LOW INDUCTANCE ELECTRICAL CONTACT ASSEMBLY
20190067861 ยท 2019-02-28
Assignee
Inventors
- Wei Kuong Foong (Petaling Jaya, MY)
- Kok Sing Goh (Petaling Jaya, MY)
- Shamal Mundiyath (Petaling Jaya, MY)
- Eng Kiat Lee (Petaling Jaya, MY)
Cpc classification
H01R13/405
ELECTRICITY
H01R13/504
ELECTRICITY
G01R1/07307
PHYSICS
International classification
H01R13/405
ELECTRICITY
Abstract
An electrical contact test assembly that has a small size, a very low inductance, is able to handle high frequency and high current testing, and one that is easy to assemble, handle and maintain. An electrical contact assembly that comprises a shorter length of contact achieved by sandwiching an inner holder in between two rows of contacts and keeping them together via an adhesive between each of the two rows of contacts and the inner holder. In this way, very small sizes of contacts are more easily assembled and handled. The low inductance then allows for high frequency testing. An electrical contact assembly that comprises a one-piece contact without the complexity of other designs such as screws, springs, etc, allowing higher currents and tri-temperature testing.
Claims
1. An electrical contact assembly for use in a testing apparatus, comprising: a plurality of inner pins arranged in a row, each inner pin having a vertical section; a plurality of outer pins arranged in a row, each outer pin having a vertical section; an inner holder located in between said plurality of inner pins and said plurality of outer pins, said inner holder having a C-shaped cross-section, whereby an inner surface of the inner holder is adapted to receive a back side of said vertical section of said plurality of inner pins, and an outer surface of the inner holder is adapted to be received by a front side of said vertical section of said plurality of outer pins; and an outer holder having an inner surface adapted to receive a back side of said plurality of outer pins.
2. An electrical contact assembly for use in a testing apparatus according to claim 1, wherein an adhesive is applied between said inner holder inner surface and said inner pin vertical section, such that the plurality of inner pins are joined to said inner holder.
3. An electrical contact assembly for use in a testing apparatus according to claim 1, wherein an adhesive is applied between said inner holder outer surface and said outer pin vertical section, such that the plurality of outer pins are joined to said inner holder.
4. An electrical contact assembly for use in a testing apparatus according to claim 1, wherein an adhesive is applied between said outer holder inner surface and said outer pin vertical section, so that the plurality of outer pins adhere to said outer holder.
Description
BRIEF DESCRIPTION OF DRAWINGS
[0014]
[0015]
[0016]
[0017]
[0018]
[0019]
DETAILED DESCRIPTION OF INVENTION
[0020] It should be noted that the following detailed description is directed to an electrical contact assembly of an integrated circuit (IC) testing apparatus, and is not limited to any particular size or configuration but in fact a multitude of sizes and configurations within the general scope of the following description.
LIST OF NUMBERED ELEMENTS IN FIGURES
[0021] Inner Pin (10) [0022] Inner Pin Bottom Cantilever (13) [0023] Inner Pin Load End (14) [0024] Inner Pin Vertical Section (15) [0025] Inner Pin Top Cantilever (17) [0026] Inner Pin Device End (18) [0027] Outer Pin (20) [0028] Outer Pin Bottom Cantilever (23) [0029] Outer Pin Load End (24) [0030] Outer Pin Vertical Section (25) [0031] Outer Pin Diagonal Section (26) [0032] Outer Pin Top Cantilever (27) [0033] Outer Pin Device End (28) [0034] Inner Holder (30) [0035] Inner Holder Inner Surface (32) [0036] Inner Holder Outer Surface (34) [0037] Inner Holder Elongated Holes (35) [0038] Outer Holder (40) [0039] Outer Holder Inner Surface (42) [0040] Outer Holder Elongated Holes (45)
[0041] Referring to
[0042] From the different views, it is made clear how the inner pins (10), outer pins (20), inner holder (30) and outer holder (40) are assembled together to form the contact assembly of this invention.
[0043] Along a top side of the inner holder (30), there is provided a series of elongated holes (35) which is located adjacently above said row of inner pins (10). Along a top side of the outer holder (40), there is also provided a series of elongated holes (45) which is located adjacently above said row of outer pins (20).
