleaning liquid.
Second Embodiment
[0041] In the second embodiment of the present invention, the influence of the time period of suspending the cleaning on the cleaning effect was examined. Only the time period of suspending the cleaning (time interval between pulses) was changed without changing the lengths of the first pulse and the second pulse, and the cleaning effect was evaluated. The evaluation method is as in the first embodiment. A solution containing a simulated reagent component is suctioned by the reagent dispensing probe 21 and discharged to the cell 25. Next, in the cleaning tank 28, cleaning was performed using the time chart of the pulse cleaning operation in the lower part of
[0042]
[0043] However, in light of operation of the automatic analysis device 10, it is necessary to clean the dispensing probe within a limited time. For example, a case of the cleaning with two pulses of the first pulse and the second pulse is considered. Assuming that the cleaning time is T1, the necessary amount of the cleaning liquid is W, and the flow rate of the cleaning liquid is V, the time T2 for suspending the cleaning can be determined by the following equation: T2=T1?W/V.
[0044] The result that the cleaning effect is higher when the cleaning suspension period is longer is considered to be consistent with the mechanism assumed in the first embodiment that the effect of the pulse cleaning is due to the diffusion of the simulated reagent component when the cleaning is suspended. That is, it is considered that the longer the washing suspension period was, the longer the diffusion distance of the simulated reagent component became, and a greater amount of the simulated reagent component was diffused into a portion where the flow rate of the cleaning liquid was great in the central portion of the hollow portion of the reagent dispensing probe 21 before the washing of the second pulse was performed.
Third Embodiment
[0045] In the first and second embodiments, pulse cleaning in which cleaning was divided into 2 sessions was mainly considered. In the third embodiment of the present invention, the relationship between the number of pulse divisions or the length of pulse period and the cleaning effect was examined in more detail. The configuration of the automatic analysis device 10 is same as that of the first embodiment.
[0046]
[0047]
[0048] From the above results, it can be seen that the cleaning time of each pulse is desirably 20% or more of the total cleaning time. In other words, the number of pulse divisions including the first pulse is desirably 2 or more and 4 or less. This is because when the number of divisions is 5 or more, any of the pulses becomes 20% or less of the cleaning time. In addition, in view of the fact that the higher cleaning effect was obtained when the cleaning time was around 30%, the number of divisions including the first pulse is desirably 3 or more.
Fourth Embodiment
[0049] In the fourth embodiment of the present invention, a case where the dispensing probe outer surface is cleaned in parallel with cleaning of the dispensing probe inner surface is described. We evaluated the relationship of the relative timing between the inner surface cleaning and the outer surface cleaning. The configuration of the automatic analysis device 10 is same as that of the first embodiment.
[0050] As an evaluation method, similarly to the method described in the first embodiment, the solution containing a simulated reagent component is suctioned by the reagent dispensing probe 21 and then is discharged to the cell 25. Thereafter, cleaning is performed in the cleaning tank 28. Thereafter, a solution not containing the simulated reagent component is dispensed, is discharged to the cell 25, and then is washed in the cleaning tank 28. The cleaned state at this time was observed while evaluating a plurality of timing conditions of the outer surface cleaning and the inner surface cleaning.
[0051] As a result of the evaluation, it was confirmed that when the inner surface cleaning was started prior to the outer surface cleaning, there was a case where the liquid feeding state of the cleaning solution from the inner surface was unstable. Before cleaning the inner surface of the reagent dispensing probe 21, a part of the simulated reagent component and the component of the solution not containing the simulated reagent component remains on the inner surface, and these components and the cleaning liquid are mixed at the start of cleaning. At this time, when the solution remaining on the inner surface of the reagent dispensing probe 21 and the cleaning liquid were mixed, the two liquids had different liquid properties, and thus there was a case where the flow of the cleaning liquid was unstable due to foaming or the like caused by a surfactant effect.
[0052] On the other hand, the present inventors have found that, in a case where the outer surface cleaning preceded the inner surface cleaning, when the cleaning was started in a state where the cleaning liquid on the inner surface covered the probe tip, even if the flow state of the cleaning liquid on the inner surface was disturbed, the cleaning solution sprayed onto the outer surface could prevent the influence thereof. This was considered to be due to, when the mixed liquid of the cleaning liquid on the inner surface and the residual component of the simulated reagent component spilled from the inner surface of the reagent dispensing probe 21, the mixed liquid being taken into the cleaning liquid sprayed onto the outer surface and moving along the flow field of the cleaning liquid sprayed onto the outer surface.