[0044] Referring to
[0045] In more detail, each said inner pin (10) is C-shaped with a vertical section (15) joining a horizontal bottom cantilever (13) to a horizontal top cantilever (17). At the other end of the bottom cantilever (13), a vertical load end (14) extends downwards, which during testing comes into contact with the load board of a testing apparatus. Similarly, at the other end of the top cantilever (17), a vertical device end (18) extends upwards, which during testing comes into contact with a device under test (DUT). The portion comprising part of the top cantilever (17), the vertical section (15) and part of the bottom cantilever (13) forms the so-called C-shaped portion of this inner pin (10) mentioned above and in relation to
[0046] Each said outer pin (20) is C-shaped with a vertical section (25) joining a horizontal bottom cantilever (23) to a horizontal top cantilever (27). At the other end of the bottom cantilever (23), a vertical load end (24) extends downwards, which during testing comes into contact with the load board of a testing apparatus. Similarly, at the other end of the top cantilever (27), a vertical device end (28) extends upwards, which during testing comes into contact with a device under test (DUT). The outer pins (20) are designed to wrap around the inner holder (30). In each outer pin (20), the top cantilever (27) is raised slightly near its middle so that there are essentially two top horizontal sections joined by a diagonal section (26). This is to facilitate wrapping snugly around the inner holder (30). The portion comprising part of the top cantilever (27), the vertical section (25) and part of the bottom cantilever (23) forms the so-called C-shaped portion of this outer pin (20) mentioned above and in relation to
[0047] Still referring to
[0048] The inner holder (30) is hollowed-out with a C-shaped cross-section and an open inner face, and is designed to wrap around the vertical section (15) side of the row of inner pins (10), in order to contain said inner pins (10). The said inner holder (30) is enclosed at each end to further contain said inner pins (10). The said inner holder (30) has an inner surface (32) on the inside of the C-shape which faces and, after assembly, is flush against the inner pin vertical section (15). The inner holder (30) also has an outer surface (34) which faces outwards and, after assembly, is flush against the outer pin vertical section (25). In this way, the inner pin load end (14) and the outer pin load end (24) are side by side with, but not touching, each other. Similarly, the inner pin device end (18) and the outer pin device end (28) are also side by side with, but not touching, each other. The inner holder (30) is provided with a series of elongated holes (35) on its top side which, after assembly, is adjacently above the top cantilevers (17) of the plurality of inner pins (10).
[0049] The outer holder (40) is hollowed-out with a C-shaped cross-section and an open inner face, and is designed to wrap around the vertical section (25) side of the row of outer pins (20), in order to contain said outer pins (20). The said outer holder (40) is partially enclosed at each end to further contain said outer pins (20). The said outer holder (40) has an inner surface (42) on the inside of the C-shape which faces and, after assembly, is flush against the outer pin vertical section (25). The outer holder (40) is provided with a series of elongated holes (45) on its top side which, after assembly, is adjacently above the top cantilevers (27) of the plurality of outer pins (20).
[0050] Adhesive applied into the inner holder elongated holes (35) secures the said vertical section side of the inner pins (10) to the inner holder (30). Adhesive applied into the outer holder elongated holes (45) secures the said vertical section side of the outer pins (20) to the outer holder (40) and the inner holder (30). In a preferred embodiment, the adhesive is a non-conductive adhesive, such as epoxy. In another preferred embodiment, the adhesive is a non-conductive, tri-temp resistant adhesive.
[0051] In this way, the vertical sections (15, 25) of both inner pins (10) and outer pins (20) are secured to the inner holder (30) and the vertical section (25) of the outer pins (20) are secured to the outer holder (40). This securing of only the portions of the inner and outer pins close to the vertical sections (15, 25) while leaving the load board ends (14, 24) and device ends (18, 28) free cause the bottom cantilevers (13, 23) and top cantilevers (17, 27) to become cantilever springs.
[0052]
[0053] While several particularly preferred embodiments of the present invention have been described and illustrated, it should now be apparent to those skilled in the art that various changes and modifications can be made without departing from the scope of the invention. Accordingly, the following claims are intended to embrace such changes, modifications, and areas of application that are within the scope of this invention.