[0053]
[0054] Given this, in order to further reduce the amount of cleaning liquid used for the exterior cleaning, the timing of stopping the spray of the cleaning liquid onto the outer surface in a state of feeding the cleaning liquid on the inner surface of the reagent dispensing probe 21 was considered. As a result, it has been clarified that there was no particular problem even if the spraying of the cleaning liquid onto the outer surface was stopped in a state where the cleaning of the inner surface was continued, as long as a certain period of time (for example, about 50 ms) elapsed after the cleaning of the inner surface was once started. The reason for this is considered to be as follows.
[0055] When a certain period of time elapses after the start of the cleaning of the inner surface, the proportion of the simulated reagent component or the like in the cleaning liquid fed to the inner surface of the reagent dispensing probe 21 decreases and the solution coming out from the inner surface is only the cleaning liquid, whereby the liquid property is uniformized. Therefore, it is considered that foaming due to the surfactant effect or the like as described above is not observed, and the liquid feeding state is stabilized. As a result, even when the cleaning liquid was not sprayed onto the outer surface, a problem such as scattering of the cleaning liquid did not occur.
[0056]
[0057]
[0058]
Fifth Embodiment
[0059] In the first to fourth embodiments, the pump 202 and the pump 209 were used in combination as a cleaning pump for cleaning the inner surface of the dispensing probe. Cleaning was started by opening the electromagnetic valve 204, and cleaning was stopped by closing the electromagnetic valve 204. The flow rate is thus determined by the pressure of these pumps. Typically, such cleaning is performed at a relatively high flow rate. On the other hand, we separately prepared a pump with a lower flow rate, and attempted to perform finishing cleaning by driving the pump. This was intended to improve the cleaning effect by performing pulse cleaning at a relatively high pressure and a high flow rate and then performing cleaning at a low flow rate. The other configurations of the automatic analysis device 10 were same as those of the first embodiment.
[0060]
[0061]
[0062]
<Regarding Modifications of the Present Invention>
[0063] The present invention is not limited to the above-described embodiments, and encompasses various modifications. For example, the above-described embodiments have been described in detail for the sake of comprehensible explanation of the present invention, and are not necessarily limited to those provided with all the described configurations. Furthermore, a part of the configuration of one embodiment can be replaced with the configuration of another embodiment, and the configuration of another embodiment can be added to the configuration of one embodiment. In addition, with regard to a part of the configuration of each embodiment, addition of other configurations, deletion, and replacement are possible.
[0064] In the above embodiments, each functional unit (the reagent dispensing mechanism 14, the reagent disk 12, the reaction disk 13, the electromagnetic valve, the pump, and the like) included in the automatic analysis device 10 can be controlled by a controller provided in the automatic analysis device 10. The controller can be configured by hardware such as a circuit device in which such a function is implemented, or can be configured by an arithmetic device executing software in which the function is implemented.
[0065] In the above embodiments, the cleaning of the reagent dispensing probe 21 has been mainly described; however, the present invention is not limited thereto, and the present invention can also be applied to other dispensing probes such as the sample dispensing probe 22.
REFERENCE SIGN LIST
[0066] 10 automatic analysis device [0067] 11 reagent container [0068] 12 reagent disk [0069] 13 reaction disk [0070] 14 reagent dispensing mechanism [0071] 15 sample dispensing mechanism [0072] 21 reagent dispensing probe [0073] 22 sample dispensing probe [0074] 23 sample container [0075] 24 rack [0076] 25 cell [0077] 26 cleaning tank [0078] 27 stirring mechanism [0079] 28 cleaning tank [0080] 29 light source [0081] 30 photometer [0082] 201 cleaning liquid tank [0083] 202 pump [0084] 203 electromagnetic valve [0085] 204 electromagnetic valve [0086] 205 syringe pump [0087] 206 tube [0088] 207 cleaning nozzle [0089] 209 pump [0090] 210 pump